L29C525 [LOGIC]
Dual Pipeline Register; 双管道注册型号: | L29C525 |
厂家: | LOGIC DEVICES INCORPORATED |
描述: | Dual Pipeline Register |
文件: | 总6页 (文件大小:173K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
L29C525
Dual Pipeline Register
DEVICES INCORPORATED
FEATURES
DESCRIPTION
The L29C525 is a high-speed, low
power CMOS pipeline register. It is
Instruction I1-0 = 01 (Push B) acts
similarly to the Push A and B
pin-for-pin compatible with the AMD instruction, except that only the B side
Am29525. The L29C525 can be registers are shifted. The input data is
configured as two independent 8-level applied to register B0, and the
❑ Dual 8-Deep Pipeline Register
❑ Configurable to Single 16-Deep
❑ Low Power CMOS Technology
❑ Replaces AMD Am29525
❑ Load, Shift, and Hold Instructions
❑ Separate Data In and Data Out Pins
❑ Three-State Outputs
pipelines or as a single 16-level
contents of register B7 are lost. The
contents of the A side registers are
unaffected. Instruction I1-0 = 10 (Push
A) is identical to the Push B
instruction, except that the A side
registers are shifted and the B side
registers are unaffected.
pipeline. The configuration imple-
mented is determined by the instruc-
tion code (I1-0) as shown in Table 2.
❑ Package Styles Available:
• 28-pin Plastic DIP
The I1-0 instruction code controls the
internal routing of data and loading of
each register. For instruction I1-0 = 00
(Push A and B), data applied at the
D7-0 inputs is latched into register A0
on the rising edge of CLK. The
contents of A0 simultaneously move
to register A1, A1 moves to A2, and so
on. The contents of register A7 are
wrapped back to register B0. The
registers on the B side are similarly
shifted, with the contents of register
B7 lost.
• 28-pin Plastic LCC, J-Lead
Instruction I1-0 = 11 (Hold) causes no
internal data movement. It is equiva-
lent to preventing the application of a
clock edge to any internal register.
The contents of any of the registers is
selectable at the output through the
use of the S3-0 control inputs. The
independence of the I and S control
lines allows simultaneous reading and
writing. Encoding for the S3-0 controls
is given in Table 3.
L29C525 BLOCK DIAGRAM
A0
A1
A2
A3
A4
A5
A6
A7
D
I
7-0
1-0
8
2
CLK
Y
7-0
B0
B1
B2
B3
B4
B5
B6
B7
8
OE
S
3-0
4
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L29C525
DEVICES INCORPORATED
Dual Pipeline Register
TABLE 1. REGISTER LOAD OPERATIONS
Single 16 Level
Dual 8 Level
Push A
Push A and B
Push B
Hold All Registers
HOLD
HOLD
HOLD
HOLD
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
B7
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
B7
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
B7
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
B7
TABLE 2. INSTRUCTION SET
Inputs
TABLE 3. OUTPUT SELECT
S3
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
S2
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
S1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
S0
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
Y7-0
Mnemonics
Shift
I1
0
0
1
1
I0
0
1
0
1
Description
Push A and B
Push B
A0
A1
A2
A3
A4
A5
A6
A7
B0
B1
B2
B3
B4
B5
B6
B7
LDB
LDA
Push A
HLD
Hold All Registers
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L29C525
DEVICES INCORPORATED
Dual Pipeline Register
MAXIMUM RATINGS Above which useful life may be impaired (Notes 1, 2, 3, 8)
Storage temperature ........................................................................................................... –65°C to +150°C
Operating ambient temperature........................................................................................... –55°C to +125°C
VCC supply voltage with respect to ground ............................................................................ –0.5 V to +7.0 V
Input signal with respect to ground ........................................................................................ –3.0 V to +7.0 V
Signal applied to high impedance output ............................................................................... –3.0 V to +7.0 V
Output current into low outputs............................................................................................................. 25 mA
Latchup current ............................................................................................................................... > 400 mA
OPERATING CONDITIONS To meet specified electrical and switching characteristics
Mode
Temperature Range (Ambient)
0°C to +70°C
Supply Voltage
4.75 V ≤ VCC ≤ 5.25 V
4.50 V ≤ VCC ≤ 5.50 V
Active Operation, Commercial
Active Operation, Military
–55°C to +125°C
ELECTRICAL CHARACTERISTICS Over Operating Conditions (Note 4)
Symbol Parameter
Test Condition
Min
Typ
Max Unit
VOH
VOL
VIH
Output High Voltage
VCC = Min., IOH = –12 mA
VCC = Min., IOL = 24 mA
2.4
V
Output Low Voltage
Input High Voltage
Input Low Voltage
0.5
VCC
0.8
V
V
2.0
0.0
VIL
(Note 3)
V
IIX
Input Current
Ground ≤ VIN ≤ VCC (Note 12)
Ground ≤ VOUT ≤ VCC (Note 12)
(Notes 5, 6)
±20
±20
µA
µA
IOZ
ICC1
ICC2
Output Leakage Current
VCC Current, Dynamic
VCC Current, Quiescent
10
35 mA
1.0 mA
(Note 7)
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L29C525
DEVICES INCORPORATED
Dual Pipeline Register
SWITCHING CHARACTERISTICS
COMMERCIAL OPERATING RANGE (0°C to +70°C) Notes 9, 10 (ns)
L29C525–
20
15
Symbol Parameter
Min
Max
Min
Max
tPD
Clock to Output Delay
20
15
tSEL
tPW
tSD
tHD
tSI
Select to Output Delay
20
15
Clock Pulse Width
12
7
10
5
Data Setup Time
Data Hold Time
0
0
Instruction Setup Time
7
5
tHI
Instruction Hold Time
2
2
tENA
tDIS
Three-State Output Enable Delay (Note 11)
Three-State Output Disable Delay (Note 11)
15
13
15
13
MILITARY OPERATING RANGE (–55°C to +125°C) Notes 9, 10 (ns)
L29C525–
*
25
20*
Symbol Parameter
Min
Max
Min
Max
tPD
Clock to Output Delay
25
20
tSEL
tPW
tSD
tHD
tSI
Select to Output Delay
25
20
Clock Pulse Width
12
7
12
7
Data Setup Time
Data Hold Time
2
2
Instruction Setup Time
7
7
tHI
Instruction Hold Time
2
2
tENA
tDIS
Three-State Output Enable Delay (Note 11)
Three-State Output Disable Delay (Note 11)
15
13
15
13
SWITCHING WAVEFORMS
t
SD
tHD
D
7-0
1-0
t
SI
tHI
I
t
PW
tPW
CLK
tPD
S3-0
t
SEL
OE
t
DIS
tENA
HIGH IMPEDANCE
Y7-0
*DISCONTINUED SPEED GRADE
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L29C525
DEVICES INCORPORATED
Dual Pipeline Register
NOTES
1. Maximum Ratings indicate stress 9. AC specifications are tested with
11. For the tENA test, the transition is
specifications only. Functional oper- input transition times less than 3 ns, measured to the 1.5 V crossing point
ationoftheseproductsatvaluesbeyond output reference levels of 1.5 V (except
those indicated in the Operating Condi-
with datasheet loads. For the tDIS test,
the transition is measured to the
tDIS test), and input levels of nominally
tions table is not implied. Exposure to 0 to 3.0 V. Output loading may be a ±200mV level from the measured
maximum rating conditions for ex- resistive divider which provides for steady-state output voltage with
tended periods may affect reliability.
±10mA loads. The balancing volt-
age, VTH, is set at 3.5 V for Z-to-0
specified IOH and IOL at an output
voltage of VOH min and VOL max
2. The products described by this spec-
ification include internal circuitry de-
signedto protect the chipfrom damag-
ing substrate injection currents and ac-
cumulationsofstaticcharge. Neverthe-
less, conventional precautions should
be observed during storage, handling,
and use of these circuits in order to This device has high-speed outputs ca-
avoid exposure to excessive electrical pable of large instantaneous current
respectively. Alternatively, a diode and 0-to-Z tests, and set at 0 V for Z-
bridge with upper and lower current to-1 and 1-to-Z tests.
sources of IOH and IOL respectively,
12. These parameters are only tested at
and a balancing voltage of 1.5 V may be
the high temperature extreme, which is
used. Parasitic capacitance is 30 pF
the worst case for leakage current.
minimum, and may be distributed.
FIGURE A. OUTPUT LOADING CIRCUIT
stress values.
pulses and fast turn-on/turn-off times.
Asaresult, caremustbeexercisedinthe
testing of this device. The following
measures are recommended:
S1
DUT
3. Thisdeviceprovideshardclampingof
transient undershoot and overshoot. In-
put levels below ground or above VCC
I
OL
V
TH
CL
I
OH
will be clamped beginning at –0.6 V and a. A 0.1 µF ceramic capacitor should be
VCC + 0.6 V. The device can withstand installed between VCC and Ground
indefinite operation with inputs in the leads as close to the Device Under Test
range of –0.5 V to +7.0 V. Device opera- (DUT) as possible. Similar capacitors
FIGURE B. THRESHOLD LEVELS
t
ENA
tDIS
tion will not be adversely affected, how-
ever, input current levels will be well in and the tester common, and device
should be installed between device VCC
OE
0
1.5 V
1.5 V
excess of 100 mA.
ground and tester common.
Z
Z
3.5V Vth
1.5 V
1.5 V
V
OL*
0.2 V
0.2 V
0
1
Z
Z
4. Actualtestconditionsmayvaryfrom
b. Ground and VCC supply planes
those designated but operation is guar- must be brought directly to the DUT
anteed as specified. socket or contactor fingers.
V
OH*
1
0V Vth
VOL
* Measured VOL with IOH = –10mA and IOL = 10mA
VOH*
Measured VOH with IOH = –10mA and IOL = 10mA
5. Supply current for a given applica- c. Input voltages should be adjusted to
tioncanbeaccuratelyapproximatedby:
compensateforinductivegroundand VCC
noise to maintain required DUT input
levels relative to the DUT ground pin.
2
NCV F
4
where
10. Each parameter is shown as a min-
imum or maximum value. Input re-
quirements are specified from the point
of view of the external system driving
the chip. Setup time, for example, is
specified as a minimum since the exter-
nal system must supply at least that
much time to meet the worst-case re-
quirementsofallparts. Responsesfrom
the internal circuitry are specified from
the point of view of the device. Output
delay, for example, is specified as a
maximumsinceworst-caseoperationof
anydevicealwaysprovidesdatawithin
that time.
N = total number of device outputs
C = capacitive load per output
V = supply voltage
F = clock frequency
6. Tested with all outputs changing ev-
ery cycle and no load, at a 5 MHz clock
rate.
7. Tested with all inputs within 0.1 V of
VCC or Ground, no load.
8. These parameters are guaranteed
but not 100% tested.
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L29C525
DEVICES INCORPORATED
Dual Pipeline Register
ORDERING INFORMATION
28-pin — 0.3" wide
28-pin
1
S2
S1
S0
28
27
26
25
24
23
22
21
20
19
18
17
16
15
2
S3
3
Y0
D0
4
3
2
1
28 27 26
25
5
D
2
3
Y
Y
Y
V
1
4
Y1
D1
6
24
23
22
21
20
19
5
Y2
D2
D
2
6
Y3
D3
7
V
CC
3
Top
View
7
VCC
GND
OE
Y4
VCC
GND
D4
8
GND
CC
8
9
D4
D5
D6
GND
OE
9
10
11
10
11
12
13
14
D5
Y
4
12 13 14 15 16 17 18
Y5
D6
Y6
D7
Y7
I0
I1
CLK
Plastic DIP
(P10)
Plastic J-Lead Chip Carrier
(J4)
Speed
0°C to +70°C — COMMERCIAL SCREENING
0°C to +70°C — COMMERCIAL SCREENING
20 ns
15 ns
L29C525PC20
L29C525JC20
L29C525JC15
L29C525PC15
–55°C to +125°C — COMMERCIAL SCREENING
–55°C to +125°C — COMMERCIAL SCREENING
–55°C to +125°C — MIL-STD-883 COMPLIANT
–55°C to +125°C — MIL-STD-883 COMPLIANT
Pipeline Registers
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