GS8160E36GT-133IT [GSI]
Cache SRAM, 512KX36, 8.5ns, CMOS, PQFP100, TQFP-100;型号: | GS8160E36GT-133IT |
厂家: | GSI TECHNOLOGY |
描述: | Cache SRAM, 512KX36, 8.5ns, CMOS, PQFP100, TQFP-100 静态存储器 |
文件: | 总25页 (文件大小:647K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
GS8160E18/32/36T-250/225/200/166/150/133
250 MHz–133 MHz
100-Pin TQFP
Commercial Temp
Industrial Temp
1M x 18, 512K x 36
18Mb Sync Burst SRAMs
2.5 V or 3.3 V V
DD
2.5 V or 3.3 V I/O
with the Linear Burst Order (LBO) input. The Burst function need not
be used. New addresses can be loaded on every cycle with no
degradation of chip performance.
Features
• FT pin for user-configurable flow through or pipeline
operation
Flow Through/Pipeline Reads
• Dual Cycle Deselect (DCD) operation
• 2.5 V or 3.3 V +10%/–10% core power supply
• 2.5 V or 3.3 V I/O supply
The function of the Data Output register can be controlled by the user
via the FT mode pin (Pin 14). Holding the FT mode pin low places the
RAM in Flow Through mode, causing output data to bypass the Data
Output Register. Holding FT high places the RAM in Pipeline mode,
activating the rising-edge-triggered Data Output Register.
• LBO pin for Linear or Interleaved Burst mode
• Internal input resistors on mode pins allow floating mode pins
• Default to Interleaved Pipeline mode
DCD Pipelined Reads
• Byte Write (BW) and/or Global Write (GW) operation
• Internal self-timed write cycle
The GS8160E18/32/36T is a DCD (Dual Cycle Deselect) pipelined
synchronous SRAM. SCD (Single Cycle Deselect) versions are also
available. DCD SRAMs pipeline disable commands to the same
degree as read commands. DCD RAMs hold the deselect command
for one full cycle and then begin turning off their outputs just after the
second rising edge of clock.
• Automatic power-down for portable applications
• JEDEC-standard 100-lead TQFP package
Functional Description
Applications
Byte Write and Global Write
The GS8160E18/32/36T is an 18,874,368-bit (16,777,216-bit for x32
version) high performance synchronous SRAM with a 2-bit burst
address counter. Although of a type originally developed for Level 2
Cache applications supporting high performance CPUs, the device
now finds application in synchronous SRAM applications, ranging
from DSP main store to networking chip set support.
Byte write operation is performed by using Byte Write enable (BW)
input combined with one or more individual byte write signals (Bx).
In addition, Global Write (GW) is available for writing all bytes at one
time, regardless of the Byte Write control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion (High) of
the ZZ signal, or by stopping the clock (CK). Memory data is retained
during Sleep mode.
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst control
inputs (ADSP, ADSC, ADV), and write control inputs (Bx, BW, GW)
are synchronous and are controlled by a positive-edge-triggered clock
input (CK). Output enable (G) and power down control (ZZ) are
asynchronous inputs. Burst cycles can be initiated with either ADSP
or ADSC inputs. In Burst mode, subsequent burst addresses are
generated internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or interleave order
Core and Interface Voltages
The GS8160E18/32/36T operates on a 2.5 V or 3.3 V power supply.
All input are 3.3 V and 2.5 V compatible. Separate output power
(VDDQ) pins are used to decouple output noise from the internal
circuits and are 3.3 V and 2.5 V compatible.
Parameter Synopsis
-250 -225 -200 -166 -150 -133 Unit
Pipeline
3-1-1-1
tKQ
2.5
4.0
2.7
4.4
3.0
5.0
3.4
6.0
3.8
6.7
4.0
7.5
ns
ns
tCycle
Curr (x18)
280
255
300
230
270
200
230
185 165
215 190
mA
mA
3.3 V
2.5 V
Curr (x32/x36) 330
Curr (x18) 275
Curr (x32/x36) 320
250
295
230
265
195
225
180 165
210 185
mA
mA
Flow
Through
2-1-1-1
tKQ
5.5
5.5
6.0
6.0
6.5
6.5
7.0
7.0
7.5
7.5
8.5
8.5
ns
ns
tCycle
Curr (x18)
Curr (x32/x36) 200
175
165
190
160
180
150
170
145 135
165 150
mA
mA
3.3 V
2.5 V
Curr (x18) 175
Curr (x32/x36) 200
165
190
160
180
150
170
145 135
165 150
mA
mA
Rev: 2.13 11/2004
1/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
GS8160E18 100-Pin TQFP Pinout (Package T)
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
A
NC
NC
1
2
3
4
5
6
7
8
9
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
NC
NC
V
NC
V
DDQ
DDQ
SS
V
NC
DQPA
DQA
DQA
V
V
V
SS
NC
NC
DQB
DQB
1M x 18
Top View
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
V
SS
DDQ
SS
V
DDQ
DQA
DQA
DQB
DQB
V
FT
SS
NC
V
DD
V
NC
DD
ZZ
V
SS
DQA
DQA
DQB
DQB
V
V
V
DQA
DQA
NC
NC
V
V
NC
NC
NC
DDQ
DDQ
SS
V
SS
DQB
DQB
DQPB
NC
V
SS
DDQ
SS
V
DDQ
NC
NC
NC
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 2.13 11/2004
2/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
GS8160E32 100-Pin TQFP Pinout (Package T)
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
NC
DQB
DQB
V
NC
DQC
DQC
1
2
3
4
5
6
7
8
9
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
V
DDQ
DDQ
V
V
SS
SS
DQB
DQB
DQB
DQB
DQC
DQC
DQC
DQC
512K x 32
Top View
V
V
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
V
SS
DDQ
SS
V
DDQ
DQB
DQB
DQC
DQC
V
SS
FT
NC
V
DD
V
ZZ
NC
DD
V
SS
DQA
DQA
V
DQD
DQD
DDQ
V
DDQ
SS
V
V
SS
DQA
DQA
DQA
DQA
DQD
DQD
DQD
DQD
V
V
V
SS
DDQ
SS
V
DDQ
DQA
DQA
NC
DQD
DQD
NC
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 2.13 11/2004
3/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
GS8160E36 100-Pin TQFP Pinout (Package T)
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
DQPB
DQB
DQPC
DQC
1
2
3
4
5
6
7
8
9
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
DQB
DQC
V
V
V
DDQ
DDQ
SS
V
SS
DQB
DQB
DQB
DQB
DQC
DQC
DQC
DQC
512K x 36
Top View
V
V
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
V
SS
DDQ
SS
V
DDQ
DQB
DQB
DQC
DQC
V
SS
FT
NC
V
DD
V
ZZ
NC
DD
V
SS
DQA
DQA
DQD
DQD
DDQ
V
V
V
DDQ
SS
V
SS
DQA
DQA
DQA
DQA
DQD
DQD
DQD
DQD
V
V
SS
DDQ
SS
V
V
DDQ
DQA
DQD
DQA
DQD
DQPA
DQPD
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 2.13 11/2004
4/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
TQFP Pin Description
Symbol
A0, A1
A
Type
Description
Address field LSBs and Address Counter preset Inputs
Address Input
I
I
DQA
DQB
DQC
DQD
I/O
Data Input and Output pins
NC
—
No Connect
Byte Write—Writes all enabled bytes; active low
Byte Write Enable for DQA, DQB Data I/Os; active low
Clock Input Signal; active high
BW
I
I
I
I
I
I
I
I
I
I
I
I
I
BA, BB, BC, BD
CK
GW
Global Write Enable—Writes all bytes; active low
Chip Enable; active low
E1
E2
Chip Enable; active high
E3
Chip Enable; active low
G
ADV
Output Enable; active low
Burst address counter advance enable; active low
Address Strobe (Processor, Cache Controller); active low
Sleep Mode control; active high
ADSP, ADSC
ZZ
LBO
Linear Burst Order mode; active low
Core power supply
V
DD
V
I
I
I/O and Core Ground
SS
V
Output driver power supply
DDQ
Rev: 2.13 11/2004
5/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
GS8160E18/32/36 Block Diagram
RegisteQr
A0–An
D
A0
A1
A0
A1
D0
D1
Counter
Load
Q0
Q1
A
LBO
ADV
CK
Memory
Array
ADSC
ADSP
Q
D
Register
GW
BW
BA
D
Q
Register
36
36
D
Q
BB
BC
BD
4
Register
D
Q
Register
D
Q
Register
D
Q
Register
E1
E2
E3
D
Q
Register
D
Q
FT
G
0
Power Down
Control
DQx1–DQx9
ZZ
Note: Only x36 version shown for simplicity.
Rev: 2.13 11/2004
6/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Mode Pin Functions
Mode Name
Pin Name
State
Function
Linear Burst
Interleaved Burst
Flow Through
Pipeline
L
Burst Order Control
Output Register Control
Power Down Control
LBO
H
L
FT
ZZ
H or NC
L or NC
H
Active
Standby, I = I
DD SB
Note:
There is a pull-up device on the FT pin and a pull-down device on the ZZ pin, so this input pin can be unconnected and the chip will operate in
the default states as specified in the above tables.
Burst Counter Sequences
Linear Burst Sequence
A[1:0] A[1:0] A[1:0] A[1:0]
Interleaved Burst Sequence
A[1:0] A[1:0] A[1:0] A[1:0]
1st address
2nd address
3rd address
4th address
00
01
10
11
01
10
11
00
10
11
00
01
11
00
01
10
1st address
2nd address
3rd address
4th address
00
01
10
11
01
00
11
10
10
11
00
01
11
10
01
00
Note:
The burst counter wraps to initial state on the 5th clock.
Note:
The burst counter wraps to initial state on the 5th clock.
BPR 1999.05.18
Rev: 2.13 11/2004
7/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Byte Write Truth Table
Function
Read
GW
BW
H
L
BA
X
BB
X
BC
X
BD
X
Notes
1
H
H
H
H
H
H
H
L
Read
H
L
H
H
L
H
H
H
L
H
H
H
H
L
1
Write byte a
Write byte b
Write byte c
Write byte d
Write all bytes
Write all bytes
L
2, 3
L
H
H
H
L
2, 3
L
H
H
L
2, 3, 4
2, 3, 4
2, 3, 4
L
H
L
L
L
X
X
X
X
X
Notes:
1. All byte outputs are active in read cycles regardless of the state of Byte Write Enable inputs.
2. Byte Write Enable inputs BA, BB, BC and/or BD may be used in any combination with BW to write single or multiple bytes.
3. All byte I/Os remain High-Z during all write operations regardless of the state of Byte Write Enable inputs.
4. Bytes “C” and “D” are only available on the x32 and x36 versions.
Rev: 2.13 11/2004
8/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Synchronous Truth Table
Operation
State
Address
Used
2
3
4
Diagram
E1
ADSP ADSC ADV
E
W
DQ
5
Key
Deselect Cycle, Power Down
Deselect Cycle, Power Down
Deselect Cycle, Power Down
Read Cycle, Begin Burst
None
None
X
X
H
L
X
X
L
L
X
L
X
X
X
X
X
X
L
X
X
X
X
F
T
F
F
T
T
F
F
T
T
High-Z
F
F
T
T
T
X
X
X
X
X
X
X
X
High-Z
None
X
L
L
H
L
High-Z
External
External
External
Next
R
X
L
Q
Q
D
Q
Q
D
D
Q
Q
D
D
Read Cycle, Begin Burst
Write Cycle, Begin Burst
Read Cycle, Continue Burst
Read Cycle, Continue Burst
Write Cycle, Continue Burst
Write Cycle, Continue Burst
Read Cycle, Suspend Burst
Read Cycle, Suspend Burst
Write Cycle, Suspend Burst
Write Cycle, Suspend Burst
R
L
L
X
H
X
H
X
H
X
H
H
H
H
X
H
X
H
X
H
X
W
L
CR
CR
CW
CW
H
H
H
H
H
H
H
H
Next
L
Next
L
Next
L
Current
Current
Current
Current
H
H
H
H
Notes:
1. X = Don’t Care, H = High, L = Low
2. E = T (True) if E2 = 1 and E3 = 0; E = F (False) if E2 = 0 or E3 = 1
3. W = T (True) and F (False) is defined in the Byte Write Truth Table preceding.
4. G is an asynchronous input. G can be driven high at any time to disable active output drivers. G low can only enable active drivers (shown
as “Q” in the Truth Table above).
5. All input combinations shown above are tested and supported. Input combinations shown in gray boxes need not be used to accomplish
basic synchronous or synchronous burst operations and may be avoided for simplicity.
6. Tying ADSP high and ADSC low allows simple non-burst synchronous operations. See BOLD items above.
7. Tying ADSP high and ADV low while using ADSC to load new addresses allows simple burst operations. See ITALIC items above.
Rev: 2.13 11/2004
9/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Simplified State Diagram
X
Deselect
W
R
W
R
X
R
X
First Write
First Read
CW
CR
CR
W
R
R
X
Burst Write
X
Burst Read
CR
CW
CR
Notes:
1. The diagram shows only supported (tested) synchronous state transitions. The diagram presumes G is tied low.
2. The upper portion of the diagram assumes active use of only the Enable (E1, E2, and E3) and Write (BA, BB, BC, BD, BW, and GW)
control inputs, and that ADSP is tied high and ADSC is tied low.
3. The upper and lower portions of the diagram together assume active use of only the Enable, Write, and ADSC control inputs, and
assumes ADSP is tied high and ADV is tied low.
Rev: 2.13 11/2004
10/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Simplified State Diagram with G
X
Deselect
W
R
W
R
X
W
R
X
First Write
First Read
CR
CW
CW
CR
W
R
R
W
X
Burst Write
X
Burst Read
CR
CW
CW
CR
Notes:
1. The diagram shows supported (tested) synchronous state transitions plus supported transitions that depend upon the use of G.
2. Use of “Dummy Reads” (Read Cycles with G High) may be used to make the transition from Read cycles to Write cycles without passing
through a Deselect cycle. Dummy Read cycles increment the address counter just like normal read cycles.
3. Transitions shown in gray tone assume G has been pulsed high long enough to turn the RAM’s drivers off and for incoming data to meet
Data Input Set Up Time.
Rev: 2.13 11/2004
11/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Absolute Maximum Ratings
(All voltages reference to V
)
SS
Symbol
Description
Value
Unit
V
V
Voltage on V Pins
–0.5 to 4.6
DD
DD
V
Voltage in V
Pins
DDQ
–0.5 to 4.6
V
DDQ
V
–0.5 to V
+0.5 (≤ 4.6 V max.)
DDQ
Voltage on I/O Pins
Voltage on Other Input Pins
Input Current on Any Pin
Output Current on Any I/O Pin
Package Power Dissipation
Storage Temperature
V
I/O
V
–0.5 to V +0.5 (≤ 4.6 V max.)
V
IN
DD
I
+/–20
+/–20
mA
mA
W
IN
I
OUT
P
1.5
D
o
T
–55 to 125
–55 to 125
C
STG
o
T
Temperature Under Bias
C
BIAS
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended
Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended period of time, may affect reliability of
this component.
Power Supply Voltage Ranges
Parameter
Symbol
Min.
3.0
Typ.
3.3
Max.
3.6
Unit
Notes
V
3.3 V Supply Voltage
2.5 V Supply Voltage
V
V
V
V
DD3
V
2.3
2.5
2.7
DD2
3.3 V V
I/O Supply Voltage
V
3.0
3.3
3.6
DDQ
DDQ
DDQ3
2.5 V V
I/O Supply Voltage
V
2.3
2.5
2.7
DDQ2
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifica-
tions quoted are evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < V +2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
DDn
Rev: 2.13 11/2004
12/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
V
Range Logic Levels
Parameter
DDQ3
Symbol
Min.
2.0
Typ.
—
Max.
Unit
Notes
V
Input High Voltage
V
V
+ 0.3
DD
V
V
V
V
1
DD
IH
V
Input Low Voltage
V
–0.3
2.0
—
0.8
+ 0.3
1
DD
IL
V
I/O Input High Voltage
I/O Input Low Voltage
V
V
—
1,3
1,3
DDQ
IHQ
DDQ
V
V
–0.3
—
0.8
DDQ
ILQ
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifica-
tions quoted are evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < V +2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
DDn
3.
V
(max) is voltage on V
pins plus 0.3 V.
IHQ
DDQ
V
Range Logic Levels
Parameter
DDQ2
Symbol
Min.
Typ.
—
Max.
Unit
Notes
V
Input High Voltage
V
0.6*V
V
+ 0.3
DD
V
V
V
V
1
DD
IH
DD
V
Input Low Voltage
V
0.3*V
DD
–0.3
—
1
DD
IL
V
I/O Input High Voltage
I/O Input Low Voltage
V
0.6*V
V
+ 0.3
DDQ
—
1,3
1,3
DDQ
IHQ
DD
V
V
0.3*V
DD
–0.3
—
DDQ
ILQ
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifica-
tions quoted are evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < V +2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
DDn
3.
V
(max) is voltage on V
pins plus 0.3 V.
IHQ
DDQ
Recommended Operating Temperatures
Parameter
Symbol
Min.
0
Typ.
25
Max.
70
Unit
°C
Notes
T
Ambient Temperature (Commercial Range Versions)
2
2
A
T
Ambient Temperature (Industrial Range Versions)
–40
25
85
°C
A
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifica-
tions quoted are evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < V +2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
DDn
Rev: 2.13 11/2004
13/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Undershoot Measurement and Timing
Overshoot Measurement and Timing
V
IH
50% tKC
V
+ 2.0 V
50%
DD
V
SS
50%
V
DD
V
– 2.0 V
SS
50% tKC
V
IL
Capacitance
o
(T = 25 C, f = 1 MHZ, V = 2.5 V)
A
DD
Parameter
Symbol
Test conditions
Typ.
Max.
Unit
pF
C
V
= 0 V
Input Capacitance
4
6
5
7
IN
IN
C
V
OUT
= 0 V
Input/Output Capacitance
pF
I/O
Note:
These parameters are sample tested.
AC Test Conditions
Parameter
Conditions
V
– 0.2 V
Input high level
Input low level
DD
0.2 V
1 V/ns
/2
Input slew rate
V
Input reference level
DD
V
/2
Output reference level
Output load
DDQ
Fig. 1
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
Output Load 1
DQ
*
50Ω
30pF
V
DDQ/2
* Distributed Test Jig Capacitance
Rev: 2.13 11/2004
14/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
I
V = 0 to V
IN DD
–1 uA
1 uA
IL
V
≥ V ≥ V
IN
–1 uA
–1 uA
1 uA
100 uA
DD
IH
IH
I
ZZ Input Current
FT Input Current
IN1
0 V ≤ V ≤ V
IN
V
≥ V ≥ V
IN
–100 uA
–1 uA
1 uA
1 uA
DD
IL
IL
I
IN2
0 V ≤ V ≤ V
IN
I
Output Disable, V
= 0 to V
DD
Output Leakage Current
Output High Voltage
Output High Voltage
Output Low Voltage
–1 uA
1.7 V
2.4 V
—
1 uA
—
OL
OUT
DDQ
DDQ
V
I
I
= –8 mA, V
= –8 mA, V
= 2.375 V
= 3.135 V
OH2
OH
OH
V
—
OH3
V
I
= 8 mA
OL
0.4 V
OL
Rev: 2.13 11/2004
15/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Rev: 2.13 11/2004
16/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
AC Electrical Characteristics
-250
-225
-200
-166
-150
-133
Parameter
Symbol
Unit
Min Max Min Max Min Max Min Max Min Max Min Max
Clock Cycle Time
tKC
tKQ
4.0
—
—
2.5
—
—
—
—
—
5.5
—
—
—
—
—
—
4.4
—
—
2.7
—
—
—
—
—
6.0
—
—
—
—
—
—
5.0
—
—
3.0
—
—
—
—
—
6.5
—
—
—
—
—
—
6.0
—
—
3.4
—
—
—
—
—
7.0
—
—
—
—
—
—
6.7
—
—
3.8
—
—
—
—
—
7.5
—
—
—
—
—
—
7.5
—
1.5
1.5
1.5
0.5
8.5
—
3.0
3.0
1.5
0.5
1.7
2
—
4.0
—
—
—
—
—
8.5
—
—
—
—
—
—
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Clock to Output Valid
Clock to Output Invalid
Pipeline
tKQX
1.5
1.5
1.2
0.2
5.5
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.3
0.3
6.0
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.4
0.4
6.5
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.5
0.5
7.0
—
3.0
3.0
1.5
0.5
1.3
1.5
1.5
1.5
1.5
0.5
7.5
—
3.0
3.0
1.5
0.5
1.5
1.7
1
Clock to Output in Low-Z
tLZ
Setup time
Hold time
tS
tH
Clock Cycle Time
Clock to Output Valid
tKC
tKQ
tKQX
Clock to Output Invalid
Clock to Output in Low-Z
Setup time
Flow
Through
1
tLZ
tS
tH
Hold time
Clock HIGH Time
Clock LOW Time
tKH
tKL
Clock to Output in
High-Z
1
1.5
2.3
1.5
2.5
1.5
3.0
1.5
3.0 1.5 3.0 1.5 3.0
ns
tHZ
G to Output Valid
G to output in Low-Z
G to output in High-Z
ZZ setup time
tOE
—
0
2.3
—
2.3
—
—
—
—
0
2.5
—
2.5
—
—
—
—
0
3.2
—
3.0
—
—
—
—
0
3.5
—
3.0
—
—
—
—
0
3.8
—
3.0
—
—
—
—
0
4.0
—
3.0
—
—
—
ns
ns
ns
ns
ns
ns
1
tOLZ
1
—
5
—
5
—
5
—
5
—
5
—
5
tOHZ
2
tZZS
2
ZZ hold time
1
1
1
1
1
1
tZZH
ZZ recovery
tZZR
20
20
20
20
20
20
Notes:
1. These parameters are sampled and are not 100% tested.
2. ZZ is an asynchronous signal. However, in order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold
times as specified above.
Rev: 2.13 11/2004
17/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Pipeline Mode Timing
Begin
Read A Cont
Deselect Deselect Write B Read C Read C+1 Read C+2 Read C+3 Cont
tKL
Deselect Deselect
tKH
tKC
CK
ADSP
tS
tS
ADSC initiated read
tH
ADSC
ADV
tS
tH
tH
A
B
C
Ao–An
GW
tS
tS
tH
tH
BW
tS
Ba–Bd
E1
tS
tS
tS
Deselected with E1
tH
E2 and E3 only sampled with ADSC
tH
tH
E2
E3
G
tS
D(B)
tKQ
tHZ
tOE
tOHZ
Q(A)
tH
tLZ
tKQX
Hi-Z
Q(C)
Q(C+1)
Q(C+2)
Q(C+3)
DQa–DQd
Rev: 2.13 11/2004
18/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Flow Through Mode Timing
Begin
Read A Cont
tKH
Deselect Write B
tKC
Read C Read C+1 Read C+2 Read C+3 Read C Deselect
tKL
CK
Fixed High
ADSP
tS
tH
tS
tH
ADSC initiated read
ADSC
ADV
Ao–An
GW
tH
tS
tS
tH
tS
tH
A
B
C
tS
tH
tS
tH
BW
tH
tS
Ba–Bd
E1
tS
Deselected with E1
tH
E1 masks ADSP
tS
tH
E2 and E3 only sampled with ADSP and ADSC
E1 masks ADSP
E2
tS
tH
E3
G
tH
tS
tOE
tKQ
tKQX
tHZ
tOHZ
D(B)
tLZ
Q(A)
Q(C)
Q(C+1)
Q(C+2)
Q(C+3)
Q(C)
DQa–DQd
Rev: 2.13 11/2004
19/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Sleep Mode
During normal operation, ZZ must be pulled low, either by the user or by its internal pull down resistor. When ZZ is pulled high,
the SRAM will enter a Power Sleep mode after 2 cycles. At this time, internal state of the SRAM is preserved. When ZZ returns to
low, the SRAM operates normally after ZZ recovery time.
Sleep mode is a low current, power-down mode in which the device is deselected and current is reduced to I 2. The duration of
SB
Sleep mode is dictated by the length of time the ZZ is in a High state. After entering Sleep mode, all inputs except ZZ become
disabled and all outputs go to High-Z The ZZ pin is an asynchronous, active high input that causes the device to enter Sleep mode.
When the ZZ pin is driven high, I 2 is guaranteed after the time tZZI is met. Because ZZ is an asynchronous input, pending
SB
operations or operations in progress may not be properly completed if ZZ is asserted. Therefore, Sleep mode must not be initiated
until valid pending operations are completed. Similarly, when exiting Sleep mode during tZZR, only a Deselect or Read commands
may be applied while the SRAM is recovering from Sleep mode.
Sleep Mode Timing Diagram
tKH
tKC
tKL
CK
Setup
Hold
ADSP
ADSC
tZZR
tZZS
tZZH
ZZ
Application Tips
Single and Dual Cycle Deselect
SCD devices force the use of “dummy read cycles” (read cycles that are launched normally, but that are ended with the output
drivers inactive) in a fully synchronous environment. Dummy read cycles waste performance, but their use usually assures there
will be no bus contention in transitions from reads to writes or between banks of RAMs. DCD SRAMs (like this one) do not waste
bandwidth on dummy cycles and are logically simpler to manage in a multiple bank application (wait states need not be inserted at
bank address boundary crossings), but greater care must be exercised to avoid excessive bus contention.
Rev: 2.13 11/2004
20/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
TQFP Package Drawing (Package T)
θ
L
c
L1
Symbol
Description
Standoff
Min. Nom. Max
A1
A2
b
0.05
1.35
0.20
0.09
0.10
1.40
0.30
—
0.15
1.45
0.40
0.20
22.1
20.1
16.1
14.1
—
Body Thickness
Lead Width
c
Lead Thickness
D
Terminal Dimension 21.9
Package Body 19.9
Terminal Dimension 15.9
22.0
20.0
16.0
14.0
0.65
0.60
1.00
e
D1
E
b
E1
e
Package Body
Lead Pitch
13.9
—
L
Foot Length
Lead Length
Coplanarity
Lead Angle
0.45
—
0.75
—
L1
Y
A1
A2
E1
E
0.10
7°
θ
0°
—
Notes:
1. All dimensions are in millimeters (mm).
2. Package width and length do not include mold protrusion.
Rev: 2.13 11/2004
21/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Ordering Information for GSI Synchronous Burst RAMs
2
Speed
3
1
Org
Type
Package
Status
T
Part Number
A
(MHz/ns)
1M x 18
1M x 18
GS8160E18T-250
GS8160E18T-225
GS8160E18T-200
GS8160E18T-166
GS8160E18T-150
GS8160E18T-133
GS8160E32T-250
GS8160E32T-225
GS8160E32T-200
GS8160E32T-166
GS8160E32T-150
GS8160E32T-133
GS8160E36T-250
GS8160E36T-225
GS8160E36T-200
GS8160E36T-166
GS8160E36T-150
GS8160E36T-133
GS8160E18T-250I
GS8160E18T-225I
GS8160E18T-200I
GS8160E18T-166I
GS8160E18T-150I
GS8160E18T-133I
GS8160E32T-250I
GS8160E32T-225I
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
250/5.5
225/6
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
C
I
1M x 18
200/6.5
166/7
1M x 18
1M x 18
150/7.5
133/8.5
250/5.5
225/6
1M x 18
512K x 32
512K x 32
512K x 32
512K x 32
512K x 32
512K x 32
512K x 36
512K x 36
512K x 36
512K x 36
512K x 36
512K x 36
1M x 18
200/6.5
166/7
150/7.5
133/8.5
250/5.5
225/6
200/6.5
166/7
150/7.5
133/8.5
250/5.5
225/6
1M x 18
I
1M x 18
200/6.5
166/7
I
1M x 18
I
1M x 18
150/7.5
133/8.5
250/5.5
225/6
I
1M x 18
I
512K x 32
I
512K x 32
I
Notes:
1. Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS8160E18T-150IT.
2. The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each
device is Pipeline/Flow through mode-selectable by the user.
3. T = C = Commercial Temperature Range. T = I = Industrial Temperature Range.
A
A
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which
are covered in this data sheet. See the GSI Technology web site (www.gsitechnology.com) for a complete listing of current offerings.
Rev: 2.13 11/2004
22/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
Ordering Information for GSI Synchronous Burst RAMs
2
Speed
3
1
Org
Type
Package
Status
T
Part Number
A
(MHz/ns)
512K x 32
512K x 32
512K x 32
512K x 32
512K x 36
512K x 36
512K x 36
512K x 36
512K x 36
GS8160E32T-200I
GS8160E32T-166I
GS8160E32T-150I
GS8160E32T-133I
GS8160E36T-250I
GS8160E36T-225I
GS8160E36T-200I
GS8160E36T-166I
GS8160E36T-150I
GS8160E36T-133I
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
DCD Pipeline/Flow Through
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
200/6.5
166/7
I
I
I
I
I
I
I
I
I
I
150/7.5
133/8.5
250/5.5
225/6
200/6.5
166/7
150/7.5
133/8.5
512K x 36
Notes:
1. Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS8160E18T-150IT.
2. The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each
device is Pipeline/Flow through mode-selectable by the user.
3. T = C = Commercial Temperature Range. T = I = Industrial Temperature Range.
A
A
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which
are covered in this data sheet. See the GSI Technology web site (www.gsitechnology.com) for a complete listing of current offerings.
Rev: 2.13 11/2004
23/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
18Mb Sync SRAM Datasheet Revision History
DS/DateRev. Code: Old;
New
Types of Changes
Format or Content
Page;Revisions;Reason
• Converted from 0.25u 3.3V process to 0.18u 2.5V process.
Master File Rev B
GS8160E18T-150IT 1.00 9/
1999A;GS8160E18T-150IT
2.00 1/1999B
Content
Format
• Added x72 Pinout.
• Added GSI Logo.
• Changed Flow-Through Read-Write cycle Timing Diagram for
accuracy
GS8160E18T- 2.00 11/
1999B;GS8160E18T 2.01 1/
2000C
• Changed pin description in TQFP to match order of pins in
pinout.
GS8160E18T 2.01 1/
2000C;GS8160E18 T 2.02 1/
2000D
• Front page; Features - changed 2.5V I/O supply to 2.5V
or3.3V I/O supply; Core and Interface voltages - Changed
paragraph to include information for 3.3V;Completeness
• Absolute Maximum Ratings; Changed VDDQ - Value: From: -
.05 to VDD : to : -.05 to 3.6; Completeness.
GS18/362.0 1/2000DGS18/
362.03 2/2000E
• Recommended Operating Conditions;Changed: I/O Supply
Voltage- Max. from VDD to 3.6; Input High Voltage- Max. from
VDD +0.3 to 3.6; Same page - took out Note 1;Completeness
• Electrical Characteristics - Added second Output High Voltage
line to table; completeness.
• Note: There was not a Rev 2.02 for the 8160Z or the 8161Z.
• Changed the value of ZZ recovery in the AC Electrical
Characteristics table on page 15 from 20 ns to 100 ns
GS18/362.03 2/2000E;
8160E18_r2_04
Content
• Added 225 MHz speed bin
• Updated Pg. 1 table, AC Characteristics table, and Operating
Currents table to match 815xxx
8160E18_r2_04;
8160E18_r2_05
Content/Format
• Updated format to comply with Technical Publications
standards
• Updated Capitance table—removed Input row and changed
Output row to I/O
8160E18_r2_05;
8160E18_r2_06
Content
Content
• Updated Features list on page 1
8160E18_r2_06;
8160E18_r2_07
• Completely reworked table on page 1
• Updated Mode Pin Functions table on page 7
• Added 3.3 V references to entire document
• Updated Operating Conditions table
8160E18_r2_07;
8160E18_r2_08
• Added Pin 56 to Pin Description table
Content
• Updated Operating Currents table and added note
• Updated Application Tips paragraph
• Updated table on page 1; added power numbers
Rev: 2.13 11/2004
24/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
GS8160E18/32/36T-250/225/200/166/150/133
18Mb Sync SRAM Datasheet Revision History
DS/DateRev. Code: Old;
New
Types of Changes
Format or Content
Page;Revisions;Reason
• Updated Operating Currents table
• Updated table on page 1; updated power numbers
8160E18_r2_08;
8160E18_r2_09
Content
Content
• Updated Recommended Operating Conditions table (added
V
references)
DDQ
• Updated table on page 1
• Created recommended operating conditions tables on pages
12 and 13
• Updated AC Electrical Characteristics table
• Added Sleep mode description on page 23
• Updated Ordering Information for 225 MHz part (changed
from 7ns to 6.5 ns)
8160E18_r2_09;
8160E18_r2_10
• Added 250 MHz speed bin
• Deleted 180 MHz speed bin
• Updated AC Characteristics table
• Updated FT power numbers
8160E18_r2_10;
8160E18_r2_11
• Updated ZZ recovery time diagram
• Updated Mb references from 16Mb to 18Mb
• Updated AC Test Conditions table and removed Output Load
2 diagram
Content
• Removed pin locations from pin description table
• Removed Preliminary banner
8160E18_r2_11;
8160E18_r2_12
Content
• Updated format
8160E18_r2_12;
8160E18_r2_13
Format/Content
• Updated timing diagrams
Rev: 2.13 11/2004
25/25
© 1999, GSI Technology
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
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