ISL6210 [INTERSIL]

Dual Synchronous Rectified MOSFET Drivers; 双同步整流MOSFET驱动器
ISL6210
型号: ISL6210
厂家: Intersil    Intersil
描述:

Dual Synchronous Rectified MOSFET Drivers
双同步整流MOSFET驱动器

驱动器
文件: 总10页 (文件大小:249K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ISL6210  
®
Data Sheet  
November 28, 2006  
FN6392.0  
PRELIMINARY  
Dual Synchronous Rectified MOSFET  
Drivers  
Features  
• 5V Quad N-Channel MOSFET Drives for Two  
Synchronous Rectified Bridges  
The ISL6210 integrates two ISL6208A drivers and is  
optimized to drive two independent power channels in a  
synchronous-rectified buck converter topology. These  
drivers combined with an Intersil ISL62xx multiphase PWM  
controller forms a complete single-stage core-voltage  
regulator solution with high efficiency performance at high  
switching frequency for advanced microprocessors.  
• Adaptive Shoot-Through Protection  
- Active Gate Threshold Monitoring  
- Programmable Dead-Time  
• 0.4Ω On-Resistance and 4A Sink Current Capability  
• Supports High Switching Frequency  
- Fast Output Rise and Fall  
The IC is biased by a single low voltage supply (5V),  
minimizing driver switching losses in high MOSFET gate  
capacitance and high switching frequency applications.  
Each driver is capable of driving a 3nF load with less than  
10ns rise/fall time. Bootstrapping of the upper gate driver is  
implemented via an internal low forward drop diode,  
reducing implementation cost, complexity, and allowing the  
use of higher performance, cost effective N-Channel  
MOSFETs. Adaptive shoot-through protection is integrated  
to prevent both MOSFETs from conducting simultaneously.  
- Ultra Low Three-State Hold-Off Time (20ns)  
• Low V Internal Bootstrap Diode  
F
• Low Bias Supply Current  
• Power-On Reset  
• QFN Package  
- Compliant to JEDEC PUB95 MO-220 QFN-Quad Flat  
No Leads-Product Outline  
- Near Chip-Scale Package Footprint; Improves PCB  
Efficiency and Thinner in Profile  
The ISL6210 features 4A typical sink current for the lower  
gate driver, enhancing the lower MOSFET gate hold-down  
capability during PHASE node rising edge, preventing power  
loss caused by the self turn-on of the lower MOSFET due to  
the high dV/dt of the switching node.  
• Pb-Free Plus Anneal Available (RoHS Compliant)  
Applications  
• Core Voltage Supplies for Intel® and AMD®  
Microprocessors  
The ISL6210 also features an input that recognizes a high-  
impedance state, working together with Intersil multiphase  
PWM controllers to prevent negative transients on the  
controlled output voltage when operation is suspended. This  
feature eliminates the need for the schottky diode that may  
be utilized in a power system to protect the load from  
negative output voltage damage.  
• High Frequency Low Profile High Efficiency DC/DC  
Converters  
• High Current Low Voltage DC/DC Converters  
• Synchronous Rectification for Isolated Power Supplies  
Related Literature  
Technical Brief TB363 “Guidelines for Handling and  
Processing Moisture Sensitive Surface Mount Devices  
(SMDs)”  
Ordering Information  
PART  
NUMBER  
(Note)  
TEMP.  
RANGE  
(°C)  
PART  
MARKING  
PACKAGE  
(Pb-Free)  
PKG.  
DWG. #  
Technical Brief 400 and Technical Brief 417 for Power  
Train Design, Layout Guidelines, and Feedback  
Compensation Design  
ISL6210CRZ  
62 10CRZ -10 to +100 16 Ld 4x4 QFN L16.4x4  
ISL6210CRZ-T 62 10CRZ -10 to +100 16 Ld 4x4 QFN L16.4x4  
Technical Brief 447 “Guidelines for Preventing Boot-to-  
Phase Stress on Half-Bridge MOSFET Driver ICs”  
NOTE: Intersil Pb-free plus anneal products employ special Pb-free  
material sets; molding compounds/die attach materials and 100%  
matte tin plate termination finish, which are RoHS compliant and  
compatible with both SnPb and Pb-free soldering operations. Intersil  
Pb-free products are MSL classified at Pb-free peak reflow  
temperatures that meet or exceed the Pb-free requirements of  
IPC/JEDEC J STD-020.  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.  
Copyright Intersil Americas Inc. 2006. All Rights Reserved. Intel® is a registered trademark of Intel Corporation.  
AMD® is a registered trademark of Advanced Micro Devices, Inc. All other trademarks mentioned are the property of their respective owners.  
ISL6210  
Pinout  
ISL6210  
(16 LD 4X4 QFN)  
TOP VIEW  
16 15 14 13  
GND  
LGATE1  
PVCC  
1
2
3
4
12 UGATE1  
11 BOOT1  
10 BOOT2  
GND  
FCCM  
9
UGATE2  
5
6
7
8
Block Diagram  
ISL6210  
EN  
PVCC  
BOOT1  
FCCM  
VCC  
UGATE1  
PHASE1  
CHANNEL 1  
SHOOT-  
THROUGH  
4.25K  
4K  
PROTECTION  
PVCC  
PWM1  
LGATE1  
PGND  
PGND  
CONTROL  
LOGIC  
VCC  
PVCC  
BOOT2  
4.25K  
4K  
UGATE2  
PWM2  
GND  
PHASE2  
SHOOT-  
THROUGH  
PROTECTION  
CHANNEL 2  
PVCC  
LGATE2  
PGND  
PAD  
THE PAD ON THE BOTTOM SIDE OF THE QFN PACKAGE  
MUST BE SOLDERED TO THE CIRCUIT’S GROUND.  
FN6392.0  
November 28, 2006  
2
ISL6210  
Typical Application - Multiphase Converter Using ISL6210 Gate Drivers  
BOOT1  
+5V  
+12V  
UGATE1  
PHASE1  
VCC  
FCCM  
LGATE1  
PVCC  
EN  
DUAL  
DRIVER  
ISL6210  
+5V  
+5V  
BOOT2  
+12V  
COMP  
V
FB  
CC  
VSEN  
UGATE2  
PHASE2  
ISEN1  
PWM1  
PWM1  
PWM2  
PGOOD  
EN  
PWM2  
ISEN2  
LGATE2  
MAIN  
PAD  
CONTROL  
ISL62xx  
PGND  
GND  
VID  
+V  
CORE  
ISEN3  
PWM3  
PWM4  
FCCM  
+5V  
BOOT1  
+12V  
GND  
ISEN4  
UGATE1  
PHASE1  
VCC  
LGATE1  
PVCC  
FCCM  
DUAL  
DRIVER  
ISL6210  
+5V  
EN  
BOOT2  
+12V  
UGATE2  
PHASE2  
PWM1  
PWM2  
LGATE2  
PAD  
GND  
PGND  
FN6392.0  
November 28, 2006  
3
ISL6210  
Absolute Maximum Ratings  
Thermal Information  
Supply Voltage (PVCC, VCC) . . . . . . . . . . . . . . . . . . . . -0.3V to 7V  
Input Voltage (V , V ) . . . . . . . . . . . . . . . -0.3V to VCC + 0.3V  
Thermal Resistance (Notes 1 and 2)  
QFN Package. . . . . . . . . . . . . . . . . .  
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . +150°C  
Maximum Storage Temperature Range. . . . . . . . . .-65°C to +150°C  
θ
(°C/W)  
46  
θ
(°C/W)  
8.5  
JA  
JC  
EN PWM  
BOOT Voltage (V  
). . . -0.3V to 33V (DC) or 36V (<200ns)  
BOOT-GND  
BOOT To PHASE Voltage (V  
). . . . . . -0.3V to 7V (DC)  
-0.3V to 9V (<10ns)  
BOOT-PHASE  
PHASE Voltage . . . . . . . . . . . . . . . . . . . . . GND - 0.3V to 30V (DC)  
GND -8V (<20ns Pulse Width, 10μJ)  
UGATE Voltage . . . . . . . . . . . . . . . . V  
- 0.3V (DC) to V  
PHASE  
BOOT  
- 5V (<20ns Pulse Width, 10μJ) to V  
BOOT  
V
PHASE  
LGATE Voltage . . . . . . . . . . . . . . . GND - 0.3V (DC) to VCC + 0.3V  
GND - 2.5V (<20ns Pulse Width, 5μJ) to VCC + 0.3V  
Ambient Temperature Range. . . . . . . . . . . . . . . . . .-40°C to +125°C  
HBM ESD Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2kV  
Recommended Operating Conditions  
Ambient Temperature Range. . . . . . . . . . . . . . . . . .-10°C to +100°C  
Maximum Operating Junction Temperature. . . . . . . . . . . . . +125°C  
Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5V ±10%  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the  
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTES:  
1. θ is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features.  
JA  
2. θ , “case temperature” location is at the center of the package underside exposed pad. See Tech Brief TB379 for details.  
JC  
Electrical Specifications These specifications apply for T = -10°C to +100°C, Unless Otherwise Noted  
A
PARAMETER  
SUPPLY CURRENT  
SYMBOL  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
Bias Supply Current  
POWER-ON RESET  
POR Rising  
I
PWM pin floating, V  
= 5V  
VCC  
-
170  
-
μA  
VCC  
-
2.6  
-
3.4  
3.0  
400  
4.2  
V
V
POR Falling  
-
-
Hysteresis  
mV  
BOOTSTRAP DIODE  
Forward Voltage Drop  
PWM INPUT  
V
V
= 5V, forward bias current = 2mA  
0.3  
0.60  
0.7  
V
F
VCC  
Sinking Impedance  
Source Impedance  
Three-State Rising Threshold  
Three-State Falling Threshold  
Three-State Shutdown Holdoff Time  
R
R
8.0  
8.3  
1.08  
3.4  
-
10.4  
10.6  
1.3  
15  
25  
1.5  
3.98  
-
kΩ  
kΩ  
V
PWM_SNK  
PWM_SRC  
V
V
= 5V  
= 5V  
VCC  
VCC  
3.65  
80  
V
t
t
or t  
PDLL  
+ Gate Falling Time  
ns  
ns  
TSSHD  
PDLU  
Three-state to UG/LG Rising Propagation  
Delay  
t
-
20  
-
PTS  
SWITCHING TIME (See Figure 1)  
UGATE Rise Time (Note 3)  
t
t
V
V
V
V
V
V
V
V
= 5V, 3nF Load  
-
-
-
-
-
-
-
-
8.0  
8.0  
8.0  
4.0  
20  
-
-
-
-
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RU  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
VCC  
LGATE Rise Time (Note 3)  
t
= 5V, 3nF Load  
RL  
UGATE Fall Time (Note 3)  
= 5V, 3nF Load  
FU  
LGATE Fall Time (Note 3)  
t
= 5V, 3nF Load  
FL  
UGATE Turn-Off Propagation Delay  
LGATE Turn-Off Propagation Delay  
UGATE Turn-On Propagation Delay  
LGATE Turn-On Propagation Delay  
t
= 5V, Outputs Unloaded  
= 5V, Outputs Unloaded  
= 5V, Outputs Unloaded; R  
= 5V, Outputs Unloaded; R  
PDLU  
t
27  
PDLL  
t
= 0Ω  
= 0Ω  
26  
PDHU  
SET  
SET  
t
26  
PDHL  
FN6392.0  
November 28, 2006  
4
ISL6210  
Electrical Specifications These specifications apply for T = -10°C to +100°C, Unless Otherwise Noted (Continued)  
A
PARAMETER  
UGATE Turn-On Propagation Delay  
LGATE Turn-On Propagation Delay  
Minimum LGATE On Time in DCM (Note 3)  
OUTPUT  
SYMBOL  
TEST CONDITIONS  
= 5V, Outputs Unloaded; R  
= 5V, Outputs Unloaded; R  
MIN  
TYP  
41  
MAX  
UNITS  
ns  
t
V
V
= 80kΩ  
= 80kΩ  
-
-
-
-
-
-
PDHU  
VCC  
VCC  
SET  
SET  
t
33  
ns  
PDHL  
t
400  
ns  
LGMIN  
Upper Drive Source Resistance (Note 3)  
Upper Drive Source Current (Note 3)  
Upper Drive Sink Resistance (Note 3)  
Upper Drive Sink Current (Note 3)  
Lower Drive Source Resistance (Note 3)  
Lower Drive Source Current (Note 3)  
Lower Drive Sink Resistance (Note 3)  
Lower Drive Sink Current (Note 3)  
NOTE:  
R
250mA Source Current  
V = 2.5V  
-
-
-
1.0  
2.00  
1.0  
2.5  
-
Ω
A
Ω
A
Ω
A
Ω
A
UG_SRC  
I
UG_SCR  
UGATE-PHASE  
250mA Sink Current  
= 2.5V  
R
2.5  
-
UG_SNK  
I
V
2.00  
1.0  
UG_SNK  
UGATE-PHASE  
250mA Source Current  
= 2.5V  
R
-
-
-
-
2.5  
-
LG_SRC  
I
V
2.00  
0.4  
LG_SCR  
LGATE  
250mA Sink Current  
= 2.5V  
R
1.0  
-
LG_SNK  
I
V
4.00  
LG_SNK  
LGATE  
3. Guaranteed by Characterization. Not 100% tested in production.  
Functional Pin Description  
NUMBER  
NAME  
FUNCTION  
1
2
3
GND  
Bias and reference ground. All signals are referenced to this node.  
LGATE1 Lower gate drive output of Channel 1. Connect to gate of the low-side power N-Channel MOSFET.  
PVCC This pin supplies power to both the lower and higher gate drives in ISL6614. Its operating range is +5V to 12V. Place a high  
quality low ESR ceramic capacitor from this pin to GND.  
4
FCCM Logic control input that will force continuous conduction mode (HIGH state) or allow discontinuous conduction mode  
(LOW state). Placing a series resistor in this input will allow the switching dead-time to be programmed.  
5
6
7
8
PGND It is the power ground return of both low gate drivers.  
LGATE2 Lower gate drive output of Channel 2. Connect to gate of the low-side power N-Channel MOSFET.  
EN  
Logic control input that will enable (HIGH state) or disable (LOW state) the IC. Shutdown current is <1μA.  
PHASE2 Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET in Channel 2. This pin  
provides a return path for the upper gate drive.  
9
UGATE2 Upper gate drive output of Channel 2. Connect to gate of high-side power N-Channel MOSFET.  
10  
BOOT2 Floating bootstrap supply pin for the upper gate drive of Channel 2. Connect the bootstrap capacitor between this pin and  
the PHASE2 pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See the Internal Bootstrap  
Device section under DESCRIPTION for guidance in choosing the capacitor value.  
11  
BOOT1 Floating bootstrap supply pin for the upper gate drive of Channel 1. Connect the bootstrap capacitor between this pin and  
the PHASE1 pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See the Internal Bootstrap  
Device section under DESCRIPTION for guidance in choosing the capacitor value.  
12  
13  
UGATE1 Upper gate drive output of Channel 1. Connect to gate of high-side power N-Channel MOSFET.  
PHASE1 Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET in Channel 1. This pin  
provides a return path for the upper gate drive.  
14  
15  
VCC  
Connect this pin to a +5V bias supply. It supplies power to internal analog circuits. Place a high quality low ESR ceramic  
capacitor from this pin to GND.  
PWM1 The PWM signal is the control input for the Channel 1 driver. The PWM signal can enter three distinct states during operation, see  
the three-state PWM Input section under DESCRIPTION for further details. Connect this pin to the PWM output of the controller.  
16  
PWM2 The PWM signal is the control input for the Channel 2 driver. The PWM signal can enter three distinct states during operation, see  
the three-state PWM Input section under DESCRIPTION for further details. Connect this pin to the PWM output of the controller.  
N/A  
PAD  
Connect this pad to the power ground plane (GND) via thermally enhanced connection.  
FN6392.0  
November 28, 2006  
5
ISL6210  
Timing Diagram  
2.5V  
t
PWM  
PDHU  
t
t
PDLU  
TSSHD  
t
t
RU  
RU  
t
FU  
t
PTS  
1V  
UGATE  
LGATE  
t
PTS  
1V  
t
RL  
t
TSSHD  
t
PDHL  
t
t
PDLL  
FL  
FIGURE 1. TIMING DIAGRAM  
the lower gate through the drain-to-gate capacitor of the  
lower MOSFET and prevent a shoot through caused by the  
high dv/dt of the phase node.  
Description  
Theory of Operation  
Designed for speed, the ISL6210 dual MOSFET driver  
controls both high-side and low-side N-Channel FETs for two  
separate channels of a Multiphase PWM system from two  
independent PWM signals.  
Diode Emulation  
Diode emulation allows for higher converter efficiency under  
light-load situations. With diode emulation active, the  
ISL6210 will detect the zero current crossing of the output  
inductor and turn off LGATE. This ensures that  
discontinuous conduction mode (DCM) is achieved. Diode  
emulation is asynchronous to the PWM signal. Therefore,  
the ISL6210 will respond to the FCCM input immediately  
after it changes state.  
A rising edge on PWM initiates the turn-off of the lower  
MOSFET (see Timing Diagram). After a short propagation  
delay [t  
], the lower gate begins to fall. Typical fall times  
PDLL  
[t ] are provided in the Electrical Specifications section.  
FL  
Adaptive shoot-through circuitry monitors the LGATE  
voltage. When LGATE has fallen below 1V, UGATE is  
allowed to turn ON. This prevents both the lower and upper  
MOSFETs from conducting simultaneously, or shoot-  
through.  
NOTE: Intersil does not recommend Diode Emulation use with  
r
current sensing topologies. The turn-OFF of the low side  
DS(ON)  
MOSFET can cause gross current measurement inaccuracies.  
Three-State PWM Input  
A falling transition on PWM indicates the turn-off of the upper  
MOSFET and the turn-on of the lower MOSFET. A short  
A unique feature of the ISL6210 and other Intersil drivers is  
the addition of a shutdown window to the PWM input. If the  
PWM signal enters and remains within the shutdown window  
for a set holdoff time, the output drivers are disabled and  
both MOSFET gates are pulled and held low. The shutdown  
state is removed when the PWM signal moves outside the  
shutdown window. Otherwise, the PWM rising and falling  
thresholds outlined in the ELECTRICAL SPECIFICATIONS  
determine when the lower and upper gates are enabled.  
propagation delay [t  
] is encountered before the upper  
PDLU  
gate begins to fall [t ]. The upper MOSFET gate-to-source  
FU  
voltage is monitored, and the lower gate is allowed to rise  
after the upper MOSFET gate-to-source voltage drops below  
1V. The lower gate then rises [t ], turning on the lower  
RL  
MOSFET.  
This driver is optimized for converters with large step down  
compared to the upper MOSFET because the lower  
MOSFET conducts for a much longer time in a switching  
period. The lower gate driver is therefore sized much larger  
to meet this application requirement.  
Adaptive Shoot-Through Protection  
Both drivers incorporate adaptive shoot-through protection  
to prevent upper and lower MOSFETs from conducting  
simultaneously and shorting the input supply. This is  
accomplished by ensuring the falling gate has turned off one  
MOSFET before the other is allowed to turn on.  
The 0.5Ω on-resistance and 4A sink current capability  
enable the lower gate driver to absorb the current injected to  
FN6392.0  
November 28, 2006  
6
ISL6210  
During turn-off of the lower MOSFET, the LGATE voltage is  
monitored until it reaches a 1V threshold, at which time the  
UGATE is released to rise. Adaptive shoot-through circuitry  
monitors the upper MOSFET gate-to-source voltage during  
UGATE turn-off. Once the upper MOSFET gate-to-source  
voltage has dropped below a threshold of 1V, the LGATE is  
allowed to rise.  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
t
DELAY  
In addition to gate threshold monitoring, a programmable  
delay between MOSFET switching can be accomplished by  
placing a resistor in series with the FCCM input. This delay  
allows for maximum design flexibility over MOSFET  
selection. The delay can be programmed from 5ns to 50ns  
and is obtained from the absolute value of the current  
flowing into the FCCM pin. If no resistor is used, the  
0
minimum 5ns delay is selected. Gate threshold monitoring is  
not affected by the addition or removal of the additional  
dead-time. Refer to Figure 2 and Figure 3 for more detail.  
0
167  
333  
500  
667  
833  
1000  
R
(kΩ)  
DELAY  
FIGURE 3. ISL6210 PROGRAMMABLE DEAD-TIME vs  
DELAY RESISTOR  
FCCM = VCC or GND  
The equation governing the dead-time seen in Figure 3 is  
expressed as:  
GATE B  
GATE A  
(EQ. 1)  
T
= [0.045 × R  
] + 5ns  
DELAY(kΩ)  
DELAY(ns)  
The equation can be rewritten to solve for R  
follows:  
as  
DELAY  
ADAPTIVE SHOOT-THROUGH  
PROTECTION  
(T  
5ns)  
DELAY(ns)  
------------------------------------------------------  
(kΩ) =  
R
(EQ. 2)  
DELAY  
0.045  
1V  
Internal Bootstrap Diode  
This driver features an internal bootstrap diode. Simply  
adding an external capacitor across the BOOT and PHASE  
pins completes the bootstrap circuit.  
FCCM = RESISTOR to VCC or GND  
GATE B  
GATE A  
The following equation helps select a proper bootstrap  
capacitor size:  
ADAPTIVE PROTECTION  
WITH DELAY  
Q
GATE  
-------------------------------------  
C
BOOT_CAP  
ΔV  
BOOT_CAP  
(EQ. 3)  
T
= 5n - 50ns  
DELAY  
Q
PVCC  
G1  
-----------------------------------  
Q
=
N  
Q1  
1V  
GATE  
V
GS1  
where Q is the amount of gate charge per upper MOSFET  
G1  
at V  
gate-source voltage and N is the number of  
GS1  
Q1  
control MOSFETs. The ΔV  
BOOT_CAP  
term is defined as the  
FIGURE 2. PROGRAMMABLE DEAD-TIME  
allowable droop in the rail of the upper gate drive.  
As an example, suppose two IRLR7821 FETs are chosen as  
the upper MOSFETs. The gate charge, Q , from the data  
G
sheet is 10nC at 4.5V (V ) gate-source voltage. Then the  
GS  
Q
is calculated to be 22nC at PVCC level. We will  
GATE  
assume a 200mV droop in drive voltage over the PWM  
cycle. We find that a bootstrap capacitance of at least  
0.110μF is required. The next larger standard value  
FN6392.0  
November 28, 2006  
7
ISL6210  
capacitance is 0.22µF. A good quality ceramic capacitor is  
recommended.  
where the gate charge (Q and Q ) is defined at a  
G2  
G1  
particular gate to source voltage (V  
and V  
) in the  
GS1  
GS2  
corresponding MOSFET data sheet; I is the driver’s total  
2.0  
1.8  
Q
quiescent current with no load at both drive outputs; N  
Q1  
and N are number of upper and lower MOSFETs,  
Q2  
1.6  
1.4  
1.2  
1.0  
0.8  
respectively. The I  
V
product is the quiescent power of  
Q
CC  
the driver without capacitive load and is typically negligible.  
The total gate drive power losses are dissipated among the  
resistive components along the transition path. The drive  
resistance dissipates a portion of the total gate drive power  
losses, the rest will be dissipated by the external gate  
Q
= 100nC  
0.6  
0.4  
0.2  
0.0  
GATE  
resistors (R and R , should be a short to avoid  
G1 G2  
interfering with the operation shoot-through protection  
circuitry) and the internal gate resistors (R and R ) of  
20nC  
GI1  
GI2  
MOSFETs. Figures 5 and 6 show the typical upper and lower  
gate drives turn-on transition path. The power dissipation on  
the driver can be roughly estimated as:  
0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0  
ΔV (V)  
BOOT_CAP  
FIGURE 4. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE  
VOLTAGE  
P
= P  
+ P  
+ I VCC  
(EQ. 6)  
DR  
DR_UP  
DR_LOW  
Q
R
R
P
Qg_Q1  
Power Dissipation  
HI1  
LO1  
-------------------------------------- --------------------------------------- ---------------------  
P
=
+
DR_UP  
R
+ R  
R
+ R  
EXT1  
2
Package power dissipation is mainly a function of the  
HI1  
EXT1  
LO1  
switching frequency (F ), the output drive impedance, the  
SW  
R
R
P
Qg_Q2  
HI2  
LO2  
external gate resistance, and the selected MOSFET’s  
internal gate resistance and total gate charge. Calculating  
the power dissipation in the driver for a desired application is  
critical to ensure safe operation. Exceeding the maximum  
allowable power dissipation level will push the IC beyond the  
maximum recommended operating junction temperature of  
125°C. The maximum allowable IC power dissipation for the  
SO14 package is approximately 1W at room temperature,  
while the power dissipation capacity in the QFN packages,  
with an exposed heat escape pad, is around 2W. See Layout  
Considerations paragraph for thermal transfer improvement  
suggestions. When designing the driver into an application, it  
is recommended that the following calculation is used to  
ensure safe operation at the desired frequency for the  
selected MOSFETs. The total gate drive power losses due to  
the gate charge of MOSFETs and the driver’s internal  
circuitry and their corresponding average driver current can  
be estimated with Equations 4 and 5, respectively,  
-------------------------------------- --------------------------------------- ---------------------  
P
R
=
+
DR_LOW  
R
+ R  
R
+ R  
EXT2  
2
HI2  
EXT2  
LO2  
R
R
GI1  
GI2  
-------------  
-------------  
= R  
+
R
= R +  
G2  
EXT2  
G1  
EXT2  
N
N
Q1  
Q2  
PVCC  
BOOT  
D
C
GD  
R
HI1  
G
C
DS  
R
R
LO1  
R
GI1  
C
G1  
UGATE  
PHASE  
GS  
Q1  
S
FIGURE 5. TYPICAL UPPER-GATE DRIVE TURN-ON PATH  
PVCC  
(EQ. 4)  
P
= P  
+ P  
+ I VCC  
Q
Qg_TOT  
Qg_Q1  
Qg_Q2  
2
D
Q
PVCC  
G1  
C
GD  
--------------------------------------  
P
=
F  
N  
Qg_Q1  
SW  
SW  
Q1  
V
LGATE  
GS1  
R
HI2  
G
C
DS  
2
Q
PVCC  
G2  
R
R
LO2  
R
GI2  
C
G2  
--------------------------------------  
P
=
F  
N  
Qg_Q2  
Q2  
V
GS2  
GS  
Q2  
S
GND  
Q
N  
Q
N  
G2 Q2  
V
GS2  
G1  
V
Q1  
(EQ. 5)  
----------------------------- -----------------------------  
I
=
+
F  
+ I  
Q
DR  
SW  
GS1  
FIGURE 6. TYPICAL LOWER-GATE DRIVE TURN-ON PATH  
FN6392.0  
November 28, 2006  
8
ISL6210  
A good layout would help reduce the ringing on the phase  
and gate nodes significantly:  
Layout Considerations  
Reducing Phase Ring  
• Avoid uses via for decoupling components across BOOT  
and PHASE pins and in between VCC and GND pins. The  
decoupling loop should be short.  
The parasitic inductances of the PCB and the power devices  
(both upper and lower FETs) could cause serious ringing,  
exceeding absolute maximum rating of the devices. The  
negative ringing at the edges of the PHASE node could add  
charges to the bootstrap capacitor through the internal  
bootstrap diode, in some cases, it could cause over stress  
across BOOT and PHASE pins. Therefore, user should do a  
careful layout and select proper MOSFETs and drivers. The  
• All power traces (UGATE, PHASE, LGATE, GND, VCC)  
should be short and wide, and avoid using via; otherwise,  
use two vias for interconnection when possible.  
• Keep SOURCE of upper FET and DRAIN of lower FET as  
close as thermally possible.  
2
D PAK and DPAK package MOSFETs have high parasitic  
• Keep connection in between SOURCE of lower FET and  
power ground wide and short.  
lead inductance, which can exacerbate this issue. FET  
selection plays an important role in reducing PHASE ring. If  
higher inductance FETs must be used, a Schottky diode is  
recommended across the lower MOSFET to clamp negative  
PHASE ring.  
• Input capacitors should be placed as close to the DRAIN  
of upper FET and SOURCE of lower FETs as thermally  
possible.  
NOTE: Refer to Intersil Tech Brief TB447 for more information.  
Thermal Management  
For maximum thermal performance in high current, high  
switching frequency applications, connecting the thermal  
pad of the QFN part to the power ground with multiple vias is  
recommended. This heat spreading allows the part to  
achieve its full thermal potential.  
FN6392.0  
November 28, 2006  
9
ISL6210  
Quad Flat No-Lead Plastic Package (QFN)  
Micro Lead Frame Plastic Package (MLFP)  
L16.4x4  
16 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE  
(COMPLIANT TO JEDEC MO-220-VGGC ISSUE C)  
MILLIMETERS  
SYMBOL  
MIN  
NOMINAL  
MAX  
1.00  
0.05  
1.00  
NOTES  
A
A1  
A2  
A3  
b
0.80  
0.90  
-
-
-
-
-
-
9
0.20 REF  
9
0.23  
1.95  
1.95  
0.28  
0.35  
2.25  
2.25  
5, 8  
D
4.00 BSC  
-
D1  
D2  
E
3.75 BSC  
9
2.10  
7, 8  
4.00 BSC  
-
E1  
E2  
e
3.75 BSC  
9
2.10  
7, 8  
0.65 BSC  
-
k
0.25  
0.50  
-
-
-
-
L
0.60  
0.75  
0.15  
8
L1  
N
-
16  
4
4
-
10  
2
Nd  
Ne  
P
3
3
-
-
0.60  
12  
9
θ
-
9
Rev. 5 5/04  
NOTES:  
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.  
2. N is the number of terminals.  
3. Nd and Ne refer to the number of terminals on each D and E.  
4. All dimensions are in millimeters. Angles are in degrees.  
5. Dimension b applies to the metallized terminal and is measured  
between 0.15mm and 0.30mm from the terminal tip.  
6. The configuration of the pin #1 identifier is optional, but must be  
located within the zone indicated. The pin #1 identifier may be  
either a mold or mark feature.  
7. Dimensions D2 and E2 are for the exposed pads which provide  
improved electrical and thermal performance.  
8. Nominal dimensionsare provided toassistwith PCBLandPattern  
Design efforts, see Intersil Technical Brief TB389.  
9. Features and dimensions A2, A3, D1, E1, P & θ are present when  
Anvil singulation method is used and not present for saw  
singulation.  
10. Depending on the method of lead termination at the edge of the  
package, a maximum 0.15mm pull back (L1) maybe present. L  
minus L1 to be equal to or greater than 0.3mm.  
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.  
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN6392.0  
November 28, 2006  
10  

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