IRF3315STRR [INFINEON]

Power Field-Effect Transistor, 21A I(D), 150V, 0.082ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, POWER, D2PAK-3;
IRF3315STRR
型号: IRF3315STRR
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 21A I(D), 150V, 0.082ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, POWER, D2PAK-3

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PD - 9.1617A  
IRF3315S/L  
PRELIMINARY  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Surface Mount (IRF3315S)  
D
VDSS = 150V  
l Low-profile through-hole (IRF3315L)  
l 175°C Operating Temperature  
l Fast Switching  
R
DS(on) = 0.082Ω  
G
l Fully Avalanche Rated  
ID = 21A  
Description  
S
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedizeddevicedesignthatHEXFETPowerMOSFETs  
arewellknownfor,providesthedesignerwithanextremely  
efficient and reliable device for use in a wide variety of  
applications.  
The D2Pak is a surface mount power package capable of  
accommodating die sizes up to HEX-4. It provides the  
highest power capability and the lowest possible on-  
resistance in any existing surface mount package. The  
D2Pak is suitable for high current applications because of  
its low internal connection resistance and can dissipate  
up to 2.0W in a typical surface mount application.  
The through-hole version (IRF3315L) is available for low-  
profileapplications.  
2
T O -262  
D
Pak  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10Vꢀ  
Continuous Drain Current, VGS @ 10Vꢀ  
Pulsed Drain Current ꢀ  
21  
15  
A
84  
PD @TA = 25°C  
PD @TC = 25°C  
Power Dissipation  
3.8  
94  
W
W
Power Dissipation  
Linear Derating Factor  
0.63  
± 20  
350  
12  
W/°C  
V
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy‚ꢀ  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒꢀ  
Operating Junction and  
9.4  
2.5  
mJ  
V/ns  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
300 (1.6mm from case )  
Thermal Resistance  
Parameter  
Junction-to-Case  
Junction-to-Ambient ( PCB Mounted,steady-state)**  
Typ.  
–––  
–––  
Max.  
1.6  
40  
Units  
RθJC  
RθJA  
°C/W  
11/7/97  
IRF3315S/L  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
150 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.187 ––– V/°C Reference to 25°C, ID = 1mAꢀ  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance ––– ––– 0.082  
V
S
VGS = 10V, ID = 12A „  
VDS = VGS, ID = 250µA  
VDS = 50V, ID = 12Aꢀ  
VDS = 150V, VGS = 0V  
VDS = 120V, VGS = 0V, TJ = 125°C  
VGS = 20V  
Gate Threshold Voltage  
2.0  
17  
––– 4.0  
––– –––  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 95  
––– ––– 11  
––– ––– 47  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -20V  
Qg  
ID = 12A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
nC  
ns  
VDS = 120V  
VGS = 10V, See Fig. 6 and 13 „ꢀ  
VDD = 75V  
–––  
–––  
–––  
–––  
9.6 –––  
32 –––  
49 –––  
38 –––  
RiseTime  
ID = 12A  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
RG = 5.1Ω  
RD = 5.9Ω, See Fig. 10 „ꢀ  
Between lead,  
LS  
Internal Source Inductance  
nH  
pF  
–––  
–––  
7.5  
and center of die contact  
VGS = 0V  
Ciss  
Coss  
Crss  
Input Capacitance  
––– 1300 –––  
––– 300 –––  
––– 160 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
D
IS  
MOSFETsymbol  
showing the  
21  
84  
––– –––  
––– –––  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
p-n junction diode.  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 174 260  
––– 1.2 1.7  
V
TJ = 25°C, IS = 43A, VGS = 0V „  
TJ = 25°C, IF = 43A  
ns  
µC  
Qrr  
ton  
di/dt = 100A/µs „ꢀ  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
„ Pulse width 300µs; duty cycle 2%.  
Uses IRF3315 data and test conditions  
max. junction temperature. ( See fig. 11 )  
‚ VDD = 25V, starting TJ = 25°C, L = 4.9 mH  
RG = 25, IAS = 12A. (See Figure 12)  
ƒ I 12A, di/dt 140A/µs, VDD V(BR)DSS  
,
SD  
TJ 175°C  
** When mounted on 1" square PCB ( FR-4 or G-10 Material ).  
For recommended footprint and soldering techniques refer to application note #AN-994.  
IRF3315S/L  
100  
10  
1
100  
10  
1
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
VGS  
15V  
TOP  
TOP  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
4.5V  
4.5V  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
°
°
T = 25 C  
J
T = 175 C  
J
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
100  
10  
1
21A  
=
I
D
°
T = 25 C  
J
°
T = 175 C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
4
5
6
7
8
9
10  
T , Junction Temperature( C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 4. Normalized On-Resistance  
Fig 3. Typical Transfer Characteristics  
Vs. Temperature  
IRF3315S/L  
20  
16  
12  
8
3000  
I
D
= 12  
A
V
= 0V,  
f = 1MHz  
C SHORTED  
ds  
GS  
V
V
V
= 120V  
= 75V  
= 30V  
DS  
DS  
DS  
C
= C + C  
iss  
gs  
gd ,  
C
= C  
rss  
gd  
2500  
2000  
1500  
1000  
500  
C
= C + C  
gd  
oss  
ds  
C
iss  
C
oss  
C
rss  
4
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
0
1
10  
100  
0
20  
40  
60  
80  
100  
V
, Drain-to-Source Voltage (V)  
Q
, Total Gate Charge (nC)  
DS  
G
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
1000  
100  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
°
T = 25 C  
J
100  
10  
1
10  
10us  
°
T = 175 C  
J
100us  
1ms  
1
°
T = 25 C  
C
°
T = 175 C  
Single Pulse  
J
10ms  
V
= 0 V  
GS  
0.1  
0.2  
0.5  
0.8  
1.1  
1.4  
1
10  
100  
1000  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
IRF3315S/L  
RD  
25  
20  
15  
10  
5
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
0
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
T
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
10  
1
D = 0.50  
0.20  
0.10  
0.05  
0.02  
P
DM  
0.1  
t
1
t
2
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
Notes:  
1. Duty factor D = t / t  
1
2
2. Peak T =P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig11. MaximumEffectiveTransientThermalImpedance,Junction-to-Case  
IRF3315S/L  
1000  
800  
600  
400  
200  
0
I
D
15V  
TOP  
4.9A  
8.5A  
BOTTOM 12A  
D RIVER  
L
V
D S  
D.U .T  
R
+
G
V
D D  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR )D SS  
t
25  
50  
75  
100  
125  
150  
175  
p
°
Starting T , Junction Temperature ( C)  
J
Fig 12c. Maximum Avalanche Energy  
Vs. DrainCurrent  
I
AS  
Fig12b. UnclampedInductiveWaveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
10 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Current Sampling Resistors  
Charge  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
IRF3315S/L  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig14.ForN-ChannelHEXFETS  
IRF3315S/L  
D2Pak Package Outline  
10.54 (.415)  
10.29 (.405)  
10.16 (.400)  
REF.  
- B -  
4.69 (.185)  
4.20 (.165)  
1.40 (.055)  
- A -  
1.32 (.052)  
1.22 (.048)  
M AX.  
2
6.47 (.255)  
6.18 (.243)  
1.78 (.070)  
1.27 (.050)  
15.49 (.610)  
14.73 (.580)  
2.79 (.110)  
2.29 (.090)  
1
3
2.61 (.103)  
2.32 (.091)  
5.28 (.208)  
4.78 (.188)  
8.89 (.350)  
REF.  
1.40 (.055)  
1.14 (.045)  
1.39 (.055)  
1.14 (.045)  
3X  
0.55 (.022)  
0.46 (.018)  
0.93 (.037)  
0.69 (.027)  
3X  
5.08 (.200)  
0.25 (.010)  
M
B A M  
MINIMUM RECOMMEND ED FOOTPRINT  
11.43 (.450)  
8.89 (.350)  
LE AD ASSIGNM ENTS  
1 - GATE  
NO TES:  
1
2
3
4
DIM ENS IONS AFTER SOLDER DIP.  
17.78 (.700)  
2 - DRAIN  
DIM ENS IONIN G & TOLERANCING PER ANSI Y14.5M , 1982.  
CONTROLLIN G DIMENSION : INCH.  
3 - SOURCE  
HEATSINK & LEAD DIM ENSIONS DO NOT INCLUD E BURRS.  
3.81 (.150)  
2.54 (.100)  
2.08 (.082)  
2X  
2X  
Part Marking Information  
D2Pak  
A
INTERNATIO NAL  
RECTIFIER  
LOGO  
PART NUMB ER  
F530S  
9246  
1M  
DATE CODE  
(YYW W )  
9B  
A SSEM BLY  
YY  
=
YEAR  
= W EEK  
LOT  
CODE  
W W  
IRF3315S/L  
Package Outline  
TO-262 Outline  
Part Marking Information  
TO-262  
IRF3315S/L  
Tape & Reel Information  
D2Pak  
TRR  
1.60 (.063)  
1.50 (.059)  
1.60 (.063)  
1.50 (.059)  
4.10 (.161)  
3.90 (.153)  
0.368 (.0145)  
0.342 (.0135)  
FEED DIRECTION  
1.85 (.073)  
11.60 (.457)  
11.40 (.449)  
1.65 (.065)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
TRL  
1.75 (.069 )  
1.25 (.049 )  
10.90 (.429)  
10.70 (.421)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED DIRECTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
MAX.  
60.00 (2.362)  
M IN .  
30.40 (1.197)  
M AX.  
N O TES  
:
1. C O M FO RM S TO EIA-418.  
2. C O N TR O LLIN G D IM EN SIO N : M ILLIM ETER .  
3. D IM ENSIO N M EASUR ED  
4. IN CLU D ES FLAN G E D ISTO R TIO N  
26.40 (1.039)  
24.40 (.961)  
4
@ HU B.  
3
@
O U TER ED G E.  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
11/97  

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