ICS8431AM-01LFT [IDT]

Clock Generator, 200MHz, PDSO28, SOIC-28;
ICS8431AM-01LFT
型号: ICS8431AM-01LFT
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

Clock Generator, 200MHz, PDSO28, SOIC-28

时钟 光电二极管 外围集成电路 晶体
文件: 总7页 (文件大小:96K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PRELIMINARY  
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
GENERAL DESCRIPTION  
FEATURES  
The ICS8431-01 is a general purpose clock Fully integrated PLL  
,&6  
frequency synthesizer and a member of the  
Differential 3.3V LVPECLoutput  
200MHz output frequency  
HiPerClockS™ HiPerClockS™ family of High Performance  
Clock Solutions from ICS. The ICS8431-01  
consists of one independent low bandwidth PLL  
Crystal oscillator interface  
timing channel. A 16.666MHz crystal is used as the input to  
the on-chip oscillator. The M and N dividers are configured to  
produce a fixed output frequency of 200MHz.  
Spread Spectrum Clocking (SSC) fixed at 1/2% modulation  
for environments requiring ultra low EMI  
Programmable features of the ICS8431-01 support four op-  
erational modes. The four modes are spread spectrum clock-  
ing (SSC), non-spread spectrum clock and two test modes  
and are controlled by the Power Up Latch. After power up  
the latch is disabled and the initial programmed values can  
only be overwritten by removing all power to the device.  
LVTTL/ LVCMOS control inputs  
PLL bypass modes supporting in-circuit testing and on-chip  
functional block characterization  
28 lead SOIC  
In SSC mode the output clock is modulated in order to achieve  
a reduction in EMI. In one of the PLL bypass test modes the  
PLL is disconnected as the source to the differential output  
allowing an external source to be connnected to the  
TEST_I/O pin. This is useful for in-circuit testing and allows  
the differential output to be driven at a lower frequency  
throughout the system clock tree. In the other PLL bypass  
mode the oscillator divider is used as the source to both the  
M and N dividers. In this configuration the frequency at FOUT,  
nFOUT equals the crystal frequency divide by 16 divided by  
N. The frequency at TEST I/O equals the crystal frequency  
divide by 16 divided by M. This is useful for characterizing  
the oscillator and internal dividers.  
BLOCK DIAGRAM  
PIN ASSIGNMENT  
XTAL1  
OSC  
XTAL2  
nc  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
nc  
nc  
nc  
nc  
nc  
nc  
2
3
4
5
6
7
VDDI  
XTAL2  
XTAL1  
nc  
nc  
VDDA  
nc  
nc  
nc  
VDDO  
FOUT  
nFOUT  
GND  
÷ 16  
PLL  
nc  
PHASE  
DETECTOR  
nc  
nc  
8
9
VCO  
SSC_CTL0  
SSC_CTL1  
GNDT  
TEST_I/O  
VDDT  
10  
11  
12  
13  
14  
÷ N  
FOUT  
nFOUT  
÷ M  
TEST_I/O  
ICS8431-01  
SSC_CTL0  
SSC_CTL1  
Power  
Up  
Latch  
28-Lead SOIC  
M Package  
Top View  
Configuration Logic  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
1
PRELIMINARY  
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
CONFIGURATION PROGRAMMING INTERFACE  
Programming the Spread Spectrum Clocking (SSC) feature is accomplished by configuring the internal PUL register. The input to  
this register is encoded by the SSC_CTL[1:0] pins which define all functional states after power is applied. Figure 1 shows the timing  
relationship of the latched SSC_CTL[1:0] in relationship to the PLL power-on condition.  
VDD = 0V  
VDD = 3.3V  
VDD Power On  
SSC_CTL[1:0]  
t = 100µs  
Data Valid  
TPUL_SU  
TPUL_HD  
FIGURE 1. POWER-UP CONFIGURATION TIMING  
After power is applied, the control bits SSC_CTL0 and SSC_CTL1 are latched after approximately 100µs. TPUL_SU is the time  
during which the data on the control bits is required to be valid before being latched. TPUL_HD is the time after the data is latched that  
the control bits are required to remain valid. The configuration latch can only be overwritten by removing the power and applying data  
to the inputs that meet the setup and hold time requirment during power-on, as defined in Figure 1. Table 3, Input Function Table  
defined the valid commands for SSC_CTL[1:0] lines.  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
2
PRELIMINARY  
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
TABLE 1. PIN DESCRIPTIONS  
Number  
Name  
Type  
Description  
1 -9, 19,  
20, 21, 23,  
24, 28  
nc  
Unused  
No connection.  
These LVCMOS / LVTTL pins are sampled during power-up to configure the  
SSC control. After power-up inputs have no effect on the latched configuration  
register.  
SSC CTL 0,  
SSC CTL 1  
10, 11  
Input  
Pullup  
12  
13  
GNDT  
Power  
Ground pin for core and test output.  
Input /  
Output  
TEST I/O  
Programmed asdefined in Table 3, Function Table.  
14  
15  
VDDT  
GND  
Power  
Power  
Power supply pin for test output.  
Ground pin for output.  
These differential outputs are main output drivers for the synthesizer. They are  
compatible with terminated positive referenced LVPECL logic.  
16, 17  
nFOUT, FOUT  
Output  
18  
22  
27  
VDDO  
VDDA  
VDDI  
Power  
Power  
Power  
Power supply pin for output.  
PLL power supply pin.  
Power supply pin for core.  
TABLE 2. PIN CHARACTERISTICS  
Symbol  
Parameter  
Test Conditions  
Minimum  
Typical  
51  
Maximum Units  
RPULLUP  
Input Pullup Resistor  
KΩ  
KΩ  
RPULLDOWN Input Pulldown Resistor  
51  
TABLE 3. FUNCTION TABLE  
Inputs  
Outputs  
FOUT, nFOUT TEST_I/O  
Disabled fXTAL ÷ 16 ÷ N fXTAL ÷ 16 ÷ M  
TEST_I/O  
Source  
Operational Modes  
SSC  
SSC_CTL1 SSC_CTL0  
PLL bypass; Oscillator, oscillator, M and N  
dividers test mode. NOTE 1  
0
0
Internal  
0
1
1
1
0
1
PLL  
External  
PLL  
Enabled  
Disabled  
Disabled  
200MHz  
Test Clk  
200MHz  
Hi-Z  
Input  
Hi-Z  
Default SSC; Modulation Factor = ½ Percent  
PLL Bypass Mode, (1MHz Test Clk 200MHz)  
No SSC Modulation  
NOTE 1: Used for in house debug and characterization.  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
3
PRELIMINARY  
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
ABSOLUTE MAXIMUM RATINGS  
Supply Voltage  
4.6V  
Inputs  
Outputs  
-0.5V to VDD + 0.5V  
-0.5V to VDDO + 0.5V  
0°C to 70°C  
Ambient Operating Temperature  
Storage Temperature  
-65°C to 150°C  
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress  
specifications only and functional operation of product at these condition or any conditions beyond those listed in the DC Electrical  
Characteristics or AC Electrical Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may  
affect product reliability.  
TABLE 4A. LVTTL, LVCMOS DC ELECTRICAL CHARACTERISTICS, VDDA, VDDI=VDDO=VDDT=3.3V±5%, TA=0°C TO 70°C  
Symbol  
Parameter  
Test Conditions  
Minimum  
Typical  
Maximum Units  
VDDA, VDDI,  
VDDO, VDDT  
Power Supply Voltage  
3.135  
3.3  
3.465  
V
SSC_CTL0, SSC_CTL1  
TEST_I/O  
VDDI = 3.465V  
VDDI = 3.465V  
2
2
3.765  
3.765  
0.8  
V
V
VIH  
Input High Voltage  
SSC_CTL0, SSC_CTL1  
TEST_I/O  
VDDI = 3.135V  
-0.3  
V
VIL  
IIH  
IIL  
Input Low Voltage  
Input High  
VDDI = 3.135V  
1.3  
V
SSC_CTL0, SSC_CTL1  
TEST_I/O  
VDDI = VIN = 3.465V  
VDDI = VIN = 3.465V  
50  
µA  
µA  
µA  
µA  
Current  
50  
SSC_CTL0, SSC_CTL1 VDDI = 3.465V, VIN = 0V  
TEST_I/O VDDI = 3.465V, VIN = 0V  
-150  
-50  
Input Low Current  
TABLE 4B. LVPECL DC ELECTRICAL CHARACTERISTICS, VDDA, VDDI=VDDO=VDDT=3.3V±5%, TA=0°C TO 70°C  
Symbol  
VOH  
Parameter  
Test Conditions  
VDDI = VDDO = 3.3V  
VDDI = VDDO = 3.3V  
Minimum  
Typical  
Maximum  
Units  
V
Output High Voltage; NOTE 1, 2  
Output Low Voltage; NOTE 1, 2  
Common Mode Voltage Range  
Output High Current  
2.1  
1.4  
600  
16  
2.2  
1.5  
800  
18  
VOL  
V
VSWING  
IOH  
700  
mV  
mA  
mA  
IOL  
Output Low Current  
2
4
NOTE 1: These values are for VDDO equal to 3.3V. Output levels will vary 1:1 with VDDO.  
NOTE 2: Output terminated with 50to VDDO - 2V.  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
4
PRELIMINARY  
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
TABLE 5. AC ELECTRICAL CHARACTERISTICS, VDDI=VDDO=3.3V±5%, TA=0°C TO 70°C  
Symbol  
tPERIOD  
tjit  
Parameter  
Test Conditions  
fout = 200MHz  
fout = 200MHz  
fout = 200MHz  
20% to 80%  
Minimum  
Typical  
Maximum Units  
Output Period; NOTE 1  
Peak Jitter (Short Cycle); NOTE 1  
Output Duty Cycle; NOTE 1  
Output Rise Time  
4995  
5005  
50  
ps  
ps  
tDC  
47  
300  
300  
14  
53  
%
tR  
800  
800  
18  
ps  
tF  
Output Fall Time  
20% to 80%  
ps  
Fxtal  
Crystal Input Range  
MHz  
KHz  
%
Fm  
SSC Modulation Frequency  
SSC Modulation Factor  
Power-up to Stable Clock Output  
Configuration Latch Setup Time  
Configuration Latch Hold Time  
30  
33.33  
Fmf  
0.5  
tSTABLE  
tPUL_SU  
tPUL_HD  
TBD  
µs  
10  
0
ns  
ns  
NOTE 1: Spread spectrum clocking enabled  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
5
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
PACKAGE OUTLINE AND DIMENSIONS - M SUFFIX  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
6
Integrated  
Circuit  
Systems, Inc.  
ICS8431-01  
CLOCK SYNTHESIZER  
ORDERING INFORMATION  
Part/Order Number  
Marking  
Package  
28 Lead SOIC  
Count  
Temperature  
0°C to 70°C  
0°C to 70°C  
ICS8431AM-01  
ICS8431AM-01  
ICS8431AM-01  
ICS8431AM-01T  
28 LeadSOIC on Tape and Reel  
8431-01  
www.icst.com  
SEPTEMBER 13, 2000  
7

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