IDT74FCT162827CTPF8 [IDT]
Bus Driver, FCT Series, 2-Func, 10-Bit, True Output, CMOS, PDSO56, TVSOP-56;
| 型号： | IDT74FCT162827CTPF8 |
| 厂家： | 
INTEGRATED DEVICE TECHNOLOGY |
| 描述： | Bus Driver, FCT Series, 2-Func, 10-Bit, True Output, CMOS, PDSO56, TVSOP-56 驱动 光电二极管 输出元件 逻辑集成电路 电视 |
| 文件： | 总7页 (文件大小：547K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
FAST CMOS
IDT74FCT162827AT/CT
20-BIT BUFFER
FEATURES:
DESCRIPTION:
• 0.5 MICRON CMOS Technology
TheFCT162827T20-bitbuffersarebuiltusingadvanceddualmetalCMOS
technology. These20-bitbusdriversprovidehigh-performancebusinterface
buffering for wide data/address paths or buses carrying parity. Two pair of
NAND-ed output enable controls offer maximum control flexibility and are
organizedtooperatethedeviceastwo10-bitbuffersorone20-bitbuffer.Flow-
throughorganizationofsignalpinssimplifieslayout. Allinputsaredesignedwith
hysteresisforimprovednoisemargin.
• High-speed, low-power CMOS replacement for ABT functions
• Typical tSK(o) (Output Skew) < 250ps
• Low input and output leakage ≤1µA (max.)
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
• VCC = 5V ±10%
• Balanced Output Drivers (±24mA)
TheFCT162827Thasbalancedoutputdrivewithcurrentlimitingresistors.
Thisofferslowgroundbounce,minimalundershoot,andcontrolledoutputfall
times–reducing the need for external series terminating resistors. The
FCT162827Tisaplug-inreplacementfortheFCT16827TandABT16827for
on-boardinterfaceapplications.
• Reduced system switching noise
• Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
• Available in SSOP, TSSOP, and TVSOP packages
FUNCTIONALBLOCKDIAGRAM
1
28
1OE
2OE
29
56
55
1
1
1OE
2
2OE
2
2
42
15
1A
1
1Y
1
2A
1
2Y
1
TO NINE OTHER CHAN-
NELS
TO NINE OTHER CHAN-
NELS
TheIDTlogoisaregisteredtrademarkofIntegratedDeviceTechnology,Inc.
INDUSTRIAL TEMPERATURE RANGE
APRIL 2002
1
© 2002 Integrated Device Technology, Inc.
DSC-5440/2
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
ABSOLUTE MAXIMUM RATINGS(1)
PINCONFIGURATION
Symbol
Description
Max
Unit
V
V
°C
mA
(2)
VTERM
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND –0.5 to VCC+0.5
–0.5 to 7
1
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1OE
2
1A
1
1OE
(3)
1
VTERM
2
1Y
1
TSTG
IOUT
Storage Temperature
DC Output Current
–65 to +150
–60 to +120
3
1Y
G2N
1A
2
4
GN
D
1A
3
NOTES:
D
1Y
3
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
5
6
1Y
1A
4
4
VCC
7
VCC
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Outputs and I/O terminals for FCT162XXX.
8
1Y
5
1A
5
1A
6
9
1Y
6
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
1Y
1A
7
GN
D
1A
8
1A
9
1A1
0
2A
1
7
GN
D
1Y
8
1Y
9
1Y1
0
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol
CIN
Parameter(1)
Conditions
VIN = 0V
Typ.
3.5
Max. Unit
6
Input Capacitance
pF
pF
COUT
Output Capacitance
VOUT = 0V
3.5
8
2Y
1
NOTE:
1. This parameter is measured at characterization but not tested.
2Y
2A
2
2
2Y
3
GN
D
2Y
4
2Y
5
2A
3
GN
D
2A
4
PINDESCRIPTION
2A
5
Pin Names
xOEx
xAx
Description
OutputEnableInputs(ActiveLOW)
DataInputs
2A
6
VCC
2Y
6
VCC
2Y
7
2Y
8
GN
D
2Y
9
2A
7
xYx
3-StateOutputs
2A
8
GN
D
2A
9
2Y1
0
2A1
0
2OE
2
2OE
1
FUNCTIONTABLE(1)
Inputs
Outputs
SSOP/ TSSOP/ TVSOP
TOP VIEW
xOE1
L
xOE2
L
xAx
L
xYx
L
L
L
H
H
H
X
X
H
X
X
Z
Z
NOTE:
1. H = HIGH voltage level
L = LOW voltage level
X = Don’t care
Z = High-impedance
2
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
DCELECTRICALCHARACTERISTICSOVEROPERATINGRANGE
FollowingConditionsApplyUnlessOtherwiseSpecified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
Symbol
VIH
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
Min.
2
Typ.(2)
—
Max.
—
Unit
V
VIL
IIH
InputLOWLevel
GuaranteedLogicLOWLevel
VCC = Max.
—
—
—
—
—
—
—
—
–80
—
—
—
—
—
—
—
—
—
–0.7
–140
100
5
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
V
µA
InputHIGHCurrent(Inputpins)(4)
Input HIGH Current (I/O pins)(4)
InputLOWCurrent(Inputpins)(4)
InputLOWCurrent(I/Opins)(4)
HighImpedanceOutputCurrent
(3-StateOutputpins)(4)
VI = VCC
IIL
VI = GND
IOZH
IOZL
VIK
IOS
VH
ICCL
ICCH
ICCZ
VCC = Max.
VO = 2.7V
VO = 0.5V
µA
ClampDiodeVoltage
ShortCircuitCurrent
InputHysteresis
Quiescent Power Supply Current
VCC = Min., IIN = –18mA
VCC = Max., VO = GND(3)
V
mA
mV
µA
—
VCC = Max
VIN = GND or VCC
500
OUTPUTDRIVECHARACTERISTICS
Symbol
IODL
IODH
Parameter
OutputLOWCurrent
Output HIGH Current
Output HIGH Voltage
Test Conditions(1)
Min.
60
–60
2.4
Typ.(2) Max.
Unit
mA
mA
V
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3)
VCC = Min.
115
–115
3.3
200
–200
—
VOH
IOH = –24mA
IOL = 24mA
VIN = VIH or VIL
VOL
OutputLOWVoltage
VCC = Min.
—
0.3
0.55
V
VIN = VIH or VIL
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This test limit for this parameter is ±5µA at TA = –55°C.
3
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
POWERSUPPLYCHARACTERISTICS
Symbol
Parameter
TestConditions(1)
Min.
Typ.(2)
Max.
Unit
∆ICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
—
0.5
1.5
mA
ICCD
Dynamic Power Supply Current(4)
VCC = Max.
VIN = VCC
—
60
100
µA/
OutputsOpen
VIN = GND
MHz
xOE1 = xOE2 = GND
OneInputToggling
50% Duty Cycle
VCC = Max.
OutputsOpen
fi = 10MHz
IC
TotalPowerSupplyCurrent(6)
VIN = VCC
—
—
—
—
0.6
0.9
3
1.5
2.3
mA
VIN = GND
50% Duty Cycle
xOE1 = xOE2 = GND
OneBitToggling
VIN = 3.4V
VIN = GND
VCC = Max.
VIN = VCC
5.5(5)
20.5(5)
OutputsOpen
VIN = GND
fi = 2.5MHz
50% Duty Cycle
xOE1 = xOE2 = GND
Twenty BitsToggling
VIN = 3.4V
VIN = GND
8
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
4
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
SWITCHINGCHARACTERISTICSOVEROPERATINGRANGE
FCT162827AT
FCT162827CT
Symbol
tPLH
Parameter
PropagationDelay
xAx to xYx
Condition(1)
CL = 50pF
RL = 500Ω
CL =300pF(4)
RL = 500Ω
CL = 50pF
Min.(2)
Max.
Min.(2)
Max.
3.7
Unit
ns
1.5
8
1.5
1.5
.5
tPHL
1.5
1.5
1.5
1.5
1.5
—
15
12
23
9
7
4.8
9
tPZH
tPZL
OutputEnableTime
xOEx to xYx
ns
RL = 500Ω
CL =300pF(4)
RL = 500Ω
CL = 5pF(4)
RL = 500Ω
CL = 50pF
1.5
1.5
1.5
—
tPHZ
tPLZ
OutputDisableTime
4
ns
ns
xOEx to xYx
10
0.5
4
RL = 500Ω
tSK(o)
OutputSkew(3)
0.5
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design.
4. This limit is guaranteed but not tested.
5
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
TESTCIRCUITSANDWAVEFORMS
VCC
7.0V
SWITCHPOSITION
Test
Switch
Closed
Open
500Ω
Open Drain
Disable Low
Enable Low
VOUT
VIN
Pulse
Generator
D.U.T.
50pF
CL
All Other Tests
DEFINITIONS:
500Ω
RT
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Test Circuits for All Outputs
3V
DATA
1.5V
INPUT
0V
LOW-HIGH-LOW
tH
tSU
1.5V
PULSE
3V
1.5V
0V
TIMING
INPUT
tW
ASYNCHRONOUS CONTROL
tREM
PRESET
CLEAR
ETC.
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
SYNCHRONOUS CONTROL
PRESET
3V
1.5V
0V
CLEAR
tSU
tH
Pulse Width
CLOCK ENABLE
ETC.
Set-up, Hold, and Release Times
ENABLE
DISABLE
3V
1.5V
0V
3V
SAME PHASE
CONTROL
INPUT
1.5V
0V
INPUT TRANSITION
tPLH
tPLH
tPHL
tPHL
tPZL
tPLZ
VOH
1.5V
VOL
OUTPUT
3.5V
1.5V
3.5V
VOL
OUTPUT
NORMALLY
LOW
SWITCH
CLOSED
0.3V
0.3V
3V
1.5V
0V
tPZH
tPHZ
OPPOSITE PHASE
INPUT TRANSITION
VOH
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
1.5V
0V
0V
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
6
IDT74FCT162827AT/CT
FASTCMOS20-BITBUFFER
INDUSTRIALTEMPERATURERANGE
ORDERINGINFORMATION
IDT
XX
FCT
XXXX
XXX
XX
Temp. Range
Family
Package
Device Type
PV
PA
PF
Shrink Small Outline Package
Thin Shrink Small Outline Package
Thin Very Small Outline Package
20-Bit Buffer
827AT
827CT
162
74
Double-Density, 5 Volt, Balanced Drive
– 40°C to +85°C
DATASHEETDOCUMENTHISTORY
1/21/2002
4/9/2002
RemovedMilitarytempgrade
RemovedBspeedoption
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Santa Clara, CA 95054
www.idt.com
7
相关型号：
IDT74FCT162827CTPVG8
Bus Driver, FCT Series, 2-Func, 10-Bit, True Output, CMOS, PDSO56, GREEN, SSOP-56
IDT
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