SSF5508 [GOOD-ARK]
55V N-Channel MOSFET;![SSF5508](http://pdffile.icpdf.com/pdf2/p00349/img/icpdf/SSF5508-15_2145347_icpdf.jpg)
型号: | SSF5508 |
厂家: | ![]() |
描述: | 55V N-Channel MOSFET |
文件: | 总7页 (文件大小:1059K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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SSF5508
55V N-Channel MOSFET
Main Product Characteristics
VDSS 55V
RDS(on) 4.5mohm(typ.)
ID 110A
MarkingandPin
Assignment
SchematicDiagram
TO-220
Features and Benefits
AdvancedtrenchMOSFETprocess technology
Special designed for PWM, load switching and
generalpurposeapplications
Ultralowon-resistancewithlowgatecharge
Fastswitching andreversebodyrecovery
175℃operating temperature
Leadfreeproduct
Description
It utilizes the latest trench processing techniques to achieve the high cell density and reduces the
on-resistance with high repetitive avalanche rating. These features combine to make this design an extremely
efficient andreliable devicefor useinpower switching application and awidevarietyof other applications.
Absolute Max Rating
Symbol
Parameter
Max.
110
Units
ID @ TC = 25°C
ID @ TC = 100°C
IDM
Continuous Drain Current, VGS @ 10V①
Continuous Drain Current, VGS @ 10V①
Pulsed Drain Current②
A
80
440
205
W
W/°C
V
Power Dissipation③
PD @TC = 25°C
Linear Derating Factor
2.0
VDS
Drain-Source Voltage
55
VGS
Gate-to-Source Voltage
± 20
375
V
EAS
mJ
A
Single Pulse Avalanche Energy @ L=0.3mH②
Avalanche Current @ L=0.3mH②
Operating Junction and Storage Temperature Range
IAR
50
TJ TSTG
-55 to +175
°C
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Page 1 of 7
Rev.4.2
SSF5508
55V N-Channel MOSFET
Thermal Resistance
Symbol
Characteristics
Typ.
—
Max.
0.73
62
Units
℃/W
℃/W
℃/W
RθJC
Junction-to-case③
—
Junction-to-ambient (t ≤ 10s) ④
Junction-to-Ambient (PCB mounted, steady-state) ④
RθJA
—
40
Electrical Characteristics @TA=25℃ unless otherwise specified
Symbol Parameter
Min.
55
—
Typ.
—
Max.
—
Units
Conditions
V(BR)DSS Drain-to-Source breakdown voltage
V
VGS = 0V, ID = 250μA
VGS=10V,ID = 68A
TJ = 125℃
4.5
5.5
—
RDS(on)
VGS(th)
IDSS
Static Drain-to-Source on-resistance
Gate threshold voltage
mΩ
V
—
7
2.5
—
—
3.5
—
VDS = VGS, ID = 250μA
TJ = 125℃
2.4
—
—
1
VDS = 55V,VGS = 0V
TJ = 125°C
Drain-to-Source leakage current
Gate-to-Source forward leakage
μA
nA
—
—
50
100
—
—
—
VGS =20V
IGSS
-100
—
—
VGS = -20V
Qg
Total gate charge
Gate-to-Source charge
Gate-to-Drain("Miller") charge
Turn-on delay time
Rise time
—
ID = 30A,
124.7
24.46
48.68
19.62
18.82
69.76
30.12
5607
463
454
nC
ns
VDS=30V,
Qgs
Qgd
td(on)
tr
—
—
VGS = 10V
—
—
—
—
VGS=10V, VDS=30V,
—
—
RL=15Ω,
GEN=2.55Ω
td(off)
tf
Turn-Off delay time
Fall time
—
—
R
—
—
Ciss
Coss
Crss
Input capacitance
Output capacitance
Reverse transfer capacitance
—
—
VGS = 0V
pF
VDS = 25V
ƒ = 600KHz
—
—
—
—
Source-Drain Ratings and Characteristics
Symbol
Parameter
Continuous Source Current
(Body Diode)
Min.
Typ.
Max.
Units
Conditions
MOSFET symb
showing the
IS
—
—
110
A
integral reverse
p-n junction diode.
IS=68A, VGS=0V
TJ = 25°C, IF =68A, di/dt =
100A/μs
Pulsed Source Current
(Body Diode)
ISM
—
—
440
A
VSD
trr
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
—
—
—
0.94
37
1.3
—
V
ns
nC
Qrr
—
60
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Page 2 of 7
Rev.4.2
SSF5508
55V N-Channel MOSFET
Test Circuits and Waveforms
aveforms:
Notes:
①The maximum current rating is limited by bond-wires.
②Repetitive rating; pulse width limited by max. junction temperature.
③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
④The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
⑤These curves are based on the junction-to-case thermal impedence which is measured with the
device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=175°C.
⑥ The maximum current rating is limited by bond-wires.
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Page 3 of 7
Rev.4.2
SSF5508
55V N-Channel MOSFET
Typical Electrical and Thermal Characteristics
Figure 2. Gate to source cut-off voltage
Figure 1: Typical Output Characteristics
Figure 3. Drain-to-Source Breakdown Voltage vs.
Temperature
Figure 4: Normalized On-Resistance Vs. Case
Temperature
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Page 4 of 7
Rev.4.2
Typical Electrical and Thermal Characteristics
SSF5508
55V N-Channel MOSFET
Figure 5. Maximum Drain Current Vs. Case
Temperature
Figure 6.Typical Capacitance Vs. Drain-to-Source
Voltage
Figure7. Maximum Effective Transient Thermal Impedance, Junction-to-Case
TO-220 Mechanical Data
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Page 5 of 7
Rev.4.2
SSF5508
55V N-Channel MOSFET
COMMON DIMENSIONS
MM
SYMBOL
MIN
NOM
MAX
A
A1
A2
b
4.3 4.57 4.7
1.2
2.2
-
2.4
-
1.4
2.9
0.77
1.23
0.4
0.9
b2
c
-
1.36
0.7
-
D
15.25 15.6 15.8
D1
E
8.59 9.1
9.4
10.4
-
9.66
-
10
8.7
E1
E2
e
9.66
10
10.4
2.54BSC
5.08BSC
6.5
e1
H1
L
6.2
12.6
-
6.7
14.27
3.95
3.9
-
L1
ΦP
Q
-
3.5
3.6
2.65 2.8 2.95
θ1
θ2
a1
a2
d1
d2
f1
f2
f3
g1
1°
1°
-
3°
3°
1.8
3.0
2.0
7.6
1.4
1.5
1.0
2.8
5°
5°
-
-
-
DETAIL ‘A’
-
-
-
-
-
-
-
-
-
-
OPTION1
OPTION2
OPTION3
-
-
DETAIL ‘B’ (BACK VIEW)
DETAIL ‘C’
OPTION1
OPTION2
OPTION3
OPTION1
OPTION2
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Page 6 of 7
Rev.4.2
SSF5508
55V N-Channel MOSFET
Ordering and Marking Information
Device Marking: SSF5508
Package (Available)
TO220
Operating Temperature Range
C : -55 to 175 ºC
Devices per Unit
Packag Units/Tu Tubes/Inner
Units/Inner Inner
Box
Units/Carton
Boxes/Carton Box
Box
e Type be
Box
TO220
50
20
1000
6
6000
Reliability Test Program
Test Item
High
Conditions
Tj=125℃ to 175℃ @
Duration Sample Size
168 hours
500 hours
1000 hours
3 lots x 77 devices
Temperature
Reverse
80% of Max
VDSS/VCES/VR
Bias(HTRB)
High
Tj=150℃ or 175℃ @
168 hours
500 hours
1000 hours
3 lots x 77 devices
Temperature
Gate
100% of Max VGSS
Bias(HTGB)
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Page 7 of 7
Rev.4.2
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