BSS606N [INFINEON]

Infineon technologies offers automotive and industrial manufacturers a broad portfolio of N- and P-Channel Small Signal MOSFETs that meet and exceed the highest quality requirements in well-known industry standard packages. With unmatched levels of reliability and manufacturing capacity these components are ideally suited for a wide variety of applications including LED Lighting, ADAS, body control units, SMPS and motor control.;
BSS606N
型号: BSS606N
厂家: Infineon    Infineon
描述:

Infineon technologies offers automotive and industrial manufacturers a broad portfolio of N- and P-Channel Small Signal MOSFETs that meet and exceed the highest quality requirements in well-known industry standard packages. With unmatched levels of reliability and manufacturing capacity these components are ideally suited for a wide variety of applications including LED Lighting, ADAS, body control units, SMPS and motor control.

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BSS606N  
OptiMOS-3 Small-Signal-Transistor  
Features  
Product Summary  
VDS  
60  
60  
90  
3.2  
V
• N-channel  
RDS(on),max  
VGS=10 V  
VGS=4.5 V  
mW  
• Enhancement mode  
• Logic level (4.5V rated)  
ID  
A
• Avalanche rated  
• Qualified according to AEC Q101  
• 100%lead-free; Halogen-free; RoHS compliant  
PG-SOT-89  
4
1
2
3
Type  
Package  
Tape and Reel Information  
Marking  
KE  
Halogen-free  
Yes  
Package  
Non-dry  
BSS606N  
PG-SOT-89 H6327: 3000 pcs/ reel  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
T A=25 °C  
T A=70 °C  
T A=25 °C  
Continuous drain current  
3.2  
2.6  
A
I D,pulse  
Pulsed drain current  
12.8  
E AS  
I D=3.2 A, R GS=25 W  
Avalanche energy, single pulse  
14  
6
mJ  
I D=3.2 A, V DS=48 V,  
di /dt =100 A/µs,  
T j,max=150 °C  
Reverse diode dv /dt  
dv /dt  
kV/µs  
V GS  
Gate source voltage  
±20  
1.0  
V
Power dissipation 1)  
P tot  
T A=25 °C  
W
°C  
T j, T stg  
Operating and storage temperature  
ESD Class  
-55 ... 150  
JESD22-A114 -HBM  
class 0 (< 250V)  
260 °C  
Soldering Temperature  
IEC climatic category; DIN IEC 68-1  
1) Value refers to minimum footprint  
55/150/56  
Rev 2.2  
page 1  
2013-04-03  
BSS606N  
Unit  
Values  
typ.  
Parameter  
Symbol Conditions  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
junction - case  
R thJC  
-
-
10  
K/W  
R thJA  
SMD version, device on PCB  
minimal footprint  
-
-
-
-
125  
70  
6 cm2 cooling area2)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS=0 V, I D=250 µA  
V GS(th) V DS=0 V, I D=15 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
60  
-
-
V
1.3  
1.8  
2.3  
V DS=60 V, V GS=0 V,  
T j=25 °C  
I DSS  
Drain-source leakage current  
-
-
-
-
1
mA  
V DS=60 V, V GS=0 V,  
T j=150 °C  
100  
I GSS  
V GS=20 V, V DS=0 V  
Gate-source leakage current  
-
-
-
-
100 nA  
R DS(on) V GS=4.5 V, I D=2.6 A  
V GS=10 V, I D=3.2 A  
Drain-source on-state resistance  
66  
47  
90  
60  
mW  
|V DS|>2|I D|R DS(on)max  
I D=2.6 A  
,
g fs  
Transconductance  
-
6
-
S
2) Performed on 40mmx40mmx1.5mm epoxy FR4 PCB with 6cm2 (one layer, 70μm thick) copper area for drain  
connectio. PCB is vertical without blown air.  
Rev 2.2  
page 2  
2013-04-03  
BSS606N  
Unit  
Values  
typ.  
Parameter  
Symbol Conditions  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
494  
131  
10.2  
5.6  
2.6  
13  
657 pF  
174  
V GS=0 V, V DS=25 V,  
f =1 MHz  
C oss  
Crss  
t d(on)  
t r  
15.3  
-
-
-
-
ns  
V DD=30 V, V GS=10 V,  
I D=3.2 A, R G,ext=6 W  
t d(off)  
t f  
Turn-off delay time  
Fall time  
2.1  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
1.6  
1.0  
3.7  
3.2  
2.1  
1.4  
5.6  
-
nC  
Q gd  
V DD=48 V, I D=3.2 A,  
V GS=0 to 5 V  
Q g  
V plateau  
Gate plateau voltage  
V
A
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
0.9  
T A=25 °C  
I S,pulse  
12.8  
V GS=0 V, I F=3.2 A,  
T j=25 °C  
V SD  
Diode forward voltage  
-
0.8  
1.1  
V
t rr  
Reverse recovery time  
-
-
22  
11  
-
-
ns  
V R=30 V, I F=3.2 A,  
di F/dt =100 A/µs  
Q rr  
Reverse recovery charge  
nC  
Rev 2.2  
page 3  
2013-04-03  
BSS606N  
1 Power dissipation  
2 Drain current  
P tot=f(T A)  
I D=f(T A); V GS≥10 V  
1.2  
1
3.6  
3.2  
2.8  
2.4  
2
0.8  
0.6  
0.4  
0.2  
0
1.6  
1.2  
0.8  
0.4  
0
0
40  
80  
120  
160  
0
20  
40  
60  
80 100 120 140 160  
TA [°C]  
TA [°C]  
3 Safe operating area  
I D=f(V DS); T A=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
Z thJA=f(t p)  
parameter: D =t p/T  
102  
103  
1 µs  
10 µs  
101  
102  
0.5  
100 µs  
1 ms  
0.2  
0.1  
10 ms  
100  
101  
0.05  
DC  
0.02  
0.01  
10-1  
100  
single pulse  
10-2  
10-1  
10-1  
100  
101  
102  
10-5 10-4 10-3 10-2 10-1 100 101 102 103  
VDS [V]  
tp [s]  
Rev 2.2  
page 4  
2013-04-03  
BSS606N  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
R DS(on)=f(I D); T j=25 °C  
parameter: V GS  
parameter: V GS  
10  
150  
3 V  
4 V  
10 V  
9
3.3 V  
4.5 V  
3.5 V  
8
7
6
5
4
3
2
1
0
100  
4 V  
3.5 V  
3.3 V  
4.5 V  
10 V  
50  
3 V  
2.8 V  
0
0
2
4
6
8
0
2
4
6
8
10  
VDS [V]  
ID [A]  
7 Typ. transfer characteristics  
8 Typ. forward transconductance  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
g fs=f(I D); T j=25 °C  
10  
9
12  
10  
8
8
7
6
5
6
4
4
3
150 °C  
25 °C  
2
1
0
2
0
0
1
2
3
4
5
0
2
4
6
8
10  
VGS [V]  
ID [A]  
Rev 2.2  
page 5  
2013-04-03  
BSS606N  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
V GS(th)=f(T j); V DS=VGS; I D=15 µA  
parameter: I D  
R DS(on)=f(T j); I D=3.2 A; V GS=10 V  
120  
100  
80  
2.8  
2.4  
2
max  
typ  
1.6  
max  
60  
min  
1.2  
typ  
40  
0.8  
0.4  
0
20  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Tj [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz; Tj=25°C  
)
parameter: T j  
103  
101  
Ciss  
100  
10-1  
10-2  
25 °C  
150 °C  
Coss  
102  
150 °C, 98%  
25 °C, 98%  
Crss  
101  
10-3  
0
0
10  
20  
30  
0.4  
0.8  
1.2  
1.6  
VDS [V]  
VSD [V]  
Rev 2.2  
page 6  
2013-04-03  
BSS606N  
13 Avalanche characteristics  
14 Typ. gate charge  
V GS=f(Q gate); I D=3.2 A pulsed  
parameter: V DD  
I AS=f(t AV); R GS=25 W  
parameter: T j(start)  
101  
7
6
5
4
3
2
1
0
25 °C  
30 V  
48 V  
100  
12 V  
100 °C  
125 °C  
10-1  
10-2  
100  
101  
102  
103  
0
1
2
3
4
5
Qgate [nC]  
tAV [µs]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V BR(DSS)=f(T j); I D=250 µA  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
V GS  
Qg  
V gs(th)  
Qg(th)  
Qsw  
Qgd  
Qgate  
Qgs  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Rev 2.2  
page 7  
2013-04-03  
BSS606N  
SOT-89  
Package Outline:  
Footprint:  
Packaging:  
Dimensions in mm  
Rev 2.2  
page 8  
2013-04-03  
BSS606N  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev 2.2  
page 9  
2013-04-03  

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