LTD315-66-XX-RP12-PF [LIGITEK]

TRIPLE DIGIT LED DISPLAY; 三位数的LED显示屏
LTD315-66-XX-RP12-PF
型号: LTD315-66-XX-RP12-PF
厂家: LIGITEK ELECTRONICS CO., LTD.    LIGITEK ELECTRONICS CO., LTD.
描述:

TRIPLE DIGIT LED DISPLAY
三位数的LED显示屏

文件: 总9页 (文件大小:143K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
TRIPLE DIGIT LED DISPLAY (0.36 Inch)  
Pb  
Lead-Free Parts  
LTD315/66-XX/RP12-PF  
DATA SHEET  
DOC. NO : QW0905-LTD315/66-XX/RP12-PF  
REV.  
: A  
DATE  
: 19 - Mar.- 2007  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page 1/8  
PART NO. LTD315/66-XX/RP12-PF  
Package Dimensions  
22.5  
7.25  
(0.886")  
(0.283")  
DIG.1  
DIG.2  
DIG.3  
9.14  
(0.36")  
14.0  
(0.551")  
10.16  
(0.4")  
ψ1.0  
LTD315/66-XX/RP12-PF  
LIGITEK  
A
F
B
G
E
C
DP  
D
Ø 0.51  
12.0±0.5  
TYP  
2.54X5=  
12.7(0.5")  
PIN NO.1  
Note : 1.All dimension are in millimeters and (lnch) tolerance is ±0.25mm unless otherwise noted.  
2.Specifications are subject to change without notice.  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page 2/8  
PART NO. LTD315/66-XX/RP12-PF  
Internal Circuit Diagram  
LTD3156-XX/RP12-PF  
9
8
12  
DIG.1  
DIG.2  
DIG.3  
A B C D E F GDP A B C D E F GDP A B C D E F GDP  
4
3
10 5  
11 7 2 1  
LTD3166-XX/RP12-PF  
12  
DIG.1  
9
8
DIG.2  
DIG.3  
A B C D E F GDP A B C D E F GDP A B C D E F GDP  
4
3
10 5  
7
11  
2 1  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
Page 3/8  
PART NO. LTD315/66-XX/RP12-PF  
Electrical Connection  
PIN NO.  
1
LTD3156-XX/RP12-PF  
PIN NO.  
1
LTD3166-XX/RP12-PF  
Cathode E  
Anode E  
Anode D  
Cathode D  
2
3
2
3
Anode DP  
Cathode DP  
C
G
C
G
Anode  
Anode  
Cathode  
Cathode  
4
4
5
5
6
No Connect  
6
No Connect  
Anode B  
B
Cathode  
7
7
Common Cathode Dig.3  
Common Cathode Dig.2  
Anode F  
Common Anode Dig.3  
Common Anode Dig.2  
Cathode F  
8
8
9
9
10  
11  
12  
10  
11  
12  
Anode A  
Cathode A  
Common Cathode Dig.1  
Common Anode Dig.1  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LTD315/66-XX/RP12-PF  
4/8  
Page  
Absolute Maximum Ratings at Ta=25  
Ratings  
HR  
Symbol  
Parameter  
UNIT  
Forward Current Per Chip  
IF  
30  
mA  
mA  
Peak Forward Current Per  
Chip (Duty 1/10,0.1ms  
Pulse Width)  
100  
IFP  
Power Dissipation Per Chip  
mW  
PD  
100  
10  
μA  
Reverse Current Per Any Chip  
Operating Temperature  
Ir  
Topr  
Tstg  
-25 ~ +85  
-25 ~ +85  
Storage Temperature  
Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260 ℃  
Part Selection And Application Information(Ratings at 25)  
Electrical  
common  
cathode  
or anode  
CHIP  
Emitted  
λP  
(nm)  
△λ  
(nm)  
Vf(v)  
Typ.  
Iv(mcd)  
Typ.  
Min.  
IV-M  
PART NO  
Max.  
Min.  
1.5  
Material  
Common  
Cathode  
LTD3156-XX/RP12-PF  
LTD3166-XX/RP12-PF  
660  
20  
1.8  
2.4 3.05 5.0  
2:1  
GaAlAs Red  
Common  
Anode  
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.  
2. The luminous intensity data did not including ±15% testing tolerance.  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LTD315/66-XX/RP12-PF  
Page 5/8  
Test Condition For Each Parameter  
Symbol  
Unit  
volt  
Test Condition  
Parameter  
Forward Voltage Per Chip  
Vf  
If=20mA  
If=10mA  
If=20mA  
If=20mA  
Vr=5V  
Luminous Intensity Per Chip  
Peak Wavelength  
Iv  
mcd  
nm  
λP  
△λ  
Ir  
Spectral Line Half-Width  
Reverse Current Any Chip  
Luminous Intensity Matching Ratio  
nm  
μA  
IV-M  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LTD315/66-XX/RP12-PF  
Page6/8  
Typical Electro-Optical Characteristics Curve  
HR CHIP  
Fig.1 Forward current vs. Forward Voltage  
Fig.2 Relative Intensity vs. Forward Current  
3.0  
1000  
2.5  
2.0  
1.5  
100  
10  
1.0  
0.5  
1.0  
0.1  
0
1.0  
2.0  
3.0  
4.0  
5.0  
1.0  
10  
100  
1000  
Forward Current(mA)  
Forward Voltage(V)  
Fig.3 Forward Voltage vs. Temperature  
Fig.4 Relative Intensity vs. Temperature  
3.0  
2.5  
2.0  
1.2  
1.1  
1.0  
1.5  
1.0  
0.5  
0.9  
0.8  
0
-40  
-20  
-0  
20  
40  
60  
80  
100  
-40  
-20  
-0  
20  
40  
60  
80  
100  
Ambient Temperature()  
Ambient Temperature()  
Fig.5 Relative Intensity vs. Wavelength  
1.0  
0.5  
0
600  
650  
700  
750  
Wavelength (nm)  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
PART NO. LTD315/66-XX/RP12-PF  
Page 7/8  
Soldering Condition(Pb-Free)  
1.Iron:  
Soldering Iron:30W Max  
Temperature 350°C Max  
Soldering Time:3 Seconds Max(One time only)  
Distance:Solder Temperature 1/16 Inch Below Seating  
Plane For 3 Seconds At 260°C  
2.Wave Soldering Profile  
Dip Soldering  
Preheat: 120°C Max  
Preheat time: 60seconds Max  
Ramp-up  
2°C/sec(max)  
Ramp-Down:-5°C/sec(max)  
Solder Bath:260°C Max  
Dipping Time:3 seconds Max  
Distance:Solder Temperature 1/16 Inch Below Seating  
Plane For 3 Seconds At 260°C  
Temp(°C)  
260°C3sec Max  
260°  
5°/sec  
max  
120°  
2°/sec  
25°  
0°  
max  
0
50  
150  
Time(sec)  
100  
Preheat  
60 Seconds Max  
Note: 1.Wave solder should not be made more than one time.  
2.You can just only select one of the soldering conditions as above.  
LIGITEK ELECTRONICS CO.,LTD.  
Property of Ligitek Only  
8/8  
PART NO. LTD315/66-XX/RP12-PF  
Page  
Reliability Test:  
Reference  
Description  
Test Item  
Test Condition  
Standard  
1.Under Room Temperature  
2.If=10mA  
3.t=1000 hrs (-24hrs, +72hrs)  
This test is conducted for the purpose  
of detemining the resistance of a part  
in electrical and themal stressed.  
MIL-STD-750: 1026  
MIL-STD-883: 1005  
JIS C 7021: B-1  
Operating Life Test  
The purpose of this is the resistance of  
the device which is laid under condition  
of high temperature for hours.  
High Temperature  
Storage Test  
1.Ta=105℃±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
MIL-STD-883:1008  
JIS C 7021: B-10  
The purpose of this is the resistance  
of the device which is laid under  
condition of low temperature for hours.  
Low Temperature  
Storage Test  
1.Ta=-40℃±5℃  
2.t=1000 hrs (-24hrs, +72hrs)  
JIS C 7021: B-12  
1.Ta=65℃±5℃  
2.RH=90%~95%  
3.t=240hrs ±2hrs  
High Temperature  
High Humidity Test  
The purpose of this test is the resistance  
of the device under tropical for hours.  
MIL-STD-202:103B  
JIS C 7021: B-11  
The purpose of this is the resistance of  
the device to sudden extreme changes  
in high and low temperature.  
1.Ta=105℃±5&-40℃±5℃  
(10min) (10min)  
2.total 10 cycles  
MIL-STD-202: 107D  
MIL-STD-750: 1051  
MIL-STD-883: 1011  
Thermal Shock Test  
This test intended to determine the  
thermal characteristic resistance  
of the device to sudden exposures  
at extreme changes in temperature  
when soldering the lead wire.  
MIL-STD-202: 210A  
MIL-STD-750: 2031  
JIS C 7021: A-1  
Solder Resistance  
Test  
1.T.Sol=260 ℃±5℃  
2.Dwell time= 10 ±1sec.  
MIL-STD-202: 208D  
MIL-STD-750: 2026  
MIL-STD-883: 2003  
JIS C 7021: A-2  
This test intended to see soldering well  
performed or not.  
1.T.Sol=230 ℃±5℃  
2.Dwell time=5 ±1sec  
Solderability Test  

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