IPB80N06S4L07ATMA2 [INFINEON]

Power Field-Effect Transistor, 80A I(D), 60V, 0.0064ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, GREEN, PLASTIC, TO-263, 3 PIN;
IPB80N06S4L07ATMA2
型号: IPB80N06S4L07ATMA2
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 80A I(D), 60V, 0.0064ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, GREEN, PLASTIC, TO-263, 3 PIN

脉冲 晶体管
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IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
OptiMOS®-T2 Power-Transistor  
Product Summary  
VDS  
60  
6.4  
80  
V
R
DS(on),max (SMD version)  
m  
A
I D  
Features  
• N-channel - Enhancement mode  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
• AEC Q101 qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green Product (RoHS compliant)  
• 100% Avalanche tested  
Type  
Package  
Marking  
IPB80N06S4L-07  
IPI80N06S4L-07  
IPP80N06S4L-07  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
4N06L07  
4N06L07  
4N06L07  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
Continuous drain current1)  
I D  
T C=25°C, VGS=10V  
80  
58  
A
T C=100°C, VGS=10V2)  
Pulsed drain current2)  
I D,pulse  
EAS  
T C=25°C  
320  
71  
Avalanche energy, single pulse2)  
Avalanche current, single pulse  
Gate source voltage  
I D=40A  
mJ  
A
I AS  
-
80  
VGS  
-
±16  
79  
V
Ptot  
T C=25°C  
Power dissipation  
W
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-
-
-55 ... +175  
55/175/56  
°C  
Rev. 1.0  
page 1  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics2)  
R thJC  
R thJA  
R thJA  
Thermal resistance, junction - case  
-
-
-
-
-
-
1.9  
62  
K/W  
Thermal resistance, junction -  
ambient, leaded  
SMD version, device on PCB  
minimal footprint  
-
-
-
-
62  
40  
6 cm2 cooling area3)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS  
VGS(th)  
I DSS  
V
V
V
GS=0V, I D= 1mA  
DS=VGS, I D=40µA  
DS=60V, VGS=0V  
Drain-source breakdown voltage  
Gate threshold voltage  
60  
1.2  
-
-
-
2.2  
1
V
1.7  
0.01  
Zero gate voltage drain current  
µA  
V
DS=60V, VGS=0V,  
-
5
100  
T j=125°C2)  
I GSS  
V
V
GS=16V, VDS=0V  
GS=4.5V, I D=40A  
Gate-source leakage current  
-
-
-
100 nA  
R DS(on)  
Drain-source on-state resistance  
7.9  
11.3  
mΩ  
V
GS=4.5V, I D=40A,  
-
-
-
7.6  
5.5  
5.2  
11  
SMD version  
V
GS=10 V, I D=80 A  
6.7  
6.4  
V
GS=10 V, I D=80 A,  
SMD version  
Rev. 1.0  
page 2  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
4370  
980  
45  
10  
3
5680 pF  
1270  
V
GS=0V, VDS=25V,  
f =1MHz  
90  
-
-
-
-
ns  
V
DD=30V, VGS=10V,  
I D=80A, R G=3.5Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
50  
8
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
17  
6
22  
12  
75  
-
nC  
Q gd  
V
V
DD=48V, I D=80A,  
GS=0 to 10V  
Q g  
58  
4.0  
Vplateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
-
-
-
-
80  
T C=25°C  
I S,pulse  
320  
V
GS=0V, I F=80A,  
VSD  
Diode forward voltage  
Reverse recovery time2)  
Reverse recovery charge2)  
0.6  
0.95  
39  
1.3  
V
T j=25°C  
VR=30V, I F=80A,  
diF/dt =100A/µs  
t rr  
-
-
-
ns  
nC  
Q rr  
-
38  
1) Current is limited by bondwire; with an R thJC = 1.9K/W the chip is able to carry 82A at 25°C.  
2) Specified by design. Not subject to production test.  
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.0  
page 3  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
1 Power dissipation  
2 Drain current  
P
tot = f(T C); VGS 6 V  
I D = f(T C); VGS 6 V; SMD  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
100  
80  
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
C [°C]  
T
C [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
thJC = f(t p)  
I D = f(VDS); T C = 25 °C; D = 0; SMD  
parameter: t p  
Z
parameter: D =t p/T  
101  
1000  
100  
10  
1 µs  
0.5  
100  
10 µs  
0.1  
0.05  
10-1  
100 µs  
0.01  
10-2  
single pulse  
1 ms  
10-3  
1
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
0.1  
1
10  
100  
t p [s]  
V
DS [V]  
Rev. 1.0  
page 4  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
5 Typ. output characteristics  
I D = f(VDS); T j = 25 °C; SMD  
parameter: VGS  
6 Typ. drain-source on-state resistance  
DS(on) = f(I D); T j = 25 °C; SMD  
R
parameter: VGS  
320  
5 V  
10 V  
4 V  
4.5 V  
14  
12  
10  
8
6 V  
280  
240  
200  
160  
120  
80  
5 V  
4.5 V  
6 V  
4 V  
6
40  
10 V  
0
4
0
0
1
2
3
4
5
6
80  
160  
240  
320  
V
DS [V]  
I
D [A]  
7 Typ. transfer characteristics  
I D = f(VGS); VDS = 6V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R
DS(on) = f(T j); I D = 80 A; VGS = 10 V; SMD  
320  
280  
240  
200  
160  
120  
80  
10  
9
-55 °C  
25 °C  
8
175 °C  
7
6
5
40  
4
0
3
0
1
2
3
4
5
6
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
GS [V]  
Rev. 1.0  
page 5  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
9 Typ. gate threshold voltage  
GS(th) = f(T j); VGS = VDS  
10 Typ. capacitances  
V
C = f(VDS); VGS = 0 V; f = 1 MHz  
parameter: I D  
2.5  
104  
Ciss  
2
1.5  
1
400 µA  
103  
Coss  
40 µA  
102  
0.5  
Crss  
101  
0
0
5
10  
15  
20  
25  
30  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
DS [V]  
11 Typical forward diode characteristicis  
12 Avalanche characteristics  
A S= f(t AV  
IF = f(VSD)  
I
)
parameter: T j  
parameter: Tj(start)  
103  
100  
25 °C  
100 °C  
102  
10  
1
150 °C  
25 °C  
175 °C  
101  
100  
0.1  
0.1  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1
10  
100  
1000  
V
SD [V]  
t
AV [µs]  
Rev. 1.0  
page 6  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
13 Avalanche energy  
14 Drain-source breakdown voltage  
BR(DSS) = f(T j); I D = 1 mA  
E
AS = f(T j); I D = 40 A  
V
66  
64  
62  
60  
58  
56  
80  
60  
40  
20  
0
-55  
-15  
25  
65  
105  
145  
25  
75  
125  
175  
T j [°C]  
T j [°C]  
15 Typ. gate charge  
GS = f(Q gate); I D = 80 A pulsed  
16 Gate charge waveforms  
V
parameter: VDD  
10  
9
8
7
6
5
4
3
2
1
V GS  
Q g  
12 V  
48 V  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
0
0
20  
40  
60  
Q
gate [nC]  
Rev. 1.0  
page 7  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2009  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.0  
page 8  
2009-03-24  
IPB80N06S4L-07  
IPI80N06S4L-07, IPP80N06S4L-07  
Revision History  
Version  
Date  
Changes  
Revision 1.0  
24.03.2009 Final data sheet  
Rev. 1.0  
page 9  
2009-03-24  

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