ISL75052SEHFE/PROTO [INTERSIL]
1.5A, Rad Hard, Positive, High Voltage LDO;型号: | ISL75052SEHFE/PROTO |
厂家: | Intersil |
描述: | 1.5A, Rad Hard, Positive, High Voltage LDO |
文件: | 总16页 (文件大小:657K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
1.5A, Rad Hard, Positive, High Voltage LDO
ISL75052SEH
Features
The ISL75052SEH is a radiation hardened, single output LDO
specified for an output current of 1.5A. The device operates from
an input voltage range of 4.0V to 13.2V and provides for output
voltages of 0.6V to 12.7V. The output is adjustable based on a
resistor divider setting. Dropout voltages as low as 75mV (at
0.5A) typical can be realized using the device. This allows the
• DLA SMD 5962-13220
• Input supply range 4.0V to 13.2V.
• Output Current up to 1.5A at a T = +150°C
J
• Best in class Accuracy ±1.5%
- Over line, load and temperature
• Ultra Low Dropout:
user to improve the system efficiency by lowering V to nearly
IN
V
.
OUT
- 75mV Dropout (typ) @ 0.5A
- 225mV Dropout (typ) @ 1.5A
The ENABLE feature allows the part to be placed into a low
shutdown current mode of 165µA (typ). When enabled the device
operates with a low ground current of 11mA (typ), which provides
for operation with Low Quiescent Power consumption.
• Noise of 100µV
(typ) between 300Hz to 300kHz
RMS
• SET mitigation with no added filtering/diodes
• Shutdown Current of 165µA (typ)
• Externally adjustable Output Voltage
• PSRR 65dB (typ) @ 1kHz
The device has superior transient response and is designed
keeping Single Event Effects in mind. This results in reduction of
the magnitude of SET seen on the output. There is no need for
additional protection diodes and filters.
• ENable and PGood Feature
COMP pin is provided to enable the use of external
• Programmable Soft-Start/In-rush Current Limiting
• Adjustable Overcurrent Protection
• Over-Temperature Shutdown
compensation. This is achieved by connecting a resistor and
capacitor from COMP to ground. The device is stable with
Tantalum capacitors as low as 47µF (KEMET T525 series) and
provides excellent regulation all the way from no Load to full
Load. The programmable soft-start allows one to program the
inrush current by means of the decoupling capacitor used on the
BYP pin. The OCP pin allows the short circuit output current limit
threshold to be programmed by means of a resistor from OCP pin
to GND. The OCP setting range is from a 0.16A min to 3.2A max.
The resistor sets the constant current threshold for the output
under fault conditions. The thermal shutdown disables the output
if the device temperature exceeds the specified value, it will
subsequently enter a ON/OFF cycle till the fault is removed.
• Stable with 47µF Min Tantalum Capacitor
• Package 16 Ld Flat Pack
• Radiation Environment
- High Dose Rate (50-300rad(Si)/s) . . . . . . . . . 100krad(Si)
- Low Dose Rate (0.01rad(Si)/s). . . . . . . . . . . . 100krad(Si)*
- SET/SEL/SEB. . . . . . . . . . . . . . . . . . . . . . . . ..86 MeV.cm2/mg
*Product capability established by initial characterization. The
"EH" version is acceptance tested on a wafer-by-wafer basis to
50krad(Si) at low dose rate.
Applications
• LDO regulator for Space Power Systems
• DSP, FPGA and µP Core Power Supplies
• Post Regulation of SMPS and Down Hole Drilling
Related Literature
See AN1850, "ISL75052SEH Evaluation Board User's Guide"
See AN1851, "SEE Testing of the ISL75052SEH"
See AN1852, "Radiation Report of the ISL75052SEH"
0.30
EN
VIN
0.25
0.20
0.15
0.10
0.05
0.00
+150°C
3,4,5 VIN
VOUT
ADJ
1,2
+125°C
16
8
BYP
15
14
13
12
VOUT
2.5V
ISL75052SEH
OCP EN
0.1µF
200µF
25°C
9
VCCX
PG
GND
2.2k
0.1µF 200µF
10
COMP
15.8k
2.2n
Ω
300
0.1µF
0.1µF
22k
VIN
4.87k
1nF
22k
PG
0
0.5
1.0
1.5
OUT
2.0
I
(A)
LOAD
FIGURE 2. DROPOUT vs I
FIGURE 1. TYPICAL APPLICATION
May 29, 2013
FN8456.0
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 |Copyright Intersil Americas LLC 2013. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners
1
ISL75052SEH
Block Diagram
COMP
OCP
3.8V
LDO
VIN
VCCX
CURRENT
LIMIT
600mV
BYP
REFERENCE
BIAS
VOUT
POWER
PDMOS
THERMAL
SHUTDOWN
EN
UVLO
ADJ
PG
DELAY
540mV
GND
Typical Applications
EN
1
2
3
4
5
VOUT
VOUT
VIN
16
15
14
BYP
ADJ
EN
VIN
VIN
GND 13
COMP 12
GND 11
PG 10
VCCX
ISL75052SEH
VIN
NC
22k
10k
100µF 100µF
0.1µF
1nF
PG
6
7
8
NC
VOUT = 2.5V
100µF
Ω
300
OCP
VCCX
9
15.8k
2.2k
0.1µF
100µF
NC = No connect pin can be connected
to either VIN or GND
2.2nF
4.87k
0.1µF
FIGURE 3.
FN8456.0
May 29, 2013
2
ISL75052SEH
Pin Configuration
ISL75052SEH
(16 Ld CDFP)
TOP VIEW
VOUT
VOUT
VIN
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
BYP
ADJ
EN
VIN
GND
VIN
COMP
TMODE
NC
NC
PG
OCP
VCCX
DOTTED LINE SHOWS METAL BOTTOM
Pin Descriptions
PIN NUMBER
PIN NAME
DESCRIPTION
ESD CIRCUIT
Circuit 1
3, 4, 5
VIN
Input supply pins.
10
PG
This pin is logic high when V
is not in regulation.
is in regulation signal. A logic low defines when V
OUT
Circuit 2
OUT
13
9
GND
GND pin. Pin 13 is also connected to the metal lid of the package.
Circuit 2
VCCX
The 3.8V internal bus is pinned out to accept a decoupling capacitor. Connect a 0.1µF Circuit 2
ceramic capacitor from VCCX pin to GND.
1, 2
12
15
6, 7
16
8
VOUT
COMP
ADJ
Output voltage pins.
Circuit 1
Circuit 2
Circuit 2
Circuit 2
Circuit 2
Circuit 2
Circuit 2
Circuit 2
Circuit 2
Add compensation capacitor & resistor between COMP and GND.
ADJ pin allows V
OUT
to be programmed with an external resistor divider.
NC
No connect. May be grounded if needed.
BYP
Connect a 0.1µF capacitor from BYP pin to GND, to filter the internal VREF.
OCP pin allows the Current limit to be programmed with an external resistor.
OCP
EN
14
11
V
independent chip enable. TTL and CMOS compatible.
IN
TMODE
Test Mode pin, must be connected to GND.
Bottom
Metallization
The metal surface on the bottom surface of the package is floating. For mounting
instructions see “Bottom Metal Mounting Guidelines” on page 8.
PAD
PAD
ESD_CL_12V
ESD_RC_7V
GND
GND
ESD CIRCUIT 1
ESD CIRCUIT 2
FN8456.0
May 29, 2013
3
ISL75052SEH
Ordering Information
ORDERING
INTERNAL
PART
TEMP
PACKAGE
NUMBER
MKT. NUMBER
MARKING
RANGE (°C)
(RoHS Compliant)
PKG DWG. #
K16.E
5962R1322001VXC
5962R1322001V9A
ISL75052SEHF/SAMPLE
ISL75052SEHFE/PROTO
ISL75052SEHEV1ZB
NOTE:
ISL75052SEHVFE
Q 5962R13 22001VXC
-55 to +125
-55 to +125
-55 to +125
-55 to +125
16 Ld CDFP
Die
ISL75052SEHVX
ISL75052SEHX/SAMPLE
ISL75052SEHFE/PROTO
Evaluation Board
Die Sample
16 Ld CDFP
ISL75052 SEHFE /PROTO
K16.E
1. These Intersil Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with both
SnPb and Pb-free soldering operations.
FN8456.0
May 29, 2013
4
ISL75052SEH
Absolute Maximum Ratings
Thermal Information
V
V
V
Relative to GND without ion beam (Note 2) . . . . . . . . . . -0.3 to +16.0V
Relative to GND under ion beam (Note 2) . . . . . . . . . . . -0.3 to +14.7V
Relative to GND (Note 2) . . . . . . . . . . . . . . . . . . . . . . . . -0.3 to +14.7V
Thermal Resistance (Typical)
16 Ld CDFP Package (Notes 5, 6) . . . . . . .
Storage Temperature Range. . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
θ
JA (°C/W)
26
θ
JC (°C/W)
IN
IN
4.5
OUT
PG,EN,OCP/ADJ,COMP,REFIN,REFOUT relative to GND (Note 2) . . . -0.3to
+6.5VDC
Junction Temperature (T ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175°C
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
J
Recommended Operating Conditions (Notes 3)
Radiation Information
Ambient Temperature Range (T ) . . . . . . . . . . . . . . . . . . .-55°C to +125°C
A
Junction Temperature (T ) (Note 2). . . . . . . . . . . . . . . . . . . . . . . . . . .+150°C
J
Maximum Total Dose
V
Relative to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.0V to 13.2V
High Dose(Dose Rate = 50 - 300radSi/s) . . . . . . . . . . . .100 krads (Si)
IN
V
Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2.5V to 12.7V
Low Dose(Dose Rate = 10milliradSi/s) (Note 4). . . . . . 100 krads (Si)
OUT
2
PG, EN, OCP/ADJ relative to GND . . . . . . . . . . . . . . . . . . . . . . . .0V to +5.5V
SET (V
OUT
within ±5% During Events . . . . . . . . . . . . . . . .86MeV/mg/cm
2
SEL/B (No Latchup/Burnout. . . . . . . . . . . . . . . . . . . . . . . . 86MeV/mg/cm
The output capacitance used for SEE testing is 2x100µF for C and C
,
IN
OUT
100nF for BYPASS
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTES:
2. Extended operation at these conditions may compromise reliability. Exceeding these limits will result in damage. Recommended operating conditions
define limits where specifications are guaranteed.
3. Refer to “Bottom Metal Mounting Guidelines” on page 8.
4. Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer by wafer basis to 50 krad(Si) at low dose
rate.
5. θJA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See
TechBrief TB379
6. For θ , the “case temp” location is the center of the exposed metal pad on the package underside.
JC
7. Electromigration specification defined as lifetime average junction temperature of +150°C where max rated DC current = lifetime average current.
Electrical Specifications Unless otherwise noted, all parameters are guaranteed over the following specified conditions:
V
= V
OUT
+ 0.5V, V
OUT
= 4.0V, C = C
IN
= 2x100µF 60mΩ, KEMET type T541X107N025AH or equivalent, T = +25°C, I = 0A. Applications must follow
OUT J L
IN
thermal guidelines of the package to determine worst case junction temperature. Please refer to “Applications Information” on page 7 of the data sheet
and Tech Brief TB379. Boldface limits apply over the operating temperature range, -55°C to +125°C. Pulse load techniques used by ATE to ensure T = T
J
A
defines guaranteed limits.
MIN
MAX
PARAMETER
DC CHARACTERISTICS
DC Output Voltage Accuracy
SYMBOL
TEST CONDITIONS
(Note 8) TYP (Note 8) UNITS
V
V
OUT
Resistor adjust to: 2.5V and 5.0V
OUT
V
= 2.5V, 4.0V < V < 5.0V; 0A < I
IN
< 1.5A,
< 1.5A,
< 1.5A,
< 1.5A,
-1.5
-2.0
-1.5
-2.0
0.2
0.2
0.2
0.2
1.5
2.0
1.5
2.0
%
%
%
%
OUT
T = -55°C to +125°C
LOAD
LOAD
LOAD
LOAD
J
V
= 2.5V, 4.0V < V < 5.0V; 0A < I
IN
OUT
T = +25°C, Post Rad.
J
V
= 5.0V, 5.5V < V < 6.9V; 0A < I
IN
OUT
T = -55°C to +125°C
J
V
= 5.0V, 5.5V < V < 6.9V, 0A < I
IN
OUT
T = +25°C, Post Rad.
J
V
OUT
Resistor adjust to: 10.0V
= 10.0V, 10.5V < V < 13.2V, I
V
0A,
0A,
-1.5
-2.0
-1.5
-2.0
0.2
0.2
0.2
0.2
1.5
2.0
1.5
2.0
%
%
%
%
OUT
T =-55°C to +125°C
IN
LOAD =
J
V
= 10.0V, 10.5V < V < 13.2V, I
IN
OUT
T = +25°C, Post Rad.
LOAD =
J
V
= 10.0V, V = 10.5V, I
IN
= 1.5A, V =13.2V,
IN
OUT
LOAD
= 1.0A, T = -55°C to +125°C
I
LOAD
J
V
= 10.0V, V = 10.5V; I
IN LOAD
=1.5A, V =13.2V,
IN
OUT
I
= 1.0A, T = +25°C, Post Rad.
LOAD
J
FN8456.0
May 29, 2013
5
ISL75052SEH
Electrical Specifications Unless otherwise noted, all parameters are guaranteed over the following specified conditions:
V
= V
OUT
+ 0.5V, V
OUT
= 4.0V, C = C
IN
= 2x100µF 60mΩ, KEMET type T541X107N025AH or equivalent, T = +25°C, I = 0A. Applications must follow
OUT J L
IN
thermal guidelines of the package to determine worst case junction temperature. Please refer to “Applications Information” on page 7 of the data sheet
and Tech Brief TB379. Boldface limits apply over the operating temperature range, -55°C to +125°C. Pulse load techniques used by ATE to ensure T = T
J
A
defines guaranteed limits. (Continued)
MIN
MAX
PARAMETER
VCCX Pin
SYMBOL
TEST CONDITIONS
(Note 8) TYP (Note 8) UNITS
V
T = -55°C to +125°C; 4V < V < 13.2V; I
= 0A
;
3.7
591
588
588
3.9
600
600
600
4.1
609
612
612
V
VCCX
J
IN LOAD
ADJ Pin
V
T = -55°C to +125°C
mV
mV
mV
ADJ
J
ADJ Pin
V
T = 25°C, Post Rad
J
ADJ
BYP
BYP Pin
V
4.0V < V < 13.2V; I
IN
=0A
LOAD
T = -55°C to +125°C
,
J
DC Input Line Regulation
DC Input Line Regulation
DC Input Line Regulation
DC Output Load Regulation
DC Output Load Regulation
DC Output Load Regulation
ADJ Input Current
4.0V < V < 13.2V, V
IN
= 2.5V
= 5.0V
1
1
8
20
mV
mV
mV
mV
mV
mV
µA
OUT
5.5V < V < 13.2V, V
IN
OUT
10.5V < V < 13.2V, V
IN OUT
= 10.0V
1
10
V
V
V
= 2.5V; 0A < I
= 5.0V; 0A < I
< 1.5A, V = 4.0V
IN
0.3
1.3
0.1
9
OUT
OUT
OUT
LOAD
LOAD
< 1.5A, V = 5.5V
18
IN
< 1.5A, V = 10.5V
= 10.0V; 0A < I
= 0.6V
36
LOAD
IN
V
1
ADJ
Ground Pin Current
I
I
I
I
V
= 2.5V; I
= 2.5V; I
= 0A, 4.0V < V < 13.2V
IN
6
8
10
mA
mA
mA
mA
µA
Q
Q
Q
Q
OUT
OUT
OUT
OUT
LOAD
LOAD
Ground Pin Current
V
V
V
= 1.5A, 4.0V < V < 13.2V
IN
12
Ground Pin Current
= 10.0V, I
= 0A, 11.0V < V < 13.2V
IN
15
20
LOAD
LOAD
Ground Pin Current
= 10.0V, I
= 1.5A, 11.0V < V < 13.2V
IN
20
25
Ground Pin Current in Shutdown
Ground Pin Current in Shutdown
Dropout Voltage (Note 10)
Dropout Voltage (Note 10)
Dropout Voltage (Note 10)
I
ENABLE Pin = 0V, V = 4.0V
IN
70
120
300
160
300
400
0.32
SHDNL
I
ENABLE Pin = 0V, V = 13.2V
IN
165
75
µA
SHDNH
V
V
V
I
I
I
= 0.5A, V
= 1.0A, V
= 1.5A, V
= 3.6V and 12.7V
= 3.6V and 12.7V
= 3.6V and 12.7V
mV
mV
mV
A
DO
DO
DO
LOAD
LOAD
LOAD
OUT
OUT
OUT
150
225
0.24
Output Short Circuit Current for 16
Ld FP
ISCL
V
SET = 4.0V, V
OUT
= 3k, Note 12)
+ 0.5V < V < 13.2V,
IN
0.16
1.6
OUT
R
SET
Output Short Circuit Current for 16
Ld FP
ISCH
V
SET = 4.0V, V
OUT
= 300Ω, Note 12)
+ 0.5V < V < 13.2V,
IN
2.4
3.2
196
25
A
OUT
R
SET
Thermal Shutdown Temperature
(Note 9)
V
+ 0.5V < V < 13.2V
IN
154
175
°C
°C
TSD
OUT
Thermal Shutdown Hysteresis
(Rising Threshold) (Note 9)
V
+ 0.5V < V < 13.2V
IN
TSDn
OUT
AC CHARACTERISTICS
Input Supply Ripple Rejection
(Note 9)
PSRR
PSRR
PSRR
PM
V
V
= 300mV, f = 1kHz, I
= 1.5A;
55
60
40
50
10
65
70
50
dB
dB
dB
°
P-P
LOAD
= 4.9V, V
= 4.0V
IN
OUT
Input Supply Ripple Rejection
(Note 9)
V
V
= 300mV, f = 120Hz, I
= 5mA;
LOAD
P-P
= 4.9V, V
= 2.5V
IN
OUT
Input Supply Ripple Rejection
(Note 9)
V
V
= 300mV, f = 100kHz, I
= 1.5A;
LOAD
P-P
= 4.9V, V
= 4.0V
IN
OUT
Phase Margin, (Note 9)
V
= 2.5V, 4.0V and 10V, C
= 2x100µF,
OUT
OUT
R
=22k, C
= 1nF
COMP
COMP
Gain Margin, (Note 9)
GM
V
= 2.5V, 4.0V and 10V C
= 2x100µF,
dB
OUT
OUT
R
= 22k, C
= 1nF
COMP
COMP
= 10mA, BW = 300Hz < f < 300kHz, BYPASS to
Output Noise Voltage, (Note 9)
I
100
µV
RMS
LOAD
GND capacitor = 0.2µF
FN8456.0
May 29, 2013
6
ISL75052SEH
Electrical Specifications Unless otherwise noted, all parameters are guaranteed over the following specified conditions:
V
= V
OUT
+ 0.5V, V
OUT
= 4.0V, C = C
IN
= 2x100µF 60mΩ, KEMET type T541X107N025AH or equivalent, T = +25°C, I = 0A. Applications must follow
OUT J L
IN
thermal guidelines of the package to determine worst case junction temperature. Please refer to “Applications Information” on page 7 of the data sheet
and Tech Brief TB379. Boldface limits apply over the operating temperature range, -55°C to +125°C. Pulse load techniques used by ATE to ensure T = T
J
A
defines guaranteed limits. (Continued)
MIN
MAX
PARAMETER
SYMBOL
TEST CONDITIONS
(Note 8) TYP (Note 8) UNITS
DEVICE START-UP CHARACTERISTICS
Enable Pin Characteristics
Turn-on Threshold
4.0V < V < 13.2V
IN
0.5
0.8
1.2
1
V
Enable Pin Leakage Current
V
= 13.2V, EN = 5.5V
µA
ms
IN
Enable Pin Propagation Delay (EN
V
= 4.5V, V
OUT
= 4.0V, I
= 1.5A,
= 1.5A,
0.5
1.4
1.1
170
1.0
IN
LOAD
LOAD
step 1.2V to V
OUT
= 100mV)
C
= 22µF, C
= 0.2µF
OUT
BYP
Enable Pin Turn-on Delay
(EN step 1.2V to PGOOD)
V
C
= 4.5V, V
= 4.0V, I
3.0
2.5
ms
ms
mV
IN
OUT
= 2x100µF, C
= 0.2µF
OUT
BYP
= 4.0V, I
Enable Pin Turn-on Delay
(EN step 1.2V to PGOOD)
V
C
= 4.5V, V
= 1.5A,
IN
OUT
= 22µF, C
LOAD
= 0.2µF
OUT
BYP
Hysteresis (Falling Threshold)
PG Pin Characteristics
4.0V < V < 13.2V
75
IN
V
V
V
Error Flag Rising Threshold
Error Flag Falling Threshold
Error Flag Hysteresis
83
80
88
86
2.5
5
94
91
%V
OUT
OUT
OUT
OUT
OUT
OUT
%V
%V
1.75
Error Flag Low Voltage
Error Flag Low Voltage
Error Flag Leakage Current
I
I
= 1mA
100
400
1
mV
SINK
= 10mA
5
mV
µA
SINK
V
= 13.2V, PG = 5.5V
IN
8. Parameters with bold face MIN and/or MAX limits are 100% tested at -55°C, 25°C and 125°C.
9. Limits established by characterization and are not production tested.
10. Dropout is defined by the difference in supply V and V
IN OUT
when the supply produces a 2% drop in V from its nominal value.
OUT
11. Refer to thermal package guidelines in “Bottom Metal Mounting Guidelines” on page 8..
12. OCP recovery overshoot should be within ±4% of the nominal VOUT setpoint.
13. SET performance of <±5% at LET = 86MeV.cm2/mg has been evaluated at V
0.1µF CDR04 X7R capacitor. Capacitor on BYP = 0.1µF CDR04 X7R.
= >2.5V with C = C
IN
= 2x100µF 10V 60mΩ in parallel with
OUT
OUT
OUTPUT CAPACITOR
Applications Information
Input Voltage Requirements
It is recommended to use a combination of Tantalum and
Ceramic capacitors to achieve a good volume to capacitance
ratio. The recommended combination is a 2x100µF 60mΩ rated,
KEMET T541 series tantalum capacitor, in parallel with a 0.1µF
MIL-PRF-49470 ceramic capacitor to be connected to V
Ground pins of the LDO with PCB traces no longer than 0.5cm.
This RH LDO will work from a V in the range of 4.0V to 13.2V.
IN
The input supply can have a tolerance of as much as ±10% for
conditions noted in the specification table. The minimum
guaranteed input voltage is 4.0V. However, due to the nature of
and
OUT
an LDO, V must be some margin higher than the output voltage
plus dropout at the maximum rated current of the application if
IN
INPUT CAPACITOR
It is recommended to use a combination of Tantalum and
Ceramic capacitors to achieve a good capacitance to volume
ratio. The recommended combination is a 2x100µF 60mΩ rated,
KEMET T541 series tantalum capacitor in parallel with a 0.1µF
active filtering (PSRR) is expected from V to V . The Dropout
spec of this family of LDOs has been generously specified in
order to allow design for efficient operation.
IN OUT
External Capacitor Requirements
MIL-PRF-49470 ceramic capacitor to be connected to V and
Ground pins of the LDO with PCB traces no longer than 0.5cm.
IN
GENERAL GUIDELINE
Current Limit Protection
External capacitors are required for proper operation. Careful
attention must be paid to layout guidelines and selection of
capacitor type and value to ensure optimal performance.
The RH LDO incorporates protection against overcurrent due to
any short or overload condition applied to the output pin. The
current limit circuit performs as a constant current source when
the output current exceeds the current limit threshold which can
be adjusted by means of a resistor connected between the OCP
FN8456.0
May 29, 2013
7
ISL75052SEH
pin and GND. If the short or overload condition is removed from
, then the output returns to normal voltage mode regulation.
Bottom Metal Electrical Potential
V
OUT
The package bottom metal is electrically isolated and unbiased.
The bottom metal may be electrically connected to any potential
which offers the best thermal path through conductive mounting
materials (conductive epoxy, solder, etc.) or may be left unbiased
through the use of electrically non-conductive mounting
In the event of an overload condition the LDO will begin to cycle
on and off due to the die temperature exceeding thermal fault
condition. However, one may never witness thermal cycling if the
heatsink used for the package can keep the die temperature
below the limits specified for thermal shutdown. The ROCP can
be calculated using the equation:
materials (non-conductive epoxy, Sil-pad, kapton film, etc.).
Bottom Metal Mounting Guidelines
The package bottom is a solderable metal surface. The following
JESD51-5 guidelines may be used to mount the package:
(EQ. 1)
R
= 893 ⁄ I
OCP
OCP
• Place a thermal land on the PCB under the bottom metal.
Where:
= The OCP resistor value in ohms.
• The land should be approximately the same size to 1mm
larger than the 0.19x0.41inch bottom metal.
R
OCP
I
= The required OCP threshold in amps.
OCP
• Place an array of thermal vias below the thermal land.
• Via array size: ~4 x 9 = 36 thermal vias
ESD Clamps
The ESD_CL_12V ESD clamps break down at nominally 17V. The
ESD_RC_7V clamps break down at nominally 7.5V with a
tolerance of ±10%. The PG pin has a diode to GND. The VOUT pin
has a diode to VIN (see “Pin Descriptions” on page 3).
• Via diameter: ~0.3mm drill diameter with plated copper on
the inside of each via.
• Via pitch: ~1.2mm.
Vias should drop to and contact as much buried metal area as
feasible to provide the best thermal path.
COMP Pin
This pin helps compensate the device for various load conditions.
For 4.0V < VIN < 6.0V use RCOMP = 40k and CCOMP = 1nF. For
6V < VIN < 13.2V use RCOMP = 40k and CCOMP = 4.7nF. The
max current of the COMP pin when shorted to GND is 160µA.
Thermal Fault Protection
In the event the die temperature exceeds +170°C (typ.) the
output of the LDO will shut down until the die temperature can
cool down to +150°C (typ.). The level of power combined with the
Undervoltage Lockout
thermal impedance of the package (θ of 5°C/W for the 16 Ld
JC
CDFP package) will determine if the junction temperature
exceeds the thermal shutdown temperature specified in the
specification table (see “Bottom Metal Mounting Guidelines” on
page 8).
The undervoltage lockout function detects when VCCX exceeds
3.2V. When that level is reached, the LDO feedback loop is
closed and the LDO can begin regulating. This is achieved by
freeing the BYP net to charge up and act as a reference voltage
to the EA. Prior to that happening, the LDO Power PMOS device is
clamped off.
FN8456.0
May 29, 2013
8
ISL75052SEH
Typical Operating Performance
2.605
2.600
2.595
2.590
2.585
2.580
2.575
2.570
2.565
2.560
2.555
10.35
10.30
10.25
10.20
10.15
10.10
10.05
10.00
V
AT 25°C
V
= 12V
V
= 10.8V
OUT
IN
IN
V
AT 125°C
OUT
V
AT -55°C
V
= 13.2V
V
= 14.7V
OUT
IN
IN
0
2
4
6
8
10
12
14
16
18
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
1.6
1.6
1.6
V
(V)
I
IN
OUT
FIGURE 4. LINE REGULATION vs TEMPERATURE (°C),
FIGURE 5A. LOAD REGULATION V
= 10.17V AT 25°C
OUT
V
= 2.579V, I
= 0mA
OUT
OUT
10.35
10.30
10.35
10.30
10.25
10.20
10.15
10.10
10.05
10.00
V
= 10.8V
V
= 12V
IN
IN
10.25
10.20
10.15
10.10
10.05
10.00
V
= 12V
IN
V
= 10.8V
IN
V
= 14.7V
IN
V
= 13.2V
IN
V
= 14.7V
0.6
IN
V
= 13.2V
1.4
IN
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
0
0.2
0.4
0.8
(A)
1.0
1.2
1.6
I
I
OUT
OUT
FIGURE 5B. LOAD REGULATION V
= 10.13V AT 125°C
FIGURE 5C. LOAD REGULATION V
= 10.22V AT -55°C
OUT
OUT
2.61
2.60
2.59
2.61
2.60
2.59
V
= 12V
IN
V
= 10.5V
IN
V
= 4.5V
IN
V
= 4.0V
2.58
2.57
2.56
2.55
2.54
2.53
2.52
2.58
2.57
2.56
2.55
2.54
2.53
2.52
IN
V
= 14.7V
IN
V
= 13.2V
IN
V
= 5.5V
IN
V
= 5.0V
IN
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
1.6
I
I
OUT
OUT
FIGURE 6A. LOAD REGULATION V
= 2.567V AT 25°C
FIGURE 6B. LOAD REGULATION V
= 2.571V AT 125°C
OUT
OUT
FN8456.0
May 29, 2013
9
ISL75052SEH
Typical Operating Performance(Continued)
2.61
2.60
2.59
2.58
2.57
2.56
2.55
2.54
2.53
2.52
13.00
12.95
12.90
12.85
12.80
12.75
12.70
12.65
12.60
12.55
12.50
V
= 12V
IN
V
= 10.5V
IN
V
= 13.2V
IN
V
= 14.7V
= 16.2V
IN
V
= 14.7V
IN
V
= 13.2V
IN
V
IN
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
1.6
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
1.6
I
I
OUT
OUT
FIGURE 6C. LOAD REGULATION V
= 2.564V AT -55°C
FIGURE 7A. LOAD REGULATION V
= 12.75V AT 25°C
OUT
OUT
13.00
12.95
12.90
12.85
12.80
12.75
13.00
12.95
12.90
12.85
12.80
V
= 14.7V
V
= 13.2V
IN
IN
12.75
12.70
12.65
12.60
12.55
12.50
V
= 16.2V
IN
V
= 14.7V
V
= 13.2V
IN
IN
12.70
12.65
12.60
12.55
12.50
V
= 16.2V
IN
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
0
0.2
0.4
0.6
0.8
(A)
1.0
1.2
1.4
1.6
I
(A)
I
OUT
OUT
FIGURE 7B. LOAD REGULATION V
= 12.63V AT 125°C
FIGURE 7C. LOAD REGULATION V
= 12.7V AT -55°C
OUT
OUT
Timebase = 500µs/DIV
Timebase = 500µs/DIV
V
= 20mV/DIV
OUT
V
= 20mV/DIV
OUT
I
= 500mA/DIV
OUT
I
= 500mA/DIV
OUT
FIGURE 8. LOAD STEP RESPONSE, 25°C, V = 4.0V, V
IN OUT
= 2.5V,
FIGURE 9. LOAD STEP RESPONSE, 25°C, V = 4.0V, V
IN OUT
= 2.5V,
I
= 0A to 1.6A, C
= 200µF, 30mΩ
OUT
OUT
I
= 0.15A to 1.6A, C
= 200µF, 30mΩ
OUT
OUT
FN8456.0
May 29, 2013
10
ISL75052SEH
Typical Operating Performance(Continued)
Timebase = 500µs/DIV
Timebase = 500µs/DIV
V
= 50mV/DIV
V
= 50mV/DIV
OUT
OUT
I
= 500mA/DIV
I
= 500mA/DIV
OUT
OUT
FIGURE 9B. LOAD STEP RESPONSE, 25°C, V = 13.2V, V
IN OUT
= 10V,
FIGURE 9A. LOAD STEP RESPONSE, 25°C, V = 13.2V, V
IN OUT
= 10V,
I
= 0.15A to 1.5A, C
= 200µF, 30mΩ
I
= 0A to 1.5A, C
= 200µF, 30mΩ
OUT
OUT
OUT
OUT
60
50
180
150
120
90
70
60
50
40
30
180
150
120
90
PHASE (°)
PHASE (°)
40
30
20
60
60
20
10
30
10
30
0
0
0
0
-10
-20
-30
-40
-50
-60
-70
-10
-20
-30
-40
-50
-60
-30
-60
-90
-120
-150
-180
-30
-60
-90
-120
-150
-180
GAIN (dB)
GAIN (dB)
500
5k
50k
FREQUENCY (Hz)
500k
500
5k
50k
500k
FREQUENCY (Hz)
FIGURE 10. GAIN PHASE PLOTS, V = 4V, V
IN
= 2.5V, I
= 200µF, 30mΩ,
= 0.2A,
FIGURE 11. GAIN PHASE PLOTS, V = 4V, V
IN
= 2.5V, I = 1.5A,
OUT
= 200µF, 30mΩ,
OUT
OUT
OUT
OUT
OUT
R
= 22k, C
= 1nF, C
R
= 22k, C = 1nF, C
COMP
COMP
COMP
COMP
PHASE MARGIN = 98.68°, GAIN MARGIN = 23.01dB
PHASE MARGIN = 84.56°, GAIN MARGIN = 18.06dB
-30
-40
125°C PSRR (dB)
-50
-60
-70
25°C PSRR (dB)
-80
-55°C PSRR (dB)
10k
-90
-100
100
1k
100k
FREQUENCY (Hz)
FIGURE 12. PSRR, V = 4.9V, V
IN
= 4.0V, I
= 1.5A, R
COMP
= 22k, C
= 1nF, C = 200µF, 30mΩ
OUT
OUT
OUT
COMP
FN8456.0
May 29, 2013
11
ISL75052SEH
Typical Operating Performance(Continued)
Timebase = 1ms/DIV
C1 to C4 = 1V/DIV
Timebase = 1ms/DIV
C1 to C4 = 1V/DIV
EN
EN
V
V
V
V
IN
IN
OUT
OUT
P
P
GOOD
GOOD
FIGURE 13. 25°C START-UP WITH ENABLE, V = 4V, V
IN OUT
= 2.5V,
FIGURE 14. 25°C START-UP WITH ENABLE, V = 4V, V = 2.5V,
IN OUT
I
= 0.1A
I
= 1.5A
OUT
OUT
Timebase = 5ms/DIV
C1 to C4 = 1V/DIV
Timebase = 5ms/DIV
C1 to C4 = 1V/DIV
V
OUT
V
OUT
V
V
IN
IN
P
P
GOOD
GOOD
EN
EN
FIGURE 15. 25°C SHUTDOWN WITH ENABLE, V = 4V, V
IN OUT
= 2.5V,
FIGURE 16. 25°C SHUTDOWN WITH ENABLE, V = 4V, V
IN OUT
= 2.5V,
I
= 0.1A
I
= 1.5A
OUT
OUT
Timebase = 200µs/DIV
EN
V
IN
V
OUT
P
GOOD
FIGURE 17. 25°C PROPAGATION DELAY, V = 4.5V, V
IN
= 4V, I
= 1.5A, EN 50% TO V 5%
OUT
OUT
OUT
FN8456.0
May 29, 2013
12
ISL75052SEH
TOP METALLIZATION
Package Characteristics
Weight of Packaged Device
Type: AlCu (99.5%/0.5%)
Thickness: 2.7µm ± 0.4µm
0.59 Grams (Typical)
SUSTRATE
Lid Characteristics
Type: Silicon
Finish: Gold
Potential: Connected to Pin 13 (GND)
Case Isolation to Any Lead: 20 x 10 Ω (min)
BACKSIDE FINISH
Silicon
9
ASSEMBLY RELATED INFORMATION
Die Characteristics
Die Dimensions
SUBSTRATE POTENTIAL
Ground
2819μm x 5638μm (111 mils x 222 mils).
Thickness: 304.8μm ± 25.4μm (12.0 mils ± 1 mil).
ADDITIONAL INFORMATION
Interface Materials
WORST CASE CURRENT DENSITY
5
2
< 2 x 10 A/cm
GLASSIVATION
Type: Silicon Oxide and Silicon Nitride
Thickness: 0.3µm ± 0.03µm to 1.2µm ± 0.12µm
TRANSISTOR COUNT
1074
PROCESS
0.6µm BiCMOS Junction Isolated
FN8456.0
May 29, 2013
13
ISL75052SEH
Metallization Mask Layout
TABLE 1. DIE LAYOUT X-Y COORDINATES
PIN
PAD
1
X
Y
DX
185
185
5508
185
185
185
185
185
185
185
185
185
185
185
185
185
DY
450
449
2689
450
450
185
185
185
185
185
450
185
185
185
184
450
NAME
VOUT
VOUT
VIN
PIN#
1,2
1,2
3,4,5
3,4,5
3,4,5
8
1019
1249
2764
3070
3300
5037
5253
5099
4635
3824
2840
1799
668
1021
390
2
3
1354
1030
399
4
VIN
5
VIN
6
256
OCP
VCCX
PG
7
1635
2436
2436
2436
1660
2436
2436
2381
1972
1652
9
8
10
9
TMODE
COMP
VIN
11
10
11
12
13
14
15
16
12
3,4,5
13
GND
EN
14
168
ADJ
15
168
BYP
16
789
VOUT
1,2
For additional products, see www.intersil.com/en/products.html
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN8456.0
May 29, 2013
14
ISL75052SEH
Revision History
The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to the web to make sure that
you have the latest revision.
DATE
REVISION
FN8456.0
CHANGE
May 29, 2013
Initial Release
About Intersil
Intersil Corporation is a leader in the design and manufacture of high-performance analog, mixed-signal and power management
semiconductors. The company's products address some of the largest markets within the industrial and infrastructure, personal
computing and high-end consumer markets. For more information about Intersil, visit our website at www.intersil.com.
For the most updated datasheet, application notes, related documentation and related parts, please see the respective product
information page found at www.intersil.com. You may report errors or suggestions for improving this datasheet by visiting
www.intersil.com/en/support/ask-an-expert.html. Reliability reports are also available from our website at
http://www.intersil.com/en/support/qualandreliability.html#reliability
FN8456.0
May 29, 2013
15
ISL75052SEH
Package Outline Drawing
K16.E
16 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE
Rev 1, 1/12
0.015 (0.38)
PIN NO. 1
0.008 (0.20) ID OPTIONAL
1
2
A
A
0.050 (1.27 BSC)
PIN NO. 1
ID AREA
0.420
0.400
0.005 (0.13)
MIN
4
TOP VIEW
0.022 (0.56)
0.015 (0.38)
0.115 (2.92)
0.009 (0.23)
0.004 (0.10)
0.045 (1.14)
0.026 (0.66)
0.085 (2.16)
6
0.278 (7.06)
0.262 (6.65)
-D-
-H-
-C-
0.370 (9.40)
0.250 (6.35)
0.198 (5.03)
0.182 (4.62)
BOTTOM
METAL
0.03 (0.76) MIN
7
SEATING AND
BASE PLANE
SIDE VIEW
BOTTOM METAL
0.005 (0.127) REF.
OFFSET FROM
CERAMIC EDGE
OPTIONAL
PIN 1 INDEX
BOTTOM VIEW
NOTES:
Index area: A notch or a pin one identification mark shall be located
adjacent to pin one and shall be located within the shaded area shown.
The manufacturer’s identification shall not be used as a pin one
identification mark. Alternately, a tab may be used to identify pin one.
1.
0.006 (0.15)
0.004 (0.10)
LEAD FINISH
2. If a pin one identification mark is used in addition to a tab, the limits
of the tab dimension do not apply.
0.009 (0.23)
0.004 (0.10)
BASE
METAL
3. The maximum limits of lead dimensions (section A-A) shall be
measured at the centroid of the finished lead surfaces, when solder
dip or tin plate lead finish is applied.
0.019 (0.48)
0.015 (0.38)
4. Measure dimension at all four corners.
0.0015 (0.04)
MAX
5. For bottom-brazed lead packages, no organic or polymeric materials
shall be molded to the bottom of the package to cover the leads.
0.022 (0.56)
0.015 (0.38)
6. Dimension shall be measured at the point of exit (beyond the
meniscus) of the lead from the body. Dimension minimum shall
be reduced by 0.0015 inch (0.038mm) maximum when solder dip
lead finish is applied.
3
SECTION A-A
7. The bottom of the package is a solderable metal surface.
8. Dimensioning and tolerancing per ANSI Y14.5M - 1982.
9. Dimensions: INCH (mm). Controlling dimension: INCH.
FN8456.0
May 29, 2013
16
相关型号:
ISL76120ARTZ
Automotive Grade USB 2.0 High/Full Speed Multiplexer; DFN10; Temp Range: -40° to 105°C
RENESAS
ISL76120ARTZ-T
Automotive Grade USB 2.0 High/Full Speed Multiplexer; DFN10; Temp Range: -40° to 105°C
RENESAS
©2020 ICPDF网 联系我们和版权申明