IS61C3216-10KI [ISSI]
Standard SRAM, 64KX8, 10ns, CMOS, PDSO44, 0.400 INCH, PLASTIC, SOJ-44;
| 型号： | IS61C3216-10KI |
| 厂家： | 
INTEGRATED SILICON SOLUTION, INC |
| 描述： | Standard SRAM, 64KX8, 10ns, CMOS, PDSO44, 0.400 INCH, PLASTIC, SOJ-44 内存集成电路 静态存储器 光电二极管 |
| 文件： | 总3页 (文件大小：53K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
OS-CON DATA SHEET
No.OS02N-DFSVP051
OS-CON 6SVP470M
Frequency (kHz)
Impedance (ohm)
ESR (ohm)
0.12
2.824
0.084
0.5
0.691
0.044
1
0.353
0.037
10
0.046
0.017
100
0.010
0.009
500
0.013
0.009
1000
0.024
0.009
5000
0.103
0.022
10000
0.230
0.024
Frequency characteristics
1000
100
10
Impedance (ohm)
ESR (ohm)
1
0.1
0.01
0.001
0.1
1
10
100
1000
10000
Frequency (kHz)
Measureing equipment: HP4194A
Test fixture: HP16047C
Measuring position: root of leads
OS Engineering Department, OS-CON Control Department
Saga SANYO Industries Co., Ltd.
n = 3p.(Ave.)
Room temperature
OS-CON DATA SHEET
SVP series
Test item
Endurance
Test temperature
105 deg.C
Model
6SVP470M
130106406
(After V.P.S test)
Applied voltage
6.3V
Lot No.
Tangent of loss angle (120Hz)
Change in capacitance (120Hz)
0.15
0.14
0.13
0.12
0.11
0.1
20
10
0
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
-10
-20
-30
-40
0
2000
0
2000
Time[h]
Time[h]
Leakage current (6.3V 60s)
ESR (100kHz)
100
90
80
70
60
50
40
30
20
10
0
10000
1000
100
10
1
0.1
0.01
0
2000
0
2000
Time[h]
Time[h]
Note:
n =30p.
V.P.S test conditions : 230deg.C×75s×2times
(V.P.S=Vapor Phase Soldering method)
Start on September 10, 2001
End on December 2, 2001
Executed by R. Kawachino
Drawn by S. Yoshino
No.OS02D-DESVP051
OS Engineering Departmaent, OS-CON Control Department, Saga SANYO Industries Co., Ltd.
OS-CON DATA SHEET
SVP series
Test item
Damp heat (Steady state)
(After V.P.S test)
Test temperature
60 deg.C
Model
6SVP470M
060202471
Test humidity
90% RH
Lot No.
Change in capacitance (120Hz)
Tangent of loss angle (120Hz)
0.15
0.14
0.13
0.12
0.11
0.1
20
10
0
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
-10
-20
-30
-40
0
1000
0
1000
Time[h]
Time[h]
Leakage current (6.3V 60s)
ESR (100kHz)
100
90
80
70
60
50
40
30
20
10
0
10000
1000
100
10
1
0.1
0.01
0
1000
0
1000
Time[h]
Time[h]
Note:
n =20p.
V.P.S test conditions : 230deg.C×75s×2times
(V.P.S = Vapor Phase Soldering method)
Start on November 7, 2001
End on December 20, 2001
Executed by R. Kawachino
Drawn by M. Kimura
No.OS02D-DHSVP051
OS Engineering Department, OS-CON Control Department, Saga SANYO Industries Co., Ltd.
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