HM624256ALP-25 [HITACHI]

Cache SRAM, 256KX4, 25ns, CMOS, PDIP28, 0.400 INCH, PLASTIC, DIP-28;
HM624256ALP-25
型号: HM624256ALP-25
厂家: HITACHI SEMICONDUCTOR    HITACHI SEMICONDUCTOR
描述:

Cache SRAM, 256KX4, 25ns, CMOS, PDIP28, 0.400 INCH, PLASTIC, DIP-28

静态存储器 光电二极管 内存集成电路
文件: 总11页 (文件大小:73K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HM624256A Series  
262144-word × 4-bit High Speed CMOS Static RAM  
Description  
The Hitachi HM624256A is a high speed 1M Static RAM organized as 262,144-word × 4-bit. It realizes high  
speed access time (20/25/35 ns) and low power consumption, employing CMOS process technology and high  
speed circuit designing technology. It is most advantageous for the field where high speed and high density  
memory is required, such as the cache memory for main frame or 32-bit MPU. The HM624256A, packaged  
in a 400-mil plastic SOJ is available for high density mounting.  
Features  
Single 5 V supply and high density 28-pin package (DIP and SOJ)  
High speed  
Access time: 20/25/35 ns (max)  
Low power dissipation  
Active mode: 350 mW (typ)  
Standby mode: 100 µW (typ)  
Completely static memory  
No clock or timing strobe required  
Equal access and cycle time  
Directly TTL compatible  
All inputs and outputs  
HM624256A Series  
Ordering Information  
Type No.  
Access Time Package  
HM624256AP-20  
HM624256AP-25  
HM624256AP-35  
20 ns  
25 ns  
35 ns  
400 mil 28-pin plastic DIP (DP-28C)  
HM624256ALP-20 20 ns  
HM624256ALP-25 25 ns  
HM624256ALP-35 35 ns  
HM624256AJP-20 20 ns  
HM624256AJP-25 25 ns  
HM624256AJP-35 35 ns  
400 mil 28-pin plastic SOJ (CP-28D)  
HM624256ALJP-20 20 ns  
HM624256ALJP-25 25 ns  
HM624256ALJP-35 35 ns  
2
HM624256A Series  
Pin Arrangement  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
A10  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
A17  
A16  
A15  
A14  
A13  
A12  
A11  
NC  
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
WE  
CS  
OE  
VSS  
(Top view)  
Pin Description  
Pin Name  
A0 – A17  
I/O1 – I/O4  
CS  
Function  
Address  
Input/output  
Chip select  
Output enable  
Write enable  
Power supply  
Ground  
OE  
WE  
VCC  
VSS  
3
HM624256A Series  
Block Diagram  
A2  
A3  
VCC  
VSS  
A4  
Row  
decoder  
Memory array  
512 × 2048  
A5  
A6  
A7  
A8  
A9  
A10  
I/O1  
I/O2  
Column I/O  
Input  
data  
control  
Column decoder  
I/O3  
I/O4  
A0 A1 A11A12A13A14A15A16A17  
CS  
WE  
OE  
Function Table  
CS  
H
L
OE  
X
WE  
X
Mode  
VCC Current I/O Pin  
Ref. Cycle  
Not selected ISB, ISB1  
High-Z  
Dout  
Din  
L
H
Read  
Write  
Write  
ICC  
ICC  
ICC  
Read cycle (1) – (3)  
Write cycle (1)  
L
H
L
L
L
L
Din  
Write cycle (2)  
Note: X: H or L  
Absolute Maximum Ratings  
Parameter  
Symbol  
Vin  
Value  
–0.5*1 to +7.0  
Unit  
Voltage on any pin relative to VSS  
Power dissipation  
V
PT  
1.0  
W
°C  
°C  
°C  
Operating temperature range  
Storage temperature range  
Storage temperature range under bias  
Topr  
Tstg  
Tbias  
0 to +70  
–55 to +125  
–10 to +85  
Note: 1. Vin min = –2.0 V for pulse width 10 ns  
4
HM624256A Series  
Recommended DC Operating Conditions (Ta = 0 to +70°C)  
Parameter  
Symbol  
VCC  
Min  
4.5  
0
Typ  
5.0  
0
Max  
5.5  
0
Unit  
V
Supply voltage  
VSS  
V
Input high (logic 1) voltage  
Input low (logic 0) voltage  
VIH  
2.2  
–0.5*1  
6.0  
0.8  
V
VIL  
V
Note: 1. VIL min = –2.0 V for pulse width 10 ns  
DC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, VSS = 0 V)  
HM624256A-20  
HM624256A-25/35  
Parameter  
Symbol Min Typ*1 Max Min Typ*1 Max Unit Test Conditions  
Input leakage current  
|ILI|  
2.0  
2.0  
150  
60  
2.0  
2.0  
120  
40  
µA  
µA  
VCC = max  
Vin = VSS to VCC  
Output leakage current  
|ILO|  
CS = VIH  
VI/O = VSS to VCC  
Operating power supply ICC  
current  
mA CS = VIL, II/O = 0 mA,  
min cycle  
Standby power supply  
current  
ISB  
mA CS = VIH,  
min cycle  
Standby power supply  
current (1)  
ISB1  
0.02 2.0  
0.02  
2.0  
mA CS VCC – 0.2 V  
0 V Vin 0.2 V or  
Vin VCC – 0.2 V  
*2  
ISB1  
100*2  
100*2 µA  
Output low voltage  
Output high voltage  
VOL  
0.4  
0.4  
V
V
IOL = 8 mA  
VOH  
2.4  
2.4  
IOH = –4 mA  
Notes: 1. Typical values are at VCC = 5.0 V, Ta = +25°C and not guaranteed.  
2. L-version  
Capacitance (Ta = 25°C, f = 1 MHz)  
Parameter  
Symbol  
Min  
Max  
5*2  
6*3  
8
Unit  
pF  
Test Conditions  
Input capacitance  
Cin  
Vin = 0 V  
pF  
Input/output capacitance  
CI/O  
pF  
VI/O = 0 V  
Notes: 1. This parameter is sampled and not 100% tested.  
2. SOJ package  
3. DIP package  
5
HM624256A Series  
AC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, unless otherwise noted.)  
Test Conditions  
Input pulse levels: 0V to 3.0 V  
Input rise and fall time: 4 ns  
Input timing reference levels: 1.5 V  
Output timing reference levels: 1.5 V  
Output load: See figures  
+ 5 V  
+ 5 V  
480 Ω  
480 Ω  
Dout  
Dout  
255 Ω  
30 pF *1  
255 Ω  
5 pF *1  
Output load (A)  
Note: 1. Including scope and jig  
Output load (B)  
(For tCHZ, tOHZ, tCLZ, tOLZ, tWHZ and tOW  
)
Read Cycle  
HM624256A-20 HM624256A-25 HM624256A-35  
Parameter  
Symbol Min  
Max  
Min  
25  
5
Max  
Min  
35  
5
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Read cycle time  
tRC  
20  
5
Address access time  
tAA  
20  
20  
25  
25  
35  
35  
Chip select access time  
tACS  
*1  
Chip selection to output in low-Z  
Output enable to output valid  
Output enable to output in low-Z  
Chip deselection to output in high-Z  
Chip disable to output in high-Z  
Output hold from address change  
Chip selection to power up time  
tCLZ  
tOE  
0
10  
0
12  
0
15  
*1  
*1  
tOLZ  
tCHZ  
tOHZ  
tOH  
0
10  
10  
0
12  
10  
0
15  
10  
*1  
0
0
0
5
5
5
tPU  
0
0
0
Chip deselection to power down time tPD  
12  
15  
25  
Notes: 1. Transition is measured ±200 mV from steady state voltage with Load (B). This parameter is  
sampled not 100% tested.  
6
HM624256A Series  
Read Timing Waveform (1)*1 (WE = VIH)  
tRC  
Address  
OE  
tAA  
tOE  
tOH  
tOLZ  
CS  
tOHZ  
tCHZ  
tACS  
tCLZ  
Dout  
Valid Data  
Notes: 1. Transition is measured ±200 mV from state voltage with Load (B). This parameter is  
sampled and not 100% tested.  
Read Timing Waveform (2) (WE = VIH, CS = VIL, OE = VIL)  
tRC  
Address  
tAA  
tOH  
tOH  
Valid Data  
Dout  
7
HM624256A Series  
Read Timing Waveform (3)*1, *2 (WE = VIH, OE = VIL)  
CS  
tCHZ  
tACS  
tCLZ  
Dout  
Valid Data  
tPD  
High  
Impedance  
High Impedance  
tPU  
VCC supply  
current  
ICC  
ISB  
50 %  
50 %  
Notes: 1. Transition is measured ±200 mV from steady state voltage with Load (B). This parameter  
is sampled and not 100% tested.  
2.Device is continuously selected, CS = VIL.  
Write Cycle  
HM624256A-20 HM624256A-25 HM624256A-35  
Parameter  
Symbol Min  
Max  
10  
12  
Min  
25  
17  
20  
0
Max  
10  
15  
Min  
35  
25  
30  
0
Max  
10  
15  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Write cycle time  
tWC  
tCW  
tAW  
tAS  
20  
15  
16  
0
Chip selection to end of write  
Address valid to end of write  
Address setup time  
Write pulse width  
*2  
tWP  
15  
0
17  
0
25  
0
*3  
tWR  
Write recovery time  
*4  
Output disable to output in high-Z tOHZ  
0
0
0
*4  
Write to output in high-Z  
Data to write time overlap  
Data hold from write time  
Output active from end of write  
tWHZ  
tDW  
0
0
0
12  
0
15  
0
20  
0
*5  
tDH  
*1  
tOW  
0
0
0
Notes: 1. Transition is measured ±200 mV from steady state voltage with Load (B). This parameter is  
sampled and not 100% tested.  
2. A write occurs during the overlap (tWP) of a low CS and a low WE.  
3. tWR is measured from the earlier of CS or WE going high to the end of write cycle.  
4. During this period, I/O pins are in the output state so that the input signals of opposite phase to the  
outputs must not be applied.  
5. If CS is low during this period, I/O pins are in the output state. Then the data input signals of  
opposite phase to the outputs must not be applied to them.  
8
HM624256A Series  
Write Timing Waveform (1)  
tWC  
Address  
tWR  
OE  
CS  
tCW  
*1  
tAW  
tAS  
WE  
tOHZ  
tWP  
Dout  
Din  
tDW  
tDH  
Valid Data  
Notes: 1. If the CS low transition occurs simultaneously with the WE low transition or after the WE  
transition, output remain in a high impedance state.  
Write Timing Waveform (2) (OE Low Fixed)  
tWC  
Address  
tWR  
tCW  
CS  
*1  
tWP  
WE  
tOH  
*2  
tAS  
*3  
tWHZ  
tOW  
Dout  
Din  
tDW  
tDH  
Valid Data  
Notes: 1. If the CS low transition occurs simultaneously with the WE low transitions or after the WE  
transition, output remain in a high impedance state.  
2.Dout is the same phase of write data of this write cycle.  
3.Dout is the read data of next address.  
9
HM624256A Series  
Low VCC Date Retention Characteristics (Ta = 0 to +70°C)  
This characteristics is guaranteed only for L-version.  
Parameter  
Symbol  
Min Typ Max Unit Test Conditions  
VCC for data retention  
VDR  
2.0  
V
CS VCC – 0.2 V,  
Vin VCC – 0.2 V or  
0 V Vin 0.2 V  
Data retention current  
ICCDR  
0
2
50*1 µA  
Chip deselect to data retention time tCDR  
ns  
Operation recovery time  
Note: 1. VCC = 3.0 V  
tR  
5
ms  
Low VCC Data Retention Timing Waveform  
Data retention mode  
VCC  
4.5 V  
tR  
tCDR  
2.2 V  
VDR  
CS  
0 V  
CS VCC – 0.2 V  
10  
HM624256A Series  
Package Dimensions  
HM624256AP/ALP Series (DP-28C)  
Unit: mm  
34.70  
35.56 Max  
28  
15  
14  
1
0.89  
1.30  
1.27 Max  
10.16  
+ 0.11  
– 0.05  
0.25  
2.54 ± 0.25  
0.48 ± 0.10  
0° – 15°  
HM624256AJP/ALJP Series (CP-28D)  
Unit: mm  
18.17  
18.54 Max  
15  
14  
28  
1
0.74  
1.30 Max  
1.27  
0.10  
0.43 ± 0.10  
9.40 ± 0.25  
11  

相关型号:

HM624256ALP-35

Cache SRAM, 256KX4, 35ns, CMOS, PDIP28, 0.400 INCH, PLASTIC, DIP-28
HITACHI

HM624256AP-25

Cache SRAM, 256KX4, 25ns, CMOS, PDIP28, 0.400 INCH, PLASTIC, DIP-28
HITACHI

HM624256AP-35

Cache SRAM, 256KX4, 35ns, CMOS, PDIP28, 0.400 INCH, PLASTIC, DIP-28
HITACHI
ETC
ETC
ETC
ETC
ETC
ETC

HM624257ALJP-35

Cache SRAM, 256KX4, 35ns, CMOS, PDSO32, 0.400 INCH, PLASTIC, SOJ-32
HITACHI