IS45S16800F-6BLA1 [ISSI]
IC DRAM 128M PARALLEL 54TFBGA;型号: | IS45S16800F-6BLA1 |
厂家: | INTEGRATED SILICON SOLUTION, INC |
描述: | IC DRAM 128M PARALLEL 54TFBGA 动态存储器 |
文件: | 总62页 (文件大小:824K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IS42/45S81600F
IS42/45S16800F
16Mx8, 8Mx16
SEPTEMBER 2019
128Mb SYNCHRONOUS DRAM
OVERVIEW
FEATURES
ISSI's 128Mb Synchronous DRAM achieves high-speed
data transfer using pipeline architecture. All inputs and
outputs signals refer to the rising edge of the clock input.
The 128Mb SDRAM is organized as follows.
• Clock frequency: 200, 166, 143 MHz
• Fully synchronous; all signals referenced to a
positive clock edge
• Internal bank for hiding row access/precharge
• Power supply
Vdd Vddq
IS42/45S81600F IS42/45S16800F
IS42/45S81600F
IS42/45S16800F
• LVTTL interface
3.3V 3.3V
4M x8 x4 Banks
54-pin TSOPII
2M x16 x4 Banks
54-pin TSOPII
54-ball BGA
3.3V 3.3V
• Programmable burst length
– (1, 2, 4, 8, full page)
• Programmable burst sequence:
Sequential/Interleave
KEY TIMING PARAMETERS
• Auto Refresh (CBR)
• Self Refresh
Parameter
-5
-6
-7
Unit
Clk Cycle Time
CAS Latency = 3
CAS Latency = 2
• 4096 refresh cycles every 16 ms (A2 grade) or
64 ms (Commercial, Industrial, A1 grade)
5
10
6
10
7
7.5
ns
ns
Clk Frequency
CAS Latency = 3
CAS Latency = 2
• Random column address every clock cycle
200
100
166
100
143
133
Mhz
Mhz
• Programmable CAS latency (2, 3 clocks)
• Burst read/write and burst read/single write
operations capability
Access Time from Clock
CAS Latency = 3
CAS Latency = 2
5
6.5
5.4
6.5
5.4
5.4
ns
ns
• Burst termination by burst stop and precharge
command
• Temperature Ranges:
Commercial (0oC to +70oC)
Industrial (-40oC to +85oC)
Automotive, A1 (-40oC to +85oC)
Automotive, A2 (-40oC to +105oC)
Copyright © 2019 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time with-
out notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain
the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be
expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications unless Integrated
Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
1
09/11/2019
IS42/45S81600F, IS42/45S16800F
DEVICE OVERVIEW
Aself-timed row precharge initiated at the end of the burst
sequence is available with theAUTO PRECHARGE func-
tion enabled. Precharge one bank while accessing one of
the other three banks will hide the precharge cycles and
provide seamless, high-speed, random-access operation.
The 128Mb SDRAM is a high speed CMOS, dynamic
random-access memory designed to operate in 3.3V Vdd
and 3.3V Vddq memory systems containing 134,217,728
bits. Internally configureꢀ as a ꢁuaꢀ-bank DRAM with
a synchronous interface. Each 33,554,432-bit bank is
organized as 4,096 rows by 512 columns by 16 bits or
4,096 rows by 1,024 columns by 8 bits.
SDRAMreadandwriteaccessesareburstorientedstarting
at a selected location and continuing for a programmed
number of locations in a programmed sequence. The
registration of an ACTIVE command begins accesses,
followed by a READ or WRITE command. The ACTIVE
command in conjunction with address bits registered are
used to select the bank and row to be accessed (BA0,
BA1 select the bank; A0-A11 select the row). The READ
or WRITE commands in conjunction with address bits
registered are used to select the starting column location
for the burst access.
The128MbSDRAMincludesanAUTOREFRESHMODE,
and a power-saving, power-down mode. All signals are
registered on the positive edge of the clock signal, CLK.
All inputs and outputs are LVTTL compatible.
The 128Mb SDRAM has the ability to synchronously burst
data at a high data rate with automatic column-address
generation,theabilitytointerleavebetweeninternalbanks
to hide precharge time and the capability to randomly
change column addresses on each clock cycle during
burst access.
Programmable READ or WRITE burst lengths consist of
1, 2, 4 and 8 locations or full page, with a burst terminate
option.
FUNCTIONAL BLOCK DIAGRAM (FOR 2MX16X4 BANKS ONLY)
CLK
CKE
CS
RAS
CAS
WE
DQML
DQMH
DATA IN
BUFFER
COMMAND
DECODER
&
CLOCK
GENERATOR
16
16
REFRESH
CONTROLLER
MODE
REGISTER
2
DQ 0-15
12
V
DD/VDDQ
ss/Vss
SELF
DATA OUT
BUFFER
REFRESH
V
Q
A10
A11
A9
CONTROLLER
16
16
A8
A7
A6
REFRESH
COUNTER
A5
A4
4096
A3
A2
A1
A0
BA0
BA1
4096
MEMORY CELL
ARRAY
4096
4096
12
BANK 0
ROW
ADDRESS
LATCH
ROW
ADDRESS
BUFFER
12
12
SENSE AMP I/O GATE
512
(x 16)
COLUMN
ADDRESS LATCH
BANK CONTROL LOGIC
9
BURST COUNTER
COLUMN DECODER
COLUMN
ADDRESS BUFFER
9
2
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
PIN CONFIGURATIONS
54 pin TSOP - Type II for x8
V
DD
1
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
VSS
DQ0
2
DQ7
V
DD
Q
3
VSSQ
NC
DQ1
4
NC
DQ6
5
V
SS
Q
6
VDDQ
NC
DQ2
7
NC
DQ5
8
V
DD
Q
9
VSSQ
NC
DQ3
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
NC
DQ4
V
SS
Q
VDDQ
NC
NC
V
DD
NC
WE
VSS
NC
DQM
CLK
CKE
NC
A11
A9
CAS
RAS
CS
BA0
BA1
A10
A0
A8
A7
A1
A6
A2
A5
A3
A4
V
DD
V
SS
PIN DESCRIPTIONS
A0-A11
A0-A9
BA0, BA1
DQ0 to DQ7
CLK
Row Address Input
WE
Write Enable
Column Address Input
Bank Select Address
Data I/O
DQM
Vdd
Vss
Data Input/Output Mask
Power
Ground
System Clock Input
Clock Enable
Vddq
Vssq
NC
Power Supply for I/O Pin
Ground for I/O Pin
No Connection
CKE
CS
Chip Select
RAS
Row Address Strobe Command
Column Address Strobe Command
CAS
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
3
09/11/2019
IS42/45S81600F, IS42/45S16800F
PIN CONFIGURATIONS
54 pin TSOP - Type II for x16
V
DD
1
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
VSS
DQ0
2
DQ15
V
DD
Q
3
VSSQ
DQ1
DQ2
4
DQ14
DQ13
5
V
SS
Q
6
VDDQ
DQ3
DQ4
7
DQ12
DQ11
8
V
DD
Q
9
VSSQ
DQ5
DQ6
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
DQ10
DQ9
V
SS
Q
VDDQ
DQ7
DQ8
VDD
VSS
DQML
WE
CAS
RAS
CS
NC
DQMH
CLK
CKE
NC
BA0
BA1
A10
A0
A11
A9
A8
A7
A1
A6
A2
A5
A3
A4
V
DD
V
SS
PIN DESCRIPTIONS
A0-A11
A0-A8
BA0, BA1
DQ0 to DQ15
CLK
Row Address Input
WE
Write Enable
Column Address Input
Bank Select Address
Data I/O
DQML x16 Lower Byte, Input/Output Mask
DQMH x16 Upper Byte, Input/Output Mask
Vdd
Vss
Power
System Clock Input
Clock Enable
Ground
CKE
Vddq
Vssq
NC
Power Supply for I/O Pin
Ground for I/O Pin
No Connection
CS
Chip Select
RAS
Row Address Strobe Command
Column Address Strobe Command
CAS
4
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
PIN CONFIGURATION
54-ball BGA for x16 (Top View) (8.00 mm x 8.00 mm Body, 0.8 mm Ball Pitch)
PACKAGE CODE: 54B (8x8)
1 2 3 4 5 6 7 8 9
A
VSS DQ15 VSSQ
DQ14 DQ13 VDDQ
DQ12 DQ11 VSSQ
DQ10 DQ9 VDDQ
VDDQ DQ0 VDD
VSSQ DQ2 DQ1
VDDQ DQ4 DQ3
VSSQ DQ6 DQ5
VDD DQML DQ7
CAS RAS WE
BA0 BA1 CS
B
C
D
E
F
DQ8 NC
VSS
DQMH CLK CKE
G
H
J
NC
A8
A11
A7
A9
A6
A4
A0
A3
A1
A10
VSS
A5
A2 VDD
PIN DESCRIPTIONS
A0-A11
A0-A8
BA0, BA1
DQ0 to DQ15
CLK
Row Address Input
WE
Write Enable
Column Address Input
Bank Select Address
Data I/O
DQML x16 Lower Byte Input/Output Mask
DQMH x16 Upper Byte Input/Output Mask
Vdd
Vss
Power
System Clock Input
Clock Enable
Ground
CKE
Vddq
Vssq
NC
Power Supply for I/O Pin
Ground for I/O Pin
No Connection
CS
Chip Select
RAS
Row Address Strobe Command
Column Address Strobe Command
CAS
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
5
09/11/2019
IS42/45S81600F, IS42/45S16800F
PIN FUNCTIONS
Symbol
Type
Function (In Detail)
A0-A11
Input Pin
Address Inputs: A0-A11 are sampled during the ACTIVE
command (row-address A0-A11) and READ/WRITE command (column address A0-
A9 (x8), or A0-A8 (x16); with A10 ꢀefining auto precharge) to select one location out
of the memory array in the respective bank. A10 is sampled during a PRECHARGE
command to determine if all banks are to be precharged (A10 HIGH) or bank se-
lected by BA0, BA1 (LOW). The address inputs also provide the op-code during a
LOAD MODE REGISTER command.
BA0, BA1
CAS
Input Pin
Input Pin
Input Pin
Bank Select Aꢀꢀress: BA0 anꢀ BA1 ꢀefines which bank the ACTIVE, READ, WRITE
or PRECHARGE command is being applied.
CAS, in conjunction with the RAS and WE, forms the device command. See the
"Command Truth Table" for details on device commands.
CKE
The CKE input determines whether the CLK input is enabled. The next rising edge of
the CLK signal will be valid when is CKE HIGH and invalid when LOW. When CKE
is LOW, the device will be in either power-down mode, clock suspend mode, or self
refresh mode. CKE is an asynchronous input.
CLK
Input Pin
Input Pin
CLK is the master clock input for this device. Except for CKE, all inputs to this device
are acquired in synchronization with the rising edge of this pin.
CS
The CS input determines whether command input is enabled within the device.
Command input is enabled when CS is LOW, and disabled with CS is HIGH. The
device remains in the previous state when CS is HIGH.
DQML,
Input Pin
DQML anꢀ DQMH control the lower anꢀ upper bytes of the I/O buffers. In reaꢀ
DQMH
moꢀe,DQML anꢀ DQMH control the output buffer. WhenDQML orDQMH is LOW, the
corresponꢀing buffer byte is enableꢀ, anꢀ when HIGH, ꢀisableꢀ. The outputs go to
the HIGH impedance state whenDQML/DQMH is HIGH. This function corresponds
to OE in conventional DRAMs. In write mode,DQML and DQMH control the input
buffer. When DQML or DQMH is LOW, the corresponꢀing buffer byte is enableꢀ,
and data can be written to the device. When DQML or DQMH is HIGH, input data is
masked and cannot be written to the device. For IS42/45S16800F only.
DQM
Input Pin
For IS42/45S81600F only.
DQ0-DQ7 or
DQ0-DQ15
Input/Output
Data on the Data Bus is latcheꢀ on DQ pins ꢀuring Write commanꢀs, anꢀ buffereꢀ for
output after Read commands.
RAS
Input Pin
Input Pin
RAS, in conjunction with CAS and WE, forms the device command. See the "Com-
mand Truth Table" item for details on device commands.
WE
WE, in conjunction with RAS and CAS, forms the device command. See the "Com-
mand Truth Table" item for details on device commands.
Vddq
Vdd
Power Supply Pin
Power Supply Pin
Power Supply Pin
Power Supply Pin
Vddq is the output buffer power supply.
Vdd is the device internal power supply.
Vꢂꢂq is the output buffer grounꢀ.
Vꢂꢂq
Vꢂꢂ
Vꢂꢂ is the device internal ground.
6
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
GENERAL DESCRIPTION
READ
TheREADcommandselectsthebankfromBA0,BA1inputs
and starts a burst read access to an active row. InputsA0-
A9(x8);A0-A8(x16)providesthestartingcolumnlocation.
When A10 is HIGH, this command functions as an AUTO
PRECHARGE command. When the auto precharge is
selected, the row being accessed will be precharged at
the end of the READ burst. The row will remain open for
subsequent accesses when AUTO PRECHARGE is not
selected. DQ’s read data is subject to the logic level on
the DQM inputs two clocks earlier. When a given DQM
signal was registered HIGH, the corresponding DQ’s will
be High-Z two clocks later. DQ’s will provide valid data
when the DQM signal was registered LOW.
PRECHARGEfunctioninconjunctionwithaspecificREAD
orWRITEcommand. ForeachindividualREADorWRITE
command, auto precharge is either enabled or disabled.
AUTO PRECHARGE does not apply except in full-page
burst mode. Upon completion of the READ or WRITE
burst, a precharge of the bank/row that is addressed is
automatically performed.
AUTO REFRESH COMMAND
This command executes theAUTO REFRESH operation.
The row address and bank to be refreshed are automatically
generated during this operation. The stipulated period (tꢃꢄ)
is required for a single refresh operation, and no other
commands can be executed during this period. This com-
mandisexecutedatleast4096timesforeveryTꢃꢅꢆ.During
an AUTO REFRESH command, address bits are “Don’t
Care”. This command corresponds to CBR Auto-refresh.
WRITE
A burst write access to an active row is initiated with the
WRITE command. BA0, BA1 inputs selects the bank, and
the starting column location is provided by inputs A0-A9
(x8);A0-A8 (x16). Whether or notAUTO-PRECHARGE is
used is determined by A10.
BURST TERMINATE
The BURST TERMINATE command forcibly terminates
the burst read and write operations by truncating either
fixeꢀ-length or full-page bursts anꢀ the most recently
registered READ or WRITE command prior to the BURST
TERMINATE.
The row being accessed will be precharged at the end of
the WRITE burst, if AUTO PRECHARGE is selected. If
AUTO PRECHARGE is not selected, the row will remain
open for subsequent accesses.
A memory array is written with corresponding input data
on DQ’s and DQM input logic level appearing at the same
time. Data will be written to memory when DQM signal is
LOW. When DQM is HIGH, the corresponding data inputs
will be ignored, and a WRITE will not be executed to that
byte/column location.
COMMAND INHIBIT
COMMAND INHIBITprevents new commands from being
executeꢀ. Operations in progress are not affecteꢀ, apart
from whether the CLK signal is enabled
NO OPERATION
When CS is low, the NOP command prevents unwanted
commandsfrombeingregisteredduringidleorwaitstates.
PRECHARGE
The PRECHARGE command is used to deactivate the
open row in a particular bank or the open row in all banks.
BA0, BA1 can be used to select which bank is precharged
or they are treated as “Don’t Care”. A10 determined
whether one or all banks are precharged. After execut-
ing this command, the next command for the selected
bank(s) is executed after passage of the period tRP, which
is the period required for bank precharging. Once a bank
has been precharged, it is in the idle state and must be
activated prior to any READ or WRITE commands being
issued to that bank.
LOAD MODE REGISTER
During the LOAD MODE REGISTER command the mode
register is loaded from A0-A11. This command can only
be issued when all banks are idle.
ACTIVE COMMAND
When the ACTIVE COMMAND is activated, BA0, BA1
inputs selects a bank to be accessed, and the address
inputs on A0-A11 selects the row. Until a PRECHARGE
command is issued to the bank, the row remains open
for accesses.
AUTO PRECHARGE
The AUTO PRECHARGE function ensures that the pre-
charge is initiated at the earliest valid stage within a burst.
This function allows for individual-bank precharge without
requiring an explicit command. A10 to enable the AUTO
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
7
09/11/2019
IS42/45S81600F, IS42/45S16800F
COMMAND TRUTH TABLE
CKE
A11
Function
n – 1
H
n
×
×
×
×
×
×
×
×
×
×
H
L
×
CS
H
L
RAS
×
CAS
×
WE
×
BA1
×
BA0
×
A10 A9 - A0
Device deselect (DESL)
No operation (NOP)
Burst stop (BST)
Read
×
×
×
L
×
×
×
V
V
V
V
V
×
×
×
×
V
H
H
H
H
H
H
H
L
H
H
L
H
L
×
×
H
L
×
×
H
L
H
H
L
V
V
V
V
V
V
×
V
V
V
V
V
V
×
Read with auto precharge
Write
H
L
L
H
L
H
L
L
Write with auto precharge
Bank activate (ACT)
H
L
L
L
H
V
L
H
L
H
H
H
L
H
L
Precharge select bank (PRE) H
L
L
Precharge all banks (PALL)
CBR Auto-Refresh (REF)
Self-Refresh (SELF)
H
H
H
H
L
L
L
H
×
×
L
L
L
H
H
L
×
×
L
L
L
×
×
Mode register set (MRS)
L
L
L
L
L
Note: H=Vꢇꢈ, L=Vꢇꢉ x= Vꢇꢈ or Vꢇꢉ, V = Valid Data.
DQM TRUTH TABLE
CKE
DQM
Function
n-1
H
n
×
×
×
×
×
×
U
L
L
L
Data write / output enable
Data mask / output disable
H
H
L
H
×
L
Upper byte write enable / output enable
Lower byte write enable / output enable
Upper byte write inhibit / output disable
H
H
×
H
×
H
×
H
Lower byte write inhibit / output disable
H
Note: H=Vꢇꢈ, L=Vꢇꢉ x= Vꢇꢈ or Vꢇꢉ, V = Valid Data.
8
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
CKE TRUTH TABLE
CKE
Current State /Function
n – 1 n
CS
×
RAS
CAS WE
Address
Activating Clock suspend mode entry
Any Clock suspend mode
Clock suspend mode exit
Auto refresh command Idle (REF)
Self refresh entry Idle (SELF)
Power down entry Idle
H
L
L
L
H
H
L
L
×
×
×
L
L
×
×
×
×
×
H
H
×
×
×
×
×
×
×
×
×
×
L
L
×
L
×
H
H
H
L
L
×
Self refresh exit
L
L
H
H
L
H
H
×
H
×
H
×
×
×
Power down exit
L
H
×
×
×
×
×
Note: H=Vꢇꢈ, L=Vꢇꢉ x= Vꢇꢈ or Vꢇꢉ, V = Valid Data.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
9
09/11/2019
IS42/45S81600F, IS42/45S16800F
FUNCTIONAL TRUTH TABLE
Current State
CS
H
L
RAS CAS WE
Address
Command
DESL
Action
Idle
X
H
H
H
H
L
X
H
H
L
X
H
L
X
Nop or Power Down(2)
Nop or Power Down(2)
Nop or Power Down
ILLEGAL (3)
X
NOP
L
X
BST
L
H
L
BA, CA, A10
A, CA, A10
BA, RA
BA, A10
X
READ/READA
WRIT/ WRITA
ACT
L
L
ILLEGAL(3)
L
H
H
L
H
L
Row activating
Nop
Auto refresh or Self-refresh(4)
Mode register set
Nop
L
L
PRE/PALL
REF/SELF
MRS
L
L
H
L
L
L
L
OC, BA1=L
X
Row Active
H
L
X
H
H
H
H
L
X
H
H
L
X
H
L
DESL
X
NOP
Nop
L
X
BST
Nop
L
H
L
BA, CA, A10
BA, CA, A10
BA, RA
BA, A10
READ/READA
WRIT/ WRITA
ACT
Begin read (5)
Begin write (5)
ILLEGAL (3)
L
L
L
H
H
H
L
L
L
PRE/PALL
Precharge
Precharge all banks(6)
L
L
H
L
L
X
L
L
X
H
L
X
REF/SELF
MRS
ILLEGAL
ILLEGAL
OC, BA
X
Read
X
DESL
Continue burst to end to
Row active
L
H
H
H
X
NOP
Continue burst to end Row
Row active
L
L
H
H
H
L
L
X
BST
Burst stop, Row active
H
BA, CA, A10
READ/READA
Terminate burst,
begin new read (7)
L
H
L
L
BA, CA, A10
WRIT/WRITA
Terminate burst,
begin write (7,8)
L
L
L
L
H
H
H
L
BA, RA
ACT
ILLEGAL (3)
BA, A10
PRE/PALL
Terminate burst
Precharging
L
L
H
L
L
X
L
L
X
H
L
X
REF/SELF
MRS
ILLEGAL
ILLEGAL
OC, BA
X
Write
X
DESL
Continue burst to end
Write recovering
L
H
H
H
X
NOP
Continue burst to end
Write recovering
L
L
H
H
H
L
L
X
BST
Burst stop, Row active
H
BA, CA, A10
READ/READA
Terminate burst, start read :
Determine AP (7,8)
L
H
L
L
BA, CA, A10
WRIT/WRITA
Terminate burst, new write :
Determine AP (7)
L
L
L
L
L
L
L
L
H
H
L
H
L
BA, RA
BA, A10
X
RA ACT
PRE/PALL
REF/SELF
MRS
ILLEGAL (3)
Terminate burst Precharging (9)
H
L
ILLEGAL
L
OC, BA
ILLEGAL
Note: H=Vꢇꢈ, L=Vꢇꢉ x= Vꢇꢈ or Vꢇꢉ, V = Valid Data, BA= Bank Address, CA+Column Address, RA=Row Address, OC= Op-Code
10
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
FUNCTIONAL TRUTH TABLE Continued:
Current State
CS
RAS CAS
WE
Address
Command
Action
Read with auto
Precharging
H
×
×
×
×
DESL
Continue burst to end, Precharge
L
L
L
L
L
L
L
L
H
H
H
H
H
L
H
H
L
H
L
x
NOP
Continue burst to end, Precharge
ILLEGAL
ILLEGAL (11)
ILLEGAL (11)
ILLEGAL (3)
×
BST
H
L
BA, CA, A10
BA, CA, A10
BA, RA
BA, A10
×
READ/READA
WRIT/ WRITA
ACT
L
H
H
L
H
L
L
PRE/PALL
REF/SELF
MRS
ILLEGAL (11)
L
H
L
ILLEGAL
L
L
OC, BA
×
ILLEGAL
Write with Auto
Precharge
×
×
×
DESL
Continue burst to end, Write
recovering with auto precharge
L
H
H
H
×
NOP
Continue burst to end, Write
recovering with auto precharge
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
H
H
L
H
L
L
×
BST
ILLEGAL
ILLEGAL(11)
ILLEGAL (11)
ILLEGAL (3,11)
H
L
BA, CA, A10
READ/READA
WRIT/ WRITA
ACT
L
BA, CA, A10
H
H
L
H
L
BA, RA
L
BA, A10
PRE/PALL
REF/SELF
MRS
ILLEGAL (3,11)
L
H
L
×
ILLEGAL
L
L
OC, BA
ILLEGAL
Precharging
×
H
H
H
H
L
×
H
H
L
×
H
L
×
DESL
Nop, Enter idle after tRP
Nop, Enter idle after tRP
Nop, Enter idle after tRP
ILLEGAL (3)
ILLEGAL (3)
ILLEGAL(3)
×
NOP
×
BST
H
L
BA, CA, A10
BA, CA, A10
BA, RA
BA, A10
×
READ/READA
WRIT/WRITA
ACT
L
H
H
L
H
L
L
PRE/PALL
REF/SELF
MRS
Nop Enter idle after tRP
ILLEGAL
L
H
L
L
L
OC, BA
×
ILLEGAL
Row Activating
×
H
H
H
H
L
×
H
H
L
×
H
L
DESL
Nop, Enter bank active after tRCD
Nop, Enter bank active after tRCD
Nop, Enter bank active after tRCD
ILLEGAL (3)
ILLEGAL (3)
ILLEGAL (3,9)
×
NOP
×
BST
H
L
BA, CA, A10
BA, CA, A10
BA, RA
BA, A10
×
READ/READA
WRIT/WRITA
ACT
L
H
H
L
H
L
L
PRE/PALL
REF/SELF
MRS
ILLEGAL (3)
L
H
L
ILLEGAL
L
L
OC, BA
ILLEGAL
Note: H=Vꢇꢈ, L=Vꢇꢉ x= Vꢇꢈ or Vꢇꢉ, V = Valid Data, BA= Bank Address, CA+Column Address, RA=Row Address, OC= Op-Code
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
11
09/11/2019
IS42/45S81600F, IS42/45S16800F
FUNCTIONAL TRUTH TABLE Continued:
Current State
CS
H
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
H
L
L
L
L
RAS CAS
WE
Address
Command
DESL
Action
Write Recovering
×
H
H
H
H
L
×
H
H
L
×
×
Nop, Enter row active after tDPL
Nop, Enter row active after tDPL
Nop, Enter row active after tDPL
Begin read(8)
H
L
×
NOP
×
BST
H
L
BA, CA, A10
READ/READA
WRIT/ WRITA
ACT
L
BA, CA, A10
Begin new write
ILLEGAL (3)
ILLEGAL (3)
H
H
L
H
L
BA, RA
L
BA, A10
PRE/PALL
REF/SELF
MRS
L
H
L
×
ILLEGAL
L
L
OC, BA
ILLEGAL
Write Recovering
with Auto
×
×
H
H
L
×
H
L
×
DESL
Nop, Enter precharge after tDPL
Nop, Enter precharge after tDPL
Nop, Enter row active after tDPL
ILLEGAL(3,8,11)
ILLEGAL (3,11)
ILLEGAL (3,11)
H
H
H
H
L
×
NOP
Precharge
×
BST
H
L
BA, CA, A10
READ/READA
WRIT/WRITA
ACT
L
BA, CA, A10
H
H
L
H
L
BA, RA
L
BA, A10
PRE/PALL
REF/SELF
MRS
ILLEGAL (3,11)
L
H
L
×
ILLEGAL
L
L
OC, BA
ILLEGAL
Refresh
×
×
H
L
×
×
H
L
×
DESL
Nop, Enter idle after tRC
Nop, Enter idle after tRC
ILLEGAL
H
H
H
L
×
NOP/BST
READ/READA
WRIT/WRITA
ACT
BA, CA, A10
L
BA, CA, A10
ILLEGAL
H
H
L
H
L
BA, RA
ILLEGAL
L
BA, A10
PRE/PALL
REF/SELF
MRS
ILLEGAL
L
H
L
×
ILLEGAL
L
L
OC, BA
ILLEGAL
Mode Register
Accessing
×
×
H
H
L
×
H
L
×
DESL
Nop, Enter idle after 2 clocks
Nop, Enter idle after 2 clocks
ILLEGAL
H
H
H
L
×
NOP
×
BST
×
×
BA, CA, A10
BA, RA
READ/WRITE
ILLEGAL
×
ACT/PRE/PALL ILLEGAL
REF/MRS
Note: H=Vꢇꢈ, L=Vꢇꢉ x= Vꢇꢈ or Vꢇꢉ, V = Valid Data, BA= Bank Address, CA+Column Address, RA=Row Address, OC= Op-Code
Notes:
1. All entries assume that CKE is active (CKEn-1=CKEn=H).
2. If both banks are iꢀle, anꢀ CKE is inactive (Low), the ꢀevice will enter Power Down moꢀe. All input buffers except CKE will be
disabled.
3. Illegal to bank in specifieꢀ states; Function may be legal in the bank inꢀicateꢀ by Bank Aꢀꢀress (BA), ꢀepenꢀing on the state of
that bank.
4. If both banks are iꢀle, anꢀ CKE is inactive (Low), the ꢀevice will enter Self-Refresh moꢀe. All input buffers except CKE will be
disabled.
5. Illegal if tRCD is not satisfieꢀ.
6. Illegal if tRAS is not satisfieꢀ.
7. Must satisfy burst interrupt condition.
8. Must satisfy bus contention, bus turn around, and/or write recovery requirements.
9. Must mask preceding data which don’t satisfy tDPL.
10. Illegal if tRRD is not satisfieꢀ.
11. Illegal for single bank, but legal for other banks.
12
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
CKE RELATED COMMAND TRUTH TABLE(1)
CKE
n-1
Current State
Operation
n
X
H
H
H
H
L
CS
X
H
L
RAS
X
X
H
H
L
CAS
X
X
H
L
WE Address
Self-Refresh (S.R.)
INVALID, CLK (n - 1) would exit S.R.
Self-Refresh Recovery(2)
Self-Refresh Recovery(2)
Illegal
H
L
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
H
L
X
X
L
X
L
L
X
Illegal
L
L
X
X
X
H
L
X
Maintain S.R.
L
X
H
L
X
X
H
H
L
X
Self-Refresh Recovery Idle After tꢃꢄ
H
H
H
H
H
H
H
H
L
H
H
H
H
L
X
Idle After tꢃꢄ
Illegal
X
L
X
Illegal
L
X
X
H
L
X
Begin clock suspend next cycle(5)
Begin clock suspend next cycle(5)
H
L
X
H
H
L
X
L
X
Illegal
L
L
X
Illegal
L
L
X
X
X
X
X
X
X
X
H
L
X
Exit clock suspend next cycle(2)
Maintain clock suspend
INVALID, CLK (n - 1) would exit P.D.
EXIT P.D. --> Idle(2)
H
L
X
X
X
X
X
H
L
X
X
X
X
X
X
H
L
X
L
X
Power-Down (P.D.)
Both Banks Idle
H
L
X
H
L
—
X
Maintain power down mode
L
X
Refer to operations in Operative Command TableH
Refer to operations in Operative Command TableH
Refer to operations in Operative Command TableH
H
H
H
H
H
L
—
—
L
—
Auto-Refresh
H
L
L
X
Refer to operations in Operative Command TableH
Refer to operations in Operative Command TableH
Refer to operations in Operative Command TableH
Refer to operations in Operative Command TableH
L
L
L
Op - Code
H
L
X
H
L
X
X
H
L
X
X
X
H
L
—
L
—
L
L
—
Self-Refresh(3)
Refer to operations in Operative Command TableH
Power-Down(3)
Refer to operations in Operative Command TableH
H
L
L
L
X
L
L
L
L
Op - Code
L
X
H
L
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
Any state
other than
listed above
Begin clock suspend next cycle(4)
Exit clock suspend next cycle
Maintain clock suspend
H
L
L
H
L
Notes:
1. H : High level, L : low level, X : High or low level (Don’t care).
2. CKE Low to High transition will re-enable CLK and other inputs asynchronously. A minimum setup
time must be satisfieꢀ
before any command other than EXIT.
3. Power down and Self refresh can be entered only from the both banks idle state.
4. Must be legal commanꢀ as ꢀefineꢀ in Operative Commanꢀ Table.
5. Illegal if tꢂꢃꢊ is not satisfieꢀ.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
13
09/11/2019
IS42/45S81600F, IS42/45S16800F
STATE DIAGRAM
Self
Refresh
SELF
SELF exit
REF
Mode
Register
Set
MRS
CBR (Auto)
Refresh
IDLE
CKE
CKE
ACT
Power
Down
CKE
Active
Power
Down
Row
Active
CKE
BST
Write
BST
Read
Auto Prech
Write
Read
arge
Read
CKE
CKE
CKE
WRITE
SUSPEND
READ
SUSPEND
READ
WRITE
Write
CKE
CKE
CKE
CKE
READA
SUSPEND
WRITEA
SUSPEND
WRITEA
READA
CKE
Precharge
POWER
ON
Precharge
Automatic sequence
Manual Input
14
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Vdd ꢋꢌꢊ
Vddqꢋꢌꢊ
Vꢇꢍ
Parameters
Rating
–0.5 to +4.6
–0.5 to +4.6
–0.5 to Vdd + 0.5
–1.0 to Vddq + 0.5
1
Unit
V
Maximum Supply Voltage
Maximum Supply Voltage for Output Buffer
Input Voltage
V
V
Vꢎꢏꢐ
Output Voltage
V
Pd ꢋꢌꢊ
Iꢄꢂ
Allowable Power Dissipation
Output Shorted Current
W
mA
°C
50
Tꢎꢑꢃ
Operating Temperature
Com.
Ind.
A1
0 to +70
-40 to +85
-40 to +85
-40 to +105
A2
Tꢂꢐꢒ
Storage Temperature
–55 to +150
°C
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other conditions
above those inꢀicateꢀ in the operational sections of this specification is not implieꢀ. Exposure to absolute
maximum rating conꢀitions for extenꢀeꢀ perioꢀs may affect reliability.
2. All voltages are referenced to Vss.
DC RECOMMENDED OPERATING CONDITIONS
Tꢌ = 0oC to +70oC for Commercial grade. Tꢌ = -40oC to +85oC for Industrial and A1 grade. Tꢌ = -40oC to +105oC for A2 grade.
Symbol
Vdd
Parameter
Min.
3.0
Typ.
3.3
3.3
—
Max.
3.6
Unit
V
Supply Voltage
I/O Supply Voltage
Input High Voltage
Input Low Voltage
Vddq
Vꢇꢈ(1)
Vꢇꢉ(2)
3.0
3.6
V
2.0
Vddq + 0.3
+0.8
V
-0.3
—
V
Note:
1. Vꢇꢈ (max) = Vddq +1.2V (ꢑꢏꢉꢂꢅ ꢓꢇdꢐꢈ < 3ꢍꢂ).
2. Vꢇꢉ (min) = -1.2V (ꢑꢏꢉꢂꢅ ꢓꢇdꢐꢈ < 3ꢍꢂ).
3. All voltages are referenced to Vss.
CAPACITANCE CHARACTERISTICS (At Tꢌ = 0 to +25°C, Vdd = Vddq = 3.3 ± 0.3V)
Symbol
Cꢇꢍ1
Parameter
Min.
2
Max.
Unit
pF
Input Capacitance: CLK
4
3
5
Cꢇꢍ2
Input Capacitance:All other input pins
Data Input/Output Capacitance:I/Os
1.3
2
pF
Cꢇ/ꢎ
pF
THERMAL RESISTANCE
Package
Substrate
Theta-ja
Theta-ja
Theta-ja
Theta-jc
Units
(Airflow = 0m/s) (Airflow = 1m/s) (Airflow = 2m/s)
Alloy42 TSOP2(54)
Copper TSOP2(54)
BGA(54)
4-layer
4-layer
4-layer
89.5
53.0
42.9
78.5
47.7
39.1
73.3
45.1
36.9
15.4
11.8
12.5
C/W
C/W
C/W
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
15
09/11/2019
IS42/45S81600F, IS42/45S16800F
DC ELECTRICAL CHARACTERISTICS 1 (Recommended Operation Conditions unless otherwise noted.)
Symbol Parameter
Idd1 (1)
Operating Current
Test Condition
One bank active, CL = 3, BL = 2,
-5
-6
-7
Unit
120
100
80
mA
tꢄꢉꢔ = tꢄꢉꢔ (min), tꢃꢄ = tꢃꢄ (min)
Idd
2
ꢑ
Precharge Standby Current CKE ≤ Vꢇꢉ (ꢋꢌꢊ), tꢄꢔ = 15ns
2
2
2
2
2
2
mA
mA
(In Power-Down Mode)
CS ≥ Vdd - 0.2V
Idd2
ꢑꢂ
Precharge Standby Current CKE ≤ Vꢇꢉ (ꢋꢌꢊ), CLK ≤ Vꢇꢉ (ꢋꢌꢊ)
with clock stop
CS ≥ Vdd - 0.2V
(In Power-Down Mode)
(2)
Idd
2
ꢍ
Precharge Standby Current CS ≥ Vdd - 0.2V, CKE ≥ Vꢇꢈ (ꢋꢇꢍ)
(In Non Power-Down Mode) tꢄꢔ = 15ns
25
15
25
15
25
15
mA
mA
Idd2
ꢍꢂ
Precharge Standby Current CS ≥ Vdd - 0.2V, CKE ≥ Vꢇꢈ (ꢋꢇꢍ)
with clock stop
(In Non Power-Down Mode) All inputs stable
(2)
Idd
3
ꢑ
Active Standby Current
(In Power-Down Mode)
CKE ≤ Vꢇꢉ (ꢋꢌꢊ), CS ≥ Vdd - 0.2V
tꢄꢔ = 15ns
6
6
6
6
6
6
mA
mA
Idd3
ꢑꢂ
Active Standby Current
with clock stop
CKE ≤ Vꢇꢉ (ꢋꢌꢊ), CLK ≤ Vꢇꢉ (ꢋꢌꢊ),
CS ≥ Vdd - 0.2V
(In Power-Down Mode)
(2)
Idd
3
ꢍ
Active Standby Current
CS ≥ Vdd - 0.2V, CKE ≥ Vꢇꢈ (ꢋꢇꢍ)
tꢄꢔ = 15ns
30
20
30
20
30
20
mA
mA
(In Non Power-Down Mode)
Idd3
ꢍꢂ
Active Standby Current
with clock stop
CS ≥ Vdd - 0.2V, CKE ≥ Vꢇꢈ (ꢋꢇꢍ)
All inputs stable
(In Non Power-Down Mode)
Operating Current
Idd4
All banks active, BL = Full Page, CL = 3, 130
120
100
mA
tꢄꢔ = tꢄꢔ (min)
Idd
5
6
Auto-Refresh Current
Self-Refresh Current
tꢃꢄ = tꢃꢄ (min), tꢄꢉꢔ = tꢄꢉꢔ (min)
CKE ≤ 0.2V
160
2
140
2
120
2
mA
mA
Idd
Notes:
1. Idd (ꢋꢌꢊ) is specifieꢀ at the output open conꢀition.
2. Input signals are changed one time during 30ns.
DC ELECTRICAL CHARACTERISTICS 2 (Recommended Operation Conditions unless otherwise noted.)
Symbol Parameter
Test Condition
Min
Max
Unit
Iꢇꢉ
Input Leakage Current
0V ≤ Vin ≤ Vdd, with pins other than
the tested pin at 0V
-5
5
µA
Iꢎꢉ
Output Leakage Current
Output High Voltage Level
Output Low Voltage Level
Output is disabled, 0V ≤ Vout ≤ Vdd,
Iꢎꢈ = -2mA
-5
2.4
—
5
µA
V
Vꢎꢈ
Vꢎꢉ
—
Iꢎꢉ = 2mA
0.4
V
16
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
AC ELECTRICAL CHARACTERISTICS (1,2,3)
-5
-6
-7
Symbol Parameter
Min.
Max.
Min. Max.
Min. Max.
Units
tꢄꢔ3
tꢄꢔ2
Clock Cycle Time
CAS Latency = 3
CAS Latency = 2
5
10
—
—
6
10
—
—
7
7.5
—
—
ns
ns
tꢌꢄ3
tꢌꢄ2
Access Time From CLK
CAS Latency = 3
CAS Latency = 2
—
—
5
5.4
—
—
5.4
6.5
—
—
5.4
5.4
ns
ns
tꢄꢈ
tꢄꢉ
CLK HIGH Level Width
CLK LOW Level Width
Output Data Hold Time
2
2
—
—
2.5
2.5
—
—
2.5
2.5
—
—
ns
ns
tꢎꢈ3
tꢎꢈ2
CAS Latency = 3
CAS Latency = 2
2.5
2.5
—
—
2.5
2.5
—
—
2.5
2.5
—
—
ns
ns
tꢉz
Output LOW Impedance Time
0
—
0
—
0
—
ns
ns
tꢈz3
tꢈz2
Output HIGH Impedance Time CAS Latency = 3
CAS Latency = 2
2.5
2.5
5
5.4
2.5
2.5
5.4
6.5
2.5
2.5
5.4
5.4
tdꢂ
Input Data Setup Time(2)
Input Data Hold Time(2)
Address Setup Time(2)
Address Hold Time(2)
CKE Setup Time(2)
CKE Hold Time(2)
Command Setup Time (CS, RAS, CAS, WE, DQM)(2)
Command Hold Time (CS, RAS, CAS, WE, DQM)(2)
Command Period (REF to REF / ACT to ACT)
Command Period (ACT to PRE)
Command Period (PRE to ACT)
1.5
0.8
1.5
0.8
1.5
0.8
1.5
0.8
55
—
—
1.5
0.8
1.5
0.8
1.5
0.8
1.5
0.8
60
—
—
1.5
0.8
1.5
0.8
1.5
0.8
1.5
0.8
60
—
—
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tdꢈ
tꢌꢂ
—
—
—
tꢌꢈ
—
—
—
tꢄꢔꢂ
tꢄꢔꢈ
tꢄꢋꢂ
tꢄꢋꢈ
tꢃꢄ
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
tꢃꢌꢂ
tꢃꢑ
38
100K
—
42
100K
—
37
100K
—
15
18
15
tꢃꢄd
tꢃꢃd
tdꢑꢉ
Active Command To Read / Write Command Delay Time 15
—
18
—
15
—
Command Period (ACT [0] to ACT[1])
10
10
—
12
—
14
—
Input Data To Precharge
Command Delay time
—
12
—
14
—
tdꢌꢉ
Input Data To Active / Refresh
25
—
30
—
30
—
ns
Command Delay time (During Auto-Precharge)
tꢋꢃd
tddꢅ
tꢊꢂꢃ
tꢐ
Mode Register Program Time
Power Down Exit Setup Time
Exit Self-Refresh to Active Time(4)
Transition Time
10
5.0
60
—
—
—
12
—
—
—
14
—
—
—
ns
ns
ns
6.0
7.0
67
67
0.3
1.2 0.3
1.2 0.3
1.2
ns
tꢃꢅꢆ
Refresh Cycle Time Tꢌ ≤ 70oC Com, Ind, A1, A2
—
—
—
64
64
16
—
—
—
64
64
16
—
—
—
64
64
16
ms
ms
ms
(4096)
Tꢌ ≤ 85oC Ind, A1, A2
Tꢌ > 85oC A2
Notes:
1. The power-on sequence must be executed before starting memory operation.
2. Measured with tꢐ = 1 ns. If clock rising time is longer than 1ns, (tꢐ /2 - 0.5) ns should be added to the parameter.
3. The reference level is 1.4V when measuring input signal timing. Rise and fall times are measured between Vꢇꢈ(min.) and Vꢇꢉ (max).
4. Self-Refresh Mode is not supported for A2 grade with Tꢌ > +85oC.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
17
09/11/2019
IS42/45S81600F, IS42/45S16800F
OPERATING FREQUENCY / LATENCY RELATIONSHIPS
SYMBOL PARAMETER
-5
-6
-7
UNITS
—
Clock Cycle Time
CAS Latency = 3
CAS Latency = 2
5
10
6
10
7
7.5
ns
ns
—
Operating Frequency
CAS Latency = 3
CAS Latency = 2
200
100
166
100
143
133
MHz
MHz
tꢃꢄd
tꢃꢌꢄ
tꢃꢄ
Active Command To Read/Write Command Delay Time
RAS Latency (tꢃꢄd + tꢄꢌꢄ)
CAS Latency = 3
CAS Latency = 2
3
2
3
2
3
2
cycle
cycle
CAS Latency = 3
CAS Latency = 2
6
4
6
4
6
4
cycle
Command Period (REF to REF / ACT to ACT)
Command Period (ACT to PRE)
CAS Latency = 3
CAS Latency = 2
11
6
10
6
9
8
cycle
cycle
tꢃꢌꢂ
tꢃꢑ
CAS Latency = 3
CAS Latency = 2
8
4
7
5
6
5
cycle
cycle
Command Period (PRE to ACT)
CAS Latency = 3
CAS Latency = 2
3
2
3
2
3
2
cycle
cycle
tꢃꢃd
tꢄꢄd
Command Period (ACT[0] to ACT [1])
2
1
2
1
2
1
cycle
cycle
Column Command Delay Time
(READ, READA, WRIT, WRITA)
tdꢑꢉ
tdꢌꢉ
Input Data To Precharge Command Delay Time
2
2
2
cycle
Input Data To Active/Refresh Command Delay Time
(During Auto-Precharge)
CAS Latency = 3
CAS Latency = 2
5
4
5
4
5
4
cycle
cycle
tꢃꢕd
tꢓꢕd
tꢃqꢉ
tꢓdꢉ
tꢑqꢉ
Burst Stop Command To Output in HIGH-Z Delay Time
(Read)
CAS Latency = 3
CAS Latency = 2
3
2
3
2
3
2
cycle
cycle
Burst Stop Command To Input in Invalid Delay Time
(Write)
0
0
0
cycle
cycle
cycle
Precharge Command To Output in HIGH-Z Delay Time
(Read)
CAS Latency = 3
CAS Latency = 2
3
2
3
2
3
2
Precharge Command To Input in Invalid Delay Time
(Write)
0
0
0
Last Output To Auto-Precharge Start Time (Read)
CAS Latency = 3
CAS Latency = 2
-2
-1
-2
-1
-2
-1
cycle
cycle
tqꢋd
tdꢋd
tꢋꢃd
DQM To Output Delay Time (Read)
DQM To Input Delay Time (Write)
2
0
2
2
0
2
2
0
2
cycle
cycle
cycle
Mode Register Set To Command Delay Time
18
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
AC TEST CONDITIONS
Input Load
Output Load
t
CK
t
CH
t
CL
3.0V
1.4V
1.4V
CLK
50Ω
0V
Z = 50Ω
tCMS
t
CMH
Output
3.0V
1.4V
50 pF
INPUT
0V
t
AC
tOH
OUTPUT
1.4V
1.4V
AC TEST CONDITIONS
Parameter
Rating
AC Input Levels
Input Rise and Fall Times
0V to 3.0V
1 ns
Input Timing Reference Level
1.4V
Output Timing Measurement Reference Level
1.4V
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
19
09/11/2019
IS42/45S81600F, IS42/45S16800F
Initialization
FUNCTIONAL DESCRIPTION
SDRAMs must be powered up and initialized in a
preꢀefineꢀ manner.
The128MbSDRAMsarequad-bankDRAMswhichoperate
at 3.3V and include a synchronous interface (all signals
are registered on the positive edge of the clock signal,
CLK). Each of the 33,554,432-bit banks is organized as
4,096 rows by 512 columns by 16 bits or 4,096 rows by
1,024 columns by 8 bits.
The 128M SDRAM is initialized after the power is applied
to Vdd and Vddq (simultaneously) and the clock is stable
with DQM High and CKE High.
A 100µs delay is required prior to issuing any command
other than a COMMAND INHIBIT or a NOP.The COMMAND
INHIBIT or NOP may be applied during the 100us period
and should continue at least through the end of the period.
Read and write accesses to the SDRAM are burst oriented;
accesses start at a selected location and continue for
a programmed number of locations in a programmed
sequence. Accesses begin with the registration of an AC-
TIVEcommandwhichisthenfollowedbyaREADorWRITE
command. The address bits registered coincident with the
ACTIVE command are used to select the bank and row
to be accessed (BA0 and BA1 select the bank, A0-A11 select
the row). The address bits A0-A9 (x8);A0-A8 (x16) registered
coincident with the READ or WRITE command are used
to select the starting column location for the burst access.
With at least one COMMAND INHIBIT or NOP command
having been applied, a PRECHARGE command should
be applieꢀ once the 100µs ꢀelay has been satisfieꢀ. All
banks must be precharged. This will leave all banks in an
idle state after which at least two AUTO REFRESH cycles
must be performed. After the AUTO REFRESH cycles are
complete, the SDRAM is then ready for mode register
programming.
Prior to normal operation, the SDRAM must be initial-
ized. The following sections provide detailed information
coveringꢀeviceinitialiꢖation, registerꢀefinition, commanꢀ
descriptions and device operation.
The mode register should be loaded prior to applying
any operational command because it will power up in an
unknown state.
20
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
INITIALIZE AND LOAD MODE REGISTER(1)
T0
T1
Tn+1
To+1
t
CL
Tp+1
Tp+2
Tp+3
tCK
tCH
CLK
CKE
tCKS t
CKH
t
CMS
tCMH
tCMS
tCMH
tCMS tCMH
AUTO
REFRESH
AUTO
Load MODE
REGISTER
COMMAND
NOP
PRECHARGE
NOP
NOP
NOP
ACTIVE
REFRESH
DQM/
DQML, DQMH
t
t
t
AS
tAH
A0-A9, A11
A10
ROW
ROW
BANK
CODE
AS
tAH
ALL BANKS
CODE
SINGLE BANK
ALL BANKS
AS
tAH
BA0, BA1
DQ
CODE
t
RP
t
RC
t
RC
tMRD
T
Power-up: VCC
Precharge AUTO REFRESH
and CLK stable all banks
AUTO REFRESH
Program MODE REGISTER(2, 3, 4)
DON'T CARE
T = 100µs Min.
Notes:
1. If CS is High at clock High time, all commands applied are NOP.
2. The Mode register may be loaded prior to the Auto-Refresh cycles if desired.
3. JEDEC and PC100 specify three clocks.
4. Outputs are guaranteed High-Z after the command is issued.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
21
09/11/2019
IS42/45S81600F, IS42/45S16800F
AUTO-REFRESH CYCLE
T0
T1
T2
Tn+1
To+1
tCK
tCL
tCH
CLK
CKE
t
CKS CKH
t
tCMS
tCMH
Auto
Refresh
Auto
COMMAND
PRECHARGE
NOP
NOP
NOP
ACTIVE
Refresh
DQM/
DQML, DQMH
A0-A9, A11
A10
ROW
ROW
BANK
ALL BANKS
SINGLE BANK
BANK(s)
BA0, BA1
DQ
tAS
tAH
High-Z
tRP
tRC
t
RC
DON'T CARE
Notes:
1. CAS latency = 2, 3
22
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
SELF-REFRESH CYCLE
T0
T1
T2
Tn+1
To+1
To+2
t
CK
tCH
t
CL
CLK
CKE
t
CKS
t
CKH
t
CKS
tRAS
t
CKS
tCMS
tCMH
Auto
Auto
COMMAND
PRECHARGE
NOP
NOP
NOP
Refresh
Refresh
DQM/
DQML, DQMH
A0-A9, A11
A10
ALL BANKS
SINGLE BANK
t
AS
tAH
BA0, BA1
DQ
BANK
High-Z
tRP
tXSR
Precharge all
active banks
Enter self
refresh mode
CLK stable prior to exiting
self refresh mode
Exit self refresh mode
(Restart refresh time base)
DON'T CARE
Note:
1. Self-Refresh Mode is not supported for A2 grade with Tꢌ > +85oC.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
23
09/11/2019
IS42/45S81600F, IS42/45S16800F
REGISTER DEFINITION
Mode Register
The moꢀe register is useꢀ to ꢀefine the specific moꢀe
of operation of the SDRAM. This ꢀefinition incluꢀes the
selection of a burst length, a burst type, a CAS latency,
an operating mode and a write burst mode, as shown in
MODE REGISTER DEFINITION.
Mode register bits M0-M2 specify the burst length, M3
specifiesthetypeofburst(sequentialorinterleaved), M4-M6
specify the CAS latency, M7 and M8 specify the operating
moꢀe, M9 specifies the WRITE burst moꢀe, anꢀ M10 anꢀ
M11 are reserved for future use.
The mode register is programmed via the LOAD MODE
REGISTER command and will retain the stored information
until it is programmed again or the device loses power.
The mode register must be loaded when all banks are
iꢀle, anꢀ the controller must wait the specifieꢀ time before
initiatingthesubsequentoperation.Violatingeitherofthese
reꢁuirements will result in unspecifieꢀ operation.
MODE REGISTER DEFINITION
Address Bus
BA1 BA0 A11 A10 A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
Mode Register (Mx)
Reserved(1)
Burst Length
M2 M1 M0
M3=0
M3=1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
2
4
8
1
2
4
8
Reserved Reserved
Reserved Reserved
Reserved Reserved
Full Page Reserved
Burst Type
M3
Type
0
1
Sequential
Interleaved
Latency Mode
M6 M5 M4
CAS Latency
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Reserved
Reserved
2
3
Reserved
Reserved
Reserved
Reserved
Operating Mode
M8 M7 M6-M0 Mode
0
0
Defined Standard Operation
All Other States Reserved
—
—
—
Write Burst Mode
M9
0
Mode
Programmed Burst Length
Single Location Access
1. To ensure compatibility with future devices,
should program BA1, BA0, A11, A10 = "0"
1
24
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
BURST LENGTH
ing that the burst will wrap within the block if a boundary
is reached. The block is uniquely selected by A1-A8 (x16)
when the burst length is set to two; by A2-A8 (x16) when
the burst length is set to four; and byA3-A8 (x16) when the
burstlengthissettoeight.Theremaining(leastsignificant)
address bit(s) is (are) used to select the starting location
within the block. Full-page bursts wrap within the page if
the boundary is reached.
ReadandwriteaccessestotheSDRAMareburstoriented,
with the burst length being programmable, as shown in
MODE REGISTER DEFINITION. The burst length deter-
mines the maximum number of column locations that can
be accessed for a given READ or WRITE command. Burst
lengths of 1, 2, 4 or 8 locations are available for both the
sequential and the interleaved burst types, and a full-page
burst is available for the sequential type. The full-page
burst is used in conjunction with the BURST TERMINATE
command to generate arbitrary burst lengths.
Burst Type
Accesses within a given burst may be programmed to be
either sequential or interleaved; this is referred to as the
burst type and is selected via bit M3.
Reservedstatesshouldnotbeused,asunknownoperation
or incompatibility with future versions may result.
When a READ or WRITE command is issued, a block of
columnseꢁualtotheburstlengthiseffectivelyselecteꢀ.All
accesses for that burst take place within this block, mean-
The ordering of accesses within a burst is determined by
the burst length, the burst type and the starting column
address, as shown in BURST DEFINITION table.
BURST DEFINITION
Burst
Starting Column
Order of Accesses Within a Burst
Length
Address
Type = Sequential
Type = Interleaved
A 0
2
4
0
1
0-1
1-0
0-1
1-0
A 1
0
A 0
0
0-1-2-3
1-2-3-0
2-3-0-1
3-0-1-2
0-1-2-3
1-0-3-2
2-3-0-1
3-2-1-0
0
1
1
0
1
1
A 2
A 1
0
A 0
0
0
0-1-2-3-4-5-6-7
1-2-3-4-5-6-7-0
2-3-4-5-6-7-0-1
3-4-5-6-7-0-1-2
4-5-6-7-0-1-2-3
5-6-7-0-1-2-3-4
6-7-0-1-2-3-4-5
7-0-1-2-3-4-5-6
0-1-2-3-4-5-6-7
1-0-3-2-5-4-7-6
2-3-0-1-6-7-4-5
3-2-1-0-7-6-5-4
4-5-6-7-0-1-2-3
5-4-7-6-1-0-3-2
6-7-4-5-2-3-0-1
7-6-5-4-3-2-1-0
Not Supported
0
0
1
0
1
0
8
0
1
1
1
0
0
1
0
1
1
1
1
0
1
1
Full
Page
(y)
n = A0-A7
Cn, Cn + 1, Cn + 2
Cn + 3, Cn + 4...
…Cn - 1,
(location 0-y)
Cn…
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
25
09/11/2019
IS42/45S81600F, IS42/45S16800F
CAS Latency
Operating Mode
The CAS latency is the delay, in clock cycles, between
the registration of a READ command and the availability of
the first piece of output ꢀata. The latency can be set to two
or three clocks.
ThenormaloperatingmodeisselectedbysettingM7andM8
to zero; the other combinations of values for M7 and M8 are
reserved for future use and/or test modes. The programmed
burst length applies to both READ and WRITE bursts.
If a READ command is registered at clock edge n, and
the latency is m clocks, the data will be available by clock
edge n + m. The DQs will start driving as a result of the
clock edge one cycle earlier (n + m - 1), and provided that
the relevant access times are met, the data will be valid by
clock edge n + m. For example, assuming that the clock
cycle time is such that all relevant access times are met,
if a READ command is registered at T0 and the latency
is programmed to two clocks, the DQs will start driving
after T1 and the data will be valid by T2, as shown in CAS
Latency diagrams. The Allowable Operating Frequency
table indicates the operating frequencies at which each
CAS latency setting can be used.
Test modes and reserved states should not be used be-
cause unknown operation or incompatibility with future
versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2
applies to both READ and WRITE bursts; when M9 = 1,
the programmed burst length applies to READ bursts, but
write accesses are single-location (nonburst) accesses.
CAS Latency
Allowable Operating Frequency (MHz)
Speed
CAS Latency = 2
CAS Latency = 3
Reserved states should not be used as unknown operation
or incompatibility with future versions may result.
-5
100
100
133
200
166
143
-6
-7
CAS LATENCY
T0
T1
T2
T3
CLK
READ
NOP
NOP
COMMAND
DQ
t
AC
D
OUT
OH
t
LZ
t
CAS Latency - 2
T0
T1
T2
T3
T4
CLK
READ
NOP
NOP
NOP
COMMAND
DQ
t
AC
D
OUT
OH
t
LZ
t
CAS Latency - 3
DON'T CARE
UNDEFINED
26
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
ACTIVATING SPECIFIC ROW WITHIN SPE-
CIFIC BANK
CHIP OPERATION
BANK/ROW ACTIVATION
Before any READ or WRITE commands can be issued
to a bank within the SDRAM, a row in that bank must be
“opened.” This is accomplished via theACTIVE command,
which selects both the bank and the row to be activated
(see Activating Specific Row Within Specific Bank).
CLK
HIGH
CKE
CS
After opening a row (issuing anACTIVE command), a READ
or WRITE command may be issued to that row, subject to
the tꢃꢄd specification. Minimum tꢃꢄd should be divided
by the clock period and rounded up to the next whole
number to determine the earliest clock edge after the AC-
TIVE command on which a READ or WRITE command
can be entered. For example, a tꢃꢄd specification of 18ns
with a 125 MHz clock (8ns period) results in 2.25 clocks,
rounꢀeꢀ to 3. This is reflecteꢀ in the following example,
which covers any case where 2 < [tꢃꢄd (MIN)/tꢄꢔ] ≤ 3.
(Thesameproceꢀureisuseꢀtoconvertotherspecification
limits from time units to clock cycles).
RAS
CAS
WE
A0-A11
BA0, BA1
ROW ADDRESS
BANK ADDRESS
A subseꢁuent ACTIVE commanꢀ to a ꢀifferent row in the
same bank can only be issued after the previous active
row has been “closed” (precharged). The minimum time
interval between successive ACTIVE commands to the
same bank is ꢀefineꢀ by tꢃꢄ.
A subsequent ACTIVE command to another bank can be
issueꢀwhilethefirstbankisbeingaccesseꢀ, whichresults
in a reduction of total row-access overhead. The minimum
time interval between successive ACTIVE commands to
ꢀifferent banks is ꢀefineꢀ by tꢃꢃd.
EXAMPLE: MEETING TRCD (MIN) WHEN 2 < [TRCD (MIN)/TCK] ≤ 3
T0
T1
T2
T3
T4
CLK
READ or
WRITE
ACTIVE
NOP
NOP
COMMAND
t
RCD
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
27
09/11/2019
IS42/45S81600F, IS42/45S16800F
READS
READ COMMAND
READ bursts are initiated with a READ command, as
shown in the READ COMMAND diagram.
The starting column and bank addresses are provided with
theREADcommand,andautoprechargeiseitherenabledor
disabled for that burst access. If auto precharge is enabled,
the row being accessed is precharged at the completion of
the burst. For the generic READ commands used in the fol-
lowing illustrations, auto precharge is disabled.
CLK
HIGH
CKE
CS
RAS
During READ bursts, the valid data-out element from the
starting column address will be available following the
CAS latency after the READ command. Each subsequent
data-out element will be valid by the next positive clock
edge. The CAS Latency diagram shows general timing
for each possible CAS latency setting.
CAS
WE
Upon completion of a burst, assuming no other commands
havebeeninitiated,theDQswillgoHigh-Z.Afull-pageburst
will continue until terminated. (At the end of the page, it will
wrap to column 0 and continue.)
COLUMN ADDRESS
AUTO PRECHARGE
A0-A9
A11
Data from any READ burst may be truncated with a sub-
seꢁuent READ commanꢀ, anꢀ ꢀata from a fixeꢀ-length
READ burst may be immediately followed by data from a
READ commanꢀ. In either case, a continuous flow of ꢀata
can be maintaineꢀ. The first ꢀata element from the new
burst follows either the last element of a completed burst
or the last desired data element of a longer burst which
is being truncated.
A10
NO PRECHARGE
BANK ADDRESS
BA0, BA1
Note: A9 is "Don't Care" for x16.
The DQM input is used to avoid I/O contention, as shown
in Figures RW1 and RW2. The DQM signal must be as-
serted (HIGH) at least three clocks prior to the WRITE
commanꢀ (DQM latency is two clocks for output buffers)
to suppress data-out from the READ. Once the WRITE
command is registered, the DQs will go High-Z (or remain
High-Z), regardless of the state of the DQM signal, pro-
vided the DQM was active on the clock just prior to the
WRITE command that truncated the READ command.
If not, the second WRITE will be an invalid WRITE. For
example, if DQM was LOW during T4 in Figure RW2, then
the WRITEs at T5 and T7 would be valid, while the WRITE
at T6 would be invalid.
ThenewREADcommandshouldbeissuedxcyclesbefore
the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in Consecutive READ Bursts for CAS latencies of
two and three; data element n + 3 is either the last of a
burstoffourorthelastdesiredofalongerburst.The128Mb
SDRAM uses a pipelined architecture and therefore does
not require the 2n rule associated with a prefetch architec-
ture.AREAD command can be initiated on any clock cycle
following a previous READ command. Full-speed random
read accesses can be performed to the same bank, as
shown in Random READ Accesses, or each subsequent
READ may be performeꢀ to a ꢀifferent bank.
The DQM signal must be de-asserted prior to the WRITE
commanꢀ (DQM latency is ꢖero clocks for input buffers)
to ensure that the written data is not masked.
Data from any READ burst may be truncated with a sub-
seꢁuent WRITE commanꢀ, anꢀ ꢀata from a fixeꢀ-length
READ burst may be immediately followed by data from a
WRITE command (subject to bus turnaround limitations).
The WRITE burst may be initiated on the clock edge im-
mediately following the last (or last desired) data element
from the READ burst, provided that I/O contention can be
avoided. In a given system design, there may be a pos-
sibility that the device driving the input data will go Low-Z
before the SDRAM DQs go High-Z. In this case, at least
a single-cycle delay should occur between the last read
data and the WRITE command.
Afixeꢀ-lengthREADburstmaybefolloweꢀby,ortruncateꢀ
with, aPRECHARGE commandtothesamebank(provided
that auto precharge was not activated), and a full-page burst
may be truncated with a PRECHARGE command to the
samebank.ThePRECHARGEcommandshouldbeissued
x cycles before the clock edge at which the last desired
data element is valid, where x equals the CAS latency
28
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
minus one. This is shown in the READ to PRECHARGE
diagram for each possible CAS latency; data element n +
3 is either the last of a burst of four or the last desired of
a longer burst. Following the PRECHARGE command, a
subsequent command to the same bank cannot be issued
until tꢃꢑ is met. Note that part of the row precharge time
is hidden during the access of the last data element(s).
In the case of a fixeꢀ-length burst being executeꢀ to
completion, a PRECHARGE command issued at the
optimum time (as described above) provides the same
operation that woulꢀ result from the same fixeꢀ-length
burst with auto precharge. The disadvantage of the PRE-
CHARGE command is that it requires that the command
and address buses be available at the appropriate time to
issue the command; the advantage of the PRECHARGE
commanꢀ is that it can be useꢀ to truncate fixeꢀ-length
or full-page bursts.
Full-page READ bursts can be truncated with the BURST
TERMINATE commanꢀ, anꢀ fixeꢀ-length READ bursts
may be truncated with a BURST TERMINATE command,
providedthatautoprechargewasnotactivated.TheBURST
TERMINATE command should be issued x cycles before
the clock edge at which the last desired data element is
valid, where x equals the CAS latency minus one. This is
shown in the READ Burst Termination diagram for each
possibleCASlatency;dataelementn+3isthelastdesired
data element of a longer burst.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
29
09/11/2019
IS42/45S81600F, IS42/45S16800F
RW1 - READ to WRITE
T0
T1
T2
T3
T4
T5
T6
CLK
DQM
COMMAND
ADDRESS
DQ
READ
NOP
NOP
NOP
NOP
NOP
WRITE
BANK,
COL n
BANK,
COL b
t
HZ
DOUT n+1
DOUT n+2
DOUT
n
DIN b
CAS Latency - 2
t
DS
DON'T CARE
RW2 - READ to WRITE
T0
T1
T2
T3
T4
T5
CLK
DQM
COMMAND
ADDRESS
DQ
READ
NOP
NOP
NOP
NOP
WRITE
BANK,
COL n
BANK,
COL b
t
HZ
DOUT
n
DIN
b
CAS Latency - 3
t
DS
DON'T CARE
30
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
CONSECUTIVE READ BURSTS
T0
T1
T2
T3
T4
T5
T6
CLK
COMMAND
ADDRESS
DQ
READ
NOP
NOP
NOP
READ
NOP
NOP
BANK,
COL n
BANK,
COL b
D
OUT
n
DOUT n+1
DOUT n+2
DOUT n+3
DOUT
b
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
COMMAND
READ
NOP
NOP
NOP
READ
NOP
NOP
NOP
BANK,
COL n
BANK,
COL b
ADDRESS
DQ
DOUT
n
DOUT n+1
DOUT n+2
DOUT n+3
D
OUT
b
CAS Latency - 3
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
31
09/11/2019
IS42/45S81600F, IS42/45S16800F
RANDOM READ ACCESSES
T0
T1
T2
T3
T4
T5
CLK
COMMAND
ADDRESS
DQ
READ
READ
READ
READ
NOP
NOP
BANK,
COL n
BANK,
COL b
BANK,
COL m
BANK,
COL x
DOUT
n
DOUT
b
DOUT
m
DOUT
x
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
T5
T6
CLK
COMMAND
ADDRESS
DQ
READ
READ
READ
READ
NOP
NOP
NOP
BANK,
COL n
BANK,
COL b
BANK,
COL m
BANK,
COL x
DOUT
n
DOUT
b
DOUT
m
DOUT
x
CAS Latency - 3
DON'T CARE
32
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
READ BURST TERMINATION
T0
T1
T2
T3
T4
T5
T6
CLK
COMMAND
ADDRESS
DQ
BURST
TERMINATE
READ
NOP
NOP
NOP
NOP
NOP
x = 1 cycle
BANK a,
COL n
D
OUT
n
DOUT n+1
DOUT n+2
DOUT n+3
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
COMMAND
ADDRESS
DQ
BURST
TERMINATE
READ
NOP
NOP
NOP
NOP
x = 2 cycles
NOP
NOP
BANK,
COL n
DOUT
n
DOUT n+1
DOUT n+2
DOUT n+3
CAS Latency - 3
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
33
09/11/2019
IS42/45S81600F, IS42/45S16800F
ALTERNATING BANK READ ACCESSES
T0
T1
T2
T3
T4
T5
T6
T7
T8
tCK
tCL
tCH
CLK
CKE
tCKS tCKH
tCMS tCMH
ACTIVE
COMMAND
NOP
READ
NOP
ACTIVE
NOP
READ
NOP
ACTIVE
tCMS tCMH
DQM/
DQML, DQMH
tAS tAH
COLUMN m(2)
ROW
ROW
COLUMN b(2)
ROW
ROW
A0-A9, A11
A10
ROW
tAS tAH
ENABLE AUTO PRECHARGE
ENABLE AUTO PRECHARGE
ROW
tAS tAH
BANK 0
BANK 3
BANK 3
BANK 0
BA0, BA1
BANK 0
t
LZ
tOH
tOH
tOH
tOH
tOH
DQ
DOUT
m
D
OUT m+
1
D
OUT m+
2
D
OUT m+
3
D
OUT
b
tAC
tAC
tAC
tAC
tAC
tAC
tRCD - BANK 0
tRRD
CAS Latency - BANK 0
tRP - BANK 0
tRCD - BANK 0
tRCD - BANK 3
CAS Latency - BANK 3
tRAS - BANK 0
tRC - BANK 0
DON'T CARE
Notes:
1) CAS latency = 2, Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
34
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
READ - FULL-PAGE BURST
T0
T1
T2
T3
T4
T5
T6
Tn+1
Tn+2
Tn+3
Tn+4
tCK
tCL
tCH
CLK
CKE
tCKS tCKH
tCMS tCMH
ACTIVE
COMMAND
NOP
READ
NOP
NOP
NOP
NOP
NOP
BURST TERM
NOP
NOP
tCMS tCMH
DQM/
DQML, DQMH
tAS tAH
COLUMN m(2)
A0-A9, A11
A10
ROW
tAS tAH
ROW
tAS tAH
BA0, BA1
BANK
BANK
tAC
tAC
tAC
tAC
tAC
tAC
tHZ
D
OUT
m
D
OUT m+
1
D
OUT m+
2
D
OUT m-
1
D
OUT
m
D
OUT m+
1
DQ
tLZ
t
OH
tOH
tOH
tOH
t
OH
tOH
tRCD
CAS Latency
each row (x4) has
1,024 locations
DON'T CARE
UNDEFINED
Full page Full-page burst not self-terminating.
completion Use BURST TERMINATE command.
Notes:
1) CAS latency = 2, Burst Length = Full Page
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
35
09/11/2019
IS42/45S81600F, IS42/45S16800F
READ - DQM OPERATION
T0
T1
T2
T3
T4
T5
T6
T7
T8
t
CK
t
CL
tCH
CLK
CKE
t
CKS tCKH
t
CMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
NOP
NOP
NOP
NOP
t
CMS
t
CMH
DQM/
DQML, DQMH
t
t
t
AS
tAH
COLUMN m(2)
A0-A9, A11
A10
ROW
AS
tAH
ENABLE AUTO PRECHARGE
ROW
DISABLE AUTO PRECHARGE
AS
tAH
BA0, BA1
BANK
BANK
t
OH
tOH
tOH
t
AC
tAC
D
OUT
m
D
OUT m+
2
D
OUT m+
3
DQ
tLZ
tLZ
t
HZ
tAC
tHZ
DON'T CARE
UNDEFINED
t
RCD
CAS Latency
Notes:
1) CAS latency = 2, Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
36
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
READ to PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
COMMAND
ADDRESS
DQ
t
RP
PRECHARGE
READ
NOP
NOP
NOP
NOP
ACTIVE
NOP
BANK a,
COL n
BANK
BANK a,
ROW
(a or all)
t
RQL
High-Z
D
OUT
n
DOUT n+1
DOUT n+2
DOUT n+3
CAS Latency - 2
DON'T CARE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
COMMAND
ADDRESS
DQ
t
RP
PRECHARGE
READ
NOP
NOP
NOP
NOP
NOP
ACTIVE
BANK,
COL n
BANK,
COL b
BANK a,
ROW
t
RQL
High-Z
DOUT
n
DOUT n+1
D
OUT n+2
DOUT n+3
CAS Latency - 3
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
37
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITES
An example is shown in WRITE to WRITE diagram. Data
n + 1 is either the last of a burst of two or the last desired
of a longer burst. The 128Mb SDRAM uses a pipelined
architecture and therefore does not require the 2n rule as-
sociated with a prefetch architecture. A WRITE command
can be initiated on any clock cycle following a previous
WRITEcommand.Full-speedrandomwriteaccesseswithin
a page can be performed to the same bank, as shown in
Random WRITE Cycles, or each subsequent WRITE may
be performeꢀ to a ꢀifferent bank.
WRITE bursts are initiated with a WRITE command, as
shown in WRITE Command diagram.
WRITE COMMAND
CLK
HIGH
CKE
Data for any WRITE burst may be truncated with a subse-
ꢁuentREADcommanꢀ, anꢀꢀataforafixeꢀ-lengthWRITE
burstmaybeimmediatelyfollowedbyasubsequentREAD
command. Once the READ com mand is registered, the
data inputs will be ignored, and WRITEs will not be ex-
ecuted. An example is shown in WRITE to READ. Data
n + 1 is either the last of a burst of two or the last desired
of a longer burst.
CS
RAS
CAS
WE
Data for a fixeꢀ-length WRITE burst may be followeꢀ
by, or truncated with, a PRECHARGE command to the
same bank (provided that auto precharge was not acti-
vated), and a full-page WRITE burst may be truncated
with a PRECHARGE command to the same bank. The
PRECHARGE command should be issued tdꢑꢉ after the
clock edge at which the last desired input data element is
registered. The auto precharge mode requires a tdꢑꢉ of
at least one clock plus time, regardless of frequency. In
addition, when truncating a WRITE burst, the DQM signal
must be used to mask input data for the clock edge prior
to, and the clock edge coincident with, the PRECHARGE
command. An example is shown in the WRITE to PRE-
CHARGE diagram. Data n+1 is either the last of a burst
of two or the last desired of a longer burst. Following the
PRECHARGE command, a subsequent command to the
same bank cannot be issued until tꢃꢑ is met.
COLUMN ADDRESS
AUTO PRECHARGE
A0-A9
A11
A10
NO PRECHARGE
BANK ADDRESS
BA0, BA1
Note: A9 is "Don't Care" for x16.
The starting column and bank addresses are provided with
theWRITEcommand,andautoprechargeiseitherenabled
or disabled for that access. If auto precharge is enabled,
the row being accessed is precharged at the completion of
the burst. For the generic WRITE commands used in the
following illustrations, auto precharge is disabled.
Inthecaseofafixeꢀ-lengthburstbeingexecuteꢀtocomple-
tion, a PRECHARGE command issued at the optimum
time (as described above) provides the same operation that
woulꢀ result from the same fixeꢀ-length burst with auto
precharge.ThedisadvantageofthePRECHARGEcommand
is that it requires that the command and address buses be
available at the appropriate time to issue the command;
the advantage of the PRECHARGE command is that it
can be useꢀ to truncate fixeꢀ-length or full-page bursts.
During WRITE bursts, the first valiꢀ data-in element will be
registered coincident with the WRITE command. Subse-
quentdataelementswillberegisteredoneachsuccessive
positive clock eꢀge. Upon completion of a fixeꢀ-length
burst, assuming no other commands have been initiated,
the DQs will remain High-Z and any additional input data
will be ignored (see WRITE Burst). A full-page burst will
continue until terminated. (At the end of the page, it will
wrap to column 0 and continue.)
Fixed-length or full-page WRITE bursts can be truncated
with the BURST TERMINATE command. When truncat-
ing a WRITE burst, the input data applied coincident with
the BURST TERMINATE command will be ignored. The
last data written (provided that DQM is LOW at that time)
will be the input data applied one clock previous to the
BURST TERMINATE command. This is shown in WRITE
Burst Termination, where data n is the last desired data
element of a longer burst.
Data for any WRITE burst may be truncated with a subse-
ꢁuent WRITE commanꢀ, anꢀ ꢀata for a fixeꢀ-length WRITE
burst may be immediately followed by data for a WRITE
command. The new WRITE command can be issued on
any clock following the previous WRITE command, and the
data provided coincident with the new command applies to
the new command.
38
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE BURST
T0
T1
T2
T3
CLK
COMMAND
ADDRESS
DQ
WRITE
NOP
NOP
NOP
BANK,
COL n
DIN
n
DIN n+1
DON'T CARE
WRITE TO WRITE
T0
T1
T2
CLK
COMMAND
ADDRESS
DQ
WRITE
NOP
WRITE
BANK,
COL n
BANK,
COL b
DIN
n
DIN n+1
DIN b
DON'T CARE
RANDOM WRITE CYCLES
T0
T1
T2
T3
CLK
COMMAND
ADDRESS
DQ
WRITE
WRITE
WRITE
WRITE
BANK,
COL n
BANK,
COL b
BANK,
COL m
BANK,
COL x
DIN
n
DIN
b
DIN
m
DIN x
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
39
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE to READ
T0
T1
T2
T3
T4
T5
CLK
COMMAND
ADDRESS
DQ
WRITE
NOP
READ
NOP
NOP
NOP
BANK,
COL n
BANK,
COL b
DIN
n
DIN n+1
D
OUT
b
DOUT b+1
CAS Latency - 2
DON'T CARE
WP1 - WRITE to PRECHARGE
T0
T1
T2
T3
T4
T5
T6
CLK
DQM
tRP
PRECHARGE
COMMAND
ADDRESS
DQ
WRITE
NOP
NOP
NOP
ACTIVE
NOP
BANK a,
COL n
BANK
BANK a,
ROW
(a or all)
t
DPL
DIN
n
D
IN n+1
DIN n+2
DON'T CARE
40
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
WP2 - WRITE to PRECHARGE
T0
T1
T2
T3
T4
T5
T6
CLK
DQM
tRP
COMMAND
ADDRESS
DQ
PRECHARGE
WRITE
NOP
NOP
NOP
NOP
ACTIVE
BANK a,
COL n
BANK
BANK a,
ROW
(a or all)
tDPL
DIN
n
DIN n+1
DON'T CARE
WRITE Burst Termination
T0
T1
T2
CLK
BURST
TERMINATE
NEXT
COMMAND
ADDRESS
DQ
WRITE
COMMAND
BANK,
COL n
(ADDRESS)
DIN
n
(DATA)
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
41
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE - FULL PAGE BURST
T0
T1
T2
T3
T4
T5
Tn+1
NOP
Tn+2
t
CK
t
CL
t
CH
CLK
CKE
t
CKS CKH
t
t
CMS
t
CMH
COMMAND
ACTIVE
NOP
WRITE
NOP
NOP
NOP
BURST TERM
NOP
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
t
AH
COLUMN m(2)
A0-A9, A11
A10
ROW
AS
tAH
ROW
AS
tAH
BA0, BA1
BANK
BANK
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
t
DH
DIN
m
D
IN m+
1
D
IN m+
2
D
IN m+
3
DIN m-1
DQ
tRCD
Full page completed
DON'T CARE
Notes:
1) Burst Length = Full Page
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
42
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE - DQM OPERATION
T0
T1
T2
T3
T4
T5
T6
T7
t
CK
tCL
t
CH
CLK
CKE
t
CKS CKH
t
tCMS
tCMH
COMMAND
ACTIVE
NOP
WRITE
NOP
NOP
NOP
NOP
NOP
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
t
AH
COLUMN m(2)
A0-A9, A11
A10
ROW
AS
tAH
ENABLE AUTO PRECHARGE
ROW
DISABLE AUTO PRECHARGE
AS
tAH
BA0, BA1
BANK
BANK
t
DS
t
DH
tDS
t
DH
t
DS
t
DH
D
IN
m
D
IN m+
2
DIN m+3
DQ
t
RCD
DON'T CARE
Notes:
1) Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
43
09/11/2019
IS42/45S81600F, IS42/45S16800F
ALTERNATING BANK WRITE ACCESSES
T0
T1
T2
T3
T4
T5
T6
T7
T8
T9
t
CK
t
CL
tCH
CLK
CKE
tCKS tCKH
tCMS
tCMH
COMMAND
ACTIVE
NOP
WRITE
NOP
ACTIVE
NOP
WRITE
NOP
NOP
ACTIVE
t
CMS tCMH
DQM/DQML
DQMH
t
t
t
AS
tAH
COLUMN m(2)
ROW
ROW
COLUMN b(2)
ROW
ROW
A0-A9, A11
A10
ROW
AS
tAH
ENABLE AUTO PRECHARGE
ENABLE AUTO PRECHARGE
ROW
AS
tAH
BANK 0
BANK 1
BANK 1
BANK 0
BA0, BA1
BANK 0
tDS
t
DH
tDS
t
DH
tDS
t
DH
tDS
t
DH
tDS
t
DH
tDS
t
DH
t
DS
tDH
t
DS
tDH
DQ
DIN
m
D
IN m+
1
D
IN m+
2
D
IN m+
3
DIN
b
D
IN b+
1
D
IN b+
2
DIN b+3
t
t
t
t
RCD - BANK 0
RRD
t
DPL - BANK 0
tRP - BANK 0
t
RCD - BANK 0
t
RCD - BANK 1
tDPL - BANK 1
RAS - BANK 0
RC - BANK 0
DON'T CARE
Notes:
1) Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
44
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
CLOCK SUSPEND
of a suspended internal clock edge is ignored; any data
presentontheDQpinsremainsdriven;andburstcounters
are not incremented, as long as the clock is suspended.
(See following examples.)
Clock suspend mode occurs when a column access/burst
is in progress and CKE is registered LOW. In the clock
suspend mode, the internal clock is deactivated, “freezing”
the synchronous logic.
Clock suspend mode is exited by registering CKE HIGH;
the internal clock and related operation will resume on the
subsequent positive clock edge.
For each positive clock edge on which CKE is sampled
LOW, the next internal positive clock edge is suspended.
Any command or data present on the input pins at the time
Clock Suspend During WRITE Burst
T0
T1
T2
T3
T4
T5
CLK
CKE
INTERNAL
CLOCK
COMMAND
ADDRESS
DQ
NOP
WRITE
NOP
NOP
BANK a,
COL n
D
IN
n
DIN n+1
DIN n+2
DON'T CARE
Clock Suspend During READ Burst
T0
T1
T2
T3
T4
T5
T6
CLK
CKE
INTERNAL
CLOCK
COMMAND
ADDRESS
DQ
READ
NOP
NOP
NOP
NOP
NOP
BANK a,
COL n
DOUT
n
D
OUT n+1
DOUT n+2
DOUT n+3
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
45
09/11/2019
IS42/45S81600F, IS42/45S16800F
CLOCK SUSPEND MODE
T0
T1
T2
T3
T4
T5
T6
T7
T8
T9
tCK
tCL
tCH
CLK
CKE
tCKS tCKH
tCKS tCKH
tCMS tCMH
COMMAND
READ
NOP
NOP
NOP
NOP
NOP
WRITE
NOP
tCMS tCMH
DQM/DQML
DQMH
tAS tAH
COLUMN n(2)
A0-A9, A11
A10
COLUMN m(2)
tAS tAH
tAS tAH
BA0, BA1
BANK
BANK
tDS tDH
tAC
tAC
tHZ
DQ
DOUT
m
D
OUT m+1
DIN e
D
IN e+1
tLZ
tOH
DON'T CARE
UNDEFINED
Notes:
1) CAS latency = 3, Burst Length = 2, Auto Precharge is disabled.
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
46
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
PRECHARGE
PRECHARGE Command
ThePRECHARGEcommanꢀ(seefigure)isuseꢀtoꢀeacti-
vate the open row in a particular bank or the open row in all
banks. The bank(s) will be available for a subsequent row
access some specifieꢀ time (tꢃꢑ) after the PRECHARGE
command is issued. InputA10 determines whether one or
all banks are to be precharged, and in the case where only
one bank is to be precharged, inputs BA0, BA1 select the
bank. When all banks are to be precharged, inputs BA0,
BA1 are treated as “Don’t Care.” Once a bank has been
precharged, it is in the idle state and must be activated
prior to any READ or WRITE commands being issued to
that bank.
CLK
HIGH
CKE
CS
RAS
CAS
WE
POWER-DOWN
Power-down occurs if CKE is registered LOW coincident
with a NOP or COMMAND INHIBIT when no accesses
are in progress. If power-down occurs when all banks are
idle, this mode is referred to as precharge power-down;
if power-down occurs when there is a row active in either
bank, this mode is referred to as active power-down.
Entering power-down deactivates the input and output
buffers, excluꢀingCKE, formaximumpowersavingswhile
in standby. The device may not remain in the power-down
statelongerthantherefreshperiod(64ms)sincenorefresh
operations are performed in this mode.
A0-A9, A11
ALL BANKS
A10
BANK SELECT
BANK ADDRESS
BA0, BA1
The power-down state is exited by registering a NOP or
COMMAND INHIBIT and CKE HIGH at the desired clock
edge (meeting tꢄꢔꢂ). See figure below.
POWER-DOWN
CLK
t
CKS
≥ tCKS
CKE
COMMAND
NOP
NOP
ACTIVE
tRCD
tRAS
t
RC
All banks idle
Input buffers gated off
Enter power-down mode
Exit power-down mode
less than 64ms
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
47
09/11/2019
IS42/45S81600F, IS42/45S16800F
POWER-DOWN MODE CYCLE
T0
T1
T2
Tn+1
Tn+2
t
CK
t
CL
tCH
CLK
CKE
t
CKS
t
CKH
t
CKS
tCKS
tCMS
tCMH
COMMAND
PRECHARGE
NOP
NOP
NOP
ACTIVE
DQM/DQML
DQMH
A0-A9, A11
A10
ROW
ROW
ALL BANKS
SINGLE BANK
t
AS
tAH
BA0, BA1
DQ
BANK
BANK
High-Z
Two clock cycles
Input buffers gated
All banks idle
off while in
power-down mode
Precharge all
active banks
All banks idle, enter
power-down mode
DON'T CARE
Exit power-down mode
48
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
BURST READ/SINGLE WRITE
Four cases where CONCURRENT AUTO PRECHARGE
occurs are ꢀefineꢀ below.
The burst read/single write mode is entered by programming
the write burst mode bit (M9) in the mode register to a logic
1. In this mode, all WRITE commands result in the access
of a single column location (burst of one), regardless of
the programmed burst length. READ commands access
columns according to the programmed burst length and
sequence,justasinthenormalmodeofoperation(M9=0).
READ with Auto Precharge
1. Interrupted by a READ (with or without auto precharge):
AREADtobankmwillinterruptaREADonbankn, CAS
latency later. The PRECHARGE to bank n will begin
when the READ to bank m is registered.
CONCURRENT AUTO PRECHARGE
2.InterruptedbyaWRITE(withorwithoutautoprecharge):
A WRITE to bank m will interrupt a READ on bank n
whenregistered.DQMshouldbeusedthreeclocksprior
to the WRITE command to prevent bus contention. The
PRECHARGE to bank n will begin when the WRITE to
bank m is registered.
An access command (READ or WRITE) to another bank
while an access command with auto precharge enabled is
executing is not allowed by SDRAMs, unless the SDRAM
supports CONCURRENT AUTO PRECHARGE. ISSI
SDRAMs support CONCURRENT AUTO PRECHARGE.
READ With Auto Precharge interrupted by a READ
T0
T1
T2
T3
T4
T5
T6
T7
CLK
READ - AP
BANK n
READ - AP
BANK m
NOP
NOP
NOP
NOP
NOP
NOP
Idle
COMMAND
BANK n
Page Active
READ with Burst of 4
Page Active
Interrupt Burst, Precharge
t
RP - BANK n
tRP - BANK m
Internal States
BANK m
READ with Burst of 4
Precharge
BANK n,
COL a
BANK n,
COL b
ADDRESS
DQ
D
OUT
a
DOUT a+1
DOUT
b
DOUT b+1
CAS Latency - 3 (BANK n)
DON'T CARE
CAS Latency - 3 (BANK m)
READ With Auto Precharge interrupted by a WRITE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
READ - AP
BANK n
WRITE - AP
BANK m
COMMAND
NOP
NOP
NOP
NOP
NOP
NOP
Idle
BANK n
READ with Burst of 4
Page Active
Interrupt Burst, Precharge
Page Active
tRP - BANK n
tDPL - BANK m
Internal States
BANK m
WRITE with Burst of 4
Write-Back
BANK n,
COL a
BANK m,
COL b
ADDRESS
DQM
DQ
D
OUT
a
DIN
b
DIN b+1
DIN b+2
DIN b+3
CAS Latency - 3 (BANK n)
DON'T CARE
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
49
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE with Auto Precharge
4.InterruptedbyaWRITE(withorwithoutautoprecharge):
WRITE to bank m will interrupt a WRITE on bank n
3. Interrupted by a READ (with or without auto precharge):
AREADtobankmwillinterruptaWRITEonbanknwhen
registered, with the data-out appearing (CAS latency)
later. The PRECHARGE to bank n will begin after tdꢑꢉ
is met, where tdꢑꢉ begins when the READ to bank m is
registered. The last valid WRITE to bank n will be data-
in registered one clock prior to the READ to bank m.
A
whenregistered.ThePRECHARGEtobanknwillbegin
after tdꢑꢉ is met, where tdꢑꢉ begins when the WRITE
to bank m is registered. The last valid data WRITE
to bank n will be data registered one clock prior to a
WRITE to bank m.
WRITE With Auto Precharge interrupted by a READ
T0
T1
T2
T3
T4
T5
T6
T7
CLK
COMMAND
BANK n
WRITE - AP
BANK n
READ - AP
BANK m
NOP
NOP
NOP
NOP
NOP
NOP
Page Active
WRITE with Burst of 4 Interrupt Burst, Write-Back
DPL - BANK n
Precharge
t
tRP - BANK n
Internal States
tRP - BANK m
BANK m
Page Active
READ with Burst of 4
Precharge
BANK n,
COL a
BANK m,
COL b
ADDRESS
DQ
DIN
a
DIN a+1
DOUT
b
DOUT b+1
CAS Latency - 3 (BANK m)
DON'T CARE
WRITE With Auto Precharge interrupted by a WRITE
T0
T1
T2
T3
T4
T5
T6
T7
CLK
COMMAND
BANK n
WRITE - AP
BANK n
WRITE - AP
BANK m
NOP
NOP
NOP
NOP
NOP
NOP
Page Active
WRITE with Burst of 4
Interrupt Burst, Write-Back
DPL - BANK n
Precharge
t
t
RP - BANK n
Internal States
tDPL - BANK m
BANK m
Page Active
WRITE with Burst of 4
Write-Back
BANK n,
COL a
BANK m,
COL b
ADDRESS
DQ
DIN
a
DIN a+1
DIN a+2
D
IN
b
DIN b+1
DIN b+2
DIN b+3
DON'T CARE
50
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
READ WITH AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
t
CK
tCL
tCH
CLK
CKE
t
CKS tCKH
t
CMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
NOP
NOP
NOP
ACTIVE
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
tAH
COLUMN m(2)
A0-A9, A11
A10
ROW
ROW
ROW
BANK
AS
tAH
ENABLE AUTO PRECHARGE
ROW
AS
tAH
BA0, BA1
DQ
BANK
BANK
t
AC
t
AC
t
AC
t
AC
tHZ
DOUT
m
D
OUT m+1
D
OUT m+2
D
OUT m+3
t
LZ
tOH
tOH
t
OH
tOH
t
t
t
RCD
RAS
RC
CAS Latency
DON'T CARE
UNDEFINED
t
RP
Notes:
1) CAS latency = 2, Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
51
09/11/2019
IS42/45S81600F, IS42/45S16800F
READ WITHOUT AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
tCK
t
CL
tCH
CLK
CKE
t
CKS tCKH
t
CMS tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
NOP
PRECHARGE
ALL BANKS
NOP
ACTIVE
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
tAH
COLUMN m(2)
A0-A9, A11
A10
ROW
ROW
ROW
BANK
AS
tAH
ROW
AS
tAH
DISABLE AUTO PRECHARGE
SINGLE BANK
BANK
BA0, BA1
DQ
BANK
BANK
t
AC
t
AC
t
AC
t
AC
tHZ
DOUT
m
DOUT m+1
D
OUT m+2
DOUT m+3
t
LZ
tOH
t
OH
tOH
tOH
tRCD
tRAS
t
RC
CAS Latency
DON'T CARE
UNDEFINED
tRP
Notes:
1) CAS latency = 2, Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
52
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
SINGLE READ WITH AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
tCK
tCL
tCH
CLK
CKE
tCKS tCKH
tCMS
tCMH
COMMAND
ACTIVE
NOP
NOP
NOP
READ
NOP
NOP
ACTIVE
NOP
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
tAH
COLUMN m(2)
A0-A9, A11
A10
ROW
ROW
ROW
BANK
AS
tAH
ENABLE AUTO PRECHARGE
ROW
AS
tAH
BA0, BA1
BANK
BANK
tOH
t
AC
DOUT m
DQ
tHZ
DON'T CARE
UNDEFINED
tRCD
tRAS
t
RC
CAS Latency
tRP
Notes:
1) CAS latency = 2, Burst Length = 1
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
53
09/11/2019
IS42/45S81600F, IS42/45S16800F
SINGLE READ WITHOUT AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
tCK
t
CL
tCH
CLK
CKE
t
CKS CKH
t
t
CMS
tCMH
COMMAND
ACTIVE
NOP
READ
NOP
NOP
PRECHARGE
NOP
ACTIVE
NOP
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
t
AH
COLUMN m(2)
A0-A9, A11
A10
ROW
ROW
ROW
BANK
AS
tAH
ALL BANKS
ROW
SINGLE BANK
BANK
AS
tAH
DISABLE AUTO PRECHARGE
BA0, BA1
DQ
BANK
BANK
t
OH
t
AC
D
OUT
m
t
LZ
tHZ
DON'T CARE
UNDEFINED
t
t
t
RCD
RAS
RC
CAS Latency
tRP
Notes:
1) CAS latency = 2, Burst Length = 1
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
54
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE - WITH AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
T9
t
CK
tCL
tCH
CLK
CKE
t
CKS tCKH
tCMS
tCMH
COMMAND
ACTIVE
NOP
WRITE
NOP
NOP
NOP
NOP
NOP
NOP
ACTIVE
t
CMS tCMH
DQM/DQML
DQMH
t
t
t
AS
tAH
COLUMN m(2)
ROW
ROW
BANK
A0-A9, A11
A10
ROW
AS
tAH
ENABLE AUTO PRECHARGE
ROW
AS
tAH
BA0, BA1
BANK
BANK
tDS
t
DH
t
DS
t
DH
t
DS
tDH
t
DS
tDH
DQ
DIN
m
D
IN m+
1
D
IN m+
2
D
IN m+3
tRCD
tRAS
t
RC
tDPL
tRP
DON'T CARE
Notes:
1) Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
55
09/11/2019
IS42/45S81600F, IS42/45S16800F
WRITE - WITHOUT AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
t
CK
tCL
tCH
CLK
CKE
t
CKS CKH
t
tCMS
t
CMH
COMMAND
ACTIVE
NOP
WRITE
NOP
NOP
NOP
PRECHARGE
NOP
ACTIVE
t
CMS
t
CMH
DQM/DQML
DQMH
t
t
t
AS
t
AH
COLUMN m(2)
ROW
ROW
BANK
A0-A9, A11
A10
ROW
AS
tAH
ALL BANKS
ROW
AS
tAH
SINGLE BANK
BANK
DISABLE AUTO PRECHARGE
BANK
BA0, BA1
BANK
tDS
t
DH
tDS
t
DH
tDS
t
DH
tDS
t
DH
DQ
DIN
m
D
IN m+
1
D
IN m+
2
D
IN m+3
t
t
t
RCD
RAS
RC
t
DPL(3)
tRP
DON'T CARE
Notes:
1) Burst Length = 4
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
3) tꢃꢌꢂ must not be violated.
56
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
SINGLE WRITE - WITH AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
T9
tCK
t
CL
tCH
CLK
CKE
t
CKS tCKH
t
CMS tCMH
ACTIVE
NOP
NOP
NOP
WRITE
NOP
NOP
NOP
ACTIVE
NOP
COMMAND
tCMS tCMH
DQM/DQML, DQMH
t
t
t
AS
tAH
A0-A9, A11
A10
COLUMN m(2)
ROW
ROW
BANK
ROW
AS
t
AH
ENABLE AUTO PRECHARGE
ROW
AS
t
AH
BA0, BA1
BANK
BANK
tDS
t
DH
DQ
D
IN
m
t
t
t
RCD
RAS
RC
t
DPL
tRP
DON'T CARE
Notes:
1) Burst Length = 1
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
57
09/11/2019
IS42/45S81600F, IS42/45S16800F
SINGLE WRITE - WITHOUT AUTO PRECHARGE
T0
T1
T2
T3
T4
T5
T6
T7
T8
tCK
tCL
tCH
CLK
CKE
tCKS tCKH
tCMS tCMH
COMMAND
ACTIVE
NOP
WRITE
NOP
NOP
PRECHARGE
NOP
ACTIVE
NOP
tCMS tCMH
DQM/DQML
DQMH
tAS tAH
COLUMN m(2)
A0-A9, A11
A10
ROW
ROW
ROW
BANK
tAS tAH
DISABLE AUTO PRECHARGE
ALL BANKS
ROW
SINGLE BANK
tAS tAH
BA0, BA1
BANK
BANK
BANK
tDS tDH
DQ
DIN m
tRCD
tDPL(3)
tRP
tRAS
tRC
DON'T CARE
Notes:
1) Burst Length = 1
2) x16: A9 and A11 = "Don't Care"
x8: A11 = "Don't Care"
3) tꢃꢌꢂ must not be violated.
58
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
ORDERING INFORMATION - Vꢀꢀ = 3.3V
Commercial Range: 0°C to +70°C
Frequency
200 MHz
166 MHz
143 MHz
Speed (ns) Order Part No.
Package
5
6
7
IS42S81600F-5TL
IS42S81600F-6TL
IS42S81600F-7TL
54-Pin TSOPII, Lead-free
54-Pin TSOPII, Lead-free
54-Pin TSOPII, Lead-free
Frequency
Speed (ns) Order Part No.
Package
200 MHz
5
6
7
IS42S16800F-5TL
IS42S16800F-5BL
54-Pin TSOPII, Lead-free
54-ball BGA, Lead-free
166 MHz
143 MHz
IS42S16800F-6TL
IS42S16800F-6BL
54-Pin TSOPII, Lead-free
54-ball BGA, Lead-free
IS42S16800F-7TL
IS42S16800F-7BL
54-Pin TSOPII, Lead-free
54-ball BGA, Lead-free
Industrial Range: -40°C to +85°C
Frequency
200 MHz
166 MHz
143 MHz
Speed (ns) Order Part No.
Package
5
6
7
IS42S81600F-5TLI
IS42S81600F-6TLI
IS42S81600F-7TLI
54-Pin TSOPII, Lead-free
54-Pin TSOPII, Lead-free
54-Pin TSOPII, Lead-free
Frequency
Speed (ns) Order Part No.
Package
200 MHz
5
6
7
IS42S16800F-5TLI
IS42S16800F-5BLI
54-Pin TSOPII, Lead-free
54-ball BGA, Lead-free
166 MHz
143 MHz
IS42S16800F-6TLI
IS42S16800F-6BLI
54-Pin TSOPII, Lead-free
54-ball BGA, Lead-free
IS42S16800F-7TLI
IS42S16800F-7BLI
54-Pin TSOPII, Lead-free
54-ball BGA, Lead-free
*Contact ISSI for Leaded parts support.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
59
09/11/2019
IS42/45S81600F, IS42/45S16800F
ORDERING INFORMATION - Vꢀꢀ = 3.3V
Automotive Range A1: -40°C to +85°C
Frequency Speed (ns) Order Part No.
Package
166 MHz
143 MHz
6
7
IS45S81600F-6TLA1
IS45S81600F-7TLA1
IS45S81600F-7CTLA1
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
54-pin TSOPII, Cu leadframe plated with matte Sn
Frequency Speed (ns) Order Part No.
Package
166 MHz
6
IS45S16800F-6TLA1
IS45S16800F-6CTLA1
IS45S16800F-6BLA1
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
54-pin TSOPII, Cu leadframe plated with matte Sn
54-ball BGA, SnAgCu balls
143 MHz
7
IS45S16800F-7TLA1
IS45S16800F-7CTLA1
IS45S16800F-7BLA1
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
54-pin TSOPII, Cu leadframe plated with matte Sn
54-ball BGA, SnAgCu balls
Automotive Range A2: -40°C to +105°C
Frequency Speed (ns) Order Part No.
Package
143 MHz
7
IS45S81600F-7TLA2
IS45S81600F-7CTLA2
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
54-pin TSOPII, Cu leadframe plated with matte Sn
Frequency Speed (ns) Order Part No.
Package
166 MHz
143 MHz
6
7
IS45S16800F-6TLA2
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
IS45S16800F-7TLA2
IS45S16800F-7CTLA2
IS45S16800F-7BLA2
54-pin TSOPII, Alloy42 leadframe plated with matte Sn
54-pin TSOPII, Cu leadframe plated with matte Sn
54-ball BGA, SnAgCu balls
Notes:
1. Contact ISSI for Leaded and Copper lead frame parts support.
2. Part numbers with "L" are leadfree, and RoHS compliant.
60
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
IS42/45S81600F, IS42/45S16800F
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
61
09/11/2019
IS42/45S81600F, IS42/45S16800F
62
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D1
09/11/2019
相关型号:
IS45S16800F-7BLA2
Synchronous DRAM, 8MX16, 5.4ns, CMOS, PBGA54, 8 X 8 MM, 0.80 MM PITCH, LEAD FREE, TFBGA-54
ISSI
IS45S16800F-7TLA1
Synchronous DRAM, 8MX16, 5.4ns, CMOS, PDSO54, 0.400 INCH, LEAD FREE, TSOP2-54
ISSI
©2020 ICPDF网 联系我们和版权申明