IC62C1024L-70W [ISSI]
Standard SRAM, 128KX8, 70ns, CMOS, PDIP32, 0.600 INCH, DIP-32;
| 型号： | IC62C1024L-70W |
| 厂家： | 
INTEGRATED SILICON SOLUTION, INC |
| 描述： | Standard SRAM, 128KX8, 70ns, CMOS, PDIP32, 0.600 INCH, DIP-32 静态存储器 光电二极管 内存集成电路 |
| 文件： | 总8页 (文件大小：122K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
IC62C1024L
128K x 8 LOW POWER CMOS STATIC RAM
ꢀEATURES
DESCRIPTION
The ICSI IC62C1024L is a low power,131,072-word by 8-bit
CMOS static RAM. It is fabricated using ICSI's high-
performance CMOS technology. This highly reliable process
coupled with innovative circuit design techniques, yields higher
performance and low power consumption devices.
High-speed access time: 35, 45, 55, 70 ns
Low active power: 450 mW (typical)
Low standby power: 150 µW (typical) CMOS
standby
Output Enable (OE) and two Chip Enable
(CE1 and CE2) inputs for ease in applications
When CE1 is HIGH or CE2 is LOW (deselected), the device
assumes a standby mode at which the power dissipation can
be reduced by using CMOS input levels.
ꢀully static operation: no clock or refresh
required
Easy memory expansion is provided by using two Chip Enable
inputs, CE1 and CE2. The active LOW Write Enable (WE)
controls both writing and reading of the memory.
TTL compatible inputs and outputs
Single 5V (±10%) power supply
The IC62C1024L is available in 32-pin 600mil DIP, 450mil SOP
and 8*20mm TSOP-1 packages.
ꢀUNCTIONAL BLOCK DIAGRAM
512 x 2048
MEMORY ARRAY
A0-A16
DECODER
VCC
GND
I/O
DATA
COLUMN I/O
I/O0-I/O7
CIRCUIT
CE1
CE2
CONTROL
CIRCUIT
OE
WE
ICSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors
which may appear in this publication. © Copyright 2000, Integrated Circuit Solution Inc.
Integrated Circuit Solution Inc.
ALSR006-0A
1
IC62C1024L
PIN CONꢀIGURATION
32-Pin SOP and DIP
PIN CONꢀIGURATION
32-Pin 8x20mm TSOP-1
NC
A16
A14
A12
A7
1
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
VCC
A15
CE2
WE
A13
A8
A11
A9
A8
1
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
OE
2
2
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
3
3
4
A13
WE
CE2
A15
VCC
NC
A16
A14
A12
A7
4
5
5
A6
6
6
A5
7
A9
7
A4
8
A11
OE
8
A3
9
9
A2
10
11
12
13
14
15
16
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
10
11
12
13
14
15
16
A1
A0
I/O0
I/O1
I/O2
GND
A6
A5
A4
A1
A2
A3
PIN DESCRIPTIONS
A0-A16
CE1
Address Inputs
Chip Enable 1 Input
Chip Enable 2 Input
Output Enable Input
Write Enable Input
Input/Output
CE2
OE
WE
I/O0-I/O7
Vcc
Power
GND
Ground
OPERATING RANGE
Range
Ambient Temperature
VCC
Commercial
0°C to +70°C
5V ± 10%
5V ± 10%
Industrial
40°C to +85°C
TRUTH TABLE
Mode
WE CE1 CE2 OE
I/O Operation
Vcc Current
Not Selected
(Power-down)
X
X
H
X
X
L
X
X
High-Z
High-Z
ISB1, ISB2
ISB1, ISB2
Output Disabled
Read
H
H
L
L
L
L
H
H
H
H
L
High-Z
DOUT
DIN
ICC
ICC
ICC
Write
X
2
Integrated Circuit Solution Inc.
ALSR006-0A
IC62C1024L
ABSOLUTE MAXIMUM RATINGS(1)
Symbol Parameter
Value
0.5 to +7.0
45 to +85
65 to +150
1.5
Unit
V
VTERM
TBIAS
TSTG
PT
Terminal Voltage with Respect to GND
Temperature Under Bias
Storage Temperature
°C
°C
W
Power Dissipation
IOUT
DC Output Current (LOW)
20
mA
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
CAPACITANCE(1,2)
Symbol
CIN
Parameter
ConditionsMax.
VIN = 0V
Unit
6
Input Capacitance
Output Capacitance
pF
pF
COUT
VOUT = 0V
8
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: TA = 25°C, f = 1 MHz, Vcc = 5.0V.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol Parameter
Test Conditions
Min.
Max.
Unit
VOH
VOL
VIH
VIL
ILI
Output HIGH Voltage
VCC = Min., IOH = 1.0 mA
VCC = Min., IOL = 2.1 mA
2.4
0.4
V
V
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage(1)
Input Leakage
2.2
0.3
VCC + 0.5
0.8
V
V
GND ≤ VIN ≤ VCC
Com.
Ind.
2
10
2
10
µA
ILO
Output Leakage
GND ≤ VOUT ≤ VCC
Com.
Ind.
2
10
2
10
µA
Notes:
1. VIL = 3.0V for pulse width less than 10 ns.
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
-35
ns-45
Min. Max.
ns-55
Min. Max.
ns-70
ns
Symbol Parameter
Test Conditions
CC = Max., CE = VIL
OUT = 0 mA, f = fMAX
Min. Max.
Min. Max.
Unit
ICC
Vcc Dynamic Operating
Supply Current
V
Com.
Ind.
100
110
90
80
90
70
80
mA
I
100
I
SB
1
2
TTL Standby Current
(TTL Inputs)
V
CC = Max.,
Com.
Ind.
10
15
10
15
10
15
10
15
mA
µA
VIN = VIH or VIL, CE1
≥
VIH,
or CE2
≤ VIL, f = 0
ISB
CMOS Standby
VCC = Max.,
Com.
Ind.
500
750
500
750
500
750
500
750
Current (CMOS Inputs)
CE1
≤
≤
≤
VCC 0.2V,
CE2
0.2V, VIN > VCC 0.2V,
0.2V, f = 0
or VIN
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
Integrated Circuit Solution Inc.
ALSR006-0A
3
IC62C1024L
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
-35
-45
Min.
-55
-70
Symbol Parameter
Min.
35
3
Max.
Max.
Min.
55
3
Max.
Min.
70
3
Max.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
t
t
t
t
t
t
t
t
t
t
t
RC
Read Cycle Time
Address Access Time
Output Hold Time
CE1 Access Time
CE2 Access Time
OE Access Time
45
3
AA
35
45
55
70
OHA
ACE
1
0
35
35
10
0
45
45
20
0
55
55
25
0
70
70
35
ACE
2
DOE
(2)
(2)
LZOE
OE to Low-Z Output
OE to High-Z Output
HZOE
0
10
0
15
0
20
0
25
LZCE1(2) CE1 to Low-Z Output
3
5
7
10
10
0
LZCE2(2) CE2 to Low-Z Output
3
5
7
(2)
HZCE
CE1 or CE2 to High-Z Output
0
10
0
15
0
20
25
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in 6igure 1a.
2. Tested with the load in 6igure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
AC TEST CONDITIONS
Parameter
Unit
0V to 3.0V
5 ns
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Level
1.5V
Output Load
See Figures 1a and 1b
AC TEST LOADS
480 Ω
480 Ω
5V
5V
OUTPUT
OUTPUT
255 Ω
255 Ω
100 pF
Including
jig and
5 pF
Including
jig and
scope
scope
)igure 1a.
)igure 1b.
4
Integrated Circuit Solution Inc.
ALSR006-0A
IC62C1024L
AC WAVEꢀORMS
READ CYCLE NO. 1(1,2)
t
RC
ADDRESS
DOUT
t
AA
t
OHA
t
OHA
DATA VALID
READ CYCLE NO. 2(1,3)
t
RC
ADDRESS
OE
t
AA
t
OHA
t
HZOE
t
DOE
t
LZOE
CE1
t
ACE1/tACE2
CE2
tLZCE1/
tLZCE2
t
HZCE
HIGH-Z
DOUT
DATA VALID
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE1 = VIL, CE2 = VIH.
3. Address is valid prior to or coincident with CE1 LOW and CE2 HIGH transitions.
Integrated Circuit Solution Inc.
ALSR006-0A
5
IC62C1024L
WRITE CYCLE SWITCHING CHARACTERISTICS(1,3) (Over Operating Range, Standard and Low
Power)
-35
-45
-55
-70
Symbol Parameter
Min.
35
25
25
25
0
Max.
Min.
45
35
35
35
0
Max.
Min.
55
50
50
45
0
Max.
Min.
70
60
60
60
0
Max.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
t
t
t
t
t
t
t
t
t
t
t
WC
SCE
SCE
AW
HA
Write Cycle Time
1
2
CE1 to Write End
CE2 to Write End
Address Setup Time to Write End
Address Hold from Write End
Address Setup Time
SA
0
0
0
0
(4)
PWE
WE Pulse Width
25
20
0
35
25
0
40
25
0
50
30
0
SD
Data Setup to Write End
Data Hold from Write End
WE LOW to High-Z Output
WE HIGH to Low-Z Output
HD
(2)
HZWE
3
10
5
15
5
20
5
25
(2)
LZWE
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in 6igure 1a.
2. Tested with the load in 6igure 1b. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE1 LOW, CE2 HIGH and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the Write.
4. Tested with OE HIGH.
AC WAVEꢀORMS
WRITE CYCLE NO. 1 (WE Controlled)(1,2)
t
WC
ADDRESS
CE1
t
HA
t
SCE1
t
SCE2
CE2
t
AW
(4)
PWE
t
WE
DOUT
DIN
t
SA
t
HZWE
t
LZWE
HIGH-Z
DATA UNDEFINED
t
SD
t
HD
DATA-IN VALID
6
Integrated Circuit Solution Inc.
ALSR006-0A
IC62C1024L
WRITE CYCLE NO. 2 (CE1, CE2 Controlled)(1,2)
t
WC
ADDRESS
t
SA
tHA
t
SCE1
CE1
CE2
t
SCE2
t
AW
(4)
t
PWE
WE
DOUT
DIN
t
HZWE
tLZWE
HIGH-Z
DATA UNDEFINED
t
HD
t
SD
DATA-IN VALID
Notes:
1. The internal write time is defined by the overlap of CE1 LOW, CE2 HIGH and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the Write.
2. I/O will assume the High-Z state if OE = VIH.
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol
Parameter
Test Condition
Min.
Max.
Unit
V
VDR
Vcc for Data Retention
Data Retention Current
See Data Retention Waveform
Vcc = 3.0V, CE1 > Vcc 0.2V
2.0
5.5
IDR
Com.
Ind.
250
400
µA
t
t
SDR
RDR
Data Retention Setup Time
Recovery Time
See Data Retention Waveform
See Data Retention Waveform
0
ns
ns
t
RC
DATA RETENTION WAVEꢀORM (CE1 Controlled)
t
Data Retention Mode
t
RDR
SDR
V
V
CC
DR
5.0V
3.0V
CE1 ≥ V
- 0.2V
CC
CE1
GND
Integrated Circuit Solution Inc.
ALSR006-0A
7
IC62C1024L
DATA RETENTION WAVEꢀORM (CE2 Controlled)
Data Retention Mode
V
CC
5.0V
3.0V
t
t
RDR
SDR
CE2
V
DR
CE2 ≤ 0.2V
0.4V
GND
ORDERING INꢀORMATION
Commercial Range: 0°C to +70°C
ORDERING INꢀORMATION
Industrial Range: 40°C to +85°C
Speed (nsꢀ Order Part No.
Package
Speed (nsꢀ Order Part No.
Package
35
35
35
IC62C1024L-35W 600mil DIP
IC62C1024L-35Q 450mil SOP
35
35
35
IC62C1024L-35WI 600mil DIP
IC62C1024L-35QI 450mil SOP
IC62C1024L-35TI 8*20mm TSOP-1
IC62C1024L-35T
8*20mm TSOP-1
45
45
45
IC62C1024L-45W 600mil DIP
IC62C1024L-45Q 450mil SOP
45
45
45
IC62C1024L-45WI 600mil DIP
IC62C1024L-45QI 450mil SOP
IC62C1024L-45TI 8*20mm TSOP-1
IC62C1024L-45T
8*20mm TSOP-1
55
55
55
IC62C1024L-55W 600mil DIP
IC62C1024L-55Q 450mil SOP
55
55
55
IC62C1024L-55WI 600mil DIP
IC62C1024L-55QI 450mil SOP
IC62C1024L-55TI 8*20mm TSOP-1
IC62C1024L-55T
8*20mm TSOP-1
70
70
70
IC62C1024L-70W 600mil DIP
IC62C1024L-70Q 450mil SOP
70
70
70
IC62C1024L-70WI 600mil DIP
IC62C1024L-70QI 450mil SOP
IC62C1024L-70TI 8*20mm TSOP-1
IC62C1024L-70T
8*20mm TSOP-1
Integrated Circuit Solution Inc.
HEADQUARTER:
NO.2, TECHNOLOGY RD. V, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU, TAIWAN, R.O.C.
TEL: 886-3-5780333
"ax: 886-3-5783000
BRANCH O""ICE:
7", NO. 106, SEC. 1, HSIN-TAI 5TH ROAD,
HSICHIH TAIPEI COUNTY, TAIWAN, R.O.C.
TEL: 886-2-26962140
"AX: 886-2-26962252
http://www.icsi.com.tw
8
Integrated Circuit Solution Inc.
ALSR006-0A
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