SPW52N50C3 [INFINEON]

Cool MOS⑩ Power Transistor; 酷MOS ™功率晶体管
SPW52N50C3
型号: SPW52N50C3
厂家: Infineon    Infineon
描述:

Cool MOS⑩ Power Transistor
酷MOS ™功率晶体管

晶体 晶体管 脉冲 局域网
文件: 总11页 (文件大小:252K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SPW52N50C3  
Cool MOS™ Power Transistor  
Feature  
New revolutionary high voltage technology  
V
@ T  
560  
0.07  
52  
V
A
DS  
jmax  
R
DS(on)  
I
D
Worldwide best R  
in TO 247  
DS(on)  
P-TO247  
Ultra low gate charge  
Periodic avalanche rated  
Extreme dv/dt rated  
Ultra low effective capacitances  
Improved transconductance  
Type  
SPW52N50C3  
Package  
P-TO247  
Ordering Code  
Q67040-S4615  
Marking  
52N50C3  
Maximum Ratings  
Parameter  
Symbol  
Value  
Unit  
A
Continuous drain current  
I
D
T = 25 °C  
52  
30  
C
T = 100 °C  
C
156  
1800  
Pulsed drain current, t limited by T  
Avalanche energy, single pulse  
I
E
p
jmax  
D puls  
mJ  
AS  
I = 10 A, V = 50 V  
D
DD  
1)  
jmax  
E
1
Avalanche energy, repetitive t limited by T  
AR  
AR  
I = 20 A, V = 50 V  
D
DD  
20  
A
V
Avalanche current, repetitive t limited by T  
Gate source voltage  
I
V
AR  
jmax AR  
±20  
30  
417  
GS  
V
P
Gate source voltage AC (f >1Hz)  
GS  
tot  
Power dissipation, T = 25°C  
W
C
°C  
Operating and storage temperature  
T , T  
-55... +150  
j
stg  
Page 1  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
Maximum Ratings  
Parameter  
Symbol  
Value  
Unit  
Drain Source voltage slope  
dv/dt  
50  
V/ns  
V
= 400 V, I = 52 A, T = 125 °C  
D j  
DS  
Thermal Characteristics  
Parameter  
Symbol  
Values  
Unit  
min.  
typ. max.  
R
-
-
-
-
-
0.3 K/W  
62  
Thermal resistance, junction - case  
Thermal resistance, junction - ambient, leaded  
Soldering temperature,  
thJC  
R
thJA  
T
-
260 °C  
sold  
1.6 mm (0.063 in.) from case for 10s  
Electrical Characteristics, at Tj=25°C unless otherwise specified  
Parameter  
Symbol  
Conditions  
Values  
Unit  
min.  
typ. max.  
V
V
=0V, I =0.25mA 500  
-
-
-
V
Drain-source breakdown voltage  
Drain-Source avalanche  
breakdown voltage  
(BR)DSS GS  
D
V
=0V, I =20A  
-
600  
V
GS  
D
(BR)DS  
I =2700µΑ, V =V  
2.1  
3
3.9  
Gate threshold voltage  
Zero gate voltage drain current  
V
I
D
GS DS  
GS(th)  
V
=500V, V =0V,  
µA  
DS  
GS  
DSS  
T =25°C,  
-
-
0.5  
-
25  
250  
j
T =150°C  
j
V
V
=20V, V =0V  
-
-
100 nA  
Gate-source leakage current  
Drain-source on-state resistance R  
I
GSS  
GS  
DS  
=10V, I =30A,  
GS  
D
DS(on)  
T =25°C  
-
-
-
0.06  
0.16  
0.7  
0.07  
-
-
j
T =150°C  
j
R
f=1MHz, open Drain  
Gate input resistance  
G
Page 2  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
Electrical Characteristics , at T = 25 °C, unless otherwise specified  
j
Parameter  
Symbol  
Conditions  
Values  
typ. max.  
Unit  
S
min.  
Transconductance  
g
V
2*I *R  
DS(on)max  
,
-
40  
-
fs  
DS  
D
I =30A  
D
Input capacitance  
C
V
=0V, V =25V,  
-
-
-
-
6800  
2200  
150  
-
-
-
-
pF  
iss  
GS  
DS  
f=1MHz  
Output capacitance  
C
oss  
Reverse transfer capacitance  
C
rss  
2)  
V
V
=0V,  
Effective output capacitance,  
energy related  
C
212  
pF  
ns  
GS  
o(er)  
=0V to 400V  
DS  
3)  
Effective output capacitance,  
time related  
C
-
469  
-
o(tr)  
Turn-on delay time  
t
V
=380V, V =0/10V,  
-
-
-
-
20  
30  
120  
10  
-
-
-
-
d(on)  
DD  
GS  
I =52A, R =1.8Ω  
Rise time  
t
D
G
r
Turn-off delay time  
Fall time  
t
d(off)  
t
f
Gate Charge Characteristics  
Gate to source charge  
Q
Q
Q
V
=380V, I =52A  
-
-
-
30  
160  
290  
-
-
-
nC  
V
gs  
gd  
g
DD  
D
Gate to drain charge  
V
V
=380V, I =52A,  
Gate charge total  
DD  
D
=0 to 10V  
GS  
V
=380V, I =52A  
-
5
-
Gate plateau voltage  
V(plateau)  
DD  
D
1
2
3
Repetitve avalanche causes additional power losses that can be calculated asPAV=EAR*f.  
Co(er) is a fixed capacitance that gives the same stored energy asCoss while VDS is rising from 0 to 80% VDSS  
Co(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS  
.
.
Page 3  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
Electrical Characteristics, at T = 25 °C, unless otherwise specified  
j
Parameter  
Symbol  
Conditions  
Values  
typ. max.  
Unit  
min.  
T =25°C  
-
-
52  
A
Inverse diode continuous  
forward current  
I
C
S
Inverse diode direct current,  
I
-
-
156  
SM  
pulsed  
V
=0V, I =I  
F S  
-
-
-
-
-
1
580  
20  
70  
900  
1.2  
V
Inverse diode forward voltage  
Reverse recovery time  
V
GS  
SD  
t
V =380V, I =I ,  
-
-
-
-
ns  
µC  
A
rr  
R
F S  
di /dt=100A/µs  
Reverse recovery charge  
Peak reverse recovery current  
Q
rr  
F
I
rrm  
A/µs  
Peak rate of fall of reverse  
recovery current  
di /dt  
rr  
Typical Transient Thermal Characteristics  
Symbol  
Value  
typ.  
Unit  
Symbol  
Value  
typ.  
Unit  
Thermal resistance  
Thermal capacitance  
0.002689  
0.005407  
0.011  
K/W  
0.001081  
0.004021  
0.005415  
0.014  
R
R
R
R
C
Ws/K  
th1  
th2  
th3  
th4  
th1  
C
th2  
C
th3  
0.054  
C
th4  
0.071  
0.025  
Rth5  
C
th5  
0.036  
R
C
0.158  
th6  
th6  
External Heatsink  
Tj  
Rth1  
Rth,n  
Tcase  
Ptot (t)  
Cth1  
Cth2  
Cth,n  
Tamb  
Page 4  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
1 Power dissipation  
= f (T )  
2 Safe operating area  
I = f ( V  
P
)
DS  
tot  
C
D
parameter : D = 0 , T =25°C  
C
10 3  
SPW52N50C3  
500  
W
A
10 2  
10 1  
400  
350  
300  
250  
200  
150  
100  
50  
tp = 0.001 ms  
10 0  
tp = 0.01 ms  
tp = 0.1 ms  
tp = 1 ms  
DC  
10 -1  
10 -2  
0
0
20  
40  
60  
80 100 120  
160  
10 0  
10 1  
10 2  
10 3  
DS  
°C  
T
V
V
C
3 Transient thermal impedance  
= f (t )  
4 Typ. output characteristic  
I = f (V ); T =25°C  
Z
thJC  
p
D
DS  
j
parameter: D = t /T  
parameter: t = 10 µs, V  
p
p
GS  
10 0  
280  
K/W  
20V  
A
7.5V  
10 -1  
10 -2  
10 -3  
10 -4  
200  
160  
120  
80  
7V  
6.5V  
D = 0.5  
D = 0.2  
D = 0.1  
D = 0.05  
D = 0.02  
D = 0.01  
6V  
5.5V  
single pulse  
40  
5V  
4.5V  
V
0
10 -7  
10 -6  
10 -5  
10 -4  
10 -3  
10 -1  
0
4
8
12  
16  
20  
26  
s
t
V
p
DS  
Page 5  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
5 Typ. output characteristic  
I = f (V ); T =150°C  
6 Typ. drain-source on resistance  
=f(I )  
R
D
DS  
j
DS(on)  
D
parameter: t = 10 µs, V  
parameter: T =150°C, V  
p
GS  
j
GS  
160  
0.5  
20V  
A
4V 4.5V  
5V  
5.5V  
6V  
6.5V  
6.5V  
120  
100  
80  
60  
40  
20  
0
0.4  
0.35  
0.3  
6V  
5.5V  
0.25  
0.2  
5V  
4.5V  
4V  
20V  
160  
0.15  
0.1  
0
4
8
12  
16  
20  
26  
0
20  
40  
60  
80 100 120  
V
A
I
V
D
DS  
7 Drain-source on-state resistance  
= f (T )  
8 Typ. transfer characteristics  
R
I = f ( V ); V 2 x I x R  
DS(on)  
j
D
GS  
DS  
D
DS(on)max  
parameter : I = 30 A, V = 10 V  
parameter: t = 10 µs  
D
GS  
p
SPW52N50C3  
280  
0.38  
A
25°C  
0.32  
0.28  
0.24  
0.2  
200  
160  
120  
80  
0.16  
0.12  
0.08  
0.04  
0
150°C  
98%  
typ  
40  
0
°C  
-60  
-20  
20  
60  
100  
180  
0
1
2
3
4
5
6
7
8
10  
V
V
T
GS  
j
Page 6  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
9 Typ. gate charge  
= f (Q  
10 Forward characteristics of body diode  
V
)
I = f (V  
)
GS  
Gate  
F
SD  
parameter: I = 52 A pulsed  
parameter: T , tp = 10 µs  
D
j
10 3  
SPW52N50C3  
SPW52N50C3  
16  
V
A
12  
10 2  
0.2 VDS max  
10  
0.8 VDS max  
8
6
4
2
0
10 1  
Tj = 25 °C typ  
Tj = 150 °C typ  
Tj = 25 °C (98%)  
Tj = 150 °C (98%)  
10 0  
nC  
40 80 120 160 200 240 280 320 360  
0
420  
0
0.4  
0.8  
1.2  
1.6  
2
2.4  
3
V
Q
V
Gate  
SD  
11 Avalanche SOA  
12 Avalanche energy  
E = f (T )  
AS  
I
= f (t  
)
AR  
AR  
j
par.: T 150 °C  
par.: I = 10 A, V = 50 V  
j
D
DD  
20  
2
A
16  
14  
12  
10  
8
mJ  
Tj (START)=25°C  
1
0.5  
0
6
Tj(START)=125°C  
4
2
0
10 -3 10 -2 10 -1 10 0 10 1 10 2  
10 4  
20  
40  
60  
80  
100  
120  
160  
µs  
t
°C  
T
AR  
j
Page 7  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
13 Drain-source breakdown voltage  
= f (T )  
14 Avalanche power losses  
P = f (f )  
AR  
V
(BR)DSS  
j
parameter: E =1mJ  
AR  
SPW52N50C3  
1000  
600  
V
-
800  
700  
600  
500  
400  
300  
200  
100  
570  
560  
550  
540  
530  
520  
510  
500  
490  
480  
470  
460  
450  
0
10 4  
-60  
-20  
20  
60  
100  
180  
10 5  
10 6  
°C  
Hz  
T
f
j
15 Typ. capacitances  
C = f (V  
16 Typ. C  
stored energy  
oss  
)
E
=f(V  
)
DS  
oss  
DS  
parameter: V =0V, f=1 MHz  
GS  
10 5  
24  
µJ  
pF  
Ciss  
20  
10 4  
18  
16  
14  
12  
10  
8
10 3  
Coss  
10 2  
6
Crss  
4
2
10 1  
0
0
100  
200  
300  
400  
600  
DS  
0
100  
200  
300  
500  
DS  
V
V
V
V
Page 8  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
Definition of diodes switching characteristics  
Page 9  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
P-TO-247-3-1  
15.9  
6.35  
5.03  
ø3.61  
2.03  
D
7
2.97 x 0.127  
D
1.14  
0.243  
0.762 MAX.  
2.4 +0.05  
1.2  
2
2.92  
5.46  
General tolerance unless otherwise specified: Leadframe parts: 0.05  
Package parts: 0.12  
Page 10  
Rev. 2.0  
2004-03-16  
SPW52N50C3  
Published by  
Infineon Technologies AG,  
Bereichs Kommunikation  
St.-Martin-Strasse 53,  
D-81541 München  
© Infineon Technologies AG 1999  
All Rights Reserved.  
Attention please!  
The information herein is given to describe certain components and shall not be considered as warranted  
characteristics.  
Terms of delivery and rights to technical change reserved.  
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement,  
regarding circuits, descriptions and charts stated herein.  
Infineon Technologies is an approved CECC manufacturer.  
Information  
For further information on technology, delivery terms and conditions and prices please contact your nearest  
Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list).  
Warnings  
Due to technical requirements components may contain dangerous substances.  
For information on the types in question please contact your nearest Infineon Technologies Office.  
Infineon Technologies Components may only be used in life-support devices or systems with the express  
written approval of Infineon Technologies, if a failure of such components can reasonably be expected to  
cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device  
or system Life support devices or systems are intended to be implanted in the human body, or to support  
and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health  
of the user or other persons may be endangered.  
Page 11  
Rev. 2.0  
2004-03-16  

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