IRLR024ZTRPBF [INFINEON]

Power Field-Effect Transistor, 16A I(D), 55V, 0.058ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA, LEAD FREE, PLASTIC, DPAK-3;
IRLR024ZTRPBF
型号: IRLR024ZTRPBF
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 16A I(D), 55V, 0.058ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA, LEAD FREE, PLASTIC, DPAK-3

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PD - 95773B  
IRLR024ZPbF  
IRLU024ZPbF  
HEXFET® Power MOSFET  
Features  
n Logic Level  
D
n Advanced Process Technology  
n UltraLowOn-Resistance  
n 175°COperatingTemperature  
n Fast Switching  
n Repetitive Avalanche Allowed up to Tjmax  
n Lead-Free  
VDSS = 55V  
R
DS(on) = 58mΩ  
G
ID = 16A  
S
Description  
This HEXFET® Power MOSFET utilizes the latest  
processingtechniquestoachieveextremelylowon-  
resistancepersiliconarea.Additionalfeaturesofthis  
design area175°Cjunctionoperatingtemperature,  
fast switching speed and improved repetitive  
avalanche rating . These features combine to make  
thisdesignanextremelyefficientandreliabledevice  
for use in a wide variety of applications.  
D-Pak  
I-Pak  
IRLR024ZPbF IRLU024ZPbF  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
(Silicon Limited)  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
I
I
I
@ T = 25°C  
C
16  
D
D
@ T = 100°C  
C
11  
A
64  
DM  
P
@T = 25°C Power Dissipation  
C
35  
W
W/°C  
V
D
Linear Derating Factor  
0.23  
V
Gate-to-Source Voltage  
Single Pulse Avalanche Energy  
± 16  
GS  
EAS (Thermally limited)  
AS (Tested )  
25  
mJ  
E
Single Pulse Avalanche Energy Tested Value  
Avalanche Current  
25  
IAR  
See Fig.12a, 12b, 15, 16  
A
EAR  
Repetitive Avalanche Energy  
Operating Junction and  
mJ  
T
J
-55 to + 175  
T
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
STG  
300 (1.6mm from case )  
Thermal Resistance  
Parameter  
Typ.  
–––  
–––  
–––  
Max.  
4.28  
40  
Units  
Rθ  
Rθ  
Rθ  
ˆ
Junction-to-Case  
JC  
JA  
JA  
Junction-to-Ambient (PCB mount)  
Junction-to-Ambient  
°C/W  
110  
HEXFET® isaregisteredtrademarkofInternationalRectifier.  
www.irf.com  
1
10/01/10  
IRLR/U024ZPbF  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Drain-to-Source Breakdown Voltage  
Min. Typ. Max. Units  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
55  
–––  
–––  
V
V(BR)DSS/TJ  
Breakdown Voltage Temp. Coefficient ––– 0.053 ––– V/°C Reference to 25°C, ID = 1mA  
–––  
Static Drain-to-Source On-Resistance –––  
–––  
46  
58  
80  
VGS = 10V, ID = 9.6A  
mΩ  
RDS(on)  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
VGS = 5.0V, ID = 5.0A  
VGS = 4.5V, ID = 3.0A  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 9.6A  
100  
3.0  
–––  
20  
VGS(th)  
Gate Threshold Voltage  
1.0  
7.4  
V
S
gfs  
Forward Transconductance  
Drain-to-Source Leakage Current  
IDSS  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
µA  
VDS = 55V, VGS = 0V  
250  
200  
VDS = 55V, VGS = 0V, TJ = 125°C  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
nA VGS = 16V  
GS = -16V  
ID = 5.0A  
DS = 44V  
––– -200  
V
Qg  
Qgs  
Qgd  
td(on)  
tr  
6.6  
1.6  
3.9  
8.2  
43  
9.9  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
nC  
V
VGS = 5.0V  
VDD = 28V  
ID = 5.0A  
Rise Time  
td(off)  
tf  
Turn-Off Delay Time  
19  
ns  
RG = 28 Ω  
VGS = 5.0V  
Fall Time  
16  
LD  
Internal Drain Inductance  
4.5  
Between lead,  
D
S
nH 6mm (0.25in.)  
from package  
G
LS  
Internal Source Inductance  
–––  
7.5  
–––  
and center of die contact  
VGS = 0V  
DS = 25V  
pF ƒ = 1.0MHz  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
Ciss  
Input Capacitance  
–––  
–––  
–––  
–––  
–––  
–––  
380  
62  
–––  
–––  
–––  
–––  
–––  
–––  
Coss  
Output Capacitance  
V
Crss  
Reverse Transfer Capacitance  
Output Capacitance  
39  
Coss  
180  
50  
Coss  
Output Capacitance  
VGS = 0V, VDS = 44V, ƒ = 1.0MHz  
GS = 0V, VDS = 0V to 44V  
Coss eff.  
Effective Output Capacitance  
81  
V
Source-Drain Ratings and Characteristics  
Parameter  
Min. Typ. Max. Units  
Conditions  
D
I
Continuous Source Current  
–––  
–––  
16  
MOSFET symbol  
S
(Body Diode)  
Pulsed Source Current  
A
showing the  
integral reverse  
G
I
–––  
–––  
64  
SM  
S
(Body Diode)  
p-n junction diode.  
V
t
Diode Forward Voltage  
–––  
–––  
–––  
–––  
16  
1.3  
24  
17  
V
T = 25°C, I = 9.6A, V  
= 0V  
GS  
SD  
J
S
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
ns T = 25°C, I = 9.6A, VDD = 28V  
J F  
rr  
di/dt = 100A/µs  
Q
t
11  
nC  
rr  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
on  
2
www.irf.com  
IRLR/U024ZPbF  
100  
10  
1
100  
10  
1
VGS  
10V  
VGS  
10V  
TOP  
TOP  
9.0V  
7.0V  
5.0V  
4.5V  
4.0V  
3.5V  
3.0V  
9.0V  
7.0V  
5.0V  
4.5V  
4.0V  
3.5V  
3.0V  
BOTTOM  
BOTTOM  
3.0V  
3.0V  
60µs PULSE WIDTH  
Tj = 175°C  
60µs PULSE WIDTH  
Tj = 25°C  
0.1  
0.1  
0.1  
1
10  
0.1  
1
10  
V
, Drain-to-Source Voltage (V)  
DS  
V
, Drain-to-Source Voltage (V)  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
100  
10  
1
15  
T
= 25°C  
J
T
= 175°C  
J
10  
5
T = 175°C  
J
T
= 25°C  
V
J
V
= 8.0V  
DS  
= 10V  
DS  
300µs PULSE WIDTH  
60µs PULSE WIDTH  
0.1  
0
0
2
4
6
8
10  
12  
0
2
4
6
8
10 12 14 16  
I ,Drain-to-Source Current (A)  
D
V
, Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Typical Forward Transconductance  
vs. Drain Current  
www.irf.com  
3
IRLR/U024ZPbF  
10000  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I = 5.0A  
D
C
C
C
+ C , C  
SHORTED  
iss  
gs  
gd  
ds  
V
V
V
= 44V  
= 28V  
= 11V  
DS  
DS  
DS  
= C  
rss  
oss  
gd  
= C + C  
ds  
gd  
1000  
100  
10  
C
iss  
C
oss  
C
rss  
1
10  
100  
0
1
2
3
4
5
6
7
V
, Drain-to-Source Voltage (V)  
Q
Total Gate Charge (nC)  
DS  
G
Fig 6. Typical Gate Charge vs.  
Fig 5. Typical Capacitance vs.  
Gate-to-SourceVoltage  
Drain-to-SourceVoltage  
100  
10  
1
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R (on)  
DS  
T
= 175°C  
J
100µsec  
1
1msec  
Tc = 25°C  
Tj = 175°C  
T
= 25°C  
1.5  
J
V
= 0V  
10msec  
GS  
Single Pulse  
0.1  
0.0  
0.5  
1.0  
2.0  
2.5  
3.0  
1
10  
100  
1000  
V
, Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRLR/U024ZPbF  
2.5  
2.0  
1.5  
1.0  
0.5  
16  
14  
12  
10  
8
I
= 5.0A  
= 5.0V  
D
V
GS  
6
4
2
0
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
25  
50  
75  
100  
125  
150  
175  
T , Junction Temperature (°C)  
T
, Case Temperature (°C)  
J
C
Fig 10. Normalized On-Resistance  
Fig 9. Maximum Drain Current vs.  
vs.Temperature  
CaseTemperature  
10  
D = 0.50  
1
0.20  
0.10  
0.05  
R1  
R1  
R2  
R2  
0.1  
0.01  
0.02  
0.01  
Ri (°C/W) τi (sec)  
τ
J τJ  
τ
2.354  
0.000354  
τ
Cτ  
1 τ1  
Ci= τi/Ri  
τ
2τ2  
1.926  
0.001779  
SINGLE PULSE  
( THERMAL RESPONSE )  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
0.001  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRLR/U024ZPbF  
100  
80  
60  
40  
20  
0
15V  
I
D
TOP  
1.2A  
1.8A  
BOTTOM 9.6A  
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
2
V0GVS  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
25  
50  
75  
100  
125  
150  
175  
Starting T , Junction Temperature (°C)  
J
I
AS  
Fig 12c. Maximum Avalanche Energy  
Fig 12b. Unclamped Inductive Waveforms  
vs. Drain Current  
Q
G
10 V  
Q
Q
GD  
GS  
2.5  
2.0  
1.5  
1.0  
V
G
Charge  
I
= 250µA  
D
Fig 13a. Basic Gate Charge Waveform  
L
VCC  
DUT  
0
1K  
-75 -50 -25  
0
25 50 75 100 125 150 175  
T , Temperature ( °C )  
J
Fig 14. Threshold Voltage vs. Temperature  
Fig 13b. Gate Charge Test Circuit  
6
www.irf.com  
IRLR/U024ZPbF  
100  
10  
1
Allowed avalanche Current vs  
avalanche pulsewidth, tav  
Duty Cycle = Single Pulse  
0.01  
assuming  
Tj = 25°C due to  
avalanche losses  
0.05  
0.10  
0.1  
1.0E-05  
1.0E-04  
1.0E-03  
1.0E-02  
1.0E-01  
tav (sec)  
Fig 15. Typical Avalanche Current vs.Pulsewidth  
Notes on Repetitive Avalanche Curves , Figures 15, 16:  
(For further info, see AN-1005 at www.irf.com)  
1. Avalanche failures assumption:  
Purely a thermal phenomenon and failure occurs at a  
temperature far in excess of Tjmax. This is validated for  
every part type.  
2. Safe operation in Avalanche is allowed as long asTjmax is  
not exceeded.  
3. Equation below based on circuit and waveforms shown in  
Figures 12a, 12b.  
4. PD (ave) = Average power dissipation per single  
avalanche pulse.  
5. BV = Rated breakdown voltage (1.3 factor accounts for  
voltage increase during avalanche).  
6. Iav = Allowable avalanche current.  
30  
25  
20  
15  
10  
5
TOP  
BOTTOM 1% Duty Cycle  
= 9.6A  
Single Pulse  
I
D
7. T = Allowable rise in junction temperature, not to exceed  
Tjmax (assumed as 25°C in Figure 15, 16).  
tav = Average time in avalanche.  
0
D = Duty cycle in avalanche = tav ·f  
25  
50  
75  
100  
125  
150  
175  
ZthJC(D, tav) = Transient thermal resistance, see figure 11)  
Starting T , Junction Temperature (°C)  
J
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC  
Fig 16. Maximum Avalanche Energy  
Iav = 2DT/ [1.3·BV·Zth]  
EAS (AR) = PD (ave)·tav  
vs.Temperature  
www.irf.com  
7
IRLR/U024ZPbF  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
D.U.T  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
-
+
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
Re-Applied  
Voltage  
dv/dt controlled by RG  
RG  
+
-
Body Diode  
Forward Drop  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
Inductor Curent  
I
SD  
Ripple  
5%  
* VGS = 5V for Logic Level Devices  
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel  
HEXFET® Power MOSFETs  
RD  
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 18a. Switching Time Test Circuit  
V
DS  
90%  
10%  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 18b. Switching Time Waveforms  
8
www.irf.com  
IRLR/U024ZPbF  
D-Pak (TO-252AA) Package Outline  
Dimensions are shown in millimeters (inches)  
D-Pak (TO-252AA) Part Marking Information  
EXAMPLE: THIS IS AN IRFR120  
PART NUMBER  
WIT H AS S E MBLY  
LOT CODE 1234  
ASSEMBLED ON WW 16, 2001  
IN THE ASSEMBLY LINE "A"  
INTERNATIONAL  
RECTIFIER  
LOGO  
DAT E CODE  
YEAR 1 = 2001  
WE E K 16  
IRFR120  
116A  
12  
34  
LINE A  
Note: "P" in assembly lineposition  
AS S EMBL Y  
LOT CODE  
indicates "L ead-F ree"  
"P" in assembly lineposition indicates  
"L ead-F ree" qualification to the cons umer-level  
PART NUMBER  
DAT E CODE  
P = DESIGNATES LEAD-FREE  
PRODUCT (OPTIONAL)  
INTERNATIONAL  
RECTIFIER  
LOGO  
OR  
IRFR120  
12 34  
P = DESIGNATES LEAD-FREE  
PRODUCT QUALIFIED TOTHE  
CONSUMER LEVEL (OPTIONAL)  
AS S EMBL Y  
LOT CODE  
YEAR 1 = 2001  
WE E K 16  
A = AS S E MB L Y S I T E CODE  
Notes:  
1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/  
2. For the most current drawing please refer to IR website at http://www.irf.com/package/  
www.irf.com  
9
IRLR/U024ZPbF  
I-Pak (TO-251AA) Package Outline  
Dimensions are shown in millimeters (inches)  
I-Pak (TO-251AA) Part Marking Information  
PART NUMBER  
EXAMPLE: THIS IS AN IRFU120  
INTERNATIONAL  
WIT H AS S E MB LY  
DAT E CODE  
YEAR 1 = 2001  
WEEK 19  
RECTIFIER  
LOGO  
IRFU120  
119A  
78  
LOT CODE 5678  
ASSEMBLED ON WW19, 2001  
IN THE ASSEMBLY LINE "A"  
56  
LINE A  
ASSEMBLY  
LOT CODE  
Note: "P" in assembly lineposition  
indicates Lead-Free"  
OR  
PART NUMBER  
DAT E CODE  
P = DESIGNATES LEAD-FREE  
PRODUCT (OPTIONAL)  
INTERNATIONAL  
RECTIFIER  
LOGO  
IRFU120  
56 78  
YEAR 1 = 2001  
AS S EMBL Y  
LOT CODE  
WEEK 19  
A = AS S EMBLY S IT E CODE  
Notes:  
1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/  
2. For the most current drawing please refer to IR website at http://www.irf.com/package/  
10  
www.irf.com  
IRLR/U024ZPbF  
D-Pak (TO-252AA) Tape & Reel Information  
Dimensions are shown in millimeters (inches)  
TR  
TRL  
TRR  
16.3 ( .641 )  
15.7 ( .619 )  
16.3 ( .641 )  
15.7 ( .619 )  
12.1 ( .476 )  
11.9 ( .469 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
FEED DIRECTION  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).  
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
13 INCH  
16 mm  
NOTES :  
1. OUTLINE CONFORMS TO EIA-481.  
Notes:  
 Repetitive rating; pulse width limited by  
max. junction temperature. (See fig. 11).  
Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical  
repetitive avalanche performance.  
‚ Limited by TJmax, starting TJ = 25°C, L = 0.54mH  
RG = 25, IAS = 9.6A, VGS =10V. Part not  
† This value determined from sample failure population.  
100% tested to this value in production.  
recommended for use above this value.  
‡ When mounted on 1" square PCB (FR-4 or G-10 Material)  
ƒ Pulse width 1.0ms; duty cycle 2%.  
„ Coss eff. is a fixed capacitance that gives the same  
charging time as Coss while VDS is rising from 0 to  
For recommended footprint and soldering techniques  
refer to application note #AN-994.  
ˆ Rθ is measured at TJ of approximately 90°C.  
80% VDSS  
.
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 10/2010  
www.irf.com  
11  

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