ESD110-B1 [INFINEON]

ESD / transient protection according to;
ESD110-B1
型号: ESD110-B1
厂家: Infineon    Infineon
描述:

ESD / transient protection according to

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中文:  中文翻译
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Protection Device  
TVS (Transient Voltage Suppressor)  
ESD110-B1 Series  
Bi-directional, 18.5 V (AC), 0.3 pF, 0201, 0402, RoHS and Halogen Free compliant  
ESD110-B1-02ELS  
ESD110-B1-02EL  
Data Sheet  
Revision 1.4, 2014-10-23  
Final  
Power Management & Multimarket  
Edition 2014-10-23  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2014 Infineon Technologies AG  
All Rights Reserved.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact the nearest  
Infineon Technologies Office (www.infineon.com)  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information on the types in  
question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the express written  
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure  
of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support  
devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may  
be endangered.  
ESD110-B1 Series  
Product Overview  
1
Product Overview  
1.1  
Features  
ESD / transient protection according to:  
IEC61000-4-2 (ESD): ±15 kV (air), ±12 kV (contact)  
IEC61000-4-5 (Surge): ±2 A (tp = 8 / 20 µs)  
Bi-directional, working voltage up to VRWM = ±18.5 V (AC)  
Ultra-low capacitance: CL = 0.3 pF (typical)  
Low clamping voltage: VCL = 28 V (typical) at ITLP = 16 A  
Very low reverse current: IR < 1 nA (typical)  
Pb-free (RoHS compliant) and halogen free package  
1.2  
Application Examples  
ESD Protection of RF signal lines in Near Field Communication (NFC) applications  
1.3  
Product Description  
Pin 1 marking  
(lasered)  
Pin 1  
Pin 2  
Pin 1  
Pin 2  
PinConf_and_SchematicDiag.vsd  
Figure 1-1 Pin Configuration and Schematic Diagram  
Table 1-1 Part Information  
Type  
Package  
Configuration  
Marking code  
ESD110-B1-02ELS  
ESD110-B1-02EL  
TSSLP-2-4  
TSLP-2-20  
1 line, bi-directional  
1 line, bi-directional  
X
XX  
Final Data Sheet  
3
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Maximum Ratings  
2
Maximum Ratings  
Table 2-1 Maximum Ratings at TA = 25 °C, unless otherwise specified1)  
Parameter  
Symbol  
Values  
Unit  
ESD air discharge2)  
VESD  
±15  
±12  
58  
kV  
ESD contact discharge2)  
Peak pulse power3)  
Peak pulse current3)  
Operating temperature  
PPK  
IPP  
W
A
±2  
TOP  
Tstg  
-40 to 125  
-55 to 150  
°C  
°C  
Storage temperature  
1) Device is electrically symmetrical  
2) VESD according to IEC61000-4-2  
3) Non-repetitive current pulse 8/20µs exponential decay waveform according to IEC61000-4-5  
Attention: Stresses above the max. values listed here may cause permanent damage to the device.  
Exposure to absolute maximum rating conditions for extended periods may affect device  
reliability. Maximum ratings are absolute ratings; exceeding only one of these values may  
cause irreversible damage to the integrated circuit.  
3
Electrical Characteristics at TA = 25 °C, unless otherwise specified  
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Figure 3-1 Definitions of electrical characteristics  
Final Data Sheet  
4
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Electrical Characteristics at TA = 25 °C, unless otherwise specified  
Table 3-1 DC Characteristics at TA = 25 °C, unless otherwise specified1)  
Parameter Symbol Values  
Typ.  
Unit  
Note / Test Condition  
Min.  
-18.5  
-15  
20  
20  
Max.  
18.5  
15  
Reverse working voltage VRWM  
V
for AC voltages (NFC)  
for DC voltages  
Trigger voltage  
Holding voltage  
Vt1  
Vh  
V
V
21  
19  
<1  
10  
26  
TA = 25 °C, IT = 0.5 mA  
TA = 125 °C, IT = 0.5 mA  
TA = 25 °C, VR = 18.5 V  
TA = 125 °C, VR = 18.5 V  
Reverse leakage current IR  
30  
nA  
1) Device is electrically symmetrical  
Table 3-2 AC Characteristics at TA = 25 °C, unless otherwise specified  
Parameter  
Symbol  
Values  
Typ.  
Unit  
pF  
Note / Test Condition  
Min.  
0.15  
0.15  
Max.  
0.5  
0.5  
Line capacitance  
Serie inductance  
CL  
0.3  
0.3  
0.2  
0.4  
VR = 0 V, f = 1 MHz  
VR = 0 V, f = 1 GHz  
ESD110-B1-02ELS  
ESD110-B1-02EL  
LS  
nH  
Table 3-3 ESD and Surge Characteristics at TA = 25 °C, unless otherwise specified1)  
Parameter  
Symbol  
Values  
Typ.  
Unit  
Note / Test Condition  
Min.  
Max.  
35  
44  
24  
29  
Clamping voltage2)  
Clamping voltage3)  
Dynamic resistance2)  
VCL  
30  
39  
19  
24  
0.6  
V
I
I
I
I
TLP = 16 A, tp = 100 ns  
TLP = 30 A, tp = 100 ns  
PP = 1 A, tp = 8/20 μs  
PP = 2 A, tp = 8/20 μs  
VCL  
RDYN  
Ω
tp = 100 ns  
1) Device is electrically symmetrical  
2) Please refer to Application Note AN210[1]. TLP parameter: Z0 = 50 Ω , tp = 100ns, tr = 300ps  
3) Non-repetitive current pulse 8/20µs exponential decay waveform according to IEC61000-4-5  
Final Data Sheet  
5
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Typical Characteristics Diagrams  
4
Typical Characteristics Diagrams  
Typical characteristics diagrams at TA=25°C, unless otherwise specified  
-3  
10  
-4  
10  
-5  
10  
-6  
10  
-7  
10  
-8  
10  
-9  
10  
-10  
10  
-11  
10  
-12  
10  
0
5
10  
15  
20  
V [V]  
R
Figure 4-1 Reverse leakage current: IR = f(VR)  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
1 MHz  
1 GHz  
0
2
4
6
8
10  
12  
14  
16  
18  
20  
V [V]  
R
Figure 4-2 Line capacitance: CL = f(VR)  
Final Data Sheet  
6
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Typical Characteristics Diagrams  
160  
140  
120  
100  
80  
Scope: 6 GHz, 20 GS/s  
V
= 142 V  
= 26 V  
CL-max-peak  
V
60  
CL-30ns-peak  
40  
20  
0
-20  
-50  
0
50  
100 150 200 250 300 350 400 450  
t [ns]  
p
Figure 4-3 Clamping voltage (ESD): VCL = f(t), 8 kV positiv pulse from pin 1 to pin 2  
20  
Scope: 6 GHz, 20 GS/s  
0
-20  
-40  
-60  
-80  
V
= -144 V  
= -25 V  
CL-max-peak  
-100  
-120  
-140  
-160  
V
CL-30ns-peak  
-50  
0
50  
100 150 200 250 300 350 400 450  
t [ns]  
p
Figure 4-4 Clamping voltage (ESD): VCL = f(t), 8 kV negativ pulse from pin 1 to pin 2  
Final Data Sheet  
7
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Typical Characteristics Diagrams  
200  
175  
150  
125  
100  
75  
Scope: 6 GHz, 20 GS/s  
V
= 187 V  
= 33 V  
CL-max-peak  
V
CL-30ns-peak  
50  
25  
0
-25  
-50  
0
50  
100 150 200 250 300 350 400 450  
t [ns]  
p
Figure 4-5 Clamping voltage (ESD): VCL = f(t), 15 kV positiv pulse from pin 1 to pin 2  
25  
Scope: 6 GHz, 20 GS/s  
0
-25  
-50  
-75  
-100  
-125  
-150  
-175  
-200  
V
= -181 V  
= -31 V  
CL-max-peak  
V
CL-30ns-peak  
-50  
0
50  
100 150 200 250 300 350 400 450  
t [ns]  
p
Figure 4-6 Clamping voltage (ESD): VCL = f(t), 15 kV negativ pulse from pin 1 to pin 2  
Final Data Sheet  
8
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Typical Characteristics Diagrams  
30  
25  
20  
15  
10  
5
15  
12.5  
10  
ESD110-B1 Series  
R
DYN  
R
= 0.6 Ω  
DYN  
7.5  
5
2.5  
0
0
-5  
-2.5  
-5  
-10  
-15  
-20  
-25  
-30  
-7.5  
-10  
-12.5  
-15  
R
= 0.6 Ω  
DYN  
-40 -35 -30 -25 -20 -15 -10 -5  
0
5 10 15 20 25 30 35 40  
V
[V]  
TLP  
Figure 4-7 Clamping voltage (TLP): ITLP = f(VTLP) [1], pin 1 to pin 2  
Final Data Sheet  
9
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Typical Characteristics Diagrams  
2.5  
2
1.5  
1
0.5  
0
-0.5  
-1  
-1.5  
-2  
-2.5  
-30 -25 -20 -15 -10 -5  
0
5
10  
15  
20  
25  
30  
V
[V]  
CL  
Figure 4-8 Clamping voltage(Surge): IPP = f(VCL)  
Final Data Sheet  
10  
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Typical Characteristics Diagrams  
0
-2  
-4  
-6  
-8  
-10  
-12  
-14  
-16  
ESD110-B1-02EL  
ESD110-B1-02ELS  
10  
100  
1000  
f [MHz]  
10000  
Figure 4-9 Insertion loss vs. frequency in a 50 system  
Final Data Sheet  
11  
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Application Information  
5
Application Information  
Mobile phone  
differential antenna  
Interconnection  
top/bottom shell  
“external pads”  
Main PCB / Top shell  
Bottom shell  
RF=13.56MHz  
signalvs . GND<+-18Vp  
+Vsignalvs . -Vsignal <36V!!!  
TX+  
loop+  
TX-  
GND  
RX  
E MI LP filter  
GND  
Antenna  
matching  
loop-  
Caps should be high  
voltage type to be save  
regards the residual  
ESD peak  
Mobile phone  
single ended antenna  
Interconnection  
top/bottom shell  
“external pads”  
Bottom shell  
Main PCB / Top shell  
RF=13.56MHz  
signalvs . GND<+-18Vp  
TX+  
loop  
TX-  
E MI LP filter  
Antenna  
matching  
GND  
RX  
GND  
Caps should be high  
voltage type to be save  
regards the residual  
ESD peak  
ESD18V_application example .vsd  
Figure 5-1 Bi-directional ESD / Transient protection for NFC Frontend [3]  
Final Data Sheet  
12  
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Package Information  
6
Package Information  
6.1  
TSSLP-2-4  
Top view  
Bottom view  
+0ꢀ01  
-0ꢀ02  
0ꢀ31  
0ꢀ0ꢁ  
0ꢀ32  
2
1
1)  
0ꢀ0ꢁ MAXꢀ  
0ꢀ03ꢁ  
0ꢀ26  
Pin 1  
marking  
1) Dimension applies to plated terminals  
TSSLP-2-3, -4-PO V01  
Figure 6-1 TSSLP-2-4: Package outline  
0ꢀ32  
0ꢀ27  
Copper  
Solder mask  
Stencil apertures  
TSSLP-2-3, -4-FP V02  
Figure 6-2 TSSLP-2-4: Footprint  
0ꢀ3ꢁ  
4
Tape type  
Ex Ey  
Punched Tape  
0ꢀ43 0ꢀ73  
Embossed Tape 0ꢀ37 0ꢀ67  
Deliveries can be both tape types (no selection possible)ꢀ  
Specification allows identical processing (pick & place) by usersꢀ  
Pin 1  
Ex  
TSSLP-2-3, -4-TP V03  
marking  
Figure 6-3 TSSLP-2-4: Packing  
Type code  
Pin 1 marking  
TSSLP-2-3, -4-MK V01  
Figure 6-4 TSSLP-2-4: Marking (example) Table 1-1 “Part Information” on Page 3  
Final Data Sheet 13 Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Package Information  
6.2  
TSLP-2-20  
Top view  
Bottom view  
+0ꢀ01  
-0ꢀ02  
0ꢀꢂ1  
0ꢀ0ꢁ  
0ꢀ6  
0ꢀ0ꢁ MAXꢀ  
2
1
1)  
0ꢀ0ꢂꢁ  
0ꢀꢁ  
Pin 1  
marking  
1) Dimension applies to plated terminals  
TSLP-2-19, -20-PO V01  
Figure 6-5 TSLP-2-20: Package overview  
0.6  
0.45  
Copper  
Solder mask  
Stencil apertures  
TSLP-2-19, -20-FP V01  
Figure 6-6 TSLP-2-20: Footprint  
0ꢀ4  
4
Pin 1  
marking  
0ꢀ76  
TSLP-2-19, -20-TP V02  
Figure 6-7 TSLP-2-20: Packing  
Type code  
12  
Pin 1 marking  
TSLP-2-19, -20-MK V01  
Figure 6-8 TSLP-2-20: Marking example Table 1-1 “Part Information” on Page 3  
Final Data Sheet  
14  
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
References  
References  
[1] Infineon AG - Application Note AN210: Effective ESD Protection design at System Level Using VF-TLP  
Characterization Methodology  
[2] Infineon AG - Recommendations for PCB Assembly of Infineon TSLP and TSSLP Packages  
[3] Infineon AG - Application Note AN244: Tailored ESD Protection for the NFC Frontend  
Final Data Sheet  
15  
Revision 1.4, 2014-10-23  
ESD110-B1 Series  
Revision History: Rev. 1.3, 2014-04-08  
Page or Item  
Subjects (major changes since previous revision)  
Revision 1.4, 2014-10-23  
4
Table 2-1) updated  
Trademarks of Infineon Technologies AG  
AURIX™, BlueMoon™, COMNEON™, C166™, CROSSAVE™, CanPAK™, CIPOS™, CoolMOS™, CoolSET™,  
CORECONTROL™, DAVE™, EasyPIM™, EconoBRIDGE™, EconoDUAL™, EconoPACK™, EconoPIM™,  
EiceDRIVER™, EUPEC™, FCOS™, HITFET™, HybridPACK™, ISOFACE™, I²RF™, IsoPACK™, MIPAQ™,  
ModSTACK™, my-d™, NovalithIC™, OmniTune™, OptiMOS™, ORIGA™, PROFET™, PRO-SIL™,  
PRIMARION™, PrimePACK™, RASIC™, ReverSave™, SatRIC™, SIEGET™, SINDRION™, SMARTi™,  
SmartLEWIS™, TEMPFET™, thinQ!™, TriCore™, TRENCHSTOP™, X-GOLD™, XMM™, X-PMU™,  
XPOSYS™.  
Other Trademarks  
Advance Design System™ (ADS) of Agilent Technologies, AMBA™, ARM™, MULTI-ICE™, PRIMECELL™,  
REALVIEW™, THUMB™ of ARM Limited, UK. AUTOSAR™ is licensed by AUTOSAR development partnership.  
Bluetooth™ of Bluetooth SIG Inc. CAT-iq™ of DECT Forum. COLOSSUS™, FirstGPS™ of Trimble Navigation  
Ltd. EMV™ of EMVCo, LLC (Visa Holdings Inc.). EPCOS™ of Epcos AG. FLEXGO™ of Microsoft Corporation.  
FlexRay™ is licensed by FlexRay Consortium. HYPERTERMINAL™ of Hilgraeve Incorporated. IEC™ of  
Commission Electrotechnique Internationale. IrDA™ of Infrared Data Association Corporation. ISO™ of  
INTERNATIONAL ORGANIZATION FOR STANDARDIZATION. MATLAB™ of MathWorks, Inc. MAXIM™ of  
Maxim Integrated Products, Inc. MICROTEC™, NUCLEUS™ of Mentor Graphics Corporation. Mifare™ of NXP.  
MIPI™ of MIPI Alliance, Inc. MIPS™ of MIPS Technologies, Inc., USA. muRata™ of MURATA  
MANUFACTURING CO., MICROWAVE OFFICE™ (MWO) of Applied Wave Research Inc., OmniVision™ of  
OmniVision Technologies, Inc. Openwave™ Openwave Systems Inc. RED HAT™ Red Hat, Inc. RFMD™ RF  
Micro Devices, Inc. SIRIUS™ of Sirius Sattelite Radio Inc. SOLARIS™ of Sun Microsystems, Inc. SPANSION™  
of Spansion LLC Ltd. Symbian™ of Symbian Software Limited. TAIYO YUDEN™ of Taiyo Yuden Co.  
TEAKLITE™ of CEVA, Inc. TEKTRONIX™ of Tektronix Inc. TOKO™ of TOKO KABUSHIKI KAISHA TA. UNIX™  
of X/Open Company Limited. VERILOG™, PALLADIUM™ of Cadence Design Systems, Inc. VLYNQ™ of Texas  
Instruments Incorporated. VXWORKS™, WIND RIVER™ of WIND RIVER SYSTEMS, INC. ZETEX™ of Diodes  
Zetex Limited.  
Last Trademarks Update 2010-06-09  
Final Data Sheet  
16  
Revision 1.4, 2014-10-23  
w w w . i n f i n e o n . c o m  
Published by Infineon Technologies AG  

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