SPD08P06P G [INFINEON]

Infineon’s highly innovative OptiMOS™ families include p-channel power MOSFETs. These products consistently meet the highest quality and performance demands in key specifications for power system design such as on-state resistance and figure of merit characteristics.;
SPD08P06P G
型号: SPD08P06P G
厂家: Infineon    Infineon
描述:

Infineon’s highly innovative OptiMOS™ families include p-channel power MOSFETs. These products consistently meet the highest quality and performance demands in key specifications for power system design such as on-state resistance and figure of merit characteristics.

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SPD08P06P G  
SIPMOS® Power-Transistor  
Product Summary  
Features  
V DS  
-60  
0.3  
V
A
• P-Channel  
R DS(on),max  
I D  
• Enhancement mode  
-8.8  
• Avalanche rated  
• dv /dt rated  
PG-TO252-3  
• 175°C operating temperature  
• Pb-free lead finishing; RoHS compliant  
° Qualified according to AEC Q101  
Type  
Package  
Tape and reel information  
Marking Lead free  
08P06P Yes  
Packing  
SPD08P06PG PG-TO252-3  
1000 pcs / reel  
Non dry  
Value  
Parameter  
Symbol Conditions  
Unit  
steady state  
I D  
T A=25 °C  
T A=100 °C  
T A=25 °C  
-8.83  
Continuous drain current  
A
-6.25  
I D,pulse  
E AS  
-35.32  
Pulsed drain current  
I D=8.83 A, R GS=25  
70  
Avalanche energy, single pulse  
mJ  
Avalanche energy, periodic limited by  
Tjmax  
E AR  
4.2  
I D=8.83 A, V DS=48 V,  
di /dt =-200 A/µs,  
-6  
Reverse diode dv /dt  
dv /dt  
kV/µs  
T
j,max=175 °C  
V GS  
±20  
42  
Gate source voltage  
V
P tot  
T A=25 °C  
Power dissipation  
W
°C  
T j, T stg  
"-55 ... +175"  
Operating and storage temperature  
ESD class  
260 °C  
Soldering temperature  
IEC climatic category; DIN IEC 68-1  
55/175/56  
Rev 1.92  
page 1  
2012-09-10  
SPD08P06P G
Parameter  
Symbol Conditions  
Unit  
Values  
typ.  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
junction - case  
R thJC  
-
-
-
-
K/W  
3.6  
Thermal resistance,  
junction - ambient,leaded  
R thJA  
R thJA  
-
SMD version, device on PCB:  
minimal footprint  
-
-
-
-
75  
K/W  
6 cm2 cooling area1)  
50  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS  
V GS(th)  
V
V
GS=0 V, I D=-250 µA  
DS=V GS, I D=-250 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
-60  
-
-
V
-2.1  
-3.0  
-4  
V
DS=-60 V, V GS=0 V,  
I DSS  
Zero gate voltage drain current  
-
-0.1  
-1  
µA  
T j=25 °C  
V
DS=-60 V, V GS=0 V,  
-
-
-
-10  
-10  
230  
-100  
T j=150 °C  
I GSS  
V
V
GS=-20 V, V DS=0 V  
GS=-6.2 V, I D=-10 A  
Gate-source leakage current  
-100 nA  
R DS(on)  
Drain-source on-state resistance  
300  
-
mΩ  
|V DS|>2|I D|R DS(on)max  
I D=-6.2 A  
,
g fs  
Transconductance  
2.5  
4.9  
S
2
1) Device on 40mm*40mm*1.5mm epoxy PCB FR4 with 6 cm ( one layer, 70µ, thick) copper area for drain connection.  
PCB is vertical without blown air  
.
Rev 1.92  
page 2  
2012-09-10  
SPD08P06P G  
Values  
Unit  
Parameter  
Symbol Conditions  
min.  
typ.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
335  
105  
65  
420 pF  
135  
95  
V
GS=0 V, V DS=-25 V,  
C oss  
C rss  
t d(on)  
t r  
f =1 MHz  
16.0  
46.0  
48  
24.0  
69  
V
DD=-30 V, V GS=-  
10 V, I D=-6.2 A,  
R G=6 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
72  
14  
21  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
-1.9  
-5  
-2.6 nC  
Q gd  
-8  
V
V
DD=-48 V, I D=-8.8 A,  
GS=0 to -10 V  
Q g  
-10  
-6  
-13  
V plateau  
Gate plateau voltage  
-
V
A
Reverse Diode  
I S  
Diode continuous forward current  
Diode pulse current  
-
-
-
-
-8.80  
-35.3  
T A=25 °C  
I S,pulse  
V
GS=0 V, I F=-8.83 A,  
V SD  
t rr  
Diode forward voltage  
Reverse recovery time  
Reverse recovery charge  
-
-
-
-0.98  
60  
-1.55  
90  
V
T j=25 °C  
ns  
V R=30 V, I F=|I S|,  
di F/dt =100 A/µs  
Q rr  
100  
150 nC  
Rev 1.92  
page 3  
2012-09-10  
SPD08P06P G  
1 Power dissipation  
2 Drain current  
P
tot=f(T A)  
I D=f(T A); |V GS|10 V  
9
8
7
6
5
4
3
2
1
0
40  
30  
20  
10  
0
0
0
40  
80  
A [°C]  
120  
160  
40  
80  
120  
160  
T
A [°C]  
T
3 Safe operating area  
I D=f(V DS); T A=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
thJA=f(t p)  
Z
parameter: D =t p/T  
102  
101  
10 µs  
limited by on-state  
resistance  
100 µs  
101  
100  
0.5  
1 ms  
10 ms  
100  
0.2  
0.1  
DC  
0.05  
0.02  
0.01  
10-1  
single pulse  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
10-1  
10-2  
10-1  
100  
101  
102  
-V DS [V]  
t
p [s]  
Rev 1.92  
page 4  
2012-09-10  
SPD08P06P G  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
DS(on)=f(I D); T j=25 °C  
R
parameter: V GS  
parameter: V GS  
1000  
-20 V  
900  
800  
18  
-10 V  
15  
700  
-7 V  
-4 V  
-4.5 V  
600  
12  
9
-5 V  
500  
400  
300  
200  
100  
0
-5.5 V  
-6 V  
-6 V  
-7 V  
-5.5 V  
-5V  
6
-10 V  
-20V  
3
-4.5 V  
-4 V  
0
0
2
4
6
8
10  
12  
14  
0
1
2
3
4
5
6
7
8
-V DS [V]  
-ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
6
5
4
3
2
6
5
4
3
2
1
0
1
125 °C  
25 °C  
0
0
1
2
3
4
5
6
7
8
0
2
4
6
8
10  
-ID [A]  
-V GS [V]  
Rev 1.92  
page 5  
2012-09-10  
SPD08P06P G  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
R
DS(on)=f(T j); I D=-6.2 A; V GS=-10 V  
V
GS(th)=f(T j); V GS=V DS; I D=-250 µA  
700  
600  
500  
5
4.5  
max.  
4
3.5  
98 %  
typ.  
3
400  
2.5  
2
300  
min.  
1.5  
200  
typ.  
1
0.5  
0
100  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
T j [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
103  
175 °C, typ  
Ciss  
101  
100  
25 °C, 98%  
Coss  
Crss  
102  
175 °C, 98%  
10-1  
10-2  
25 °C, typ  
101  
0
5
10  
15  
20  
25  
0
0.5  
1
1.5  
2
2.5  
3
-V DS [V]  
-V SD [V]  
Rev 1.92  
page 6  
2012-09-10  
SPD08P06P G  
13 Avalanche characteristics  
AS=f(t AV); R GS=25 Ω  
14 Typ. gate charge  
GS=f(Q gate); I D=-8.8 A pulsed  
V
I
parameter: T j(start)  
parameter: V DD  
101  
16  
14  
12  
10  
8
25 °C  
30 V  
48 V  
100 °C  
12 V  
125 °C  
6
4
2
100  
100  
0
0
101  
102  
103  
3
6
9
12  
15  
t
AV [µs]  
Q
gate [nC]  
15 Drain-source breakdown voltage  
V
BR(DSS)=f(T j); I D=-250 µA  
70  
65  
60  
55  
50  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
Rev 1.92  
page 7  
2012-09-10  
SPD08P06P G  
Package outline: PG-TO252-3  
Rev 1.92  
page 8  
2012-09-10  
SPD08P06P G  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2008 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies  
hereby disclaims any and all warranties and liabilities of any kind, including without limitation,  
warranties of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
).  
the nearest Infineon Technologies Office (www.infineon.com  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office. Infineon  
Technologies components may be used in life-support devices or systems only with the express  
written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be  
implanted in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be  
endangered.  
Rev 1.92  
page 9  
2012-09-10  

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