IDT74FCT139CTQG [IDT]
Decoder/Driver, FCT Series, Inverted Output, CMOS, PDSO16, QSOP-16;
| 型号： | IDT74FCT139CTQG |
| 厂家： | 
INTEGRATED DEVICE TECHNOLOGY |
| 描述： | Decoder/Driver, FCT Series, Inverted Output, CMOS, PDSO16, QSOP-16 驱动 光电二极管 逻辑集成电路 |
| 文件： | 总6页 (文件大小：79K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
FAST CMOS
1-OF-4 DECODER
WITH ENABLE
IDT74FCT139AT/CT
DESCRIPTION:
FEATURES:
The IDT74FCT139T is a dual 1-of-4 decoder built using an advanced
dual metal CMOS technology. These devices have two independent
decoders, each of which accept two binary weighted inputs (A0-A1) and
provide fourmutuallyexclusive active lowoutputs (O0-O3).Eachdecoder
has anactive lowenable (E). WhenE is high, alloutputs are forcedhigh.
• A and C grades
• Low input and output leakage ≤1µA (max.)
• CMOS power levels
• True TTL input and output compatibility:
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.)
• High Drive outputs (-15mA IOH, 48mA IOL)
• Meets or exceeds JEDEC standard 18 specifications
• Power off disable outputs permit "live insertion"
• Available in SOIC and QSOP packages
FUNCTIONALBLOCKDIAGRAM
Ea
Eb
A0a
A1a
A0b
A1b
O0a
O1a
O2a
O3a
O0b
O1b
O2b
O3b
TheIDTlogoisaregisteredtrademarkofIntegratedDeviceTechnology,Inc.
INDUSTRIAL TEMPERATURE RANGE
FEBRUARY 2006
1
© 2006 Integrated Device Technology, Inc.
DSC-2566/10
IDT74FCT139AT/CT
FASTCMOS1-OF-4DECODERWITHENABLE
INDUSTRIALTEMPERATURERANGE
ABSOLUTEMAXIMUMRATINGS(1)
PINCONFIGURATION
Symbol
Description
Max
Unit
V
(2)
VTERM
Terminal Voltage with Respect to GND
–0.5 to +7
(3)
VTERM
Terminal Voltage with Respect to GND –0.5 to VCC+0.5
V
1
2
3
Ea
A0a
A1a
16
15
14
13
VCC
Eb
TSTG
IOUT
Storage Temperature
DC Output Current
–65 to +150
–60 to +120
° C
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by =0.5V unless otherwise noted.
A0b
A1b
O0b
O1b
O2b
O3b
4
5
6
O0a
O1a
12
11
10
9
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
O2a
7
8
O3a
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Symbol
Parameter(1)
Input Capacitance
Output Capacitance
Conditions
Typ.
Max. Unit
GND
CIN
VIN = 0V
6
10
12
pF
pF
COUT
VOUT = 0V
8
SOIC/ QSOP
TOP VIEW
NOTE:
1. This parameter is measured at characterization but not tested.
PINDESCRIPTION
Pin Names
A0, A1
E
Description
Address Inputs
Enable Inputs (Active LOW)
Outputs (Active LOW)
O0 - O3
FUNCTIONTABLE(1)
Inputs
Outputs
E1
H
L
A0
X
L
A1
X
L
O0
H
L
O1
H
H
L
O2
O3
H
H
H
H
L
H
H
H
L
L
H
L
L
H
H
H
L
H
H
H
H
L
H
H
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
2
IDT74FCT139AT/CT
FASTCMOS1-OF-4DECODERWITHENABLE
INDUSTRIALTEMPERATURERANGE
DCELECTRICALCHARACTERISTICSOVEROPERATINGRANGE
FollowingConditionsApplyUnlessOtherwiseSpecified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
Symbol
VIH
VIL
IIH
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
Min.
2
Typ.(2)
—
Max.
—
0.8
1
Unit
V
Input LOW Level
Guaranteed Logic LOW Level
VCC = Max.
—
—
—
—
—
–60
2.4
—
V
Input HIGH Current(4)
Input LOW Current(4)
Input HIGH Current(4)
Clamp Diode Voltage
Short Circuit Current
OutputHIGHVoltage
VI = 2.7V
VI = 0.5V
—
µA
IIL
VCC = Max.
—
1
II
VCC = Max., VI = VCC (Max.)
VCC = Min., IIN = –18mA
—
1
µA
V
VIK
IOS
–0.7
–120
3.3
–1.2
–225
—
(3)
VCC = Max., VO = GND
mA
V
VOH
VCC = Min
IOH = –8mA
VIN = VIH or VIL
VCC = Min
IOH = –15mA
IOL = 48mA
2
3
—
VOL
Output LOWVoltage
—
0.3
0.5
V
VIN = VIH or VIL
VH
ICC
Input Hysteresis
—
—
—
200
—
1
mV
mA
Quiescent Power Supply Current
VCC = Max.
0.01
VIN = GND or VCC
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = –55°C.
3
IDT74FCT139AT/CT
FASTCMOS1-OF-4DECODERWITHENABLE
INDUSTRIALTEMPERATURERANGE
POWERSUPPLYCHARACTERISTICS
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
ΔICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V
—
0.5
2
mA
(3)
ICCD
IC
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
One Input Toggling
50% Duty Cycle
VIN = VCC
VIN = GND
—
0.15
0.3
mA/
MHz
Total Power Supply Current(6)
VCC = Max.
Outputs Open
fo = 10MHz
VIN = VCC
VIN = GND
—
—
—
—
1.5
1.8
3
4
5
mA
mA
50% Duty Cycle
One Input and
One Output Toggling
VIN = 3.4V
VIN = GND
(5)
7
VCC = Max.
Outputs Open
fo = 10MHz
VIN = VCC
VIN = GND
(5)
9
50% Duty Cycle
One Input Toggling
on each decoder
VIN = 3.4V
VIN = GND
3.5
Two Outputs Toggling
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of ΔICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fONO)
ICC = Quiescent Current
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fO = Output Frequency
NO = Number of Outputs at fO
All currents are in milliamps and all frequencies are in megahertz.
SWITCHINGCHARACTERISTICSOVEROPERATINGRANGE
74FCT139AT
74FCT139CT
Min.(2)
Symbol
tPLH
Parameter
PropagationDelay
A0 or A1 to Ox
PropagationDelay
E to Ox
Condition(1)
CL = 50pF
RL = 500Ω
Min.(2)
Max.
Max.
Unit
1.5
5.9
1.5
5
ns
tPHL
tPLH
1.5
5.5
1.5
4.8
ns
tPHL
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
4
IDT74FCT139AT/CT
FASTCMOS1-OF-4DECODERWITHENABLE
INDUSTRIALTEMPERATURERANGE
TESTCIRCUITSANDWAVEFORMS
VCC
SWITCHPOSITION
7.0V
Test
Switch
Closed
Open
500W
Open Drain
Disable Low
Enable Low
VOUT
VIN
Pulse
Generator
D.U.T
.
All Other Tests
50pF
500W
T
R
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
L
C
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Octal Link
Test Circuits for All Outputs
3V
DATA
1.5V
INPUT
0V
LOW-HIGH-LOW
tH
tSU
1.5V
PULSE
3V
1.5V
0V
TIMING
INPUT
ASYNCHRONOUS CONTROL
tW
tREM
PRESET
CLEAR
ETC.
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
SYNCHRONOUS CONTROL
PRESET
3V
1.5V
0V
CLEAR
tSU
tH
CLOCK ENABLE
ETC.
Pulse Width
Octal Link
Octal Link
Set-Up, Hold, and Release Times
ENABLE
DISABLE
3V
1.5V
0V
3V
SAME PHASE
CONTROL
INPUT
1.5V
0V
INPUT TRANSITION
tPLH
tPLH
tPHL
tPHL
tPZL
tPLZ
VOH
1.5V
VOL
OUTPUT
3.5V
1.5V
3.5V
VOL
VOH
OUTPUT
NORMALLY
LOW
SWITCH
CLOSED
0.3V
0.3V
3V
1.5V
0V
tPZH
tPHZ
OPPOSITE PHASE
INPUT TRANSITION
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
1.5V
0V
0V
Octal Link
Octal Link
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
5
IDT74FCT139AT/CT
FASTCMOS1-OF-4DECODERWITHENABLE
INDUSTRIALTEMPERATURERANGE
ORDERINGINFORMATION
IDT
XX
FCT
XXXX
XX
X
Temp. Range
Package
Process
Device Type
Blank
Industrial
SO
Q
Small Outline IC (300 mil)
Quarter-size Small Outline Package
Dual 1-of-4 Decoder with Enable
– 40°C to +85°C
139AT
139CT
74
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6
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