X28HC64JZ-12 [INTERSIL]

5 Volt, Byte Alterable EEPROM; 5伏,可变的字节EEPROM
X28HC64JZ-12
型号: X28HC64JZ-12
厂家: Intersil    Intersil
描述:

5 Volt, Byte Alterable EEPROM
5伏,可变的字节EEPROM

可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总17页 (文件大小:358K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
X28HC64  
64k, 8k x 8-Bit  
®
Data Sheet  
August 28, 2009  
FN8109.2  
5 Volt, Byte Alterable EEPROM  
Features  
The X28HC64 is an 8K x 8 EEPROM, fabricated with Intersil’s  
proprietary, high performance, floating gate CMOS  
technology. Like all Intersil programmable nonvolatile  
memories, the X28HC64 is a 5V only device. It features the  
JEDEC approved pinout for byte-wide memories, compatible  
with industry standard RAMs.  
• 70ns access time  
• Simple byte and page write  
- Single 5V supply  
- No external high voltages or VPP control circuits  
- Self-timed  
- No erase before write  
The X28HC64 supports a 64-byte page write operation,  
effectively providing a 32µs/byte write cycle, and enabling the  
entire memory to be typically written in 0.25 seconds. The  
X28HC64 also features DATA Polling and Toggle Bit Polling,  
two methods providing early end of write detection. In addition,  
the X28HC64 includes a user-optional software data protection  
mode that further enhances Intersil’s hardware write protect  
capability.  
- No complex programming algorithms  
- No overerase problem  
• Low power CMOS  
- 40mA active current max.  
• 200µA standby current max.  
• Fast write cycle times  
- 64-byte page write operation  
- Byte or page write cycle: 2ms typical  
- Complete memory rewrite: 0.25 sec. typical  
- Effective byte write cycle time: 32µs typical  
Intersil EEPROMs are designed and tested for applications  
requiring extended endurance. Inherent data retention is  
greater than 100 years.  
• Software data protection  
• End of write detection  
- DATA polling  
- Toggle bit  
• High reliability  
- Endurance: 100000 cycles  
- Data retention: 100 years  
• JEDEC approved byte-wide pin out  
• Pb-free available (RoHS compliant)  
Pinouts  
X28HC64  
(28 LD PDIP, SOIC)  
TOP VIEW  
X28HC64  
(32 LD PLCC)  
TOP VIEW  
1
28  
VCC  
NC  
A12  
A7  
2
27  
WE  
NC  
A8  
4
3
2
1
32 31 30  
29  
3
26  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
5
A8  
A9  
4
25  
A6  
6
7
28  
27  
5
24  
A9  
A5  
A11  
NC  
OE  
A10  
6
23  
A11  
A4  
8
9
26  
25  
7
X28HC64 22  
A3  
OE  
A10  
X28HC64  
(Top View)  
8
21  
20  
19  
18  
17  
16  
15  
A2  
10  
11  
24  
23  
9
A1  
CE  
CE  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
10  
11  
12  
13  
14  
A0  
I/O7  
I/O6  
12  
13  
22  
21  
NC  
I/O0  
I/O1  
I/O0  
14 15 16 17 18 19 20  
I/O2  
VSS  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc.  
Copyright Intersil Americas Inc. 2005-2006, 2009. All Rights Reserved  
1
All other trademarks mentioned are the property of their respective owners.  
X28HC64  
Ordering Information  
TEMPERATURE  
RANGE (°C)  
ACCESS TIME  
(ns)  
PKG.  
DWG. #  
PART NUMBER  
PART MARKING  
PACKAGE  
32 Ld PLCC  
X28HC64J-70 RR  
X28HC64JI-70 ZRR  
X28HC64J-70 ZRR  
X28HC64SI-70 RR  
X28HC64S-70 RRZ  
X28HC64J-90 RR  
X28HC64JI-90 RR  
X28HC64JI-90 ZRR  
X28HC64P-90 RR  
X28HC64PI-90 RR  
X28HC64PI-90 RRZ  
X28HC64P-90 RRZ  
X28HC64J-12 RR  
X28HC64JI-12 RR  
X28HC64JI-12 Z RR  
X28HC64J-12 RRZ  
X28HC64P-12 RR  
X28HC64PI-12 RR  
0 to +70  
70  
N32.45x55  
N32.45x55  
N32.45x55  
M28.3  
X28HC64J-70*  
-40 to +85  
0 to +70  
32 Ld PLCC (Pb-free)  
32 Ld PLCC (Pb-free)  
28 Ld SOIC (300 mil)  
X28HC64JIZ-70* (Note 1)  
X28HC64JZ-70* (Note 1)  
X28HC64SIZ-70  
-40 to +85  
0 to +70  
28 Ld SOIC (300 mil) (Pb-free) M28.3  
X28HC64SZ-70 (Note 1)  
X28HC64J-90*  
0 to +70  
90  
32 Ld PLCC  
N32.45x55  
-40 to +85  
-40 to +85  
0 to +70  
32 Ld PLCC  
N32.45x55  
N32.45x55  
E28.6  
X28HC64JI-90**  
32 Ld PLCC (Pb-free)  
28 Ld PDIP  
X28HC64JIZ-90* (Note 1)  
X28HC64P-90  
-40 to +85  
-40 to +85  
0 to +70  
28 Ld PDIP  
E28.6  
X28HC64PI-90  
28 Ld PDIP (Pb-free)  
28 Ld PDIP (Pb-free)  
32 Ld PLCC  
E28.6  
X28HC64PIZ-90 (Notes 1, 2)  
E28.6  
X28HC64PZ-90 (Notes 1, 2)  
X28HC64J-12*  
0 to +70  
120  
N32.45x55  
N32.45x55  
N32.45x55  
N32.45x55  
E28.6  
X28HC64JI-12*  
-40 to +85  
-40 to +85  
0 to +70  
32 Ld PLCC  
X28HC64JIZ-12* (Note 1)  
X28HC64JZ-12* (Note 1)  
X28HC64P-12  
32 Ld PLCC (Pb-free)  
32 Ld PLCC (Pb-free)  
28 Ld PDIP  
0 to +70  
X28HC64PI-12  
-40 to +85  
-40 to +85  
0 to +70  
28 Ld PDIP  
E28.6  
X28HC64PIZ-12 (Notes 1, 2) X28HC64PI-12 RRZ  
X28HC64PZ-12 (Notes 1, 2) X28HC64P-12 RRZ  
28 Ld PDIP (Pb-free)  
28 Ld PDIP (Pb-free)  
28 Ld SOIC (300 mil)  
28 Ld SOIC (300 mil)  
E28.6  
E28.6  
X28HC64S-12*, **  
X28HC64S-12 RR  
X28HC64SI-12 RR  
X28HC64SI-12 RRZ  
X28HC64S-12 RRZ  
0 to +70  
M28.3  
X28HC64SI-12*  
-40 to +85  
-40 to +85  
0 to +70  
M28.3  
X28HC64SIZ-12* (Note 1)  
X28HC64SZ-12 (Note 1)  
28 Ld SOIC (300 mil) (Pb-free) M28.3  
28 Ld SOIC (300 mil) (Pb-free) M28.3  
*Add “T1” suffix for tape and reel. Please refer to TB347 for details on reel specifications.  
***Add “T2” suffix for tape and reel. Please refer to TB347 for details on reel specifications.  
NOTES:  
1. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100%  
matte tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations).  
Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC  
J STD-020.  
2. Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing  
applications.  
FN8109.2  
August 28, 2009  
2
X28HC64  
Device Operation  
Pin Descriptions  
Addresses (A -A )  
Read  
0
12  
The Address inputs select an 8-bit memory location during a  
read or write operation.  
Read operations are initiated by both OE and CE LOW. The  
read operation is terminated by either CE or OE returning  
HIGH. This two line control architecture eliminates bus  
contention in a system environment. The data bus will be in  
a high impedance state when either OE or CE is HIGH.  
Chip Enable (CE)  
The Chip Enable input must be LOW to enable all read/write  
operations. When CE is HIGH, power consumption is reduced.  
Write  
Output Enable (OE)  
Write operations are initiated when both CE and WE are  
LOW and OE is HIGH. The X28HC64 supports both a CE  
and WE controlled write cycle. That is, the address is latched  
by the falling edge of either CE or WE, whichever occurs  
last. Similarly, the data is latched internally by the rising edge  
of either CE or WE, whichever occurs first. A byte write  
operation, once initiated, will automatically continue to  
completion, typically within 2ms.  
The Output Enable input controls the data output buffers and  
is used to initiate read operations.  
Data In/Data Out (I/O -I/O )  
0
7
Data is written to or read from the X28HC64 through the I/O  
pins.  
Write Enable (WE)  
The Write Enable input controls the writing of data to the  
X28HC64.  
Page Write Operation  
The page write feature of the X28HC64 allows the entire  
memory to be written in 0.25 seconds. Page write allows two  
to sixty-four bytes of data to be consecutively written to the  
X28HC64 prior to the commencement of the internal  
programming cycle. The host can fetch data from another  
device within the system during a page write operation  
(change the source address), but the page address (A6  
through A12) for each subsequent valid write cycle to the part  
during this operation must be the same as the initial page  
address.  
TABLE 1. PIN NAMES  
SYMBOL  
A0-A12  
I/O0-I/O7  
WE  
DESCRIPTION  
Address Inputs  
Data Input/Output  
Write Enable  
Chip Enable  
Output Enable  
+5V  
CE  
OE  
VCC  
The page write mode can be initiated during any write  
operation. Following the initial byte write cycle, the host can  
write an additional one to sixty-three bytes in the same  
manner. Each successive byte load cycle, started by the WE  
HIGH to LOW transition, must begin within 100µs of the  
falling edge of the preceding WE. If a subsequent WE HIGH  
to LOW transition is not detected within 100µs, the internal  
automatic programming cycle will commence. There is no  
page write window limitation. Effectively the page write  
window is infinitely wide, so long as the host continues to  
access the device within the byte load cycle time of 100µs.  
VSS  
Ground  
NC  
No Connect  
Block Diagram  
65,536-BIT  
X BUFFERS  
LATCHES AND  
DECODER  
EEPROM  
ARRAY  
A –A  
0
12  
ADDRESS  
INPUTS  
Write Operation Status Bits  
Y BUFFERS  
LATCHES  
AND  
The X28HC64 provides the user two write operation status  
bits. These can be used to optimize a system write cycle  
time. The status bits are mapped onto the I/O bus as shown  
in Figure 1.  
I/O BUFFERS  
AND LATCHES  
DECODER  
CE  
I/O  
DP  
TB  
5
4
3
2
1
0
CONTROL  
LOGIC AND  
TIMING  
I/O –I/O  
DATA INPUTS/OUTPUTS  
0
7
OE  
WE  
RESERVED  
TOGGLE BIT  
DATA POLLING  
V
CC  
SS  
V
FIGURE 1. STATUS BIT ASSIGNMENT  
FN8109.2  
August 28, 2009  
3
X28HC64  
DATA Polling (I/O )  
Toggle Bit (I/O )  
7
6
The X28HC64 features DATA Polling as a method to indicate  
to the host system that the byte write or page write cycle has  
completed. DATA Polling allows a simple bit test operation to  
determine the status of the X28HC64, eliminating additional  
interrupt inputs or external hardware. During the internal  
programming cycle, any attempt to read the last byte written  
will produce the complement of that data on I/O7 (i.e. write  
data = 0xxx xxxx, read data = 1xxx xxxx). Once the  
The X28HC64 also provides another method for determining  
when the internal write cycle is complete. During the internal  
programming cycle I/O6 will toggle from HIGH to LOW and  
LOW to HIGH on subsequent attempts to read the device.  
When the internal cycle is complete the toggling will cease  
and the device will be accessible for additional read or write  
operations.  
programming cycle is complete, I/O7 will reflect true data.  
DATA Polling I/O  
7
Last  
Write  
WE  
CE  
OE  
V
IH  
V
OH  
HIGH Z  
I/O  
7
V
OL  
X28HC64  
Ready  
A –A  
0
12  
An  
An  
An  
An  
An  
An  
An  
FIGURE 2. DATA POLLING BUS SEQUENCE  
DATA Polling can effectively reduce the time for writing to the  
X28HC64. The timing diagram in Figure 2 illustrates the  
sequence of events on the bus. The software flow diagram in  
Figure 3 illustrates one method of implementing the routine.  
WRITE DATA  
NO  
WRITES  
COMPLETE?  
YES  
SAVE LAST DATA  
AND ADDRESS  
READ LAST  
ADDRESS  
IO  
7
NO  
COMPARE?  
YES  
READY  
FIGURE 3. DATA POLLING SOFTWARE FLOW  
FN8109.2  
August 28, 2009  
4
X28HC64  
The Toggle Bit I/O  
6
LAST  
WRITE  
WE  
CE  
OE  
V
OH  
HIGH Z  
I/O  
6
*
*
V
OL  
X28HC64  
READY  
* BEGINNING AND ENDING STATE OF I/O WILL VARY.  
6
FIGURE 4. TOGGLE BIT BUS SEQUENCE  
Hardware Data Protection  
The X28HC64 provides two hardware features that protect  
nonvolatile data from inadvertent writes.  
LAST WRITE  
YES  
• Default VCC Sense—All write functions are inhibited when  
VCC is 3V typically.  
• Write Inhibit—Holding either OE LOW, WE HIGH, or CE  
HIGH will prevent an inadvertent write cycle during power-  
up and power-down, maintaining data integrity.  
LOAD ACCUM  
FROM ADDR N  
Software Data Protection  
The X28HC64 offers a software controlled data protection  
feature. The X28HC64 is shipped from Intersil with the software  
data protection NOT ENABLED; that is, the device will be in the  
standard operating mode. In this mode data should be  
protected during power-up/-down operations through the use of  
external circuits. The host would then have open read and write  
access of the device once VCC was stable.  
COMPARE  
ACCUM WITH  
ADDR N  
NO  
COMPARE  
OK?  
YES  
The X28HC64 can be automatically protected during power-  
up and power-down without the need for external circuits by  
employing the software data protection feature. The internal  
software data protection circuit is enabled after the first write  
operation utilizing the software algorithm. This circuit is  
nonvolatile and will remain set for the life of the device,  
unless the reset command is issued.  
READY  
FIGURE 5. TOGGLE BIT SOFTWARE FLOW  
The Toggle Bit can eliminate the chore of saving and  
fetching the last address and data in order to implement  
DATA Polling. This can be especially helpful in an array  
comprised of multiple X28HC64 memories that is frequently  
updated. Toggle Bit Polling can also provide a method for  
status checking in multiprocessor applications. The timing  
diagram in Figure 4 illustrates the sequence of events on the  
bus. The software flow diagram in Figure 5 illustrates a  
method for polling the Toggle Bit.  
Once the software protection is enabled, the X28HC64 is  
also protected from inadvertent and accidental writes in the  
powered-up state. That is, the software algorithm must be  
issued prior to writing additional data to the device.  
Software Algorithm  
Selecting the software data protection mode requires the  
host system to precede data write operations by a series of  
three write operations to three specific addresses. Refer to  
Figure 6 and 7 for the sequence. The three-byte sequence  
opens the page write window, enabling the host to write from  
one to sixty-four bytes of data. Once the page load cycle has  
been completed, the device will automatically be returned to  
the data protected state.  
FN8109.2  
August 28, 2009  
5
X28HC64  
Software Data Protection  
V
CC  
(V  
)
CC  
0V  
DATA  
ADDR  
AAA  
1555  
55  
0AAA  
A0  
1555  
WRITES  
OK  
WRITE  
PROTECTED  
t
WC  
CE  
BYTE  
OR  
t  
BLC MAX  
WE  
PAGE  
FIGURE 6. TIMING SEQUENCE—BYTE OR PAGE WRITE  
Regardless of whether the device has previously been  
protected or not, once the software data protection algorithm  
is used, the X28HC64 will automatically disable further  
writes unless another command is issued to deactivate it. If  
no further commands are issued the X28HC64 will be write  
protected during power-down and after any subsequent  
power-up.  
WRITE DATA AA  
TO ADDRESS  
1555  
WRITE DATA 55  
TO ADDRESS  
0AAA  
Note: Once initiated, the sequence of write operations  
should not be interrupted.  
WRITE DATA A0  
TO ADDRESS  
1555  
BYTE/PAGE  
LOAD ENABLED  
WRITE DATA XX  
TO ANY  
ADDRESS  
OPTIONAL  
BYTE/PAGE  
LOAD OPERATION  
WRITE LAST  
BYTE TO  
LAST ADDRESS  
AFTER T  
WC  
RE-ENTERS DATA  
PROTECTED STATE  
FIGURE 7. WRITE SEQUENCE FOR SOFTWARE DATA  
PROTECTION  
FN8109.2  
August 28, 2009  
6
X28HC64  
Resetting Software Data Protection  
V
CC  
AAA  
1555  
55  
0AAA  
80  
1555  
AA  
1555  
55  
0AAA  
20  
1555  
STANDARD  
OPERATING  
MODE  
DATA  
ADDR  
t  
WC  
CE  
WE  
FIGURE 8. RESET SOFTWARE DATA PROTECTION TIMING SEQUENCE  
In the event the user wants to deactivate the software data  
protection feature for testing or reprogramming in an  
EEPROM programmer, the following six step algorithm will  
reset the internal protection circuit. After tWC, the X28HC64  
will be in standard operating mode.  
WRITE DATA AA  
TO ADDRESS  
1555  
Note: Once initiated, the sequence of write operations  
should not be interrupted.  
WRITE DATA 55  
TO ADDRESS  
0AAA  
WRITE DATA 80  
TO ADDRESS  
1555  
WRITE DATA AA  
ADDRESS  
1555  
WRITE DATA 55  
TO ADDRESS  
0AAA  
WRITE DATA 20  
TO ADDRESS  
1555  
FIGURE 9. SOFTWARE SEQUENCE TO DEACTIVATE  
SOFTWARE  
FN8109.2  
August 28, 2009  
7
X28HC64  
Because the X28HC64 has two power modes, standby and  
System Considerations  
active, proper decoupling of the memory array is of prime  
concern. Enabling CE will cause transient current spikes.  
The magnitude of these spikes is dependent on the output  
capacitive loading of the I/Os. Therefore, the larger the array  
sharing a common bus, the larger the transient spikes. The  
voltage peaks associated with the current transients can be  
suppressed by the proper selection and placement of  
decoupling capacitors. As a minimum, it is recommended  
that a 0.1µF high frequency ceramic capacitor be used  
between VCC and VSS at each device. Depending on the  
size of the array, the value of the capacitor may have to be  
larger.  
Because the X28HC64 is frequently used in large memory  
arrays, it is provided with a two-line control architecture for  
both read and write operations. Proper usage can provide  
the lowest possible power dissipation, and eliminate the  
possibility of contention where multiple I/O pins share the  
same bus.  
To gain the most benefit, it is recommended that CE be  
decoded from the address bus, and be used as the primary  
device selection input. Both OE and WE would then be  
common among all devices in the array. For a read  
operation, this assures that all deselected devices are in  
their standby mode, and that only the selected device(s)  
is/are outputting data on the bus.  
In addition, it is recommended that a 4.7µF electrolytic bulk  
capacitor be placed between VCC and VSS for each eight  
devices employed in the array. This bulk capacitor is  
employed to overcome the voltage droop caused by the  
inductive effects of the PC board traces.  
1.4  
1.4  
5.5V  
CC  
5.5V  
CC  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
- 55°C  
+ 25°C  
5.0V  
CC  
+ 125°C  
4.5V  
CC  
0M  
10M  
FREQUENCY (Hz)  
20M  
0M  
10M  
FREQUENCY (Hz)  
20M  
FIGURE 11. NORMALIZED ICC(RD) @ 25% OVER THE VCC  
RANGE AND FREQUENCY  
FIGURE 10. NORMALIZED ICC(RD) BY TEMPERATURE  
OVER FREQUENCY DATA PROTECTION  
FN8109.2  
August 28, 2009  
8
X28HC64  
Absolute Maximum Ratings  
Thermal Information  
Temperature Under Bias  
Pb-Free Reflow Profile. . . . . . . . . . . . . . . . . . . . . . . . .see link below  
http://www.intersil.com/pbfree/Pb-FreeReflow.asp  
*Pb-free PDIPs can be used for through hole wave solder  
processing only. They are not intended for use in Reflow solder  
processing applications.  
X28HC64 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-10°C to +85°C  
X28HC64I. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +135°C  
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C  
Voltage on any Pin with Respect to Vss . . . . . . . . . . . . . . -1V to +7V  
DC Output Current. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5mA  
Recommended Operating Conditions  
Commercial Temperature Range. . . . . . . . . . . . . . . . . 0°C to +70°C  
Industrial Temperature Range . . . . . . . . . . . . . . . . . .-40°C to +85°C  
Supply Voltage Range  
X28HC64 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5V ±10%  
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and  
result in failures not covered by warranty.  
DC Electrical Specifications Over recommended operating conditions, unless otherwise specified. Parameters with MIN and/or MAX  
limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by  
characterization and are not production tested.  
TYP  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN (Note 3)  
MAX  
UNIT  
VCC Current (active) (TTL Inputs)  
ICC  
CE = OE = VIL, WE = VIH, All I/O’s = open, address  
inputs = TTL levels @ f = 10 MHz  
15  
40  
mA  
V
V
CC Current (Standby) (TTL Inputs)  
CC Current (Standby) (CMOS Inputs)  
ISB1  
ISB2  
CE = VIH, OE = VIL All I/O’s = open, other inputs = VIH  
1
2
mA  
µA  
CE = VCC - 0.3V, OE = GND, All I/O’s = open, other  
inputs = VCC - 0.3V  
100  
200  
Input Leakage Current  
Output Leakage Current  
Input LOW Voltage (Note 4)  
Input HIGH Voltage (Note 4)  
Output LOW Voltage  
Output HIGH Voltage  
NOTES:  
ILI  
ILO  
VIN = VSS to VCC  
±10  
±10  
µA  
µA  
V
VOUT = VSS to VCC, CE = VIH  
VlL  
-1  
2
0.8  
VIH  
VOL  
VOH  
VCC + 1  
0.4  
V
IOL = 5mA  
V
IOH = -5mA  
2.4  
V
3. Typical values are for TA = +25°C and nominal supply voltage  
4. VIL min. and VIH max. are for reference only and are not tested.  
Endurance and Data Retention  
Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified.  
Temperature limits established by characterization and are not production tested.  
PARAMETER  
Minimum Endurance  
Data Retention  
MIN  
100,000  
100  
MAX  
UNIT  
Cycles  
Years  
FN8109.2  
August 28, 2009  
9
X28HC64  
Power-up Timing  
Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits  
established by characterization and are not production tested.  
TYP  
PARAMETER  
SYMBOL  
tPUR  
(Note 3)  
UNIT  
µs  
Power-up to Read Operation (Note 5)  
Power-up to Write Operation (Note 5)  
100  
5
tPUW  
ms  
Capacitance  
TA = +25°C, f = 1MHz, VCC = 5V  
PARAMETER  
SYMBOL  
CI/O  
TEST CONDITIONS  
MAX  
10  
UNIT  
Input/output Capacitance (Note 5)  
Input Capacitance (Note 5)  
NOTE:  
VI/O = 0V  
VIN = 0V  
pF  
pF  
CIN  
6
5. This parameter is periodically sampled and not 100% tested.  
Symbol Table  
TABLE 2. AC CONDITIONS OF TEST  
Input Pulse Levels  
0V to 3V  
5ns  
WAVEFORM  
INPUTS  
OUTPUTS  
Input Rise and Fall Times  
Input and Output Timing Levels  
Must be  
steady  
Will be  
steady  
1.5V  
Ma y change  
from LO W  
to HIGH  
Will change  
from LO W  
to HIGH  
TABLE 3. MODE SELECTION  
Ma y change  
from HIGH  
to LO W  
Will change  
from HIGH  
to LO W  
CE  
L
OE  
L
WE  
H
MODE  
Read  
Write  
I/O  
POWER  
Active  
DOUT  
DIN  
Don’t Care:  
Changes  
Allowed  
Changing:  
State Not  
Known  
L
H
L
Active  
H
X
X
Standby and write  
inhibit  
High Z  
Standby  
N/A  
Center Line  
is High  
Impedance  
X
X
L
X
H
Write inhibit  
Write inhibit  
X
Equivalent AC Load Circuits  
5V  
1.92kΩ  
OUTPUT  
1.37kΩ  
30pF  
FN8109.2  
August 28, 2009  
10  
X28HC64  
AC Electrical Specifications  
Read Cycle Limits Over the recommended operating conditions unless otherwise specified. Parameters with MIN and/or MAX limits are  
100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization and are not  
production tested.  
X28HC64-70  
X28HC64-90  
X28HC64-12  
-55°C TO +125°C  
-55°C TO +125°C  
-55°C TO +125°C  
PARAMETER  
Read Cycle Time  
SYMBOL  
tRC  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
UNIT  
ns  
70  
90  
120  
Chip Enable Access Time  
Address Access Time  
tCE  
70  
70  
35  
90  
90  
40  
120  
120  
50  
ns  
tAA  
ns  
Output Enable Access Time  
CE LOW to Active Output (Note 6)  
OE LOW to Active Output (Note 6)  
CE HIGH to High Z Output (Note 6)  
OE HIGH to High Z Output (Note 6)  
Output Hold from Address Change  
NOTE:  
tOE  
ns  
tLZ  
0
0
0
0
0
0
ns  
tOLZ  
tHZ  
tOHZ  
tOH  
ns  
30  
30  
30  
30  
30  
30  
ns  
ns  
0
0
0
ns  
6. tLZ min., tHZ, tOLZ min., and tOHZ are periodically sampled and not 100% tested. tHZ max. and tOHZ max. are measured from the point when CE  
or OE return HIGH (whichever occurs first) to the time when the outputs are no longer driven.  
Read Cycle  
t
RC  
ADDRESS  
t
CE  
CE  
t
OE  
OE  
V
IH  
WE  
t
t
OHZ  
OLZ  
t
t
t
t
HZ  
LZ  
OH  
AA  
HIGH Z  
DATA I/O  
DATA VALID  
DATA VALID  
FN8109.2  
August 28, 2009  
11  
X28HC64  
Write Cycle Limits Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits  
established by characterization and are not production tested.  
TYP  
PARAMETER  
Write Cycle Time (Note 7)  
SYMBOL  
tWC  
MIN  
(Note 3)  
MAX  
UNIT  
ms  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
ns  
ns  
µs  
µs  
2
5
Address Setup Time  
Address Hold Time  
Write Setup Time  
Write Hold Time  
tAS  
0
50  
0
tAH  
tCS  
tCH  
0
CE Pulse Width  
tCW  
50  
0
OE High Setup Time  
OE High Hold Time  
WE Pulse Width  
WE HIGH Recovery (Note 8)  
Data Valid (Note 8)  
Data Setup  
tOES  
tOEH  
tWP  
0
50  
50  
tWPH  
tDV  
1
tDS  
50  
0
Data Hold  
tDH  
Delay to Next Write (Note 8)  
Byte Load Cycle  
NOTES:  
tDW  
10  
tBLC  
0.15  
100  
7. tWC is the minimum cycle time to be allowed from the system perspective unless polling techniques are used. It is the maximum time the device  
requires to automatically complete the internal write operation.  
8. tWPH and tDW are periodically sampled and not 100% tested.  
WE Controlled Write Cycle  
t
WC  
ADDRESS  
t
t
AH  
AS  
t
t
CS  
CH  
CE  
OE  
t
t
OEH  
OES  
t
WP  
WE  
t
DV  
DATA IN  
DATA OUT  
DATA VALID  
HIGH Z  
t
t
DH  
DS  
FN8109.2  
August 28, 2009  
12  
X28HC64  
CE Controlled Write Cycle  
t
WC  
ADDRESS  
t
t
AS  
AH  
t
CW  
CE  
OE  
t
OES  
t
OEH  
t
t
t
CS  
CH  
WE  
t
DV  
DATA VALID  
DATA IN  
t
DS  
DH  
HIGH Z  
DATA OUT  
Page Write Cycle  
OE  
(NOTE 9)  
CE  
t
t
BLC  
WP  
WE  
t
WPH  
Address  
(NOTE 10)  
Last Byte  
Byte n+2  
I/O  
Byte 0  
Byte 1  
Byte 2  
Byte n  
Byte n+1  
t
WC  
*For each successive write within the page write operation, A –A should be the same or  
6
12  
writes to an unknown address could occur.  
NOTES:  
9. Between successive byte writes within a page write operation, OE can be strobed LOW: e.g. this can be done with CE and WE HIGH to fetch  
data from another memory device within the system for the next write; or with WE HIGH and CE LOW effectively performing a polling operation.  
10. The timings shown above are unique to page write operations. Individual byte load operations within the page write must conform to either the  
CE or WE controlled write cycle timing.  
FN8109.2  
August 28, 2009  
13  
X28HC64  
DATA Polling Timing Diagram (Note 11)  
ADDRESS  
CE  
A
A
A
n
n
n
WE  
t
t
OEH  
OES  
OE  
t
DW  
D
= X  
D
= X  
OUT  
I/O  
7
D
= X  
IN  
OUT  
t
WC  
Toggle Bit Timing Diagram (Note 11)  
CE  
WE  
t
OES  
t
OEH  
OE  
t
DW  
HIGH Z  
I/O*  
*
6
*
t
WC  
* I/O beginning and ending state will vary, depending upon actual t  
.
WC  
6
NOTE:  
11. Polling operations are by definition read cycles and are therefore subject to read cycle timings.  
FN8109.2  
August 28, 2009  
14  
X28HC64  
Plastic Leaded Chip Carrier Packages (PLCC)  
0.042 (1.07)  
0.056 (1.42)  
N32.45x55 (JEDEC MS-016AE ISSUE A)  
PIN (1)  
IDENTIFIER  
0.004 (0.10)  
C
32 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE  
0.042 (1.07)  
0.048 (1.22)  
0.050 (1.27) TP  
ND  
0.025 (0.64)  
0.045 (1.14)  
INCHES  
MILLIMETERS  
R
C
L
SYMBOL  
MIN  
MAX  
MIN  
3.18  
MAX  
3.55  
NOTES  
A
A1  
D
0.125  
0.060  
0.485  
0.447  
0.188  
0.585  
0.547  
0.238  
0.140  
0.095  
0.495  
0.453  
0.223  
0.595  
0.553  
0.273  
-
1.53  
2.41  
-
D2/E2  
D2/E2  
12.32  
11.36  
4.78  
12.57  
11.50  
5.66  
-
D1  
D2  
E
3
C
L
E1  
E
4, 5  
14.86  
13.90  
6.05  
15.11  
14.04  
6.93  
-
NE  
E1  
E2  
N
3
VIEW “A”  
4, 5  
28  
7
28  
7
6
0.015 (0.38)  
MIN  
ND  
NE  
7
7
A1  
A
D1  
D
9
9
SEATING  
PLANE  
Rev. 0 7/98  
0.020 (0.51) MAX  
3 PLCS  
-C-  
NOTES:  
0.026 (0.66)  
0.032 (0.81)  
1. Controlling dimension: INCH. Converted millimeter dimen-  
sions are not necessarily exact.  
0.050 (1.27)  
MIN  
2. Dimensions and tolerancing per ANSI Y14.5M-1982.  
3. Dimensions D1 and E1 do not include mold protrusions. Al-  
lowable mold protrusion is 0.010 inch (0.25mm) per side.  
Dimensions D1 and E1 include mold mismatch and are mea-  
sured at the extreme material condition at the body parting  
line.  
0.013 (0.33)  
0.021 (0.53)  
0.025 (0.64)  
MIN  
(0.12)  
0.005  
M
A S - B S D S  
-C-  
4. To be measured at seating plane  
contact point.  
5. Centerline to be determined where center leads exit plastic  
body.  
VIEW “A” TYP.  
6. “N” is the number of terminal positions.  
7. ND denotes the number of leads on the two shorts sides of the  
package, one of which contains pin #1. NE denotes the num-  
ber of leads on the two long sides of the package.  
FN8109.2  
August 28, 2009  
15  
X28HC64  
Small Outline Plastic Packages (SOIC)  
M28.3 (JEDEC MS-013-AE ISSUE C)  
N
28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE  
INDEX  
0.25(0.010)  
M
B M  
H
AREA  
INCHES  
MILLIMETERS  
E
SYMBOL  
MIN  
MAX  
MIN  
2.35  
0.10  
0.33  
0.23  
MAX  
2.65  
0.30  
0.51  
0.32  
18.10  
7.60  
NOTES  
-B-  
A
A1  
B
C
D
E
e
0.0926  
0.0040  
0.013  
0.1043  
0.0118  
0.0200  
0.0125  
-
-
1
2
3
L
9
SEATING PLANE  
A
0.0091  
0.6969  
0.2914  
-
0.7125 17.70  
3
-A-  
o
h x 45  
D
0.2992  
7.40  
4
0.05 BSC  
1.27 BSC  
-
-C-  
α
H
h
0.394  
0.01  
0.419  
0.029  
0.050  
10.00  
0.25  
0.40  
10.65  
0.75  
1.27  
-
e
A1  
C
5
B
0.10(0.004)  
L
0.016  
6
0.25(0.010) M  
C
A M B S  
N
α
28  
28  
7
0o  
8o  
0o  
8o  
-
NOTES:  
Rev. 0 12/93  
1. Symbols are defined in the “MO Series Symbol List” in Section 2.2  
of Publication Number 95.  
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
3. Dimension “D” does not include mold flash, protrusions or gate  
burrs. Mold flash, protrusion and gate burrs shall not exceed  
0.15mm (0.006 inch) per side.  
4. Dimension “E” does not include interlead flash or protrusions. In-  
terlead flash and protrusions shall not exceed 0.25mm (0.010  
inch) per side.  
5. The chamfer on the body is optional. If it is not present, a visual  
index feature must be located within the crosshatched area.  
6. “L” is the length of terminal for soldering to a substrate.  
7. “N” is the number of terminal positions.  
8. Terminal numbers are shown for reference only.  
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater  
above the seating plane, shall not exceed a maximum value of  
0.61mm (0.024 inch)  
10. Controlling dimension: MILLIMETER. Converted inch dimen-  
sions are not necessarily exact.  
FN8109.2  
August 28, 2009  
16  
X28HC64  
Dual-In-Line Plastic Packages (PDIP)  
E28.6 (JEDEC MS-011-AB ISSUE B)  
N
28 LEAD DUAL-IN-LINE PLASTIC PACKAGE  
E1  
INCHES  
MILLIMETERS  
INDEX  
1
2
3
N/2  
AREA  
SYMBOL  
MIN  
MAX  
0.250  
-
MIN  
-
MAX  
6.35  
-
NOTES  
-B-  
-C-  
A
A1  
A2  
B
-
4
-A-  
0.015  
0.125  
0.014  
0.030  
0.008  
1.380  
0.005  
0.600  
0.485  
0.39  
3.18  
0.356  
0.77  
0.204  
4
D
E
0.195  
0.022  
0.070  
0.015  
1.565  
-
4.95  
0.558  
1.77  
0.381  
39.7  
-
-
BASE  
PLANE  
A2  
A
-
SEATING  
PLANE  
B1  
C
8
L
C
L
-
D1  
B1  
eA  
A1  
A
D1  
e
D
35.1  
5
eC  
C
B
D1  
E
0.13  
15.24  
12.32  
5
eB  
0.010 (0.25) M  
C
B S  
0.625  
0.580  
15.87  
14.73  
6
NOTES:  
E1  
e
5
1. Controlling Dimensions: INCH. In case of conflict between English and  
Metric dimensions, the inch dimensions control.  
0.100 BSC  
0.600 BSC  
2.54 BSC  
15.24 BSC  
-
eA  
eB  
L
6
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.  
-
0.700  
0.200  
-
17.78  
5.08  
7
3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of  
Publication No. 95.  
0.115  
2.93  
4
9
4. Dimensions A, A1 and L are measured with the package seated in  
N
28  
28  
JEDEC seating plane gauge GS-3.  
Rev. 1 12/00  
5. D, D1, and E1 dimensions do not include mold flash or protrusions.  
Mold flash or protrusions shall not exceed 0.010 inch (0.25mm).  
eA  
6. E and  
ular to datum  
7. eB and eC are measured at the lead tips with the leads unconstrained.  
C must be zero or greater.  
are measured with the leads constrained to be perpendic-  
-C-  
.
e
8. B1 maximum dimensions do not include dambar protrusions. Dambar  
protrusions shall not exceed 0.010 inch (0.25mm).  
9. N is the maximum number of terminal positions.  
10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3,  
E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm).  
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.  
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN8109.2  
August 28, 2009  
17  

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