HS-3530RH [INTERSIL]
Low Power, Radiation Hardened Programmable Operational Amplifier; 低功耗，抗辐射可编程运算放大器
| 型号： | HS-3530RH |
| 厂家： | 
Intersil |
| 描述： | Low Power, Radiation Hardened Programmable Operational Amplifier |
| 文件： | 总12页 (文件大小：109K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
HS-3530RH
Low Power, Radiation Hardened
Programmable Operational Amplifier
August 1995
Features
Pinout
8 LEAD METAL CAN PACKAGE (CAN)
MIL-STD-1835 MACY1-X8
TOP VIEW
• Radiation Environment
- Neutron Fluence (Φ) 5 x 1012 n/cm2 (E ≥ 10KeV)
(γ)
- Gamma Rate
1 x 109 RAD (Si)/s
- Gamma Dose (γ) 1 x 106 RAD (Si)
ISET
8
• Wide Range AC Programming
- Slew Rate 0.06 to 3V/µs
OFFSET
NULL
1
3
7
5
V+
- Gain X Bandwidth 100kHz to 5.0MHz
INVERTING
INPUT
2
6
OUTPUT
• Wide Range DC Programming
- Power Supply Range ±3.0V to ±15V
• Supply Current 10µA to 1.2mA
OFFSET
NULL
NON-INVERTING
INPUT
4
V-
• Dielectrically Isolated Device Islands
• Short Circuit Protection
NOTE:
1. Case tied to V-.
Description
The HS-3530RH is a Low Power Operational Amplifier which
is an internally compensated monolithic device offering a Functional Diagram
wide range of performance specifications. Parameters such
as power dissipation, slew rate, bandwidth, noise and input
DC parameters are programmed by selecting an external
resistor or current source. Supply voltages as low as ±3V
may be used with little degradation of AC performance. The
+V
HS-3530RH has been specifically designed to meet
OFFSET
NULL 2
exposure to space radiation environments. Operation from -55oC
to +125oC is guaranteed.
7
2
3
5
-IN
A major advantage of the HS-3530RH is that operating
characteristics remain virtually constant over a wide supply
range (±3V to ±15V), allowing the amplifier to offer maximum
performance in almost any system, including battery
operated equipment. A primary application for this device is
in active filtering and conditioning for a wide variety of
signals that differ in frequency and amplitude. Also, by
modulating the set current, it can be used for designs such
as current controlled oscillators/modulators, sample and
hold circuits and variable active filters.
6
OUT
+IN
8
1
4
ISET
OFFSET
-V
NULL 1
Ordering Information
TEMPERATURE
PART NUMBER
HS2-3530RH-8
RANGE
PACKAGE
o
o
-55 C to +125 C
8 Lead Metal Can
8 Lead Metal Can
8 Lead Metal Can
o
o
HS2-3530RH-Q
-55 C to +125 C
o
HS2-3530RH/SAMPLE
+25 C
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
Spec Number 518079
File Number 3024.2
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999762
Specifications HS-3530RH
Absolute Maximum Ratings
Reliability Information
Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . . 40V Thermal Resistance
Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20V Metal Can Package . . . . . . . . . . . . . . . . . 160 C/W 70 C/W
Voltage at Either Input Terminal . . . . . . . . . . . . . . . . . . . . . . V+ to V- Maximum Package Power Dissipation at +125 C Ambient:
ISET (Current at ISET) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500µA Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.31W
θ
θ
JA
JC
o
o
o
VSET (Voltage to GND at ISET). . . . . . . . . (V+ -2.0V) < VSET < V+ If device power exceeds package dissipation capability, provide heat
Output Short Circuit Duration (Note 1) . . . . . . . . . . . . . . . . Indefinite sinking or derate linearly at the following rate:
o
o
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C
Metal Can Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.3mW/ C
o
o
Storage Temperature Range . . . . . . . . . . . . . . . . . -65 C to +150 C
ESD Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . <2000V
o
Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . . 275 C
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
o
o
1
Operating Temperature Range. . . . . . . . . . . . . . . . -55 C to +125 C
VINcm ≤ / (V+ - V-)
2
Operating Supply Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . ±3V to ±15V RL ≥ 2kV
TABLE 1A. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: Supply Voltage = ±15V, RSOURCE = 100Ω, RLOAD = 500kΩ, VOUT = 0V, Unless Otherwise Specified.
ISET = 1.5µA
ISET = 15µA
GROUP A
PARAMETER
SYMBOL
CONDITIONS
VCM = 0V
SUBGROUP TEMPERATURE MIN
MAX
MIN
-3
MAX
3
UNITS
mV
o
Input Offset
Voltage
VIO
1
+25 C
-3
-5
-
3
5
-
o
o
2, 3
1
+125 C, -55 C
-5
5
mV
o
Input Bias
Current
+IB
-IB
IIO
VCM = 0V, +RS = 10kΩ
-RS = 100Ω
Note 2
+25 C
-40
-50
40
nA
o
o
2, 3
+125 C, 0 C
-
-
+50
nA
o
3
1
-55 C
-
-
-
-
-
-
-60
-40
-50
60
40
nA
nA
nA
o
VCM = 0V, +RS = 100Ω
-RS = 10kΩ
Note 2
+25 C
o
o
2, 3
+125 C, 0 C
+50
o
3
1
-55 C
-
-
-
-
-
-
-60
-15
-20
60
15
nA
nA
nA
o
Input Offset
Current
VCM = 0V, +RS = 10kΩ
-RS = 10kΩ
Note 2
+25 C
o
o
2, 3
+125 C, 0 C
+20
o
3
4
-55 C
-
65
25
65
25
80
80
80
80
12.5
10.5
-
-
-30
80
50
80
50
80
80
80
80
12.5
10.5
-
30
nA
kV/V
kV/V
kV/V
kV/V
dB
o
Large Signal
Voltage Gain
+AVOL
-AVOL
VOUT = 0V and +10V
Note 1
+25 C
-
-
o
o
5, 6
4
+125 C, -55 C
-
-
o
VOUT = 0V and -10V
Note 1
+25 C
-
-
o
o
5, 6
1
+125 C, -55 C
-
-
o
Common Mode
Rejection Ratio
+CMRR ∆VCM = +5V, +V = +10V
+25 C
-
-
-V = -20V, VOUT = -5V
o
o
2, 3
1
+125 C, -55 C
-
-
dB
o
-CMRR
+VOUT
-VOUT
∆VCM = -5V, +V = +20V
-V = -10V, VOUT = +5V
+25 C
-
-
dB
o
o
2, 3
1
+125 C, -55 C
-
-
dB
o
Output Voltage
Swing
Note 1
Note 1
+25 C
-
-
-
V
o
o
2, 3
1
+125 C, -55 C
-
V
o
+25 C
-12.5
-10.5
-
-12.5
-10.5
-
V
o
o
2, 3
1
+125 C, -55 C
-
-
V
o
Output Current
+IOUT
-IOUT
RL = 2kΩ
RL = 2kΩ
+25 C
0.25
-
2.5
-
mA
mA
o
1
+25 C
-0.25
-2.5
Spec Number 518079
763
Specifications HS-3530RH
TABLE 1A. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Tested at: Supply Voltage = ±15V, RSOURCE = 100Ω, RLOAD = 500kΩ, VOUT = 0V, Unless Otherwise Specified.
ISET = 1.5µA
ISET = 15µA
GROUP A
PARAMETER
SYMBOL
CONDITIONS
IOUT = 0mA
SUBGROUP TEMPERATURE MIN
MAX
MIN
-
MAX
UNITS
µA
o
Quiescent Power
Supply Current
+ICC
1
2, 3
1
+25 C
-
15
15
-
150
o
o
+125 C, -55 C
-
-
160
µA
o
-ICC
IOUT = 0mA
+25 C
-15
-15
80
80
-150
-160
80
-
-
-
-
µA
o
o
2, 3
1
+125 C, -55 C
-
µA
o
Power Supply
Rejection Ratio
+PSRR
∆VSUP = 10V
+V = +10V, -V = -15V
+V = +20V, -V = -15V
+25 C
-
dB
o
o
2, 3
+125 C, -55 C
-
80
dB
o
-PSRR
∆VSUP = 10V
+V = +15V, -V = -10V
+V = +15V, -V = -20V
1
+25 C
80
80
-
-
80
80
-
-
dB
dB
o
o
2, 3
+125 C, -55 C
NOTES:
1. RL = 75kΩ at ISET = 1.5µA, RL = 5kΩ at ISET = 15µA.
o
2. Temperature 0 C performed for Intersil -8 product flow only.
TABLE 1B. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: Supply Voltage = ±3V, RSOURCE = 100Ω, RLOAD = 500kΩ, VOUT = 0V, Unless Otherwise Specified.
ISET = 1.5µA
ISET = 15µA
GROUP A
PARAMETER
SYMBOL
CONDITIONS
VCM = 0V
SUBGROUP TEMPERATURE MIN
MAX
MIN
-3
MAX
UNITS
mV
o
Input Offset
Voltage
VIO
1
2, 3
4
+25 C
-3
-5
3
5
-
3
5
-
o
o
+125 C, -55 C
-5
mV
o
Large Signal
Voltage Gain
+AVOL
-AVOL
VOUT = 0V and +1V
Note 1
+25 C
25
15
25
15
80
80
25
25
25
25
80
80
kV/V
kV/V
kV/V
kV/V
dB
o
o
5, 6
4
+125 C, -55 C
-
-
o
VOUT = 0V and -1V
Note 1
+25 C
-
-
o
o
5, 6
1
+125 C, -55 C
-
-
o
Common Mode
Rejection Ratio
+CMRR ∆VCM = +1.5V
+V = +1.5V, -V = -4.5V
+25 C
-
-
o
o
2, 3
+125 C, -55 C
-
-
dB
VOUT = -1.5V
o
-CMRR
∆VCM = -1.5V
+V = +4.5V, -V = -1.5V
VOUT = +1.5V
1
+25 C
80
80
-
-
80
80
-
-
dB
dB
o
o
2, 3
+125 C, -55 C
o
Output Voltage
Swing
+VOUT
-VOUT
+ICC
Note 1
1
2, 3
1
+25 C
2.0
2.0
-
-
2.0
2.0
-
-
V
V
o
o
+125 C, -55 C
-
-2.0
-2.0
15
15
-
-
-2.0
-2.0
150
160
-
o
Note 1
+25 C
V
o
o
2, 3
1
+125 C, -55 C
-
-
V
o
Quiescent Power
Supply Current
IOUT = 0mA
IOUT = 0mA
+25 C
-
-
µA
µA
µA
µA
dB
dB
o
o
2, 3
1
+125 C, -55 C
-
-
o
-ICC
+25 C
-15
-15
80
80
-150
-160
80
80
o
o
2, 3
1
+125 C, -55 C
-
-
o
Power Supply
Rejection Ratio
+PSRR
∆VSUP = 1.5V
+V = +3V, -V = -3V
+V = +4.5V, -V = -3V
+25 C
-
-
o
o
2, 3
+125 C, -55 C
-
-
o
-PSRR
∆VSUP = 1.5V
+V = +3V, -V = -3V
+V = +3V, -V = -4.5V
1
+25 C
80
80
-
-
80
80
-
-
dB
dB
o
o
2, 3
+125 C, -55 C
NOTE:
1. RL = 75kΩ at ISET = 1.5µA, RL = 5kΩ at ISET = 15µA.
Spec Number 518079
764
Specifications HS-3530RH
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Tested at: CL = 100pF, AVCL = +1, RL = 75kΩ, Unless Otherwise Specified.
ISET = 1.5µA
ISET = 15µA
GROUP A
PARAMETER
SYMBOL
CONDITIONS
SUBGROUP TEMPERATURE MIN
MAX
MIN
MAX
UNITS
VSUPPLY = ±15V
o
Slew Rate
Note 1
+SR
-SR
VOUT = -10V to +10V
VOUT = +10V to -10V
9
9
9
+25 C
0.025
0.025
-
-
-
0.25
0.25
-
-
-
V/µs
V/µs
µs
o
+25 C
o
Rise & Fall Time TR
TF
VOUT = 0 to +400mV
10% < TR < 90%
+25 C
8.0
0.8
o
VOUT = 0 to -400mV
10% < TF < 90%
9
+25 C
-
8.0
-
0.8
µs
o
Overshoot
+OS
VOUT = 0 to +400mV
VOUT = 0 to -400mV
9
9
+25 C
-
-
35
35
-
-
35
35
%
%
o
-OS
+25 C
VSUPPLY = ±3V
o
Slew Rate
Note 1
+SR
-SR
VOUT = -2V to +2V
VOUT = +2V to -2V
9
9
+25 C
0.01
0.01
-
-
0.1
0.1
-
-
V/µs
V/µs
o
+25 C
TABLE 3. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: RSOURCE = 50Ω, CL = 100pF, AVCL = +1, Unless Otherwise Specified.
ISET = 1.5µA
ISET = 15µA
PARAMETER
SYMBOL
CONDITIONS
NOTES TEMPERATURE MIN
MAX
MIN
MAX
UNITS
VSUPPLY = ±15V
o
Differential Input
Resistance
RIN
VCM = 0V
1
+25 C
50
-
50
-
MΩ
o
Full Power Bandwidth
FPBW
CLSG
VPEAK = 10V
1, 2
1
+25 C
0.4
+1
-
-
4
-
-
kHz
V/V
o
o
Minimum Closed
Loop Stable Gain
RL = 2kΩ, CL = 50pF
-55 C to +125 C
+1
o
Output Resistance
ROUT
PC
Open Loop
1
+25 C
-
-
10
-
-
10
Ω
o
o
Quiescent Power
Consumption
VOUT = 0V, IOUT = 0mA
1, 3
-55 C to +125 C
4.8
4.8
mW
o
Output Short-Circuit
Current
IOSC
VOUT = 0V
1, 4
1
+25 C
-14
45
38
-
-27
42
-
mA
o
Gain Bandwidth
Product
GBWP
AVCL = 10V/V
VO = 200mV, fO = 10kHz
+25 C
750
kHz
VSUPPLY = ±3V
o
Gain Bandwidth
Product
GBWP
AVCL = 10V/V
VO = 200mV, fO = 10kHz
1
+25 C
30
-
600
-
kHz
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK).
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs).
4. Caution: Continuous long-duration short-circuit operation may degrade the operating life of the device.
Spec Number 518079
765
Specifications HS-3530RH
TABLE 4. POST RAD DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
TEMPERATURE
MIN
MAX
UNITS
o
Open Loop Voltage Gain
AVOL
VSUPPLY = ±15V
ISET = 15µA
+25 C
15
-
kV/V
o
Input Offset Voltage
VIO
VSUPPLY = ±15V
ISET = 15µA
+25 C
-
5.0
mV
o
TABLE 5. BURN-IN DELTA PARAMETERS GROUP B, SUBGROUPS 5 (T = +25 C)
A
PARAMETER
DELTA LIMIT
±0.5mV
VIO
IBIAS
±30nA
TABLE 6. APPLICABLE SUBGROUPS
GROUP A SUBGROUPS
RECORDED
CONFORMANCE
GROUP
MIL-STD-883
METHOD
RECORDED
FOR -8
TESTED FOR -Q
FOR -Q
TESTED FOR -8
Initial Test
Interim Test
PDA
100% 5004
100% 5004
1, 4, 9
1 (Note 2)
1, 4, 9
1, 4, 9
1
1, 4, 9, ∆
1, ∆ (Note 2)
100% 5004
1, ∆
-
Final Test
100% 5004
2, 3, 5, 6
-
2, 3, 5, 6
Group A (Note 1)
Subgroup B5
Subgroup B6
Group C
Sample 5005
Sample 5005
Sample 5005
Sample 5005
Sample 5005
Sample 5005
1, 2, 3, 4, 5, 6, 9
-
1, 2, 3, 4, 5, 6, 9
1, 2, 3, 4, 5, 6, 9, ∆
1, 2, 3, ∆ (Note 2)
-
1, 4, 9
-
-
-
-
-
-
1, 4, 9
1
1, 2, 3, 4, 5, 6, 9
Group D
1, 4, 9
1
Group E, Subgroup 2
NOTES:
1. Alternate Group A testing in accordance with MIL-STD-883 method 5005 may be exercised.
2. Table 5 parameters only
Spec Number 518079
766
HS-3530RH
Intersil Space Level Product Flow -Q
Wafer Lot Acceptance (All Lots) Method 5007
(Includes SEM)
100% Initial Electrical Test (T0)
100% Static Burn-In, Condition A or B, 240 Hours, +125oC
GAMMA Radiation Verification (Each Wafer) Method 1019,
4 Samples/Wafer, 0 Rejects
or Equivalent, Method 1015
100% Interim Electrical Test 1 (T1)
100% Nondestructive Bond Pull, Method 2023
Sample - Wire Bond Pull Monitor, Method 2011
Sample - Die Shear Monitor, Method 2019 or 2027
100% Internal Visual Inspection, Method 2010, Condition A
100% Delta Calculation (T0-T1)
100% PDA, Method 5004 (Note 1)
100% Final Electrical Test
100% Fine/Gross Leak, Method 1014
100% Radiographic (X-Ray), Method 2012 (Note 2)
100% External Visual, Method 2009
Sample - Group A, Method 5005 (Note 3)
Sample - Group B, Method 5005 (Note 4)
Sample - Group D, Method 5005 (Notes 4 and 5)
100% Data Package Generation (Note 6)
100% Temperature Cycle, Method 1010, Condition C,
10 Cycles
100% Constant Acceleration, Method 2001, Condition per
Method 5004
100% PIND, Method 2020, Condition A
100% External Visual
100% Serialization
NOTES:
1. Failures from subgroup 1 and deltas are used for calculating PDA. The maximum allowable PDA = 5%.
2. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004.
3. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
4. Group B and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include
separate line items for Group B test, Group B samples, Group D test and Group D samples.
5. Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the
P.O. should include a separate line item for Group D generic data. Generic data is not guaranteed to be available and is therefore not
available in all cases.
6. Data Package Contents:
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quan-
tity).
• Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage.
• GAMMA Radiation Report. Contains Cover page, disposition, RAD Dose, Lot Number, Test Package used, Specification Numbers, Test
equipment, etc. Radiation Read and Record data on file at Intersil.
• X-Ray report and film. Includes penetrometer measurements.
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Lot Serial Number Sheet (Good units serial number and lot number).
• Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test.
• Group B and D attributes and/or Generic data is included when required by the P.O.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
by an authorized Quality Representative.
Spec Number 518079
767
HS-3530RH
Intersil Space Level Product Flow -8
GAMMA Radiation Verification (Each Wafer) Method 1019,
4 Samples/Wafer, 0 Rejects
100% Static Burn-In, Condition A or B, 160 Hours, +125oC
or Equivalent, Method 1015
Periodic- Wire Bond Pull Monitor, Method 2011
100% Interim Electrical Test
Periodic- Die Shear Monitor, Method 2019 or 2027
100% Internal Visual Inspection, Method 2010, Condition B
100% PDA, Method 5004 (Note 1)
100% Final Electrical Test
100% Temperature Cycle, Method 1010, Condition C,
10 Cycles
100% Fine/Gross Leak, Method 1014
100% External Visual, Method 2009
Sample - Group A, Method 5005 (Note 2)
Sample - Group B, Method 5005 (Note 3)
Sample - Group C, Method 5005 (Notes 3 and 4)
Sample - Group D, Method 5005 (Notes 3 and 4)
100% Data Package Generation (Note 4)
100% Constant Acceleration, Method 2001, Condition per
Method 5004
100% External Visual
100% Initial Electrical Test
NOTES:
1. Failures from subgroup 1 are used for calculating PDA. The maximum allowable PDA = 5%.
2. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
3. Group B, C and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include
separate line items for Group B test, Group B samples, Group C test and Group C samples and Group D test and Group D samples.
4. Group C and/or D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required,
the P.O. should include a separate line item for Group C generic data and/or D generic data. Generic data is not guaranteed to be avail-
able and is therefore not available in all cases.
5. Data Package Contents:
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quan-
tity).
• GAMMA Radiation Report. Contains Cover page, disposition, RAD Dose, Lot Number, Test Package used, Specification Numbers, Test
equipment, etc. Radiation Read and Record data on file at Intersil.
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Group B, C and D attributes and/or Generic data is included when required by the P.O.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
by an authorized Quality Representative.
Spec Number 518079
768
HS-3530RH
Test Circuit
ACOUT
+VCC
-1
V1
2K
100pF†
0.1
1
FOR LOOP STABILITY,
10K
USE MIN VALUE CAPACITOR
TO PREVENT OSCILLATION
500K
2
S1 1
OPEN 2
S2
2
-
500K
S4
1
-
+
DUT
-
+
1
S9
S8
2
OPEN
3
S5
1
1
1
1
S7
+
FB
1
4
OPEN 2
2
V2
2
10K
VAC
-VEE
0.1
1
100
100
2K
5K
75K
x2
EOUT
5K
2
S3
†Includes Stray Capacitance
All Resistors = ± 1% (Ω)
1
All Capacitors = ± 10% (µF)
50K
Simplified Transient Response/Slew Rate Circuit
2
-
6
3
VOUT
+
8
RL
100pF
RSET
VINN
-V
Burn-In Circuit
Irradiation Circuit
+V
7
+15V
C1
D1
1MΩ
2
3
-
0.01µF
+V
8
2
OUTPUT
7
4
6
ISET
8
-
+
+
6
R1
3
R2
4
0.01µF
- V
C2
D2
-15V
Spec Number 518079
769
HS-3530RH
Typical Performance Curves
100
1000
PRE-RAD
10
100
VSUPPLY = ±15V
VSUPPLY = ±15V
VSUPPLY = ±3V
10
1
1
10
SET CURRENT (µA)
100
1
10
100
SET CURRENT (µA)
FIGURE 1. INPUT BIAS CURRENT vs SET CURRENT
FIGURE 2. PRERAD POSITIVE SUPPLY CURRENT
6
4
200K
100K
2
1
0.8
0.6
0.4
VSUPPLY = ±15V
VSUPPLY = ±3V
0.2
0.1
10K
1
10
100
1
10
SET CURRENT (µA)
100
SET CURRENT (µA)
FIGURE 3. PRERAD LARGE SIGNAL VOLTAGE GAIN vs ISET
FIGURE 4. GAIN BANDWIDTH PRODUCT vs SET CURRENT
10
30
25
20
1.0
ISET = 15µA
ISET = 1.5µA
SR+ = SR-
SLEW RATE =
15
10
5
2
VSUPPLY = 15V
T = +25oC
0.1
VSUPPLY = ±15V
VSUPPLY = ±3V
PRE-RAD
0.01
1K
10K
100K
1M
1
10
100
SET CURRENT (µA)
RLOAD (Ω)
FIGURE 5. SLEW RATE vs SET CURRENT
FIGURE 6. OUTPUT VOLTAGE SWING vs LOAD RESISTANCE
Spec Number 518079
770
HS-3530RH
Typical Performance Curves (Continued)
200K
25
20
15
10
5
VSUPPLY = ±15V
100K
ISET = 15µA
PRE-RAD
VSUPPLY = ±3V
ISET = 15µA
ISET = 1.5µA
VSUPPLY = ±15V
-50 -25
10K
0
25
50
75
100 125
-50
-25
0
25
50
75
100 125
TEMPERATURE (oC)
TEMPERATURE (oC)
FIGURE 7. INPUT BIAS CURRENT vs TEMPERATURE
FIGURE 8. OPEN LOOP VOLTAGE GAIN vs TEMPERATURE
Schematic
VCC
R1
20Ω
D2
20W
Q23
Q23
Q24
Q37
Q1
Q44
Q25
Q39A
Q39B
Q31
2pF
Q26
Q4
Q5
Q42
Q22
8
2
1 SET
IN-
D13
D14
Q9
Q0
Q34
Q27
R5
R2
D47 D48
Q11
D49 D50
Q12
D32
D33
20Ω
27pF Q28
Q20
OUT
20Ω
6
Q19
D43
R3
20Ω
D28
Q35
Q41
Q16 Q45
Q18 Q46
Q30
D29
Q7
Q8
Q36
R7
R8
D17 3K
R4
20Ω
D15
3K
D6
4
3
1
5
VEE
IN+
VOS1
VOS2
Spec Number 518079
771
HS-3530RH
Metallization Topology
DIE DIMENSIONS:
54 x 67 x 11.5mils
DIE ATTACH:
Temperature: Metal Can - 420oC (Max)
(1370 x 1700 x 290µm)
WORST CASE CURRENT DENSITY:
0.544 x 105 A/cm2 at 2.5mA
METALLIZATION:
Type: Al
Thickness: 12.5kÅ ± 2kÅ
SUBSTRATE POTENTIAL (POWERED UP): -V
TRANSISTOR COUNT: 49
GLASSIVATION:
Type: SiO2
PROCESS: Complimentary Bipolar
Thickness: 8kÅ ± 1kÅ
Metallization Mask Layout
HS-3530RH
OFFSET
NULL
+IN
-IN
-V
(& PACKAGE)
ISET
+V
OFFSET NULL
OUTPUT
Spec Number 518079
772
HS-3530RH
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Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
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Spec Number 518079
773
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