74FCT162827ATPA [IDT]
Bus Driver, FCT Series, 2-Func, 10-Bit, True Output, CMOS, PDSO56, TSSOP-56;
| 型号： | 74FCT162827ATPA |
| 厂家： | 
INTEGRATED DEVICE TECHNOLOGY |
| 描述： | Bus Driver, FCT Series, 2-Func, 10-Bit, True Output, CMOS, PDSO56, TSSOP-56 驱动 光电二极管 输出元件 逻辑集成电路 |
| 文件： | 总7页 (文件大小：73K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
FAST CMOS
20-BIT BUFFER
IDT74FCT162827AT/CT
FEATURES:
DESCRIPTION:
• 0.5 MICRON CMOS Technology
TheFCT162827T20-bitbuffersarebuiltusingadvanceddualmetalCMOS
technology. These20-bitbusdriversprovidehigh-performancebusinterface
buffering for wide data/address paths or buses carrying parity. Two pair of
NAND-ed output enable controls offer maximum control flexibility and are
organizedtooperatethedeviceastwo10-bitbuffersorone20-bitbuffer.Flow-
throughorganizationofsignalpinssimplifieslayout. Allinputsaredesignedwith
hysteresisforimprovednoisemargin.
• High-speed, low-power CMOS replacement for ABT functions
• Typical tSK(o) (Output Skew) < 250ps
• Low input and output leakage ≤1µA (max.)
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
• VCC = 5V ±10%
• Balanced Output Drivers (±24mA)
• Reduced system switching noise
• Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
• Available in SSOP and TSSOP packages
TheFCT162827Thasbalancedoutputdrivewithcurrentlimitingresistors.
Thisofferslowgroundbounce,minimalundershoot,andcontrolledoutputfall
times–reducing the need for external series terminating resistors. The
FCT162827Tisaplug-inreplacementfortheFCT16827TandABT16827for
on-boardinterfaceapplications.
FUNCTIONALBLOCKDIAGRAM
1
28
1OE
1
2OE
1
29
56
1OE
2
2OE
2
2
42
55
15
1Y1
2Y1
1A1
2A1
TO NINE OTHER CHANNELS
TO NINE OTHER CHANNELS
TheIDTlogoisaregisteredtrademarkofIntegratedDeviceTechnology,Inc.
INDUSTRIAL TEMPERATURE RANGE
SEPTEMBER 2009
1
© 2009 Integrated Device Technology, Inc.
DSC-5440/7
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
ABSOLUTE MAXIMUM RATINGS(1)
PINCONFIGURATION
Symbol
Description
Max
Unit
V
(2)
VTERM
Terminal Voltage with Respect to GND
–0.5 to 7
1
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1
1
1
OE2
1
OE
1
(3)
VTERM
Terminal Voltage with Respect to GND –0.5 to VCC+0.5
V
2
1
Y
Y
1
A
1
2
TSTG
IOUT
Storage Temperature
DC Output Current
–65 to +150
–60 to +120
° C
mA
3
1
2
A
GND
4
GND
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
5
1
Y
3
4
1A
3
6
1
Y
1
A
4
VCC
7
V
CC
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Outputs and I/O terminals for FCT162XXX.
8
1
1
1
Y
Y
Y
5
6
7
1A
5
6
7
9
1
1
A
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
A
GND
GND
CAPACITANCE (TA = +25°C, f = 1.0MHz)
1
1
Y
8
9
1A
1A
1A
2A
8
Symbol
CIN
Parameter(1)
Input Capacitance
Output Capacitance
Conditions
VIN = 0V
Typ.
3.5
Max. Unit
Y
9
6
8
pF
pF
1
Y10
10
1
COUT
VOUT = 0V
3.5
2
2
Y
1
NOTE:
1. This parameter is measured at characterization but not tested.
Y
Y
2
2
A2
2
3
2A
3
GND
GND
2
2
2
A
A
A
4
5
6
2
2
2
Y
Y
Y
4
5
6
PINDESCRIPTION
Pin Names
xOEx
xAx
Description
OutputEnableInputs(ActiveLOW)
DataInputs
VCC
V
CC
2
2
Y
7
8
2
2
A
7
xYx
3-StateOutputs
Y
A
8
GND
GND
2A
9
2Y
9
2
Y10
2
A
10
2OE
2
2
OE1
FUNCTIONTABLE(1)
Inputs
Outputs
SSOP/ TSSOP
TOP VIEW
xOE1
L
xOE2
L
xAx
L
xYx
L
L
L
H
H
H
X
X
Z
X
H
X
Z
NOTE:
1. H = HIGH voltage level
L = LOW voltage level
X = Don’t care
Z = High-impedance
2
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
DCELECTRICALCHARACTERISTICSOVEROPERATINGRANGE
FollowingConditionsApplyUnlessOtherwiseSpecified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
Symbol
VIH
Parameter
Test Conditions(1)
GuaranteedLogicHIGHLevel
Min.
2
Typ.(2)
—
Max.
—
Unit
V
Input HIGH Level
VIL
InputLOWLevel
GuaranteedLogicLOWLevel
VCC = Max.
—
—
—
—
—
—
—
—
–80
—
—
—
0.8
±1
V
IIH
InputHIGHCurrent(Inputpins)(4)
Input HIGH Current (I/O pins)(4)
InputLOWCurrent(Inputpins)(4)
InputLOWCurrent(I/Opins)(4)
HighImpedanceOutputCurrent
(3-StateOutputpins)(4)
VI = VCC
—
µA
—
±1
IIL
VI = GND
—
±1
—
±1
IOZH
IOZL
VIK
VCC = Max.
VO = 2.7V
VO = 0.5V
—
±1
µ A
—
±1
ClampDiodeVoltage
VCC = Min., IIN = –18mA
–0.7
–140
100
5
–1.2
–250
—
V
(3)
IOS
ShortCircuitCurrent
VCC = Max., VO = GND
mA
mV
µ A
VH
InputHysteresis
—
ICCL
ICCH
ICCZ
QuiescentPowerSupplyCurrent
VCC = Max
500
VIN = GND or VCC
OUTPUTDRIVECHARACTERISTICS
Symbol
IODL
Parameter
OutputLOWCurrent
Output HIGH Current
OutputHIGHVoltage
Test Conditions(1)
Min.
60
Typ.(2) Max.
Unit
mA
mA
V
(3)
VCC = 5V, VIN = VIH or VIL, VO = 1.5V
115
–115
3.3
200
–200
—
(3)
IODH
VCC = 5V, VIN = VIH or VIL, VO = 1.5V
–60
2.4
VOH
VCC = Min.
IOH = –24mA
IOL = 24mA
VIN = VIH or VIL
VCC = Min.
VOL
OutputLOWVoltage
—
0.3
0.55
V
VIN = VIH or VIL
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This test limit for this parameter is ±5µA at TA = –55°C.
3
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
POWERSUPPLYCHARACTERISTICS
Symbol
Parameter
TestConditions(1)
Min.
Typ.(2)
Max.
Unit
ΔICC
QuiescentPowerSupplyCurrent
TTL Inputs HIGH
VCC = Max.
—
0.5
1.5
mA
(3)
VIN = 3.4V
ICCD
IC
DynamicPowerSupplyCurrent(4)
VCC = Max.
OutputsOpen
xOE1 = xOE2 = GND
OneInputToggling
50% Duty Cycle
VIN = VCC
VIN = GND
—
60
100
µ A /
MHz
TotalPowerSupplyCurrent(6)
VCC = Max.
OutputsOpen
fi = 10MHz
VIN = VCC
VIN = GND
—
—
0.6
0.9
1.5
2.3
mA
50% Duty Cycle
xOE1 = xOE2 = GND
OneBitToggling
VIN = 3.4V
VIN = GND
(5)
VCC = Max.
OutputsOpen
fi = 2.5MHz
50% Duty Cycle
xOE1 = xOE2 = GND
Twenty BitsToggling
VIN = VCC
VIN = GND
—
—
3
8
5.5
(5)
VIN = 3.4V
VIN = GND
20.5
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
4
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
SWITCHINGCHARACTERISTICSOVEROPERATINGRANGE
FCT162827AT
FCT162827CT
Symbol
tPLH
Parameter
PropagationDelay
xAx to xYx
Condition(1)
CL = 50pF
RL = 500Ω
CL =300pF(4)
RL = 500Ω
CL = 50pF
RL = 500Ω
CL =300pF(4)
RL = 500Ω
CL = 5pF(4)
RL = 500Ω
CL = 50pF
RL = 500Ω
Min.(2)
Max.
Min.(2)
Max.
Unit
1.5
8
1.5
1.5
.5
3.7
ns
tPHL
1.5
1.5
1.5
1.5
1.5
—
15
12
23
9
7
4.8
9
tPZH
tPZL
OutputEnableTime
ns
xOEx to xYx
1.5
1.5
1.5
—
tPHZ
tPLZ
OutputDisableTime
4
ns
ns
xOEx to xYx
10
0.5
4
(3)
tSK(o)
OutputSkew
0.5
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design.
4. This limit is guaranteed but not tested.
5
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
TESTCIRCUITSANDWAVEFORMS
V
CC
7.0V
SWITCHPOSITION
500Ω
500Ω
Test
Switch
Closed
Open
V
OUT
V
IN
Open Drain
Disable Low
Enable Low
Pulse
Generator
D.U.T.
50pF
All Other Tests
RT
CL
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Test Circuits for All Outputs
3V
DATA
1.5V
INPUT
0V
LOW-HIGH-LOW
tH
tSU
1.5V
PULSE
3V
1.5V
0V
TIMING
INPUT
ASYNCHRONOUS CONTROL
t
W
tREM
PRESET
CLEAR
ETC.
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
SYNCHRONOUS CONTROL
PRESET
3V
1.5V
0V
CLEAR
tSU
Pulse Width
t
H
CLOCK ENABLE
ETC.
Set-up, Hold, and Release Times
ENABLE
DISABLE
3V
1.5V
0V
3V
SAME PHASE
CONTROL
INPUT
1.5V
0V
INPUT TRANSITION
t
PLH
t
PHL
PHL
t
PZL
tPLZ
VOH
OUTPUT
3.5V
1.5V
3.5V
1.5V
OUTPUT
NORMALLY
LOW
SWITCH
CLOSED
VOL
tPLH
t
0.3V
0.3V
VOL
3V
1.5V
0V
tPZH
tPHZ
OPPOSITE PHASE
INPUT TRANSITION
VOH
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
1.5V
0V
0V
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
6
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
ORDERINGINFORMATION
XX
FCT
XXXX
XXX
XX
Temp. Range
Family
Package
Device Type
PVG
PAG
Shrink Small Outline Package - Green
Thin Shrink Small Outline Package - Green
20-Bit Buffer
827AT
827CT
162
74
Double-Density, 5 Volt, Balanced Drive
40 C to +85 C
DatasheetDocumentHistory
09/06/09 Pg. 7
Updatedthe orderinginformationbyremovingthe "IDT"notationandnonRoHSpart.
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fax: 408-284-2775
www.idt.com
7
相关型号：
74FCT162827BTPVCG4
FCT SERIES, DUAL 10-BIT DRIVER, TRUE OUTPUT, PDSO56, 0.300 INCH, 0.635 MM PITCH, PLASTIC, SSOP-56
TI
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