IDT74FCT841ATSO [IDT]

FAST CMOS BUS INTERFACE LATCHES; FAST CMOS总线接口锁存器
IDT74FCT841ATSO
型号: IDT74FCT841ATSO
厂家: INTEGRATED DEVICE TECHNOLOGY    INTEGRATED DEVICE TECHNOLOGY
描述:

FAST CMOS BUS INTERFACE LATCHES
FAST CMOS总线接口锁存器

锁存器
文件: 总7页 (文件大小:142K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IDT54/74FCT841AT/BT/CT/DT  
FAST CMOS  
BUS INTERFACE  
LATCHES  
Integrated Device Technology, Inc.  
FEATURES:  
DESCRIPTION:  
The FCT8xxT series is built using an advanced dual metal  
CMOS technology.  
• Common features:  
– Low input and output leakage 1µA (max.)  
– CMOS power levels  
– True TTL input and output compatibility  
– VOH = 3.3V (typ.)  
The FCT8xxT bus interface latches are designed to elimi-  
nate the extra packages required to buffer existing latches  
and provide extra data width for wider address/data paths or  
buses carrying parity. The FCT841T are buffered, 10-bit wide  
versions of the popular FCT373T function. They are ideal for  
use as an output port requiring high IOL/IOH.  
All of the FCT8xxT high-performance interface family can  
drive large capacitive loads, while providing low-capacitance  
bus loading at both inputs and outputs. All inputs have clamp  
diodes to ground and all outputs are designed for low-capaci-  
tance bus loading in high-impedance state.  
– VOL = 0.3V (typ.)  
– Meets or exceeds JEDEC standard 18 specifications  
– Product available in Radiation Tolerant and Radiation  
Enhanced versions  
– Military product compliant to MIL-STD-883, Class B  
and DESC listed (dual marked)  
– Available in DIP, SOIC, SSOP, QSOP, CERPACK  
and LCC packages  
• Features for FCT841T:  
– A, B, C and D speed grades  
– High drive outputs (-15mA IOH, 48mA IOL)  
– Power off disable outputs permit “live insertion”  
FUNCTIONAL BLOCK DIAGRAM  
D0  
D1  
D2  
D3  
D4  
D5  
D8  
D9  
D
D
D
D
D
D
D
D
Q
Q
Q
Q
Q
Q
Q
Q
LE  
LE  
LE  
LE  
LE  
LE  
LE  
LE  
LE  
OE  
Y0  
Y1  
Y2  
Y3  
Y4  
Y5  
Y8  
Y9  
2571 drw 01  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
JUNE 1996  
1996 Integrated Device Technology, Inc.  
6.22  
2571/6  
1
IDT54/74FCT841AT/BT/CT/DT  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
FAST CMOS BUS INTERFACE LATCHES  
PIN CONFIGURATIONS  
INDEX  
1
2
3
4
5
6
7
8
9
10  
24  
23  
22  
21  
20  
19  
18  
17  
16  
VCC  
Y0  
Y1  
Y2  
Y3  
OE  
D0  
D1  
D2  
D3  
D4  
D5  
D6  
D7  
D8  
4 3 2  
P24-1  
D24-1  
SO24-2  
SO24-7  
SO24-8  
&
282726  
1
D
D3  
D4  
2
5
6
7
8
9
10  
11  
25  
Y
Y
Y
2
3
4
24  
23  
22  
21  
20  
19  
Y4  
Y5  
Y6  
Y7  
Y8  
NC  
NC  
L28-1  
D5  
D6  
D7  
Y5  
Y6  
Y7  
E24-1  
15  
14  
13  
1213 1415161718  
D9  
GND  
Y9  
LE  
11  
12  
DIP/SOIC/SSOP/QSOP/CERPACK  
TOP VIEW  
LCC  
TOP VIEW  
2571 drw 02  
2571 drw 03  
PIN DESCRIPTION  
FUNCTION TABLE(1)  
Name  
DI  
I/O  
Description  
The latch data inputs.  
I
Inputs  
Internal Output  
LE  
H
H
L
DI  
L
QI  
L
YI  
Z
Function  
OE  
H
LE  
I
The latch enable input. The latches are  
transparent when LE is HIGH. Input data  
is latched on the HIGH-to-LOW  
transition.  
High Z  
High Z  
H
H
X
L
H
Z
H
NC  
L
Z
Latched (High Z)  
Transparent  
YI  
O
The 3-state latch outputs.  
L
H
H
L
L
OE  
I
The output enable control. When OE is  
LOW, the outputs are enabled. When OE  
L
L
H
X
H
H
Transparent  
is HIGH, the outputs V are in high-  
I
NC  
NC  
Latched  
impedance (off) state.  
NOTE:  
2571 tbl 02  
2571 tbl 01  
1. H=HIGH, L=LOW, X=Don’tCare, NC=NoChange, Z=HighImpedance  
ABSOLUTE MAXIMUM RATINGS(1)  
CAPACITANCE (TA = +25°C, f = 1.0MHz)  
Symbol  
Rating  
Commercial  
Military  
Unit  
Symbol  
Parameter(1)  
Conditions Typ. Max. Unit  
(2)  
VTERM  
Terminal Voltage  
with Respect to  
GND  
–0.5 to +7.0 –0.5 to +7.0  
V
CIN  
Input  
Capacitance  
Output  
VIN = 0V  
6
8
10  
pF  
COUT  
VOUT = 0V  
12  
pF  
(3)  
VTERM  
Terminal Voltage  
with Respect to  
GND  
–0.5 to  
–0.5 to  
V
Capacitance  
VCC +0.5  
VCC +0.5  
2571 lnk 04  
NOTE:  
1. This parameter is measured at characterization but not tested.  
TA  
Operating  
0 to +70  
–55 to +125 °C  
Temperature  
Temperature  
Under Bias  
Storage  
TBIAS  
TSTG  
–55 to +125 –65 to +135 °C  
–55 to +125 –65 to +150 °C  
Temperature  
Power Dissipation  
PT  
0.5  
0.5  
W
IOUT  
DC Output  
Current  
–60 to +120 –60 to +120 mA  
NOTES:  
2571 lnk 03  
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-  
INGS may cause permanent damage to the device. This is a stress rating  
onlyandfunctionaloperationofthedeviceattheseoranyotherconditions  
above those indicated in the operational sections of this specification is  
not implied. Exposure to absolute maximum rating conditions for  
extended periods may affect reliability. No terminal voltage may exceed  
VCC by +0.5V unless otherwise noted.  
2. Input and VCC terminals only.  
3. Outputs and I/O terminals only.  
6.22  
2
IDT54/74FCT841AT/BT/CT/DT  
FAST CMOS BUS INTERFACE LATCHES  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE  
Following Conditions Apply Unless Otherwise Specified:  
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%  
Symbol  
Parameter  
Input HIGH Level  
Test Conditions(1)  
Min. Typ.(2) Max.  
Unit  
VIH  
Guaranteed Logic HIGH Level  
2.0  
0.8  
±1  
±1  
±1  
±1  
±1  
–1.2  
V
VIL  
II H  
II L  
Input LOW Level  
Guaranteed Logic LOW Level  
V
Input HIGH Current(4)  
Input LOW Current(4)  
High Impedance Output Current  
(3-State Output pins)(4)  
Input HIGH Current(4)  
Clamp Diode Voltage  
Input Hysteresis  
VCC = Max.  
VCC = Max.  
VI = 2.7V  
VI = 0.5V  
VO = 2.7V  
VO = 0.5V  
µA  
IOZH  
IOZL  
II  
µA  
VCC = Max., VI = VCC (Max.)  
VCC = Min., IIN = –18mA  
µA  
V
VIK  
VH  
ICC  
–0.7  
200  
0.01  
mV  
Quiescent Power Supply Current  
VCC = Max., VIN = GND or VCC  
1
mA  
2571 lnk 05  
OUTPUT DRIVE CHARACTERISTICS FOR FCT841T  
Symbol  
Parameter  
Test Conditions(1)  
Min. Typ.(2) Max.  
Unit  
V
OH  
Output HIGH Voltage  
V
V
CC = Min.  
IN = VIH or VIL  
I
I
I
I
I
I
OH = –6mA MIL.  
2.4  
2.0  
3.3  
3.0  
0.3  
V
OH = –8mA COM'L.  
OH = –12mA MIL.  
OH = –15mA COM'L.  
OL = 32mA MIL.  
V
V
VOL  
Output LOW Voltage  
V
V
V
CC = Min.  
IN = VIH or VIL  
0.5  
OL = 48mA COM'L.  
I
I
OS  
Short Circuit Current  
Input/Output Power Off Leakage(5)  
CC = Max., V  
O
= GND(3)  
–60  
–120 –225  
mA  
OFF  
V
CC = 0V, VIN or V  
O
4.5V  
±1  
µA  
2571 lnk 06  
NOTES:  
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.  
2. Typical values are at Vcc = 5.0V, +25°C ambient.  
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.  
4. The test limit for this parameter is ±5µA at TA = –55°C.  
5. This parameter is guaranteed but not tested.  
6.22  
3
IDT54/74FCT841AT/BT/CT/DT  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
FAST CMOS BUS INTERFACE LATCHES  
POWER SUPPLY CHARACTERISTICS  
Symbol  
Parameter  
Quiescent Power Supply Current  
TTL Inputs HIGH  
Test Conditions(1)  
Min. Typ.(2) Max.  
Unit  
ICC  
VCC = Max.  
VIN = 3.4V(3)  
0.5  
2.0  
mA  
ICCD  
Dynamic Power Supply Current(4) VCC = Max.  
VIN = VCC  
0.15  
0.25  
mA/  
Outputs Open  
OE = GND  
LE = VCC  
VIN = GND  
MHz  
One Input Toggling  
50% Duty Cycle  
VCC = Max.  
IC  
Total Power Supply Current(6)  
VIN = VCC  
1.5  
1.8  
3.5  
4.5  
mA  
Outputs Open  
fi = 10MHz  
VIN = GND  
50% Duty Cycle  
OE = GND  
VIN = 3.4  
VIN = GND  
LE = VCC  
One Bit Toggling  
VCC = Max.  
VIN = VCC  
3.0  
5.0  
6.0(5)  
Outputs Open  
fi = 2.5MHz  
VIN = GND  
50% Duty Cycle  
OE = GND  
VIN = 3.4  
VIN = GND  
14.0(5)  
LE = VCC  
Eight Bits Toggling  
2571 tbl 07  
NOTES:  
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.  
2. Typical values are at VCC = 5.0V, +25°C ambient.  
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.  
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.  
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.  
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC  
IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi)  
ICC = Quiescent Current  
ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)  
DH = Duty Cycle for TTL Inputs High  
NT = Number of TTL Inputs at DH  
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)  
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)  
fi = Input Frequency  
Ni = Number of Inputs at fi  
All currents are in milliamps and all frequencies are in megahertz.  
6.22  
4
IDT54/74FCT841AT/BT/CT/DT  
FAST CMOS BUS INTERFACE LATCHES  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
FCT841BT  
SWITCHING CHARACTERISTICS OVER OPERATING RANGE  
FCT841AT  
Com'l.  
Mil.  
Com'l.  
Mil.  
Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max.  
Symbol  
tPLH  
tPHL  
Parameter  
Propagation Delay  
Conditions(1)  
CL = 50pF  
RL = 500  
CL = 300pF(4)  
RL = 500Ω  
CL = 50pF  
RL = 500Ω  
CL = 300pF(4)  
RL = 500Ω  
CL = 50pF  
RL = 500Ω  
CL = 300pF(4)  
RL = 500Ω  
CL = 5pF(4)  
RL = 500Ω  
CL = 50pF  
RL = 500Ω  
CL = 50pF  
Unit  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
9.0  
13.0  
12.0  
16.0  
11.5  
23.0  
7.0  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
10.0  
15.0  
13.0  
20.0  
13.0  
25.0  
9.0  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
6.5  
13.0  
8.0  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
7.5  
15.0  
10.5  
18.0  
8.5  
ns  
DI to YI (LE = HIGH)  
tPLH  
tPHL  
Propagation Delay  
LE to YI  
ns  
ns  
ns  
15.5  
8.0  
tPZH  
tPZL  
Output Enable Time OE to YI  
Output Disable Time OE to Y I  
14.0  
6.0  
15.0  
6.5  
tPHZ  
tPLZ  
8.0  
10.0  
7.0  
7.5  
tSU  
tH  
Data to LE Set-up Time  
Data to LE Hold Time  
2.5  
2.5  
4.0  
2.5  
3.0  
5.0  
2.5  
2.5  
4.0  
2.5  
2.5  
4.0  
ns  
ns  
ns  
RL = 500Ω  
(3)  
tW  
LE Pulse Width HIGH  
NOTES:  
2571 tbl 08  
1. See test circuit and waveforms.  
2. Minimum limits are guaranteed but not tested on Propagation Delays.  
3. These parameters are guaranteed but not tested.  
4. These conditions are guaranteed but not tested.  
SWITCHING CHARACTERISTICS OVER OPERATING RANGE  
FCT841CT  
FCT841DT  
Com'l.  
Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max.  
Com'l.  
Mil.  
Mil.  
Symbol  
tPLH  
tPHL  
Parameter  
Propagation Delay  
Conditions(1)  
CL = 50pF  
RL = 500Ω  
CL = 300pF(4)  
RL = 500Ω  
CL = 50pF  
RL = 500Ω  
CL = 300pF(4)  
RL = 500Ω  
CL = 50pF  
RL = 500Ω  
CL = 300pF(4)  
RL = 500Ω  
CL = 5pF(4)  
RL = 500Ω  
CL = 50pF  
RL = 500Ω  
CL = 50pF  
Unit  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
5.5  
13.0  
6.4  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
6.3  
15.0  
6.8  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
4.2  
8.0  
4.0  
8.0  
4.8  
9.0  
4.0  
4.0  
ns  
DI to YI (LE = HIGH)  
tPLH  
tPHL  
Propagation Delay  
LE to YI  
ns  
ns  
ns  
15.0  
6.5  
16.0  
7.3  
tPZH  
tPZL  
Output Enable Time OE to YI  
Output Disable Time OE to Y I  
12.0  
5.7  
13.0  
6.0  
tPHZ  
tPLZ  
6.0  
6.3  
tSU  
tH  
Data to LE Set-up Time  
Data to LE Hold Time  
2.5  
2.5  
4.0  
2.5  
2.5  
4.0  
1.5  
1.0  
3.0  
ns  
ns  
RL = 500Ω  
(3)  
tW  
LE Pulse Width HIGH  
ns  
NOTES:  
2571 tbl 09  
1. See test circuit and waveforms.  
2. Minimum limits are guaranteed but not tested on Propagation Delays.  
3. These parameters are guaranteed but not tested.  
4. These conditions are guaranteed but not tested.  
6.22  
5
IDT54/74FCT841AT/BT/CT/DT  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
FAST CMOS BUS INTERFACE LATCHES  
TEST CIRCUITS AND WAVEFORMS  
SWITCH POSITION  
TEST CIRCUITS FOR ALL OUTPUTS  
Test  
Switch  
VCC  
7.0V  
Open Drain  
Disable Low  
Closed  
500  
Enable Low  
VOUT  
VIN  
Pulse  
Generator  
Open  
All Other Tests  
D.U.T.  
2571 lnk 11  
DEFINITIONS:  
CL= Load capacitance: includes jig and probe capacitance.  
RT = Termination resistance: should be equal to ZOUT of the Pulse  
50pF  
500Ω  
T
R
C
L
Generator.  
2571 drw 04  
SET-UP, HOLD AND RELEASE TIMES  
PULSE WIDTH  
3V  
DATA  
1.5V  
0V  
INPUT  
LOW-HIGH-LOW  
t
H
t
SU  
1.5V  
PULSE  
3V  
1.5V  
0V  
TIMING  
INPUT  
t
W
ASYNCHRONOUS CONTROL  
t
REM  
PRESET  
3V  
1.5V  
0V  
CLEAR  
HIGH-LOW-HIGH  
PULSE  
1.5V  
ETC.  
SYNCHRONOUS CONTROL  
PRESET  
3V  
2571 drw 06  
1.5V  
0V  
CLEAR  
t
SU  
t
H
CLOCK ENABLE  
ETC.  
2571 drw 05  
PROPAGATION DELAY  
ENABLE AND DISABLE TIMES  
ENABLE  
DISABLE  
3V  
1.5V  
0V  
3V  
SAME PHASE  
CONTROL  
INPUT  
1.5V  
0V  
INPUT TRANSITION  
t
PLH  
t
t
PHL  
PHL  
t
PZL  
tPLZ  
V
OH  
OUTPUT  
3.5V  
1.5V  
3.5V  
1.5V  
OUTPUT  
NORMALLY  
LOW  
SWITCH  
CLOSED  
V
OL  
t
PLH  
0.3V  
0.3V  
V
OL  
3V  
1.5V  
0V  
t
PZH  
tPHZ  
OPPOSITE PHASE  
INPUT TRANSITION  
V
OH  
OUTPUT  
NORMALLY  
HIGH  
SWITCH  
OPEN  
1.5V  
0V  
2571 drw 07  
0V  
2571 drw 08  
NOTES:  
1. Diagram shown for input Control Enable-LOW and input Control Disable-  
HIGH  
2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns  
6.22  
6
IDT54/74FCT841AT/BT/CT/DT  
FAST CMOS BUS INTERFACE LATCHES  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
ORDERING INFORMATION  
IDT  
XX  
FCT  
XXXX  
X
X
Temp. Range  
Device Type  
Package  
Process  
Blank  
B
Commercial  
MIL-STD-883, Class B  
P
Plastic DIP  
D
CERDIP  
E
CERPACK  
L
Leadless Chip Carrier  
Small Outline IC  
Shrink Small Outline Package  
Quarter-size Small Outline Package  
SO  
PY  
Q
841AT  
841BT  
841CT  
841DT  
10-Bit Non-Inverting Latch  
54  
74  
–55°C to +125°C  
0°C to +70°C  
2571 drw 09  
6.22  
7

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