LHY2040

更新时间:2024-09-18 07:31:26
品牌:LIGITEK
描述:ROUND TYPE LED LAMPS

LHY2040 概述

ROUND TYPE LED LAMPS ROUND型LED灯

LHY2040 数据手册

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LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
OFFICE:7F.,NO.208,SEC.3,JHONGYANG Rd.,Tucheng City Taipei Hsien,Taiwan R.O.C  
TEL:(02)22677686(REP)  
FAX:(02)22675286,(02)22695616  
ROUND TYPE LED LAMPS  
LHY2040  
DATA SHEET  
DOC. NO : QW0905-LHY2040  
A
REV.  
:
DATE  
: 22 - Oct - 2004  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page  
PART NO. LHY2040  
1/4  
Package Dimensions  
3.0  
4.2  
4.0  
5.2  
1.5MAX  
25.0MIN  
0.5  
TYP  
1.0MIN  
2.54TYP  
-
+
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted.  
2.Specifications are subject to change without notice.  
Directivity Radiation  
0°  
-30°  
30°  
-60°  
60°  
100% 75% 50% 25% 0 25% 50% 75%100%  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page2/4  
PART NO. LHY2040  
Absolute Maximum Ratings at Ta=25℃  
Ratings  
HY  
Symbol  
Parameter  
UNIT  
30  
IF  
IFP  
Forward Current  
Peak Forward Current  
Duty 1/10@10KHz  
mA  
mA  
60  
mW  
μA  
Power Dissipation  
75  
PD  
Ir  
Reverse Current @5V  
Electrostatic Discharge  
Operating Temperature  
Storage Temperature  
10  
ESD  
Topr  
Tstg  
2000  
-40 ~ +85  
-40 ~ +100  
V
Max 260for 5 sec Max  
Soldering Temperature  
Tsol  
(2mm from body)  
Typical Electrical & Optical Characteristics (Ta=25 )  
Forward  
voltage  
@20mA(V)  
Dominant  
wave  
Viewing  
angle  
2θ1/2  
(deg)  
Luminous  
intensity  
@20mA(mcd)  
Spectral  
halfwidth  
△λnm  
COLOR  
length  
PART NO  
LHY2040  
MATERIAL  
AlGaInP  
λDnm  
Typ.  
Emitted  
Yellow  
Lens  
Yellow Diffused  
Min. Max. Min.  
595  
15  
1.7  
2.6 220 450  
36  
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.  
2. The luminous intensity data did not including ±15% testing tolerance.  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page  
PART NO. LHY2040  
3/4  
Typical Electro-Optical Characteristics Curve  
HY CHIP  
Fig.1 Forward current vs. Forward Voltage  
Fig.2 Relative Intensity vs. Forward Current  
1000  
100  
10  
3.0  
2.5  
2.0  
1.5  
1.0  
1.0  
0.5  
0.0  
0.1  
1.0  
1.5  
2.0  
2.5  
3.0  
1.0  
10  
100  
1000  
Forward Current(mA)  
Forward Voltage(V)  
Fig.3 Forward Voltage vs. Temperature  
Fig.4 Relative Intensity vs. Temperature  
1.2  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
1.1  
1.0  
0.9  
0.8  
0.0  
-40  
-20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80 100  
Ambient Temperature()  
Ambient Temperature()  
Fig.5 Relative Intensity vs. Wavelength  
1.0  
0.5  
0.0  
550  
600  
650  
500  
Wavelength (nm)  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page  
PART NO. LHY2040  
4/4  
Reliability Test:  
Reference  
Standard  
Description  
Test Item  
Test Condition  
1.Under Room Temperature  
2.If=20mA  
3.t=1000 hrs (-24hrs, +72hrs)  
This test is conducted for the purpose  
of detemining the resisance of a part  
in electrical and themal stressed.  
MIL-STD-750: 1026  
MIL-STD-883: 1005  
JIS C 7021: B-1  
Operating Life Test  
The purpose of this is the resistance of  
the device which is laid under ondition  
of hogh temperature for hours.  
High Temperature  
Storage Test  
1.Ta=105±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
MIL-STD-883:1008  
JIS C 7021: B-10  
The purpose of this is the resistance  
of the device which is laid under  
condition of low temperature for hours.  
Low Temperature  
Storage Test  
1.Ta=-40±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
JIS C 7021: B-12  
1.Ta=65±5℃  
2.RH=90%~95%  
3.t=240hrs±2hrs  
High Temperature  
High Humidity Test  
The purpose of this test is the resistance  
of the device under tropical for hous.  
MIL-STD-202:103B  
JIS C 7021: B-11  
The purpose of this is the resistance of  
the device to sudden extreme changes  
in high and low temperature.  
1.Ta=105±5&-40±5℃  
(10min) (10min)  
2.total 10 cycles  
MIL-STD-202: 107D  
MIL-STD-750: 1051  
MIL-STD-883: 1011  
Thermal Shock Test  
This test intended to determine the  
thermalcharacteristic resistance  
of the device to sudden exposures  
at extreme changes in temperature  
when soldering the lead wire.  
MIL-STD-202: 210A  
MIL-STD-750: 2031  
JIS C 7021: A-1  
Solder Resistance  
Test  
1.T.Sol=260±5℃  
2.Dwell time= 10±1sec.  
MIL-STD-202: 208D  
MIL-STD-750: 2026  
MIL-STD-883: 2003  
JIS C 7021: A-2  
This test intended to see soldering well  
performed or not.  
1.T.Sol=230±5℃  
2.Dwell time=5±1sec  
Solderability Test  

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