IPI80N04S304AKSA1 [INFINEON]

Power Field-Effect Transistor, 80A I(D), 40V, 0.0042ohm, 1-Element, N-Channel, Silicon, Metal-Oxide Semiconductor FET, TO-262AA, GREEN, TO-262, 3 PIN;
IPI80N04S304AKSA1
型号: IPI80N04S304AKSA1
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 80A I(D), 40V, 0.0042ohm, 1-Element, N-Channel, Silicon, Metal-Oxide Semiconductor FET, TO-262AA, GREEN, TO-262, 3 PIN

脉冲 晶体管
文件: 总9页 (文件大小:191K)
中文:  中文翻译
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IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
OptiMOS®-T Power-Transistor  
Product Summary  
VDS  
40  
3.8  
80  
V
R
DS(on),max (SMD version)  
m  
A
I D  
Features  
• N-channel - Enhancement mode  
• Automotive AEC Q101 qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green package (RoHS compliant)  
• 100% Avalanche tested  
PG-TO263-3-2 PG-TO262-3-1 PG-TO220-3-1  
Type  
Package  
Marking  
3N0404  
3N0404  
3N0404  
IPB80N04S3-04  
IPI80N04S3-04  
IPP80N04S3-04  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
Continuous drain current1)  
I D  
T C=25°C, VGS=10V  
T C=100 °C,  
80  
A
80  
V
GS=10 V2)  
Pulsed drain current2)  
I D,pulse  
EAS  
T C=25 °C  
I D=80 A  
320  
290  
Avalanche energy, single pulse  
Gate source voltage  
mJ  
V
VGS  
±20  
Ptot  
T C=25 °C  
Power dissipation  
136  
W
°C  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... +175  
55/175/56  
Rev. 1.0  
page 1  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics2)  
R thJC  
R thJA  
R thJA  
Thermal resistance, junction - case  
-
-
-
-
1.1  
62  
K/W  
Thermal resistance, junction -  
ambient, leaded  
SMD version, device on PCB  
minimal footprint  
-
-
-
-
62  
40  
6 cm2 cooling area3)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS  
VGS(th)  
V
V
GS=0 V, I D= 1 mA  
DS=VGS, I D=90 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
40  
-
-
V
2.1  
3.0  
4.0  
V
DS=40 V, VGS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-
-
-
1
µA  
T j=25 °C  
V
DS=40 V, VGS=0 V,  
100  
T j=125 °C2)  
I GSS  
V
V
GS=20 V, VDS=0 V  
GS=10 V, I D=80 A  
Gate-source leakage current  
-
-
-
100 nA  
RDS(on)  
Drain-source on-state resistance  
3.5  
4.1  
m  
V
GS=10 V, I D=80 A,  
-
3.2  
3.8  
SMD version  
Rev. 1.0  
page 2  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
4000  
1100  
170  
20  
5200 pF  
1400  
V
GS=0 V, VDS=25 V,  
f =1 MHz  
250  
-
-
-
-
ns  
12  
V
DD=20 V, VGS=10 V,  
I D=80 A, R G=3.5 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
30  
10  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
22  
15  
60  
5.6  
30  
26  
80  
-
nC  
Q gd  
V
V
DD=32 V, I D=80 A,  
GS=0 to 10 V  
Q g  
Vplateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
-
-
-
-
80  
T C=25 °C  
I S,pulse  
320  
V
GS=0 V, I F=80 A,  
VSD  
Diode forward voltage  
Reverse recovery time2)  
Reverse recovery charge2)  
-
-
-
0.95  
35  
1.3  
V
T j=25 °C  
VR=20 V, I F=I S,  
diF/dt =100 A/µs  
t rr  
-
-
ns  
nC  
Q rr  
35  
1) Current is limited by bondwire; with an R thJC = 1.1K/W the chip is able to carry 141A at 25°C. For detailed  
information see Application Note ANPS071E at www.infineon.com/optimos  
2) Defined by design. Not subject to production test.  
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.0  
page 3  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
1 Power dissipation  
2 Drain current  
P
tot = f(T C); VGS 6 V  
I D = f(T C); VGS 6 V  
160  
140  
120  
100  
80  
100  
80  
60  
40  
20  
0
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
C [°C]  
T
C [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
thJC = f(t p)  
I D = f(VDS); T C = 25 °C; D = 0; SMD  
parameter: t p  
Z
parameter: D =t p/T  
101  
1000  
1 µs  
10 µs  
100 µs  
100  
0.5  
100  
1 ms  
0.1  
10-1  
0.05  
0.01  
10  
1
10-2  
single pulse  
10-3  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
0.1  
1
10  
100  
t
p [s]  
V
DS [V]  
Rev. 1.0  
page 4  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
5 Typ. output characteristics  
I D = f(VDS); T j = 25 °C; SMD  
parameter: VGS  
6 Typ. drain-source on-state resistance  
DS(on) = f(I D); T j = 25 °C; SMD  
R
parameter: VGS  
360  
20  
10 V  
5.5 V  
6 V  
18  
16  
14  
12  
10  
8
320  
280  
240  
200  
160  
120  
80  
7 V  
6.5 V  
6 V  
6
6.5 V  
5.5 V  
5 V  
4
7 V  
40  
10 V  
2
0
0
20  
40  
60  
D [A]  
80  
100  
120  
0
2
4
6
8
I
V
DS [V]  
7 Typ. transfer characteristics  
I D = f(VGS); VDS = 6V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R
DS(on) = f(T j); I D = 80 A; VGS = 10 V; SMD  
360  
320  
280  
240  
200  
160  
120  
80  
6
-55 °C  
25 °C  
5
4
3
2
175 °C  
40  
0
2
3
4
5
6
7
8
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
GS [V]  
Rev. 1.0  
page 5  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
9 Typ. gate threshold voltage  
GS(th) = f(T j); VGS = VDS  
10 Typ. capacitances  
V
C = f(VDS); VGS = 0 V; f = 1 MHz  
parameter: I D  
4
104  
3.5  
3
Ciss  
900 µA  
90 µA  
103  
Coss  
2.5  
2
1.5  
Crss  
102  
1
0
5
10  
15  
20  
25  
30  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
DS [V]  
11 Typical forward diode characteristicis  
12 Typ. avalanche characteristics  
A S= f(t AV  
IF = f(VSD)  
I
)
parameter: T j  
parameter: Tj(start)  
103  
100  
25 °C  
150 °C  
100 °C  
102  
10  
25 °C  
175 °C  
101  
100  
1
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
10  
100  
1000  
V
SD [V]  
t AV [µs]  
Rev. 1.0  
page 6  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
13 Typical avalanche energy  
AS = f(T j)  
14 Typ. drain-source breakdown voltage  
BR(DSS) = f(T j); I D = 1 mA  
E
V
parameter: I D  
55  
50  
45  
40  
35  
30  
1400  
1200  
1000  
800  
20 A  
600  
40 A  
80 A  
400  
200  
0
-60  
-20  
20  
60  
100  
140  
180  
25  
75  
125  
175  
T j [°C]  
T j [°C]  
15 Typ. gate charge  
GS = f(Q gate); I D = 80 A pulsed  
16 Gate charge waveforms  
V
parameter: VDD  
12  
V GS  
Q g  
8 V  
32 V  
10  
8
6
V gs(th)  
4
2
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
0
0
25  
50  
75  
Q
gate [nC]  
Rev. 1.0  
page 7  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2007  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein,  
any typical values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including  
without limitation warranties of noninfringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices please  
contact your nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements components may contain dangerous substances. For information  
on the types in question please contact your nearest Infineon Technologies Office.  
Infineon Technologies Components may only be used in life-support devices or systems with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably  
be expected to cause the failure of that life-support device or system, or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be  
implanted in the human body, or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be  
endangered.  
Rev. 1.0  
page 8  
2007-05-03  
IPB80N04S3-04  
IPI80N04S3-04, IPP80N04S3-04  
Revision History  
Version  
Date  
Changes  
Rev. 1.0  
page 9  
2007-05-03  

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