BSS806NE [INFINEON]

Infineon technologies offers automotive and industrial manufacturers a broad portfolio of N- and P-Channel Small Signal MOSFETs that meet and exceed the highest quality requirements in well-known industry standard packages. With unmatched levels of reliability and manufacturing capacity these components are ideally suited for a wide variety of applications including LED Lighting, ADAS, body control units, SMPS and motor control.;
BSS806NE
型号: BSS806NE
厂家: Infineon    Infineon
描述:

Infineon technologies offers automotive and industrial manufacturers a broad portfolio of N- and P-Channel Small Signal MOSFETs that meet and exceed the highest quality requirements in well-known industry standard packages. With unmatched levels of reliability and manufacturing capacity these components are ideally suited for a wide variety of applications including LED Lighting, ADAS, body control units, SMPS and motor control.

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BSS806NE  
OptiMOS2 Small-Signal-Transistor  
Features  
Product Summary  
VDS  
20  
57  
82  
2.3  
V
• N-channel  
RDS(on),max  
VGS=2.5 V  
VGS=1.8 V  
mW  
• Enhancement mode  
• Ultra Logic level (1.8V rated)  
ID  
A
• ESD protected  
• Avalanche rated  
• Qualified according to AEC Q101  
• 100% lead-free; RoHS compliant  
• Halogen-free according to IEC61249-2-21  
PG-SOT23  
3
1
2
Type  
Package  
SOT23  
Tape and Reel  
Marking  
YIs  
Halogen Free  
Yes  
Packing  
Non dry  
BSS806NE  
H6327: 3000 pcs/ reel  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
T A=25 °C  
T A=70 °C  
T A=25 °C  
Continuous drain current  
2.3  
1.9  
9.3  
A
I D,pulse  
Pulsed drain current  
E AS  
I D=2.3 A, R GS=25 W  
Avalanche energy, single pulse  
10.8  
6
mJ  
I D=2.3 A, V DS=16 V,  
di /dt =200 A/µs,  
T j,max=150 °C  
Reverse diode dv /dt  
dv /dt  
kV/µs  
V GS  
Gate source voltage  
±8  
0.5  
V
Power dissipation1)  
P tot  
T A=25 °C  
W
°C  
T j, T stg  
Operating and storage temperature  
ESD Class  
-55 ... 150  
1C(1kV to 2kV)  
260 °C  
JESD22-A114 -HBM  
Soldering Temperature  
IEC climatic category; DIN IEC 68-1  
55/150/56  
Rev 2.01  
page 1  
2014-01-16  
BSS806NE  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
junction - ambient  
minimal footprint 1)  
R thJA  
-
-
250 K/W  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS= 0 V, I D= 250 µA  
V GS(th) V DS=VGS , I D=11 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
20  
0.3  
-
-
0.55  
-
-
0.75  
1
V
V DS=20 V, V GS=0 V,  
I DSS  
Drain-source leakage current  
mA  
T j=25 °C  
V DS=20 V, V GS=0 V,  
T j=150 °C  
-
-
100  
I GSS  
V GS=8 V, V DS=0 V  
Gate-source leakage current  
-
-
-
-
6
µA  
R DS(on) V GS=1.8 V, I D=1.3 A  
V GS=2.5 V, I D=2.3 A  
Drain-source on-state resistance  
57  
41  
82  
57  
mW  
|V DS|>2|I D|R DS(on)max  
I D=1.9 A  
,
g fs  
Transconductance  
9
-
S
1) Performed on 40mm2 FR4 PCB. The traces are 1mm wide, 70μm thick and 20mm long; they are present on both  
sides of the PCB.  
Rev 2.01  
page 2  
2014-01-16  
BSS806NE  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
370  
118  
20  
529 pF  
169  
V GS=0 V, V DS=10 V,  
f =1 MHz  
C oss  
Crss  
t d(on)  
t r  
29  
7.5  
9.9  
12.0  
3.7  
-
-
-
-
ns  
V DD=10 V, V GS=2.5 V,  
I D=2.3A, R G,ext=6 W  
t d(off)  
t f  
Turn-off delay time  
Fall time  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
0.55  
0.58  
1.7  
-
-
-
-
nC  
Q gd  
V DD=10 V, I D=2.3 A,  
V GS=0 to 2.5 V  
Q g  
V plateau  
Gate plateau voltage  
1.5  
V
A
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
0.5  
9.3  
T A=25 °C  
I S,pulse  
V GS=0 V, I F=2.3 A,  
T j=25 °C  
V SD  
Diode forward voltage  
-
0.82  
1.1  
V
t rr  
Reverse recovery time  
-
-
11  
-
-
ns  
V R=10 V, I F=2.3 A,  
di F/dt =100 A/µs  
Q rr  
Reverse recovery charge  
3.3  
nC  
Rev 2.01  
page 3  
2014-01-16  
BSS806NE  
1 Power dissipation  
2 Drain current  
P tot=f(T A)  
I D=f(T A); V GS≥2.5 V  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
0.5  
0.375  
0.25  
0.125  
0
0
40  
80  
120  
160  
0
20  
40  
60  
80 100 120 140 160  
TA [°C]  
TA [°C]  
3 Safe operating area  
I D=f(V DS); T A=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
Z thJA=f(t p)  
parameter: D =t p/T  
102  
103  
101  
10 µs  
0.5  
102  
100 µs  
1 ms  
0.2  
10 ms  
0.1  
100  
0.05  
101  
0.02  
10-1  
10-2  
10-3  
0.01  
DC  
single pulse  
100  
10-1  
10-1  
100  
101  
102  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
VDS [V]  
tp [s]  
Rev 2.01  
page 4  
2014-01-16  
BSS806NE  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
R DS(on)=f(I D); T j=25 °C  
parameter: V GS  
parameter: V GS  
4
120  
1.3 V  
2.5 V  
1.8 V  
1.4 V  
1.6 V  
1.5 V  
100  
1.6 V  
3
2
1
0
80  
60  
40  
20  
0
1.5 V  
1.8 V  
2 V  
2.5 V  
1.4 V  
1.3 V  
1.2 V  
1.1 V  
0
1
2
3
4
0.0  
0.4  
0.8  
1.2  
1.6  
2.0  
VDS [V]  
ID [A]  
7 Typ. transfer characteristics  
8 Typ. forward transconductance  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
g fs=f(I D); T j=25 °C  
4
3
2
20  
16  
12  
8
25 °C  
150 °C  
1
0
4
0
0.0  
0.5  
1.0  
1.5  
2.0  
0
2
4
6
8
VGS [V]  
ID [A]  
Rev 2.01  
page 5  
2014-01-16  
BSS806NE  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
V GS(th)=f(T j); V DS=VGS; I D=11 µA  
parameter: I D  
R DS(on)=f(T j); I D=2.3 A; V GS=2.5 V  
100  
80  
1.2  
0.8  
98 %  
98 %  
60  
typ  
0.4  
2 %  
typ  
40  
0
20  
0
-0.4  
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Tj [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz; Tj=25°C  
)
parameter: T j  
103  
101  
Ciss  
25 °C  
100  
10-1  
10-2  
150 °C, 98%  
Coss  
102  
150 °C  
25 °C, 98%  
Crss  
101  
10-3  
0
0
5
10  
15  
20  
0.4  
0.8  
1.2  
1.6  
VDS [V]  
VSD [V]  
Rev 2.01  
page 6  
2014-01-16  
BSS806NE  
13 Avalanche characteristics  
14 Typ. gate charge  
V GS=f(Q gate); I D=2.3 A pulsed  
parameter: V DD  
I AS=f(t AV); R GS=25 W  
parameter: T j(start)  
101  
5
4.5  
4
3.5  
100  
25 °C  
10 V  
3
2.5  
2
100 °C  
16 V  
4 V  
125 °C  
10-1  
1.5  
1
100  
101  
102  
103  
0.5  
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0  
tAV [µs]  
Qgate [nC]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V BR(DSS)=f(T j); I D=250 µA  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
V GS  
Qg  
V gs(th)  
Qg(th)  
Qsw  
Qgd  
Qgate  
Qgs  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Rev 2.01  
page 7  
2014-01-16  
BSS806NE  
SOT23  
Package Outline:  
Footprint:  
Packaging:  
Dimensions in mm  
Rev 2.01  
page 8  
2014-01-16  
BSS806NE  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2012 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev 2.01  
page 9  
2014-01-16  

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