JANTXV2N7228U [INFINEON]
POWER MOSFET SURFACE MOUNT(SMD-1); 功率MOSFET表面贴装( SMD - 1 )型号: | JANTXV2N7228U |
厂家: | Infineon |
描述: | POWER MOSFET SURFACE MOUNT(SMD-1) |
文件: | 总7页 (文件大小:184K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PD - 90418C
IRFN450
JANTX2N7228U
JANTXV2N7228U
POWER MOSFET
SURFACE MOUNT(SMD-1)
REF:MIL-PRF-19500/592
500V, N-CHANNEL
HEXFET® MOSFETTECHNOLOGY
Product Summary
Part Number
RDS(on)
ID
IRFN450
0.415 Ω
12A
HEXFET® MOSFET technology is the key to International
Rectifier’s advanced line of power MOSFET transistors. The
efficient geometry design achieves very low on-state re-
sistance combined with high transconductance. HEXFET
transistors also feature all of the well-established advan-
tages of MOSFETs, such as voltage control, very fast switch-
ing, ease of paralleling and electrical parameter temperature
stability. They are well-suited for applications such as switch-
ing power supplies, motor controls, inverters, choppers,
audio amplifiers, high energy pulse circuits, and virtually
any application where high reliability is required. The
HEXFET transistor’s totally isolated package eliminates the
need for additional isolating material between the device
and the heatsink. This improves thermal efficiency and
reduces drain capacitance.
SMD-1
Features:
n
n
n
n
n
n
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Electrically Isolated
Surface Mount
Dynamic dv/dt Rating
n Light-weight
Absolute Maximum Ratings
Parameter
Units
I
@ V
@ V
= 10V, T = 25°C
Continuous Drain Current
12
8.0
48
D
GS
C
A
I
= 10V, T = 100°C Continuous Drain Current
D
GS
C
I
Pulsed Drain Current ➀
Max. Power Dissipation
Linear Derating Factor
DM
@ T = 25°C
P
150
1.2
±20
750
12
W
W/°C
V
D
C
V
Gate-to-Source Voltage
Single Pulse Avalanche Energy ➀
Avalanche Current ➀
GS
E
AS
mJ
A
I
AR
E
Repetitive Avalanche Energy ➀
Peak Diode Recovery dv/dt ➀
Operating Junction
15
mJ
V/ns
AR
dv/dt
3.5
T
-55 to 150
J
T
Storage Temperature Range
Package Mounting Surface Temperature
Weight
oC
g
STG
300(for 5 seconds)
2.6 (Typical)
For footnotes refer to the last page
www.irf.com
1
1/25/01
IRFN450
Electrical Characteristics @Tj = 25°C (Unless Otherwise Specified)
Parameter
Min Typ Max Units
Test Conditions
BV
DSS
Drain-to-Source Breakdown Voltage
500
—
—
—
—
V
V
= 0V, I = 1.0mA
D
GS
V/°C Reference to 25°C, I = 1.0mA
∆BV
/∆T Temperature Coefficient of Breakdown
0.68
DSS
J
D
Voltage
R
Static Drain-to-Source On-State
Resistance
Gate Threshold Voltage
Forward Transconductance
Zero Gate Voltage Drain Current
—
—
2.0
6.5
—
—
—
—
—
—
—
0.415
0.515
4.0
V
= 10V, I = 8.0A
DS(on)
GS D
➀
Ω
V
= 10V, I = 12A
D
GS
V
V
V
= V , I = 250µA
GS(th)
fs
DS
GS
D
Ω
g
—
S ( )
V
> 15V, I
= 8.0A ➀
DS
V
DS
I
25
250
= 400V ,V =0V
DSS
DS GS
µA
—
V
= 400V,
DS
= 0V, T = 125°C
V
GS
J
I
I
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
Total Gate Charge
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
4.0
100
-100
120
19
V
= 20V
= -20V
GSS
GSS
GS
nA
nC
V
GS
Q
Q
Q
V
=10V, I = 12A
GS D
g
gs
gd
d(on)
r
Gate-to-Source Charge
Gate-to-Drain (‘Miller’) Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
FallTime
V
DS
=250V
70
t
t
t
t
35
V
= 250V, I = 12A,
DD
GS
D
190
170
130
—
V
=10V, R = 2.35Ω
G
ns
d(off)
f
Measured from the center of drain
pad to center of source pad.
L
+ L
Total Inductance
S
D
nH
C
C
C
Input Capacitance
—
—
—
2700
600
240
—
—
—
V
= 0V, V
= 25V
iss
GS
DS
f = 1.0MHz
Output Capacitance
Reverse Transfer Capacitance
pF
oss
rss
Source-Drain Diode Ratings and Characteristics
Parameter
Min Typ Max Units
Test Conditions
I
I
V
t
Continuous Source Current (Body Diode)
Pulse Source Current (Body Diode) ➀
Diode Forward Voltage
—
—
—
—
—
—
—
—
—
—
12
48
1.7
S
A
V
SM
T = 25°C, I = 12A, V
= 0V ➀
j
SD
rr
S
GS
Reverse Recovery Time
1600 nS
14 µC
T = 25°C, I = 12A, di/dt ≤ 100A/µs
j
F
Q
Reverse Recovery Charge
V
DD
≤ 30V ➀
RR
t
Forward Turn-On Time
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L + L .
S D
on
Thermal Resistance
Parameter
Min Typ Max Units
Test Conditions
R
R
Junction-to-Case
—
—
—
0.83
—
thJC
°C/W
Junction-to-PC board
3.0
Soldered to a copper-clad PC board
thJ-PCB
Note: Corresponding Spice and Saber models are available on the G&S Website.
For footnotes refer to the last page
2
www.irf.com
IRFN450
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs.Temperature
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3
IRFN450
13a & b
Fig 6. Typical Gate Charge Vs.
Fig 5. Typical Capacitance Vs.
Gate-to-SourceVoltage
Drain-to-SourceVoltage
Fig 8. Maximum Safe Operating Area
Fig 7. Typical Source-Drain Diode
ForwardVoltage
4
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IRFN450
RD
VDS
VGS
D.U.T.
RG
+VDD
-
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.
d(on)
d(off)
CaseTemperature
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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5
IRFN450
15V
DRIVER
L
V
D S
D.U .T
AS
.
R
G
+
-
V
D D
I
A
20V
1
0.01
Ω
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)D SS
t
p
Fig 12c. Maximum Avalanche Energy
Vs. DrainCurrent
I
AS
Current Regulator
Fig 12b. Unclamped Inductive Waveforms
Same Type as D.U.T.
50KΩ
.2µF
0
1V
Q
G
.3µF
10 V
+
V
DS
D.U.T.
-
Q
Q
GD
GS
V
GS
V
G
3mA
I
I
D
G
Charge
Current Sampling Resistors
Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
6
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IRFN450
Footnotes:
➀➀ I
SD
≤ 12A, di/dt ≤ 130A/µs,
➀➀ Repetitive Rating; Pulse width limited by
V
≤ 500V, T ≤ 150°C
maximum junction temperature.
DD
J
➀➀➀V
= 25V, starting T = 25°C, L= 10.4mH
J
DD
Peak I = 12A, V
➀➀➀Pulse width ≤ 300 µs; Duty Cycle ≤ 2%
= 10V
L
GS
Case Outline and Dimensions — SMD-1
PAD ASSIGNMENTS
1- DRAIN
2- GATE
3- SOURCE
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 01/02
www.irf.com
7
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