IRS23365DMPBF [INFINEON]

Drives up to six IGBT/MOSFET power devices;
IRS23365DMPBF
型号: IRS23365DMPBF
厂家: Infineon    Infineon
描述:

Drives up to six IGBT/MOSFET power devices

双极性晶体管
文件: 总37页 (文件大小:594K)
中文:  中文翻译
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IRS23365DM  
Product Summary  
Topology  
Features  
Drives up to six IGBT/MOSFET power devices  
3 Phase  
≤ 600 V  
Gate drive supplies up to 20 V per channel  
Integrated bootstrap functionality  
Overꢀcurrent protection  
Overꢀtemperature shutdown input  
Advanced input filter  
Integrated deadtime protection  
Shootꢀthrough (crossꢀconduction) protection  
Undervoltage lockout for VCC & VBS  
Enable/disable input and fault reporting  
Adjustable fault clear timing  
VOFFSET  
VOUT  
10 V – 20 V  
180 mA & 380 mA  
530 ns & 530 ns  
275 ns  
Io+ & I oꢀ (typical)  
tON & tOFF (typical)  
Deadtime (typical)  
Package Options  
Separate logic and power grounds  
3.3 V input logic compatible  
Tolerant to negative transient voltage  
Designed for use with bootstrap power supplies  
Matched propagation delays for all channels  
ꢀ40°C to 125°C operating range  
RoHS compliant  
LeadꢀFree  
48ꢀLead MLPQ7X7  
(without 14 leads)  
Typical Applications  
Appliance motor drives  
Servo drives  
Micro inverter drives  
General purpose three phase inverters  
Typical Connection Diagram  
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IRS23365DM  
Description  
The IRS23365DM is a high voltage, high speed, power MOSFET and IGBT gate drivers with three highꢀside and three lowꢀ  
side referenced output channels for 3ꢀphase applications. This IC is designed to be used with lowꢀcost bootstrap power  
supplies; the bootstrap diode functionality has been integrated into this device to reduce the component count and the PCB  
size. Proprietary HVIC and latch immune CMOS technologies have been implemented in a rugged monolithic structure. The  
floating logic input is compatible with standard CMOS or LSTTL outputs (down to 3.3 V logic). A current trip function which  
terminates all six outputs can be derived from an external current sense resistor. Enable functionality is available to terminate  
all six outputs simultaneously. An openꢀdrain FAULT signal is provided to indicate that a fault (e.g., overꢀcurrent, overꢀ  
temperature, or undervoltage shutdown event) has occurred. Fault conditions are cleared automatically after a delay  
programmed externally via an RC network connected to the RCIN input. The output drivers feature a highꢀpulse current  
buffer stage designed for minimum driver crossꢀconduction. Shootꢀthrough protection circuitry and a minimum deadtime  
circuitry have been integrated into this IC. Propagation delays are matched to simplify the HVIC’s use in high frequency  
applications. The floating channels can be used to drive Nꢀchannel power MOSFETs or IGBTs in the highꢀside configuration,  
which operate up to 600 V.  
Simplified Block Diagram  
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IRS23365DM  
Typical Application Diagram  
DC Bus 600 V  
+
To  
Load  
Input  
Voltage  
I
VCC  
Control Inputs,  
EN, & FAULT  
Qualification Information†  
Industrial††  
Qualification Level  
Comments: This family of ICs has passed JEDEC’s Industrial  
qualification. IR’s Consumer qualification level is granted by  
extension of the higher Industrial level.  
MSL3†††, 260°C  
MLPQ7X7  
Moisture Sensitivity Level  
(per IPC/JEDEC JꢀSTDꢀ020)  
Class 1B  
Human Body Model  
Machine Model  
(per JEDEC standard JESD22ꢀA114)  
Class B  
ESD  
(per EIA/JEDEC standard EIA/JESD22ꢀA115)  
Class IV  
(per JEDEC standard JESD22ꢀC101)  
Class I, Level A  
Charged Device Model ††††  
IC LatchꢀUp Test  
RoHS Compliant  
(per JESD78)  
Yes  
††  
Qualification standards can be found at International Rectifier’s web site http://www.irf.com/  
Higher qualification ratings may be available should the user have such requirements. Please contact your  
International Rectifier sales representative for further information.  
†††  
Higher MSL ratings may be available for the specific package types listed here. Please contact your International  
Rectifier sales representative for further information.  
††††  
Charged Device Model classification is based on SOIC28W package.  
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IRS23365DM  
Absolute Maximum Ratings  
Absolute maximum ratings indicate sustained limits beyond which damage to the device may occur. All voltage parameters  
are absolute voltages referenced to VSS unless otherwise stated in the table. The thermal resistance and power dissipation  
ratings are measured under board mounted and still air conditions. Voltage clamps are included between VCC & COM (25 V),  
VCC & VSS (25 V), and VB & VS (25 V).  
Definition  
Min  
Max  
Units  
Symbol  
VCC  
25†  
Low side supply voltage  
ꢀ0.3  
VIN  
Logic input voltage (HIN, LIN, ITRIP, EN)  
VSSꢀ0.3  
VSS+5.2  
VRCIN  
VB  
VS  
VHO  
VLO  
VFLT  
COM  
dVS/dt  
PWHIN  
RCIN input voltage  
VSSꢀ0.3  
ꢀ0.3  
VCC+0.3  
625†  
Highꢀside floating well supply voltage  
Highꢀside floating well supply return voltage  
Floating gate drive output voltage  
Lowꢀside output voltage  
Fault output voltage  
Power ground  
V
VBꢀ25†  
VSꢀ0.3  
COMꢀ0.3  
VSSꢀ0.3  
VCCꢀ25  
VB+0.3  
VB+0.3  
VCC+0.3  
VCC+0.3  
VCC+0.3  
50  
Allowable VS offset supply transient relative to VSS  
Highꢀside input pulse width  
V/ns  
ns  
500  
PD  
2.0  
W
Package power dissipation @ TA +25ºC  
RthJA  
Thermal resistance, junction to ambient  
63  
ºC/W  
TJ  
TS  
TL  
Junction temperature  
Storage temperature  
Lead temperature (soldering, 10 seconds)  
ꢀ55  
150  
150  
300  
ºC  
All supplies are tested at 25 V. An internal 25 V clamp exists for each supply.  
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IRS23365DM  
Recommended Operating Conditions  
For proper operation, the device should be used within the recommended conditions. All voltage parameters are absolute  
voltages referenced to VSS unless otherwise stated in the table. The offset rating is tested with supplies of (VCCꢀCOM) = (VBꢀ  
VS) = 15 V.  
Definition  
Min  
Max  
Units  
Symbol  
VCC  
VIN  
VB  
Lowꢀside supply voltage  
10  
VSS  
20  
HIN, LIN, & EN input voltage  
VSS+5  
VS+20  
Highꢀside floating well supply voltage  
VS+10  
Highꢀside floating well supply offset voltage†  
Transient highꢀside floating supply voltage††  
Floating gate drive output voltage  
Lowꢀside output voltage  
VS  
VS(t)  
VHO  
COMꢀ8  
ꢀ50  
Vs  
COM  
ꢀ5  
VSS  
VSS  
VSS  
ꢀ40  
600  
600  
VB  
VCC  
5
VCC  
VCC  
VSS+5  
125  
V
VLO  
COM  
VFLT  
VRCIN  
VITRIP  
TA  
Power ground  
FAULT output voltage  
RCIN input voltage  
ITRIP input voltage  
Ambient temperature  
ºC  
VS  
VS  
of –8 V to 600 V. Logic state held for of –8 V to –VBS. Please refer to Design Tip DT97ꢀ3 for  
Logic operation for  
more details.  
†† Operational for transient negative VS of VSS ꢀ 50 V with a 50 ns pulse width. Guaranteed by design. Refer to the  
Application Information section of this datasheet for more details.  
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IRS23365DM  
Static Electrical Characteristics  
(VCCꢀCOM) = (VBꢀVS) = 15 V. TA = 25oC unless otherwise specified. The VIN and IIN parameters are referenced to VSS and are  
applicable to all six channels. The VO and IO parameters are referenced to respective VS and COM and are applicable to the  
respective output leads HO or LO. The  
parameters are referenced to VSS. The  
parameters are referenced to VS.  
VCCUV  
VBSUV  
Symbol  
Definition  
VCC supply undervoltage positive going threshold  
VCC supply undervoltage negative going  
threshold  
Min  
8
Typ  
8.9  
Max  
9.8  
Units  
Test Conditions  
VCCUV  
+
VCCUV  
7.4  
8.2  
9
VCCUVHY  
VBSUV+  
V
CC supply undervoltage hysteresis  
0.3  
8
0.7  
8.9  
V
NA  
VBS supply undervoltage positive going threshold  
9.8  
VBS supply undervoltage negative going  
threshold  
VBSUVꢀ  
7.4  
8.2  
9
VBSUVHY  
ILK  
IQBS  
V
BS supply undervoltage hysteresis  
0.3  
0.7  
70  
2
Highꢀside floating well offset supply leakage  
Quiescent VBS supply current  
50  
120  
4
VB = VS = 600 V  
ꢁA  
All inputs are in the off  
state  
IQCC  
Quiescent VCC supply current  
mA  
VOH  
VOL  
High level output voltage drop, VBIASꢀVO  
Low level output voltage drop, VO  
0.90  
0.40  
1.4  
0.6  
V
V
IO= 20 mA  
VO=0 V,VIN=0 V,  
PW ≤ 10 ꢁs  
VO=15 V,VIN=5 V,  
PW ≤ 10 ꢁs  
Io+  
Ioꢀ  
Output high short circuit pulsed current  
Output low short circuit pulsed current  
120  
250  
180  
380  
mA  
VIH  
VIL  
Logic “1” input voltage  
Logic “0” input voltage  
Input voltage clamp  
(HIN, LIN, ITRIP and EN)  
Input bias current (HO = High)  
2.5  
NA  
0.8  
V
VIN,CLAMP  
IHIN+  
4.8  
5.2  
5.65  
220  
IIN = 100 ꢁA  
VIN = 0 V  
165  
IHINꢀ  
ILIN+  
ILINꢀ  
Input bias current (HO = Low)  
Input bias current (LO = High)  
Input bias current (LO = Low)  
120  
165  
120  
165  
220  
165  
VIN = 4 V  
VIN = 0 V  
VIN = 4 V  
ꢁA  
V
VRCIN,TH  
VRCIN,HY  
IRCIN  
RON,RCIN  
VIT,TH+  
VIT,THꢀ  
VIT,HYS  
IITRIP+  
IITRIPꢀ  
RCIN positive going threshold  
RCIN hysteresis  
0.37  
0.8  
8
3
50  
0.46  
0.4  
0.07  
5
5
1
100  
0.55  
20  
1
2.5  
20  
1
NA  
RCIN input bias current  
RCIN low on resistance  
ITRIP positive going threshold  
ITRIP negative going threshold  
ITRIP hysteresis  
ꢁA  
V
VRCIN = 0 V or 15 V  
I = 1.5 mA  
NA  
“High” ITRIP input bias current  
“Low” ITRIP input bias current  
ꢁA  
V
VIN = 4 V  
VIN = 0 V  
NA  
VEN,TH+ Enable positive going threshold  
VEN,THꢀ  
IEN+  
Enable negative going threshold  
“High” enable input bias current  
“Low” enable input bias current  
ꢁA  
VIN = 4 V  
VIN = 0 V  
I = 1.5 mA  
NA  
IENꢀ  
50  
200  
RON,FLT FAULT low on resistance  
RBS Internal BS diode Ron  
100  
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IRS23365DM  
Dynamic Electrical Characteristics  
VCC= VB = 15 V, VS = VSS = COM, TA = 25oC, and CL = 1000 pF unless otherwise specified.  
Symbol  
Definition  
Turnꢀon propagation delay  
Turnꢀoff propagation delay  
Turnꢀon rise time  
Min  
400  
400  
Typ  
530  
530  
125  
50  
Max  
750  
750  
190  
75  
Units  
Test Conditions  
tON  
tOFF  
tR  
VIN = 0 V & 5 V  
tF  
Turnꢀoff fall time  
Input filter time†  
(HIN, LIN, ITRIP)  
tFIL,IN  
tEN  
tFILTER,EN  
200  
350  
510  
ns  
Enable low to output shutdown  
propagation delay  
350  
460  
650  
VIN, VEN = 0 V or 5 V  
Enable input filter time  
100  
1.3  
200  
2
NA  
VIN = 0 V or 5 V  
FAULT clear time  
RCIN: R = 2 Mꢂ, C = 1 nF  
tFLTCLR  
1.65  
ms  
VITRIP = 0 V  
ITRIP to output shutdown  
propagation delay  
tITRIP  
tBL  
500  
750  
400  
600  
1200  
VITRIP = 5 V  
ITRIP blanking time  
ITRIP to FAULT propagation delay  
Deadtime  
VIN = 0 V or 5 V  
tFLT  
DT  
400  
950  
420  
VITRIP = 5 V  
190  
275  
VIN = 0 V & 5 V without  
external deadtime  
DT matching††  
MDT  
60  
ns  
VIN = 0 V & 5 V with  
external deadtime larger  
than DT  
††  
MT  
PM  
50  
75  
Delay matching time (tON, tOFF  
Pulse width distortion†††  
)
PW input=10 ꢁs  
The minimum width of the input pulse is recommended to exceed 500 ns to ensure the filtering time of the input  
filter is exceeded.  
††  
This parameter applies to all of the channels. Please see the application section for more details.  
†††  
PM is defined as PWIN ꢀ PWOUT.  
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IRS23365DM  
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IRS23365DM  
Functional Block Diagram: IRS23365D  
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IRS23365DM  
Input/Output Pin Equivalent Circuit Diagrams: IRS23365D  
VB  
ESD  
Diode  
HO  
ESD  
Diode  
VCC  
ESD  
Diode  
VS  
RPU  
600V  
HIN  
or LIN  
VCC  
VIN  
Clamp  
ESD  
Diode  
ESD  
Diode  
VSS  
25 V  
Clamp  
LO  
ESD  
Diode  
COM  
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IRS23365DM  
Lead Definitions: IRS23365DM  
Symbol  
Description  
VCC  
VSS  
Lowꢀside supply voltage  
Logic ground  
VB1  
Highꢀside gate drive floating supply (phase 1)  
Highꢀside gate drive floating supply (phase 2)  
Highꢀside gate drive floating supply (phase 3)  
High voltage floating supply return (phase 1)  
High voltage floating supply return (phase 2)  
High voltage floating supply return (phase 3)  
VB2  
VB3  
VS1  
VS2  
VS3  
HIN1/N  
HIN2/N  
HIN3/N  
LIN1/N  
LIN2/N  
LIN3/N  
HO1  
Logic inputs for highꢀside gate driver outputs (phase 1); input is outꢀofꢀphase with output  
Logic inputs for highꢀside gate driver outputs (phase 2); input is outꢀofꢀphase with output  
Logic inputs for highꢀside gate driver outputs (phase 3); input is outꢀofꢀpha se with output  
Logic inputs for lowꢀside gate driver outputs (phase 1); input is outꢀofꢀphase with output  
Logic inputs for lowꢀside gate driver outputs (phase 2); input is outꢀofꢀphase with output  
Logic inputs for lowꢀside gate driver outputs (phase 3); input is outꢀofꢀphase with output  
Highꢀside driver outputs (phase 1)  
HO2  
Highꢀside driver outputs (phase 2)  
HO3  
Highꢀside driver outputs (phase 3)  
LO1  
Lowꢀside driver outputs (phase 1)  
LO2  
Lowꢀside driver outputs (phase 2)  
LO3  
Lowꢀside driver outputs (phase 3)  
COM  
Lowꢀside gate drive return  
Indicates overꢀcurrent, overꢀtemperature (ITRIP), or lowꢀside undervoltage lockout has occurred. This pin  
has negative logic and an openꢀdrain output. The use of overꢀcurrent and overꢀtemperature protection  
requires the use of external components.  
Logic input to shutdown functionality. Logic functions when EN is high (i.e., positive logic). No effect on  
FAULT and not latched.  
FAULT/N  
EN  
Analog input for overꢀcurrent shutdown. When active, ITRIP shuts down outputs and activates FAULT and  
RCIN low. When ITRIP becomes inactive, FAULT stays active low for an externally set time tFLTCLR, then  
automatically becomes inactive (openꢀdrain high impedance).  
An external RC network input used to define the FAULT CLEAR delay (tFLTCLR) approximately equal to R*C.  
When RCIN > 8 V, the FAULT pin goes back into an openꢀdrain highꢀimpedance state.  
ITRIP  
RCIN  
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IRS23365DM  
Lead Assignments  
The central exposed pad (35) has to be connected to COM for better electrical performance.  
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IRS23365DM  
Application Information and Additional Details  
Information regarding the following topics are included as subsections within this section of the datasheet.  
IGBT/MOSFET Gate Drive  
Switching and Timing Relationships  
Deadtime  
Matched Propagation Delays  
Input Logic Compatibility  
Undervoltage Lockout Protection  
ShootꢀThrough Protection  
Enable Input  
Fault Reporting and Programmable Fault Clear Timer  
OverꢀCurrent Protection  
OverꢀTemperature Shutdown Protection  
Truth Table: Undervoltage lockout, ITRIP, and ENABLE  
Advanced Input Filter  
ShortꢀPulse / Noise Rejection  
Integrated Bootstrap Functionality  
Bootstrap Power Supply Design  
Separate Logic and Power Grounds  
Tolerant to Negative VS Transients  
PCB Layout Tips  
Integrated Bootstrap FET limitation  
Additional Documentation  
IGBT/MOSFET Gate Drive  
The IRS23365D HVICs are designed to drive up to six MOSFET or IGBT power devices. Figures 1 and 2 illustrate several  
parameters associated with the gate drive functionality of the HVIC. The output current of the HVIC, used to drive the gate of the  
power switch, is defined as IO. The voltage that drives the gate of the external power switch is defined as VHO for the highꢀside  
power switch and VLO for the lowꢀside power switch; this parameter is sometimes generically called VOUT and in this case does not  
differentiate between the highꢀside or lowꢀside output voltage.  
VB  
VB  
(or VCC  
)
(or VCC)  
IO+  
HO  
HO  
(or LO)  
(or LO)  
+
IOꢀ  
VHO (or VLO)  
VS  
VS  
(or COM)  
(or COM)  
Figure 1: HVIC sourcing current  
Figure 2: HVIC sinking current  
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IRS23365DM  
Switching and Timing Relationships  
The relationship between the input and output signals of the IRS23365D are illustrated below in Figures 3 . From these  
figures, we can see the definitions of several timing parameters (i.e., PWIN, PWOUT, tON, tOFF, tR, and tF) associated with this  
device.  
LINx  
(or HINx)  
50%  
50%  
PWIN  
tOFF tF  
tON tR  
PWOUT  
90%  
10%  
90%  
10%  
LOx  
(or HOx)  
Figure 3: Switching time waveforms  
The following two figures illustrate the timing relationships of some of the functionality of the IRS23365D; this functionality is  
described in further detail later in this document.  
During interval A of Figure 4, the HVIC has received the command to turnꢀon both the highꢀ and lowꢀside switches at the same  
time; as a result, the shootꢀthrough protection of the HVIC has prevented this condition and both the highꢀ and lowꢀside output  
are held in the off state.  
Interval B of Figures 4 and 5 shows that the signal on the ITRIP input pin has gone from a low to a high state; as a result, all of  
the gate drive outputs have been disabled (i.e., see that HOx has returned to the low state; LOx is also held low), the voltage  
on the RCIN pin has been pulled to 0 V, and a fault is reported by the FAULT output transitioning to the low state. Once the  
ITRIP input has returned to the low state, the output will remain disabled and the fault condition reported until the voltage on  
the RCIN pin charges up to VRCIN,TH (see interval C in Figure 6); the charging characteristics are dictated by the RC network  
attached to the RCIN pin.  
During intervals D and E of Figure 4, we can see that the enable (EN) pin has been pulled low (as is the case when the driver IC  
has received a command from the control IC to shutdown); this results in the outputs (HOx and LOx) being held in the low state  
until the enable pin is pulled high.  
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IRS23365DM  
Figure 4: Input/output timing diagram  
Interval B  
Interval C  
VIT,THꢀ  
VIT,TH+  
ITRIP  
FAULT  
50%  
50%  
tFLT  
RCIN  
HOx  
VRCIN,TH  
tFLTCLR  
90%  
tITRIP  
Figure 5: Detailed view of B & C intervals  
Deadtime  
This family of HVICs features integrated deadtime protection circuitry. The deadtime for these ICs is fixed; other ICs within  
IR’s HVIC portfolio feature programmable deadtime for greater design flexibility. The deadtime feature inserts a time period (a  
minimum deadtime) in which both the highꢀ and lowꢀside power switches are held off; this is done to ensure that the power  
switch being turned off has fully turned off before the second power switch is turned on. This minimum deadtime is  
automatically inserted whenever the external deadtime is shorter than DT; external deadtimes larger than DT are not modified  
by the gate driver. Figure 6 illustrates the deadtime period and the relationship between the output gate signals.  
The deadtime circuitry of the IRS23365D is matched with respect to the highꢀ and lowꢀside outputs of a given channel;  
additionally, the deadtimes of each of the three channels are matched. Figure 6 defines the two deadtime parameters (i.e.,  
DT1 and DT2) of a specific channel; the deadtime matching parameter (MDT) associated with the IRS23365D specifies the  
maximum difference between DT1 and DT2. The MDT parameter also applies when comparing the DT of one channel of the  
IRS23365D to that of another.  
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IRS23365DM  
Figure 6: Illustration of deadtime  
Matched Propagation Delays  
The IRS23365D is designed with propagation delay matching circuitry. With this feature, the IC’s response at the output to a  
signal at the input requires approximately the same time duration (i.e., tON, tOFF) for both the lowꢀside channels and the highꢀ  
side channels; the maximum difference is specified by the delay matching parameter (MT). Additionally, the propagation delay  
for each lowꢀside channel is matched when compared to the other lowꢀside channels and the propagation delays of the highꢀ  
side channels are matched with each other; the MT specification applies as well. The propagation turnꢀon delay (tON) of the  
IRS23365D is matched to the propagation turnꢀon delay (tOFF).  
Input Logic Compatibility  
The inputs of this IC are compatible with standard CMOS and TTL outputs. The IRS23365D has been designed to be  
compatible with 3.3 V and 5 V logicꢀlevel signals. Figure 7 illustrates an input signal to the IRS23365D, its input threshold  
values, and the logic state of the IC as a result of the input signal.  
Figure 7: HIN & LIN input thresholds  
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IRS23365DM  
Undervoltage Lockout Protection  
This family of ICs provides undervoltage lockout protection on both the VCC (logic and lowꢀside circuitry) power supply and the  
VBS (highꢀside circuitry) power supply. Figure 8 is used to illustrate this concept; VCC (or VBS) is plotted over time and as the  
waveform crosses the UVLO threshold (VCCUV+/ꢀ or VBSUV+/ꢀ) the undervoltage protection is enabled or disabled.  
Upon powerꢀup, should the VCC voltage fail to reach the VCCUV+ threshold, the IC will not turnꢀon. Additionally, if the VCC  
voltage decreases below the VCCUVꢀ threshold during operation, the undervoltage lockout circuitry will recognize a fault  
condition and shutdown the highꢀ and lowꢀside gate drive outputs, and the FAULT pin will transition to the low state to inform  
the controller of the fault condition.  
Upon powerꢀup, should the VBS voltage fail to reach the VBSUV threshold, the IC will not turnꢀon. Additionally, if the VBS voltage  
decreases below the VBSUV threshold during operation, the undervoltage lockout circuitry will recognize a fault condition, and  
shutdown the highꢀside gate drive outputs of the IC.  
The UVLO protection ensures that the IC drives the external power devices only when the gate supply voltage is sufficient to  
fully enhance the power devices. Without this feature, the gates of the external power switch could be driven with a low  
voltage, resulting in the power switch conducting current while the channel impedance is high; this could result in very high  
conduction losses within the power device and could lead to power device failure.  
Figure 8: UVLO protection  
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IRS23365DM  
ShootꢀThrough Protection  
The IRS23365D is equipped with shootꢀthrough protection circuitry (also known as crossꢀconduction prevention circuitry).  
Figure 9 shows how this protection circuitry prevents both the highꢀ and lowꢀside switches from conducting at the same time.  
Table 1 illustrates the input/output relationship of the devices in the form of a truth table.  
Figure 9: Illustration of shootꢀthrough protection circuitry  
IRS23365D  
HIN  
0
LIN  
0
HO  
0
LO  
0
0
1
1
0
1
0
0
1
1
1
0
0
Table 1: Input/output truth table for IRS23365D  
Enable Input  
The IRS23365D is equipped with an enable input pin that is used to shutdown or enable the HVIC. When the EN pin is in the  
high state the HVIC is able to operate normally (assuming no other fault conditions). When a condition occurs that should  
shutdown the HVIC, the EN pin should see a low logic state. The enable circuitry of the IRS23365D features an input filter; the  
minimum input duration is specified by tFILTER,EN. Please refer to the EN pin parameters VEN,TH+, VEN,THꢀ, and IEN for the details  
of its use. Table 2 gives a summary of this pin’s functionality and Figure 10 illustrates the outputs’ response to a shutdown  
command.  
EN  
VEN,THꢀ  
Enable Input  
tEN  
Enable input high  
Enable input low  
Outputs enabled*  
Outputs disabled  
90%  
HOx  
(or LOx)  
Table 2: Enable functionality truth table  
(*assumes no other fault condition)  
Figure 10: Output enable timing waveform  
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Fault Reporting and Programmable Fault Clear Timer  
The IRS23365D provides an integrated fault reporting output and an adjustable fault clear timer. There are two situations that  
would cause the HVIC to report a fault via the FAULT pin. The first is an undervoltage condition of VCC and the second is if the  
ITRIP pin recognizes a fault. Once the fault condition occurs, the FAULT pin is internally pulled to VSS and the fault clear timer  
is activated. The fault output stays in the low state until the fault condition has been removed and the fault clear timer expires;  
once the fault clear timer expires, the voltage on the FAULT pin will return to VCC  
.
The length of the fault clear time period (tFLTCLR) is determined by exponential charging characteristics of the capacitor where  
the time constant is set by RRCIN and CRCIN. In Figure 11 where we see that a fault condition has occurred (UVLO or ITRIP),  
RCIN and FAULT are pulled to VSS, and once the fault has been removed, the fault clear timer begins. Figure 12 shows that  
RRCIN is connected between the VCC and the RCIN pin, while CRCIN is placed between the RCIN and VSS pins.  
Figure 11: RCIN and FAULT pin waveforms  
Figure 12: Programming the fault clear timer  
The design guidelines for this network are shown in Table 3.  
≤1 nF  
Ceramic  
CRCIN  
0.5 Mꢂ to 2 Mꢂ  
>> RON,RCIN  
RRCIN  
Table 3: Design guidelines  
The length of the fault clear time period can be determined by using the formula below.  
vC(t) = Vf(1ꢀeꢀt/RC  
)
tFLTCLR = ꢀ(RRCINCRCIN)ln(1ꢀVRCIN,TH/VCC  
)
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IRS23365DM  
OverꢀCurrent Protection  
The IRS23365D HVICs are equipped with an ITRIP input pin. This functionality can be used to detect overꢀcurrent events in  
the DCꢀ bus. Once the HVIC detects an overꢀcurrent event through the ITRIP pin, the outputs are shutdown, a fault is  
reported through the FAULT pin, and RCIN is pulled to VSS  
.
The level of current at which the overꢀcurrent protection is initiated is determined by the resistor network (i.e., R0, R1, and R2)  
connected to ITRIP as shown in Figure 13, and the ITRIP threshold (VIT,TH+). The circuit designer will need to determine the  
maximum allowable level of current in the DCꢀ bus and select R0, R1, and R2 such that the voltage at node VX reaches the  
overꢀcurrent threshold (VIT,TH+) at that current level.  
VIT,TH+ = R0IDCꢀ(R1/(R1+R2))  
Figure 13: Programming the overꢀcurrent protection  
For example, a typical value for resistor R0 could be 50 mꢂ. The voltage of the ITRIP pin should not be allowed to exceed 5  
V; if necessary, an external voltage clamp may be used.  
OverꢀTemperature Shutdown Protection  
The ITRIP input of the IRS23365D can also be used to detect overꢀtemperature events in the system and initiate a shutdown  
of the HVIC (and power switches) at that time. In order to use this functionality, the circuit designer will need to design the  
resistor network as shown in Figure 14 and select the maximum allowable temperature.  
This network consists of a thermistor and two standard resistors R3 and R4. As the temperature changes, the resistance of the  
thermistor will change; this will result in a change of voltage at node VX. The resistor values should be selected such the  
voltage VX should reach the threshold voltage (VIT,TH+) of the ITRIP functionality by the time that the maximum allowable  
temperature is reached. The voltage of the ITRIP pin should not be allowed to exceed 5 V.  
When using both the overꢀcurrent protection and overꢀtemperature protection with the ITRIP input, ORꢀing diodes (e.g.,  
DL4148) can be used. This network is shown in Figure 15; the ORꢀing diodes have been labeled D1 and D2.  
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Figure 14: Programming overꢀtemperature  
protection  
Figure 15: Using overꢀcurrent protection and overꢀ  
temperature protection  
Truth Table: Undervoltage lockout, ITRIP, and ENABLE  
Table 4 provides the truth table for the IRS23365D. The first line shows that the UVLO for VCC has been tripped; the FAULT  
output has gone low and the gate drive outputs have been disabled. is not latched in this case and when VCC is greater  
VCCUV  
than  
, the FAULT output returns to the high impedance state.  
VCCUV  
The second case shows that the UVLO for VBS has been tripped and that the highꢀside gate drive outputs have been disabled.  
After VBS exceeds the , HO will stay low until the HVIC input receives a new rising transition of HIN. The third  
VBSUV threshold  
case shows the normal operation of the HVIC. The fourth case illustrates that the ITRIP trip threshold has been reached and  
that the gate drive outputs have been disabled and a fault has been reported through the fault pin. In the last case, the HVIC  
has received a command through the EN input to shutdown; as a result, the gate drive outputs have been disabled.  
VCC  
VBS  
ITRIP  
EN  
RCIN  
High  
High  
High  
Low  
FAULT  
0
High impedance  
High impedance  
0
LO  
0
LIN  
LIN  
0
HO  
0
0
HIN  
0
0
<
UVLO VCC  
UVLO VBS  
Normal operation  
ITRIP fault  
VCCUV  
15 V  
15 V  
15 V  
15 V  
<
0 V  
0 V  
>VITRIP  
0 V  
5 V  
5 V  
5 V  
0 V  
VBSUV  
15 V  
15 V  
15 V  
EN command  
High  
High impedance  
0
Table 4: IRS23365D UVLO, ITRIP, EN, RCIN, & FAULT truth table  
Advanced Input Filter  
The advanced input filter allows an improvement in the input/output pulse symmetry of the HVIC and helps to reject noise  
spikes and short pulses. This input filter has been applied to the HIN, LIN, and EN inputs. The working principle of the new  
filter is shown in Figures 16 and 17.  
Figure 16 shows a typical input filter and the asymmetry of the input and output. The upper pair of waveforms (Example 1)  
show an input signal with a duration much longer then tFIL,IN; the resulting output is approximately the difference between the  
input signal and tFIL,IN  
.
The lower pair of waveforms (Example 2) show an input signal with a duration slightly longer then  
tFIL,IN; the resulting output is approximately the difference between the input signal and tFIL,IN  
.
Figure 17 shows the advanced input filter and the symmetry between the input and output. The upper pair of waveforms  
(Example 1) show an input signal with a duration much longer then tFIL,IN; the resulting output is approximately the same  
duration as the input signal. The lower pair of waveforms (Example 2) show an input signal with a duration slightly longer  
then tFIL,IN; the resulting output is approximately the same duration as the input signal.  
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Figure 16: Typical input filter  
Figure 17: Advanced input filter  
ShortꢀPulse / Noise Rejection  
This device’s input filter provides protection against shortꢀpulses (e.g., noise) on the input lines. If the duration of the input  
signal is less than tFIL,IN, the output will not change states. Example 1 of Figure 18 shows the input and output in the low state  
with positive noise spikes of durations less than tFIL,IN; the output does not change states. Example 2 of Figure 18 shows the  
input and output in the high state with negative noise spikes of durations less than tFIL,IN; the output does not change states.  
Figure 18: Noise rejecting input filters  
Figures 19 and 20 present lab data that illustrates the characteristics of the input filters while receiving ON and OFF pulses.  
The input filter characteristic is shown in Figure 19; the left side illustrates the narrow pulse ON (short positive pulse)  
characteristic while the left shows the narrow pulse OFF (short negative pulse) characteristic. The xꢀaxis of Figure 19 shows  
the duration of PWIN, while the yꢀaxis shows the resulting PWOUT duration. It can be seen that for a PWIN duration less than  
tFIL,IN, that the resulting PWOUT duration is zero (e.g., the filter rejects the input signal/noise). We also see that once the PWIN  
duration exceed tFIL,IN, that the PWOUT durations mimic the PWIN durations very well over this interval with the symmetry  
improving as the duration increases. To ensure proper operation of the HVIC, it is suggested that the input pulse width for the  
highꢀside inputs be ≥ 500 ns.  
The difference between the PWOUT and PWIN signals of both the narrow ON and narrow OFF cases is shown in Figure 20; the  
careful reader will note the scale of the yꢀaxis. The xꢀaxis of Figure 20 shows the duration of PWIN, while the yꢀaxis shows the  
resulting PWOUT–PWIN duration. This data illustrates the performance and near symmetry of this input filter.  
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Figure 19: IRS23365D input filter characteristic  
Figure 20: Difference between the input pulse and the output pulse  
Integrated Bootstrap Functionality  
The new IRS23365D family features integrated highꢀvoltage bootstrap MOSFETs that eliminate the need of the external  
bootstrap diodes and resistors in many applications.  
There is one bootstrap MOSFET for each highꢀside output channel and it is connected between the VCC supply and its  
respective floating supply (i.e., VB1, VB2, VB3); see Figure 21 for an illustration of this internal connection.  
The integrated bootstrap MOSFET is turned on only during the time when LO is ‘high’, and it has a limited source current due  
to RBS. The VBS voltage will be charged each cycle depending on the onꢀtime of LO and the value of the CBS capacitor, the  
drainꢀsource (collectorꢀemitter) drop of the external IGBT (or MOSFET), and the lowꢀside freeꢀwheeling diode drop.  
The bootstrap MOSFET of each channel follows the state of the respective lowꢀside output stage (i.e., the bootstrap MOSFET  
is ON when LO is high, it is OFF when LO is low), unless the VB voltage is higher than approximately 110% of VCC. In that  
case, the bootstrap MOSFET is designed to remain off until VB returns below that threshold; this concept is illustrated in Figure  
22.  
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IRS23365DM  
VB1  
VCC  
VB2  
VB3  
Figure 21: Internal bootstrap MOSFET connection  
Figure 22: Bootstrap MOSFET state diagram  
A bootstrap MOSFET is suitable for most of the PWM modulation schemes and can be used either in parallel with the external  
bootstrap network (i.e., diode and resistor) or as a replacement of it. The use of the integrated bootstrap as a replacement of  
the external bootstrap network may have some limitations. An example of this limitation may arise when this functionality is  
used in nonꢀcomplementary PWM schemes (typically 6ꢀstep modulations) and at very high PWM duty cycle. In these cases,  
superior performances can be achieved by using an external bootstrap diode in parallel with the internal bootstrap network.  
Bootstrap Power Supply Design  
For information related to the design of the bootstrap power supply while using the integrated bootstrap functionality of the  
IRS23365D, please refer to Application Note 1123 (ANꢀ1123) entitled “Bootstrap Network Analysis: Focusing on the Integrated  
Bootstrap Functionality.” This application note is available at www.irf.com.  
For information related to the design of a standard bootstrap power supply (i.e., using an external discrete diode) please refer  
to Design Tip 04ꢀ4 (DT04ꢀ4) entitled “Using Monolithic High Voltage Gate Drivers.” This design tip is available at www.irf.com.  
Separate Logic and Power Grounds  
The IRS23365D has separate logic and power ground pin (VSS and COM respectively) to eliminate some of the noise  
problems that can occur in power conversion applications. Current sensing shunts are commonly used in many applications  
for power inverter protection (i.e., overꢀcurrent protection), and in the case of motor drive applications, for motor current  
measurements. In these situations, it is often beneficial to separate the logic and power grounds.  
Figure 23 shows a HVIC with separate VSS and COM pins and how these two grounds are used in the system. The VSS is  
used as the reference point for the logic and overꢀcurrent circuitry; VX in the figure is the voltage between the ITRIP pin and  
the VSS pin. Alternatively, the COM pin is the reference point for the lowꢀside gate drive circuitry. The output voltage used to  
drive the lowꢀside gate is VLOꢀCOM; the gateꢀemitter voltage (VGE) of the lowꢀside switch is the output voltage of the driver  
minus the drop across RG,LO  
.
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IRS23365DM  
DC+ BUS  
DBS  
VB  
(x3)  
VCC  
CBS  
HO  
RG,HO  
(x3)  
VS  
(x3)  
VS1  
VS2  
VS3  
LO  
(x3)  
RG,LO  
ITRIP  
+
+
+
VGE1  
VGE2  
VGE3  
VSS  
COM  
R2  
R0  
+
R1  
VX  
DCꢀ BUS  
Figure 23: Separate VSS and COM pins  
Tolerant to Negative VS Transients  
A common problem in today’s highꢀpower switching converters is the transient response of the switch node’s voltage as the  
power switches transition on and off quickly while carrying a large current. A typical 3ꢀphase inverter circuit is shown in Figure  
24; here we define the power switches and diodes of the inverter.  
If the highꢀside switch (e.g., the IGBT Q1 in Figures 25 and 26) switches off, while the U phase current is flowing to an  
inductive load, a current commutation occurs from highꢀside switch (Q1) to the diode (D2) in parallel with the lowꢀside switch of  
the same inverter leg. At the same instance, the voltage node VS1, swings from the positive DC bus voltage to the negative  
DC bus voltage.  
Figure 24: Three phase inverter  
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IRS23365DM  
DC+ BUS  
Q1  
ON  
IU  
VS1  
D2  
Q2  
OFF  
DCꢀ BUS  
Figure 25: Q1 conducting  
Figure 26: D2 conducting  
Also when the V phase current flows from the inductive load back to the inverter (see Figures 27 and 28), and Q4  
IGBT switches on, the current commutation occurs from D3 to Q4. At the same instance, the voltage node, VS2,  
swings from the positive DC bus voltage to the negative DC bus voltage.  
Figure 27: D3 conducting  
Figure 28: Q4 conducting  
However, in a real inverter circuit, the VS voltage swing does not stop at the level of the negative DC bus, rather it swings  
below the level of the negative DC bus. This undershoot voltage is called “negative VS transient”.  
The circuit shown in Figure 29 depicts one leg of the three phase inverter; Figures 30 and 31 show a simplified illustration of  
the commutation of the current between Q1 and D2. The parasitic inductances in the power circuit from the die bonding to the  
PCB tracks are lumped together in LC and LE for each IGBT. When the highꢀside switch is on, VS1 is below the DC+ voltage by  
the voltage drops associated with the power switch and the parasitic elements of the circuit. When the highꢀside power switch  
turns off, the load current momentarily flows in the lowꢀside freewheeling diode due to the inductive load connected to VS1 (the  
load is not shown in these figures). This current flows from the DCꢀ bus (which is connected to the COM pin of the HVIC) to  
the load and a negative voltage between VS1 and the DCꢀ Bus is induced (i.e., the COM pin of the HVIC is at a higher potential  
than the VS pin).  
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Figure 29: Parasitic Elements  
Figure 30: VS positive  
Figure 31: VS negative  
In a typical motor drive system, dV/dt is typically designed to be in the range of 3ꢀ5 V/ns. The negative VS transient voltage can  
exceed this range during some events such as short circuit and overꢀcurrent shutdown, when di/dt is greater than in normal  
operation.  
International Rectifier’s HVICs have been designed for the robustness required in many of today’s demanding applications.  
The IRS23365D has been seen to withstand large negative VS transient conditions on the order of ꢀ50 V for a period of 50 ns.  
An illustration of the IRS23365D’s performance can be seen in Figure 32. This experiment was conducted using various loads  
to create this condition; the curve shown in this figure illustrates the successful operation of the IRS2336D under these  
stressful conditions. In case of ꢀVS transients greater then ꢀ20 V for a period of time greater than 100 ns; the HVIC is designed  
to hold the highꢀside outputs in the off state for 4.5 ꢃs in order to ensure that the highꢀ and lowꢀside power switches are not on  
at the same time.  
Figure 32: Negative VS transient results for an International Rectifier HVIC  
Even though the IRS23365D has been shown able to handle these large negative VS transient conditions, it is highly  
recommended that the circuit designer always limit the negative VS transients as much as possible by careful PCB layout and  
component use.  
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IRS23365DM  
PCB Layout Tips  
Distance between high and low voltage components: It’s strongly recommended to place the components tied to the floating  
voltage pins (VB and VS) near the respective high voltage portions of the device.  
Ground Plane: In order to minimize noise coupling, the ground plane should not be placed under or near the high voltage  
floating side. The central exposed pad has to be connected to COM for better electrical performance.  
Gate Drive Loops: Current loops behave like antennas and are able to receive and transmit EM noise (see Figure 33). In order  
to reduce the EM coupling and improve the power switch turn on/off performance, the gate drive loops must be reduced as  
much as possible. Moreover, current can be injected inside the gate drive loop via the IGBT collectorꢀtoꢀgate parasitic  
capacitance. The parasitic autoꢀinductance of the gate loop contributes to developing a voltage across the gateꢀemitter, thus  
increasing the possibility of a self turnꢀon effect.  
Figure 33: Antenna Loops  
Supply Capacitor: It is recommended to place a bypass capacitor (CIN) between the VCC and VSS pins. This connection is  
shown in Figure 34. A ceramic 1 ꢃF ceramic capacitor is suitable for most applications. This component should be placed as  
close as possible to the pins in order to reduce parasitic elements  
.
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Figure 34: Supply capacitor  
Routing and Placement: Power stage PCB parasitic elements can contribute to large negative voltage transients at the switch  
node; it is recommended to limit the phase voltage negative transients. In order to avoid such conditions, it is recommended  
to 1) minimize the highꢀside emitter to lowꢀside collector distance, and 2) minimize the lowꢀside emitter to negative bus rail  
stray inductance. However, where negative VS spikes remain excessive, further steps may be taken to reduce the spike. This  
includes placing a resistor (5 ꢂ or less) between the VS pin and the switch node (see Figure 35), and in some cases using a  
clamping diode between VSS and VS (see Figure 36). See DT04ꢀ4 at www.irf.com for more detailed information.  
Figure 36: VS resistor  
Figure 37: VS clamping diode  
Additional Documentation  
Several technical documents related to the use of HVICs are available at www.irf.com; use the Site Search function and the  
document number to quickly locate them. Below is a short list of some of these documents.  
DT97ꢀ3: Managing Transients in Control IC Driven Power Stages  
ANꢀ1123: Bootstrap Network Analysis: Focusing on the Integrated Bootstrap Functionality  
DT04ꢀ4: Using Monolithic High Voltage Gate Drivers  
ANꢀ978: HV Floating MOSꢀGate Driver ICs  
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IRS23365DM  
Parameter Temperature Trends  
Figures 38ꢀ59 provide information on the experimental performance of the IRS23365D HVIC. The line plotted in each figure  
is generated from actual lab data. A small number of individual samples were tested at three temperatures (ꢀ40 ºC, 25 ºC,  
and 125 ºC) in order to generate the experimental (Exp.) curve. The line labeled Exp. consist of three data points (one data  
point at each of the tested temperatures) that have been connected together to illustrate the understood temperature trend.  
The individual data points on the curve were determined by calculating the averaged experimental value of the parameter  
(for a given temperature).  
1000  
800  
600  
400  
200  
0
1000  
800  
600  
400  
200  
0
Exp.  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 38: tON vs. temperature  
Figure 39: tOFF vs. temperature  
600  
450  
300  
150  
0
1500  
1200  
900  
600  
300  
0
Exp.  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 40: DT vs. temperature  
Figure 41: tITRIP vs. temperature  
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IRS23365DM  
1200  
1000  
800  
600  
400  
200  
0
1000  
800  
600  
400  
200  
0
Exp.  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
100  
100  
125  
125  
125  
Temperature (oC)  
Temperature (oC)  
Figure 42: tFLT vs. temperature  
Figure 43: tEN vs. temperature  
60  
40  
20  
0
60  
40  
20  
0
Exp.  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 44: MT vs. temperature  
Figure 45: MDT vs. temperature  
60  
40  
20  
0
16  
12  
8
Exp.  
Exp.  
4
0
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
Temperature (oC)  
Temperature (oC)  
Figure 46: PM vs. temperature  
Figure 47: IITRIP+ vs. temperature  
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5
4
3
2
1
0
120  
100  
80  
60  
40  
20  
0
Exp.  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
100  
100  
125  
125  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 48: IQCC vs. temperature  
Figure 49: IQBS vs. temperature  
0.60  
0.40  
0.20  
0.00  
0.60  
Exp.  
0.40  
0.20  
0.00  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
Temperature (oC)  
Temperature (oC)  
Figure 50: IO+ vs. temperature  
Figure 51: IOꢀ vs. temperature  
12  
10  
8
12  
10  
8
Exp.  
Exp.  
6
6
4
4
2
2
0
0
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
Temperature (oC)  
Temperature (oC)  
Figure 52: VCCUV+ vs. temperature  
Figure 53: VCCUVꢀ vs. temperature  
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10  
9
10  
9
Exp.  
Exp.  
8
8
7
7
6
6
5
5
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 54: VBSUV+ vs. temperature  
Figure 55: VBSUVꢀ vs. temperature  
800  
600  
400  
200  
800  
600  
400  
200  
0
Exp.  
EXP.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 56: VIT,TH+ vs. temperature  
Figure 57: VIT,THꢀ vs. temperature  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
Exp.  
Exp.  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
ꢀ50  
ꢀ25  
0
25  
50  
75  
100  
125  
Temperature (oC)  
Temperature (oC)  
Figure 58: RON,RCIN vs. temperature  
Figure 59: RON,FLT vs. temperature  
33 www.irf.com  
© 2012 International Rectifier  
3 December, 2012  
IRS23365DM  
Case outline drawing for: MLPQ7X7  
34 www.irf.com  
© 2012 International Rectifier  
3 December, 2012  
IRS23365DM  
Tape and Reel Details: MLPQ7X7  
LOADED TAPE FEED DIRECTION  
A
B
H
D
F
C
NOTE : CONTROLLING  
DIMENSION IN MM  
E
G
CARRIER TAPE DIMENSION FOR 48MLPQ7X7  
Metric  
Min  
Imperial  
Min  
Code  
A
B
C
D
E
F
G
H
Max  
12.10  
4.10  
16.30  
7.60  
7.35  
7.35  
n/a  
Max  
0.476  
0.161  
0.641  
0.299  
0.289  
0.289  
n/a  
11.90  
3.90  
15.70  
7.40  
7.15  
7.15  
1.50  
1.50  
0.474  
0.153  
0.618  
0.291  
0.281  
0.281  
0.059  
0.059  
1.60  
0.062  
F
D
B
C
A
E
G
H
REEL DIMENSIONS FOR 48MLPQ7X7  
Metric  
Min  
329.60  
20.95  
12.80  
1.95  
98.00  
n/a  
18.5  
Imperial  
Min  
Code  
A
B
C
D
E
F
G
H
Max  
330.25  
21.45  
13.20  
2.45  
102.00  
22.4  
21.1  
Max  
13.001  
0.844  
0.519  
0.096  
4.015  
0.881  
0.83  
12.976  
0.824  
0.503  
0.767  
3.858  
n/a  
0.728  
0.645  
16.4  
18.4  
0.724  
35 www.irf.com  
© 2012 International Rectifier  
3 December, 2012  
IRS23365DM  
Part Marking Information  
36 www.irf.com  
© 2012 International Rectifier  
3 December, 2012  
IRS23365DM  
Ordering Information  
Standard Pack  
Base Part Number  
Package Type  
Complete Part Number  
Form  
Quantity  
52  
Tube/Bulk  
IRS23365DMPbF  
IRS23365D  
MLPQ7x7 48L  
Tape and Reel  
3000  
IRS23365DMTRPbF  
The information provided in this document is believed to be accurate and reliable. However, International Rectifier assumes no  
responsibility for the consequences of the use of this information. International Rectifier assumes no responsibility for any infringement of  
patents or of other rights of third parties which may result from the use of this information. No license is granted by implication or otherwise  
under any patent or patent rights of International Rectifier. The specifications mentioned in this document are subject to change without  
notice. This document supersedes and replaces all information previously supplied.  
For technical support, please contact IR’s Technical Assistance Center  
http://www.irf.com/technicalꢀinfo/  
WORLD HEADQUARTERS:  
233 Kansas St., El Segundo, California 90245  
Tel: (310) 252ꢀ7105  
Revision History  
Date  
Comment  
09/28/11  
10/11/11  
Original document.  
Iin+ and Iinꢀ updated  
03/27/2012 New datasheet format  
04/27/2012 Add explanation about exposed pad  
37 www.irf.com  
© 2012 International Rectifier  
3 December, 2012  

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