ESD311-U1-02N [INFINEON]

USB V 总线的单向 ESD 保护 /瞬态保护/电涌保护 – IEC61000-4-2 (ESD):±30 kV(空气/接触) – IEC61000-4-4 (ESD):80 A(5/50 µs) – IEC61000-4-5(浪涌):28 A (8/20 μs);
ESD311-U1-02N
型号: ESD311-U1-02N
厂家: Infineon    Infineon
描述:

USB V 总线的单向 ESD 保护 /瞬态保护/电涌保护 – IEC61000-4-2 (ESD):±30 kV(空气/接触) – IEC61000-4-4 (ESD):80 A(5/50 µs) – IEC61000-4-5(浪涌):28 A (8/20 μs)

文件: 总13页 (文件大小:557K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Protection Device  
TVS (Transient Voltage Suppressor)  
ESD311-U1-02N  
Uni-directional, 15 V, 210 pF, 0603, RoHS and Halogen Free compliant  
ESD311-U1-02N  
Data Sheet  
Revision 1.0, 2014-05-28  
Final  
Power Management & Multimarket  
Edition 2014-05-28  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2014 Infineon Technologies AG  
All Rights Reserved.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact the nearest  
Infineon Technologies Office (www.infineon.com)  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information on the types in  
question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the express written  
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure  
of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support  
devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may  
be endangered.  
ESD311-U1-02N  
Product Overview  
1
Product Overview  
1.1  
Features  
ESD / Transient / Surge protection according to:  
IEC61000-4-2 (ESD): ±30 kV (air / contact discharge)  
IEC61000-4-4 (EFT): ±4 kV / ±80 A (5/50 ns)  
IEC61000-4-5 (surge): ±28 A (8/20 μs)  
Uni-directional working voltage up to VRWM = 15 V  
Low capacitance: CL = 210 pF (typical)  
Low clamping voltage VCL = 29 V (typical) at IPP = 28 A  
Low reverse current. IR < 1 nA (typical)  
Small and flat-profile SMD plastic package: 1.6 mm x 0.8 mm x 0.375 mm.  
Pb-free (RoHS compliant) and halogen free package  
1.2  
Application Examples  
Surge protection of USB VBUS lines in mobile devices  
1.3  
Product Description  
Pin 1 marking  
(lasered)  
Pin 1  
Pin 2  
Pin 1  
Pin 2  
PinConf_and_SchematicDiag.vsd  
Figure 1-1 Pin Configuration and Schematic Diagram (in mm)  
Table 1-1 Part Information  
Type  
Package  
Configuration  
Marking code  
ESD311-U1-02N  
TSNP-2-2  
uni-directional  
A
Final Data Sheet  
3
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Maximum Ratings  
2
Maximum Ratings  
Table 2-1 Maximum Ratings at TA = 25 °C, unless otherwise specified  
Parameter  
Symbol  
VESD  
PPK  
Values  
±30  
Unit  
kV  
W
ESD air / contact discharge1)  
Peak pulse power2)  
800  
Peak pulse current2)  
IPP  
28  
A
Operating temperature range  
TOP  
-40 to 125  
-65 to 150  
°C  
°C  
Storage temperature  
Tstg  
1) VESD according to IEC61000-4-2  
2) Non-repetitive current pulse 8/20µs exponential decay waveform according to IEC61000-4-5  
Attention: Stresses above the max. values listed here may cause permanent damage to the device.  
Exposure to absolute maximum rating conditions for extended periods may affect device  
reliability. Maximum ratings are absolute ratings; exceeding only one of these values may  
cause irreversible damage to the integrated circuit.  
3
Electrical Characteristics  
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ꢏꢏꢏ ꢂꢚꢖꢚꢑꢛꢚꢕꢖꢐꢗꢘꢓꢙꢚ  
ꢏꢏꢏ ꢂꢚꢖꢚꢑꢛꢚꢕꢜꢝꢑꢑꢚ ꢘ  
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ꢎꢂꢕꢕꢕꢕꢕꢏꢏꢏꢕꢎꢑꢚꢓ(ꢔꢐꢒ ꢕꢖꢐꢗꢘꢓꢙꢚ  
ꢋꢉꢕꢕꢕꢕꢕꢏꢏꢏꢕꢋꢗꢓ'*! ꢙꢕꢖꢐꢗꢘꢓꢙꢚ  
ꢈꢉꢊꢕꢕꢕꢕꢏꢏꢏꢕꢈꢉꢊꢕꢖꢐꢗꢘꢓꢙꢚ  
 
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ꢊꢊꢕꢕꢕꢕꢕꢕꢕꢏꢏꢏꢕꢊꢚꢓ(ꢕ*ꢝꢗꢛꢚꢕꢜꢝꢑꢑꢚ ꢘ  
ꢈꢉꢊꢕꢕꢕꢕꢕꢕꢏꢏꢏꢕꢈꢉꢊꢕꢜꢝꢑꢑꢚ ꢘ  
ꢊꢊ  
ꢈꢉꢊ  
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Figure 3-1 Definitions of electrical characteristics  
Final Data Sheet  
4
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Electrical Characteristics  
Table 3-1 DC Characteristics at TA = 25 °C, unless otherwise specified  
Parameter Symbol Values  
Typ.  
Unit  
Note / Test Condition  
Min.  
Max.  
15  
Reverse working voltage VRWM  
V
Breakdown voltage  
Reverse current  
VBR  
IR  
16  
17  
<1  
V
IT = 1 mA  
VR = 15V  
100  
nA  
Table 3-2 AC Characteristics at TA = 25 °C, unless otherwise specified  
Parameter  
Symbol  
Values  
Typ.  
210  
Unit  
Note / Test Condition  
Min.  
Max.  
Line capacitance  
CL  
290  
pF  
VR = 0 V, f = 1 MHz  
Table 3-3 ESD and Surge Characteristics at TA = 25 °C, unless otherwise specified  
Parameter  
Symbol  
Values  
Typ.  
Unit  
Note / Test Condition  
Min.  
Max.  
26.5  
28  
Clamping voltage1)  
Clamping voltage2)  
Dynamic resistance1)  
VCL  
22  
V
I
I
I
I
TLP = 16 A, tp = 100 ns  
TLP = 30 A, tp = 100 ns  
PP = 1 A, tp = 8/20 µs  
PP = 28 A, tp = 8/20 µs  
23  
21  
25.5  
35  
29  
RDYN  
0.07  
tp = 100 ns  
1) Please refer to Application Note AN210[1]. TLP parameter: Z0 = 50 Ω , tp = 100 ns, tr = 600 ps.  
2) Non-repetitive current pulse 8/20µs exponential decay waveform according to IEC61000-4-5  
Final Data Sheet  
5
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Typical Characteristics Diagrams  
4
Typical Characteristics Diagrams  
Typical characteristics diagrams at TA = 25°C, unless otherwise specified  
-3  
10  
-4  
10  
-5  
10  
-6  
10  
-7  
10  
-8  
10  
-9  
10  
-10  
10  
-11  
10  
-12  
10  
0
2
4
6
8
10  
12  
14  
16  
V [V]  
R
Figure 4-1 Reverse leakage current: IR = f(VR)  
220  
200  
180  
160  
140  
120  
100  
80  
60  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15  
V [V]  
R
Figure 4-2 Line capacitance: CL = f(VR)  
Final Data Sheet  
6
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Typical Characteristics Diagrams  
75  
50  
25  
0
Scope: 6 GHz, 20 GS/s  
V
V
= 42 V  
= 20 V  
CL-max-peak  
CL-30ns-peak  
-25  
-50  
0
50  
100  
150  
200  
250  
300  
350  
400  
450  
t [ns]  
p
Figure 4-3 Clamping voltage (ESD): VCL = f(t), 8 kV positive pulse from pin 1 to pin 2  
25  
Scope: 6 GHz, 20 GS/s  
0
-25  
-50  
-75  
V
= -31 V  
= -1 V  
CL-max-peak  
V
CL-30ns-peak  
-50  
0
50  
100  
150  
200  
250  
300  
350  
400  
450  
t [ns]  
p
Figure 4-4 Clamping voltage (ESD) VCL = f(t), 8 kV negative pulse from pin 1 to pin 2  
Final Data Sheet  
7
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Typical Characteristics Diagrams  
75  
50  
25  
0
Scope: 6 GHz, 20 GS/s  
V
= 20 V  
CL-max-peak  
V
= -20 V  
CL-30ns-peak  
-25  
-50  
0
50  
100  
150  
200  
250  
300  
350  
400  
450  
t [ns]  
p
Figure 4-5 Clamping voltage (ESD) VCL = f(t), 15 kV positive pulse from pin 1 to pin 2  
25  
Scope: 6 GHz, 20 GS/s  
0
-25  
-50  
-75  
V
= -52 V  
= -1 V  
CL-max-peak  
V
CL-30ns-peak  
-50  
0
50  
100  
150  
200  
250  
300  
350  
400  
450  
t [ns]  
p
Figure 4-6 Clamping voltage (ESD) VCL = f(t), 15 kV negative pulse from pin 1 to pin 2  
Final Data Sheet  
8
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Typical Characteristics Diagrams  
ESD311-U1-02N  
R
DYN  
80  
60  
40  
30  
R
= 0.07 Ω  
DYN  
40  
20  
10  
20  
0
0
-20  
-40  
-60  
-80  
-10  
-20  
-30  
-40  
R
= 0.05 Ω  
DYN  
-30 -25 -20 -15 -10 -5  
0
5
10 15 20 25 30  
V
[V]  
TLP  
Figure 4-7 Clamping voltage (TLP): ITLP = f(VTLP)[1], pin 1 to pin 2  
Final Data Sheet  
9
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Typical Characteristics Diagrams  
40  
30  
20  
10  
0
-10  
-20  
-30  
-40  
-50  
-60  
-15  
-10  
-5  
0
5
10  
[V]  
15  
20  
25  
30  
35  
V
CL  
Figure 4-8 Pulse current (Surge): IPP = f(VCL)[1], pin 1 to pin 2  
Final Data Sheet  
10  
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Package Information  
5
Package Information  
5.1  
TSNP-2-2  
Top view  
Bottom view  
0.4 MAX.  
0.02 MAX.  
0.0ꢀ  
0.0ꢀ  
0.7  
0.8  
A
0.1 A  
0.1ꢀ x 4ꢀ°  
B
Pin 1 marking  
TSNP-2-2-PO V01  
Figure 5-1 TSNP-2-2: Package outline  
0.7  
0.7  
0.7  
0.7  
Copper  
Solder mask  
Stencil apertures  
TSNP-2-2-FP V01  
Figure 5-2 TSNP-2-2: Footprint  
4
0.ꢀ  
Pin 1  
marking  
0.9ꢀ  
TSNP-2-2-TP V01  
Figure 5-3 TSNP-2-2: Packing  
Pin 1 marking  
Date code (M)  
Type code  
TSNP-2-2-MK V01  
Figure 5-4 TSNP-2-2: Marking example, Type code see: Table 1-1 “Part Information” on Page 3  
Final Data Sheet  
11  
Revision 1.0, 2014-05-28  
ESD311-U1-02N  
Revision History: Rev. 0.9.1, 2014-05-20  
Page or Item  
Subjects (major changes since previous revision)  
Revision 1.0, 2014-05-28  
All  
Status change to final  
Trademarks of Infineon Technologies AG  
AURIX™, BlueMoon™, C166™, CanPAK™, CIPOS™, CIPURSE™, COMNEON™, EconoPACK™, CoolMOS™,  
CoolSET™, CORECONTROL™, CROSSAVE™, DAVE™, EasyPIM™, EconoBRIDGE™, EconoDUAL™,  
EconoPIM™, EiceDRIVER™, eupec™, FCOS™, HITFET™, HybridPACK™, I²RF™, ISOFACE™, IsoPACK™,  
MIPAQ™, ModSTACK™, my-d™, NovalithIC™, OmniTune™, OptiMOS™, ORIGA™, PRIMARION™,  
PrimePACK™, PrimeSTACK™, PRO-SIL™, PROFET™, RASIC™, ReverSave™, SatRIC™, SIEGET™,  
SINDRION™, SIPMOS™, SMARTi™, SmartLEWIS™, SOLID FLASH™, TEMPFET™, thinQ!™,  
TRENCHSTOP™, TriCore™, X-GOLD™, X-PMU™, XMM™, XPOSYS™.  
Other Trademarks  
Advance Design System™ (ADS) of Agilent Technologies, AMBA™, ARM™, MULTI-ICE™, KEIL™,  
PRIMECELL™, REALVIEW™, THUMB™, µVision™ of ARM Limited, UK. AUTOSAR™ is licensed by AUTOSAR  
development partnership. Bluetooth™ of Bluetooth SIG Inc. CAT-iq™ of DECT Forum. COLOSSUS™,  
FirstGPS™ of Trimble Navigation Ltd. EMV™ of EMVCo, LLC (Visa Holdings Inc.). EPCOS™ of Epcos AG.  
FLEXGO™ of Microsoft Corporation. FlexRay™ is licensed by FlexRay Consortium. HYPERTERMINAL™ of  
Hilgraeve Incorporated. IEC™ of Commission Electrotechnique Internationale. IrDA™ of Infrared Data  
Association Corporation. ISO™ of INTERNATIONAL ORGANIZATION FOR STANDARDIZATION. MATLAB™ of  
MathWorks, Inc. MAXIM™ of Maxim Integrated Products, Inc. MICROTEC™, NUCLEUS™ of Mentor Graphics  
Corporation. Mifare™ of NXP. MIPI™ of MIPI Alliance, Inc. MIPS™ of MIPS Technologies, Inc., USA. muRata™  
of MURATA MANUFACTURING CO., MICROWAVE OFFICE™ (MWO) of Applied Wave Research Inc.,  
OmniVision™ of OmniVision Technologies, Inc. Openwave™ Openwave Systems Inc. RED HAT™ Red Hat, Inc.  
RFMD™ RF Micro Devices, Inc. SIRIUS™ of Sirius Satellite Radio Inc. SOLARIS™ of Sun Microsystems, Inc.  
SPANSION™ of Spansion LLC Ltd. Symbian™ of Symbian Software Limited. TAIYO YUDEN™ of Taiyo Yuden  
Co. TEAKLITE™ of CEVA, Inc. TEKTRONIX™ of Tektronix Inc. TOKO™ of TOKO KABUSHIKI KAISHA TA.  
UNIX™ of X/Open Company Limited. VERILOG™, PALLADIUM™ of Cadence Design Systems, Inc. VLYNQ™  
of Texas Instruments Incorporated. VXWORKS™, WIND RIVER™ of WIND RIVER SYSTEMS, INC. ZETEX™ of  
Diodes Zetex Limited.  
Last Trademarks Update 2010-10-26  
Final Data Sheet  
2
Revision 1.0, 2014-05-28  
w w w . i n f i n e o n . c o m  
Published by Infineon Technologies AG  

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