IPB160N04S4LH1ATMA1 [INFINEON]

Power Field-Effect Transistor, 160A I(D), 40V, 0.0015ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263,;
IPB160N04S4LH1ATMA1
型号: IPB160N04S4LH1ATMA1
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 160A I(D), 40V, 0.0015ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263,

脉冲 晶体管
文件: 总9页 (文件大小:203K)
中文:  中文翻译
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Data Sheet  
IPB160N04S4L-H1  
OptiMOSTM-T2 Power-Transistor  
Product Summary  
VDS  
RDS(on)  
ID  
40  
1.5  
160  
V
mΩ  
A
Features  
• N-channel Logic Level - Enhancement mode  
PG-TO263-7-3  
• AEC qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green product (RoHS compliant)  
• 100% Avalanche tested  
Type  
Package  
Marking  
IPB160N04S4L-H1  
PG-TO263-7-3  
4N04LH1  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
T C=25°C, VGS=10V1)  
I D  
Continuous drain current  
160  
160  
A
T C=100 °C,  
V
GS=10 V2)  
Pulsed drain current2)  
I D,pulse  
EAS  
I AS  
T C=25 °C  
640  
400  
I D=80 A  
Avalanche energy, single pulse  
Avalanche current, single pulse  
Gate source voltage  
mJ  
A
-
160  
VGS  
Ptot  
-
+20/-16  
167  
V
T C=25 °C  
Power dissipation  
W
°C  
T j, T stg  
-
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-
-
-55 ... +175  
55/175/56  
Rev. 1.0  
page 1  
2013-05-27  
Data Sheet  
Conditions  
IPB160N04S4L-H1  
Values  
Parameter  
Symbol  
Unit  
min.  
typ.  
max.  
Thermal characteristics2)  
R thJC  
Thermal resistance, junction - case  
-
-
-
0.9  
K/W  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS VGS=0 V, I D= 1 mA  
VGS(th) VDS=VGS, I D=110 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
40  
-
-
V
1.2  
1.7  
2.2  
VDS=40 V, VGS=0 V,  
T j=25 °C  
I DSS  
Zero gate voltage drain current  
-
-
0.05  
1
1
µA  
V
DS=18 V, VGS=0 V,  
20  
T j=85 °C2)  
I GSS  
VGS=20 V, VDS=0 V  
Gate-source leakage current  
-
-
-
-
100 nA  
R DS(on) VGS=4.5 V, I D=50 A  
Drain-source on-state resistance  
1.6  
1.2  
2.0  
1.5  
mΩ  
V
GS=10 V, I D=100 A  
Rev. 1.0  
page 2  
2013-05-27  
Data Sheet  
Conditions  
IPB160N04S4L-H1  
Values  
Parameter  
Symbol  
Unit  
min.  
typ.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
11500  
1920  
100  
16  
14950 pF  
2500  
V
GS=0 V, VDS=25 V,  
f =1 MHz  
230  
-
-
-
-
ns  
20  
V
DD=20 V, VGS=10 V,  
I D=160 A, R G=3.5 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
70  
65  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
34  
16  
44  
37  
190  
-
nC  
Q gd  
VDD=32 V, I D=160 A,  
GS=0 to 10 V  
V
Q g  
146  
3.0  
Vplateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
-
-
-
-
160  
640  
T C=25 °C  
I S,pulse  
VGS=0 V, I F=100 A,  
T j=25 °C  
VSD  
Diode forward voltage  
-
0.9  
1.3  
V
Reverse recovery time2)  
t rr  
-
-
60  
80  
-
-
ns  
VR=20 V, I F=50A,  
diF/dt =100 A/µs  
Reverse recovery charge2)  
Q rr  
nC  
1) Current is limited by bondwire; with an R thJC = 0.9 K/W the chip is able to carry 250A at 25°C.  
2) Defined by design. Not subject to production test.  
Rev. 1.0  
page 3  
2013-05-27  
Data Sheet  
IPB160N04S4L-H1  
1 Power dissipation  
2 Drain current  
P
tot = f(T C); VGS 6 V  
I D = f(T C); VGS 6 V  
200  
175  
150  
125  
100  
75  
180  
160  
140  
120  
100  
80  
60  
50  
40  
25  
20  
0
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
TC [°C]  
TC [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
Z thJC = f(t p)  
I D = f(VDS); T C = 25 °C; D = 0  
parameter: t p  
parameter: D =t p/T  
100  
1000  
100  
10  
1 µs  
0.5  
10 µs  
100 µs  
0.1  
10-1  
0.05  
0.01  
1 ms  
10-2  
single pulse  
10-3  
1
0.1  
1
10  
100  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
VDS [V]  
tp [s]  
Rev. 1.0  
page 4  
2013-05-27  
Data Sheet  
IPB160N04S4L-H1  
5 Typ. output characteristics  
I D = f(VDS); T j = 25 °C  
parameter: VGS  
6 Typ. drain-source on-state resistance  
R DS(on) = (I D); T j = 25 °C  
parameter: VGS  
12  
640  
3 V  
4.5 V  
10 V  
3.5 V  
4 V  
10  
8
480  
320  
160  
0
4 V  
6
3.5 V  
4
4.5 V  
2
10 V  
3 V  
0
0
100  
200  
300  
400  
500  
600  
0
1
2
3
4
5
ID [A]  
VDS [V]  
7 Typ. transfer characteristics  
I D = f(VGS); VDS = 6V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R DS(on) = f(T j); I D = 100 A; VGS = 10 V  
640  
480  
320  
160  
0
2.5  
25 °C  
-55 °C  
175 °C  
2
1.5  
1
0.5  
-60  
-20  
20  
60  
100  
140  
180  
1
2
3
4
5
Tj [°C]  
VGS [V]  
Rev. 1.0  
page 5  
2013-05-27  
Data Sheet  
IPB160N04S4L-H1  
9 Typ. gate threshold voltage  
GS(th) = f(T j); VGS = VDS  
10 Typ. capacitances  
V
C = f(VDS); VGS = 0 V; f = 1 MHz  
parameter: I D  
105  
104  
103  
102  
101  
2
1100 µA  
Ciss  
1.5  
110 µA  
Coss  
1
Crss  
0.5  
0
0
5
10  
15  
20  
25  
30  
-60  
-20  
20  
60  
Tj [°C]  
100  
140  
180  
VDS [V]  
11 Typical forward diode characteristicis  
12 Typ. avalanche characteristics  
I AS = f(t AV  
IF = f(VSD)  
)
parameter: T j  
parameter: Tj(start)  
103  
1000  
102  
100  
25 °C  
100 °C  
150 °C  
25 °C  
175 °C  
101  
10  
100  
1
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
10  
100  
1000  
VSD [V]  
tAV [µs]  
Rev. 1.0  
page 6  
2013-05-27  
Data Sheet  
IPB160N04S4L-H1  
13 Typical avalanche energy  
AS = f(T j)  
14 Drain-source breakdown voltage  
E
VBR(DSS) = f(T j); I D = 1 mA  
parameter: I D  
46  
44  
42  
40  
38  
36  
875  
40 A  
750  
625  
500  
80 A  
375  
250  
160 A  
125  
0
-60  
-20  
20  
60  
100  
140  
180  
25  
75  
125  
175  
Tj [°C]  
Tj [°C]  
15 Typ. gate charge  
16 Gate charge waveforms  
V
GS = f(Q gate); I D = 160 A pulsed  
parameter: VDD  
12  
VGS  
10  
8
Qg  
8 V  
32 V  
6
4
Qgate  
2
Qgd  
Qgs  
0
0
20  
40  
60  
80  
100  
120  
Qgate [nC]  
Rev. 1.0  
page 7  
2013-05-27  
Data Sheet  
IPB160N04S4L-H1  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
©
Infineon Technologies AG 2013  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.0  
page 8  
2013-05-27  
Data Sheet  
IPB160N04S4L-H1  
Revision History  
Version  
Date  
Changes  
27.05.2013 Data Sheet  
Revision 1.0  
Rev. 1.0  
page 9  
2013-05-27  

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