IS61LPS102418A-200B3I [ISSI]

256K x 72, 512K x 36, 1024K x 18 18Mb SYNCHRONOUS PIPELINED, SINGLE CYCLE DESELECT STATIC RAM; 256K X 72 , 512K ×36 , 1024K ×18 18MB同步流水式,单曲循环DESELECT静态RAM
IS61LPS102418A-200B3I
型号: IS61LPS102418A-200B3I
厂家: INTEGRATED SILICON SOLUTION, INC    INTEGRATED SILICON SOLUTION, INC
描述:

256K x 72, 512K x 36, 1024K x 18 18Mb SYNCHRONOUS PIPELINED, SINGLE CYCLE DESELECT STATIC RAM
256K X 72 , 512K ×36 , 1024K ×18 18MB同步流水式,单曲循环DESELECT静态RAM

存储 内存集成电路 静态存储器
文件: 总34页 (文件大小:220K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IS61VPS25672A IS61LPS25672A  
IS61VPS51236A IS61LPS51236A  
IS61VPS102418A IS61LPS102418A  
®
ISSI  
256K x 72, 512K x 36, 1024K x 18  
18Mb SYNCHRONOUS PIPELINED,  
SINGLE CYCLE DESELECT STATIC RAM  
FEBRUARY 2005  
DESCRIPTION  
FEATURES  
The ISSIIS61LPS/VPS51236A,IS61LPS/VPS102418A,  
andIS61LPS/VPS25672Aarehigh-speed,low-powersyn-  
chronous staticRAMs designedtoprovideburstable, high-  
performance memory for communication and networking  
applications. The IS61LPS/VPS51236A is organized as  
524,288 words by 36 bits, the IS61LPS/VPS102418A is  
organizedas1,048,576wordsby18bits,andtheIS61LPS/  
VPS25672A is organized as 262,144 words by 72 bits.  
Fabricated with ISSI's advanced CMOS technology, the  
deviceintegratesa2-bitburstcounter,high-speedSRAM  
core,andhigh-drivecapabilityoutputsintoasinglemono-  
lithic circuit. All synchronous inputs pass through regis-  
ters controlled by a positive-edge-triggered single clock  
input.  
• Internal self-timed write cycle  
• Individual Byte Write Control and Global Write  
• Clock controlled, registered address, data and  
control  
• Burst sequence control using MODE input  
• Three chip enable option for simple depth  
expansion and address pipelining  
• Common data inputs and data outputs  
• Auto Power-down during deselect  
• Single cycle deselect  
Write cycles are internally self-timed and are initiated by  
therisingedgeoftheclockinput. Writecyclescanbeone  
tofourbyteswideascontrolledbythewritecontrolinputs.  
• Snooze MODE for reduced-power standby  
• JTAG Boundary Scan for PBGA package  
• Power Supply  
Separatebyteenablesallowindividualbytestobewritten.  
The byte write operation is performed by using the byte  
write enable (BWE) input combined with one or more  
individual byte write signals (BWx). In addition, Global  
Write (GW) is available for writing all bytes at one time,  
regardless of the byte write controls.  
LPS: VDD 3.3V + 5%, VDDQ 3.3V/2.5V + 5%  
VPS: VDD 2.5V + 5%, VDDQ 2.5V + 5%  
• JEDEC 100-Pin TQFP, 119-ball PBGA, 165-ball  
PBGA, and 209-ball (x72) packages  
Bursts can be initiated with either ADSP (Address Status  
Processor) or ADSC (Address Status Cache Controller)  
inputpins.Subsequentburstaddressescanbegenerated  
internally and controlled by the ADV (burst address  
advance) input pin.  
• Lead-free available  
The mode pin is used to select the burst sequence order,  
Linear burst is achieved when this pin is tied LOW.  
Interleave burst is achieved when this pin is tied HIGH or  
left floating.  
FAST ACCESS TIME  
Symbol  
tKQ  
Parameter  
250  
2.6  
4
200  
3.1  
5
Units  
ns  
Clock Access Time  
Cycle Time  
tKC  
ns  
Frequency  
250  
200  
MHz  
Copyright © 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability  
arisingoutoftheapplicationoruseofanyinformation, productsorservicesdescribedherein. Customersareadvisedtoobtainthelatestversionofthisdevicespecificationbeforerelyingonany  
publishedinformationandbeforeplacingordersforproducts.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
1
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
BLOCK DIAGRAM  
MODE  
A0'  
Q0  
A0  
CLK  
CLK  
BINARY  
COUNTER  
Q1  
CE  
A1'  
ADV  
A1  
256Kx72;  
512Kx36;  
ADSC  
ADSP  
CLR  
1024Kx18  
MEMORY ARRAY  
19/20  
17/18  
19/20  
D
Q
A
ADDRESS  
REGISTER  
CE  
CLK  
36,  
or 18  
or 72  
36,  
or 18  
or 72  
D
Q
GW  
BWE  
DQ(a-h)  
BYTE WRITE  
REGISTERS  
BW(a-h)  
x18: a,b  
x36: a-d  
x72: a-h  
CLK  
36,  
or 18  
or 72  
CE  
CE2  
CE2  
2/4/8  
INPUT  
REGISTERS  
OUTPUT  
REGISTERS  
D
Q
DQa - DQd  
ENABLE  
OE  
REGISTER  
CLK  
CLK  
CE  
CLK  
D
Q
ENABLE  
DELAY  
REGISTER  
CLK  
OE  
2
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
165-PIN BGA  
119-PIN BGA  
119-Ball, 14x22 mm BGA  
165-Ball, 13x15 mm BGA  
1mm Ball Pitch, 7x17 Ball Array  
1mm Ball Pitch, 11x15 Ball Array  
BOTTOM VIEW  
BOTTOM VIEW  
209-BALL BGA  
209-Ball, 14 mm x 22 mm BGA  
1 mm Ball Pitch, 11 x 19 Ball Array  
BOTTOM VIEW  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
3
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
PIN CONFIGURATION — 256K X 72, 209-Ball PBGA (TOP VIEW)  
1
2
3
4
5
6
7
8
9
10  
11  
A
B
C
D
E
F
DQg  
DQg  
DQg  
DQg  
DQPg  
DQc  
DQc  
DQc  
DQc  
NC  
DQg  
DQg  
DQg  
DQg  
DQPc  
DQc  
DQc  
DQc  
DQc  
NC  
A
CE2  
BWg  
BWd  
NC  
ADSP  
NC  
ADSC  
BWE  
CE  
ADV  
A
CE2  
BWb  
BWe  
NC  
A
DQb  
DQb  
DQb  
DQb  
DQPf  
DQf  
DQb  
DQb  
DQb  
DQb  
DQPb  
DQf  
BWc  
BWh  
VSS  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
CLK  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
VSS  
NC  
BWf  
BWa  
VSS  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
NC  
NC  
NC  
NC  
OE  
VDD  
NC  
GW  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
NC  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
NC  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
NC  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
NC  
G
H
J
NC  
DQf  
DQf  
NC  
DQf  
DQf  
NC  
DQf  
DQf  
K
L
NC  
NC  
NC  
DQh  
DQh  
DQh  
DQh  
DQPd  
DQd  
DQd  
DQd  
DQd  
DQh  
DQh  
DQh  
DQh  
DQPh  
DQd  
DQd  
DQd  
DQd  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
NC  
NC  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
NC  
VDDQ  
VSS  
VDDQ  
VSS  
VDDQ  
VSS  
NC  
DQa  
DQa  
DQa  
DQa  
DQPa  
DQe  
DQe  
DQe  
DQe  
DQa  
DQa  
DQa  
DQa  
DQPe  
DQe  
DQe  
DQe  
DQe  
M
N
P
R
T
NC  
NC  
ZZ  
VDD  
MODE  
A
U
V
W
A
A
A
A
A
A
A
A1  
A
A
A
TMS  
TDI  
A
A0  
A
TDO  
TCK  
11 x 19 Ball BGA—14 x 22 mm2 Body—1 mm Ball Pitch  
PIN DESCRIPTIONS  
Symbol  
A
Pin Name  
Symbol  
Pin Name  
Address Inputs  
BWE  
Byte Write Enable  
A0, A1  
ADV  
Synchronous Burst Address Inputs  
OE  
OutputEnable  
Synchronous Burst Address  
Advance  
ZZ  
PowerSleepMode  
MODE  
Burst Sequence Selection  
JTAG Pins  
ADSP  
Address Status Processor  
Address Status Controller  
GlobalWriteEnable  
TCK, TDO  
TMS, TDI  
ADSC  
GW  
NC  
NoConnect  
CLK  
SynchronousClock  
DQx  
DQPx  
VDD  
DataInputs/Outputs  
DataInputs/Outputs  
3.3V/2.5V Power Supply  
CE, CE2, CE2  
Synchronous Chip Select  
BWx (x=a,b,c,d Synchronous Byte Write  
e,f,g,h) Controls  
VDDQ  
Isolated Output Power Supply  
3.3V/2.5V  
Vss  
Ground  
4
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
119 BGA PACKAGE PIN CONFIGURATION-512K X 36 (TOP VIEW)  
1
2
A
3
A
4
ADSP  
ADSC  
VDD  
NC  
5
6
A
7
A
B
C
D
E
F
VDDQ  
NC  
A
VDDQ  
NC  
A
A
A
A
NC  
A
A
A
A
NC  
DQc  
DQc  
VDDQ  
DQc  
DQc  
VDDQ  
DQd  
DQd  
VDDQ  
DQd  
DQd  
NC  
DQPc  
DQc  
DQc  
DQc  
DQc  
VDD  
DQd  
DQd  
DQd  
DQd  
DQPd  
A
Vss  
Vss  
Vss  
BWc  
Vss  
NC  
Vss  
Vss  
Vss  
BWb  
Vss  
NC  
DQPb  
DQb  
DQb  
DQb  
DQb  
VDD  
DQa  
DQa  
DQa  
DQa  
DQPa  
A
DQb  
DQb  
VDDQ  
DQb  
DQb  
VDDQ  
DQa  
DQa  
VDDQ  
DQa  
DQa  
NC  
CE  
OE  
G
H
J
ADV  
GW  
VDD  
CLK  
NC  
K
L
Vss  
BWd  
Vss  
Vss  
Vss  
MODE  
A
Vss  
BWa  
Vss  
Vss  
Vss  
NC  
M
N
P
R
T
BWE  
A1*  
A0*  
VDD  
A
NC  
NC  
A
NC  
ZZ  
U
VDDQ  
TMS  
TDI  
TCK  
TDO  
NC  
VDDQ  
Note: * A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired.  
PIN DESCRIPTIONS  
Symbol  
A
Pin Name  
Symbol  
OE  
Pin Name  
Address Inputs  
Output Enable  
Power Sleep Mode  
A0, A1  
ADV  
Synchronous Burst Address Inputs  
ZZ  
Synchronous Burst Address  
Advance  
MODE  
TCK, TDO  
TMS, TDI  
NC  
Burst Sequence Selection  
JTAG Pins  
ADSP  
ADSC  
GW  
Address Status Processor  
Address Status Controller  
GlobalWriteEnable  
No Connect  
DQa-DQd  
DQPa-Pd  
VDD  
Data Inputs/Outputs  
Output Power Supply  
Power Supply  
CLK  
CE  
SynchronousClock  
Synchronous Chip Select  
BWx (x=a-d) Synchronous Byte Write Controls  
BWE Byte Write Enable  
VDDQ  
Output Power Supply  
Vss  
Ground  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
5
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
119 BGA PACKAGE PIN CONFIGURATION  
1MX18 (TOP VIEW)  
1
2
A
3
A
4
ADSP  
ADSC  
VDD  
NC  
5
A
6
A
7
VDDQ  
NC  
A
B
C
D
E
F
VDDQ  
NC  
A
A
A
A
NC  
A
A
A
A
NC  
DQb  
NC  
NC  
DQb  
NC  
DQb  
NC  
VDD  
DQb  
NC  
DQb  
NC  
DQPb  
A
Vss  
Vss  
Vss  
BWb  
Vss  
NC  
Vss  
Vss  
Vss  
Vss  
Vss  
NC  
Vss  
BWa  
Vss  
Vss  
Vss  
NC  
A
DQPa  
NC  
DQa  
NC  
DQa  
VDD  
NC  
DQa  
NC  
DQa  
NC  
A
NC  
CE  
DQa  
VDDQ  
DQa  
NC  
VDDQ  
NC  
OE  
G
H
J
ADV  
GW  
VDD  
CLK  
NC  
DQb  
VDDQ  
NC  
VDDQ  
DQa  
NC  
K
L
Vss  
Vss  
Vss  
Vss  
Vss  
MODE  
A
DQb  
VDDQ  
DQb  
NC  
M
N
P
R
T
BWE  
A1*  
VDDQ  
NC  
A0*  
DQa  
NC  
NC  
VDD  
NC  
NC  
A
A
ZZ  
U
VDDQ  
TMS  
TDI  
TCK  
TDO  
NC  
VDDQ  
Note: * A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired.  
PIN DESCRIPTIONS  
Symbol  
OE  
Pin Name  
Symbol  
A
Pin Name  
Address Inputs  
OutputEnable  
PowerSleepMode  
A0, A1  
ADV  
Synchronous Burst Address Inputs  
ZZ  
Synchronous Burst Address  
Advance  
MODE  
TCK, TDO  
TMS, TDI  
NC  
Burst Sequence Selection  
JTAG Pins  
ADSP  
ADSC  
GW  
Address Status Processor  
Address Status Controller  
GlobalWriteEnable  
NoConnect  
DQa-DQb  
DQPa-Pb  
VDD  
DataInputs/Outputs  
Output Power Supply  
PowerSupply  
CLK  
CE  
SynchronousClock  
Synchronous Chip Select  
BWx (x=a,b) Synchronous Byte Write Controls  
BWE Byte Write Enable  
VDDQ  
Output Power Supply  
Vss  
Ground  
6
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
165 PBGA PACKAGE PIN CONFIGURATION  
512K X 36 (TOP VIEW)  
1
2
3
4
5
6
7
8
9
10  
11  
A
B
C
D
E
F
NC  
A
CE  
BWc  
BWd  
Vss  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
Vss  
A
BWb  
BWa  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
NC  
CE2  
CLK  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
A
BWE  
GW  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
TDO  
TCK  
ADSC  
OE  
ADV  
ADSP  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
NC  
A
NC  
NC  
NC  
A
CE2  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
NC  
A
DQPc  
DQc  
DQc  
DQc  
DQc  
NC  
NC  
DQc  
DQc  
DQc  
DQc  
Vss  
DQd  
DQd  
DQd  
DQd  
NC  
NC  
NC  
Vss  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
Vss  
A
NC  
DQb  
DQb  
DQb  
DQb  
NC  
DQa  
DQa  
DQa  
DQa  
NC  
A
DQPb  
DQb  
DQb  
DQb  
DQb  
ZZ  
G
H
J
DQd  
DQd  
DQd  
DQd  
DQPd  
NC  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
A
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
A
DQa  
DQa  
DQa  
DQa  
DQPa  
A
K
L
M
N
P
R
TDI  
TMS  
A1*  
A0*  
MODE  
A
A
A
A
A
A
Note: * A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired.  
PIN DESCRIPTIONS  
Symbol  
A
Pin Name  
Symbol  
Pin Name  
Address Inputs  
BWE  
Byte Write Enable  
A0, A1  
ADV  
Synchronous Burst Address Inputs  
OE  
Output Enable  
Synchronous Burst Address  
Advance  
ZZ  
Power Sleep Mode  
Burst Sequence Selection  
JTAG Pins  
MODE  
ADSP  
Address Status Processor  
Address Status Controller  
GlobalWriteEnable  
TCK, TDO  
TMS, TDI  
ADSC  
GW  
NC  
No Connect  
CLK  
SynchronousClock  
DQx  
DQPx  
VDD  
Data Inputs/Outputs  
Data Inputs/Outputs  
3.3V/2.5V Power Supply  
CE, CE2, CE2  
Synchronous Chip Select  
BWx (x=a,b,c,d) Synchronous Byte Write  
Controls  
VDDQ  
Isolated Output Power Supply  
3.3V/2.5V  
Vss  
Ground  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
7
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
165 PBGA PACKAGE PIN CONFIGURATION  
1M X 18 (TOP VIEW)  
1
2
3
4
5
6
7
8
9
10  
11  
A
B
C
D
E
F
NC  
A
CE  
BWb  
NC  
Vss  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
Vss  
A
NC  
BWa  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
NC  
TDI  
TMS  
CE2  
CLK  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
A
BWE  
GW  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
Vss  
TDO  
TCK  
ADSC  
OE  
Vss  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
VDD  
Vss  
A
ADV  
ADSP  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
NC  
A
A
NC  
A
CE2  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
NC  
A
NC  
DQPa  
DQa  
DQa  
DQa  
DQa  
ZZ  
NC  
NC  
DQb  
DQb  
DQb  
DQb  
Vss  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
DQa  
DQa  
DQa  
DQa  
NC  
A
NC  
NC  
NC  
G
H
J
NC  
NC  
DQb  
DQb  
DQb  
DQb  
DQPb  
NC  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
A
VDDQ  
VDDQ  
VDDQ  
VDDQ  
VDDQ  
A
NC  
NC  
NC  
NC  
NC  
A
K
L
M
N
P
R
A1*  
A0*  
MODE  
A
A
A
A
A
A
Note: * A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired.  
PIN DESCRIPTIONS  
Symbol  
A
Pin Name  
Symbol  
Pin Name  
Address Inputs  
BWE  
Byte Write Enable  
A0, A1  
ADV  
Synchronous Burst Address Inputs  
OE  
Output Enable  
Synchronous Burst Address  
Advance  
ZZ  
Power Sleep Mode  
MODE  
Burst Sequence Selection  
JTAG Pins  
ADSP  
ADSC  
GW  
Address Status Processor  
Address Status Controller  
GlobalWriteEnable  
TCK, TDO  
TMS, TDI  
NC  
No Connect  
CLK  
SynchronousClock  
DQx  
DQPx  
VDD  
Data Inputs/Outputs  
Data Inputs/Outputs  
3.3V/2.5V Power Supply  
CE, CE2, CE2 Synchronous Chip Select  
BWx (x=a,b)  
Synchronous Byte Write  
Controls  
VDDQ  
Isolated Output Power Supply  
3.3V/2.5V  
Vss  
Ground  
8
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
PIN CONFIGURATION  
100-PIN TQFP  
99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81  
100  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
DQPb  
DQb  
DQb  
VDDQ  
VSS  
DQb  
DQb  
DQb  
DQb  
VSS  
VDDQ  
DQb  
DQb  
VSS  
NC  
DQPc  
DQc  
DQc  
VDDQ  
VSS  
DQc  
DQc  
DQc  
DQc  
VSS  
VDDQ  
DQc  
DQc  
NC  
VDD  
NC  
VDD  
ZZ  
VSS  
DQd  
DQd  
VDDQ  
VSS  
DQd  
DQd  
DQd  
DQd  
VSS  
VDDQ  
DQd  
DQd  
DQPd  
DQa  
DQa  
VDDQ  
VSS  
DQa  
DQa  
DQa  
DQa  
VSS  
VDDQ  
DQa  
DQa  
DQPa  
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
512K x 36  
PIN DESCRIPTIONS  
A0, A1  
Synchronous Address Inputs. These  
pins must tied to the two LSBs of the  
address bus.  
DQa-DQd  
DQPa-DQPd  
GW  
Synchronous Data Input/Output  
Parity Data Input/Output  
SynchronousGlobalWriteEnable  
Burst Sequence Mode Selection  
OutputEnable  
A
Synchronous Address Inputs  
MODE  
OE  
ADSC  
Synchronous Controller Address  
Status  
ADSP  
Synchronous Processor Address  
Status  
VDD  
3.3V/2.5V Power Supply  
VDDQ  
Isolated Output Buffer Supply:  
3.3V/2.5V  
ADV  
Synchronous Burst Address Advance  
Synchronous Byte Write Enable  
Synchronous Byte Write Enable  
BWa-BWd  
BWE  
Vss  
ZZ  
Ground  
Snooze Enable  
CE, CE2, CE2 SynchronousChipEnable  
CLK SynchronousClock  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
9
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
PIN CONFIGURATION  
100-PIN TQFP  
99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81  
100  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
A
NC  
NC  
VDDQ  
VSS  
NC  
DQPa  
DQa  
DQa  
VSS  
VDDQ  
DQa  
DQa  
VSS  
NC  
NC  
NC  
NC  
VDDQ  
VSS  
NC  
NC  
DQb  
DQb  
VSS  
VDDQ  
DQb  
DQb  
NC  
VDD  
NC  
VDD  
ZZ  
VSS  
DQb  
DQb  
VDDQ  
VSS  
DQb  
DQb  
DQPb  
NC  
VSS  
VDDQ  
NC  
NC  
NC  
DQa  
DQa  
VDDQ  
VSS  
DQa  
DQa  
NC  
NC  
VSS  
VDDQ  
NC  
NC  
NC  
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
1024K x 18  
PIN DESCRIPTIONS  
A0, A1  
Synchronous Address Inputs. These  
pins must tied to the two LSBs of the  
address bus.  
DQPa-DQPb Parity Data I/O; DQPa is parity for  
DQa1-8; DQPb is parity for DQb1-8  
GW  
Synchronous Global Write Enable  
Burst Sequence Mode Selection  
OutputEnable  
A
Synchronous Address Inputs  
MODE  
OE  
ADSC  
ADSP  
ADV  
SynchronousControllerAddressStatus  
SynchronousProcessorAddressStatus  
SynchronousBurstAddressAdvance  
Synchronous Byte Write Enable  
Synchronous Byte Write Enable  
VDD  
3.3V/2.5V Power Supply  
VDDQ  
Isolated Output Buffer Supply:  
3.3V/2.5V  
BWa-BWb  
BWE  
Vss  
ZZ  
Ground  
CE, CE2, CE2 Synchronous Chip Enable  
Snooze Enable  
CLK  
Synchronous Clock  
DQa-DQb  
SynchronousDataInput/Output  
10  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
TRUTH TABLE(1-8) (3CE option)  
OPERATION  
ADDRESS  
None  
CE  
H
L
CE2  
X
X
H
X
H
X
L
CE2  
X
L
ZZ  
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
ADSP ADSC ADV WRITE  
OE  
X
X
X
X
X
X
L
CLK  
L-H  
L-H  
L-H  
L-H  
L-H  
X
DQ  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
Q
Deselect Cycle, Power-Down  
Deselect Cycle, Power-Down  
Deselect Cycle, Power-Down  
Deselect Cycle, Power-Down  
Deselect Cycle, Power-Down  
Snooze Mode, Power-Down  
Read Cycle, Begin Burst  
Read Cycle, Begin Burst  
Write Cycle, Begin Burst  
X
L
L
X
X
L
X
X
X
X
X
X
X
X
X
X
X
L
X
X
X
X
X
X
X
X
L
None  
None  
L
X
L
L
None  
L
H
H
X
L
None  
L
X
X
H
H
H
H
H
X
X
X
X
X
X
X
X
X
X
X
X
L
None  
X
L
X
X
X
L
External  
External  
External  
External  
External  
Next  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L
L
L
H
X
L
High-Z  
D
L
L
H
H
H
H
H
X
X
H
X
H
H
X
X
H
X
Read Cycle, Begin Burst  
Read Cycle, Begin Burst  
Read Cycle, Continue Burst  
Read Cycle, Continue Burst  
Read Cycle, Continue Burst  
Read Cycle, Continue Burst  
Write Cycle, Continue Burst  
Write Cycle, Continue Burst  
Read Cycle, Suspend Burst  
Read Cycle, Suspend Burst  
Read Cycle, Suspend Burst  
Read Cycle, Suspend Burst  
L
L
L
H
H
H
H
H
H
L
Q
L
L
L
H
L
High-Z  
Q
X
X
H
H
X
H
X
X
H
H
X
H
X
X
X
X
X
X
X
X
X
X
X
X
H
H
H
H
H
H
H
H
H
H
H
H
Next  
L
H
L
High-Z  
Q
Next  
L
Next  
L
H
X
X
L
High-Z  
D
Next  
L
Next  
L
L
D
Current  
Current  
Current  
Current  
Current  
Current  
H
H
H
H
H
H
H
H
H
H
L
Q
H
L
High-Z  
Q
H
X
X
High-Z  
D
Write Cycle, Suspend Burst  
Write Cycle, Suspend Burst  
NOTE:  
L
D
1. X means “Don’t Care.” H means logic HIGH. L means logic LOW.  
2. For WRITE, L means one or more byte write enable signals (BWa-h) and BWE are LOW or GW is LOW. WRITE = H for all  
BWx, BWE, GW HIGH.  
3. BWa enables WRITEs to DQa’s and DQPa. BWb enables WRITEs to DQb’s and DQPb. BWc enables WRITEs to DQc’s and  
DQPc. BWd enables WRITEs to DQd’s and DQPd. BWe enables WRITEs to DQe’s and DQPe. BWf enables WRITEs to DQf’s  
and DQPf. BWg enables WRITEs to DQg’s and DQPg. BWh enables WRITEs to DQh’s and DQPh. DQPa-DQPh are avail-  
able on the x72 version. DQPa and DQPb are available on the x18 version. DQPa-DQPd are available on the x36 version.  
4. All inputs except OE and ZZ must meet setup and hold times around the rising edge (LOW to HIGH) of CLK.  
5. Wait states are inserted by suspending burst.  
6. For a WRITE operation following a READ operation, OE must be HIGH before the input data setup time and held HIGH during the  
inputdataholdtime.  
7. This device contains circuitry that will ensure the outputs will be in High-Z during power-up.  
8. ADSP LOW always initiates an internal READ at the L-H edge of CLK. A WRITE is performed by setting one or more byte write  
enable signals and BWE LOW or GW LOW for the subsequent L-H edge of CLK. See WRITE timing diagram for clarification.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
11  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
TRUTH TABLE(1-8) (1CE option)  
NEXT CYCLE  
ADDRESS CE  
ADSP ADSC  
ADV  
X
X
X
X
X
X
L
WRITE  
X
OE  
DQ  
High-Z  
Q
Deselected  
None  
External  
External  
External  
External  
External  
Next  
H
L
X
L
L
X
X
L
X
L
Read, Begin Burst  
Read, Begin Burst  
Write, Begin Burst  
Read, Begin Burst  
Read, Begin Burst  
Read,ContinueBurst  
Read,ContinueBurst  
Read,ContinueBurst  
Read,ContinueBurst  
Write, Continue Burst  
Write, Continue Burst  
Read, Suspend Burst  
Read, Suspend Burst  
Read, Suspend Burst  
Read, Suspend Burst  
Write, Suspend Burst  
X
L
L
X
H
X
L
High-Z  
D
L
H
H
H
H
H
X
X
H
X
H
H
X
X
H
X
L
L
L
H
H
H
H
H
H
L
Q
L
L
H
L
High-Z  
Q
X
X
H
H
X
H
X
X
H
H
X
H
H
H
H
H
H
H
H
H
H
H
H
H
Next  
L
H
L
High-Z  
Q
Next  
L
Next  
L
H
X
X
L
High-Z  
D
Next  
L
Next  
L
L
D
Current  
Current  
Current  
Current  
Current  
Current  
H
H
H
H
H
H
H
H
H
H
L
Q
H
L
High-Z  
Q
H
X
X
High-Z  
D
Write, Suspend Burst  
L
D
NOTE:  
1. X means “Don’t Care.” H means logic HIGH. L means logic LOW.  
2. For WRITE, L means one or more byte write enable signals (BWa-h) and BWE are LOW or GW is LOW. WRITE = H for all  
BWx, BWE, GW HIGH.  
3. BWa enables WRITEs to DQa’s and DQPa. BWb enables WRITEs to DQb’s and DQPb. BWc enables WRITEs to DQc’s and  
DQPc. BWd enables WRITEs to DQd’s and DQPd. BWe enables WRITEs to DQe’s and DQPe. BWf enables WRITEs to DQf’s  
and DQPf. BWg enables WRITEs to DQg’s and DQPg. BWh enables WRITEs to DQh’s and DQPh. DQPa-DQPh are avail-  
able on the x72 version. DQPa and DQPb are available on the x18 version. DQPa-DQPd are available on the x36 version.  
4. All inputs except OE and ZZ must meet setup and hold times around the rising edge (LOW to HIGH) of CLK.  
5. Wait states are inserted by suspending burst.  
6. For a WRITE operation following a READ operation, OE must be HIGH before the input data setup time and held HIGH during the  
inputdataholdtime.  
7. This device contains circuitry that will ensure the outputs will be in High-Z during power-up.  
8. ADSP LOW always initiates an internal READ at the L-H edge of CLK. A WRITE is performed by setting one or more byte write  
enable signals and BWE LOW or GW LOW for the subsequent L-H edge of CLK. See WRITE timing diagram for clarification.  
PARTIAL TRUTH TABLE  
Function  
GW  
BWE  
BWa  
BWb  
BWc  
BWd  
BWe  
BWf  
BWg  
BWh  
Read  
H
H
H
H
L
H
L
L
L
X
X
H
L
X
H
H
L
X
H
H
L
X
H
H
L
X
H
H
L
X
H
H
L
X
H
H
L
X
H
H
L
Read  
Write Byte 1  
Write All Bytes  
Write All Bytes  
L
X
X
X
X
X
X
X
X
12  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
INTERLEAVED BURST ADDRESS TABLE (MODE = VDD or No Connect)  
External Address  
A1 A0  
1st Burst Address  
A1 A0  
2nd Burst Address  
A1 A0  
3rd Burst Address  
A1 A0  
00  
01  
10  
11  
01  
00  
11  
10  
10  
11  
00  
01  
11  
10  
01  
00  
LINEAR BURST ADDRESS TABLE (MODE = VSS)  
0,0  
A1', A0' = 1,1  
0,1  
1,0  
ABSOLUTE MAXIMUM RATINGS(1)  
Symbol Parameter  
Value  
Unit  
°C  
W
TSTG  
PD  
Storage Temperature  
Power Dissipation  
–55 to +150  
1.6  
IOUT  
Output Current (per I/O)  
100  
mA  
V
VIN, VOUT Voltage Relative to Vss for I/O Pins  
–0.5 to VDDQ + 0.5  
–0.5 to VDD + 0.5  
VIN  
Voltage Relative to Vss for  
V
for Address and Control Inputs  
VDD  
Voltage on VDD Supply Relative to Vss  
–0.5 to 4.6  
V
Notes:  
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause perma-  
nentdamagetothedevice. Thisisastressratingonlyandfunctionaloperationofthedeviceat  
these or any other conditions above those indicated in the operational sections of this  
specification is not implied. Exposure to absolute maximum rating conditions for extended  
periodsmayaffectreliability.  
2. Thisdevicecontainscircuitytoprotecttheinputsagainstdamageduetohighstaticvoltagesor  
electricfields;however,precautionsmaybetakentoavoidapplicationofanyvoltagehigherthan  
maximum rated voltages to this high-impedance circuit.  
3. This device contains circuitry that will ensure the output devices are in High-Z at power up.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
13  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
OPERATING RANGE (IS61LPSXXXXX)  
Range  
AmbientTemperature  
VDD  
VDDQ  
Commercial  
0°C to +70°C  
3.3V + 5%  
3.3V / 2.5V + 5%  
Industrial  
–40°Cto+85°C  
3.3V + 5%  
3.3V / 2.5V + 5%  
OPERATING RANGE (IS61VPSXXXXX)  
Range  
AmbientTemperature  
VDD  
VDDQ  
Commercial  
0°C to +70°C  
2.5V + 5%  
2.5V + 5%  
Industrial  
–40°Cto+85°C  
2.5V + 5%  
2.5V + 5%  
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)  
3.3V  
2.5V  
Max.  
Symbol Parameter  
Test Conditions  
Min.  
Max.  
Min.  
Unit  
VOH  
Output HIGH Voltage  
IOH = –4.0 mA (3.3V)  
IOH = –1.0 mA (2.5V)  
2.4  
2.0  
V
VOL  
Output LOW Voltage  
IOL = 8.0 mA (3.3V)  
IOL = 1.0 mA (2.5V)  
0.4  
0.4  
V
VIH  
VIL  
ILI  
Input HIGH Voltage  
Input LOW Voltage  
Input Leakage Current  
2.0  
-0.3  
-5  
VDD + 0.3  
1.7 VDD + 0.3  
V
V
0.8  
5
-0.3  
-5  
0.7  
5
(1)  
Vss VIN VDD  
µA  
µA  
ILO  
Output Leakage Current Vss VOUT VDDQ,  
OE = VIH  
-5  
5
-5  
5
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)  
-250  
MAX  
x36  
-200  
MAX  
x36  
Symbol Parameter  
Test Conditions  
Temp.range x18  
x72  
x18  
x72  
Unit  
ICC  
ISB  
ISBI  
AC Operating  
Supply Current  
Device Selected,  
OE = VIH, ZZ VIL,  
All Inputs 0.2V or VDD – 0.2V,  
Cycle Time tKC min.  
Com.  
Ind.  
450  
500  
450  
500  
600  
650  
425  
475  
425  
475  
550  
600  
mA  
mA  
mA  
Standby Current  
TTL Input  
Device Deselected,  
VDD = Max.,  
All Inputs VIL or VIH,  
ZZ VIL, f = Max.  
Com.  
Ind.  
150  
150  
150  
150  
150  
150  
150  
150  
150  
150  
150  
150  
Standby Current  
CMOS Input  
Device Deselected,  
VDD = Max.,  
Com.  
Ind.  
110  
125  
110  
125  
110  
125  
110  
125  
110  
125  
110  
125  
VIN  
VSS + 0.2V or VDD – 0.2V  
f = 0  
ZZ>VIH  
ISB2  
Sleep Mode  
Com.  
Ind.  
60  
75  
60  
75  
60  
75  
60  
75  
60  
75  
60  
75  
mA  
Note:  
1. MODE pin has an internal pullup and should be tied to VDD or VSS. It exhibits ±100µA maximum leakage current when tied to ≤  
VSS + 0.2V or VDD – 0.2V.  
14  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
CAPACITANCE(1,2)  
Symbol  
CIN  
Parameter  
Conditions  
VIN = 0V  
Max.  
Unit  
pF  
Input Capacitance  
Input/Output Capacitance  
6
8
COUT  
VOUT = 0V  
pF  
Notes:  
1. Tested initially and after any design or process changes that may affect these parameters.  
2. Test conditions: TA = 25°C, f = 1 MHz, VDD = 3.3V.  
3.3V I/O AC TEST CONDITIONS  
Parameter  
Unit  
0V to 3.0V  
1.5 ns  
Input Pulse Level  
Input Rise and Fall Times  
Input and Output Timing  
and Reference Level  
1.5V  
Output Load  
See Figures 1 and 2  
AC TEST LOADS  
317  
3.3V  
Z
O
= 50  
OUTPUT  
Output  
50Ω  
351 Ω  
5 pF  
Including  
jig and  
1.5V  
scope  
Figure 1  
Figure 2  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
15  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
2.5V I/O AC TEST CONDITIONS  
Parameter  
Unit  
0V to 2.5V  
1.5 ns  
Input Pulse Level  
Input Rise and Fall Times  
Input and Output Timing  
and Reference Level  
1.25V  
Output Load  
See Figures 3 and 4  
2.5 I/O OUTPUT LOAD EQUIVALENT  
317 Ω  
2.5V  
Z
O
= 50  
OUTPUT  
Output  
50Ω  
351 Ω  
5 pF  
Including  
jig and  
1.25V  
scope  
Figure 3  
Figure 4  
16  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
READ/WRITE CYCLE SWITCHING CHARACTERISTICS (Over Operating Range)  
-250  
-200  
Min.  
Symbol  
fMAX  
tKC  
Parameter  
Min.  
Max.  
250  
Max.  
200  
Unit  
MHz  
ns  
ClockFrequency  
5
Cycle Time  
4.0  
1.7  
1.7  
2.6  
2.6  
2.8  
2.6  
2
tKH  
Clock High Time  
2
ns  
tKL  
Clock Low Time  
2
ns  
tKQ  
Clock Access Time  
3.1  
ns  
(2)  
tKQX  
Clock High to Output Invalid  
Clock High to Output Low-Z  
Clock High to Output High-Z  
Output Enable to Output Valid  
Output Enable to Output Low-Z  
Output Disable to Output High-Z  
Address Setup Time  
Read/Write Setup Time  
Chip Enable Setup Time  
Address Advance Setup Time  
Data Setup Time  
0.8  
0.8  
1.5  
1
ns  
(2,3)  
tKQLZ  
tKQHZ  
tOEQ  
ns  
(2,3)  
3.0  
3.1  
ns  
ns  
(2,3)  
tOELZ  
0
0
ns  
(2,3)  
tOEHZ  
tAS  
3.0  
ns  
1.2  
1.2  
1.2  
1.2  
1.2  
0.3  
0.3  
0.3  
0.3  
0.3  
1.4  
1.4  
1.4  
1.4  
1.4  
0.4  
0.4  
0.4  
0.4  
0.4  
ns  
tWS  
ns  
tCES  
tAVS  
tDS  
ns  
ns  
ns  
tAH  
Address Hold Time  
ns  
tWH  
Write Hold Time  
ns  
tCEH  
tAVH  
tDH  
Chip Enable Hold Time  
Address Advance Hold Time  
Data Hold Time  
ns  
ns  
ns  
tPDS  
tPUS  
Note:  
ZZ High to Power Down  
ZZ Low to Power Down  
2
cyc  
cyc  
2
2
1. Configuration signal MODE is static and must not change during normal operation.  
2. Guaranteed but not 100% tested. This parameter is periodically sampled.  
3. Tested with load in Figure 2.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
17  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
READ/WRITE CYCLE TIMING  
t
KC  
CLK  
ADSP  
ADSC  
t
KH  
tKL  
ADSP is blocked by CE inactive  
ADSC initiate read  
t
SS  
tSH  
t
SS  
tSH  
t
AVH  
t
AVS  
Suspend Burst  
ADV  
t
AS  
tAH  
Address  
RD1  
RD2  
RD3  
t
t
WS  
WS  
t
t
WH  
GW  
BWE  
BWx  
WH  
t
CES  
tCEH  
CE Masks ADSP  
CE  
CE2  
CE2  
t
t
CES  
CES  
t
t
CEH  
CEH  
Unselected with CE2  
CE2 and CE2 only sampled with ADSP or ADSC  
t
OEHZ  
t
OEQ  
OE  
t
KQX  
t
OEQX  
t
OELZ  
High-Z  
High-Z  
DATAOUT  
2a  
2b  
2c  
2d  
1a  
t
KQLZ  
t
KQHZ  
t
KQ  
DATAIN  
Pipelined Read  
Burst Read  
Single Read  
Unselected  
18  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
WRITE CYCLE TIMING  
t
KC  
CLK  
ADSP  
ADSC  
t
KH  
tKL  
ADSP is blocked by CE inactive  
ADSC initiate Write  
t
SS  
tSH  
t
AVH  
t
AVS  
ADV must be inactive for ADSP Write  
ADV  
t
AS  
tAH  
Address  
WR1  
WR2  
WR3  
t
t
WS  
WS  
t
t
WH  
WH  
GW  
BWE  
BWx  
t
WS  
t
WH  
t
WS  
tWH  
WR1  
WR2  
CE Masks ADSP  
WR3  
t
CES  
tCEH  
CE  
CE2  
CE2  
t
t
CES  
CES  
t
CEH  
CEH  
Unselected with CE2  
CE2 and CE2 only sampled with ADSP or ADSC  
t
OE  
DATAOUT  
DATAIN  
High-Z  
t
DS  
tDH  
BW4-BW1 only are applied to first cycle of WR2  
2a 2b 2c 2d  
High-Z  
3a  
1a  
Burst Write  
Unselected  
Single Write  
Write  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
19  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
SNOOZE MODE ELECTRICAL CHARACTERISTICS  
Symbol  
ISB2  
Parameter  
Conditions  
Min.  
2
Max.  
60  
2
Unit  
mA  
CurrentduringSNOOZEMODE  
ZZ active to input ignored  
ZZ inactive to input sampled  
ZZ active to SNOOZE current  
ZZ inactive to exit SNOOZE current  
ZZ Vih  
tPDS  
cycle  
cycle  
cycle  
ns  
tPUS  
2
tZZI  
0
tRZZI  
SNOOZE MODE TIMING  
CLK  
t
PDS  
t
ZZ setup cycle  
ZZ recovPeUryS cycle  
ZZ  
t
ZZI  
Isupply  
I
SB2  
t
RZZI  
All Inputs  
Deselect or Read Only  
Deselect or Read Only  
(except ZZ)  
Normal  
operation  
cycle  
Outputs  
(Q)  
High-Z  
Don't Care  
20  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
IEEE1149.1SERIALBOUNDARYSCAN(JTAG)  
TEST ACCESS PORT (TAP) - TEST CLOCK  
TheIS61LPS/VPSxxxxxxproductshaveaserialboundary  
scan Test Access Port (TAP) in the PBGA package only.  
(The TQFP package not available.) This port operates in  
accordancewithIEEEStandard1149.1-1900,butdoesnot  
include all functions required for full 1149.1 compliance.  
These functions from the IEEE specification are excluded  
because they place added delay in the critical speed path  
oftheSRAM.TheTAPcontrolleroperatesinamannerthat  
does not conflict with the performance of other devices  
using1149.1fullycompliantTAPs.TheTAPoperatesusing  
JEDEC standard 2.5V I/O logic levels.  
The test clock is only used with the TAP controller. All  
inputs are captured on the rising edge of TCK and outputs  
are driven from the falling edge of TCK.  
TEST MODE SELECT (TMS)  
The TMS input is used to send commands to the TAP  
controller and is sampled on the rising edge of TCK. This  
pin may be left disconnected if the TAP is not used. The  
pin is internally pulled up, resulting in a logic HIGH level.  
TEST DATA-IN (TDI)  
The TDI pin is used to serially input information to the  
registers and can be connected to the input of any  
register. The register between TDI and TDO is chosen by  
the instruction loaded into the TAP instruction register.  
For information on instruction register loading, see the  
TAP Controller State Diagram. TDI is internally pulled up  
and can be disconnected if the TAP is unused in an  
application. TDI is connected to the Most Significant Bit  
(MSB) on any register.  
DISABLING THE JTAG FEATURE  
TheSRAMcanoperatewithoutusingtheJTAGfeature.To  
disabletheTAP controller, TCK must betiedLOW (Vss)to  
prevent clocking of the device. TDI and TMS are internally  
pulled up and may be disconnected. They may alternately  
beconnectedtoVDD throughapull-upresistor.TDOshould  
beleftdisconnected. Onpower-up, thedevicewillstartina  
resetstatewhichwillnotinterferewiththedeviceoperation.  
TAP CONTROLLER BLOCK DIAGRAM  
0
Bypass Register  
2
1
0
Instruction Register  
TDI  
Selection Circuitry  
Selection Circuitry  
TDO  
31 30 29 . . .  
2
2
1
1
0
0
Identification Register  
x
. . . . .  
Boundary Scan Register*  
TCK  
TMS  
TAP CONTROLLER  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
21  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
TEST DATA OUT (TDO)  
The TDO output pin is used to serially clock data-out from  
theregisters.Theoutputisactivedependingonthecurrent  
state of the TAP state machine (see TAP Controller State  
Diagram). The output changes on the falling edge of TCK  
and TDO is connected to the Least Significant Bit (LSB) of  
any register.  
is set LOW (VSS) when the BYPASS instruction is ex-  
ecuted.  
Boundary Scan Register  
The boundary scan register is connected to all input and  
output pins on the SRAM. Several no connect(NC) pins are  
also included in the scan register to reserve pins for higher  
density devices. The x36 configuration has a 75-bit-long  
register and the x18 configuration also has a 75-bit-long  
register. The boundary scan register is loaded with the  
contents of the RAM Input and Output ring when the TAP  
controller is in the Capture-DR state and then placed  
between the TDI and TDO pins when the controller is moved  
to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD  
and SAMPLE-Z instructions can be used to capture the  
contents of the Input and Output ring.  
PERFORMING A TAP RESET  
A Reset is performed by forcing TMS HIGH (VDD) for five  
rising edges of TCK. RESET may be performed while the  
SRAM is operating and does not affect its operation. At  
power-up, the TAP is internally reset to ensure that TDO  
comes up in a high-Z state.  
TAP REGISTERS  
RegistersareconnectedbetweentheTDIandTDOpinsand  
allow data to be scanned into and out of the SRAM test  
circuitry.Onlyoneregistercanbeselectedatatimethrough  
theinstructionregisters.DataisseriallyloadedintotheTDI  
pinontherisingedgeofTCKandoutputontheTDOpinon  
the falling edge of TCK.  
TheBoundaryScanOrdertablesshowtheorderinwhichthe  
bits are connected. Each bit corresponds to one of the  
bumps on the SRAM package. The MSB of the register is  
connected to TDI, and the LSB is connected to TDO.  
Scan Register Sizes  
Instruction Register  
Three-bitinstructionscanbeseriallyloadedintotheinstruc-  
tion register. This register is loaded when it is placed  
between the TDI and TDO pins. (See TAP Controller Block  
Diagram) At power-up, the instruction register is loaded  
with the IDCODE instruction. It is also loaded with the  
IDCODEinstructionifthecontrollerisplacedinaresetstate  
as previously described.  
Register  
Name  
BitSize  
(x18)  
BitSize  
(x36)  
BitSize  
(x72)  
Instruction  
Bypass  
3
1
3
1
3
1
ID  
32  
75  
32  
75  
32  
BoundaryScan  
TBD  
When the TAP controller is in the CaptureIR state, the two  
leastsignificantbitsareloadedwithabinary01patternto  
allow for fault isolation of the board level serial test path.  
Identification (ID) Register  
Bypass Register  
TheIDregisterisloadedwithavendor-specific,32-bitcode  
duringtheCapture-DRstatewhentheIDCODEcommandis  
loadedtotheinstructionregister.TheIDCODEishardwired  
into the SRAM and can be shifted out when the TAP  
controllerisintheShift-DRstate.TheIDregisterhasvendor  
code and other information described in the Identification  
Register Definitions table.  
To save time when serially shifting data through registers,  
it is sometimes advantageous to skip certain states. The  
bypass register is a single-bit register that can be placed  
between TDI and TDO pins. This allows data to be shifted  
through the SRAM with minimal delay. The bypass register  
IDENTIFICATION REGISTER DEFINITIONS  
InstructionField  
Description  
256Kx72  
xxxx  
512Kx36  
xxxx  
1Mx18  
xxxx  
RevisionNumber (31:28)  
DeviceDepth (27:23)  
DeviceWidth (22:18)  
ISSIDeviceID (17:12)  
ISSIJEDECID (11:1)  
IDRegisterPresence (0)  
Reservedforversionnumber.  
DefinesdepthofSRAM.512K,1Mor256K  
DefineswidthoftheSRAM.x72,x36orx18  
Reservedforfutureuse.  
00110  
00101  
xxxx  
00111  
01000  
00100  
00011  
xxxxx  
xxxxx  
AllowsuniqueidentificationofSRAMvendor.  
IndicatethepresenceofanIDregister.  
0011010101  
1
00011010101  
1
00011010101  
1
22  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
TAP INSTRUCTION SET  
SAMPLE/PRELOAD  
Eight instructions are possible with the three-bit instruction  
registerandallcombinationsarelistedintheInstructionCode  
table.ThreeinstructionsarelistedasRESERVEDandshould  
not be used and the other five instructions are described  
below. The TAP controller used in this SRAM is not fully  
compliantwiththe1149.1conventionbecausesomeman-  
datory instructions are not fully implemented. The TAP  
controller cannot be used to load address, data or control  
signals and cannot preload the Input or Output buffers. The  
SRAMdoesnotimplementthe1149.1commandsEXTESTor  
INTESTorthePRELOADportionofSAMPLE/PRELOAD;instead  
itperformsacaptureoftheInputsandOutputringwhenthese  
instructions are executed. Instructions are loaded into the  
TAPcontrollerduringtheShift-IRstatewhentheinstruction  
register is placed between TDI and TDO. During this state,  
instructionsareshiftedfromtheinstructionregisterthrough  
the TDI and TDO pins. To execute an instruction once it is  
shifted in, the TAP controller must be moved into the  
Update-IRstate.  
SAMPLE/PRELOAD is a 1149.1 mandatory instruction.  
The PRELOAD portion of this instruction is not imple-  
mented,sotheTAPcontrollerisnotfully1149.1compliant.  
When the SAMPLE/PRELOAD instruction is loaded to the  
instructionregisterandtheTAPcontrollerisintheCapture-  
DR state, a snapshot of data on the inputs and output pins  
is captured in the boundary scan register.  
It is important to realize that the TAP controller clock  
operates at a frequency up to 10 MHz, while the SRAM  
clockrunsmorethananorderofmagnitudefaster.Because  
oftheclockfrequencydifferences, itispossiblethatduring  
the Capture-DR state, an input or output will under-go a  
transition. The TAP may attempt a signal capture while in  
transition(metastablestate).Thedevicewillnotbeharmed,  
but there is no guarantee of the value that will be captured  
orrepeatableresults.  
To guarantee that the boundary scan register will capture  
the correct signal value, the SRAM signal must be stabi-  
lizedlongenoughtomeettheTAPcontroller’scaptureset-  
up plus hold times (tCS and tCH). To insure that the SRAM  
clockinputiscapturedcorrectly,designsneedawaytostop  
(or slow) the clock during a SAMPLE/PRELOAD instruc-  
tion. If this is not an issue, it is possible to capture all other  
signals and simply ignore the value of the CLK captured in  
the boundary scan register.  
EXTEST  
EXTEST is a mandatory 1149.1 instruction which is to be  
executedwhenevertheinstructionregisterisloadedwithall  
0s. Because EXTEST is not implemented in the TAP  
controller,thisdeviceisnot1149.1standardcompliant.The  
TAP controller recognizes an all-0 instruction. When an  
EXTEST instruction is loaded into the instruction register,  
theSRAMrespondsasifaSAMPLE/PRELOADinstruction  
hasbeenloaded. Thereisadifferencebetween the instruc-  
tions, unlike the SAMPLE/PRELOAD instruction, EXTEST  
places the SRAM outputs in a High-Z state.  
Once the data is captured, it is possible to shift out the data  
by putting the TAP into the Shift-DR state. This places the  
boundary scan register between the TDI and TDO pins.  
Note that since the PRELOAD part of the command is not  
implemented,puttingtheTAPintotheUpdatetotheUpdate-DR  
state while performing a SAMPLE/PRELOAD instruction will  
have the same effect as the Pause-DR command.  
IDCODE  
The IDCODE instruction causes a vendor-specific, 32-bit  
codetobeloadedintotheinstructionregister.Italsoplaces  
the instruction register between the TDI and TDO pins and  
allowstheIDCODEtobeshiftedoutofthedevicewhenthe  
TAP controller enters the Shift-DR state. The IDCODE  
instructionisloadedintotheinstructionregisteruponpower-  
uporwhenevertheTAPcontrollerisgivenatestlogicreset  
state.  
BYPASS  
When the BYPASS instruction is loaded in the instruction  
register and the TAP is placed in a Shift-DR state, the  
bypass register is placed between the TDI and TDO pins.  
TheadvantageoftheBYPASSinstructionisthatitshortens  
the boundary scan path when multiple devices are con-  
nected together on a board.  
SAMPLE-Z  
RESERVED  
The SAMPLE-Z instruction causes the boundary scan  
register to be connected between the TDI and TDO pins  
whentheTAPcontrollerisinaShift-DRstate.Italsoplaces  
all SRAM outputs into a High-Z state.  
Theseinstructionsarenotimplementedbutarereservedfor  
future use. Do not use these instructions.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
23  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
INSTRUCTION CODES  
Code  
Instruction  
Description  
000  
EXTEST  
Captures the Input/Output ring contents. Places the boundary scan register between  
the TDI and TDO. Forces all SRAM outputs to High-Z state. This  
instruction is not 1149.1 compliant.  
001  
010  
IDCODE  
Loads the ID register with the vendor ID code and places the register between TDI  
and TDO. This operation does not affect SRAM operation.  
SAMPLE-Z  
Captures the Input/Output contents. Places the boundary scan register between TDI  
and TDO. Forces all SRAM output drivers to a High-Z state.  
011  
100  
RESERVED  
Do Not Use: This instruction is reserved for future use.  
SAMPLE/PRELOAD  
Captures the Input/Output ring contents. Places the boundary scan register between  
TDI and TDO. Does not affect the SRAM operation. This instruction does not  
implement 1149.1 preload function and is therefore not 1149.1 compliant.  
101  
110  
111  
RESERVED  
RESERVED  
BYPASS  
Do Not Use: This instruction is reserved for future use.  
Do Not Use: This instruction is reserved for future use.  
Places the bypass register between TDI and TDO. This operation does not  
affect SRAM operation.  
TAP CONTROLLER STATE DIAGRAM  
Test Logic Reset  
1
0
1
1
1
Run Test/Idle  
Select DR  
0
Select IR  
0
0
1
1
Capture DR  
0
Capture IR  
0
Shift DR  
1
Shift IR  
1
0
0
1
1
Exit1 DR  
0
Exit1 IR  
0
Pause DR  
1
Pause IR  
1
0
0
Exit2 DR  
1
Exit2 IR  
1
0
1
0
1
Update DR  
0
Update IR  
0
24  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
TAP Electrical Characteristics Over the Operating Range(1,2)  
Symbol  
VOH1  
VOH2  
VOL1  
VOL2  
VIH  
Parameter  
TestConditions  
Min.  
1.7  
2.1  
Max.  
Units  
OutputHIGHVoltage  
OutputHIGHVoltage  
OutputLOWVoltage  
OutputLOWVoltage  
Input HIGH Voltage  
Input LOW Voltage  
InputLeakageCurrent  
IOH = –2.0 mA  
V
V
V
V
V
V
IOH = –100  
IOL = 2.0 mA  
IOL = 100  
µA  
0.7  
µA  
0.2  
1.7  
–0.3  
–10  
VDD +0.3  
0.7  
VIL  
IX  
VSS V I VDDQ  
10  
µA  
Notes:  
1. All Voltage referenced to Ground.  
2. Overshoot: VIH (AC) VDD +1.5V for t tTCYC/2,  
Undershoot: VIL (AC) 0.5V for t tTCYC/2,  
Power-up: VIH < 2.6V and VDD < 2.4V and VDDQ < 1.4V for t < 200 ms.  
TAP AC ELECTRICAL CHARACTERISTICS(1,2) (OVER OPERATING RANGE)  
Symbol Parameter  
Min.  
100  
Max.  
10  
20  
Unit  
ns  
tTCYC  
fTF  
TCK Clock cycle time  
TCK Clock frequency  
MHz  
ns  
tTH  
TCK Clock HIGH  
40  
40  
10  
10  
10  
10  
10  
10  
tTL  
TCK Clock LOW  
ns  
tTMSS  
tTDIS  
tCS  
TMS setup to TCK Clock Rise  
TDI setup to TCK Clock Rise  
Capture setup to TCK Rise  
TMSholdafterTCKClockRise  
TDI Hold after Clock Rise  
Capture hold after Clock Rise  
TCK LOW to TDO valid  
TCK LOW to TDO invalid  
ns  
ns  
ns  
tTMSH  
tTDIH  
tCH  
ns  
ns  
ns  
tTDOV  
ns  
tTDOX  
0
ns  
Notes:  
1. Both tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register.  
2. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
25  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
TAP AC TEST CONDITIONS (2.5V/3.3V)  
TAP Output Load Equivalent  
Input pulse levels  
0 to 2.5V/0 to 3.0V  
1ns  
Input rise and fall times  
Input timing reference levels  
Output reference levels  
1.25V/1.5V  
1.25V/1.5V  
50Ω  
Vtrig  
Test load termination supply voltage  
Vtrig  
1.25V/1.5V  
1.25V/1.5V  
TDO  
20 pF  
GND  
Z0 = 50Ω  
TAP TIMING  
1
2
3
4
5
6
t
THTH  
t
TLTH  
TCK  
TMS  
t
THTL  
t
t
MVTH THMX  
t
DVTH  
t
THDX  
TDI  
t
TLOV  
TDO  
t
TLOX  
DON'T CARE  
UNDEFINED  
26  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
209 BOUNDARY SCAN ORDER (256K X 72)  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
27  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
165 PBGA BOUNDARY SCAN ORDER (x 36)  
Signal Bump  
Signal Bump  
Signal  
Name  
Bump  
ID  
Signal Bump  
Bit # Name  
ID  
Bit #  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
39  
40  
Name  
DQb  
DQb  
DQb  
DQb  
DQb  
DQb  
DQb  
DQb  
DQb  
NC  
ID  
11G  
11F  
11E  
11D  
10G  
10F  
10E  
10D  
11C  
11A  
10A  
10B  
9A  
Bit #  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
57  
58  
59  
60  
Bit #  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
73  
74  
75  
Name  
DQd  
DQd  
DQd  
DQd  
DQd  
DQd  
DQd  
DQd  
DQd  
A
ID  
1
2
MODE  
A
1R  
NC  
CE2  
BWa  
BWb  
BWc  
BWd  
CE2  
CE  
1A  
6A  
5B  
5A  
4A  
4B  
3B  
3A  
2A  
2B  
1B  
1C  
1D  
1E  
1F  
1G  
2D  
2E  
2F  
2G  
1J  
6N  
1K  
1L  
3
A
11P  
8P  
4
A
1M  
2J  
5
A
8R  
6
A
9R  
2K  
2L  
7
A
9P  
8
A
10P  
10R  
11R  
11H  
11N  
11M  
11L  
11K  
11J  
10M  
10L  
10K  
10J  
2M  
1N  
3P  
3R  
4R  
4P  
6P  
6R  
9
A
A
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
A
A
ZZ  
A
NC  
A
DQa  
DQa  
DQa  
DQa  
DQa  
DQa  
DQa  
DQa  
DQa  
A
DQc  
DQc  
DQc  
DQc  
DQc  
DQc  
DQc  
DQc  
DQc  
A
ADV  
ADSP  
ADSC  
OE  
A
9B  
A1  
8A  
A0  
8B  
BWE  
GW  
7A  
7B  
CLK  
NC  
6B  
11B  
28  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
165 PBGA BOUNDARY SCAN ORDER (x 18)  
Signal Bump  
Signal Bump  
Signal  
Name  
Bump  
ID  
Signal Bump  
Bit # Name  
ID  
Bit #  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
39  
40  
Name  
DQa  
DQa  
DQa  
DQa  
DQa  
NC  
ID  
Bit #  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
57  
58  
59  
60  
Bit #  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
73  
74  
75  
Name  
DQb  
DQb  
DQb  
DQb  
DQb  
NC  
NC  
NC  
NC  
A
ID  
1
2
MODE  
A
1R  
11G  
11F  
11E  
11D  
11C  
10F  
10E  
10D  
10G  
11A  
10A  
10B  
9A  
NC  
CE2  
BWa  
NC  
1A  
6A  
5B  
5A  
4A  
4B  
3B  
3A  
2A  
2B  
1B  
1C  
1D  
1E  
1F  
1G  
2D  
2E  
2F  
2G  
1J  
6N  
1K  
1L  
3
A
11P  
8P  
4
A
1M  
1N  
2K  
2L  
5
A
8R  
BWb  
NC  
6
A
9R  
7
A
9P  
NC  
CE2  
CE  
8
A
10P  
10R  
11R  
11H  
11N  
11M  
11L  
11K  
11J  
10M  
10L  
10K  
10J  
NC  
2M  
2J  
9
A
NC  
A
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
A
A
A
3P  
3R  
4R  
4P  
6P  
6R  
ZZ  
NC  
NC  
NC  
NC  
NC  
DQa  
DQa  
DQa  
DQa  
A
NC  
A
A
NC  
A
ADV  
ADSP  
ADSC  
OE  
NC  
A
9B  
NC  
A1  
8A  
NC  
A0  
8B  
NC  
BWE  
GW  
CLK  
NC  
7A  
DQb  
DQb  
DQb  
DQb  
7B  
6B  
11B  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
29  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
ORDERING INFORMATION (3.3V core/2.5V-3.3V I/O)  
Commercial Range: 0°C to +70°C  
Configuration  
512Kx36  
Frequency  
OrderPartNumber  
Package  
250  
IS61LPS51236A-250TQ  
IS61LPS51236A-250B2  
100 TQFP  
119 PBGA  
IS61LPS51236A-250B3  
165 PBGA  
200  
250  
IS61LPS51236A-200TQ  
IS61LPS51236A-200B2  
IS61LPS51236A-200B3  
100 TQFP  
119 PBGA  
165 PBGA  
1Mx18  
IS61LPS102418A-250TQ  
IS61LPS102418A-250B2  
100 TQFP  
119 PBGA  
IS61LPS102418A-250B3  
165 PBGA  
200  
250  
IS61LPS102418A-200TQ  
IS61LPS102418A-200B2  
IS61LPS102418A-200B3  
100 TQFP  
119 PBGA  
165 PBGA  
256Kx72  
IS61LPS25672A-250B1  
209 PBGA  
Industrial Range: -40°C to +85°C  
Configuration  
512Kx36  
Frequency  
OrderPartNumber  
Package  
250  
IS61LPS51236A-250TQI  
IS61LPS51236A-250B2I  
100 TQFP  
119 PBGA  
IS61LPS51236A-250B3I  
165 PBGA  
200  
IS61LPS51236A-200TQI  
IS61LPS51236A-200TQLI  
IS61LPS51236A-200B2I  
100 TQFP  
100TQFP,Lead-free  
119 PBGA  
IS61LPS51236A-200B3I  
IS61LPS51236A-200B3LI  
165 PBGA  
165PBGA,Lead-free  
1Mx18  
250  
200  
250  
IS61LPS102418A-250TQI  
IS61LPS102418A-250B2I  
100 TQFP  
119 PBGA  
IS61LPS102418A-250B3I  
165 PBGA  
IS61LPS102418A-200TQI  
IS61LPS102418A-200B2I  
100 TQFP  
119 PBGA  
IS61LPS102418A-200B3I  
IS61LPS25672A-250B1I  
165 PBGA  
209 PBGA  
256Kx72  
30  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
02/11/05  
®
IS61VPS25672A,IS61LPS25672A  
IS61VPS51236A, IS61LPS51236A,IS61VPS102418A,IS61LPS102418A  
ISSI  
ORDERING INFORMATION (2.5V core/2.5V I/O)  
Commercial Range: 0°C to +70°C  
Configuration  
512Kx36  
Frequency  
OrderPartNumber  
Package  
250  
IS61VPS51236A-250TQ  
IS61VPS51236A-250B2  
100 TQFP  
119 PBGA  
IS61VPS51236A-250B3  
165 PBGA  
200  
IS61VPS51236A-200TQ  
IS61VPS51236A-200B2  
100 TQFP  
119 PBGA  
IS61VPS51236A-200B3  
165 PBGA  
1Mx18  
250  
200  
250  
IS61VPS102418A-250TQ  
IS61VPS102418A-250B2  
100 TQFP  
119 PBGA  
IS61VPS102418A-250B3  
165 PBGA  
IS61VPS102418A-200TQ  
IS61VPS102418A-200B2  
100 TQFP  
119 PBGA  
IS61VPS102418A-200B3  
IS61VPS25672A-250B1  
165 PBGA  
209 PBGA  
256Kx72  
Industrial Range: -40°C to +85°C  
Configuration  
512Kx36  
Frequency  
OrderPartNumber  
Package  
250  
IS61VPS51236A-250TQI  
IS61VPS51236A-250B2I  
100 TQFP  
119 PBGA  
IS61VPS51236A-250B3I  
165 PBGA  
200  
IS61VPS51236A-200TQI  
IS61VPS51236A-200B2I  
100 TQFP  
119 PBGA  
IS61VPS51236A-200B3I  
165 PBGA  
1Mx18  
250  
200  
250  
IS61VPS102418A-250TQI  
IS61VPS102418A-250B2I  
100 TQFP  
119 PBGA  
IS61VPS102418A-250B3I  
165 PBGA  
IS61VPS102418A-200TQI  
IS61VPS102418A-200B2I  
100 TQFP  
119 PBGA  
IS61VPS102418A-200B3I  
IS61VPS25672A-250B1I  
165 PBGA  
209 PBGA  
256Kx72  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
Rev. D  
31  
02/11/05  
®
PACKAGING INFORMATION  
ISSI  
Plastic Ball Grid Array  
Package Code: B (119-pin)  
φ
b (119X)  
E
A
7
6
5
4
3
2
1
A
B
C
D
E
F
30ϒ  
G
H
J
D
D2  
D1  
K
L
M
N
P
R
T
e
U
A2  
E1  
A1  
A3  
E2  
SEATING PLANE  
A4  
MILLIMETERS  
INCHES  
Min.  
Sym. Min.  
Max.  
Max.  
N0.  
Leads  
Notes:  
119  
1.Controllingdimension:millimeters,unlessotherwisespecified.  
2.BSC=Basicleadspacingbetweencenters.  
3.DimensionsD1andEdonotincludemoldflashprotrusionand  
shouldbemeasuredfromthebottomofthepackage.  
4.Formedleadsshallbeplanarwithrespecttooneanotherwithin  
0.004inchesattheseatingplane.  
A
2.41  
0.70  
1.00  
1.70  
0.095  
0.028  
0.039  
0.067  
A1  
A2  
A3  
A4  
b
0.50  
0.80  
1.30  
0.020  
0.032  
0.051  
0.56 BSC  
0.022 BSC  
0.60  
0.90  
0.024  
0.858  
0.035  
0.874  
D
21.80  
22.20  
D1  
D2  
E
20.32 BSC  
0.800 BSC  
19.40  
13.80  
19.60  
14.20  
0.764  
0.543  
0.772  
0.559  
E1  
E2  
e
7.62 BSC  
0.300 BSC  
11.90  
12.10  
0.469  
0.476  
1.27 BSC  
0.050 BSC  
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774  
Rev. B  
02/12/03  
®
PACKAGING INFORMATION  
Ball Grid Array  
ISSI  
Package Code: B (165-pin)  
BOTTOM VIEW  
A1 CORNER  
TOP VIEW  
A1 CORNER  
φ b (165X)  
11 10  
9
8
7
6
5
4
3
2
1
1
2
3
4
5
6
7
8
9
10 11  
A
B
C
D
E
F
A
B
C
D
E
F
e
G
H
J
G
H
J
D
D1  
K
L
K
L
M
N
P
R
M
N
P
R
e
E1  
E
A2  
A
A1  
BGA - 13mm x 15mm  
Notes:  
MILLIMETERS  
INCHES  
1. Controlling dimensions are in millimeters.  
Sym. Min. Nom. Max.  
Min. Nom. Max.  
165  
N0.  
Leads  
165  
A
0.25  
1.20  
0.40  
0.047  
0.010 0.013 0.016  
0.031  
A1  
A2  
D
0.33  
0.79  
14.90 15.00 15.10  
13.90 14.00 14.10  
12.90 13.00 13.10  
9.90 10.00 10.10  
0.587 0.591 0.594  
0.547 0.551 0.555  
0.508 0.512 0.516  
0.390 0.394 0.398  
D1  
E
E1  
e
1.00  
0.45  
0.039  
b
0.40  
0.50  
0.016 0.018 0.020  
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774  
Rev. A  
06/11/03  
®
ISSI  
PACKAGING INFORMATION  
TQFP (Thin Quad Flat Pack Package)  
Package Code: TQ  
D
D1  
E
E1  
N
L1  
L
C
1
e
SEATING  
PLANE  
A2  
A
b
A1  
Notes:  
Thin Quad Flat Pack (TQ)  
Inches Millimeters  
1. All dimensioning and  
tolerancing conforms to  
ANSI Y14.5M-1982.  
Millimeters  
Min Max  
Inches  
Min Max  
Symbol  
Ref. Std.  
Min  
Max  
Min  
Max  
2. Dimensions D1 and E1 do  
not include mold protrusions.  
Allowable protrusion is 0.25  
mm per side. D1 and E1 do  
include mold mismatch and  
are determined at datum  
plane -H-.  
No. Leads (N)  
100  
128  
A
A1  
A2  
b
D
D1  
E
1.60  
0.15  
1.45  
0.38  
0.063  
1.60  
0.15  
1.45  
0.27  
0.063  
0.05  
1.35  
0.22  
0.002 0.006  
0.053 0.057  
0.009 0.015  
0.862 0.870  
0.783 0.791  
0.626 0.634  
0.547 0.555  
0.026 BSC  
0.05  
1.35  
0.17  
21.80 22.20  
19.90 20.10  
15.80 16.20  
13.90 14.10  
0.50 BSC  
0.002 0.006  
0.053 0.057  
0.007 0.011  
0.858 0.874  
0.783 0.791  
0.622 0.638  
0.547 0.555  
0.020 BSC  
3. Controlling dimension:  
millimeters.  
21.90 22.10  
19.90 20.10  
15.90 16.10  
13.90 14.10  
0.65 BSC  
E1  
e
L
0.45  
1.00 REF.  
0o 7o  
0.75  
0.018 0.030  
0.45  
0.75  
0.018 0.030  
L1  
C
0.039 REF.  
1.00 REF.  
0o  
0.039 REF.  
0o  
7o  
7o  
0o  
7o  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
PK13197LQ Rev.D 05/08/03  

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