SMD7050 [LGE]

SMD Crystal; SMD晶体


型号：	SMD7050
厂家：	LGE
描述：	SMD Crystal SMD晶体晶体
文件：	总4页 (文件大小：257K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

SMD7050

SMD Crystal

Ⅰ晶振电性能 Electrical Characteristics

1．标称频率

14.7456 MHZ

基频 / AT 切

Nominal Frequency

2．振动模式

Mode of vibration

3．工作温度范围

Operating Temperature Range

4．保存温度范围

Storage Temperature Range

5．频率偏差

Adjustment Tolerance

6．温度偏差

－ 20 ℃～＋ 70 ℃

－55℃～＋125℃

± 20 ppm Max

± 30 ppm Max

50 Ω Max．at 25℃

Tolerance over the Temperature Range

7．等效电阻

Equivalent Series Resistance

8．静电容

5.0

pF Max

Shunt Capacitance

-5

9．气密性测试

Gross Leak: 1.3*10 Pa.m /s Max

-9

Leakage

Fine Leak:

2.1*10 Pa.m /s Max

10．老化率

Aging

11．外形尺寸

Dimensions

±5ppm Max/Y

7.0*5.0*1.1mm

Ⅱ．测试条件 Test Condition

1.负载电容

____18.0____pF

____100___μW

Load Capacitance

2.激励功率

Level of Drive

3.测试仪表 Equipment

HP-E5100

Net analysis meter/AX-150U

Heli0t-706/w Helium Leak Test

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SMD7050

SMD Crystal

SMD7050 晶体外型尺寸 Dimensions

UNIT: mm

SMD7050 晶体外型尺寸（mm）

包装 PACKING

每1000 只晶体进行编带包装，每1 万只晶体放入一包装盒内。同时，包装

形式也依赖于具体数量而更改。

Deposit 1000 pieces of the quartz crystal units in tape model, and pack enough

bags in a packing case to make a 10,000 pieces package. The packing format may be

subject to change by quantity.

SMD7050 编带尺寸图

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SMD7050

SMD Crystal

Ⅷ．可靠性试验项目

Reliability Test Items

1．机械性能试验 Mechanical Performance Tests

试验项目

试验方法

Test Method

规格 No.

Test Item

Spec. No

从75 厘米高，3 次，自由落在3 厘米的硬木板上

耐冲击

Orient the sample in any attitude and drop it three times from a

height of 75 cm onto a hardwood board with a thickness of 3 cm

1-1

1-2

shock

振动频率10～55Hz,振幅1.5mm 时间1.5 分钟循环,在X、Y、

Z 轴方向各2 小时，总计6 小时。

耐振性

Subject the sample to 1.5-minute cycles of frequencies of 10 to 55

Hz and amplitudes of 1.5mm for two hours in each of the X,Y, and

Z directions, or 6 hours in total.

Vibration

用氦质谱仪测试或加压测绝缘电阻

Take measurements with a helium leakage detector，or measure

insulation resistance under pressure.

气密性

1-3

Leaking Test

1．回流焊曲线图

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SMD7050

SMD Crystal

Ⅷ．可靠性试项目

Reliability Test Items

3．环境测试 Environmental Tests

试验项目

试验方法

规格 No.

Test Item

Test Method

Spec. No.

耐寒性

在-40℃环境中非工作状态放置500 小时

2-1

2-2

Cold

Expose the sample in an inoperative mode to 500 hours in a -40℃

在+85℃环境中非工作状态放置500 小时

耐热性

Dry heat

Expose the sample in an inoperative mode to 500 hours in a 85℃

在温度+65℃，湿度95%环境中非工作状态放置500 小时

Expose the sample in an inoperative mode to 500 hours in a

65℃，and 95%RH

耐湿性

2-3

2-4

Damp heat

热冲击

Thermal

shock

在-40℃保持30 分钟，100℃保持30 分钟，循环5 次。

Subject the sample to 5 temperature variation cycles at -40℃ for

30 minutes and +100℃ for the next 30 minutes in each cycles.

SPECIFICATIONS 规格

规格 No.

规

格

Spec No.

Specification

试验前后,频率变化在±5ppm 以内,等效电阻变化在要求范围内。

Any variation between the pre- and post-test frequencies shall remain within ±5ppm. The

post-test equivalent series resistance shall remain within its specified tolerance range.

试验前后,频率变化在±10ppm 以内,等效电阻变化在要求范围内。

Any variation between the pre- and post-test frequencies shall remain within ±10ppm.

The post-test equivalent series resistance shall remain within its specified tolerance range.

试验前后,外观未见明显损伤，气密性末破坏。

After each test, no visible damage shall be manifested, nor shall the hermetic seal break

down.

上锡量至少在90%以上.

At least 90% of each dipped area shall be covered by fresh solder

1×10^-2μPa．m³/s Max or IR≥500MΩ

※测试在室温25±2℃环境中进行，每次试验后，样品必须在25±2℃环境中

恢复2 小时以上。

※ Measurements shall be taken at 25±2℃,and after each test, the sample be

exposed to two hours at 25±2℃

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SMD7050 [LGE]

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