FTK8N80P [FS]

8.0 Amps, 800 Volts N-Channel MOS -FET;
FTK8N80P
型号: FTK8N80P
厂家: First Silicon Co., Ltd    First Silicon Co., Ltd
描述:

8.0 Amps, 800 Volts N-Channel MOS -FET

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中文:  中文翻译
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SEMICONDUCTOR  
FTK8N80P/D/DD  
TECHNICAL DATA  
8.0 Amps, 800 Volts N-Channel MOS-FET  
DESCRIPTION  
These N-Channel enhancement mode power field effect  
Transistors are produced using planar stripe, DMOS  
technology.  
P :  
1
This advanced technology has been especially tailored  
to minimize on - state resistance , provide superior  
switching performance,and Withstand high energy pulse  
in the avalanche and commutaion mode .These devices  
are well suited for high efficiency switch mode power  
TO-220  
F :  
supply electronic lamp ballasts  
based on half bridge topology.  
1
TO-220F  
FEATURES  
* RDS(ON) = 1.9@VGS = 10V  
* Fast switching capability  
* Avalanche energy tested  
DD :  
1
* Improved dv/dt capability, high ruggedness  
TO-263  
SYMBOL  
2.Drain  
1.Gate  
3.Source  
ORDERING INFORMATION  
Pin Assignment  
Order Number  
Package  
Packing  
1
2
3
FTK8N80P  
FTK8N80F  
FTK8N80DD  
TO-220  
TO-220F  
TO-263  
G
D
S
Tube  
Tube  
G
G
D
D
S
S
Reel & Taping  
Note: Pin Assignmen:  
G: Gate  
D: Drain  
S: Source  
2012. 07. 05  
Revision No : 0  
1/8  
FTK8N80P/F/DD  
(
TC = 25˚C, unless otherwise specified)  
ABSOLUTE MAXIMUM RATINGS  
PARAMET  
SYMBOL  
VDSS  
RATINGS  
800  
UNIT  
V
Drain-Source Voltage  
VGSS  
Gate-Source Voltage  
±30  
V
IAR  
Avalanche Current (Note 1)  
7.5  
A
TC = 25°C  
7.5  
A
Continuous Drain Current  
Pulsed Drain Current (Note 1)  
Avalanche Energy  
ID  
TC = 100°C  
4.2  
IDM  
EAS  
28  
A
Single Pulse(Note 2)  
580  
16.7  
4.5  
mJ  
mJ  
Repetitive Limited by TJ(MAX)  
EAR  
Peak Diode Recovery dv/dt (Note 3)  
dv/dt  
V/ns  
W
TC = 25°C  
142 / 48  
1.14 / 0.38  
+150  
Power Dissipation (TO-220,TO-263/ TO-220F)  
PD  
Derate above 25°C  
W / ˚C  
TJ  
Junction Temperature  
˚C  
˚C  
TSTG  
-55 ~ +150  
Operating and Storage Temperature  
Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged.  
Absolute maximum ratings are stress ratings only and functional device operation is not implied.  
THERMAL DATA  
PARAMETER  
Junction-to-Ambient  
Junction-to-Case  
SYMBOL  
MIN  
TYP  
MAX  
62.5  
UNIT  
θJA  
TO-220, TO-263  
TO-220F  
θJc  
θJc  
˚C / W  
0.88  
2.6  
ELECTRICAL CHARACTERISTICS  
(TC = 25˚C , unless Otherwise specified.)  
PARAMETER  
OFF CHARACTERISTICS  
Drain-Source Breakdown Voltage  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
800  
V
10  
µA  
Drain-Source Leakage Current  
Gate-Body Leakage Current  
VDS = 800V, VGS = 0V  
IGSSF  
IGSSR  
VGS = 30V, VDS = 0V  
Forward  
Reverse  
100  
nA  
nA  
VGS = -30V, VDS = 0V  
-100  
ID = 250µA, Referenced to  
25°C  
ΔBVDSS / ΔTJ  
Breakdown Voltage Temperature Coefficient  
0.93  
5.5  
V / ˚C  
ON CHARACTERISTICS  
Gate Threshold Voltage  
VGS(TH)  
RDS(ON)  
gFS  
VDS = VGS, ID = 250µA  
VGS = 10V, ID = 3.50A  
2.0  
4.0  
1.9  
V
S
Static Drain-Source On-Resistance  
VDS = 40V, ID = 3.5A (Note 4)  
Forward Transconductance  
DYNAMIC CHARACTERISTICS  
Input Capacitance  
CISS  
COSS  
CRSS  
1290  
120  
10  
pF  
pF  
pF  
VDS = 25V, VGS = 0V,  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
SWITCHING CHARACTERISTICS  
Turn-On Delay Time  
tD(ON)  
35  
ns  
tR  
tD(OFF)  
tF  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
VDD = 300V, ID = 7A, RG = 25Ω  
(Note 4,5)  
100  
50  
ns  
ns  
60  
ns  
QG  
28  
nC  
nC  
VDS = 640V,ID = 7A, VGS = 10V  
(Note 4,5)  
QGS  
8.2  
QGD  
Gate-Drain Charge  
12  
nC  
2012. 07. 05  
Revision No : 0  
2/8  
FTK8N80P/F/DD  
(TJ  
=
˚C ,  
Otherwise specified.)  
unless  
25  
ELECTRICAL CHARACTERISTICS  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS  
VSD  
IS  
VGS = 0 V, IS = 7.0 A  
Drain-Source Diode Forward Voltage  
1.4  
6.6  
V
A
Maximum Continuous Drain-Source Diode  
Forward Current  
Maximum Pulsed Drain-Source Diode Forward  
Current  
ISM  
26  
A
tRR  
VGS = 0 V, IS = 7.0A,  
Reverse Recovery Time  
650  
7.0  
ns  
QRR  
dIF/dt =100 A/µs (Note 4)  
Reverse Recovery Charge  
µC  
Note:  
1. Repetitive Rating : Pulse width limited by maximum junction temperature  
2. L = 25mH, I AS  
= 6.6A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C  
μs, VDD ≤ BVDSS, Starting TJ = 25°C  
3. ISD  
≤ 8.0A, di/dt ≤ 200A/  
4. Pulse Test: Pulse width ≤ 300μs, Duty cycle ≤ 2%  
5. Essentially independent of operating temperature  
2012. 07. 05  
Revision No : 0  
3/8  
FTK8N80P/F/DD  
Fig1. I - V  
Fig2. I - V  
D
D
GS  
DS  
100  
10  
V
DS  
=30V  
101  
V
=10V  
GS  
V
V
=6V  
GS  
100 C  
=5V  
25 C  
GS  
100  
1
10-1  
0.1  
0.1  
10  
Drain - Source Voltage VDS (V)  
2
4
6
8
10  
1
100  
Gate - Source Voltage VGS (V)  
Fig3. BV  
- T  
Fig4. R  
- I  
DS(ON) D  
DSS  
j
1.2  
1.1  
1.0  
0.9  
0.8  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0
VGS = 0V  
IDS = 250  
V
GS  
=6V  
V
=10V  
GS  
100  
-100  
-50  
0
50  
150  
0
2
4
6
8
10  
12  
Junction Temperature Tj (  
)
Drain Current ID (A)  
C
Fig6. R  
- T  
j
DS(ON)  
Fig5. I - V  
S
SD  
102  
101  
100  
10-1  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
V
=10V  
= 7 A  
GS  
I
DS  
100 C  
25 C  
-100  
-50  
0
50  
100  
150  
0.4  
0.6  
0.8  
1.0  
1.2  
(V)  
1.4  
Junction Temperature T (  
)
C
Source - Drain Voltage VSD  
j
2012. 07. 05  
Revision No : 0  
4/8  
FTK8N80P/F/DD  
Fig 7. C - V  
DS  
Fig8. Q - V  
g
GS  
104  
103  
102  
101  
12  
ID=7A  
10  
8
C
C
iss  
V
= 480V  
DS  
6
oss  
4
2
C
rss  
0
0
5
10 15 20 25 30 35 40 45  
Gate - Charge (nC)  
0
10  
20  
30  
40  
Q
g
Drain - Source Voltage VDS (V)  
Fig10. Safe Operation Area  
Fig9. Safe Operation Area  
(FTK8N80P)  
(FTK8N80F)  
102  
101  
102  
101  
10µs  
10µs  
100µs  
100µs  
1ms  
1ms  
100  
10-1  
10-2  
100  
10-1  
10-2  
10ms  
DC  
10ms  
Operation in this  
Operation in this  
area is limited by RDS(ON)  
area is limited by RDS(ON)  
DC  
T = 25  
C
c
C
T = 150  
j
Single pulse  
100  
101  
102  
103  
100  
101  
102  
103  
Drain - Source Voltage V (V)  
DS  
Drain - Source Voltage V (V)  
DS  
2012. 07. 05  
Revision No : 0  
5/8  
FTK8N80P/F/DD  
Fig11. Transient Thermal Response Curve  
(FTK8N80P)  
100  
Duty=0.5  
0 2  
0.1  
10-1  
P
DM  
t
1
t
2
- Rth(j-c) = 2.8 C/W Max.  
- Duty Factor, D= t1/t2  
Single Pulse  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
TIME (sec)  
Fig12. Transient Thermal Response Curve  
(FTK8N80F)  
100  
Duty=0.5  
0 2  
10-1  
P
DM  
0.1  
t
1
0.05  
t
0.02  
2
- Rth(j-c) = 2.8 C/W Max.  
- Duty Factor, D= t1/t2  
Single Pulse  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
TIME (sec)  
2012. 07. 05  
Revision No : 0  
6/8  
FTK8N80P/F/DD  
+
D.U.T.  
VDS  
-
+
-
L
RG  
Driver  
VDD  
* dv/dt controlled by R  
G
* ISD controlled by pulse period  
* D.U.T.-Device Under Test  
Same Type  
as D.U.T.  
VGS  
Fig. 1A Peak Diode Recovery dv/dt Test Circuit  
Period  
P. W.  
VGS  
(Driver)  
D=  
P.W.  
Period  
10V  
=
VGS  
I
FM, Body Diode Forward Current  
ISD  
(D.U.T.)  
di/dt  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
VDS  
(D.U.T.)  
VDD  
Body Diode  
Forward Voltage Drop  
Fig. 1B Peak Diode Recovery dv/dt Waveforms  
2012. 07. 05  
Revision No : 0  
7/8  
FTK8N80P/F/DD  
TEST CIRCUITS AND WAVEFORMS (Cont.)  
RL  
VDS  
VDS  
90%  
VDD  
VGS  
RG  
10%  
VGS  
D.U.T.  
10V  
tD(ON)  
tD(OFF)  
Pulse Width 1μs  
Duty Factor 0 1%  
tF  
tR  
Fig. 2A Switching Test Circuit  
Fig. 2B Switching Waveforms  
Same Type  
as D.U.T.  
50kΩ  
QG  
12V  
10V  
0 3μF  
0.2μF  
VDS  
QGS  
QGD  
VGS  
DUT  
VG  
3mA  
Charge  
Fig. 3A Gate Charge Test Circuit  
Fig. 3B Gate Charge Waveform  
L
VDS  
BVDSS  
RD  
VDD  
10V  
D.U.T.  
tp  
IAS  
Time  
tp  
Fig. 4A Unclamped Inductive Switching Test Circuit  
Fig. 4B Unclamped Inductive Switching Waveforms  
2012. 07. 05  
Revision No : 0  
8/8  

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