HSD32M72D18A-13 [HANBIT]
Synchronous DRAM Module 256Mbyte (32Mx72bit), DIMM with ECC based on 16Mx8, 4Banks, 4K Ref., 3.3V; 同步DRAM模组256Mbyte ( 32Mx72bit ) ,与DIMM ECC基于16Mx8 , 4Banks , 4K参考, 3.3V型号: | HSD32M72D18A-13 |
厂家: | HANBIT ELECTRONICS CO.,LTD |
描述: | Synchronous DRAM Module 256Mbyte (32Mx72bit), DIMM with ECC based on 16Mx8, 4Banks, 4K Ref., 3.3V |
文件: | 总10页 (文件大小:178K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
HANBit
HSD32M72D18A
Synchronous DRAM Module 256Mbyte (32Mx72bit), DIMM with ECC based on
16Mx8, 4Banks, 4K Ref., 3.3V
Part No. HSD32M72D18A (Unbuffered)
GENERAL DESCRIPTION
The HSD32M72D18A is a 32M x 72 bit Synchronous Dynamic RAM high-density memory module. The module consists
of eighteen CMOS 16M x 8 bit with 4banks Synchronous DRAMs in TSOP-II 400mil packages and 2K EEPROM in 8-pin
TSSOP package on a 168-pin glass-epoxy. Two 0.33uF-decoupling capacitors are mounted on the printed circuit board in
parallel for each SDRAM. The HSD32M72D18A is a DIMM (Dual in line Memory Module) and is intended for mounting into
168-pin edge connector sockets. Synchronous design allows precise cycle control with the use of system clock. I/O
transactions are possible on every clock cycle. Range of operating frequencies, programmable latencies allows the same
device to be useful for a variety of high bandwidth, high performance memory system applications All module components
may be powered from a single 3.3V DC power supply and all inputs and outputs are LVTTL-compatible.
FEATURES
• Part Identification
HSD32M72D18A-F/10L : 100MHz (CL=3)
HSD32M72D18A-F/10 : 100MHz (CL=2)
HSD32M72D18A-F/12 : 125MHz (CL=3)
HSD32M72D18A-F/13 : 133MHz (CL=3)
F means Auto & Self refresh with Low-Power (3.3V)
• Burst mode operation
• Auto & self refresh capability (4096 Cycles/64ms)
• LVTTL compatible inputs and outputs
• Single 3.3V ±0.3V power supply
• MRS cycle with address key programs
- Latency (Access from column address)
- Burst length (1, 2, 4, 8 & Full page)
- Data scramble (Sequential & Interleave)
• All inputs are sampled at the positive going edge of the system clock
• The used device is 8M x 8bit , 4Banks SDRAM
URL: www.hbe.co.kr
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HSD32M72D18A
PIN ASSIGNMENT
PIN Symbol PIN
Symbol
DQM1
/CE0
NC
PIN
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
Symbol
DQ18
DQ19
Vcc
PIN
85
Symbol
Vss
PIN
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
Symbol
DQM5
/CE1
/RAS
Vss
PIN
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
Symbol
DQ50
DQ51
Vcc
1
Vss
DQ0
DQ1
DQ2
DQ3
Vcc
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
2
86
DQ32
DQ33
DQ34
DQ35
Vcc
3
87
4
Vss
DQ20
NC
88
DQ52
NC
5
A0
89
A1
6
A2
NC
90
A3
NC
7
DQ4
DQ5
DQ6
DQ7
DQ8
Vss
A4
CKE1
Vss
91
DQ36
DQ37
DQ38
DQ39
DQ40
Vss
A5
NC
8
A6
92
A7
Vss
9
A8
DQ21
DQ22
DQ23
Vss
93
A9
DQ53
DQ54
DQ55
Vss
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
A10
BA1
Vcc
94
BA0
A11
95
96
Vcc
DQ9
DQ10
DQ11
DQ12
DQ13
Vcc
Vcc
DQ24
DQ25
DQ26
DQ27
Vcc
97
DQ41
DQ42
DQ43
DQ44
DQ45
Vcc
CLK1
NC
DQ56
DQ57
DQ58
DQ59
Vcc
CLK0
Vss
98
99
Vss
NC
100
101
102
103
104
105
106
107
108
109
110
111
112
CKE0
/CE3
DQM6
DQM7
NC
/CE2
DQM2
DQM3
NC
DQ28
DQ29
DQ30
DQ31
Vss
DQ60
DQ61
DQ62
DQ63
Vss
DQ14
DQ15
CB0
CB1
Vss
DQ46
DQ47
CB4
Vcc
Vcc
NC
CB5
NC
NC
CLK2
NC
Vss
NC
CLK3
NC
NC
CB2
CB3
Vss
NC
CB6
CB7
Vss
NC
WP
NC
SA0
Vcc
SDA
SCL
Vcc
SA1
/WE
DQ16
DQ17
/CAS
DQM4
DQ48
DQ49
SA2
DQM0
Vcc
Vcc
* These pins are not used in this module ** These pins should be NC in the system which does not support SPD
*Pin Names
VREF : Power supply for reference
CB0~7 : Check bit (Data in/data-out)
CLK0 ~ CLK3 : Clock input
CKE0 ~ CKE1 : Colck enable input
/CE0 ~ /CE3 : Chip enable input
Vcc : Power supply
Vss : Ground
SDA : Serial data I/O
SCL : Serial clock
SA0 ~ 2 : Address in EEPROM
URL: www.hbe.co.kr
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HSD32M72D18A
FUNCTIONAL BLOCK DIAGRAM
URL: www.hbe.co.kr
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HSD32M72D18A
PIN FUNCTION DESCRIPTION
Pin
Name
System clock
Chip enable
Input Function
CLK
/CE
Active on the positive going edge to sample all inputs.
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
CKE
Clock enable
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
CKE should be enabled 1CLK+tSS prior to valid command.
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA11, Column address : CA0 ~ CA9
A0 ~ A11
BA0 ~ BA1
/RAS
Address
Bank select address Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
Row address strobe Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
/CAS
Column
address Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
strobe
/WE
Write enable
Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
DQM0 ~ 7
Data
input/output Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
mask
DQ0 ~ 63
Vcc/Vss
Data input/output
Power
Data inputs/outputs are multiplexed on the same pins.
Power and ground for the input buffers and the core logic.
supply/ground
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Voltage on Any Pin Relative to Vss
Voltage on Vcc Supply Relative to Vss
Power Dissipation
SYMBOL
VIN ,OUT
Vcc
RATING
-1V to 4.6V
-1V to 4.6V
18W
PD
o
o
Storage Temperature
TSTG
-55 C to 150 C
Short Circuit Output Current
IOS
50mA
Notes:
Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded. Functional operation should be
restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
URL: www.hbe.co.kr
REV.1.0 (August.2002)
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HSD32M72D18A
DC OPERATING CONDITIONS
(Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70°C) )
PARAMETER
Supply Voltage
SYMBOL
Vcc
VIH
MIN
3.0
2.0
-0.3
2.4
-
TYP.
MAX
3.6
UNIT
V
NOTE
3.3
Input High Voltage
Input Low Voltage
Output High Voltage
Output Low Voltage
3.0
Vcc+0.3
0.8
V
1
VIL
0
-
V
2
VOH
VOL
-
V
IOH = -2mA
IOL = 2mA
3
-
0.4
V
Input leakage current
I LI
-10
-
10
uA
Notes :
1. VIH (max) = 5.6V AC. The overshoot voltage duration is £ 3ns.
2. VIL (min) = -2.0V AC. The undershoot voltage duration is £ 3ns.
3. Any input 0V £ VIN £ VDDQ
.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
CAPACITANCE
(VCC = 3.3V, TA = 23°C, f = 1MHz, VREF =1.4V ± 200 mV)
DESCRIPTION
SYMBOL
CCLK
MIN
18
MAX
25
UNITS
Clock
pF
pF
pF
pF
/RAS, /CAS,/WE,/CE, CKE, DQM
Address
CIN
50
95
CADD
50
95
DQ (DQ0 ~ DQ7)
COUT
13
18
DC CHARACTERISTICS
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C)
TEST
CONDITION
VERSION
NOT
E
PARAMETER
SYMBOL
UNIT
-13
-12
-10
10L
Burst length = 1
Operating current
(One bank active)
tRC ³ tRC(min)
IO = 0mA
ICC1
2160
2160
1980
1980
mA
1
CKE £ VIL(max)
tCC=10ns
Precharge standby current
ICC2
P
18
mA
mA
in
CKE & CLK £ VIL(max)
tCC=¥
ICC2PS
18
power-down mode
CKE ³ VIH(min)
CS* ³ VIH(min), tCC=10ns
Input signals are changed
one time during 20ns
CKE ³ VIH(min)
CLK £ VIL(max), tCC=¥
Input signals are stable
Precharge standby current
in
ICC2
N
360
mA
mA
non power-down mode
ICC2NS
ICC3
ICC3PS
126
CKE £ VIL(max), tCC=10ns
P
90
90
Active standby current in
power-down mode
CKE&CLK £ VIL(max)
tCC=¥
URL: www.hbe.co.kr
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HSD32M72D18A
CKE³ VIH(min),
CS*³ VIH(min), tCC=10ns
Input signals are changed
one time during 20ns
CKE³ VIH(min)
CLK £VIL(max), tCC=¥
Input signals are stable
IO = 0 mA
Active standby current in
non power-down mode
(One bank active)
ICC3
N
540
360
mA
ICC3NS
Operating current
(Burst mode)
Page burst
4Banks Activated
tCCD = 2CLKs
ICC4
2700
3960
2610
3960
2250
2250
3780
mA
1
2
tRC ³ tRC(min)
Refresh current
ICC5
ICC6
3780
mA
mA
mA
27
14.4
CKE £ 0.2V
Self refresh current
Notes:
1. Measured with outputs open.
2. Refresh period is 64ms.
3. Unless otherwise noticed, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ).
AC OPERATING TEST CONDITIONS
(vcc = 3.3V ± 0.3V, TA = 0 to 70°C)
PARAMETER
Value
UNIT
AC Input levels (Vih/Vil)
2.4/0.4
1.4
V
Input timing measurement reference level
Input rise and fall time
V
tr/tf = 1/1
1.4
ns
V
Output timing measurement reference level
Output load condition
See Fig. 2
+3.3V
V =1.4V
tt
1200W
50W
DOUT
DOUT
Z0=50W
870W
50pF*
50pF
V
V
(DC) = 2.4V, I = -2mA
OH
OH
(DC) = 0.4V, I = 2mA
OL
OL
(Fig. 2) AC output load circuit
(Fig. 1) DC output load circuit
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REV.1.0 (August.2002)
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HSD32M72D18A
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
VERSION
-12 -10
PARAMETER
SYMBOL
UNIT
NOTE
-13
15
20
20
45
-10L
20
Row active to row active delay
RAS to CAS delay
tRRD(min)
tRP(min)
16
20
20
48
20
20
20
50
ns
ns
ns
ns
1
1
1
1
20
Row precharge time
tRP(min)
20
tRAS(min)
tRAS(max)
50
Row active time
100
2
ns
Row cycle time
tRC(min)
tRDL(min)
tDAL(min)
tCDL(min)
tBDL(min)
tCCD(min)
65
68
70
70
ns
CLK
-
1
2
Last data in to row precharge
Last data in to Active delay
Last data in to new col. address delay
Last data in to burst stop
2 CLK + 20 ns
1
1
1
2
CLK
CLK
CLK
2
2
3
Col. address to col. address delay
CAS latency=3
CAS latency=2
Number of valid output data
ea
4
-
1
Notes :
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
.5. For -8/H/L/10, tRDL=1CLK and tDAL=1CLK+20ns is also supported .
( recommend : tRDL=2CLK and tDAL=2CLK + 20ns.)
AC CHARACTERISTICS
(AC operating conditions unless otherwise noted)
-13
-12
MAX MIN
-10
MAX MIN
-10L
MAX
PARAMETER
SYMBOL
UNIT
NOTE
MIN MAX MIN
CAS
latency=3
CAS
latency=2
CAS
latency=3
CAS
latency=2
CAS
latency=3
CLK cycle time
7.5
-
8
-
10
10
10
12
tCC
1000
1000
1000
1000
ns
1
CLK to valid
output delay
5.4
-
6
-
6
6
6
7
tSAC
ns
ns
1,2
2
Output data
hold time
2.7
3
3
3
tOH
CAS
latency=2
-
-
3
3
3
2
3
3
3
2
CLK high pulse width
CLK low pulse width
Input setup time
tCH
tCL
tSS
2.5
2.5
1.5
3
3
2
ns
ns
ns
3
3
3
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HSD32M72D18A
Input hold time
tSH
0.8
1
1
1
1
1
1
ns
ns
ns
3
CLK to output in Low-Z
tSLZ
1
3
2
CAS
latency=3
CAS
latency=2
CLK to output
5.4
-
6
-
6
6
6
7
tSHZ
in Hi-Z
ns
Notes :
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered
ie., [(tr + tf)/2-1]ns should be added to the parameter.
SIMPLIFIED TRUTH TABLE
/R
A
S
/C
A
S
D
Q
M
CKE
CKE
n
/C
E
/W
E
BA
0,1
A10/
AP
A11
A9~A0
n-1
COMMAND
NOTE
Register
Refresh
Mode register set
Auto refresh
H
H
X
H
L
L
L
L
L
L
X
OP code
X
1,2
3
L
L
H
X
Entry
3
Self
refres
h
L
H
X
H
X
H
X
3
Exit
L
H
X
X
X
X
H
3
Bank active & row addr.
H
L
L
L
H
H
V
V
Row address
Auto
precharge
Read &
column
address
L
Column
4
disable
Auto
H
H
X
X
H
L
H
X
X
Address
precharge
precharge
precharge
(A0 ~ A9)
H
4,5
disable
Column
Address
(A0 ~ A9)
Auto
Write &
column
address
L
4
disable
L
H
L
L
V
Auto
H
4,5
6
disable
Burst Stop
Precharge
H
H
X
X
L
L
L
L
H
H
L
L
X
X
X
Bank selection
All banks
V
X
L
X
H
H
L
X
V
X
X
H
X
V
X
V
X
X
H
X
V
X
V
X
X
H
X
V
Entry
Exit
H
L
L
H
L
X
X
X
Clock suspend or
active power down
X
X
X
H
L
Entry
H
Precharge
power
down mode
H
L
Exit
L
H
H
H
X
X
V
X
DQM
X
X
X
7
H
L
X
H
X
X
H
No operation command
H
(V=Valid, X=Don't care, H=Logic high, L=Logic low)
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HSD32M72D18A
Notes :
1. OP Code : Operand code
A0 ~ A11 & BA0 ~ BA1 : Program keys. (@ MRS)
2. MRS can be issued only at all banks precharge state.
A new command can be issued after 2 CLK cycles of MRS.
3. Auto refresh functions are as same as CBR refresh of DRAM.
The automatical precharge without row precharge command is meant by "Auto".
Auto/self refresh can be issued only at all banks precharge state.
4. BA0 ~ BA1 : Bank select addresses.
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.
If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank B is selected.
If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.
If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected.
5. During burst read or write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
6. Burst stop command is valid at every burst length.
7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0),
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)
PACKAGING INFORMATION
Unit : inch [mm]
PCB Size : 1.27 ±0.008 [ ±0.20 ]
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HSD32M72D18A
ORDERING INFORMATION
Part Number
Density
Org.
Package
Ref.
Vcc
MODE
MAX.frq
ECC/
Unbuffered
ECC/
CL3
133MHz
CL3
HSD32M72D18A-13
HSD32M72D18A-12
HSD32M72D18A-10L
HSD32M72D18A-10
HSD32M72D18A-F13
HSD32M72D18A-F12
HSD32M72D18A-F10L
HSD32M72D18A-F10
256MByte
256MByte
256MByte
256MByte
256MByte
256MByte
256MByte
256MByte
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
32M x 72 168 Pin-DIMM
4K
4K
4K
4K
4K
4K
4K
4K
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
Unbuffered
ECC/
125MHz
CL3
Unbuffered
ECC/
100MHz
CL2
Unbuffered
ECC/
100MHz
CL3
Unbuffered
ECC/
133MHz
CL3
Unbuffered
ECC/
125MHz
CL3
Unbuffered
ECC/
100MHz
CL2
Unbuffered
100MHz
F means Auto & Self refresh with Low-Power (3.3V)
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REV.1.0 (August.2002)
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Synchronous DRAM Module 256Mbyte (32Mx72bit), DIMM with ECC based on 16Mx8, 4Banks, 4K Ref., 3.3V
HANBIT
HSD32M72D18P-F10L
Synchronous DRAM Module 256Mbyte (32Mx72bit), DIMM with ECC based on 16Mx8, 4Banks, 4K Ref., 3.3V
HANBIT
HSD32M72D18P-F12
Synchronous DRAM Module 256Mbyte (32Mx72bit), DIMM with ECC based on 16Mx8, 4Banks, 4K Ref., 3.3V
HANBIT
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