IRFIZ48N [INFINEON]

Power MOSFET(Vdss=55V, Rds(on)=0.016ohm, Id=36A); 功率MOSFET ( VDSS = 55V , RDS(ON) = 0.016ohm ,ID = 36A )
IRFIZ48N
型号: IRFIZ48N
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss=55V, Rds(on)=0.016ohm, Id=36A)
功率MOSFET ( VDSS = 55V , RDS(ON) = 0.016ohm ,ID = 36A )

文件: 总8页 (文件大小:111K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD 9.1407  
IRFIZ48N  
PRELIMINARY  
HEXFET® Power MOSFET  
Advanced Process Technology  
Isolated Package  
High Voltage Isolation = 2.5KVRMS  
Sink to Lead Creepage Dist. = 4.8mm  
Fully Avalanche Rated  
D
VDSS = 55V  
RDS(on) = 0.016Ω  
ID = 36A  
G
S
Description  
Fifth Generation HEXFETs from International Rectifier  
utilizeadvancedprocessingtechniquestoachieveextremely  
low on-resistance per silicon area. This benefit, combined  
with the fast switching speed and ruggedized device  
design that HEXFET Power MOSFETs are well known for,  
provides the designer with an extremely efficient and  
reliable device for use in a wide variety of applications.  
The TO-220 Fullpak eliminates the need for additional  
insulating hardware in commercial-industrial applications.  
The moulding compound used provides a high isolation  
capability and a low thermal resistance between the tab  
and external heatsink. This isolation is equivalent to using  
a 100 micron mica barrier with standard TO-220 product.  
The Fullpak is mounted to a heatsink using a single clip or  
by a single screw fixing.  
TO-220 FULLPAK  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
36  
25  
A
210  
PD @TC = 25°C  
PowerDissipation  
42  
W
W/°C  
V
LinearDeratingFactor  
0.28  
± 20  
270  
VGS  
EAS  
IAR  
Gate-to-SourceVoltage  
SinglePulseAvalancheEnergy  
AvalancheCurrent  
mJ  
A
32  
EAR  
dv/dt  
TJ  
RepetitiveAvalancheEnergy  
PeakDiodeRecoverydv/dt  
OperatingJunctionand  
4.2  
mJ  
V/ns  
5.6  
-55 to + 175  
TSTG  
StorageTemperatureRange  
SolderingTemperature,for10seconds  
Mountingtorque, 6-32orM3srew  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
3.6  
Units  
RθJC  
RθJA  
°C/W  
Junction-to-Ambient  
–––  
65  
IRFIZ48N  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
55 ––– –––  
––– 0.052 ––– V/°C Reference to 25°C, ID = 1mA  
Conditions  
V(BR)DSS  
Drain-to-SourceBreakdownVoltage  
V
VGS = 0V, ID = 250µA  
V(BR)DSS/TJ BreakdownVoltageTemp.Coefficient  
RDS(on)  
VGS(th)  
gfs  
StaticDrain-to-SourceOn-Resistance  
GateThresholdVoltage  
––– ––– 0.016  
V
S
VGS = 10V, ID = 22A  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 32A  
VDS = 55V, VGS = 0V  
VDS = 44V, VGS = 0V, TJ = 150°C  
VGS = 20V  
2.0  
22  
––– 4.0  
––– –––  
ForwardTransconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 89  
––– ––– 20  
––– ––– 39  
IDSS  
Drain-to-SourceLeakageCurrent  
µA  
nA  
Gate-to-SourceForwardLeakage  
Gate-to-SourceReverseLeakage  
TotalGateCharge  
IGSS  
VGS = -20V  
Qg  
ID = 32A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-SourceCharge  
Gate-to-Drain("Miller")Charge  
Turn-OnDelayTime  
RiseTime  
nC VDS = 44V  
VGS = 10V, See Fig. 6 and 13  
–––  
–––  
–––  
–––  
11 –––  
78 –––  
32 –––  
48 –––  
VDD = 28V  
ID = 32A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
FallTime  
RG = 5.1Ω  
RD = 0.85Ω, See Fig. 10  
Betweenlead,  
6mm(0.25in.)  
frompackage  
and center of die contact  
VGS = 0V  
D
4.5  
7.5  
LD  
LS  
InternalDrainInductance  
InternalSourceInductance  
–––  
–––  
–––  
–––  
nH  
pF  
G
S
Ciss  
Coss  
Crss  
C
InputCapacitance  
––– 1900 –––  
––– 620 –––  
––– 270 –––  
OutputCapacitance  
VDS = 25V  
ReverseTransferCapacitance  
DraintoSinkCapacitance  
ƒ = 1.0MHz, See Fig. 5  
ƒ = 1.0MHz  
–––  
12 –––  
Source-Drain Ratings and Characteristics  
Parameter  
ContinuousSourceCurrent  
(BodyDiode)  
Min. Typ. Max. Units  
Conditions  
MOSFETsymbol  
showing the  
D
IS  
––– ––– 36  
A
G
ISM  
PulsedSourceCurrent  
(BodyDiode)  
integralreverse  
––– ––– 210  
S
p-njunctiondiode.  
VSD  
trr  
DiodeForwardVoltage  
ReverseRecoveryTime  
ReverseRecoveryCharge  
––– ––– 1.3  
––– 94 140  
––– 360 540  
V
TJ = 25°C, IS = 22A, VGS = 0V  
TJ = 25°C, IF = 32A  
ns  
Qrr  
nC di/dt = 100A/µs  
Notes:  
Pulse width300µs; duty cycle 2%.  
Repetitive rating; pulse width limited by  
max. junction temperature. ( See fig. 11 )  
VDD = 25V, starting TJ = 25°C, L = 530µH  
t=60s, ƒ=60Hz  
RG = 25, IAS = 32A. (See Figure 12)  
Uses IRFZ48N data and test conditions  
ISD 32A, di/dt 250A/µs, VDD V(BR)DSS  
,
TJ 175°C  
IRFIZ48N  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
4.5V  
1
1
4.5V  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
T = 175°C  
T = 25°C  
C
C
0.1  
0.1  
0.1  
0.1  
A
100  
A
1
10  
100  
1
10  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics,  
Fig 2. Typical Output Characteristics,  
TJ = 25oC  
TJ = 175oC  
1000  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
I
= 53A  
D
100  
10  
1
T = 175°C  
J
T = 25°C  
J
V
= 25V  
DS  
20µs PULSE WIDTH  
V
= 10V  
GS  
0.1  
10A  
A
4
5
6
7
8
9
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
TJ , Junction Temperature (°C)  
VGS , Gate-to-Source Voltage (V)  
Fig 4. Normalized On-Resistance  
Fig 3. Typical Transfer Characteristics  
Vs. Temperature  
IRFIZ48N  
20  
16  
12  
8
4000  
I
= 32A  
V
= 0V,  
f = 1MHz  
D
GS  
C
C
C
= C + C  
,
C
ds  
SHORTED  
V
V
= 44V  
iss  
rss  
oss  
gs  
gd  
DS  
= C  
gd  
= 28V  
DS  
= C + C  
ds  
gd  
3000  
2000  
1000  
0
C
C
iss  
oss  
C
rss  
4
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
A
A
0
20  
40  
60  
80  
100  
1
10  
100  
VDS , Drain-to-Source Voltage (V)  
QG, Total Gate Charge (nC)  
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
1000  
100  
10  
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
10µs  
T = 175°C  
J
T = 25°C  
J
100µs  
1ms  
1
10ms  
T
T
= 25°C  
= 175°C  
C
J
Single Pulse  
V
= 0V  
GS  
A
0.1  
1
A
0.2  
0.6  
1.0  
1.4  
1.8  
2.2  
2.6  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
VSD , Source-to-Drain Voltage (V)  
DS  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating  
Forward Voltage  
Area  
IRFIZ48N  
RD  
VDS  
40  
30  
20  
10  
0
VGS  
10V  
D.U.T.  
RG  
+VDD  
-
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
A
25  
50  
75  
100  
125  
150  
175  
10%  
TC, Case Temperature (°C)  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 9. Maximum Drain Current Vs.  
Fig 10b. Switching Time Waveforms  
Case Temperature  
10  
D = 0.50  
1
0.20  
0.10  
0.05  
P
DM  
0.02  
0.01  
0.1  
t
1
t
2
SINGLE PULSE  
(THERMAL RESPONSE)  
Notes:  
1. Duty factor D = t / t  
1
2
thJC  
1
2. Peak T = P  
DM  
x Z  
+ T  
C
J
A
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
10  
t1 , Rectangular Pulse Duration (sec)  
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
IRFIZ48N  
700  
600  
500  
400  
300  
200  
100  
0
I
D
15V  
TOP  
13A  
22A  
BOTTOM 32A  
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test  
Circuit  
V
(BR)DSS  
V
= 25V  
50  
DD  
A
175  
t
p
25  
75  
100  
125  
150  
Starting TJ , Junction Temperature (°C)  
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
10 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Current Sampling Resistors  
Charge  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
IRFIZ48N  
Peak Diode Recovery dv/dt Test Circuit  
+
CircuitLayoutConsiderations  
Low Stray Inductance  
Ground Plane  
D.U.T  
Low Leakage Inductance  
Current Transformer  
-
+
-
-
+
RG  
dv/dt controlled by RG  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
+
-
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
IRFIZ48N  
Package Outline — TO-220 Fullpak  
Dimensions are shown in millimeters (inches)  
10.60 (.417)  
10.40 (.409)  
3.40 (.133)  
3.10 (.123)  
4.80 (.189)  
4.60 (.181)  
ø
2.80 (.110)  
2.60 (.102)  
- A -  
3.70 (.145)  
3.20 (.126)  
LEAD ASSIGNMENTS  
1 - GATE  
7.10 (.280)  
6.70 (.263)  
2 - DRAIN  
3 - SOURCE  
16.00 (.630)  
15.80 (.622)  
1.15 (.045)  
MIN.  
NOTES:  
1
DIMENSIONING & TOLERANCING  
PER ANSI Y14.5M, 1982  
1
2
3
2
CONTROLLING DIMENSION: INCH.  
3.30 (.130)  
3.10 (.122)  
- B -  
13.70 (.540)  
13.50 (.530)  
C
D
A
B
0.48 (.019)  
0.44 (.017)  
0.90 (.035)  
3X  
0.70 (.028)  
3X  
1.40 (.055)  
1.05 (.042)  
3X  
2.85 (.112)  
2.65 (.104)  
0.25 (.010)  
A
M
B
M
MINIMUM CREEPAGE  
DISTANCE BETWEEN  
A-B-C-D = 4.80 (.189)  
2.54 (.100)  
2X  
Part Marking  
EXAMPLE : THIS IS AN IRFI840G  
WITH ASSEMBLY  
LOT CODE E401  
A  
PART NUMBER  
INTERNATIONAL  
E401 9245  
RECTIFIER  
IRFI840G  
LOGO  
ASSEMBLY  
DATE CODE  
(YYWW)  
OT DE  
L
CO
YY = YEAR  
WW = WEEK  
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331  
EUROPEAN HEADQUARTERS:Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020  
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111  
IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086  
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371  
http://www.irf.com/  
Data and specifications subject to change without notice.  
4/96  

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