IPD122N10N3 G [INFINEON]

英飞凌的 100V OptiMOS™ 功率 MOSFET 可以为高效率、高功率密度的 SMPS 提供卓越的解决方案。与下一代出色技术相比,该系列在 R Ds(on)和 FOM(品质因数)方面均降低了30%。;
IPD122N10N3 G
型号: IPD122N10N3 G
厂家: Infineon    Infineon
描述:

英飞凌的 100V OptiMOS™ 功率 MOSFET 可以为高效率、高功率密度的 SMPS 提供卓越的解决方案。与下一代出色技术相比,该系列在 R Ds(on)和 FOM(品质因数)方面均降低了30%。

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IPD122N10N3 G  
OptiMOSTM3 Power-Transistor  
Product Summary  
Features  
VDS  
100  
12.2  
59  
V
• N-channel, normal level  
RDS(on),max  
ID  
mW  
A
• Excellent gate charge x R DS(on) product (FOM)  
• Very low on-resistance R DS(on)  
• 175 °C operating temperature  
• Pb-free lead plating; RoHS compliant  
• Qualified according to JEDEC1) for target application  
• Ideal for high-frequency switching and synchronous rectification  
• Halogen-free according to IEC61249-2-21  
Type  
IPD122N10N3 G  
Package  
Marking  
PG-TO252-3  
122N10N  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
T C=25 °C2)  
I D  
Continuous drain current  
59  
42  
A
T C=100 °C  
Pulsed drain current2)  
I D,pulse  
EAS  
T C=25 °C  
236  
I D=46 A, R GS=25 W  
Avalanche energy, single pulse  
Gate source voltage  
70  
mJ  
V
VGS  
±20  
Ptot  
T C=25 °C  
Power dissipation  
94  
W
°C  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... 175  
55/175/56  
1)J-STD20 and JESD22  
2) See figure 3  
Rev. 2.3  
page 1  
2014-05-19  
IPD122N10N3 G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Thermal characteristics  
R thJC  
Thermal resistance, junction - case  
Thermal resistance,  
-
-
-
-
-
-
1.6  
75  
50  
K/W  
R thJA  
minimal footprint  
6 cm2 cooling area3)  
junction - ambient  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS VGS=0 V, I D=1 mA  
VGS(th) VDS=VGS, I D=46 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
100  
2
-
-
V
2.7  
3.5  
VDS=100 V, VGS=0 V,  
T j=25 °C  
I DSS  
Zero gate voltage drain current  
-
-
0.1  
10  
1
µA  
VDS=100 V, VGS=0 V,  
T j=125 °C  
100  
I GSS  
VGS=20 V, VDS=0 V  
Gate-source leakage current  
-
-
-
-
1
100 nA  
R DS(on) VGS=10 V, I D=46 A  
VGS=6 V, I D=23 A  
R G  
Drain-source on-state resistance  
10.5  
13.1  
1.1  
12.2  
23.1  
-
mW  
Gate resistance  
W
|VDS|>2|I D|R DS(on)max  
I D=46 A  
,
g fs  
Transconductance  
29  
57  
-
S
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 2.3  
page 2  
2014-05-19  
IPD122N10N3 G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
1880  
330  
14  
14  
8
2500 pF  
VGS=0 V, VDS=50 V,  
f =1 MHz  
C oss  
C rss  
t d(on)  
t r  
439  
-
-
-
-
-
ns  
VDD=50 V, VGS=10 V,  
I D=46 A, R G,ext=1.6 W  
t d(off)  
t f  
Turn-off delay time  
Fall time  
24  
5
Gate Charge Characteristics6)  
Gate to source charge  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
9
5
-
-
nC  
Q gd  
VDD=50 V, I D=46 A,  
VGS=0 to 10 V  
Q sw  
Q g  
9
-
Gate charge total  
26  
4.9  
35  
35  
-
Vplateau  
Q oss  
Gate plateau voltage  
Output charge  
V
VDD=50 V, VGS=0 V  
46  
nC  
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
59  
A
T C=25 °C  
I S,pulse  
236  
VGS=0 V, I F=46 A,  
T j=25 °C  
VSD  
Diode forward voltage  
-
1
1.2  
V
t rr  
Reverse recovery time  
-
-
61  
-
-
ns  
VR=15 V, I F=46 A ,  
diF/dt =100 A/µs  
Q rr  
Reverse recovery charge  
103  
nC  
6) See figure 16 for gate charge parameter definition  
Rev. 2.3  
page 3  
2014-05-19  
IPD122N10N3 G  
1 Power dissipation  
2 Drain current  
Ptot=f(T C)  
I D=f(T C); VGS≥10 V  
100  
80  
60  
40  
20  
0
60  
50  
40  
30  
20  
10  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
TC [°C]  
TC [°C]  
3 Safe operating area  
I D=f(VDS); T C=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
Z thJC=f(t p)  
parameter: D =t p/T  
103  
101  
limited by on-state  
resistance  
1 µs  
10 µs  
102  
101  
100  
100  
0.5  
100 µs  
0.2  
0.1  
0.05  
1 ms  
0.02  
10-1  
0.01  
10 ms  
single pulse  
DC  
10-2  
10-1  
100  
101  
102  
103  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
VDS [V]  
tp [s]  
Rev. 2.3  
page 4  
2014-05-19  
IPD122N10N3 G  
5 Typ. output characteristics  
I D=f(VDS); T j=25 °C  
6 Typ. drain-source on resistance  
R DS(on)=f(I D); T j=25 °C  
parameter: VGS  
parameter: VGS  
200  
25  
180  
10 V  
4.5 V  
160  
20  
5 V  
7.5 V  
140  
6 V  
120  
100  
80  
15  
10  
5
6 V  
7.5 V  
10 V  
5.5 V  
60  
5 V  
40  
4.5 V  
20  
0
0
0
0
1
2
3
4
5
0
20  
40  
60  
80  
100  
VDS [V]  
ID [A]  
7 Typ. transfer characteristics  
I D=f(VGS); |VDS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
100  
80  
60  
40  
20  
100  
80  
60  
40  
20  
0
25 °C  
175 °C  
0
0
2
4
6
8
0
40  
80  
120  
VGS [V]  
ID [A]  
Rev. 2.3  
page 5  
2014-05-19  
IPD122N10N3 G  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
VGS(th)=f(T j); VGS=VDS  
parameter: I D  
R DS(on)=f(T j); I D=46 A; VGS=10 V  
28  
26  
24  
22  
20  
18  
4
3.5  
3
460 µA  
2.5  
46 µA  
16  
98 %  
14  
2
1.5  
1
typ  
12  
10  
8
6
4
0.5  
0
2
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Tj [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(VSD  
C =f(VDS); VGS=0 V; f =1 MHz  
)
parameter: T j  
104  
103  
Ciss  
175 °C, 98%  
103  
102  
101  
102  
25 °C  
Coss  
175 °C  
25 °C, 98%  
101  
Crss  
100  
0
0
20  
40  
60  
80  
0.5  
1
1.5  
2
VDS [V]  
VSD [V]  
Rev. 2.3  
page 6  
2014-05-19  
IPD122N10N3 G  
13 Avalanche characteristics  
14 Typ. gate charge  
VGS=f(Q gate); I D=46 A pulsed  
parameter: VDD  
I AS=f(t AV); R GS=25 W  
parameter: T j(start)  
100  
10  
8
80 V  
50 V  
25 °C  
20 V  
6
4
2
0
100 °C  
10  
150 °C  
1
0.1  
1
10  
100  
1000  
0
10  
20  
30  
tAV [µs]  
Qgate [nC]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
VBR(DSS)=f(T j); I D=1 mA  
110  
105  
100  
95  
V GS  
Qg  
V gs(th)  
Qg(th)  
Qsw  
Qgd  
Qgate  
Qgs  
90  
-60  
-20  
20  
60  
100  
140  
180  
Tj [°C]  
Rev. 2.3  
page 7  
2014-05-19  
IPD122N10N3 G  
PG-TO-252 (D-Pak)  
Rev. 2.3  
page 8  
2014-05-19  
IPD122N10N3 G  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 2.3  
page 9  
2014-05-19  

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