IPB80P04P407ATMA1 [INFINEON]

Power Field-Effect Transistor, 80A I(D), 40V, 0.0077ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, GREEN, PLASTIC, TO-263, 3 PIN;
IPB80P04P407ATMA1
型号: IPB80P04P407ATMA1
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 80A I(D), 40V, 0.0077ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, GREEN, PLASTIC, TO-263, 3 PIN

ATM 异步传输模式 脉冲 晶体管
文件: 总9页 (文件大小:225K)
中文:  中文翻译
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IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
OptiMOS®-P2 Power-Transistor  
Product Summary  
V DS  
-40  
7.4  
-80  
V
R DS(on) (SMD Version)  
mW  
A
I D  
Features  
• P-channel - Normal Level - Enhancement mode  
PG-TO263-3-2 PG-TO262-3-1 PG-TO220-3-1  
• AEC qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green package (RoHS compliant)  
• 100% Avalanche tested  
Type  
Package  
Marking  
4P0407  
4P0407  
4P0407  
IPB80P04P4-07  
IPI80P04P4-07  
IPP80P04P4-07  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
T C=25°C,  
V GS=-10V  
Continuous drain current1)  
I D  
-80  
A
T C=100°C,  
V GS=-10V2)  
62  
Pulsed drain current2)  
I D,pulse  
E AS  
I AS  
T C=25°C  
-320  
31  
I D=-40A  
Avalanche energy, single pulse  
Avalanche current, single pulse  
Gate source voltage  
mJ  
A
-
-80  
V GS  
P tot  
-
±20  
V
T C=25 °C  
Power dissipation  
88  
W
°C  
T j, T stg  
-
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-
-
-55 ... +175  
55/175/56  
Rev. 1.0  
page 1  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics2)  
R thJC  
R thJA  
R thJA  
Thermal resistance, junction - case  
-
-
-
-
-
-
1.7  
62  
K/W  
Thermal resistance, junction -  
ambient, leaded  
SMD version, device on PCB  
minimal footprint  
-
-
-
-
62  
40  
6 cm2 cooling area3)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS=0V, I D= -1mA  
V GS(th) V DS=V GS, I D=-150µA  
Drain-source breakdown voltage  
Gate threshold voltage  
-40  
-
-
V
-2.0  
-3.0  
-4.0  
V DS=-32V, V GS=0V,  
T j=25°C  
I DSS  
Zero gate voltage drain current  
-
-
-0.05  
-20  
-1  
µA  
V DS=-32V, V GS=0V,  
T j=125°C2)  
-200  
I GSS  
V GS=-20V, V DS=0V  
Gate-source leakage current  
-
-
-
-100 nA  
R DS(on) V GS=-10V, I D=-80A  
Drain-source on-state resistance  
5.7  
7.7  
7.4  
mW  
V GS=-10V, I D=-80A,  
SMD version  
-
5.4  
Rev. 1.0  
page 2  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
4681  
1520  
45  
6085 pF  
2280  
V GS=0V, V DS=-25V,  
f =1MHz  
91  
25  
-
-
-
-
ns  
V DD=-20V,  
V GS=-10V, I D=-80A,  
R G=3.5W  
15  
t d(off)  
t f  
Turn-off delay time  
Fall time  
34  
41  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
25  
13  
33  
26  
89  
-
nC  
V DD=-32V,  
I D=-80A,  
V GS=0 to -10V  
Q gd  
Q g  
68  
V plateau  
Gate plateau voltage  
-5.4  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
-
-
-
-
-80  
T C=25°C  
I S,pulse  
-320  
V GS=0V, I F=-80A,  
T j=25°C  
V SD  
Diode forward voltage  
-
-1  
-1.3  
V
Reverse recovery time2)  
t rr  
-
-
48  
54  
-
-
ns  
V R=-20V, I F=-50A,  
di F/dt =-100A/µs  
Reverse recovery charge2)  
Q rr  
nC  
1) Current is limited by bondwire; with an R thJC = 1.7K/W the chip is able to carry -88A at 25°C.  
2) Defined by design. Not subject to production test.  
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.0  
page 3  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
1 Power dissipation  
2 Drain current  
P tot = f(T C); V GS ≤ -6V  
I D = f(T C); V GS ≤ -6V; SMD  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T C [°C]  
T C [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
Z thJC = f(t p)  
I D = f(V DS); T C = 25 °C; D = 0; SMD  
parameter: t p  
parameter: D =t p/T  
101  
1000  
1 µs  
100  
0.5  
10 µs  
100  
100 µs  
0.1  
1 ms  
10-1  
0.05  
0.01  
10  
10-2  
single pulse  
1
10-3  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
0.1  
1
10  
100  
t p [s]  
-V DS [V]  
Rev. 1.0  
page 4  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
5 Typ. output characteristics  
I D = f(V DS); T j = 25 °C; SMD  
parameter: V GS  
6 Typ. drain-source on-state resistance  
R DS(on) = (I D); T j = 25 °C; SMD  
parameter: V GS  
30  
320  
-5.5V  
-5V  
-10V  
27  
24  
21  
18  
15  
12  
9
-7V  
240  
160  
80  
-6.5V  
-6V  
-6V  
-6.5V  
-7V  
-5.5V  
-5V  
6
-10V  
3
0
0
0
40  
-I D [A]  
80  
0
1
2
3
4
5
6
-V DS [V]  
7 Typ. transfer characteristics  
I D = f(V GS); V DS = -6V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R DS(on) = f(T j); I D = -80 A; V GS = -10 V; SMD  
320  
240  
160  
80  
9
8
7
6
5
4
175 °C  
25 °C  
-55 °C  
0
2
3
4
5
6
7
8
-60  
-20  
20  
60  
100  
140  
180  
-V GS [V]  
T j [°C]  
Rev. 1.0  
page 5  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
9 Typ. gate threshold voltage  
V GS(th) = f(T j); V GS = V DS  
parameter: I D  
10 Typ. capacitances  
C = f(V DS); V GS = 0 V; f = 1 MHz  
104  
4
3.6  
3.2  
Ciss  
Coss  
103  
102  
101  
-1500µA  
2.8  
-150µA  
2.4  
2
Crss  
1.6  
1.2  
0
5
10  
15  
20  
25  
30  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
-V DS [V]  
11 Typical forward diode characteristicis  
IF = f(VSD  
12 Drain-source breakdown voltage  
)
V BR(DSS) = f(T j); I D = -1 mA  
parameter: T j  
103  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
102  
25 °C  
175 °C  
101  
100  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
-60  
-20  
20  
60  
100  
140  
180  
-V SD [V]  
T j [°C]  
Rev. 1.0  
page 6  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
15 Typ. gate charge  
V GS = f(Q gate); I D = -80 A pulsed  
parameter: V DD  
16 Gate charge waveforms  
12  
10  
8
VGS  
-8V  
Q g  
-32V  
6
4
Qgate  
2
Qgd  
Q gs  
0
0
20  
40  
60  
80  
Q gate [nC]  
Rev. 1.0  
page 7  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2011  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.0  
page 8  
2011-02-14  
IPB80P04P4-07  
IPI80P04P4-07, IPP80P04P4-07  
Revision History  
Version  
Date  
Changes  
0.1  
1.0  
29.01.2010 Initial Target Data Sheet  
10.02.2011 Final Data Sheet  
Rev. 1.0  
page 9  
2011-02-14  

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