IDT74FCT521CTPYG8 [IDT]
Identity Comparator, FCT Series, 8-Bit, Inverted Output, CMOS, PDSO20, SSOP-20;型号: | IDT74FCT521CTPYG8 |
厂家: | INTEGRATED DEVICE TECHNOLOGY |
描述: | Identity Comparator, FCT Series, 8-Bit, Inverted Output, CMOS, PDSO20, SSOP-20 光电二极管 逻辑集成电路 |
文件: | 总6页 (文件大小:72K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IDT74FCT521AT/CT
FAST CMOS 8-BIT
IDENTITY COMPARATOR
FEATURES:
DESCRIPTION:
• A and C grades
• Low input and output leakage ≤1µA (max.)
• CMOS power levels
• True TTL input and output compatibility:
– VOH = 3.3V (typ.)
The IDT74FCT521T is an 8-bit identity comparator built using an
advanced dual metal CMOS technology. These devices compare two
words ofuptoeightbits eachandprovidealowoutputwhenthetwowords
match bit for bit. The expansion input IA = B also serves as an active low
enableinput.
– VOL = 0.3V (typ.)
• High Drive outputs (-15mA IOH, 48mA IOL)
• Meets or exceeds JEDEC standard 18 specifications
• Power off disable outputs permit "live insertion"
• Available in SOIC, SSOP, and QSOP packages
FUNCTIONALBLOCKDIAGRAM
2
A
B
0
0
3
4
5
A
B
1
1
6
7
A
B
2
2
8
9
A
B
3
3
19
OA=B
11
12
A
B
4
4
13
14
A
B
5
5
15
16
A
B
6
6
17
18
1
A
B
7
7
I
A=B
TheIDTlogoisaregisteredtrademarkofIntegratedDeviceTechnology,Inc.
INDUSTRIAL TEMPERATURE RANGE
OCTOBER 2009
1
© 2009 Integrated Device Technology, Inc.
DSC-2572/13
IDT74FCT521AT/CT
FASTCMOS8-BITIDENTITYCOMPARATOR
INDUSTRIALTEMPERATURERANGE
ABSOLUTEMAXIMUMRATINGS(1)
PINCONFIGURATION
Symbol
Description
Max
Unit
V
(2)
VTERM
Terminal Voltage with Respect to GND
–0.5 to +7
(3)
VTERM
Terminal Voltage with Respect to GND –0.5 to VCC+0.5
V
20
19
18
17
16
15
14
13
12
11
1
I
A=B
V
CC
TSTG
IOUT
Storage Temperature
DC Output Current
–65 to +150
–60 to +120
° C
mA
2
3
4
O
A=B
A0
B0
A1
B1
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
B
7
7
6
6
A
B
A
B
A
B
A
5
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
A2
B2
A3
B3
6
5
5
4
4
7
CAPACITANCE (TA = +25°C, F = 1.0MHz)
8
Symbol
CIN
Parameter(1)
Input Capacitance
Output Capacitance
Conditions
VIN = 0V
Typ.
6
Max. Unit
10
12
pF
pF
9
COUT
VOUT = 0V
8
GND
10
NOTE:
1. This parameter is measured at characterization but not tested.
SOIC/ SSOP/ QSOP
TOP VIEW
PINDESCRIPTION
Pin Names
A0 - A7
B0 - B7
IA = B
Description
Word A Inputs
Word B Inputs
Expansion or Enable Input (Active LOW)
Identity Output (Active LOW)
OA = B
FUNCTIONTABLE(1)
Inputs
Output
IA=B
L
A, B
OA=B
L
A = B*
A≠ B
A = B*
A≠ B
L
H
H
H
H
H
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
*A0 = B0, A1 = B1, A2 = B2, etc.
2
IDT74FCT521AT/CT
FASTCMOS8-BITIDENTITYCOMPARATOR
INDUSTRIALTEMPERATURERANGE
DCELECTRICALCHARACTERISTICSOVEROPERATINGRANGE
FollowingConditionsApplyUnlessOtherwiseSpecified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
Symbol
VIH
VIL
IIH
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
Min.
2
Typ.(2)
—
Max.
—
0.8
1
Unit
V
Input LOW Level
Guaranteed Logic LOW Level
VCC = Max.
—
—
—
—
—
—
V
Input HIGH Current(4)
Input LOW Current(4)
Input HIGH Current(4)
Clamp Diode Voltage
Short Circuit Current
OutputHIGHVoltage
VI = 2.7V
VI = 0.5V
—
µA
IIL
VCC = Max.
—
1
II
VCC = Max., VI = VCC (Max.)
VCC = Min., IIN = –18mA
—
1
µA
V
VIK
IOS
–0.7
–1.2
(3)
VCC = Max., VO = GND
–60
2.4
2
–120
3.3
3
–225
—
mA
V
VOH
VCC = Min
IOH = –8mA
IOH = –15mA
VIN = VIH or VIL
—
VOL
Output LOWVoltage
VCC = Min
IOL = 48mA
—
0.3
0.5
V
VIN = VIH or VIL
VH
ICC
Input Hysteresis
—
—
—
200
—
1
mV
mA
Quiescent Power Supply Current
VCC = Max.
0.01
VIN = GND or VCC
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = –55°C.
3
IDT74FCT521AT/CT
FASTCMOS8-BITIDENTITYCOMPARATOR
INDUSTRIALTEMPERATURERANGE
POWERSUPPLYCHARACTERISTICS
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
ΔICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V
—
0.5
2
mA
(3)
ICCD
IC
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
One Input Toggling
50% Duty Cycle
VIN = VCC
VIN = GND
—
0.15
0.25
mA/
MHz
Total Power Supply Current(6)
VCC = Max.
Outputs Open
fi = 10MHz
One Bit Toggling
50% Duty Cycle
VIN = VCC
—
—
1.5
1.8
3.5
4.5
mA
VIN = GND
VIN = 3.4V
VIN = GND
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of ΔICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fCP/2+ fiNi)
ICC = Quiescent Current
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Output Frequency
Ni = Number of Outputs at fi
All currents are in milliamps and all frequencies are in megahertz.
SWITCHINGCHARACTERISTICSOVEROPERATINGRANGE
74FCT521AT
74FCT521CT
Symbol
tPLH
Parameter
PropagationDelay
Ax or Bx to OA = B
PropagationDelay
IA = B to OA = B
Condition(1)
CL = 50pF
RL = 500Ω
Min.(2)
Max.
Min.(2)
Max.
Unit
1.5
7.2
1.5
1.5
4.5
ns
tPHL
tPLH
1.5
6
4.1
ns
tPHL
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
4
IDT74FCT521AT/CT
FASTCMOS8-BITIDENTITYCOMPARATOR
INDUSTRIALTEMPERATURERANGE
TESTCIRCUITSANDWAVEFORMS
V
CC
SWITCHPOSITION
7.0V
Test
Switch
Closed
Open
500W
Open Drain
Disable Low
Enable Low
V
OUT
V
IN
Pulse
Generator
D.U.T
.
All Other Tests
50pF
500W
T
R
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
L
C
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Octal Link
Test Circuits for All Outputs
3V
DATA
1.5V
0V
INPUT
LOW-HIGH-LOW
t
H
tSU
1.5V
PULSE
3V
1.5V
0V
TIMING
INPUT
ASYNCHRONOUS CONTROL
tW
tREM
PRESET
CLEAR
ETC.
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
SYNCHRONOUS CONTROL
PRESET
3V
1.5V
0V
CLEAR
tSU
t
H
CLOCK ENABLE
ETC.
Pulse Width
Octal Link
Octal Link
Set-Up, Hold, and Release Times
ENABLE
DISABLE
3V
1.5V
0V
3V
SAME PHASE
CONTROL
INPUT
1.5V
0V
INPUT TRANSITION
t
PLH
t
PHL
PHL
t
PZL
tPLZ
VOH
OUTPUT
3.5V
1.5V
3.5V
1.5V
OUTPUT
NORMALLY
LOW
SWITCH
CLOSED
VOL
tPLH
t
0.3V
0.3V
VOL
3V
1.5V
0V
tPZH
tPHZ
OPPOSITE PHASE
INPUT TRANSITION
VOH
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
1.5V
0V
0V
Octal Link
Octal Link
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
5
IDT74FCT521AT/CT
FASTCMOS8-BITIDENTITYCOMPARATOR
INDUSTRIALTEMPERATURERANGE
ORDERINGINFORMATION
XXXX
XX
X
XX
FCT
Package
Process
Device Type
Temp. Range
Blank
Industrial
Small Outline IC - Green
Shrink Small Outline Package - Green
Quarter-size Small Outline Package - Green
SOG
PYG
QG
Fast CMOS 8-Bit Identity Comparator
521AT
521CT
74
40 C to +85 C
DatasheetDocumentHistory
10/03/09 Pg. 6
Updatedthe orderinginformationbyremovingthe "IDT"notationandnonRoHSpart.
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800-345-7015 or 408-284-8200
fax: 408-284-2775
www.idt.com
6
相关型号:
IDT74FCT521CTSOG
Identity Comparator, FCT Series, 8-Bit, Inverted Output, CMOS, PDSO20, GREEN, SOIC-20
IDT
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