IDT70T3719_18 [IDT]
HIGH-SPEED SYNCHRONOUS DUAL-PORT STATIC RAM;型号: | IDT70T3719_18 |
厂家: | INTEGRATED DEVICE TECHNOLOGY |
描述: | HIGH-SPEED SYNCHRONOUS DUAL-PORT STATIC RAM |
文件: | 总25页 (文件大小:345K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
HIGH-SPEED 2.5V
256/128K x 72
SYNCHRONOUS
IDT70T3719/99M
DUAL-PORTSTATICRAM
WITH 3.3V OR 2.5V INTERFACE
LEAD FINISH (SnPb) ARE IN EOL PROCESS - LAST TIME BUY EXPIRES JUNE 15, 2018
Features:
True Dual-Port memory cells which allow simultaneous
◆
– 1.7ns setup to clock and 0.5ns hold on all control, data, and
address inputs @ 166MHz
– Data input, address, byte enable and control registers
Separate byte controls for multiplexed bus and bus
matching compatibility
Dual Cycle Deselect (DCD) for Pipelined Output Mode
2.5V ( 100mV) power supply for core
LVTTL compatible, selectable 3.3V ( 150mV) or 2.5V
( 100mV) power supply for I/Os and control signals on
each port
Industrial temperature range (-40°C to +85°C) is
available at 133MHz
Available in a 324-pin Green Ball Grid Array (BGA)
Includes JTAG Functionality
Green parts available, see ordering information
access of the same memory location
High-speed data access
◆
◆
– Commercial: 3.6ns (166MHz)/
4.2ns (133MHz)(max.)
◆
◆
◆
– Industrial: 4.2ns (133MHz) (max.)
Selectable Pipelined or Flow-Through output mode
Counter enable and repeat features
Dual chip enables allow for depth expansion without
◆
◆
◆
additional logic
Interrupt and Collision Detection Flags
Full synchronous operation on both ports
– 6ns cycle time, 166MHz operation (23.9Gbps bandwidth)
– Fast 3.6ns clock to data out
◆
◆
◆
◆
◆
◆
– Self-timedwriteallowsfastcycletime
Functional Block Diagram
BE7L
BE7R
BE0L
BE0R
FT/PIPE
L
0a 1a
a
0h 1h
h
1h 0h
h
1a 0a
a
FT/PIPER
1/0
1/0
R/WL
R/WR
CE0L
CE0R
1
1
CE1R
CE1L
0
0
B
W
0
B
W
7
B
W
7
B
W
0
1/0
1/0
L
L
R
R
OE
R
OE
L
D
D
D
D
D
D
D
D
OUT0-8_L
OUT9-17_L
D
D
D
D
D
D
D
D
OUT0-8_R
OUT9-17_R
OUT18-26_L
OUT27-35_L
OUT36-44_L
OUT45-53_L
OUT54-62_L
OUT63-72_L
OUT18-26_R
OUT27-35_R
OUT36-44_R
OUT45-53_R
OUT54-62_R
OUT63-72_R
,
1h 0h
1a 0a
0a 1a
0h 1h
0/1
0/1
FT/PIPER
FT/PIPE
L
a
h
h
a
256/128K x 72
MEMORY
ARRAY
Byte 0
I/O0L - I/O71L
Byte 7
Byte 7
Byte 0
I/O0R - I/O71R
D
IN_L
D
IN_R
,
CLK
L
CLKR
(1)
17L
(1)
17R
A
A
A
A
0L
REPEAT
ADS
Counter/
Address
Reg.
Counter/
Address
Reg.
R
0
ADDR_R
ADDR_L
L
REPEAT
ADS
CNTEN
R
R
L
R
CNTEN
L
INTERRUPT
CE
0
L
CE0R
TDI
TDO
TCK
TMS
T RST
COLLISION
DETECTION
LOGIC
CE
1
L
CE1R
JTAG
R/W
L
R/W
R
L
COL
INT
R
COL
INT
L
R
ZZ
CONTROL
LOGIC
(2)
(2)
ZZR
ZZ
L
5687 drw 01
NOTES:
1. Address A17 is a NC for the IDT70T3799.
2. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. All static inputs, i.e., PL/FTx and OPTx
FEBRUARY 2018
and the sleep mode pins themselves (ZZx) are not affected during sleep mode.
1
DSC 5687/4
©2018 Integrated Device Technology, Inc.
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Description:
TheIDT70T3719/99Misahigh-speed256K/128Kx72bitsynchro- tionalorbidirectionaldataflowinbursts.Anautomaticpowerdownfeature,
nousDual-PortRAM.ThememoryarrayutilizesDual-Portmemorycells controlled by CE0 and CE1, permits the on-chip circuitry of each port to
toallowsimultaneousaccessofanyaddressfrombothports.Registerson enter a very low standby power mode.
control,data,andaddressinputsprovideminimalsetupandholdtimes.
The 70T3719/99M can support an operating voltage of either 3.3V
The timing latitude provided by this approach allows systems to be or 2.5V on one or both ports, controllable by the OPT pins. The power
designed with very short cycle times. With an input data register, the supply for the core of the device (VDD) is at 2.5V.
IDT70T3719/99Mhasbeenoptimizedforapplicationshavingunidirec-
6.42
2
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Pin Configuration (2,3,4,5)
70T3719/99M
BBG-324(6)
324-Pin BGA
Top View(7)
06/27/05
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
A
B
I/O39R
I/O38R
I/O37R
I/O36R
A
15L
A
A
12L
A
8L
CE1L
A
6L
A
1L
0L
3L
I/O32R
I/O33R
I/O34R
I/O35R
A
B
COL
L
BE7L
BE6L
BE0L
BE4L
BE2L
BE5L
CE0L
BE3L
ADSL
I/O39L
I/O38L
I/O41R
I/O37L
I/O42R
I/O36L
I/O43R
TDO
A
17L(1)
13L
A
10L
REPEAT
L
A
A
I/O32L
I/O31R
I/O33L
I/O30R
I/O34L
I/O29R
I/O35L
I/O28R
BE1L
OEL
C
D
E
F
I/O40R
I/O40L
I/O47R
I/O47L
I/O48R
I/O48L
I/O55R
I/O55L
I/O56R
I/O56L
I/O63R
I/O63L
I/O64R
I/O64L
I/O71R
A
16L
A
11L
14L
A
7L
9L
R/W
L
CNTEN
L
A
A
4L
2L
C
D
E
F
INTL
I/O41L
I/O46R
I/O46L
I/O49R
I/O49L
I/O54R
I/O54L
I/O57R
I/O57L
I/O62R
I/O62L
I/O65R
I/O65L
I/O42L
I/O45R
I/O45L
I/O50R
I/O50L
I/O53R
I/O53L
I/O58R
I/O58L
I/O61R
I/O61L
I/O66R
I/O66L
I/O43L
I/O44R
I/O44L
I/O51R
I/O51L
I/O52R
I/O52L
I/O59R
I/O59L
I/O60R
I/O60L
I/O67R
I/O67L
TDI
NC
A
A
CLK
L
A
5L
ZZ
L
I/O31L
I/O24R
I/O24L
I/O23R
I/O23L
I/O16R
I/O16L
I/O15R
I/O15L
I/O8R
I/O8L
I/O30L
I/O25R
I/O25L
I/O22R
I/O22L
I/O17R
I/O17L
I/O14R
I/O14L
I/O9R
I/O9L
I/O29L
I/O26R
I/O26L
I/O21R
I/O21L
I/O18R
I/O18L
I/O13R
I/O13L
I/O10R
I/O10L
I/O5R
I/O28L
I/O27R
I/O27L
I/O20R
I/O20L
I/O19R
I/O19L
I/O12R
I/O12L
I/O11R
I/O11L
I/O4R
PL/FT
L
V
V
DD
DD
V
V
DDQL
DDQL
V
DDQR
V
DDQR
V
DDQL
V
DDQL
V
DDQR
V
DDQR
OPT
L
V
DD
V
ss
ss
ss
ss
ss
ss
ss
V
V
V
V
V
V
V
V
V
ss
ss
ss
ss
ss
ss
ss
ss
DD
V
ss
ss
ss
ss
ss
ss
ss
ss
V
DD
ss
ss
ss
ss
ss
ss
DD
V
DD
ss
ss
ss
ss
ss
ss
V
DD
V
DD
G
H
J
VDDQR
VDDQL
VDDQR
VDDQR
VDDQL
VDDQL
VDDQR
V
DDQR
DDQL
V
ss
ss
ss
ss
ss
ss
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DDQR
DDQL
VDDQR
VDDQL
VDDQR
VDDQR
VDDQL
VDDQL
VDDQR
G
H
J
V
V
V
V
V
V
V
V
V
ss
ss
ss
DD
V
V
V
V
V
ss
ss
ss
K
L
V
V
V
V
V
K
L
M
N
P
R
T
V
DDQL
DDQR
M
N
P
R
T
V
DDQR
V
DDQL
V
DDQL
V
DDQR
V
ZZR
TMS
V
DD
12R
13R
14R
V
DD
9R
7R
V
DDQL
V
DDQL
V
DD
6R
V
DD
2R
4R
OPT
R
A
17R(1)
A
A
A
A
A
A
A
A
1R
0R
3R
5R
I/O7R
I/O7L
I/O6R
I/O6L
COL
R
BE4R
BE7R
BE2R
CE0R
BE3R
BE6R
OER
PL/FT
R
A
16R
A
A
A
A
CE1R
A
I/O5L
I/O4L
ADS
R
U
V
I/O70R
I/O69R
I/O68R
TCK
A
10R
R/W
R
REPEAT
R
I/O0R
I/O1R
I/O2R
I/O3R
I/O3L
U
V
INT
R
BE1R
I/O71L
1
I/O70L
2
I/O69L
3
I/O68L
4
NC
15R
A
11R
A
8R
CLK
12
R
CNTEN
R
I/O0L
15
I/O1L
16
I/O2L
17
TRST
BE5R
BE0R
5
6
7
8
9
10
11
13
14
18
5687 tbl 01
NOTES:
1. Pin is a NC for IDT70T3799.
2. All VDD pins must be connected to 2.5V power supply.
3. All VDDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V), and 2.5V if OPT pin for that port is
set to VSS (0V).
4. All VSS pins must be connected to ground supply.
5. Package body is approximately 19mm x 19mm x 1.76mm, with 1.0mm ball-pitch.
6. This package code is used to reference the package diagram.
7. This text does not indicate orientation of the actual part-marking.
6.42
3
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Pin Names
Left Port
Right Port
CE0R CE1R
R/W
OE
Names
Chip Enables (Input)(6)
CE0L
R/W
OE
,
CE1L
,
L
R
Read/Write Enable (Input)
Output Enable (Input)
L
R
(5)
(5)
A
0L - A17L
A
0R - A17R
I/O0R - I/O71R
CLK
PL/FT
ADS
CNTEN
REPEAT
BE0R - BE7R
Address (Input)
I/O0L - I/O71L
CLK
PL/FT
ADS
CNTEN
REPEAT
BE0L - BE7L
Data Input/Output
L
R
Clock (Input)
L
R
Pipeline/Flow-Through (Input)
Address Strobe Enable (Input)
Counter Enable (Input)
Counter Repeat(3)
L
R
L
R
L
R
Byte Enables (9-bit bytes) (Input)(6)
Power (I/O Bus) (3.3V or 2.5V)(1) (Input)
Option for selecting VDDQX(1,2) (Input)
Sleep Mode pin(4) (Input)
Power (2.5V)(1) (Input)
V
DDQL
L
V
DDQR
R
OPT
ZZ
OPT
ZZ
L
R
V
V
DD
SS
NOTES:
1. VDD, OPTX, and VDDQX must be set to appropriate operating levels prior to
applying inputs on the I/Os and controls for that port.
2. OPTX selects the operating voltage levels for the I/Os and controls on that port.
If OPTX is set to VDD (2.5V), then that port's I/Os and controls will operate at 3.3V
levels and VDDQX must be supplied at 3.3V. If OPTX is set to VSS (0V), then that
port's I/Os and address controls will operate at 2.5V levels and VDDQX must be
supplied at 2.5V. The OPT pins are independent of one another—both ports can
operate at 3.3V levels, both can operate at 2.5V levels, or either can operate
at 3.3V with the other at 2.5V.
Ground (0V) (Input)
TDI
TDO
TCK
Test Data Input
Test Data Output
Test Logic Clock (10MHz) (Input)
Test Mode Select (Input)
Reset (Initialize TAP Controller) (Input)
Interrupt Flag (Output)
TMS
TRST
3. When REPEATX is asserted, the counter will reset to the last valid address loaded
via ADSX.
INT
R
INT
L
4. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when
asserted. All static inputs, i.e., PL/FTx and OPTx and the sleep mode pins
themselves (ZZx) are not affected during sleep mode. It is recommended that
boundry scan not be operated during sleep mode.
COL
R
Collision Alert (Output)
COL
L
5687 tbl 02
5. Address A17x is a NC for the IDT70T3799M.
6. Chip Enables and Byte Enables are double buffered when PL/FT = VIH, i.e., the
signals take two cycles to deselect.
6.42
4
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
(1,2,3,4,5)
Truth Table I—Read/Write and Enable Control
CLK
!
!
!
!
!
!
!
!
!
!
!
X
CE
1
Byte Enables
All BE = X
All BE = X
All BE = H
R/W
ZZ
L
L
L
L
L
L
L
L
L
I/O Operation(6)
MODE
OE
X
X
X
X
X
X
X
L
CE
H
X
L
0
X
X
All Bytes= High-Z
All Bytes = High-Z
All Bytes = High-Z
Deselected: Power Down
Deselected: Power Down
All Bytes Deselected
L
X
H
H
H
H
H
H
H
H
H
X
X
L
L
Byten = DIN, All other Bytes = High-Z Write to Byte X Only
BEn = L, All other BE = H
L
L
Byte4-7 = DIN, Byte0-3 = High-Z
Byte4-7 = High-Z, Byte0-3 = DIN
Byte0-7 = DIN
Write to Lower Bytes Only
Write to Upper Bytes Only
Write to All Bytes
BE4-7 = L, BE0-3 = H
BE4-7 = H, BE0-3 = L
BE0-7 = L
L
L
L
L
L
H
H
H
H
X
Byten = DOUT, All other Bytes = High-Z Read Byte X Only
BEn = L, All other BE = H
L
L
Byte4-7 = DOUT, Byte0-3 = High-Z
Byte4-7 = High-Z, Byte0-3 = DOUT
All Bytes = DOUT
Read Lower Bytes Only
Read Upper Bytes Only
Read All Bytes
BE4-7 = L, BE0-3 = H
BE4-7 = H, BE0-3 = L
All BE = L
L
L
L
L
L
L
H
X
X
X
All BE = X
L
All Bytes = High-Z
Outputs Disabled
Sleep Mode
X
X
All BE = X
X
H
All Bytes = High-Z
5687 tbl 03
NOTES:
1. "H" = VIH, "L" = VIL, "X" = Don't Care.
2. ADS, CNTEN, REPEAT = X.
3. OE and ZZ are asynchronous input signals.
4. It is possible to read or write any combination of bytes during a given access. A few representative samples have been illustrated here.
5. For the examples shown here, BEn may correspond to any of the eight byte enable signals.
(1,2)
Truth Table II—Address Counter Control
Previous Internal
Internal Address
I/O(3)
I/O(n) External Address Used
I/O(n+1) Counter Enabled-Internal Address generation
I/O(n+1) Enabled Address Blocked-Counter disabled (An + 1 reused)
I/O(n) Counter Set to last valid ADS load
ADS(4)
CNTEN REPEAT(4,6)
MODE
Address Address
Used
An
CLK
!
An
X
X
An
L
X
H
H
H
L
D
An + 1
An + 1
An
H
H
X
L(5)
H
D
D
!
X
An + 1
X
!
X
X
D
!
5687 tbl 04
NOTES:
1. "H" = VIH, "L" = VIL, "X" = Don't Care.
2. Read and write operations are controlled by the appropriate setting of R/W, CE0, CE1, BEn and OE.
3. Outputs configured in flow-through output mode: if outputs are in pipelined mode the data out will be delayed by one cycle.
4. ADS and REPEAT are independent of all other memory control signals including CE0, CE1 and BEn.
5. The address counter advances if CNTEN = VIL on the rising edge of CLK, regardless of all other memory control signals including CE0, CE1, BEn.
6. When REPEAT is asserted, the counter will reset to the last valid address loaded via ADS. This value is not set at power-up: a known location should be loaded
via ADS during initialization if desired. Any subsequent ADS access during operations will update the REPEAT address location.
6.42
5
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Recommended Operating
Temperature and Supply Voltage
Ambient
(1)
Grade
Commercial
Temperature
0OC to +70OC
-40OC to +85OC
GND
0V
V
+
+
DD
2.5V
2.5V
100mV
100mV
Industrial
0V
5687 tbl 05
NOTES:
1. This is the parameter TA. This is the "instant on" case temperature.
Recommended DC Operating
Conditions with VDDQ at 2.5V
Symbol
Parameter
Core Supply Voltage
I/O Supply Voltage(3)
Ground
Min.
2.4
2.4
0
Typ.
2.5
2.5
0
Max.
Unit
V
V
DD
DDQ
SS
2.6
2.6
0
V
V
V
V
Input High Volltage
(Address, Control &
Data I/O Inputs)(3)
____
V
DDQ + 100mV(2)
1.7
1.7
V
V
V
IH
IH
Input High Voltage _
JTAG
____
V
V
DD + 100mV(2)
Input High Voltage -
ZZ, OPT, PIPE/FT
____
____
____
VIH
VIL
VIL
V
DD - 0.2V
-0.3(1)
V
DD + 100mV(2)
V
V
Input Low Voltage
0.7
0.2
Input Low Voltage -
ZZ, OPT, PIPE/FT
-0.3(1)
V
5687 tbl 06a
NOTES:
1. VIL (min.) = -1.0V for pulse width less than tCYC/2 or 5ns, whichever is less.
2. VIH (max.) = VDDQ + 1.0V for pulse width less than tCYC/2 or 5ns, whichever is less.
3. To select operation at 2.5V levels on the I/Os and controls of a given port, the OPT
pinforthatportmustbesettoVss(0V), andVDDQX forthatportmustbesuppliedasindicated
above.
Recommended DC Operating
Conditions with VDDQ at 3.3V
Symbol
Parameter
Core Supply Voltage
I/O Supply Voltage(3)
Ground
Min.
2.4
3.15
0
Typ.
2.5
3.3
0
Max.
2.6
3.45
0
Unit
V
VDD
VDDQ
VSS
V
V
Input High Voltage
(Address, Control
&Data I/O Inputs)(3)
VDDQ + 150mV(2)
VDD + 100mV(2)
V
V
____
2.0
1.7
VIH
VIH
_
Input High Voltage
JTAG
____
Input High Voltage -
ZZ, OPT, PIPE/FT
____
____
____
VIH
VIL
VIL
VDD - 0.2V
-0.3(1)
VDD + 100mV(2)
V
V
V
Input Low Voltage
0.8
0.2
Input Low Voltage -
ZZ, OPT, PIPE/FT
-0.3(1)
5687 tbl 06b
NOTES:
1. VIL (min.) = -1.0V for pulse width less than tCYC/2, or 5ns, whichever is less.
2. VIH (max.) = VDDQ + 1.0V for pulse width less than tCYC/2 or 5ns, whichever is less.
3. To select operation at 3.3V levels on the I/Os and controls of a given port, the OPT pin
for that port must be set to VDD (2.5V), and VDDQX for that port must be supplied as indicated
above.
6.42
6
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Absolute Maximum Ratings (1)
Symbol
Rating
Commercial
& Industrial
Unit
V
V
TERM
V
DD Terminal Voltage
with Respect to GND
-0.5 to 3.6
(VDD
)
(2)
V
(VDDQ
TERM
V
DDQ Terminal Voltage
with Respect to GND
-0.3 to VDDQ + 0.3
-0.3 to VDDQ + 0.3
V
)
(2)
VTERM
(INPUTS and I/O's)
Input and I/O Terminal
Voltage with Respect to GND
V
(3)
T
BIAS
STG
JN
Temperature Under Bias
Storage Temperature
Junction Temperature
-55 to +125
-65 to +150
+150
oC
oC
T
T
oC
I
OUT(For VDDQ = 3.3V) DC Output Current
OUT(For VDDQ = 2.5V) DC Output Current
NOTES:
50
mA
I
40
mA
5687 tbl 07
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. This is a steady-state DC parameter that applies after the power supply has reached its
nominal operating value. Power sequencing is not necessary; however, the voltage on
any Input or I/O pin cannot exceed VDDQ during power supply ramp up.
3. Ambient Temperature under DC Bias. No AC Conditions. Chip Deselected.
Capacitance (1)
(TA = +25°C, F = 1.0MHZ)
Symbol
Parameter
Input Capacitance
Output Capacitance
Conditions(2)
IN = 0V
OUT = 0V
Max. Unit
CIN
V
15
pF
(2)
OUT
C
V
10.5
pF
5687 tbl 08
NOTES:
1. These parameters are determined by device characterization, but are not
production tested.
2. COUT also references CI/O.
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (VDD = 2.5V ± 100mV)
70T3719/99M
Symbol
|ILI
|ILI
|ILO
Parameter
Test Conditions
DDQ = Max., VIN = 0V to VDDQ
DD = Max. IN = 0V to VDD
Min.
Max.
10
Unit
µA
µA
µA
V
___
___
___
___
|
Input Leakage Current(1)
V
V
|
JTAG & ZZ Input Leakage Current(1,2)
Output Leakage Current(1,3)
,
V
30
|
10
CE
OL = +4mA, VDDQ = Min.
OH = -4mA, VDDQ = Min.
OL = +2mA, VDDQ = Min.
OH = -2mA, VDDQ = Min.
0 = VIH or CE1 = VIL, VOUT = 0V to VDDQ
V
V
V
V
OL (3.3V) Output Low Voltage(1)
OH (3.3V) Output High Voltage(1)
OL (2.5V) Output Low Voltage(1)
OH (2.5V) Output High Voltage(1)
I
0.4
___
I
2.4
V
___
I
0.4
V
___
I
2.0
V
5687 tbl 09
NOTES:
1. VDDQ is selectable (3.3V/2.5V) via OPT pins. Refer to p.5 for details.
2. Applicable only for TMS, TDI and TRST inputs.
3. Outputs tested in tri-state mode.
6.42
7
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
(3)
Temperature and Supply Voltage Range
(VDD = 2.5V ± 100mV)
70T3719/99M
S166
Com'l
70T3719/99M
S133
Com'l
Only
& Ind
Symbol
Parameter
Test Condition
Version
COM'L
Typ.(4)
Max.
Typ.(4)
520
520
280
280
400
400
12
Max. Unit
IDD
Dynamic Operating
Current (Both
Ports Active)
CEL and CER= VIL,
Outputs Disabled,
f = fMAX
S
S
S
S
S
S
S
S
S
S
S
S
640
900
740
900
380
470
500
620
20
mA
mA
mA
mA
mA
___
___
(1)
IND
I
SB1(6)
Standby Current
(Both Ports - TTL
Level Inputs)
CE
f = fMAX
L
= CE
(1)
R
= VIH
COM'L
IND
350
460
___
___
SB2(6)
Standby Current
(One Port - TTL
Level Inputs)
(5)
I
CE"A" = VIL and CE"B" = VIH
Active Port Outputs Disabled,
COM'L
IND
500
650
___
___
(1)
f=fMAX
ISB3
Full Standby Current
(Both Ports - CMOS
Level Inputs)
Both Ports CE
R
L and
> VDDQ - 0.2V, VIN > VDDQ - 0.2V
or VIN < 0.2V, f = 0(2)
COM'L
IND
12
20
CE
___
___
12
25
SB4(6)
Full Standby Current
(One Port - CMOS
Level Inputs)
CE"A" < 0.2V and CE"B" > VDDQ - 0.2V(5)
IN > VDDQ - 0.2V or VIN < 0.2V
Active Port, Outputs Disabled, f = fMAX
I
COM'L
IND
500
650
400
400
12
500
620
20
V
___
___
(1)
Izz
Sleep Mode Current
(Both Ports - TTL
Level Inputs)
ZZL = ZZR = VIH
COM'L
IND
12
20
(1)
f=fMAX
mA
___
___
12
25
5687 tbl 10
NOTES:
1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS".
2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
4. VDD = 2.5V, TA = 25°C for Typ, and are not production tested. IDD DC(f=0) = 30mA (Typ).
5. CEX = VIL means CE0X = VIL and CE1X = VIH
CEX = VIH means CE0X = VIH or CE1X = VIL
CEX < 0.2V means CE0X < 0.2V and CE1X > VDD - 0.2V
CEX > VDD - 0.2V means CE0X > VDD - 0.2V or CE1X - 0.2V
"X" represents "L" for left port or "R" for right port.
6. ISB1, ISB2 and ISB4 will all reach full standby levels (ISB3) on the appropriate port(s) if ZZL and/or ZZR = VIH.
6.42
8
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
AC Test Conditions (VDDQ - 3.3V/2.5V)
Input Pulse Levels (Address & Controls)
Input Pulse Levels (I/Os)
Input Rise/Fall Times
GND to 3.0V/GND to 2.4V
GND to 3.0V/GND to 2.4V
2ns
Input Timing Reference Levels
Output Reference Levels
Output Load
1.5V/1.25V
1.5V/1.25V
Figure 1
5687 tbl 11
50Ω
50Ω
,
DATAOUT
1.5V/1.25
10pF
(Tester)
5687 drw 03
Figure 1. AC Output Test load.
∆
tCD
(Typical, ns)
5687 drw 04
∆
Capacitance (pF) from AC Test Load
6.42
9
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the Operating Temperature Range
(2,3)
(Read and Write Cycle Timing)
(VDD = 2.5V ± 100mV, TA = 0°C to +70°C)
70T3719/99M
S166
Com'l
70T3719/99M
S133
Com'l
Only
& Ind
Symbol
Parameter
Min.
20
Max.
Min.
25
Max.
Unit
ns
t
CYC1
CYC2
CH1
CL1
CH2
CL2
SA
HA
SC
HC
SB
HB
SW
HW
SD
HD
SAD
HAD
SCN
HCN
SRPT
HRPT
OE
Clock Cycle Time (Flow-Through)(1)
Clock Cycle Time (Pipelined)(1)
Clock High Time (Flow-Through)(1)
Clock Low Time (Flow-Through)(1)
Clock High Time (Pipelined)(2)
Clock Low Time (Pipelined)(1)
Address Setup Time
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
t
6
7.5
10
ns
t
8
ns
t
8
10
ns
t
2.4
2.4
1.7
0.5
1.7
0.5
1.7
0.5
1.7
0.5
1.7
0.5
1.7
0.5
1.7
0.5
1.7
3
ns
t
3
ns
t
1.8
0.5
1.8
0.5
1.8
0.5
1.8
0.5
1.8
0.5
1.8
0.5
1.8
0.5
1.8
ns
t
Address Hold Time
ns
t
Chip Enable Setup Time
Chip Enable Hold Time
Byte Enable Setup Time
Byte Enable Hold Time
R/W Setup Time
ns
t
ns
t
ns
t
ns
t
ns
t
R/W Hold Time
ns
t
Input Data Setup Time
ns
t
Input Data Hold Time
ns
t
ns
ADS Setup Time
t
ns
ADS Hold Time
t
ns
CNTEN Setup Time
t
ns
CNTEN Hold Time
t
ns
REPEAT Setup Time
t
0.5
0.5
ns
REPEAT Hold Time
____
____
t
Output Enable to Data Valid
Output Enable to Output Low-Z
Output Enable to Output High-Z
Clock to Data Valid (Flow-Through)(1)
Clock to Data Valid (Pipelined)(1)
Data Output Hold After Clock High
Clock High to Output High-Z
Clock High to Output Low-Z
Interrupt Flag Set Time
4.4
4.6
ns
(4)
____
____
t
OLZ
1
1
ns
(4)
OHZ
t
1
3.6
12
1
4.2
15
ns
____
____
t
CD1
CD2
DC
CKHZ
ns
____
____
t
3.6
4.2
ns
____
____
t
1
1
1
1
ns
(4)
t
3.6
4.2
ns
(4)
CKLZ
____
____
t
1
1
ns
____
____
t
INS
INR
COLS
COLR
ZZSC
ZZRC
7
7
7
7
ns
____
____
____
____
____
____
t
Interrupt Flag Reset Time
Collision Flag Set Time
Collision Flag Reset Time
Sleep Mode Set Cycles
Sleep Mode Recovery Cycles
ns
t
3.6
4.2
ns
t
3.6
4.2
ns
____
____
t
2
3
2
3
cycles
cycles
____
____
t
Port-to-Port Delay
Clock-to-Clock Offset
____
____
tCO
5
6
ns
Please refer to collision Detection Timing Table
on Page 19.
tOFS
Clock-to-Clock Offset for Collision Detection
5687 tbl 12
NOTES:
1. The Pipelined output parameters (tCYC2, tCD2) apply to either or both left and right ports when FT/PIPEX = VDD (2.5V). Flow-through parameters (tCYC1, tCD1)
apply when FT/PIPE = Vss (0V) for that port.
2. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE), FT/PIPE and OPT. FT/PIPE and OPT should be
treated as DC signals, i.e. steady state during operation.
3. These values are valid for either level of VDDQ (3.3V/2.5V). See page 6 for details on selecting the desired operating voltage levels for each port.
4. Guaranteed by design (not production tested).
6.42
10
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Read Cycle for Pipelined Operation
(FT/PIPE'X' = VIH)(1,2)
tCYC2
tCH2
tCL2
CLK
CE
0
t
SC
(3)
tHC
tSC
tHC
CE1
t
SB
tHB
tSB
tHB
(5)
BE
n
R/
W
tHW
tSW
t
SA
tHA
ADDRESS(4)
DATAOUT
An
An + 1
An + 2
Qn
An + 3
(1 Latency)
t
DC
tCD2
Qn + 1
Qn + 2(5)
(1)
t
CKLZ
t
OHZ
tOLZ
(1)
OE
,
tOE
5687 drw 05
Timing Waveform of Read Cycle for Flow-through Output
(FT/PIPE"X" = VIL)(1,2,6)
tCYC1
tCH1
tCL1
CLK
CE
0
t
SC
(3)
tHC
t
SC
SB
tHC
CE1
t
tHB
t
HB
BEn
tSB
R/W
t
SW
t
HW
HA
t
SA
t
ADDRESS(4)
DATAOUT
An
An + 1
An + 2
An + 3
tDC
tCD1
tCKHZ
Qn
Qn + 1
Qn + 2(5)
t
CKLZ
tDC
t
OHZ
t
OLZ
(1)
OE
,
t
OE
5687 drw 06
NOTES:
1. OE is asynchronously controlled; all other inputs depicted in the above waveforms are synchronous to the rising clock edge.
2. ADS = VIL, CNTEN and REPEAT = VIH.
3. The output is disabled (High-Impedance state) by CE0 = VIH, CE1 = VIL, BEn = VIH following the next rising edge of the clock. Refer to
Truth Table 1.
4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
5. If BEn was HIGH, then the appropriate Byte of DATAOUT for Qn + 2 would be disabled (High-Impedance state).
6. "x" denotes Left or Right port. The diagram is with respect to that port.
6.42
11
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
(1,2)
Timing Waveform of a Multi-Device Pipelined Read
t
CYC2
t
CH2
t
CL2
CLK
ADDRESS(B1)
CE0(B1)
t
SA
tHA
A
6
A
5
A
4
A
3
A
2
A
0
A
1
t
SC
t
HC
t
SC
tHC
t
CD2
t
CD2
t
CKHZ
t
CD2
Q
0
Q3
Q
1
DATAOUT(B1)
ADDRESS(B2)
t
DC
t
CKLZ
t
DC
tCKHZ
t
SA
t
HA
A
6
A
5
A
4
A3
A
2
A
0
A
1
t
SC
t
HC
CE0(B2)
t
SC
t
HC
t
CD2
t
CKHZ
t
CD2
,
DATAOUT(B2)
Q
4
Q
2
t
CKLZ
t
CKLZ
5687 drw 07
(1,2)
Timing Waveform of a Multi-Device Flow-Through Read
t
CYC1
tCH1
tCL1
CLK
t
SA
tH
A
A6
A5
A4
A3
A2
A0
A1
ADDRESS(B1)
t
SC
tHC
CE0(B1)
t
SC
tHC
(1)
tCD1
tCD1
t
CKHZ
t
CD1
(1)
tCD1
D0
D3
D5
D1
DATAOUT(B1)
ADDRESS(B2)
(1)
(1)
tDC
t
CKLZ
tCKLZ
t
DC
t
CKHZ
t
SA
tHA
A6
A5
A4
A3
A2
A
0
A1
t
SC
tHC
CE0(B2)
t
SC
t
HC
(1)
(1)
t
CD1
t
CKHZ
t
CD1
(1)
t
CKHZ
D4
DATAOUT(B2)
D2
(1)
,
t
CKLZ
tCKLZ
5687 drw 08
NOTES:
1. B1 Represents Device #1; B2 Represents Device #2. Each Device consists of one IDT70T3719/99M for this waveform,
and are setup for depth expansion in this example. ADDRESS(B1) = ADDRESS(B2) in this situation.
2. BEn, OE, and ADS = VIL; CE1(B1), CE1(B2), R/W, CNTEN, and REPEAT = VIH.
6.42
12
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
(1,2,4)
Timing Waveform of Left Port Write to Pipelined Right Port Read
CLK"A"
t
SW
tHW
R/W"A
"
t
SA
MATCH
SD HD
VALID
tHA
NO
MATCH
ADDRESS"A"
DATAIN"A"
t
t
(3)
CO
t
CLK"B"
tCD2
R/W"B"
tSW
tHW
tSA
tHA
NO
ADDRESS"B"
DATAOUT"B"
MATCH
MATCH
VALID
,
t
DC
5687 drw 09
NOTES:
1. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
2. OE = VIL for Port "B", which is being read from. OE = VIH for Port "A", which is being written to.
3. If tCO < minimum specified, then data from Port "B" read is not valid until following Port "B" clock cycle (ie, time from write to valid read on opposite port will be
tCO + 2 tCYC2 + tCD2). If tCO > minimum, then data from Port "B" read is available on first Port "B" clock cycle (ie, time from write to valid read on opposite port
will be tCO + tCYC2 + tCD2).
4. All timing is the same for Left and Right ports. Port "A" may be either Left or Right port. Port "B" is the opposite of Port "A"
(1,2,4)
Timing Waveform with Port-to-Port Flow-Through Read
CLK "A"
tSW tHW
R/W "A"
tSA tHA
NO
ADDRESS "A"
DATAIN "A"
CLK "B"
MATCH
MATCH
tSD tHD
VALID
(3)
tCO
tCD1
R/W "B"
tHW
tHA
tSW
tSA
NO
MATCH
ADDRESS "B"
DATAOUT "B"
MATCH
tCD1
VALID
VALID
,
tDC
tDC
5687 drw 10
NOTES:
1. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
2. OE = VIL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to.
3. If tCO < minimum specified, then data from Port "B" read is not valid until following Port "B" clock cycle (i.e., time from write to valid read on opposite port will be
tCO + tCYC + tCD1). If tCO > minimum, then data from Port "B" read is available on first Port "B" clock cycle (i.e., time from write to valid read on opposite port will
be tCO + tCD1).
4. All timing is the same for both left and right ports. Port "A" may be either left or right port. Port "B" is the opposite of Port "A".
6.42
13
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Pipelined Read-to-Write-to-Read
(OE = VIL)(2)
tCYC2
tCH2
tCL2
CLK
CE0
CE1
BEn
t
SC
tHC
tSB
tHB
tSW tHW
R/W
tSW tHW
(3)
An + 3
An + 4
An
An +1
An + 2
An + 2
ADDRESS
t
SA
tHA
t
SD
tHD
DATAIN
Dn + 2
tCD2
t
CD2
(1)
t
CKHZ
(4)
tCKLZ
Qn + 3
Qn
DATAOUT
READ
NOP
WRITE
READ
,
5687 drw 11
NOTES:
1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
2. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH. "NOP" is "No Operation".
3. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
4. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
(2)
Timing Waveform of Pipelined Read-to-Write-to-Read ( OE Controlled)
tCYC2
tCH2
tCL2
CLK
CE
0
t
SC
tHC
CE1
tSB
tHB
BE
n
t
SW tHW
R/
W
t
SW tHW
(3)
An + 4
An
An +1
An + 2
An + 3
Dn + 3
An + 5
ADDRESS
t
SA
tHA
t
SD
tHD
DATAIN
Dn + 2
t
CD2
t
CD2
t
CKLZ
(1)
Qn
Qn + 4
DATAOUT
(4)
tOHZ
OE
READ
WRITE
READ
,
NOTES:
1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
5687 drw 12
2. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
3. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference
use only.
4. This timing does not meet requirements for fastest speed grade. This waveform indicates how logically it could be done if timing so allows.
6.42
14
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Flow-Through Read-to-Write-to-Read (OE = VIL)(2)
t
CYC1
tCH1
tCL1
CLK
CE
0
1
t
SC
tHC
CE
t
SB
tHB
BEn
t
SW tHW
R/W
tSW tHW
(3)
An + 4
An
An + 3
An +1
An + 2
An + 2
ADDRESS
t
SA
tHA
t
SD
tHD
DATAIN
Dn + 2
t
CD1
tCD1
t
CD1
tCD1
(1)
Qn + 3
Qn
READ
Qn + 1
DATAOUT
tDC
t
CKLZ
t
DC
tCKHZ
NOP(5)
,
READ
WRITE
5687 drw 13
Timing Waveform of Flow-Through Read-to-Write-to-Read (OE Controlled)(2)
t
CYC1
t
CH1
tCL1
CLK
CE
0
1
t
SC
tHC
CE
t
SB
tHB
BEn
t
SW tHW
t
SW tHW
R/
W
(3)
An + 5
An
An + 4
An +1
An + 2
An + 3
Dn + 3
ADDRESS
t
SA
tHA
t
SD tHD
DATAIN
Dn + 2
tOE
t
DC
t
CD1
tCD1
t
CD1
(1)
Qn + 4
Qn
DATAOUT
tCKLZ
t
DC
t
OHZ
OE
,
READ
WRITE
READ
5687 drw 14
NOTES:
1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals.
2. CE0, BEn, and ADS = VIL; CE1, CNTEN, and REPEAT = VIH.
3. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for
reference use only.
4. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity.
6.42
15
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
(1)
Timing Waveform of Pipelined Read with Address Counter Advance
t
CYC2
tCH2
tCL2
CLK
tSA
tHA
An
ADDRESS
t
SAD tHAD
ADS
tSAD tHAD
CNTEN
tSCN tHCN
tCD2
,
Qn + 2(2)
Qx - 1(2)
Qx
Qn + 3
Qn + 1
Qn
DATAOUT
tDC
READ
EXTERNAL
ADDRESS
READ
WITH
COUNTER
COUNTER
HOLD
READ WITH COUNTER
5687 drw 15
(1)
Timing Waveform of Flow-Through Read with Address Counter Advance
t
CYC1
tCH1
tCL1
CLK
tSA
tHA
An
ADDRESS
t
SAD tHAD
t
SAD
t
HAD
ADS
t
SCN
tHCN
CNTEN
t
CD1
,
Qn + 3(2)
Qx(2)
Qn + 4
Qn + 1
Qn + 2
Qn
DATAOUT
tDC
READ
WITH
COUNTER
READ
EXTERNAL
ADDRESS
READ WITH COUNTER
COUNTER
HOLD
5687 drw 16
NOTES:
1. CE0, OE, BEn = VIL; CE1, R/W, and REPEAT = VIH.
2. If there is no address change via ADS = VIL (loading a new address) or CNTEN = VIL (advancing the address), i.e. ADS = VIH and CNTEN = VIH, then
the data output remains constant for subsequent clocks.
6.42
16
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Address Counter Advance
(1)
(Flow-through or Pipelined Inputs)
t
CYC2
tCH2
tCL2
CLK
t
SA
tHA
An
ADDRESS
INTERNAL(3)
ADDRESS
An(7)
An + 4
An + 2
An + 1
An + 3
t
SAD tHAD
ADS
t
SCN
t
HC
N
CNTEN
t
SD tHD
Dn + 4
Dn + 1
Dn + 3
Dn
Dn + 1
Dn + 2
DATAIN
WRITE
EXTERNAL
ADDRESS
WRITE
WITH COUNTER
WRITE
COUNTER HOLD
WRITE WITH COUNTER
,
5687 drw 17
(2,6)
Timing Waveform of Counter Repeat
tCYC2
CLK
tSA tHA
An
ADDRESS
INTERNAL(3)
ADDRESS
An+2
An+1
An+2
An+2
An
An
An+1
An+2
tSAD tHAD
ADS
tSW tHW
R/
W
t
SCN tHCN
CNTEN
(4)
REPEAT
SRPT tHRPT
t
,
t
SD
t
HD
D3
D2
D0
D1
DATAIN
tCD1
An
An+1
An+2
An+2
HOLD
DATAOUT
,
ADVANCE
COUNTER
WRITE TO
An+2
ADVANCE
COUNTER
WRITE TO
An+1
HOLD
REPEAT
READ LAST
ADS
ADDRESS
An
ADVANCE
COUNTER
READ
WRITE TO
ADS
ADDRESS
An
ADVANCE
COUNTER
READ
COUNTER
WRITE TO
An+2
COUNTER
READ
An+1
An+2
An+2
5687 drw 18
NOTES:
1. CE0, BEn, and R/W = VIL; CE1 and REPEAT = VIH.
CE0, BEn = VIL; CE1 = VIH.
2.
3. The "Internal Address" is equal to the "External Address" when ADS = VIL and equals the counter output when ADS = VIH.
4. No dead cycle exists during REPEAT operation. A READ or WRITE cycle may be coincidental with the counter REPEAT cycle: Address loaded by last valid
ADS load will be accessed. For more information on REPEAT function refer to Truth Table II.
5. CNTEN = VIL advances Internal Address from ‘An’ to ‘An +1’. The transition shown indicates the time required for the counter to advance. The ‘An +1’Address is
written to during this cycle.
6. For Pipelined Mode user should add 1 cycle latency for outputs as per timing waveform of read cycle for pipelined operations.
6.42
17
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
(2)
Waveform of Interrupt Timing
CLK
L
t
SW
tHW
R/W
L
t
SA
3FFFF
SC
t
HA
ADDRESSL(3)
CEL(1)
t
tHC
tINS
INT
R
t
INR
CLKR
t
SC
tHC
CER(1)
R/WR
t
SW
t
HW
HA
t
t
SA
ADDRESSR(3)
3FFFF
5687 drw 19
NOTES:
1. CE0 = VIL and CE1 = VIH
2. All timing is the same for Left and Right ports.
3. Address is for internal register, not the external bus, i.e., address needs to be qualified by one of the Address counter control signals.
(1)
Truth Table III — Interrupt Flag
Left Port
Right Port
(3,4)
(2)
(3,4)
(2)
CLK
L
R/W
L
A
17L-A0L
CLK
R
R/W
R
A
17R-A0R
Function
CE
L
L
INT
X
L
CE
R
INT
R
L
3FFFF
X
X
X
X
L
Set Right INT
Reset Right INT
Set Left INT Flag
Reset Left INT Flag
R
Flag
!
!
!
!
!
!
!
!
X
X
X
X
L
L
3FFFF
3FFFE
X
H
R
Flag
X
X
X
L
L
X
L
H
L
3FFFE
H
X
X
X
L
5687 tbl 13
NOTES:
1. INTL and INTR must be initialized at power-up by Resetting the flags.
2. CE0 = VIL and CE1 = VIH. R/W and CE are synchronous with respect to the clock and need valid set-up and hold times.
3. A17X is a NC for IDT70T3799, therefore Interrupt Addresses are 1FFFF and 1FFFE.
4. Address is for internal register, not the external bus, i.e., address needs to be qualified by one of the Address counter control signals.
6.42
18
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Waveform of Collision Timing(1,2)
Both Ports Writing with Left Port Clock Leading
CLK
L
t
OFS
tSA
tHA
ADDRESS (4)
L
A
3
A
1
A2
A
0
t
COLR
tCOLS
COL
L
(3)
tOFS
CLK
R
t
SA
t
HA
(4)
ADDRESS
R
A
3
A2
A
0
A1
t
COLR
tCOLS
COLR
5687 drw 20
NOTES:
1. CE0 = VIL, CE1 = VIH.
2. For reading port, OE is a Don't care on the Collision Detection Logic. Please refer to Truth Table IV for specific cases.
3. Leading Port Output flag might output 3tCYC2 + tCOLS after Address match.
4. Address is for internal register, not the external bus, i.e., address needs to be qualified by one of the Address counter control signals.
Collision Detection Timing(3,4)
tOFS (ns)
Cycle Time
NOTES:
1. Region 1
(1)
(2)
Region 1 (ns)
Region 2 (ns)
Both ports show collision after 2nd cycle for Addresses 0, 2, 4 etc.
2. Region 2
Leading port shows collision after 3rd cycle for addresses 0, 3, 6, etc.
while trailing port shows collision after 2nd cycle for addresses 0, 2, 4 etc.
3. All the production units are tested to midpoint of each region.
5ns
6ns
0 - 2.8
2.81 - 4.6
0 - 3.8
0 - 5.3
3.81 - 5.6
5.31 - 7.1
7.5ns
4. These ranges are based on characterization of a typical device.
56876 tbl 14
Truth Table IV — Collision Detection Flag
Left Port
Right Port
(2)
(1)
(2)
(1)
CLK
L
R/W
H
L
A
17L-A0L
CLK
R
R/W
R
A
17R-A0R
Function
CE
L
COL
H
L
CE
R
COL
H
R
Both ports reading. Not a valid collision.
No flag output on either port
L
MATCH
MATCH
MATCH
MATCH
H
L
L
MATCH
MATCH
MATCH
MATCH
!
!
!
!
!
!
!
Left port reading, Right port writing.
Valid collision, flag output on Left port.
H
L
L
L
L
L
H
Right port reading, Left port writing.
Valid collision, flag output on Right port.
L
L
H
H
L
L
Both ports writing. Valid collision. Flag
output on both ports.
L
L
L
L
!
5687 tbl 15
NOTES:
1. CE0 = VIL and CE1 = VIH. R/W and CE are synchronous with respect to the clock and need valid set-up and hold times.
2. Address is for internal register, not the external bus, i.e., address needs to be qualified by one of the Address counter control signals.
6.42
19
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
(1,2)
Timing Waveform - Entering Sleep Mode
R/W
(3)
(1,2)
Timing Waveform - Exiting Sleep Mode
An
An+1
(5)
R/W
OE
(5)
Dn
Dn+1
DATAOUT
(4)
NOTES:
1. CE1 = VIH.
2. All timing is same for Left and Right ports.
3. CE0 has to be deactivated (CE0 = VIH) three cycles prior to asserting ZZ (ZZx = VIH) and held for two cycles after asserting ZZ (ZZx = VIH).
4. CE0 has to be deactivated (CE0 = VIH) one cycle prior to de-asserting ZZ (ZZx = VIL) and held for three cycles after de-asserting ZZ (ZZx = VIL).
5. The device must be in Read Mode (R/W High) when exiting sleep mode. Outputs are active but data is not valid until the following cycle.
6.42
20
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
alertflagasappropriate.Intheeventthatauserinitiatesaburstaccess
onbothportswiththesamestartingaddressonbothportsandoneorboth
portswritingduringeachaccess(i.e.,imposesalongstringofcollisions
on contiguous clock cycles), the alert flag will be asserted and cleared
everyothercycle.PleaserefertotheCollisionDetectiontimingwaveform
on Page 19.
Functional Description
TheIDT70T3719/99MprovidesatruesynchronousDual-PortStatic
RAM interface.Registeredinputsprovideminimalset-upandholdtimes
onaddress, data, andallcriticalcontrolinputs. Allinternalregistersare
clocked on the rising edge of the clock signal, however, the self-timed
internalwritepulsewidthisindependentofthecycletime.
CollisiondetectionontheIDT70T3719/99Mrepresentsasignificant
advanceinfunctionalityovercurrentsyncmulti-ports,whichhavenosuch
capability. InadditiontothisfunctionalitytheIDT70T3719/99Msustains
thekeyfeaturesofbandwidthandflexibility. Thecollisiondetectionfunction
isveryusefulinthecaseofburstingdata,orastringofaccessesmadeto
sequentialaddresses,inthatitindicatesaproblemwithintheburst,giving
theusertheoptionofeitherrepeatingtheburstorcontinuingtowatchthe
alert flag to see whether the number of collisions increases above an
acceptablethresholdvalue.Offeringthisfunctiononchipalsoallowsusers
to reduce their need for arbitration circuits, typically done in CPLD’s or
FPGA’s.Thisreducesboardspaceanddesigncomplexity,andgivesthe
usermoreflexibilityindevelopingasolution.
An asynchronous output enable is provided to ease asyn-
chronousbusinterfacing.Counterenableinputsarealsoprovidedtostall
the operation of the address counters for fast interleaved
memoryapplications.
AHIGHonCE0oraLOWonCE1 foroneclockcyclewillpowerdown
the internal circuitry to reduce static power consumption. Multiple chip
enables allow easier banking of multiple IDT70T3719/99Ms for depth
expansionconfigurations. TwocyclesarerequiredwithCE0 LOWand
CE1 HIGHtore-activatetheoutputs.
Interrupts
If the user chooses the interrupt function, a memory location (mail
boxormessagecenter)isassignedtoeachport. Theleftportinterrupt
flag (INTL) is asserted when the right port writes to memory location
3FFFE (HEX), where a write is defined as CER = R/WR = VIL per the
Truth Table I. The left port clears the interrupt through access of
addresslocation3FFFEwhenCEL = VILandR/WL=VIH.Likewise,the
right port interrupt flag (INTR) is asserted when the left
port writes to memory location 3FFFF (HEX) and to clear the interrupt
flag(INTR),therightportmustreadthememorylocation3FFFF(1FFFF
or1FFFEforIDT70T3799M).Themessage(72bits)at3FFFEor3FFFF
(1FFFF or 1FFFE for 70T3799M) is user-defined since it is an addres-
sableSRAMlocation.Iftheinterruptfunctionisnotused,addresslocations
3FFFE and 3FFFF (1FFFF or 1FFFE for IDT70T3799M) are not used
asmailboxes,butaspartoftherandomaccessmemory.RefertoTruth
Table III for the interrupt operation.
Sleep Mode
TheIDT70T3719/99Misequippedwithanoptionalsleeporlowpower
modeonbothports.Thesleepmodepinonbothportsisasynchronous
andactivehigh.Duringnormaloperation,theZZpinispulledlow.When
ZZispulledhigh,theportwillentersleepmodewhereitwillmeetlowest
possible power conditions. The sleep mode timing diagram shows the
modes ofoperation:NormalOperation,NoRead/WriteAllowedandSleep
Mode.
Fornormaloperationallinputsmustmeetsetupandholdtimesprior
tosleepand afterrecoveringfromsleep.Clocksmustalsomeetcyclehigh
and low times during these periods. Three cycles prior to asserting ZZ
(ZZx=VIH)andthreecyclesafterde-assertingZZ(ZZx=VIL),thedevice
mustbedisabledviathechipenablepins.Ifawriteorreadoperationoccurs
duringtheseperiods,thememoryarraymaybecorrupted.Validityofdata
outfromtheRAMcannotbeguaranteedimmediatelyafterZZisasserted
(priortobeinginsleep).Whenexitingsleepmode,thedevicemustbein
Read mode (R/Wx = VIH)when chip enable is asserted, and the chip
enablemustbevalidforonefullcyclebeforeareadwillresultintheoutput
ofvaliddata.
DuringsleepmodetheRAMautomaticallydeselectsitself.TheRAM
disconnectsitsinternalclockbuffer.Theexternalclockmaycontinuetorun
withoutimpactingtheRAMssleepcurrent(IZZ).Alloutputswillremainin
high-Zstatewhileinsleepmode.Allinputsareallowedtotoggle.TheRAM
will not be selected and will not perform any reads or writes.
Collision Detection
Collision is defined as an overlap in access between the two ports
resulting in the potential for either reading or writing incorrect data to a
specificaddress. Forthespecificcases:(a)Bothportsreading-nodata
iscorrupted,lost,orincorrectlyoutput,sonocollisionflagisoutputoneither
port.(b)Oneportwriting,theotherportreading-theendresultofthewrite
willstillbevalid. However, thereadingportmightcapturedatathatisin
astateoftransitionandhencethereadingport’scollisionflagisoutput.(c)
Bothportswriting-thereisariskthatthetwoportswillinterferewitheach
other, andthedatastoredinmemorywillnotbeavalidwritefromeither
port(itmayessentiallybearandomcombinationofthetwo). Therefore,
thecollisionflagisoutputonbothports. PleaserefertoTruthTableIVfor
all of the above cases.
Thealertflag (COLX)isassertedonthe2ndor3rdrisingclockedge
oftheaffectedportfollowingthecollision,andremainslowforonecycle.
PleaserefertoCollisionDetectionTimingtableonPage19.Duringthat
nextcycle,theinternalarbitrationisengagedinresettingthealertflag(this
avoidsaspecificrequirementonthepartoftheusertoresetthealertflag).
Iftwocollisionsoccuronsubsequentclockcycles,thesecondcollisionmay
notgeneratetheappropriatealertflag.Athirdcollisionwillgeneratethe
6.42
21
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Depth and Width Expansion
The IDT70T3719/99M can also be used in applications requiring
expandedwidth,asindicatedinFigure4.Throughcombiningthecontrol
signals, the devices can be grouped as necessary to accommodate
applicationsneeding144-bits.
The IDT70T3719/99M features dual chip enables (refer to Truth
Table I) in order to facilitate rapid and simple depth expansion with no
requirements for external logic. Figure 4 illustrates how to control the
various chip enables in order to expand two devices in depth.
(1)
A18/A17
IDT70T3719/99M
IDT70T3719/99M
CE
0
1
CE
0
CE
CE1
V
DD
VDD
Control Inputs
Control Inputs
IDT70T3719/99M
IDT70T3719/99M
CE
1
0
CE
1
0
CE
CE
BE,
R/W,
Control Inputs
Control Inputs
OE,
CLK,
Figure 4. Depth and Width Expansion with IDT70T3719/99M
ADS,
REPEAT,
CNTEN
,
5687 drw 23
NOTE:
1. A18 is for IDT70T3719, A17 is for IDT70T3799.
JTAG Functionality and Configuration
The IDT70T3719/99M is composed of two independent memory
arrays,andthuscannotbetreatedasasingleJTAGdeviceinthescan
chain. Thetwoarrays(AandB)eachhaveidenticalcharacteristicsand
commandsbutmustbetreatedasseparateentitiesinJTAGoperations.
Please refer to Figure 5.
Register Sizes, and System Interface Parameter tables. Specifically,
commands for Array B must precede those for Array A in any JTAG
operationssenttotheIDT70T3719/99M. PleasereferenceApplication
NoteAN-411,"JTAGTestingofMultichipModules"forspecificinstruc-
tionsonperformingJTAGtestingontheIDT70T3719/99M. AN-411is
availableatwww.idt.com.
.
JTAGsignalingmustbeprovidedseriallytoeacharrayandutilizethe
informationprovidedintheIdentificationRegisterDefinitions,Scan
IDT70T3719/99M
TDO
TDI
TDOA
TDIB
Array A
Array B
TCK
TMS
TRST
5687 drw 24
Figure 5. JTAG Configuration for IDT70T3719/99M
6.42
22
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
JTAG Timing Specifications
t
JCYC
tJR
t
JF
tJCL
tJCH
TCK
Device Inputs(1)/
TDI/TMS
tJDC
tJS
tJH
Device Outputs(2)/
TDO
t
JRSR
tJCD
TRST
,
5687 drw 25
t
JRST
Figure 5. Standard JTAG Timing
NOTES:
1. Device inputs = All device inputs except TDI, TMS, and TRST.
2. Device outputs = All device outputs except TDO.
JTAG AC Electrical
Characteristics (1,2,3,4)
70T3719/99M
Max.
Symbol
Parameter
JTAG Clock Input Period
JTAG Clock HIGH
JTAG Clock Low
JTAG Clock Rise Time
JTAG Clock Fall Time
JTAG Reset
Min.
100
40
Units
ns
____
____
____
t
JCYC
JCH
JCL
JR
JF
JRST
JRSR
JCD
JDC
JS
JH
t
ns
t
40
ns
3(1)
ns
____
t
3(1)
ns
____
t
____
t
50
ns
____
t
JTAG Reset Recovery
JTAG Data Output
JTAG Data Output Hold
JTAG Setup
50
ns
____
t
25
ns
____
t
0
ns
____
____
t
15
15
ns
t
JTAG Hold
ns
5687 tbl 16
NOTES:
1. Guaranteed by design.
2. 30pF loading on external output signals.
3. Refer to AC Electrical Test Conditions stated earlier in this document.
4. JTAG operations occur at one speed (10MHz). The base device may run at
any speed specified in this datasheet.
6.42
23
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Identification Register Definitions
Value
Value
Array A
Instruction Field Array B
Instruction Field Array A
Description
Reserved for Version number
Array B
0x0
Revision Number (31:28)
Revision Number (63:60)
0x0
IDT Device ID (27:12)(1)
IDT JEDEC ID (11:1)
IDT Device ID (59:44)(1)
IDT JEDEC ID (43:33)
0x330
0x33
1
0x330
0x33
1
Defines IDT Part number
Allows unique identification of device vendor as IDT
Indicates the presence of an ID Register
ID Register Indicator Bit (Bit 0)
ID Register Indicator Bit (Bit 32)
5687 tbl 17
NOTE:
1. Device ID for IDT70T3719M is 0x330. Device ID for IDT70T3799M is 0x331.
Scan Register Sizes
Bit Size
Array A
Bit Size
Bit Size
Register Name
Array B
70T3719M
Instruction (IR)
Bypass (BYR)
4
1
4
1
8
2
Identification (IDR)
32
32
64
Boundary Scan (BSR)
Note (3)
Note (3)
Note (3)
5687 tbl 18
System Interface Parameters
Instruction
Code
Description
EXTEST
00000000
Forces contents of the boundary scan cells onto the device outputs(1).
Places the boundary scan register (BSR) between TDI and TDO.
BYPASS
IDCODE
11111111
Places the bypass register (BYR) between TDI and TDO.
00100010
Loads the ID register (IDR) with the vendor ID code and places the
register between TDI and TDO.
01000100
Places the bypass register (BYR) between TDI and TDO. Forces all
device output drivers except INTx and COLx to a High-Z state.
HIGHZ
Uses BYR. Forces contents of the boundary scan cells onto the device
outputs. Places the bypass register (BYR) between TDI and TDO.
CLAMP
00110011
00010001
SAMPLE/PRELOAD
Places the boundary scan register (BSR) between TDI and TDO.
SAMPLE allows data from device inputs(2) to be captured in the
boundary scan cells and shifted serially through TDO. PRELOAD allows
data to be input serially into the boundary scan cells via the TDI.
RESERVED
01010101, 01110111,
10001000, 10011001,
10101010, 10111011,
11001100
Several combinations are reserved. Do not use codes other than those
identified above.
PRIVATE
01100110,11101110,
11011101
For internal use only.
5687 tbl 19
NOTES:
1. Device outputs = All device outputs except TDO.
2. Device inputs = All device inputs except TDI, TMS, and TRST.
3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local
IDT sales representative.
6.42
24
IDT70T3719/99M
High-Speed 2.5V 256/128K x 72 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
Ordering Information
A
A
A
XXXXX
A
999
A
Process/
Temperature
Range
Device
Type
Power Speed
Package
Tube or Tray
Tape and Reel
Blank
8
Commercial (0°C to +70°C)
Industrial (-40°C to +85°C)
Blank
I
G(1)
BB
Green
324-pin BGA (BBG-324)
Commercial Only
166
133
Speed in Megahertz
Commercial & Industrial
Standard Power
S
18Mbit (256K x 72) 2.5V Synchronous Dual-Port RAM
9Mbit (128K x 72) 2.5V Synchronous Dual-Port RAM
70T3719M
70T3799M
5687 drw 26
NOTE:
1. Greenpartsavailable.Forspecificspeeds,packagesandpowerscontactyourlocalsalesoffice.
LEADFINISH(SnPb)partsareinEOLprocess. ProductDiscontinuationNotice-PDN#SP-17-02
IDT Clock Solution for IDT70T3719/99M Dual-Port
Dual-Port I/O Specitications
Clock Specifications
IDT
PLL
Clock Device
IDT
Non-PLL
Clock Device
IDT Dual-Port
Part Number
Input Duty
Cycle
Requirement
Input
Capacitance
Maximum
Frequency Tolerance
Jitter
Voltage
3.3/2.5
I/O
5T9010
5T905, 5T9050
5T907, 5T9070
70T3719/99M
LVTTL
15pF
40%
166
75ps
5T2010
5687 tbl 20
Datasheet Document History:
06/27/05:
07/11/07:
01/19/09:
08/06/10:
07/15/14:
02/14/18:
InitialDatasheet
RemovedAdvancedstatus
Page 25 Removed "IDT" from orderable part number
Page 3 Footnote5-correctedatypointhepackagebodyandball-pitchdimensions
Page 25 Added Tape & Reel to Ordering Information
ProductDiscontinuationNotice-PDN#SP-17-02
Last time buy expires June 15, 2018
CORPORATE HEADQUARTERS
6024 Silver Creek Valley Road
San Jose, CA 95138
for SALES:
for Tech Support:
408-284-2794
DualPortHelp@idt.com
800-345-7015 or 408-284-8200
fax: 408-284-2775
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
6.42
25
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IDT
IDT70T631S
HIGH-SPEED 2.5V 512/256K x 18 ASYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V 0R 2.5V INTERFACE
IDT
IDT70T631S10BC
HIGH-SPEED 2.5V 512/256K x 18 ASYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V 0R 2.5V INTERFACE
IDT
IDT70T631S10BC8
Dual-Port SRAM, 256KX18, 10ns, CMOS, PBGA256, 17 X 17 MM, 1.40 MM HEIGHT, 1 MM PITCH, BGA-256
IDT
IDT70T631S10BCG
Dual-Port SRAM, 256KX18, 10ns, CMOS, PBGA256, 17 X 17 MM, 1.40 MM HIEGHT, 1 MM PITCH, GREEN, BGA-256
IDT
IDT70T631S10BCI
HIGH-SPEED 2.5V 512/256K x 18 ASYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V 0R 2.5V INTERFACE
IDT
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