83948I_16 [IDT]

Low Skew, 1-to-12 Differential-to- LVCMOS/LVTTL Fanout Buffer;
83948I_16
型号: 83948I_16
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

Low Skew, 1-to-12 Differential-to- LVCMOS/LVTTL Fanout Buffer

文件: 总13页 (文件大小:291K)
中文:  中文翻译
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83948I  
Low Skew, 1-to-12 Differential-to-  
LVCMOS/LVTTL Fanout Buffer  
Datasheet  
PRODUCT DISCONTINUATION NOTICE - LAST TIME BUY EXPIRES MAY 6, 2017  
General Description  
Features  
The 83948I is a low skew, 1-to-12 Differential-to-LVCMOS/LVTTL  
Fanout Buffer and a member of the family of High Performance  
Clock Solutions from IDT. The 83948I has two selectable clock  
inputs. The CLK, nCLK pair can accept most standard differential  
input levels. The LVCMOS_CLK can accept LVCMOS or LVTTL  
input levels. The low impedance LVCMOS/LVTTL outputs are  
designed to drive 50series or parallel terminated transmission  
lines. The effective fanout can be increased from 12 to 24 by  
utilizing the ability of the outputs to drive two series terminated  
lines.  
Twelve LVCMOS/LVTTL outputs  
Selectable differential CLK/nCLK or LVCMOS/LVTTL clock  
input  
CLK/nCLK pair can accept the following differential  
input levels: LVPECL, LVDS, LVHSTL, SSTL, HCSL  
LVCMOS_CLK supports the following input types: LVCMOS,  
LVTTL  
Maximum output frequency: 250MHz  
Output skew: 350ps (maximum)  
Part-to-part skew: 1.5ns (maximum)  
3.3V core, 3.3V output  
-40°C to 85°C ambient operating temperature  
Available in lead-free (RoHS 6) package  
For drop in replacement part use 83948i-147  
The 83948I is characterized at full 3.3V core/3.3V output.  
Guaranteed output and part-to-part skew characteristics make the  
83948I ideal for those clock distribution applications demanding  
well defined performance and repeatability.  
Pin Assignment  
Pullup  
CLK_EN  
D
Q
32 31 30 29 28 27 26 25  
Pullup  
LVCMOS_CLK  
1
1
2
3
4
5
6
7
8
CLK_SEL  
GND  
24  
23  
22  
21  
20  
Q0  
Pullup  
CLK  
nCLK  
LVCMOS_CLK  
CLK  
Q4  
0
Pulldown  
Q1  
VDDO  
Q5  
Pullup  
CLK_SEL  
Q2  
nCLK  
CLK_EN  
GND  
Q3  
OE  
VDD  
Q6  
Block Diagram  
19  
18  
17  
Q4  
VDDO  
Q7  
GND  
Q5  
9
10 11 12 13 14 15 16  
Q6  
Q7  
83948I  
Q8  
32-Lead LQFP  
7mm x 7mm x 1.4mm package body  
Q9  
Y Package  
Top View  
Q10  
Q11  
Pullup  
OE  
©2016 Integrated Device Technology, Inc  
1
May 19, 2016  
83948I Datasheet  
Table 1. Pin Descriptions  
Number  
Name  
Type  
Description  
Clock select input. When HIGH, selects LVCMOS_CLK input.  
1
CLK_SEL  
Input  
Pullup  
When LOW, selects CLK/nCLK inputs. LVCMOS / LVTTL interface levels.  
Single-ended clock input. LVCMOS/LVTTL interface levels.  
Non-inverting differential clock input.  
2
3
4
5
6
7
LVCMOS_CLK  
CLK  
Input  
Input  
Input  
Input  
Input  
Power  
Pullup  
Pullup  
nCLK  
Pulldown Inverting differential clock input.  
CLK_EN  
OE  
Pullup  
Pullup  
Clock enable pin. LVCMOS/LVTTL interface levels.  
Output enable pin. LVCMOS/LVTTL interface levels.  
Positive supply pin.  
VDD  
8, 12, 16,  
20, 24, 28, 32  
GND  
Power  
Output  
Power  
Power supply ground.  
9, 11, 13,  
15, 17, 19,  
21, 23, 25,  
27, 29, 31  
Q11, Q10, Q9,  
Q8, Q7, Q6,  
Q5, Q4, Q3,  
Q2, Q1, Q0  
Single-ended clock outputs. LVCMOS/LVTTL interface levels.  
10, 14, 18,  
22, 26, 30  
VDDO  
Output supply pins.  
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.  
Table 2. Pin Characteristics  
Symbol  
CIN  
Parameter  
Test Conditions  
Minimum  
Typical  
Maximum  
Units  
pF  
Input Capacitance  
Input Pullup Resistor  
4
RPULLUP  
51  
51  
k  
RPULLDOWN Input Pulldown Resistor  
k  
Power Dissipation Capacitance  
(per output)  
CPD  
25  
7
pF  
ROUT  
Output Impedance  
Function Tables  
Table 3A. Clock Select Function Table  
Control Input  
Clock  
CLK_SEL  
CLK/nCLK  
Selected  
LVCMOS_CLK  
0
1
De-selected  
Selected  
De-selected  
©2016 Integrated Device Technology, Inc  
2
May 19, 2016  
83948I Datasheet  
Table 3B. Clock Input Function Table  
Inputs  
Outputs  
Q[0:11]  
LOW  
CLK_SEL LVCMOS_CLK  
CLK  
nCLK  
Input to Output Mode  
Polarity  
0
0
0
0
0
0
1
1
0
1
0
1
Differential to Single-Ended  
Differential to Single-Ended  
Single-Ended to Single-Ended  
Single-Ended to Single-Ended  
Single-Ended to Single-Ended  
Single-Ended to Single-Ended  
Single-Ended to Single-Ended  
Single-Ended to Single-Ended  
Non-Inverting  
Non-Inverting  
Non-Inverting  
Non-Inverting  
Inverting  
1
0
HIGH  
LOW  
0
Biased; NOTE 1  
1
Biased; NOTE 1  
HIGH  
HIGH  
LOW  
Biased; NOTE 1  
0
1
Biased; NOTE 1  
Inverting  
LOW  
Non-Inverting  
Non-Inverting  
HIGH  
Absolute Maximum Ratings  
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.  
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond  
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for  
extended periods may affect product reliability.  
Item  
Rating  
Supply Voltage, VDD  
Inputs, VI  
4.6V  
-0.5V to VDD + 0.5V  
-0.5V to VDDO + 0.5V  
47.9C/W (0 lfpm)  
-65C to 150C  
Outputs, VO  
Package Thermal Impedance, JA  
Storage Temperature, TSTG  
DC Electrical Characteristics  
Table 4A. Power Supply DC Characteristics, VDD = VDDO = 3.3V 0.3V, TA = -40°C to 85°C  
Symbol Parameter  
Test Conditions  
Minimum  
3.0  
Typical  
3.3  
Maximum  
Units  
V
VDD  
VDDO  
IDD  
Positive Supply Voltage  
3.6  
3.6  
55  
Output Supply Voltage  
Power Supply Current  
3.0  
3.3  
V
mA  
©2016 Integrated Device Technology, Inc  
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May 19, 2016  
83948I Datasheet  
Table 4B. DC Characteristics, VDD = VDDO = 3.3V 0.3V, TA = -40°C to 85°C  
Symbol Parameter  
Test Conditions  
Minimum  
2
Typical  
Maximum  
Units  
V
VIH  
Input High Voltage  
VDD + 0.3  
0.8  
VIL  
Input Low Voltage  
-0.3  
V
VPP  
VCMR  
IIN  
Peak-to-Peak Input Voltage; NOTE 1  
Common Mode Input Voltage; NOTE 1, 2  
Input Current  
0.15  
1.3  
V
GND + 0.5  
VDD – 0.85  
100  
V
µA  
V
VOH  
VOL  
Output High Voltage  
IOH = -20mA  
IOL = 20mA  
2.5  
Output Low Voltage  
0.4  
V
NOTE 1: VIL should not be less than -0.3V.  
NOTE 2: Common mode voltage is defined as VIH.  
AC Electrical Characteristics  
Table 5. AC Characteristics, VDD = VDDO = 3.3V 0.3V, TA = -40°C to 85°C  
Parameter Symbol  
fMAX Output Frequency  
Test Conditions  
Minimum  
Typical  
Maximum  
Units  
250  
MHz  
CLK/nCLK;  
NOTE 1A  
ƒ 150MHz  
ƒ 150MHz  
2.25  
2
3.75  
4
ns  
ns  
ps  
tPD  
Propagation Delay  
LVCMOS_CLK;  
NOTE 1B  
Measured on  
Rising Edge @ VDDO/2  
tsk(o)  
Output Skew; NOTE 2, 6  
350  
CLK/nCLK  
LVCMOS_CLK  
1.5  
ns  
ns  
ns  
ps  
ns  
ns  
Part-to-Part Skew;  
NOTE 3, 6  
Measured on  
Rising Edge @ VDDO/2  
tsk(pp)  
2
tR / tF  
tPW  
tPZL, PZH  
tPLZ, PHZ  
Output Rise/Fall Time  
Output Pulse Width  
0.8V to 2V  
0.2  
1.0  
ƒ < 150MHz  
tCycle/2 - 800  
tCycle/2 + 800  
t
Output Enable Time; NOTE 4  
Output Disable Time; NOTE 4  
CLK_EN to  
11  
11  
t
1
0
1
1
ns  
ns  
ns  
ns  
Clock Enable  
CLK/nCLK  
tS  
Setup Time;  
CLK_EN to  
NOTE 5  
LVCMOS_CLK  
CLK/nCLK to  
CLK_EN  
Clock Enable  
Hold Time;  
NOTE 5  
tH  
LVCMOS_CLK to  
CLK_EN  
NOTE 1A: Measured from the differential input crossing point to VDDO/2 of the output.  
NOTE 1B: Measured from VDD/2 or crosspoint of the input to VDDO/2 of the output.  
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2.  
NOTE 3: Defined as skew between outputs on different devices operating a the same supply voltage and with equal load conditions.  
Using the same type of inputs on each device, the outputs are measured at VDDO/2.  
NOTE 4: These parameters are guaranteed by characterization. Not tested in production.  
NOTE 5: Setup and Hold times are relative to the rising edge of the input clock.  
NOTE 6: This parameter is defined in accordance with JEDEC Standard 65.  
©2016 Integrated Device Technology, Inc  
4
May 19, 2016  
83948I Datasheet  
Parameter Measurement Information  
1.65V 0.15V  
V
DD  
SCOPE  
V
V
nCLK  
CLK  
DD,  
DDO  
VPP  
VCMR  
Cross Points  
Qx  
GND  
GND  
-1.65V 0.15V  
3.3V Core/3.3V LVCMOS Output Load AC Test Circuit  
Differential Input Level  
Part 1  
VDDO  
VDDO  
2
Qx  
Qx  
Qy  
2
Part 2  
VDDO  
2
VDDO  
2
Qy  
tsk(o)  
tsk(pp)  
Part-to-Part Skew  
Output Skew  
VDDO  
VDDO  
2
VDDO  
2
2V  
2V  
2
Q0:Q11  
tPW  
0.8V  
0.8V  
Q0:Q11  
tPERIOD  
tR  
tF  
tPW  
tPERIOD  
odc =  
Output Rise/Fall Time  
Output Pulse Width  
©2016 Integrated Device Technology, Inc  
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May 19, 2016  
83948I Datasheet  
Parameter Measurement Information, continued  
VDD  
2
LVCMOS_CLK  
nCLK  
CLK  
VDDO  
2
Q0:Q11  
tPD  
Propagation Delay  
©2016 Integrated Device Technology, Inc  
6
May 19, 2016  
83948I Datasheet  
Application Information  
Wiring the Differential Input to Accept Single Ended Levels  
Figure 1 shows how the differential input can be wired to accept  
single ended levels. The reference voltage V_REF = VDD/2 is  
generated by the bias resistors R1, R2 and C1. This bias circuit  
should be located as close as possible to the input pin. The ratio of  
R1 and R2 might need to be adjusted to position the V_REF in the  
center of the input voltage swing. For example, if the input clock  
swing is only 2.5V and VDD = 3.3V, V_REF should be 1.25V and  
VDD  
R1  
1K  
Single Ended Clock Input  
R2/R1 = 0.609.  
CLK  
V_REF  
nCLK  
C1  
0.1u  
R2  
1K  
Figure 1. Single-Ended Signal Driving Differential Input  
Recommendations for Unused Input and Output Pins  
Inputs:  
Outputs:  
CLK/nCLK Inputs  
LVCMOS Outputs  
For applications not requiring the use of the differential input, both  
CLK and nCLK can be left floating. Though not required, but for  
additional protection, a 1kresistor can be tied from CLK to  
ground.  
All unused LVCMOS output can be left floating. There should be  
no trace attached.  
CLK Input  
For applications not requiring the use of a clock input, it can be left  
floating. Though not required, but for additional protection, a 1k  
resistor can be tied from the CLK input to ground.  
LVCMOS Control Pins  
All control pins have internal pull-ups or pull-downs; additional  
resistance is not required but can be added for additional  
protection. A 1kresistor can be used.  
©2016 Integrated Device Technology, Inc  
7
May 19, 2016  
83948I Datasheet  
Differential Clock Input Interface  
The CLK /nCLK accepts LVDS, LVPECL, LVHSTL, SSTL, HCSL  
and other differential signals. Both signals must meet the VPP and  
VCMR input requirements. Figures 2A to 2F show interface  
examples for the HiPerClockS CLK/nCLK input driven by the most  
common driver types. The input interfaces suggested here are  
examples only. Please consult with the vendor of the driver  
component to confirm the driver termination requirements. For  
example, in Figure 2A, the input termination applies for IDT  
HiPerClockS open emitter LVHSTL drivers. If you are using an  
LVHSTL driver from another vendor, use their termination  
recommendation.  
3.3V  
1.8V  
Zo = 50Ω  
CLK  
Zo = 50Ω  
nCLK  
Differential  
Input  
LVHSTL  
R1  
50Ω  
R2  
50Ω  
IDT  
LVHSTL Driver  
Figure 2A. HiPerClockS CLK/nCLK Input  
Driven by an IDT Open Emitter  
HiPerClockS LVHSTL Driver  
Figure 2B. HiPerClockS CLK/nCLK Input  
Driven by a 3.3V LVPECL Driver  
Figure 2C. HiPerClockS CLK/nCLK Input  
Driven by a 3.3V LVPECL Driver  
Figure 2D. HiPerClockS CLK/nCLK Input  
Driven by a 3.3V LVDS Driver  
2.5V  
3.3V  
3.3V  
3.3V  
2.5V  
R3  
R4  
120Ω  
120Ω  
*R3  
*R4  
Zo = 60Ω  
Zo = 60Ω  
CLK  
CLK  
nCLK  
nCLK  
Differential  
Input  
Differential  
Input  
SSTL  
HCSL  
R1  
R2  
120Ω  
120Ω  
Figure 2E. HiPerClockS CLK/nCLK Input  
Driven by a 3.3V HCSL Driver  
Figure 2F. HiPerClockS CLK/nCLK Input  
Driven by a 2.5V SSTL Driver  
©2016 Integrated Device Technology, Inc  
8
May 19, 2016  
83948I Datasheet  
Reliability Information  
Table 6. JA vs. Air Flow Table for a 32 Lead LQFP  
JA by Velocity  
Linear Feet per Minute  
0
200  
500  
Single-Layer PCB, JEDEC Standard Test Boards  
Multi-Layer PCB, JEDEC Standard Test Boards  
67.8°C/W  
47.9°C/W  
55.9°C/W  
42.1°C/W  
50.1°C/W  
39.4°C/W  
Transistor Count  
The transistor count for 83948I is: 1040  
Pin compatible with the MPC948/948L  
©2016 Integrated Device Technology, Inc  
9
May 19, 2016  
83948I Datasheet  
Package Outline and Package Dimensions  
Package Outline - Y Suffix for 32 Lead LQFP  
Table 7. Package Dimensions for 32 Lead LQFP  
JEDEC Variation: ABC - HD  
All Dimensions in Millimeters  
Symbol  
Minimum  
Nominal  
Maximum  
N
32  
A
1.60  
0.15  
1.45  
0.45  
0.20  
A1  
0.05  
1.35  
0.30  
0.09  
0.10  
1.40  
0.37  
A2  
b
c
D & E  
9.00 Basic  
7.00 Basic  
5.60 Ref.  
0.80 Basic  
0.60  
D1 & E1  
D2 & E2  
e
L
0.45  
0°  
0.75  
7°  
ccc  
0.10  
Reference Document: JEDEC Publication 95, MS-026  
©2016 Integrated Device Technology, Inc  
10  
May 19, 2016  
83948I Datasheet  
Ordering Information  
Table 8. Ordering Information  
Part/Order Number  
83948AYILF  
83948AYILFT  
Marking  
ICS83948AYIL  
ICS83948AYI  
Package  
“Lead-Free” 32 Lead LQFP  
“Lead-Free” 32 Lead LQFP  
Shipping Packaging  
Tray  
Temperature  
-40C to 85C  
-40C to 85C  
Tape & Reel  
©2016 Integrated Device Technology, Inc  
11  
May 19, 2016  
83948I Datasheet  
Revision History Sheet  
Rev  
Table  
Page  
Description of Change  
Date  
T5  
4
AC Characteristics table - tLZ, tHZ row changed symbol to read tPLZ, tPHZ and  
changed Parameter to read Output Enable Time.  
Added rows: tS ""Clock Enable Setup Time"" and tH ""Clock Enable Hold  
Time"".  
B
5/20/02  
T5  
4
AC Characteristics table, tS and tH rows - replaced SYNC_OE with CLK_EN.  
Added an extra note to Propagation Delay row.  
B
B
B
6/26/02  
8/8/02  
AC Characteristics table, fMAX row corrected typo error of 150MHz to  
250MHz.  
T5  
T5  
4
4
AC Characteristics table - tPW row, added f< 150MHz for tPW Test Conditions.  
11/11/02  
1
2
6
9
Features Section - added Lead-Free bullet.  
T2  
T8  
Pin Characteristics Table - changed CIN from 4pF max. to 4pF typical.  
Added Recommendations for Unused Output Pins.  
Ordering Information Table - added Lead-Free part number, marking and  
note.  
C
12/15/05  
8
11  
Added Differential Clock Input Interface Section.  
Ordering Information Table - corrected Temperature column.  
Updated datasheet format.  
C
C
T8  
T8  
3/6/08  
11  
1
Removed leaded orderable parts from Ordering Information table  
11/14/12  
General Description - Removed ICS Chip and HiPerClockS.  
Features Section - Removed reference to leaded packages  
Removed ICS from the Part Number.  
Ordering Information - Removed ICS from the Part/Order Number. Removed  
1000 from the Tape & Reel. Removed the LF note from below the table.  
Updated Header and Footer.  
C
C
12/16/15  
5/19/16  
T8  
11  
Product Discontinuation Notice - Last time buy expires May 6, 2017.  
PDN CQ-16-01  
©2016 Integrated Device Technology, Inc  
12  
May 19, 2016  
83948I Datasheet  
Corporate Headquarters  
6024 Silver Creek Valley Road  
San Jose, CA 95138 USA  
www.IDT.com  
Sales  
Tech Support  
www.idt.com/go/support  
1-800-345-7015 or 408-284-8200  
Fax: 408-284-2775  
www.IDT.com/go/sales  
DISCLAIMER Integrated Device Technology, Inc. (IDT) reserves the right to modify the products and/or specifications described herein at any time, without notice, at IDT's sole discretion. Performance specifications  
and operating parameters of the described products are determined in an independent state and are not guaranteed to perform the same way when installed in customer products. The information contained herein  
is provided without representation or warranty of any kind, whether express or implied, including, but not limited to, the suitability of IDT's products for any particular purpose, an implied warranty of merchantability,  
or non-infringement of the intellectual property rights of others. This document is presented only as a guide and does not convey any license under intellectual property rights of IDT or any third parties.  
IDT's products are not intended for use in applications involving extreme environmental conditions or in life support systems or similar devices where the failure or malfunction of an IDT product can be reasonably  
expected to significantly affect the health or safety of users. Anyone using an IDT product in such a manner does so at their own risk, absent an express, written agreement by IDT.  
Integrated Device Technology, IDT and the IDT logo are trademarks or registered trademarks of IDT and its subsidiaries in the United States and other countries. Other trademarks used herein are the property of  
IDT or their respective third party owners.  
For datasheet type definitions and a glossary of common terms, visit www.idt.com/go/glossary.  
Copyright ©2016 Integrated Device Technology, Inc. All rights reserved.  

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