HT62L256-28SOP-A [HOLTEK]

CMOS 32Kx8 Low Power SRAM; CMOS 32Kx8低功耗SRAM
HT62L256-28SOP-A
型号: HT62L256-28SOP-A
厂家: HOLTEK SEMICONDUCTOR INC    HOLTEK SEMICONDUCTOR INC
描述:

CMOS 32Kx8 Low Power SRAM
CMOS 32Kx8低功耗SRAM

静态存储器
文件: 总10页 (文件大小:116K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HT62L256  
CMOS 32K´8 Low Power SRAM  
Preliminary  
Features  
·
·
Operation voltage: 2.7V~3.3V  
Automatic power down when chip is deselected  
·
·
Low power consumption:  
Three state outputs  
-
·
Operating current: 20mA max.  
Fully static operation  
-
Standby current: 2mA  
·
Data retention supply voltage as low as 2.0V  
·
High speed access time: 70ns  
·
Easy expansion with CS and OE options  
·
Input levels are LVTTL-compatible  
·
28-pin SOP/TSOP package  
General Description  
The HT62L256 is a 262,144-bit static random access  
memory organized into 32,768 words by 8 bits and oper-  
ating from a low power range of 2.7V to 3.3V supply volt-  
age. It is fabricated with high performance CMOS  
process that provides both high speed and low power  
feature with typical standby current of 2mA and maxi-  
mum access time of 70ns.  
The HT62L256 has an automatic power down feature,  
reducing the power consumption significantly when chip  
is deselected. The HT62L256 supports the JEDEC  
standard 28-pin SOP and TSOP package.  
Block Diagram  
A
0
X
Y
-
-
D
D
e
e
c
c
A
d
d
r
e
s
s
M
e
m
o
r
y
C
e
l
l
A
r
r
a
y
B
u
f
f
e
r
s
´
( 3 2 K 8 B i t s  
A
1
4
C
S
E
S
e
n
s
e
A
m
p
l
i
f
i
e
r
R
e
a
d
/
W
r
i
t
e
W
E
C
o
n
t
r
o
l
L
o
g
i
c
O
O
u
t
p
u
t
B
u
f
f
e
r
s
V
D
D
V
S
S
D
0
D
7
Pin Assignment  
A
1
4
V
D
D
2
2
2
2
2
2
2
2
2
1
1
1
1
1
8
7
6
5
4
3
2
1
0
9
8
7
6
5
1
2
3
4
5
6
7
8
9
1
1
1
1
1
O
E
2
8
1
A
1
0
A
1
1
9
8
3
A
1
2
7
6
5
4
3
2
1
0
0
1
2
W
A
A
A
A
O
A
C
D
D
D
D
D
E
C
S
7
6
5
4
3
A
A
D
A
A
A
A
A
A
A
A
1
8
9
1
3
D
A
1
D
W
E
D
1
0
V
D
D
H
T
6
2
L
2
5
6
D
E
A
A
1
1
4
2
7
6
5
4
3
V
S
S
2
8
T
S
O
P
-
A
1
D
D
D
A
A
A
2
1
0
A
A
A
A
A
S
7
6
5
4
3
0
1
2
3
4
0
1
2
D
D
D
1
4
1
5
V
S
S
H
T
6
2
L
2
5
6
2
8
S
O
P
-
A
Rev. 0.00  
1
August 15, 2002  
Preliminary  
HT62L256  
Pin Description  
Pin Name  
A0~A14  
WE  
I/O  
I
Description  
Address input pins  
I
Write enable signal pin, active LOW  
Output enable signal pin, active LOW  
Chip select signal pin, active LOW  
Data input and output signal pins  
Positive power supply  
OE  
I
CS  
I
D0~D7  
VDD  
I/O  
¾
¾
VSS  
Negative power supply, ground  
Absolute Maximum Rating  
VDD to VSS ........................................... -0.5V to +3.6V  
IN, IN/OUT Voltage to VSS ............. -0.5V to VDD+0.5V  
Power Consumption, PT .......................................0.7W  
Operating Temperature, TOP ......................0°C to 70°C  
Storage Temperature (Plastic), Tstg ... -55°C to 125°C  
Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maximum Ratings² may  
cause substantial damage to the device. Functional operation of this device at other conditions beyond those  
listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliabil-  
ity.  
D.C. Characteristics  
Ta=25°C, VDD=3.0V±10%, TOP=0°C to 70°C  
Symbol  
VDD  
Parameter  
Test Conditions  
Min.  
2.7  
Typ.  
3.0  
0
Max.  
3.3  
0.4  
¾
Unit  
V
Operating Voltage  
Input Low Voltage  
Input High Voltage  
Input Leakage Current  
¾
¾
¾
VIL  
VIH  
ILI  
V
¾
V
0.7´VDD  
¾
VIN=0 to VDD  
1
¾
¾
mA  
CS=VIH or OE=VIH  
OUT=0 to VDD  
,
ILO  
Output Leakage Current  
1
¾
¾
mA  
V
VOL  
VOH  
IDD  
VDD=Max, IOL=2mA  
Output Low Voltage  
Output High Voltage  
Operating Current  
0.3  
¾
V
V
¾
¾
¾
¾
2
VDD=Min, IOH=-1mA  
CS=VIH, IOUT=0mA  
CS=VIH, IOUT=0mA  
V
DD-0.3  
¾
20  
50  
10  
mA  
mA  
mA  
ISB1  
ISB2  
Standby Current  
¾
Power Down Supply Current  
CS ³ VDD - 0.2V, VIN³0V  
¾
Rev. 0.00  
2
August 15, 2002  
Preliminary  
HT62L256  
A.C. Characteristics  
Ta=25°C, VDD=3.0V±10%  
Symbol  
Parameter  
Min.  
Typ.  
Max.  
Unit  
Read cycle  
tRC  
Read Cycle Time  
70  
¾
¾
¾
10  
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
70  
70  
35  
¾
¾
25  
25  
¾
tAA  
Address Access Time  
tACS  
tAOE  
tCLZ*  
Chip Selection Access Time  
Output Enable to Valid Outputs  
Chip Selection to Output in Low-Z  
Output Enabled to Output in Low-Z  
Chip Deselected to Output in High-Z  
Output Disable to Output in High-Z  
Output Hold from Address Change  
tOLZ  
tCHZ  
tOHZ  
tOH  
*
*
¾
¾
10  
*
Write cycle  
tWC  
Write Cycle Time  
70  
60  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
20  
¾
¾
¾
tCW  
Chip Selection to End of Write  
Address Setup Time  
tAS  
tAW  
Address Valid to End of Write  
Write Pulse Width  
60  
50  
0
tWP  
tWR  
Write Recovery Time  
tWHZ  
tDW  
Write to Output in High-Z  
Data Valid to End of Write  
Data Hold from End of Write  
Output Active from End of Write  
¾
30  
0
tDH  
tOW  
5
Note: 1. A write cycle occurs during the overlap of a low CS and a low WE  
2. OE may be both high and low in a write cycle  
3. tAS is specified from CS or WE, whichever occurs last  
4. tWP is an overlap time of a low CS and a low WE  
5. tWR, tDW and tDH are specified from CS or WE, whichever occurs first  
6. tWHZ is specified by the time when DATA OUT is floating and not defined by the output level  
7. When the I/O pins are in data output mode, they should not be forced with inverse signals  
Rev. 0.00  
3
August 15, 2002  
Preliminary  
HT62L256  
A.C. Test Conditions  
Item  
Conditions  
Input Pulse Level  
0V to 3V  
5ns  
Input Rise and Fall Time  
Input and Output Timing Reference Level  
Output Load  
1.5V  
See figures below  
+
1
.
5
V
+
1
.
5
V
1
.
8
k
W
1
.
8
k
I
/
O
I
/
O
1
0
0
p
5
p
9
9
0
W
9
9
0
*
I
n
c
l
u
d
i
n
g
s
c
o
p
e
a
n
d
j
i
g
*
I
n
c
l
u
d
i
n
g
s
c
o
p
e
a
n
d
j
i
g
O
u
t
p
u
t
l
o
a
d
O
u
t
p
u
t
l
o
a
d
f
o
r
t
C
L
Z
,
t
O
L
Z
,
t
C
H
Z
,
t
W
H
Z
a
n
d
t
O
W
Functional Description  
Operation truth table  
CS  
OE  
X
WE  
X
Mode  
Standby  
D0~D7  
High-Z  
High-Z  
Dout  
H
L
L
L
H
H
Output Disable  
Read  
L
H
X
L
Write  
Din  
Data retention characteristics  
Ta=-40°C to 85°C  
Symbol  
VDR  
Parameter  
Conditions  
Min.  
Max.  
Unit  
CS ³ VDD-0.2V  
VDD for Data Retention  
2.0  
3.3  
V
VIN ³ VDD-0.2V or VIN£0.2V  
CS ³ VDD-0.2V  
ICCDR  
Data Retention Current  
2
¾
mA  
VIN ³ VDD-0.2V or VIN£0.2V  
tCDR  
tR  
Chip Disable Data Retention Time  
Operation Recovery Time  
See retention timing  
See retention timing  
0
ns  
ns  
¾
¾
tRC  
*
Low VDD data retention timing  
V
D
D
3
.
0
V
3
.
0
V
V
D
D
t
C
D
R
t
R
C
S
V
I
H
V
I H  
C
³
D
D
Rev. 0.00  
4
August 15, 2002  
Preliminary  
HT62L256  
Timing Diagrams  
Read cycle 1 output enable controlled (1)  
t
R C  
A
d
d
r
e
s
s
t
A A  
O
E
t
A O E  
t
O H  
t
O L Z  
C
S
t
A C S  
t
O H Z  
t
C H Z  
t
C L Z  
D
O
U
T
D
o
n
'
t
C
a
r
e
U
n
u
s
e
d
Read cycle 2 address controlled (1, 2, 4)  
t
R C  
A
d
d
r
e
s
s
t
A A  
t
O H  
t
O H  
D
O
U
T
D
U
o
n
n
u
'
s
t
C
a
r
e
e
d
Read cycle 3 chip select controlled (1, 3, 4)  
A
d
d
r
e
s
s
t
A C S  
t
C H Z  
t
C L Z  
D
O
U
T
D
U
o
n
n
u
'
s
t
C
a
r
e
e
d
Note: 1. WE is high for read cycle  
2. Device is continuously enabled, CS=VIL  
3. Address is valid prior to or coincident with the CS transition low  
4. OE=VIL  
5. Transition is measured at ±500mV from the steady state  
Rev. 0.00  
5
August 15, 2002  
Preliminary  
HT62L256  
Write cycle 1 OE clock (1)  
t
W
C
A
d
d
r
e
s
s
t
W
R
O
E
t
C W  
(
5
)
C
S
t
A W  
t
W
P
W
E
t
A S  
t
O H Z  
(
1
,
4
)
D
O
U
T
t
D
W
t
D H  
D
I
N
D
o
n
'
t
C
a
r
e
U
n
u
s
e
d
Write cycle 2 OE=VIL Fixed (1, 6)  
t
W
C
A
d
d
r
e
s
s
t
C W  
t
W
R
(
5
)
C
S
t
A W  
t
W
P
W
E
t
O H  
t
A S  
t
W
H
Z
t
O W  
(
7
)
(
8
)
D
O
U
T
t
D
W
t
D H  
D
I
N
D
U
o
n
n
u
'
s
t
C
a
r
e
e
d
Rev. 0.00  
6
August 15, 2002  
Preliminary  
HT62L256  
Note:  
1. WE must be high during all address transitions  
2. A write occurs during the overlap (tWP) of a low CS and a low WE  
3. tWR is measured from the earliest high going edge of CS or WE to the end of the write cycle  
4. During this period, I/O pins are in the output state, so the input signals of opposite phase to the outputs  
should not be applied.  
5. If the CS low transition occurs simultaneously or after with the WE low transition, the outputs remain in a  
high impedance state  
6. OE is continuously low (OE=VIL)  
7. DOUT is at the same phase as the write data of this write cycle  
8. DOUT is the read data of the next address  
9. If CS is low during this period, then the I/O pins are in the output state and the data input signals of the  
opposite phase to the outputs should not be applied  
10. Transition is measured at ±500mV from the steady state  
Rev. 0.00  
7
August 15, 2002  
Preliminary  
HT62L256  
Package Information  
28-pin SOP (330mil) outline dimensions  
2
8
1
5
A
B
1
1
4
C
C
'
G
H
D
a
E
Dimensions in mil  
Nom.  
Symbol  
Min.  
453  
326  
14  
700  
92  
¾
Max.  
477  
336  
20  
A
B
C
C¢  
D
E
F
¾
¾
¾
¾
¾
50  
¾
¾
¾
¾
728  
104  
¾
4
¾
G
H
a
32  
4
38  
12  
0°  
10°  
Rev. 0.00  
8
August 15, 2002  
Preliminary  
HT62L256  
28-pin TSOP (8´13.4) outline dimensions  
H
D
1
2
8
q
E
0
.
0
1
0
L
D
e
t
a
i
l
1
4
1
5
D
A
2
A
A
1
S
e
e
D
e
t
a
i
l
L
1
S
b
e
y
S
e
a
t
i
n
g
P
l
a
n
e
Dimensions in mm  
Nom.  
Symbol  
Min.  
¾
Max.  
1.25  
0.18  
1.05  
¾
A
A1  
A2  
b
¾
¾
0.08  
0.95  
¾
¾
0.20  
¾
D
11.70  
13.20  
7.90  
¾
11.90  
13.60  
8.10  
¾
HD  
E
¾
¾
e
0.55  
0.50  
0.8  
¾
L
¾
¾
L1  
q
¾
¾
0°  
5°  
Rev. 0.00  
9
August 15, 2002  
Preliminary  
HT62L256  
Holtek Semiconductor Inc. (Headquarters)  
No.3, Creation Rd. II, Science-based Industrial Park, Hsinchu, Taiwan  
Tel: 886-3-563-1999  
Fax: 886-3-563-1189  
http://www.holtek.com.tw  
Holtek Semiconductor Inc. (Sales Office)  
11F, No.576, Sec.7 Chung Hsiao E. Rd., Taipei, Taiwan  
Tel: 886-2-2782-9635  
Fax: 886-2-2782-9636  
Fax: 886-2-2782-7128 (International sales hotline)  
Holtek Semiconductor (Shanghai) Inc.  
7th Floor, Building 2, No.889, Yi Shan Rd., Shanghai, China  
Tel: 021-6485-5560  
Fax: 021-6485-0313  
http://www.holtek.com.cn  
Holtek Semiconductor (Hong Kong) Ltd.  
RM.711, Tower 2, Cheung Sha Wan Plaza, 833 Cheung Sha Wan Rd., Kowloon, Hong Kong  
Tel: 852-2-745-8288  
Fax: 852-2-742-8657  
Holmate Semiconductor, Inc.  
48531 Warm Springs Boulevard, Suite 413, Fremont, CA 94539  
Tel: 510-252-9880  
Fax: 510-252-9885  
http://www.holmate.com  
Copyright Ó 2002 by HOLTEK SEMICONDUCTOR INC.  
The information appearing in this Data Sheet is believed to be accurate at the time of publication. However, Holtek as-  
sumes no responsibility arising from the use of the specifications described. The applications mentioned herein are used  
solely for the purpose of illustration and Holtek makes no warranty or representation that such applications will be suitable  
without further modification, nor recommends the use of its products for application that may present a risk to human life  
due to malfunction or otherwise. Holtek reserves the right to alter its products without prior notification. For the most  
up-to-date information, please visit our web site at http://www.holtek.com.tw.  
Rev. 0.00  
10  
August 15, 2002  

相关型号:

HT62L256-28TSOP-A

CMOS 32Kx8 Low Power SRAM
HOLTEK

HT6320

Remote-Control Transmitter/Encoder
ETC

HT6320(16DIP)

Remote-Control Receiver/Decoder
ETC

HT6320(16SOIC)

Remote-Control Receiver/Decoder
ETC

HT6337

Remote-Control Transmitter/Encoder
ETC

HT6337A(28DIP)

Consumer Electronic Controller
ETC

HT6337A(28SOIC)

Consumer Electronic Controller
ETC

HT6337B(24DIP)

Consumer Electronic Controller
ETC

HT6337B(24SOIC)

Consumer Electronic Controller
ETC

HT6337C

Consumer Electronic Controller
ETC

HT6337D

Consumer Electronic Controller
ETC

HT6337E

Consumer Electronic Controller
ETC