ISPLSI1032E-90LT [LATTICE]

In-System Programmable High Density PLD; 在系统可编程高密度PLD
ISPLSI1032E-90LT
型号: ISPLSI1032E-90LT
厂家: LATTICE SEMICONDUCTOR    LATTICE SEMICONDUCTOR
描述:

In-System Programmable High Density PLD
在系统可编程高密度PLD

可编程逻辑器件 输入元件 时钟
文件: 总16页 (文件大小:164K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
®
ispLSI 1032E  
In-System Programmable High Density PLD  
Features  
Functional Block Diagram  
• HIGH DENSITY PROGRAMMABLE LOGIC  
— 6000 PLD Gates  
Output Routing Pool  
— 64 I/O Pins, Eight Dedicated Inputs  
— 192 Registers  
D7 D6 D5 D4 D3 D2 D1 D0  
— High Speed Global Interconnect  
— Wide Input Gating for Fast Counters, State  
Machines, Address Decoders, etc.  
— Small Logic Block Size for Random Logic  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
C7  
C6  
C5  
C4  
C3  
C2  
C1  
C0  
D
D
D
D
Q
Q
Q
Q
Logic  
Array  
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY  
GLB  
fmax = 125 MHz Maximum Operating Frequency  
tpd = 7.5 ns Propagation Delay  
— TTL Compatible Inputs and Outputs  
— Electrically Erasable and Reprogrammable  
— Non-Volatile  
Global Routing Pool (GRP)  
— 100% Tested at Time of Manufacture  
— Unused Product Term Shutdown Saves Power  
B0 B1 B2 B3 B4 B5 B6 B7  
Output Routing Pool  
CLK  
• IN-SYSTEM PROGRAMMABLE  
— In-System Programmable (ISP™) 5V Only  
— Increased Manufacturing Yields, Reduced Time-to-  
Market and Improved Product Quality  
0139A(A1)-isp  
Description  
— Reprogram Soldered Devices for Faster Prototyping  
The ispLSI 1032E is a High Density Programmable Logic  
Device containing 192 Registers, 64 Universal I/O pins,  
eight Dedicated Input pins, four Dedicated Clock Input  
pins and a Global Routing Pool (GRP). The GRP  
provides complete interconnectivity between all of these  
elements. The ispLSI 1032E device offers 5V non-vola-  
tile in-system programmability of the logic, as well as the  
interconnects to provide truly reconfigurable systems. A  
functional superset of the ispLSI 1032 architecture, the  
ispLSI 1032E device adds two new global output enable  
pins.  
• OFFERS THE EASE OF USE AND FAST SYSTEM  
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY  
OF FIELD PROGRAMMABLE GATE ARRAYS  
— Complete Programmable Device Can Combine Glue  
Logic and Structured Designs  
— Enhanced Pin Locking Capability  
— Four Dedicated Clock Input Pins  
— Synchronous and Asynchronous Clocks  
— Programmable Output Slew Rate Control to  
Minimize Switching Noise  
— Flexible Pin Placement  
— Optimized Global Routing Pool Provides Global  
Interconnectivity  
The basic unit of logic on the ispLSI 1032E device is the  
Generic Logic Block (GLB). The GLBs are labeled A0,  
A1…D7(seeFigure1). Thereareatotalof32GLBsinthe  
ispLSI 1032E device. Each GLB has 18 inputs, a pro-  
grammableAND/OR/ExclusiveORarray,andfouroutputs  
which can be configured to be either combinatorial or  
registered. Inputs to the GLB come from the GRP and  
dedicated inputs. All of the GLB outputs are brought back  
into the GRP so that they can be connected to the inputs  
of any GLB on the device.  
Copyright©2002LatticeSemiconductorCorp. Allbrandorproductnamesaretrademarksorregisteredtrademarksoftheirrespectiveholders. Thespecificationsandinformationhereinaresubject  
to change without notice.  
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.  
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com  
January 2002  
1032e_08  
1
Specifications ispLSI 1032E  
Functional Block Diagram  
Figure 1. ispLSI 1032E Functional Block Diagram  
RESET  
Input Bus  
Output Routing Pool (ORP)  
Generic  
Logic Blocks  
(GLBs)  
GOE 1/IN 5  
GOE 0/IN 4  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
I/O 47  
I/O 46  
I/O 45  
I/O 44  
C7  
C6  
C5  
C4  
I/O 0  
I/O 1  
I/O 2  
I/O 3  
A0  
A1  
A2  
A3  
I/O 43  
I/O 42  
I/O 41  
I/O 40  
I/O 4  
I/O 5  
I/O 6  
I/O 7  
Global  
Routing  
Pool  
I/O 39  
I/O 38  
I/O 37  
I/O 36  
C3  
C2  
C1  
C0  
I/O 8  
I/O 9  
(GRP)  
A4  
A5  
A6  
A7  
I/O 10  
I/O 11  
I/O 35  
I/O 34  
I/O 33  
I/O 32  
I/O 12  
I/O 13  
I/O 14  
I/O 15  
SDI/IN 0  
CLK 0  
CLK 1  
CLK 2  
IOCLK 0  
IOCLK 1  
B0  
B1  
B2  
B3  
B4  
B5  
B6  
B7  
MODE/IN 1  
Clock  
Distribution  
Network  
Output Routing Pool (ORP)  
Input Bus  
Megablock  
ispEN  
The device also has 64 I/O cells, each of which is directly The GRP has, as its inputs, the outputs from all of the  
connected to an I/O pin. Each I/O cell can be individually GLBs andallof theinputs from thebi-directionalI/O cells.  
programmed to be a combinatorial input, registered in- All of these signals are made available to the inputs of the  
put, latched input, output or bi-directional GLBs. Delays through the GRP have been equalized to  
I/O pin with 3-state control. The signal levels are TTL minimize timing skew.  
compatible voltages and the output drivers can source 4  
Clocks in the ispLSI 1032E device are selected using the  
mA or sink 8 mA. Each output can be programmed  
Clock Distribution Network. Four dedicated clock pins  
independently for fast or slow output slew rate to mini-  
(Y0, Y1, Y2 and Y3) are brought into the distribution  
mize overall output switching noise.  
network, and five clock outputs (CLK 0, CLK 1, CLK 2,  
Eight GLBs, 16 I/O cells, two dedicated inputs and one IOCLK 0 and IOCLK 1) are provided to route clocks to the  
ORP are connected together to make a Megablock (see GLBs and I/O cells. The Clock Distribution Network can  
Figure 1). The outputs of the eight GLBs are connected alsobedrivenfromaspecialclockGLB (C0ontheispLSI  
to a set of 16 universal I/O cells by the ORP. Each ispLSI 1032E device). The logic of this GLB allows the user to  
1032E device contains four Megablocks.  
create an internal clock from a combination of internal  
signals within the device.  
2
Specifications ispLSI 1032E  
1
Absolute Maximum Ratings  
Supply Voltage V .................................. -0.5 to +7.0V  
cc  
Input Voltage Applied........................ -2.5 to V +1.0V  
CC  
Off-State Output Voltage Applied ..... -2.5 to V +1.0V  
CC  
Storage Temperature................................ -65 to 150°C  
Case Temp. with Power Applied .............. -55 to 125°C  
Max. Junction Temp. (T ) with Power Applied ... 150°C  
J
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional  
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification  
is not implied (while programming, follow the programming specifications).  
DC Recommended Operating Conditions  
SYMBOL  
PARAMETER  
Commercial  
Industrial  
MIN.  
4.75  
4.5  
0
MAX.  
5.25  
5.5  
UNITS  
V
V
V
V
T = 0°C to + 70°C  
A
VCC  
Supply Voltage  
T = -40°C to + 85°C  
A
Input Low Voltage  
Input High Voltage  
0.8  
VIL  
2.0  
V +1  
cc  
VIH  
Table 2-0005/1032E  
Capacitance (TA=25oC, f=1.0 MHz)  
SYMBOL  
PARAMETER  
TYPICAL  
UNITS  
TEST CONDITIONS  
VCC = 5.0V, VPIN = 2.0V  
Dedicated Input, I/O, Y1, Y2, Y3, Clock Capacitance  
(Commercial/Industrial)  
8
pf  
C1  
15  
pf  
VCC= 5.0V, VPIN = 2.0V  
Y0 Clock Capacitance  
C2  
Table 2-0006/1032E  
Data Retention Specifications  
PARAMETER  
Data Retention  
MINIMUM  
20  
MAXIMUM  
UNITS  
Years  
Cycles  
Erase/Reprogram Cycles  
10000  
Table 2-0008/1032E  
3
Specifications ispLSI 1032E  
Switching Test Conditions  
Figure 2. Test Load  
Input Pulse Levels  
GND to 3.0V  
-125  
Others  
2 ns  
3 ns  
Input Rise and Fall Time  
10% to 90%  
+ 5V  
Input Timing Reference Levels  
Output Timing Reference Levels  
Output Load  
1.5V  
1.5V  
R
1
2
Device  
Output  
Test  
Point  
See Figure 2  
Table 2-0003/1032E  
3-state levels are measured 0.5V from  
steady-state active level.  
R
C *  
L
Output Load Conditions (see Figure 2)  
TEST CONDITION  
R1  
470  
R2  
CL  
*C includes Test Fixture and Probe Capacitance.  
L
A
B
390Ω  
390Ω  
390Ω  
35pF  
35pF  
35pF  
0213a  
Active High  
Active Low  
470Ω  
Active High to Z  
at VOH-0.5V  
390Ω  
5pF  
C
Active Low to Z  
at VOL+0.5V  
470Ω  
390Ω  
5pF  
Table 2-0004/1032E  
DC Electrical Characteristics  
Over Recommended Operating Conditions  
3
SYMBOL  
PARAMETER  
Output Low Voltage  
Output High Voltage  
CONDITION  
IOL= 8 mA  
MIN.  
TYP. MAX. UNITS  
0.4  
V
VOL  
VOH  
IIL  
IOH = -4 mA  
2.4  
V
Input or I/O Low Leakage Current  
Input or I/O High Leakage Current  
ispEN Input Low Leakage Current  
I/O Active Pull-Up Current  
0V V V (Max.)  
-10  
10  
µA  
µA  
µA  
µA  
mA  
mA  
mA  
IN  
IL  
3.5V V V  
IIH  
IN  
CC  
0V V V  
-150  
-150  
-200  
IIL-isp  
IIL-PU  
IOS1  
ICC2, 4  
IN  
IL  
0V V V  
IN  
IL  
Output Short Circuit Current  
V = 5V, VOUT = 0.5V  
CC  
190  
190  
V = 0.5V, V = 3.0V  
Commercial  
Industrial  
IL  
IH  
Operating Power Supply Current  
fCLOCK = 1 MHz  
Table 2-0007/1032E  
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test problems  
by tester ground degradation. Characterized but not 100% tested.  
2. Measured using eight 16-bit counters.  
3. Typical values are at VCC= 5V and T = 25°C.  
A
4. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption  
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to  
estimate maximum ICC  
.
4
Specifications ispLSI 1032E  
External Timing Parameters  
Over Recommended Operating Conditions  
TEST 4  
COND.  
-125  
-100  
2
PARAMETER  
pd1  
#
DESCRIPTION1  
UNITS  
MIN. MAX. MIN. MAX.  
A
A
A
1
Data Propagation Delay, 4PT Bypass, ORP Bypass  
Data Propagation Delay, Worst Case Path  
Clock Frequency with Internal Feedback 3  
7.5  
10.0  
10.0  
12.5  
ns  
ns  
t
2
3
4
5
6
7
8
9
t
f
f
f
t
t
pd2  
125  
91.0  
167  
5.0  
100  
71.0  
125  
7.0  
MHz  
MHz  
MHz  
ns  
max (Int.)  
max (Ext.)  
max (Tog.)  
su1  
1
Clock Frequency with External Feedback  
(
)
tsu2 + tco1  
1
Clock Frequency, Max. Toggle  
(
)
twh + tw1  
GLB Reg. Setup Time before Clock,4 PT Bypass  
GLB Reg. Clock to Output Delay, ORP Bypass  
GLB Reg. Hold Time after Clock, 4 PT Bypass  
GLB Reg. Setup Time before Clock  
A
5.0  
6.0  
ns  
co1  
0.0  
6.0  
0.0  
8.0  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
t
t
t
t
t
t
t
t
h1  
su2  
10 GLB Reg. Clock to Output Delay  
11 GLB Reg. Hold Time after Clock  
12 Ext. Reset Pin to Output Delay  
13 Ext. Reset Pulse Duration  
6.0  
7.0  
co2  
0.0  
0.0  
h2  
A
10.0  
13.5  
r1  
5.0  
6.5  
rw1  
B
C
B
C
14 Input to Output Enable  
12.0  
12.0  
7.0  
7.0  
15.0  
15.0  
9.0  
9.0  
ptoeen  
ptoedis  
goeen  
goedis  
wh  
15 Input to Output Disable  
16 Global OE Output Enable  
17 Global OE Output Disable  
18 External Synchronous Clock Pulse Duration, High  
19 External Synchronous Clock Pulse Duration, Low  
3.0  
3.0  
3.0  
4.0  
4.0  
3.5  
wl  
20 I/O Reg. Setup Time before Ext. Sync Clock (Y2, Y3)  
21 I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3)  
su3  
0.0  
0.0  
ns  
t
h3  
Table 2-0030A/1032E  
1. Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.  
2. Refer to Timing Model in this data sheet for further details.  
3. Standard 16-bit counter using GRP feedback.  
4. Reference Switching Test Conditions section.  
5
Specifications ispLSI 1032E  
External Timing Parameters  
Over Recommended Operating Conditions  
TEST 4  
COND.  
-90  
-80  
-70  
DESCRIPTION1  
UNITS  
2
PARAMETER  
#
MIN. MAX. MIN. MAX. MIN. MAX.  
A
A
A
1
Data Propagation Delay, 4PT Bypass, ORP Bypass  
Data Propagation Delay, Worst Case Path  
Clock Frequency with Internal Feedback 3  
10.0  
12.5  
12.0  
15.0  
15.0  
17.5  
ns  
ns  
t
pd1  
2
3
4
5
6
7
8
9
t
f
f
f
t
t
pd2  
90.0  
69.0  
125  
7.5  
80.0  
61.0  
111  
8.5  
70.0  
56.0  
100  
9.0  
MHz  
MHz  
MHz  
ns  
max (Int.)  
max (Ext.)  
max (Tog.)  
su1  
1
Clock Frequency with External Feedback  
(
)
tsu2 + tco1  
1
Clock Frequency, Max. Toggle  
(
)
twh + tw1  
GLB Reg. Setup Time before Clock,4 PT Bypass  
GLB Reg. Clock to Output Delay, ORP Bypass  
GLB Reg. Hold Time after Clock, 4 PT Bypass  
GLB Reg. Setup Time before Clock  
A
6.0  
6.5  
7.0  
ns  
co1  
0.0  
8.5  
0.0  
10.0  
0.0  
11.0  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
t
t
t
t
t
t
t
t
h1  
su2  
10 GLB Reg. Clock to Output Delay  
11 GLB Reg. Hold Time after Clock  
12 Ext. Reset Pin to Output Delay  
13 Ext. Reset Pulse Duration  
7.0  
7.5  
8.0  
co2  
0.0  
0.0  
0.0  
h2  
A
13.5  
14.0  
15.0  
r1  
6.5  
8.0  
10.0  
rw1  
B
C
B
C
14 Input to Output Enable  
15.0  
15.0  
9.0  
9.0  
16.5  
16.5  
10.0  
10.0  
18.0  
18.0  
12.0  
12.0  
ptoeen  
ptoedis  
goeen  
goedis  
wh  
15 Input to Output Disable  
16 Global OE Output Enable  
17 Global OE Output Disable  
18 External Synchronous Clock Pulse Duration, High  
19 External Synchronous Clock Pulse Duration, Low  
4.0  
4.0  
4.5  
4.5  
3.5  
5.0  
5.0  
4.0  
wl  
20 I/O Reg. Setup Time before Ext. Sync Clock (Y2, Y3) 3.5  
21 I/O Reg. Hold Time after Ext. Sync. Clock (Y2, Y3) 0.0  
su3  
0.0  
0.0  
ns  
t
h3  
Table 2-0030B/1032E  
1. Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.  
2. Refer to Timing Model in this data sheet for further details.  
3. Standard 16-bit counter using GRP feedback.  
4. Reference Switching Test Conditions section.  
6
Specifications ispLSI 1032E  
1
Internal Timing Parameters  
-125  
MIN. MAX. MIN. MAX.  
-100  
2
PARAM.  
#
DESCRIPTION  
UNITS  
Inputs  
22 I/O Register Bypass  
23 I/O Latch Delay  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
t
t
iobp  
iolat  
iosu  
ioh  
0.3  
1.9  
0.3  
2.3  
24 I/O Register Setup Time before Clock  
25 I/O Register Hold Time after Clock  
26 I/O Register Clock to Out Delay  
27 I/O Register Reset to Out Delay  
28 Dedicated Input Delay  
3.0  
0.0  
3.5  
0.0  
ioco  
ior  
4.6  
4.6  
2.3  
5.0  
5.0  
2.7  
din  
GRP  
29 GRP Delay, 1 GLB Load  
30 GRP Delay, 4 GLB Loads  
31 GRP Delay, 8 GLB Loads  
32 GRP Delay, 16 GLB Loads  
33 GRP Delay, 32 GLB Loads  
ns  
ns  
ns  
ns  
ns  
t
t
t
grp1  
grp4  
grp8  
1.8  
2.0  
2.3  
2.8  
3.8  
1.9  
2.4  
2.4  
3.0  
4.2  
t
grp16  
t
grp32  
GLB  
34 4 Prod.Term Bypass Path Delay (Combinatorial)  
35 4 Prod. Term Bypass Path Delay (Registered)  
36 1 Prod.Term/XOR Path Delay  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
4ptbpc  
4ptbpr  
1ptxor  
20ptxor  
xoradj  
gbp  
3.9  
4.0  
3.6  
5.0  
5.0  
0.4  
5.3  
5.3  
4.6  
5.8  
6.3  
1.0  
t
t
t
t
t
t
t
t
t
t
t
t
37 20 Prod. Term/XOR Path Delay  
38 XOR Adjacent Path Delay 3  
39 GLB Register Bypass Delay  
40 GLB Register Setup Time before Clock  
41 GLB Register Hold Time after Clock  
42 GLB Register Clock to Output Delay  
43 GLB Register Reset to Output Delay  
44 GLB Prod.Term Reset to Register Delay  
45 GLB Prod. Term Output Enable to I/O Cell Delay  
46 GLB Prod. Term Clock Delay  
0.1  
4.5  
0.5  
5.8  
gsu  
gh  
gco  
2.3  
4.9  
3.9  
5.4  
4.0  
2.5  
6.2  
4.5  
7.2  
4.7  
gro  
ptre  
ptoe  
ptck  
2.9  
3.5  
ORP  
47 ORP Delay  
ns  
ns  
t
t
orp  
1.0  
0.0  
1.0  
0.0  
48 ORP Bypass Delay  
orpbp  
Table 2-0036A/1032E  
1. Internal Timing Parameters are not tested and are for reference only.  
2. Refer to Timing Model in this data sheet for further details.  
3. The XOR adjacent path can only be used by hard macros.  
7
Specifications ispLSI 1032E  
1
Internal Timing Parameters  
-80  
-70  
-90  
2
PARAM.  
#
DESCRIPTION  
UNITS  
MIN. MAX. MIN. MAX. MIN. MAX.  
Inputs  
22 I/O Register Bypass  
23 I/O Latch Delay  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
0.3  
2.3  
t
t
t
t
t
t
t
iobp  
iolat  
iosu  
ioh  
0.3  
2.7  
0.3  
3.3  
3.5  
0.0  
24 I/O Register Setup Time before Clock  
25 I/O Register Hold Time after Clock  
26 I/O Register Clock to Out Delay  
27 I/O Register Reset to Out Delay  
28 Dedicated Input Delay  
3.5  
0.0  
4.0  
0.0  
5.0  
5.0  
2.6  
ioco  
ior  
5.4  
5.4  
2.8  
6.1  
6.0  
2.8  
din  
GRP  
29 GRP Delay, 1 GLB Load  
30 GRP Delay, 4 GLB Loads  
31 GRP Delay, 8 GLB Loads  
32 GRP Delay, 16 GLB Loads  
33 GRP Delay, 32 GLB Loads  
ns  
ns  
ns  
ns  
ns  
2.1  
2.3  
2.6  
3.2  
4.4  
t
t
t
grp1  
grp4  
grp8  
2.2  
2.5  
2.8  
3.5  
4.8  
2.5  
2.5  
3.2  
4.0  
5.6  
t
grp16  
t
grp32  
GLB  
34 4 Prod.Term Bypass Path Delay (Combinatorial)  
35 4 Prod. Term Bypass Path Delay (Registered)  
36 1 Prod.Term/XOR Path Delay  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
5.7  
6.1  
5.6  
6.8  
7.1  
0.4  
t
4ptbpc  
4ptbpr  
1ptxor  
20ptxor  
xoradj  
gbp  
7.1  
6.7  
6.6  
7.8  
8.2  
1.3  
8.8  
7.2  
8.3  
8.7  
9.2  
1.6  
t
t
t
t
t
t
t
t
t
t
t
t
37 20 Prod. Term/XOR Path Delay  
38 XOR Adjacent Path Delay 3  
39 GLB Register Bypass Delay  
0.2  
6.8  
40 GLB Register Setup Time before Clock  
41 GLB Register Hold Time after Clock  
42 GLB Register Clock to Output Delay  
43 GLB Register Reset to Output Delay  
44 GLB Prod.Term Reset to Register Delay  
45 GLB Prod. Term Output Enable to I/O Cell Delay  
46 GLB Prod. Term Clock Delay  
0.5  
7.9  
gsu  
0.5  
8.8  
gh  
2.9  
6.3  
5.1  
7.1  
5.3  
gco  
2.9  
6.4  
5.5  
8.0  
2.9  
6.8  
5.8  
9.0  
6.2  
gro  
ptre  
ptoe  
ptck  
4.1  
4.5  
5.8 4.8  
ORP  
47 ORP Delay  
ns  
ns  
1.0  
0.0  
t
t
orp  
1.0  
0.0  
1.0  
0.0  
48 ORP Bypass Delay  
orpbp  
Table 2-0036B/1032E  
1. Internal Timing Parameters are not tested and are for reference only.  
2. Refer to Timing Model in this data sheet for further details.  
3. The XOR adjacent path can only be used by hard macros.  
8
Specifications ispLSI 1032E  
1
Internal Timing Parameters  
-125  
MIN. MAX. MIN. MAX.  
-100  
PARAM.  
#
DESCRIPTION  
UNITS  
Outputs  
1.3  
9.9  
4.3  
4.3  
2.7  
2.0  
10.0  
5.1  
49 Output Buffer Delay  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
ob  
50 Output Buffer Delay, Slew Limited Adder  
51 I/O Cell OE to Output Enabled  
52 I/O Cell OE to Output Disabled  
53 Global OE  
sl  
oen  
odis  
goe  
5.1  
3.9  
Clocks  
1.4  
1.4  
1.8  
0.0  
1.8  
1.5  
1.5  
1.8  
0.0  
1.8  
1.4  
1.4  
0.8  
0.0  
0.8  
1.5  
1.5  
0.8  
0.0  
0.8  
54 Clk Delay, Y0 to Global GLB Clk Line (Ref. clk)  
55 Clk Delay, Y1 or Y2 to Global GLB Clk Line  
56 Clk Delay, Clock GLB to Global GLB Clk Line  
57 Clk Delay, Y2 or Y3 to I/O Cell Global Clk Line  
58 Clk Delay, Clk GLB to I/O Cell Global Clk Line  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
gy0  
gy1/2  
gcp  
ioy2/3  
iocp  
Global Reset  
2.8  
4.3  
59 Global Reset to GLB and I/O Registers  
ns  
t
gr  
Table 2-0037A/1032E  
1. Internal Timing Parameters are not tested and are for reference only.  
9
Specifications ispLSI 1032E  
1
Internal Timing Parameters  
-80  
-70  
-90  
PARAM.  
#
DESCRIPTION  
UNITS  
MIN. MAX. MIN. MAX. MIN. MAX.  
Outputs  
1.7  
10.0  
5.3  
2.1  
10.0  
5.7  
2.6  
10.0  
6.2  
49 Output Buffer Delay  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
ob  
50 Output Buffer Delay, Slew Limited Adder  
51 I/O Cell OE to Output Enabled  
52 I/O Cell OE to Output Disabled  
53 Global OE  
sl  
oen  
odis  
goe  
5.3  
5.7  
6.2  
3.7  
4.3  
5.8  
Clocks  
1.4  
2.9  
1.8  
0.0  
1.8  
1.5  
3.1  
1.8  
0.0  
1.8  
1.5 1.5  
1.5 1.5  
0.8 1.8  
0.0 0.0  
0.8 1.8  
54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock)  
55 Clock Delay, Y1 or Y2 to Global GLB Clock Line  
56 Clock Delay, Clock GLB to Global GLB Clock Line  
57 Clock Delay, Y2 or Y3 to I/O Cell Global Clock Line  
58 Clock Delay, Clock GLB to I/O Cell Global Clock Line  
1.4  
2.4  
0.8  
0.0  
0.8  
1.5  
2.6  
0.8  
0.0  
0.8  
ns  
ns  
ns  
ns  
ns  
t
t
t
t
t
gy0  
gy1/2  
gcp  
ioy2/3  
iocp  
Global Reset  
4.5  
4.5  
4.6  
59 Global Reset to GLB and I/O Registers  
ns  
t
gr  
Table 2-0037B/1032E  
1. Internal Timing Parameters are not tested and are for reference only.  
10  
Specifications ispLSI 1032E  
ispLSI 1032E Timing Model  
I/O Cell  
GRP  
GLB  
ORP  
I/O Cell  
Feedback  
#34  
Ded. In  
#28  
Comb 4 PT Bypass  
I/O Reg Bypass  
#22  
GRP4  
#30  
Reg 4 PT Bypass  
#35  
GLB Reg Bypass  
#39  
ORP Bypass  
#48  
#49, 50  
I/O Pin  
(Input)  
I/O Pin  
(Output)  
Input  
Register  
20 PT  
XOR Delays  
GLB Reg  
Delay  
ORP  
Delay  
GRP Loading  
Delay  
Q
D
#51, 52  
RST  
D
Q
#47  
#36 - 38  
#59  
#29, 31 - 33  
#59  
#23 - 27  
RST  
Reset  
#40 - 43  
Clock  
Control  
PTs  
RE  
OE  
CK  
Distribution  
0491  
Y1,2,3  
#55 - 58  
#44 - 46  
#54  
#53  
Y0  
GOE 0,1  
Derivations of tsu, th and tco from the Product Term Clock1  
tsu  
th  
= Logic + Reg su - Clock (min)  
= (tiobp + tgrp4 + t20ptxor) + (tgsu) – (tiobp + tgrp4 + tptck(min))  
= (#22 + #30 + #37) + (#40) – (#22 + #30 + #46)  
2.2 ns = (0.3 + 2.0 + 5.0) + (0.1) – (0.3 + 2.0 + 2.9)  
= Clock (max) + Reg h - Logic  
= (tiobp + tgrp4 + tptck(max)) + (tgh) – (tiobp + tgrp4 + t20ptxor)  
= (#22 + #30 + #46) + (#41) - (#22 + #30 + #37)  
3.5 ns  
= (0.3 + 2.0 + 4.0) + (4.5) – (0.3 + 2.0 + 5.0)  
tco  
= Clock (max) + Reg co + Output  
= (tiobp + tgrp4 + tptck(max)) + (tgco) + (torp + tob)  
= (#22 + #30 + #46) + (#42) + (#47 + #49)  
10.9 ns = (0.3 + 2.0 + 4.0) + (2.3) + (1.0 + 1.3)  
1
Derivations of tsu, th and tco from the Clock GLB  
tsu  
= Logic + Reg su - Clock (min)  
= (tiobp + tgrp4 + t20ptxor) + (tgsu) – (tgy0(min) + tgco + tgcp(min))  
= (#22 + #30 + #37) + (#40) – (#54 + #42 + #56)  
2.9 ns = (0.3 + 2.0 + 5.0) + (0.1) – (1.4 + 2.3 + 0.8)  
th  
= Clock (max) + Reg h - Logic  
= (tgy0(max) + tgco + tgcp(max)) + (tgh) – (tiobp + tgrp4 + t20ptxor)  
= (#54 + #42 + #56) + (#41) – (#22 + #30 + #37)  
= (1.4 + 2.3 + 1.8) + (4.5) – (0.3 + 2.0 + 5.0)  
2.7 ns  
tco  
= Clock (max) + Reg co + Output  
= (tgy0(max) + tgco + tgcp(max)) + (tgco) + (torp + tob)  
= (#54 + #42 + #56) + (#42) + (#47 + #49)  
5.5 ns = (1.4 + 2.3 + 1.8) + (2.3) + (1.0 + 1.3)  
1. Calculations are based upon timing specifications for the ispLSI 1032E-125.  
Table 2-0042a/1032E  
11  
Specifications ispLSI 1032E  
Maximum GRP Delay vs GLB Loads  
6.0  
ispLSI 1032E-70  
5.0  
4.0  
ispLSI 1032E-80  
ispLSI 1032E-90/100  
ispLSI 1032E-125  
3.0  
2.0  
1.0  
1
4
8
16  
32  
GLB Load  
GRP/GLB/1032E  
Power Consumption  
Power consumption in the ispLSI 1032E device depends 3 shows the relationship between power and operating  
on two primary factors: the speed at which the device is speed.  
operating, and the number of product terms used. Figure  
Figure 3. Typical Device Power Consumption vs fmax  
350  
ispLSI 1032E  
300  
250  
200  
150  
100  
40  
20  
60  
80  
125  
0
100  
fmax (MHz)  
Notes: Configuration of eight 16-bit counters  
Typical current at 5V, 25°C  
I CC can be estimated for the ispLSI 1032E using the following equation:  
I CC(mA) = 15 + (# of PTs 0.59) + (# of nets Max freq 0.0078)  
*
*
*
Where:  
# of PTs = Number of Product Terms used in design  
# of nets = Number of Signals used in device  
Max freq = Highest Clock Frequency to the device (in MHz)  
The ICC estimate is based on typical conditions (V  
loads on average exists. These values are for estimates only. Since the value of ICC is sensitive to operating  
conditions and the program in the device, the actual ICC should be verified.  
= 5.0V, room temperature) and an assumption of four GLB  
CC  
0127/1032E  
12  
Specifications ispLSI 1032E  
Pin Description  
PLCC PIN  
NUMBERS  
TQFP PIN  
NUMBERS  
NAME  
DESCRIPTION  
Input/Output Pins - These are the general purpose I/O pins used by the logic  
array.  
26, 27, 28, 29,  
30, 31, 32, 33,  
34, 35, 36, 37,  
38, 39, 40, 41,  
45, 46, 47, 48,  
49, 50, 51, 52,  
53, 54, 55, 56,  
57, 58, 59, 60,  
68, 69, 70, 71,  
72, 73, 74, 75,  
76, 77, 78, 79,  
80, 81, 82, 83,  
I/O 0 - I/O 3  
I/O 4 - I/O 7  
17, 18, 19, 20,  
21, 22, 23, 28,  
29, 30, 31, 32,  
33, 34, 35, 36,  
40, 41, 42, 43,  
44, 45, 46, 47,  
48, 53, 54, 55,  
56, 57, 58, 59,  
67, 68, 69, 70,  
71, 72, 73, 78,  
79, 80, 81, 82,  
83, 84, 85, 86,  
90, 91, 92, 93,  
94, 95, 96, 97,  
I/O 8 - I/O 11  
I/O 12 - I/O 15  
I/O 16 - I/O 19  
I/O 20 - I/O 23  
I/O 24 - I/O 27  
I/O 28 - I/O 31  
I/O 32 - I/O 35  
I/O 36 - I/O 39  
I/O 40 - I/O 43  
I/O 44 - I/O 47  
I/O 48 - I/O 51  
I/O 52 - I/O 55  
I/O 56 - I/O 59  
I/O 60 - I/O 63  
3,  
7,  
4,  
8,  
5, 6,  
9, 10,  
11, 12, 13, 14,  
15, 16, 17, 18  
98,  
6,  
3,  
7,  
4, 5,  
8,  
9
GOE 0/IN 43  
This is a dual function pin. It can be used either as Global Output Enable for  
all I/O cells or it can be used as a dedicated input pin.  
67  
66  
GOE 1/IN 53  
This is a dual function pin. It can be used either as Global Output Enable for  
all I/O cells or it can be used as a dedicated input pin.  
84  
87  
2,  
19  
Dedicated input pins to the device.  
89, 10  
14  
IN 6, IN 7  
ispEN  
Input - Dedicated in-system programming enable input pin. This pin is  
brought low to enable the programming mode. The MODE, SDI, SDO and  
SCLK options become active.  
23  
SDI/IN 02  
25  
Input - This pin performs two functions. When ispEN is logic low, it functions  
as an input pin to load programming data into the device. SDI/IN 0 is also  
used as one of the two control pins for the isp state machine. It is a  
dedicated input pin when ispEN is logic high.  
Input - This pin performs two functions. When ispEN is logic low, it functions  
as pin to control the operation of the isp state machine. It is a dedicated  
input pin when ispEN is logic high.  
16  
MODE/IN 12  
SDO/IN 22  
SCLK/IN 32  
42  
44  
61  
37  
39  
60  
Output/Input - This pin performs two functions. When ispEN is logic low, it  
functions as an output pin to read serial shift register data. It is a dedicated  
input pin when ispEN is logic high.  
Input - This pin performs two functions. When ispEN is logic low, it functions  
as a clock pin for the Serial Shift Register. It is a dedicated input pin when  
ispEN is logic high.  
Active Low (0) Reset pin which resets all of the GLB and I/O registers in the  
device.  
RESET  
Y0  
24  
20  
66  
15  
11  
65  
Dedicated Clock input. This clock input is connected to one of the clock  
inputs of all of the GLBs on the device.  
Dedicated Clock input. This clock input is brought into the clock distribution  
network, and can optionally be routed to any GLB on the device.  
Y1  
Dedicated Clock input. This clock input is brought into the clock distribution  
network, and can optionally be routed to any GLB and/or any I/O cell on the  
device.  
Y2  
Y3  
63  
62  
62  
61  
Dedicated Clock input. This clock input is brought into the clock distribution  
network, and can optionally be routed to any I/O cell on the device.  
Ground (GND)  
Vcc  
1, 22, 43, 64  
21, 65  
GND  
VCC  
13, 38, 63, 88  
12, 64  
1
NC  
1, 2,  
24, 25, No connect.  
26, 27, 49, 50,  
51, 52, 74, 75,  
76, 77, 99, 100  
Table 2-0002A/1032E  
1. NC pins are not to be connected to any active signals, Vcc or GND.  
2. Pins have dual function capability.  
3. Pins have dual function capability which is software selectable.  
13  
Specifications ispLSI 1032E  
Pin Configurations  
ispLSI 1032E 84-Pin PLCC Pinout Diagram  
11 10 9  
8
7
6
5
4
3
2
1 84 83 82 81 80 79 78 77 76 75  
I/O 57  
I/O 58  
I/O 59  
I/O 60  
I/O 61  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
I/O 38  
I/O 37  
I/O 36  
I/O 35  
I/O 34  
I/O 62  
I/O 63  
IN 7  
I/O 33  
I/O 32  
GOE 0/IN 42  
Y1  
Y0  
VCC  
VCC  
ispLSI 1032E  
GND  
ispEN  
RESET  
GND  
Y2  
Top View  
Y3  
1SDI/IN 0  
SCLK/IN 31  
I/O 0  
I/O 31  
I/O 1  
I/O 30  
I/O 2  
I/O 29  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
I/O 28  
I/O 27  
I/O 26  
I/O 25  
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53  
1. Pins have dual function capability.  
3. Pins have dual function capability which is software selectable.  
0123-32-isp  
14  
Specifications ispLSI 1032E  
Pin Configurations  
ispLSI 1032E 100-Pin TQFP Pinout Diagram  
3NC  
3NC  
1
2
3
4
5
6
7
8
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
NC3  
NC3  
I/O 57  
I/O 58  
I/O 59  
I/O 60  
I/O 61  
I/O 62  
I/O 63  
IN 7  
I/O 38  
I/O 37  
I/O 36  
I/O 35  
I/O 34  
I/O 33  
I/O 32  
GOE 0/IN 42  
Y1  
VCC  
GND  
Y2  
Y3  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
Y0  
VCC  
GND  
ispLSI 1032E  
ispEN  
RESET  
1SDI/IN 0  
I/O 0  
Top View  
SCLK/IN 31  
I/O 31  
I/O 30  
I/O 29  
I/O 28  
I/O 27  
I/O 26  
I/O 25  
NC3  
I/O 1  
I/O 2  
I/O 3  
I/O 4  
I/O 5  
I/O 6  
3NC  
3NC  
NC3  
1. Pins have dual function capability.  
2. Pins have dual function capability which is software selectable.  
3. NC pins are not to be connected to any active signal, VCC or GND.  
0766A-32E-isp  
15  
Specifications ispLSI 1032E  
Part Number Description  
1032E XXX  
X
X
X
ispLSI  
Device Family  
Device Number  
Grade  
Blank = Commercial  
I = Industrial  
Package  
J = PLCC  
T = TQFP  
Speed  
Power  
L = Low  
125 = 125 MHz  
100 = 100 MHz  
f
f
max  
max  
0212/1032E  
90 = 90 MHz  
80 = 80 MHz  
70 = 70 MHz  
fmax  
fmax  
fmax  
ispLSI 1032E Ordering Information  
COMMERCIAL  
FAMILY  
fmax (MHz)  
tpd (ns)  
7.5  
7.5  
10  
ORDERING NUMBER  
ispLSI 1032E-125LJ  
ispLSI 1032E-125LT  
ispLSI 1032E-100LJ  
ispLSI 1032E-100LT  
ispLSI 1032E-90LJ  
ispLSI 1032E-90LT  
ispLSI 1032E-80LJ  
PACKAGE  
84-Pin PLCC  
100-Pin TQFP  
84-Pin PLCC  
100-Pin TQFP  
84-Pin PLCC  
100-Pin TQFP  
84-Pin PLCC  
125  
125  
100  
100  
90  
10  
10  
ispLSI  
90  
10  
80  
12  
80  
70  
70  
12  
15  
15  
ispLSI 1032E-80LT  
ispLSI 1032E-70LJ  
ispLSI 1032E-70LT  
100-Pin TQFP  
84-Pin PLCC  
100-Pin TQFP  
Table 2-0041A/1032E  
INDUSTRIAL  
FAMILY  
ispLSI  
fmax (MHz)  
tpd (ns)  
15  
ORDERING NUMBER  
ispLSI 1032E-70LJI  
ispLSI 1032E-70LTI  
PACKAGE  
84-Pin PLCC  
100-Pin TQFP  
70  
70  
15  
Table 2-0041B/1032E  
16  

相关型号:

ISPLSI1032E100LJ

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LJI

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LJN

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LJNI

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LT

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LTI

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LTN

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E100LTNI

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E125LJ

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E125LJI

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E125LJN

In-System Programmable High Density PLD
LATTICE

ISPLSI1032E125LJNI

In-System Programmable High Density PLD
LATTICE