IRF9Z24N [INFINEON]

Power MOSFET(Vdss=-55V, Rds(on)=0.175ohm, Id=-12A); 功率MOSFET ( VDSS = -55V , RDS(ON) = 0.175ohm ,ID = -12A )
IRF9Z24N
型号: IRF9Z24N
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss=-55V, Rds(on)=0.175ohm, Id=-12A)
功率MOSFET ( VDSS = -55V , RDS(ON) = 0.175ohm ,ID = -12A )

文件: 总8页 (文件大小:110K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD -9.1484B  
IRF9Z24N  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Dynamic dv/dt Rating  
l 175°C Operating Temperature  
l Fast Switching  
D
VDSS = -55V  
RDS(on) = 0.175Ω  
l P-Channel  
G
l Fully Avalanche Rated  
ID = -12A  
S
Description  
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedized device design that HEXFET Power  
MOSFETs are well known for, provides the designer  
with an extremely efficient and reliable device for use  
in a wide variety of applications.  
The TO-220 package is universally preferred for all  
commercial-industrialapplicationsatpowerdissipation  
levels to approximately 50 watts. The low thermal  
resistance and low package cost of the TO-220  
contribute to its wide acceptance throughout the  
industry.  
TO-220AB  
Absolute Maximum Ratings  
Parameter  
Max.  
-12  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ -10V  
Continuous Drain Current, VGS @ -10V  
Pulsed Drain Current   
-8.5  
A
-48  
PD @TC = 25°C  
Power Dissipation  
45  
W
W/°C  
V
Linear Derating Factor  
0.30  
± 20  
96  
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy‚  
Avalanche Current  
mJ  
A
-7.2  
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
4.5  
mJ  
V/ns  
-5.0  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 screw  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
Units  
RθJC  
RθCS  
RθJA  
3.3  
–––  
62  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.50  
–––  
°C/W  
8/27/97  
IRF9Z24N  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
-55 ––– –––  
Conditions  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
VGS = 0V, ID = -250µA  
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– -0.05 ––– V/°C Reference to 25°C, ID = -1mA  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance ––– ––– 0.175  
V
S
VGS = -10V, ID = -7.2A „  
VDS = VGS, ID = -250µA  
VDS = -25V, ID = -7.2A  
VDS = -55V, VGS = 0V  
VDS = -44V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Gate Threshold Voltage  
-2.0 ––– -4.0  
2.5 ––– –––  
Forward Transconductance  
––– ––– -25  
––– ––– -250  
––– ––– 100  
––– ––– -100  
––– ––– 19  
––– ––– 5.1  
––– ––– 10  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -20V  
Qg  
ID = -7.2A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = -44V  
VGS = -10V, See Fig. 6 and 13 „  
–––  
–––  
–––  
–––  
13 –––  
55 –––  
23 –––  
37 –––  
VDD = -28V  
ID = -7.2A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 24Ω  
RD = 3.7Ω, See Fig. 10 „  
Between lead,  
6mm (0.25in.)  
from package  
D
4.5  
7.5  
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
–––  
–––  
–––  
–––  
nH  
pF  
G
and center of die contact  
VGS = 0V  
S
Ciss  
Coss  
Crss  
Input Capacitance  
––– 350 –––  
––– 170 –––  
Output Capacitance  
VDS = -25V  
Reverse Transfer Capacitance  
–––  
92 –––  
ƒ = 1.0MHz, See Fig. 5  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
showing the  
D
IS  
-12  
––– –––  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
––– ––– -48  
––– ––– -1.6  
p-n junction diode.  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
V
TJ = 25°C, IS = -7.2A, VGS = 0V „  
––– 47  
––– 84 130  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
71  
ns  
TJ = 25°C, IF = -7.2A  
Qrr  
ton  
µC di/dt = -100A/µs „  
Notes:  
 Repetitive rating; pulse width limited by  
ƒ ISD -7.2A, di/dt -280A/µs, VDD V(BR)DSS  
TJ 175°C  
,
max. junction temperature. ( See fig. 11 )  
‚ Starting TJ = 25°C, L = 3.7mH  
„ Pulse width 300µs; duty cycle 2%.  
RG = 25, IAS = -7.2A. (See Figure 12)  
IRF9Z24N  
1 0 0  
1 0  
1
100  
10  
1
VGS  
- 15V  
- 10V  
- 8.0V  
- 7.0V  
- 6.0V  
- 5.5V  
- 5.0V  
VGS  
- 15V  
- 10V  
- 8.0V  
- 7.0V  
- 6.0V  
- 5.5V  
- 5.0V  
20µs PULS E W IDTH  
= 25°C  
TOP  
TOP  
T
Jc  
BOTT OM - 4. 5V  
BOTT OM - 4. 5V  
20µs PULSE W IDTH  
-4.5V  
-4.5V  
T
= 175°C  
J
C
A
A
0. 1  
1
1 0  
1 0 0  
0.1  
1
10  
100  
-V  
, Drain-to-Source Voltage (V)  
-V  
, Drain-to-Source Voltage (V)  
D S  
D S  
Fig 1. Typical Output Characteristics,  
Fig 2. Typical Output Characteristics,  
2. 0  
1. 5  
1. 0  
0. 5  
0. 0  
1 0 0  
I
= -12A  
D
T
J
= 25°C  
T
= 175°C  
1 0  
J
V
= -2 5V  
DS  
V
= -10V  
GS  
20µs P ULS E W IDTH  
1
A
1 0 A  
- 6 0 - 4 0 - 2 0  
0
2 0  
4 0  
6 0  
8 0 1 0 0 1 2 0 1 4 0 1 6 0 1 8 0  
4
5
6
7
8
9
TJ , Junction Temperature (°C)  
-VG S , Ga te-to-So urce Voltage (V)  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
IRF9Z24N  
20  
16  
12  
8
700  
I
= -7.2A  
D
V
C
C
C
= 0V ,  
f = 1MH z  
GS  
iss  
= C  
= C  
= C  
+ C  
+ C  
,
C
ds  
SHORTED  
gs  
g d  
ds  
g d  
V
V
= -44V  
= -28V  
600  
500  
400  
300  
200  
100  
0
rss  
oss  
DS  
DS  
gd  
C
C
is s  
o s s  
C
rs s  
4
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
A
A
0
5
10  
15  
20  
25  
1
10  
100  
VD S , Drain-to-Source Voltage (V)  
Q G , Total Gate Charge (nC)  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1 0 0  
1 0  
1
100  
10  
1
OPERATION IN THIS AREA LIM ITED  
BY R  
D S(o n)  
1 0µs  
T
= 150°C  
J
T
= 25°C  
J
100µs  
1m s  
T
T
= 25°C  
= 175°C  
Single Pulse  
C
J
V
= 0V  
GS  
10m s  
0. 1  
A
A
0. 4  
0. 6  
0. 8  
1. 0  
1. 2  
1. 4  
1. 6  
1. 8  
1
10  
100  
-V  
, Drain-to-Source Voltage (V)  
-VSD , Source-to-Drain Voltage (V)  
DS  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
IRF9Z24N  
1 2  
RD  
VDS  
VGS  
D.U.T.  
9
RG  
-
+
VDD  
-10V  
6
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
3
t
t
r
t
t
f
d(on)  
d(off)  
V
GS  
10%  
0
A
1 7 5  
2 5  
5 0  
7 5  
1 0 0  
1 2 5  
1 5 0  
TC , Case Temperature (°C)  
90%  
Fig 9. Maximum Drain Current Vs.  
V
DS  
Case Temperature  
Fig 10b. Switching Time Waveforms  
1 0  
D
=
0 .5 0  
0 .2 0  
1
0 .1 0  
0 .0 5  
P
0 .0 2  
0 .0 1  
DM  
0. 1  
t
S IN G LE P U L S E  
(T H E R M A L R E S P O N S E )  
1
t
2
Notes:  
1. D uty factor D  
=
t
/ t  
1
2
2. Pea k T = P  
x Z  
+ T  
C
DM  
J
th JC  
A
0 . 0 1  
0 . 0 0 0 0 1  
0 . 0 0 0 1  
0 . 0 0 1  
0 . 0 1  
0. 1  
1
t1 , Rectan gular Pulse Duratio n (sec)  
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
IRF9Z24N  
250  
200  
150  
100  
50  
L
V
I
D
-2.9A  
-5.1A  
D S  
TOP  
R
D .U .T  
AS  
B OTTOM -7.2A  
G
V
D D  
A
I
D R IVER  
-20V  
0 .0 1  
t
p
15V  
Fig 12a. Unclamped Inductive Test Circuit  
0
A
175  
25  
50  
75  
100  
125  
150  
I
AS  
Starting TJ , Junction Temperature (°C)  
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
t
p
V
(BR)DSS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
Q
G
.2µF  
12V  
.3µF  
-10V  
-
V
+
DS  
Q
Q
GD  
D.U.T.  
GS  
V
GS  
V
G
-3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13a. Basic Gate Charge Waveform  
Fig 13b. Gate Charge Test Circuit  
IRF9Z24N  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T*  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
+
-
VDD  
VGS  
* Reverse Polarity of D.U.T for P-Channel  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
[
] ***  
V
=10V  
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
[
[
]
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
]
I
SD  
Ripple 5%  
*** VGS = 5.0V for Logic Level and 3V Drive Devices  
Fig 14. For P-Channel HEXFETS  
IRF9Z24N  
Package Outline  
TO-220AB Outline  
Dimensions are shown in millimeters (inches)  
1 0.5 4 (.41 5)  
1 0.2 9 (.40 5)  
-
B
-
3.78 (.14 9)  
3.54 (.13 9)  
2 .87 ( .1 13 )  
2 .62 ( .1 03 )  
4 .69 ( .1 85 )  
4 .20 ( .1 65 )  
1 .3 2 (.0 52 )  
1 .2 2 (.0 48 )  
-
A
-
6.4 7 (.25 5)  
6.1 0 (.24 0)  
4
1 5.24 ( .6 0 0)  
1 4.84 ( .5 8 4)  
1.15 ( .0 4 5)  
L E A D  
A
S
S
IG N M E N T S  
M IN  
1
2
3
4
-
-
-
-
G A T E  
1
2
3
D R A IN  
U R C E  
D R A IN  
S
O
1 4.09 (.5 5 5)  
1 3.47 (.5 3 0)  
4.0 6 (.16 0)  
3.5 5 (.14 0)  
0 .93 ( .0 37 )  
0 .69 ( .0 27 )  
0.5 5 (.02 2)  
0.4 6 (.01 8)  
3X  
3X  
1 .4 0 (.05 5 )  
1 .1 5 (.04 5 )  
3 X  
0 .3 6 (.01 4)  
M
B
A
M
2 .9 2 (.11 5 )  
2 .6 4 (.10 4 )  
2 .54 ( .1 00 )  
2X  
N O T E  
S :  
1
2
D IM E N S IO N IN G  
C O N T R O L LIN G  
&
T O L E R A N C IN G  
P
E R  
A
N S  
I
Y
14 .5 M , 1 98 2.  
3
O
U T L IN E C O N F O R M S T O J E D E  
C
O U T LIN E T O -2 20 A B .  
N O IN C L U D E B U R R S .  
D
IM E N S IO IN C H  
N
:
4
H E A T S IN L E A D E A U R E M E N T S  
K
&
M
S
D
O
T
Part Marking Information  
TO-220AB  
EXAM PLE : THIS IS AN IRF1010  
A
W ITH ASSEMBLY  
INTERNATIONAL  
PART NUM BER  
LOT CODE 9B1M  
RECTIFIER  
IRF1010  
LOGO  
9246  
9B  
1M  
DATE CODE  
ASSEM BLY  
LOT CODE  
(YYW W )  
YY  
=
YEAR  
W W  
= W EEK  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
8/97  

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