810525AGILF [IDT]

VCXO-TO-LVCMOS/LVTTL OUTPUT; VCXO - TO- LVCMOS / LVTTL输出
810525AGILF
型号: 810525AGILF
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

VCXO-TO-LVCMOS/LVTTL OUTPUT
VCXO - TO- LVCMOS / LVTTL输出

石英晶振 压控振荡器 输出元件
文件: 总12页 (文件大小:246K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
VCXO-TO-LVCMOS/LVTTL OUTPUT  
ICS810525I  
GENERAL DESCRIPTION  
FEATURES  
The ICS810525I is a high performance, low jit-  
One single-ended LVCMOS/LVTTL output  
ICS  
HiPerClockS™  
ter/low phase noise VCXO from IDT. The  
ICS810525I works in conjunction with a 25MHz  
One single-ended clock accepts the following input types:  
LVCMOS, LVTTL  
pullable crystal to generate an LVCMOS/LVTTL  
output clock of 25MHz from an input clock of  
Accepts input frequency of 5MHz  
5MHz. The frequency of the VCXO is adjusted by the VC  
control voltage input. The output range is 100ppm around  
the nominal crystal frequency. The LF1 control voltage range  
is 0 – V . The device is packaged in a small 16 TSSOP  
packageDaD nd is ideal for use on space constrained boards.  
Absolute pull range: 100ppm  
Proprietary multiplier provides low jitter, high frequency output  
RMS phase jitter @ 25MHz, using a 25MHz crystal  
(1kHz – 1MHz): 0.27ps (typical)  
Full 3.3V supply, or 3.3V core/2.5V output supply  
-40°C to 85°C ambient operating temperature  
Available in lead-free (RoHS 6) package  
BLOCK DIAGRAM  
PIN ASSIGNMENT  
nc  
1
2
3
4
5
6
7
8
VDD  
CLK  
GND  
16  
15  
14  
GND  
Q
VDDO  
nc  
(External  
Loop Filter Inputs)  
13 LF1  
LF1  
LF0  
12  
11  
10  
9
LF0  
25MHz  
nc  
VDDA  
VDD  
XTAL_IN  
XTAL_OUT  
GND  
ICS810525I  
x5 VCXO  
PLL  
16-Lead TSSOP  
4.4mm x 5.0mm x 0.925mm package body  
G Package  
Pulldown  
Q
CLK  
5MHz  
Top View  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
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ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
TABLE 1. PIN DESCRIPTIONS  
Number  
Name  
nc  
Type  
Unused  
Description  
1, 5, 6  
No connect.  
2, 9, 14  
GND  
Q
Power  
Output  
Power  
Power  
Power  
Power supply ground.  
3
4
Single-ended clock output. LVCMOS/LVTTL interface levels.  
Output power supply pin.  
Analog supply pin.  
VDDO  
VDDA  
VDD  
7
8, 16  
Core power supply pins.  
10,  
11  
XTAL_OUT,  
XTAL_IN  
VCXO crystal oscillator interface. XTAL_IN is the input.  
XTAL_OUT is the output.  
Input  
Analog  
Input/Output  
12, 13  
15  
LF0, LF1  
CLK  
Loop filter connection node pins.  
Input  
Pulldown Single-ended clock input. LVCMOS/LVTTL interface levels.  
NOTE: Pulldown refers to internal input resistors. See Table 2, Pin Characteristics, for typical values.  
TABLE 2. PIN CHARACTERISTICS  
Symbol Parameter  
Test Conditions  
Minimum  
Typical Maximum Units  
CIN  
Input Capacitance  
4
8
pF  
pF  
pF  
kΩ  
Ω
VDDO = 3.465V  
CPD  
Power Dissipation Capacitance  
V
DDO = 2.625V  
5
RPULLDOWN Input Pulldown Resistor  
ROUT Output Impedance  
51  
15  
20  
VDDO = 3.3V  
VDDO = 2.5V  
Ω
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
2
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
ABSOLUTE MAXIMUM RATINGS  
Supply Voltage, VDD  
4.6V  
NOTE: Stresses beyond those listed under Absolute  
Maximum Ratings may cause permanent damage to the  
device. These ratings are stress specifications only. Functional op-  
eration of product at these conditions or any conditions beyond  
those listed in the DC Characteristics or AC Characteristics is not  
implied. Exposure to absolute maximum rating conditions for ex-  
tended periods may affect product reliability.  
Inputs, V  
-0.5V to VDD + 0.5 V  
-0.5V to VDDO + 0.5V  
92.4°C/W (0 mps)  
-65°C to 150°C  
I
Outputs, VO  
Package Thermal Impedance, θ  
JA  
Storage Temperature, T  
STG  
TABLE 3A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDO = 3.3V 5ꢀ, TA = -40°C TO 85°C  
Symbol Parameter  
Test Conditions  
Minimum  
3.135  
Typical  
3.3  
Maximum Units  
VDD  
VDDA  
VDDO  
IDD  
Power Supply Voltage  
3.465  
VDD  
3.465  
35  
V
V
Analog Supply Voltage  
Output Supply Voltage  
Power Supply Current  
Analog Supply Current  
VDD – 0.05  
3.135  
3.3  
3.3  
V
mA  
mA  
IDDA  
5
TABLE 3B. POWER SUPPLY DC CHARACTERISTICS, VDD = 3.3V 5ꢀ, VDDO = 2.5V 5ꢀ, TA = -40°C TO 85°C  
Symbol Parameter  
Test Conditions  
Minimum  
3.135  
Typical  
3.3  
Maximum Units  
VDD  
VDDA  
VDDO  
IDD  
Core Supply Voltage  
3.465  
VDD  
2.625  
35  
V
V
Analog Supply Voltage  
Output Supply Voltage  
Power Supply Current  
Analog Supply Current  
VDD – 0.05  
2.375  
3.3  
2.5  
V
mA  
mA  
IDDA  
5
TABLE 3C. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = 3.3V 5ꢀ, VDDO = 3.3V 5ꢀ OR 2.5V 5ꢀ, TA = -40°C TO 85°C  
Symbol Parameter  
Test Conditions  
Minimum Typical Maximum Units  
VIH  
VIL  
VLF1  
IIH  
Input High Voltage  
2
-0.3  
0
VDD + 0.3  
0.8  
V
V
Input Low Voltage  
VCXO Control Voltage  
Input High Current  
Input Low Current  
VDD  
V
VDD = VIN = 3.465V or 2.625V  
VDD = 3.465V or 2.625V, VIN = 0V  
VDD = 3.465V or 2.625V  
150  
µA  
µA  
µA  
V
IIL  
-5  
-100  
2.6  
II  
Input Current of VLF1 pin  
100  
0.5  
V
V
DDO = 3.3V 5ꢀ, IOH = -12mA  
DDO = 2.5V 5ꢀ, IOH = -12mA  
VOH  
VOL  
Output High Voltage  
Output Low Voltage  
1.8  
V
VDDO = 3.3V or 2.5V 5ꢀ IOL = 12mA  
V
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
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ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
TABLE 4A. AC CHARACTERISTICS, VDD = VDDO = 3.3V 5ꢀ, TA = -40°C TO 85°C  
Symbol Parameter  
Test Conditions  
Minimum Typical Maximum Units  
fOUT  
Output Frequency  
25  
MHz  
RMS Phase Jitter (Random);  
NOTE 1  
Integration Range:  
1kHz – 1MHz  
tjit(Ø)  
0.27  
ps  
tR / tF  
odc  
Output Rise/Fall Time  
Output Duty Cycle  
20ꢀ to 80ꢀ  
500  
48  
1200  
52  
ps  
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established  
when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet  
specifications after thermal equilibrium has been reached under these conditions.  
Characterized using a 3kHz bandwidth filter.  
NOTE 1: Please refer to the Phase Noise Plot.  
TABLE 4B. AC CHARACTERISTICS, VDD = 3.3V 5ꢀ, VDDO = 2.5V 5ꢀ, TA = -40°C TO 85°C  
Symbol Parameter  
Test Conditions  
Minimum Typical Maximum Units  
fOUT  
Output Frequency  
25  
MHz  
RMS Phase Jitter (Random);  
NOTE 1  
Integration Range:  
1kHz – 1MHz  
tjit(Ø)  
0.26  
ps  
tR / tF  
odc  
Output Rise/Fall Time  
Output Duty Cycle  
20ꢀ to 80ꢀ  
600  
44  
2100  
56  
ps  
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established  
when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet  
specifications after thermal equilibrium has been reached under these conditions.  
Characterized using a 3kHz bandwidth filter.  
NOTE 1: Please refer to the Phase Noise Plot.  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
4
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
TYPICAL PHASE NOISE AT 25MHZ @ 3.3V/3.3V  
25MHz  
RMS Phase Jitter (Random)  
Filter  
1kHz to 1MHz = 0.27ps (typical)  
Raw Phase Noise Data  
Phase Noise Result by adding  
a Filter to raw data  
OFFSET FREQUENCY (HZ)  
TYPICAL PHASE NOISE AT 25MHZ @ 3.3V/2.5V  
25MHz  
RMS Phase Jitter (Random)  
1kHz to 1MHz = 0.26ps (typical)  
Filter  
Raw Phase Noise Data  
Phase Noise Result by adding  
a Filter to raw data  
OFFSET FREQUENCY (HZ)  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
5
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
PARAMETER MEASUREMENT INFORMATION  
1.65V 5ꢀ  
2.05V 5ꢀ  
1.25V 5ꢀ  
1.65V 5ꢀ  
2.05V 5ꢀ  
SCOPE  
VDD,  
VDDO  
VDD  
SCOPE  
VDDA  
Qx  
VDDO  
LVCMOS  
GND  
VDDA  
Qx  
LVCMOS  
GND  
-1.65V 5ꢀ  
-1.25V 5ꢀ  
3.3V CORE/3.3V OUTPUT LOAD AC TEST CIRCUIT  
3.3V CORE/2.5V OUTPUT LOAD AC TEST CIRCUIT  
Phase Noise Plot  
VDD  
2
Q
tPW  
tPERIOD  
Phase Noise Mask  
tPW  
x 100ꢀ  
odc =  
Offset Frequency  
f1  
f2  
tPERIOD  
RMS Jitter = Area Under the Masked Phase Noise Plot  
RMS PHASE JITTER  
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD  
80ꢀ  
tF  
80ꢀ  
tR  
20ꢀ  
20ꢀ  
Q
OUTPUT RISE/FALL TIME  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
6
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
APPLICATION INFORMATION  
SCHEMATIC EXAMPLE  
Figure 1 shows an example of the ICS810525I application  
driver. A 2-pole filter loop filter with Low LBW setting is used in  
this example. It is recommended to refer to the ICS810525I  
datasheet for more detail on loop filter values.  
schematic. In this example, the device is operated at V = 3.3V.  
The decoupling capacitors should be located as close as  
possible to the power pin.The input is driven by a 3.3V LVCMOS  
DD  
VDD  
VDD = VDDO = 3.3V  
Q1  
R1  
33  
C6  
0.1u  
Zo = 50  
R2  
Q
Zo = 50  
Driver_LVCMOS  
U2  
33  
Receiver  
16  
15  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
8
VDDO  
VDD  
CLK  
GND  
LF1  
nc  
GND  
Q
VDDO  
nc  
nc  
VDDA  
2-pole loop filter with low LBW Setting  
LF0  
LF1  
LF0  
C7  
0.1u  
LF0  
Rs  
1k  
XTAL_IN  
XTAL_OUT  
GND  
VDD  
R3  
VDD  
10  
VDDA  
Cp  
Cs  
10nF  
VDD  
10uF  
C3  
C4  
ICS810525I  
0.01u  
10u  
C5  
0.1u  
XTAL_I N  
C1  
TUNE  
X1  
XTAL_OUT  
C2  
TUNE  
FIGURE 1. ICS810525I SCHEMATIC EXAMPLE  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
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ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
VCXO-PLL EXTERNAL COMPONENTS  
Choosing the correct external components and having a proper  
printed circuit board (PCB) layout is a key task for quality  
operation of the VCXO-PLL. In choosing a crystal, special  
precaution must be taken with the package and load  
capacitance (C ). In addition, frequency, accuracy and  
temperature rangLe must also be considered. Since the pulling  
range of a crystal also varies with the package, it is  
recommended that a metal-canned package like HC49 be used.  
Generally, a metal-canned package has a larger pulling range  
than a surface mounted device (SMD). For crystal selection  
information, refer to the VCXO Crystal Selection Application  
Note.  
the crystal specification. In either case, the absolute tuning  
range is reduced. The correct value of C is dependent on the  
L
characteristics of the VCXO.The recommended C in the Crystal  
Parameter Table balances the tuning range by Lcentering the  
tuning curve.  
The VCXO-PLL Loop Bandwidth Selection Table shows R , C  
S
S
and C values for recommended high, mid and low loop  
P
bandwidth configurations. The device has been characterized  
using these parameters. For other configurations, refer to the  
Loop Filter Component Selection for VCXO Based PLLs  
Application Note.  
LF0  
LF1  
The crystal and external loop  
The crystal’s load capacitance C characteristic determines its  
L
filter components should be  
kept as close as possible to the  
resonating frequency and is closely related to the VCXO tuning  
range. The total external capacitance seen by the crystal when  
installed on a board is the sum of the stray board capacitance,  
IC package lead capacitance, internal varactor capacitance and  
RS  
device. Loop filter and crystal  
CP  
CS  
traces should be kept short and  
separated from each other.  
Other signal traces should be  
kept separate and not run  
underneath the device, loop  
filter or crystal components.  
any installed tuning capacitors (C ).  
TUNE  
XTAL_IN  
If the crystal’s C is greater than the total external capacitance,  
the VCXO will oLscillate at a higher frequency than the crystal  
CTUNE  
25MHz  
specification. If the crystal’s C is lower than the total external  
XTAL_OUT  
L
CTUNE  
capacitance, the VCXO will oscillate at a lower frequency than  
VCXO CHARACTERISTICS TABLE  
Symbol Parameter  
Typical  
15  
Unit  
kHz/V  
pF  
kVCXO  
VCXO Gain  
CV_LOW  
CV_HIGH  
Low Varactor Capacitance  
High Varactor Capacitance  
9.8  
22.7  
pF  
VCXO-PLL APPROXIMATE LOOP BANDWIDTH SELECTION TABLE  
Bandwidth  
125Hz (Low)  
1.5kHz (Mid)  
3kHz (High)  
Crystal Frequency (MHz)  
RS (kΩ)  
CS (µF)  
CP (pF)  
10000  
100  
25MHz  
25MHz  
25MHz  
1
10  
12  
25  
0.1  
0.1  
100  
CRYSTAL CHARACTERISTICS  
Symbol Parameter  
Mode of Operation  
Minimum Typical  
Maximum  
Units  
Fundamental  
fN  
fT  
fS  
Frequency  
25  
MHz  
ppm  
ppm  
°C  
Frequency Tolerance  
Frequency Stability  
Operating Temperature Range  
Load Capacitance  
Shunt Capacitance  
Pullability Ratio  
20  
20  
-40  
85  
CL  
10  
4
pF  
CO  
pF  
CO/C1  
ESR  
220  
240  
Equivalent Series Resistance  
Drive Level  
40  
1
Ω
mW  
ppm  
Aging @ 25°C  
3 per year  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
8
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
RELIABILITY INFORMATION  
TABLE 5. θ VS. AIR FLOW TABLE FOR 16 LEAD TSSOP  
JA  
θ by Velocity (Meters per Second)  
JA  
0
1
2.5  
Multi-Layer PCB, JEDEC Standard Test Boards  
92.4°C/W  
88.0°C/W  
85.9°C/W  
TRANSISTOR COUNT  
The transistor count for ICS810525I is: 635  
PACKAGE OUTLINE & PACKAGE DIMENSIONS  
PACKAGE OUTLINE - G SUFFIX FOR 16 LEAD TSSOP  
TABLE 6. PACKAGE DIMENSIONS  
Millimeters  
SYMBOL  
Minimum  
Maximum  
N
A
16  
--  
1.20  
0.15  
1.05  
0.30  
0.20  
5.10  
A1  
A2  
b
0.05  
0.80  
0.19  
0.09  
4.90  
c
D
E
6.40 BASIC  
0.65 BASIC  
E1  
e
4.30  
4.50  
L
0.45  
0°  
0.75  
8°  
α
aaa  
--  
0.10  
Reference Document: JEDEC Publication 95, MO-153  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
9
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
TABLE 7. ORDERING INFORMATION  
Part/Order Number  
810525AGILF  
Marking  
10525AIL  
10525AIL  
Package  
Shipping Packaging  
tube  
Temperature  
-40°C to 85°C  
-40°C to 85°C  
16 Lead "Lead-Free" TSSOP  
16 Lead "Lead-Free" TSSOP  
810525AGILFT  
2500 tape & reel  
NOTE: Parts that are ordered with an "LF" suffix to the part number are the Pb-Free configuration and are RoHS compliant.  
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Incorporated (IDT) assumes no responsibility for either its use or for  
infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and  
industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT  
reserves the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
10  
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
REVISION HISTORY SHEET  
Description of Change  
LVCMOS DC Characteristics - added to VOH/VOL test conditions.  
Rev  
Table  
Page  
Date  
B
T3C  
3
2/24/09  
IDT/ ICSVCXO-TO-LVCMOS/LVTTL OUTPUT  
11  
ICS810525AGI REV. B FEBRUARY 24, 2009  
ICS810525I  
VCXO-TO-LVCMOS/LVTTL OUTPUT  
Innovate with IDT and accelerate your future networks. Contact:  
www.IDT.com  
For Sales  
For Tech Support  
Corporate Headquarters  
Integrated Device Technology, Inc.  
6024 Silver Creek Valley Road  
San Jose, CA 95138  
800-345-7015 (inside USA)  
+408-284-8200 (outside USA)  
Fax: 408-284-2775  
netcom@idt.com  
+480-763-2056  
www.IDT.com/go/contactIDT  
United States  
800-345-7015 (inside USA)  
+408-284-8200 (outside USA)  
© 2009 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks  
of Integrated Device Technology, Inc. Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be  
trademarks or registered trademarks used to identify products or services of their respective owners.  
Printed in USA  

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