LTC2325CUKG-12#PBF [Linear]
LTC2325-12 - Quad, 12-Bit + Sign, 5Msps/Ch Simultaneous Sampling ADC; Package: QFN; Pins: 52; Temperature Range: 0°C to 70°C;型号: | LTC2325CUKG-12#PBF |
厂家: | Linear |
描述: | LTC2325-12 - Quad, 12-Bit + Sign, 5Msps/Ch Simultaneous Sampling ADC; Package: QFN; Pins: 52; Temperature Range: 0°C to 70°C 转换器 |
文件: | 总30页 (文件大小:1341K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
LTC2325-12
Quad, 12-Bit+Sign, 5Msps/Ch
Simultaneous Sampling ADC
FeaTures
DescripTion
The LTC®2325-12 is a low noise, high speed quad 12-bit
+ sign successive approximation register (SAR) ADC with
differential inputs and wide input common mode range.
Operatingfromasingle3.3Vor5Vsupply,theLTC2325-12
n
5Msps/Ch Throughput Rate
n
Four Simultaneously Sampling Channels
n
Guaranteed 12-Bit, No Missing Codes
n
8V Differential Inputs with Wide Input
P-P
Common Mode Range
has an 8V differential input range, making it ideal for
P-P
n
n
n
n
n
77dB SNR (Typ) at f = 2.2MHz
applications which require a wide dynamic range with
high common mode rejection. The LTC2325-12 achieves
±±.5LSꢀ INL typical, no missing codes at 12 bits and
77dꢀ SNR.
IN
IN
–86dB THD (Typ) at f = 2.2MHz
Guaranteed Operation to 125°C
Single 3.3V or 5V Supply
Low Drift (2±ppm/°C Max) 2.±48V or 4.±96V
Internal Reference
TheLTC2325-12hasanonboardlowdrift(2±ppm/°Cmax)
2.±48V or 4.±96V temperature-compensated reference.
The LTC2325-12 also has a high speed SPI-compatible
serial interface that supports CMOS or LVDS. The fast
5Msps per channel throughput with one cycle latency
makes the LTC2325-12 ideally suited for a wide variety
of high speed applications. The LTC2325-12 dissipates
only 45mW per channel and offers nap and sleep modes
to reduce the power consumption to 26μW for further
power savings during inactive periods.
n
n
n
n
1.8V to 2.5V I/O Voltages
CMOS or LVDS SPI-Compatible Serial I/O
Power Dissipation 45mW/Ch (Typ)
Small 52-Lead (7mm × 8mm) QFN Package
applicaTions
n
High Speed Data Acquisition Systems
n
Communications
L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks and
ThinSOT is a trademark of Analog Devices, Inc. All other trademarks are the property of their
respective owners.
n
Optical Networking
Multiphase Motor Control
n
Typical applicaTion
32k Point FFT fSMPL = 5Msps,
10µF
1µF
TRUE DIFFERENTIAL INPUTS
NO CONFIGURATION REQUIRED
fIN = 2.2MHz
3.3V OR 5V
1.8V TO 2.5V
+
–
0
IN , IN
SNR = 77.1dB
V
GND
GND
O
V
DD
DD
THD = –85.7dB
SINAD = 76.2dB
SFDR = 90.3dB
ARBITRARY
DIFFERENTIAL
–20
–40
12-BIT
+SIGN
SAR ADC
+
V
V
DD
0V
DD
0V
A
IN1
CMOS/LVDS
SDR/DDR
REFBUFEN
S/H
–
A
IN1
12-BIT
+SIGN
SAR ADC
+
–
A
A
IN2
IN2
S/H
SDO1
SDO2
SDO3
SDO4
CLKOUT
SCK
–60
LTC2325-12
–80
12-BIT
+
–
A
A
BIPOLAR
UNIPOLAR
IN3
IN3
+SIGN
S/H
V
V
DD
DD
–100
–120
–140
SAR ADC
CNV
SAMPLE
12-BIT
+SIGN
SAR ADC
+
–
CLOCK
A
A
IN4
IN4
S/H
0V
0V
REF REFOUT1 REFOUT2 REFOUT3 REFOUT4
1µF 10µF 10µF 10µF 10µF
0
0.5
1
1.5
2
2.5
FOUR SIMULTANEOUS
SAMPLING CHANNELS
FREQUENCY (MHz)
232512 TA01b
232512 TA01a
232512f
1
For more information www.linear.com/LTC2325-12
LTC2325-12
absoluTe MaxiMuM raTings
pin conFiguraTion
(Notes 1, 2)
TOP VIEW
Supply Voltage (V )..................................................6V
DD
Supply Voltage (OV )................................................3V
DD
Analog Input Voltage
52 51 50 49 48 47 46 45 44 43 42 41
–
A
, A (Note 3) ................... –±.3V to (V + ±.3V)
–
IN DD
+
–
IN
A
A
1
2
40 DNC/SDOD
IN4
+
+
+
REFOUT1,2,3,4........................ .–±.3V to (V + ±.3V)
39 SDO4/SDOD
IN4
DD
DD
GND
–
GND
OV
3
38
37
CNV........................................ –±.3V to (OV + ±.3V)
A
4
IN3
DD
Digital Input Voltage
+
–
A
IN3
5
36 DNC/SDOC
SDO3/SDOC
35
(Note 3).......................... (GND – ±.3V) to (OV + ±.3V)
DD
REFOUT3
GND
6
–
7
34 CLKOUTEN/CLKOUT
Digital Output Voltage
53
GND
+
REF
8
33 CLKOUT/CLKOUT
(Note 3).......................... (GND – ±.3V) to (OV + ±.3V)
DD
REFOUT2
–
9
32 GND
Operating Temperature Range
A
A
10
11
31 OV
DD
IN2
+
–
LTC2325C................................................ ±°C to 7±°C
LTC2325I .............................................–4±°C to 85°C
LTC2325H.......................................... –4±°C to 125°C
Storage Temperature Range .................. –65°C to 15±°C
30 DNC/SDOB
IN2
+
+
GND 12
–
29 SDO2/SDOB
–
A
A
13
14
28 DNC/SDOA
IN1
+
27 SDO1/SDOA
IN1
15 16 17 18 19 20 21 22 23 24 25 26
UKG PACKAGE
52-LEAD (7mm × 8mm) PLASTIC QFN
T
JMAX
= 15±°C, θ = 31°C/W
JA
EXPOSED PAD (PIN 53) IS GND, MUST ꢀE SOLDERED TO PCꢀ
http://www.linear.com/product/LTC2325-12#orderinfo
orDer inForMaTion
LEAD FREE FINISH
TAPE AND REEL
PART MARKING*
LTC2325UKG-12
LTC2325UKG-12
LTC2325UKG-12
PACKAGE DESCRIPTION
TEMPERATURE RANGE
±°C to 7±°C
LTC2325CUKG-12#PꢀF
LTC2325IUKG-12#PꢀF
LTC2325HUKG-12#PꢀF
LTC2325CUKG-12#TRPꢀF
LTC2325IUKG-12#TRPꢀF
LTC2325HUKG-12#TRPꢀF
52-Lead (7mm × 8mm) Plastic QFN
52-Lead (7mm × 8mm) Plastic QFN
52-Lead (7mm × 8mm) Plastic QFN
–4±°C to 85°C
–4±°C to 125°C
Consult LTC Marketing for parts specified with wider operating temperature ranges. *The temperature grade is identified by a label on the shipping container.
For more information on lead free part marking, go to: http://www.linear.com/leadfree/
For more information on tape and reel specifications, go to: http://www.linear.com/tapeandreel/. Some packages are available in 5±± unit reels through
designated sales channels with #TRMPꢀF suffix.
232512f
2
For more information www.linear.com/LTC2325-12
LTC2325-12
elecTrical characTerisTics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL
PARAMETER
Absolute Input Range (A to A
CONDITIONS
(Note 5)
MIN
TYP
MAX
UNITS
V
l
l
l
l
l
+
–
+
+
–
–
V
V
V
V
)
±
V
DD
V
DD
IN
IN
IN
IN
IN
IN
+
Absolute Input Range (A to A
)
(Note 5)
±
V
IN
–
+
–
= V – V
IN
– V
Input Differential Voltage Range
Common Mode Input Range
V
V
–REFOUT1,2,3,4
REFOUT1,2,3,4
V
IN
IN
IN
+
–
= (V – V )/2
±
V
DD
V
CM
CM
IN
IN
I
IN
Analog Input DC Leakage Current
Analog Input Capacitance
–1
1
μA
pF
dꢀ
V
C
IN
1±
CMRR
Input Common Mode Rejection Ratio
CNV High Level Input Voltage
CNV Low Level Input Voltage
CNV Input Current
f
IN
= 2.2MHz
1±2
l
l
l
V
V
1.5
IHCNV
ILCNV
INCNV
±.5
1±
V
I
–1±
μA
converTer characTerisTics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL PARAMETER
CONDITIONS
MIN
12
TYP
MAX
UNITS
ꢀits
l
l
Resolution
No Missing Codes
12
ꢀits
Transition Noise
±.3
±±.5
±±.4
±
LSꢀ
RMS
l
l
l
INL
Integral Linearity Error
Differential Linearity Error
ꢀipolar Zero-Scale Error
ꢀipolar Zero-Scale Error Drift
ꢀipolar Full-Scale Error
ꢀipolar Full-Scale Error Drift
(Note 6)
(Note 7)
–1
–±.99
–1
1
±.99
1
LSꢀ
DNL
ꢀZE
LSꢀ
LSꢀ
±.±1
LSꢀ/°C
LSꢀ
l
FSE
V
V
= 4.±96V (REFꢀUFEN Grounded) (Note 7)
= 4.±96V (REFꢀUFEN Grounded)
–2
2
REFOUT1,2,3,4
15
ppm/°C
REFOUT1,2,3,4
232512f
3
For more information www.linear.com/LTC2325-12
LTC2325-12
DynaMic accuracy The l denotes the specifications which apply over the full operating temperature range,
otherwise specifications are at TA = 25°C and AIN = –1dBFS (Notes 4, 8).
SYMBOL PARAMETER
CONDITIONS
MIN
TYP
76
MAX
UNITS
dꢀ
l
l
l
l
SINAD
Signal-to-(Noise + Distortion) Ratio f = 2.2MHz, V
= 4.±96V, Internal Reference
= 5V, External Reference
= 4.±96V, Internal Reference
= 5V, External Reference
= 4.±96V, Internal Reference
= 5V, External Reference
= 4.±96V, Internal Reference
= 5V, External Reference
74
IN
REFOUT1,2,3,4
REFOUT1,2,3,4
REFOUT1,2,3,4
REFOUT1,2,3,4
REFOUT1,2,3,4
REFOUT1,2,3,4
REFOUT1,2,3,4
REFOUT1,2,3,4
f
IN
f
IN
f
IN
f
IN
f
IN
f
IN
f
IN
= 2.2MHz, V
= 2.2MHz, V
= 2.2MHz, V
= 2.2MHz, V
= 2.2MHz, V
= 2.2MHz, V
= 2.2MHz, V
76.5
77
dꢀ
SNR
Signal-to-Noise Ratio
75
76
dꢀ
77.6
–86
–85
93
dꢀ
THD
Total Harmonic Distortion
Spurious Free Dynamic Range
–76
dꢀ
dꢀ
SFDR
dꢀ
93
dꢀ
–3dꢀ Input ꢀandwidth
Aperture Delay
95
MHz
ps
5±±
5±±
1
Aperture Delay Matching
Aperture Jitter
ps
ps
RMS
Transient Response
Full-Scale Step
3±
ns
inTernal reFerence characTerisTics The l denotes the specifications which apply over the
full operating temperature range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
l
l
V
Internal Reference Output Voltage
4.75V < V < 5.25V
4.±78
2.±34
4.±96
2.±48
4.115
2.±64
V
V
REFOUT1,2,3,4
DD
3.13V < V < 3.47V
DD
l
V
Temperature Coefficient
(Note 14)
3
2±
ppm/°C
Ω
REF
REFOUT1,2,3,4 Output Impedance
Line Regulation
±.25
±.3
V
4.75V < V < 5.25V
mV/V
REFOUT1,2,3,4
DD
I
External Reference Current
REFꢀUFEN = ±V
REFOUT1,2,3,4
REFOUT1,2,3,4 = 4.±96V
REFOUT1,2,3,4 = 2.±48V
(Notes 9, 1±)
5±±
3±±
μA
μA
232512f
4
For more information www.linear.com/LTC2325-12
LTC2325-12
DigiTal inpuTs anD DigiTal ouTpuTs The l denotes the specifications which apply over the
full operating temperature range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL PARAMETER
CONDITIONS
CMOS/LVDS = GND
MIN
±.8 • OV
–1±
TYP
MAX
UNITS
CMOS Digital Inputs and Outputs
l
l
l
l
V
V
High Level Input Voltage
Low Level Input Voltage
Digital Input Current
V
V
IH
IL
DD
±.2 • OV
DD
I
IN
V
IN
= ±V to OV
DD
1±
μA
pF
C
IN
Digital Input Capacitance
5
l
l
V
V
High Level Output Voltage
Low Level Output Voltage
I = –5±±μA
OV – ±.2
V
V
OH
O
DD
I = 5±±μA
O
±.2
1±
OL
l
l
l
I
I
I
Hi-Z Output Leakage Current
Output Source Current
Output Sink Current
V
OUT
V
OUT
V
OUT
= ±V to OV
DD
–1±
μA
mA
mA
OZ
= ±V
= OV
–1±
1±
SOURCE
SINK
DD
LVDS Digital Inputs and Outputs
CMOS/LVDS = OV
DD
l
l
l
l
l
l
V
V
V
V
V
V
LVDS Differential Input Voltage
LVDS Common Mode Input Voltage
LVDS Differential Output Voltage
LVDS Common Mode Output Voltage
1±±Ω Differential Termination
DD
24±
1
6±±
1.45
6±±
1.4
mV
V
ID
OV = 2.5V
1±±Ω Differential Termination
OV = 2.5V
DD
IS
1±±Ω Differential Termination
OV = 2.5V
DD
22±
±.85
1±±
±.85
35±
1.2
2±±
1.2
mV
V
OD
1±±Ω Differential Termination
OV = 2.5V
DD
OS
Low Power LVDS Differential Output
Voltage
1±±Ω Differential Termination
OV = 2.5V
DD
35±
1.4
mV
V
OD_LP
OS_LP
Low Power LVDS Common Mode Output 1±±Ω Differential Termination
Voltage
OV = 2.5V
DD
232512f
5
For more information www.linear.com/LTC2325-12
LTC2325-12
power requireMenTs The l denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
l
l
V
Supply Voltage
5V Operation
3.3V Operation
4.75
3.13
5.25
3.47
V
V
DD
+
–
l
IV
DD
Supply Current
5Msps Sample Rate (IN = IN = ±V)
31
44.5
mA
CMOS I/O Mode: CMOS/LVDS = GND
l
l
l
l
OV
Supply Voltage
1.71
2.63
15.5
6.4
V
mA
mA
µA
DD
OVDD
NAP
I
I
I
Supply Current
5Msps Sample Rate (C = 5pF)
4.4
5.3
2±
L
Nap Mode Current
Sleep Mode Current
Power Dissipation
Conversion Done (I
)
VDD
Sleep Mode (I + I
)
9±
SLEEP
VDD OVDD
l
l
l
P
V
= 3.3V, 5Msps Sample Rate
DD
1±2
18
2±
181
21.1
288
mW
mW
µW
D_3.3V
Nap Mode
Sleep Mode
l
l
l
P
D_5V
Power Dissipation
V
= 5V, 5Msps Sample Rate
162
27
3±
261
32
424
mW
mW
µW
DD
Nap Mode
Sleep Mode
LVDS I/O Mode: CMOS/LVDS = OV , OV = 2.5V
DD
DD
l
l
l
l
OV
Supply Voltage
2.37
2.63
32
V
mA
mA
µA
DD
OVDD
NAP
I
I
I
Supply Current
5Msps Sample Rate (C = 5pF, R = 1±±Ω)
26
5.3
2±
L
L
Nap Mode Current
Conversion Done (I
)
6.4
9±
VDD
Sleep Mode Current
Power Dissipation
Sleep Mode (I
+ I
)
OVDD
SLEEP
VDD
l
l
l
P
V
= 3.3V, 5Msps Sample Rate
DD
151
52
8±
218
58.6
288
mW
mW
µW
D_3.3V
Nap Mode
Sleep Mode
l
l
l
P
D_5V
Power Dissipation
V
= 5V, 5Msps Sample Rate
214
5±
4±
3±3
69.2
424
mW
mW
µW
DD
Nap Mode
Sleep Mode
aDc TiMing characTerisTics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL
PARAMETER
CONDITIONS
MIN
±.2
3±
TYP
MAX
5
UNITS
Msps
µs
l
l
l
l
f
t
t
t
t
t
Maximum Sampling Frequency
Time ꢀetween Conversions
Conversion Time
SMPL
(Note 11) t
= t
+ t
CONV
1±±±
17±
CYC
CYC
CNVH
ns
CONV
CNV High Time
ns
CNVH
Sampling Aperture
(Note 11) t
= t
– t
CONV
28
5±
ns
ACQUISITION
WAKE
ACQUISITION
CYC
REFOUT1,2,3,4 Wake-Up Time
C
= 1±µF
ms
REFOUT1,2,3,4
CMOS I/O Mode: SDR, CMOS/LVDS = GND, SDR/ DDR = GND
l
l
l
l
l
t
t
t
t
t
SCK Period
(Note 13)
9.1
4.1
4.1
±
ns
ns
ns
ns
ns
SCK
SCK High Time
SCK Low Time
SCKH
SCKL
SDO Data Remains Valid Delay from CLKOUT↓ C = 5pF (Note 12)
1.5
4.5
HSDO_SDR
DSCKCLKOUT
L
SCK to CLKOUT Delay
(Note 12)
2.5
232512f
6
For more information www.linear.com/LTC2325-12
LTC2325-12
aDc TiMing characTerisTics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C (Note 4).
SYMBOL
PARAMETER
CONDITIONS
(Note 11)
(Note 11)
(Note 11)
MIN
TYP
MAX
UNITS
ns
l
l
l
t
t
t
ꢀus Relinquish Time After CNV↑
SDO Valid Delay from CNV↓
SCK Delay Time to CNV↑
3
3
DCNVSDOZ
DCNVSDOV
DSCKHCNVH
ns
±
ns
CMOS I/O Mode: DDR, CMOS/LVDS = GND, SDR/ DDR = OV
DD
l
l
l
l
l
l
l
l
t
t
t
t
t
t
t
t
SCK Period
18.2
8.2
8.2
±
ns
ns
ns
ns
ns
ns
ns
ns
SCK
SCK High Time
SCK Low Time
SCKH
SCKL
SDO Data Remains Valid Delay from CLKOUT↓ C = 5pF (Note 12)
1.5
4.5
3
HSDO_DDR
DSCKCLKOUT
DCNVSDOZ
DCNVSDOV
DSCKHCNVH
L
SCK to CLKOUT Delay
(Note 12)
(Note 11)
(Note 11)
(Note 11)
2
ꢀus Relinquish Time After CNV↑
SDO Valid Delay from CNV↓
SCK Delay Time to CNV↑
3
±
LVDS I/O Mode: SDR, CMOS/LVDS = OV , SDR/DDR = GND
DD
l
l
l
l
l
l
t
t
t
t
t
t
SCK Period
9.1
4.1
4.1
±
ns
ns
ns
ns
ns
ns
SCK
SCK High Time
SCK Low Time
SCKH
SCKL
SDO Data Remains Valid Delay from CLKOUT↓ C = 5pF (Note 12)
1.5
4
HSDO_SDR
DSCKCLKOUT
DSCKHCNVH
L
SCK to CLKOUT Delay
(Note 12)
(Note 11)
2
SCK Delay Time to CNV↑
±
LVDS I/O Mode: DDR, CMOS/LVDS = OV , SDR/DDR = OV = 2.5V
DD
DD
l
l
l
l
l
l
t
t
t
t
t
t
SCK Period
18.2
8.2
8.2
±
ns
ns
ns
ns
ns
ns
SCK
SCK High Time
SCK Low Time
SCKH
SCKL
SDO Data Remains Valid Delay from CLKOUT↓ C = 5pF (Note 12)
1.5
4
HSDO_DDR
DSCKCLKOUT
DSCKHCNVH
L
SCK to CLKOUT Delay
(Note 12)
(Note 11)
2
SCK Delay Time to CNV↑
±
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
untrimmed deviation from ideal first and last code transitions and includes
the effect of offset error.
Note 8: All specifications in dꢀ are referred to a full-scale ±4.±96V input
with REF = 4.±96V.
Note 2: All voltage values are with respect to ground.
Note 9: When REFOUT1,2,3,4 is overdriven, the internal reference buffer
Note 3: When these pin voltages are taken below ground, or above V or
must be turned off by setting REFꢀUFEN = ±V.
DD
OV , they will be clamped by internal diodes. This product can handle input
DD
Note 10: f
= 5MHz, I
varies proportionally with sample rate.
SMPL
REFOUT1,2,3,4
currents up to 1±±mA below ground, or above V or OV , without latch-up.
DD
DD
Note 11: Guaranteed by design, not subject to test.
Note 12: Parameter tested and guaranteed at OV = 1.71V and OV = 2.5V.
Note 13: t
rising edge capture.
Note 14: Temperature coefficient is calculated by dividing the maximum
change in output voltage by the specified temperature range.
Note 15: CNV is driven from a low jitter digital source, typically at OV
logic levels.
Note 4: V = 5V, OV = 2.5V, REFOUT1,2,3,4 = 4.±96V, f = 5MHz.
SMPL
DD
DD
DD
DD
Note 5: Recommended operating conditions.
of 9.1ns allows a shift clock frequency up to 1±5MHz for
SCK
Note 6: Integral nonlinearity is defined as the deviation of a code from a
straight line passing through the actual endpoints of the transfer curve.
The deviation is measured from the center of the quantization band.
Note 7: ꢀipolar zero error is the offset voltage measured from –±.5LSꢀ
when the output code flickers between ± ±±±± ±±±± ±±±± and 1 1111
1111 1111. Full-scale bipolar error is the worst-case of –FS or +FS
DD
232512f
7
For more information www.linear.com/LTC2325-12
LTC2325-12
aDc TiMing characTerisTics
0.8 • OV
DD
t
WIDTH
0.2 • OV
DD
50%
50%
t
t
DELAY
DELAY
232512 F01
0.8 • OV
0.8 • OV
0.2 • OV
DD
DD
DD
DD
0.2 • OV
Figure 1. Voltage Levels for Timing Specifications
232512f
8
For more information www.linear.com/LTC2325-12
LTC2325-12
Typical perForMance characTerisTics
TA = 25°C, VDD = 5V, OVDD = 2.5V, REFOUT1,2,3,4
= 4.096V, fSMPL = 5Msps, unless otherwise noted.
Integral Nonlinearity
vs Output Code
Differential Nonlinearity
vs Output Code
DC Histogram
1.0
0.5
1.0
0.5
200000
σ = 0.3
160000
120000
80000
40000
0
0
0
–0.5
–0.5
–1.0
–1.0
–4096
–2048
0
2048
4096
–4096
–2048
0
2048
4096
–3
–2
–1
0
1
2
3
OUTPUT CODE
OUTPUT CODE
CODE
232512 G02
232512 G01
232512 G03
THD, Harmonics vs Input
32k Point FFT, fSMPL = 5Msps,
fIN = 2.2MHz
SNR, SINAD vs Input Frequency
(1kHz to 2.2MHz)
Frequency (1kHz to 2.2MHz)
0
–20
78.0
77.7
77.4
77.1
76.8
76.5
76.2
75.9
75.6
75.3
75.0
–80
–84
SNR = 77.1dB
THD = –85.7dB
SINAD = 76.2dB
SFDR = 90.3dB
THD
–88
SNR
–40
–92
–96
SINAD
–60
HD3
–100
–104
–108
–112
–116
–120
–80
HD2
–100
–120
–140
0
0.5
1
1.5
2
2.5
0
0.5
1
1.5
2
2.5
0
0.5
1
1.5
2
2.5
FREQUENCY (MHz)
FREQUENCY (MHz)
FREQUENCY (MHz)
232512 G04
232512 G05
232512 G06
THD, Harmonics vs Input Common
Mode
SNR, SINAD vs Reference Voltage,
fIN = 2.2MHz
32k Point FFT, IMD, fSMPL = 5Msps,
AIN+ = 1.2MHz, AIN– = 2.2MHz
–80
–83
78
77
76
75
74
73
72
71
70
0
–20
THD = 85dB
f = 2.2MHz
f = 2.2MHz
SNR
V
= 1MHz, 4V
CM
P-P
–86
THD
SINAD
–40
–89
–92
–60
HD3
–95
–80
–98
–101
–104
–107
–110
–100
–120
–140
HD2
1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9 3.1 3.3
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
0
0.5
1
1.5
2
2.5
INPUT COMMON MODE (V)
V
(V)
REFOUT
FREQUENCY (MHz)
232512 G07
232512 G08
232512 G09
232512f
9
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LTC2325-12
Typical perForMance characTerisTics
TA = 25°C, VDD = 5V, OVDD = 2.5V, REFOUT1,2,3,4
= 4.096V, fSMPL = 5Msps, unless otherwise noted.
Step Response
(Large Signal Settling)
4096
CMRR vs Input Frequency
Crosstalk vs Input Frequency
–105
–107
–109
–111
–113
–115
–117
–119
–121
–123
–125
120
112
104
96
V
= 4V
P-P
CM
3072
2048
4.096V RANGE
1024
88
0
+
IN = 5MHz SQUARE WAVE
–
IN = 0V
80
–1024
0
0.5
1
1.5
2
2.5
0
500
1000
1500
2000
2500
–20 –10
0
10 20 30 40 50 60 70 80 90
FREQUENCY (MHz)
FREQUENCY (kHz)
SETTLING TIME (ns)
232512 G11
232512 G10
232512 G12
Step Response
(Fine Settling)
External Reference Supply
Current vs Sample Frequency
REF Output vs Temperature
20
10
700
600
500
400
300
200
100
0
1.00
0.50
REFBUFEN = 0V
4.096V RANGE
+
(EXT REF BUF
IN = 5MHz
OVERDRIVING REF BUF)
SQUARE WAVE
V
= 3.3V
DD
–
IN = 0V
0
–0.50
–1.00
–1.50
–2.00
–2.50
–3.00
V
= 4.096V
0
REFOUT1,2,3,4
V
= 5V
DD
–10
V
= 2.048V
REFOUT1,2,3,4
–20
–20 –10
0
10 20 30 40 50 60 70 80 90
0
1
2
3
4
5
–55 –35 –15
5
25 45 65 85 105 125
SETTLING TIME (ns)
SAMPLE FREQUENCY (Msps)
TEMPERATURE (°C)
232512 G13
232512 G14
232512 G15
Supply Current
vs Sample Frequency
OVDD Current vs SCK Frequency,
CLOAD = 10pF
Offset Error vs Temperature
8
7
6
5
4
3
2
1
0
32
30
28
26
24
22
20
18
16
14
12
1.0
0.5
40
35
30
25
20
15
FULL SCALE SINUSOIDAL INPUT
LVDS
V
DD
= 5V
CMOS(2.5V)
0
V
= 3.3V
DD
CMOS(1.8V)
–0.5
LOW POWER LVDS
–1.0
0
22
44
66
88
110
–55 –35 –15
5
25 45 65 85 105 125
0
1
2
3
4
5
SCK FREQUENCY (MHz)
TEMPERATURE (°C)
SAMPLE FREQUENCY (Msps)
232512 G18
232512 G16
232512 G17
232512f
10
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LTC2325-12
pin FuncTions
PINS THAT ARE THE SAME FOR ALL DIGITAL I/O MODES
REFOUT1(Pin22):ReferenceBuffer1Output.Anonboard
buffer nominally outputs 4.096V to this pin. This pin is
referred to GND and should be decoupled closely to the
pin with a 10µF (X5R, 0805 size) ceramic capacitor. The
internal buffer driving this pin may be disabled by ground-
ing the REFBUFEN pin. If the buffer is disabled, an external
reference may drive this pin in the range of 1.25V to 5V.
+
–
AIN4 , AIN4 (Pins 2, 1): Analog Differential Input Pins.
+
–
Full-scale range (AIN4 – AIN4 ) is ±REFOUT4 voltage.
These pins can be driven from V to GND.
DD
GND (Pins 3, 7, 12, 18, 26, 32, 38, 46, 49): Ground.
These pins and exposed pad (Pin 53) must be tied directly
to a solid ground plane.
SDR/DDR (Pin 23): Double Data Rate Input. Controls the
frequency of SCK and CLKOUT. Tie to GND for the falling
edge of SCK to shift each serial data output (Single Data
+
–
AIN3 , AIN3 (Pins 5, 4): Analog Differential Input Pins.
+
–
Full-scale range (AIN3 – AIN3 ) is ±REFOUT3 voltage.
These pins can be driven from V to GND.
Rate, SDR). Tie to OV to shift serial data output on each
DD
DD
edge of SCK (Double Data Rate, DDR). CLKOUT will be a
REFOUT3 (Pin 6): Reference Buffer 3 Output. An onboard
buffer nominally outputs 4.096V to this pin. This pin is
referred to GND and should be decoupled closely to the
pin with a 10µF (X5R, 0805 size) ceramic capacitor. The
internal buffer driving this pin may be disabled by ground-
ing the REFBUFEN pin. If the buffer is disabled, an external
reference may drive this pin in the range of 1.25V to 5V.
delayed version of SCK for both pin states.
CNV (Pin 24): Convert Input. This pin, when high, defines
the acquisition phase. When this pin is driven low, the
conversion phase is initiated and output data is clocked
out. This input must be driven at OV levels with a low
DD
jitter pulse. This pin is unaffected by the CMOS/LVDS pin.
REF (Pin 8): Common 4.096V reference output. Decouple
to GND with a 1μF low ESR ceramic capacitor. May be
overdriven with a single external reference to establish a
common reference for ADC cores 1 through 4.
CMOS/LVDS (Pin 25): I/O Mode Select. Ground this pin
to enable CMOS mode, tie to OV to enable LVDS mode.
DD
Float this pin to enable low power LVDS mode.
OV (Pins 31, 37): I/O Interface Digital Power. The range
DD
REFOUT2 (Pin 9): Reference Buffer 2 Output. An onboard
buffer nominally outputs 4.096V to this pin. This pin is
referred to GND and should be decoupled closely to the
pin with a 10µF (X5R, 0805 size) ceramic capacitor. The
internal buffer driving this pin may be disabled by ground-
ing the REFBUFEN pin. If the buffer is disabled, an external
reference may drive this pin in the range of 1.25V to 5V.
of OV is 1.71V to 2.63V. This supply is nominally set
DD
to the same supply as the host interface (CMOS: 1.8V or
2.5V, LVDS: 2.5V). Bypass OV to GND (Pins 32 and 38)
DD
with 0.1µF capacitors.
REFBUFEN (Pin 43): Reference Buffer Output Enable. Tie
to V when using the internal reference. Tie to ground
DD
to disable the internal REFOUT1–4 buffers for use with
+
–
AIN2 ,AIN2 (Pins11,10):AnalogDifferentialInputPins.
external voltage references. This pin has a 500k internal
+
–
Full-scale range (AIN2 – AIN2 ) is ±REFOUT2 voltage.
These pins can be driven from V to GND.
pull-up to V .
DD
DD
REFOUT4 (Pin45):ReferenceBuffer4Output.Anonboard
buffer nominally outputs 4.096V to this pin. This pin is
referred to GND and should be decoupled closely to the
pin with a 10µF (X5R, 0805 size) ceramic capacitor. The
internal buffer driving this pin may be disabled by ground-
ing the REFBUFEN pin. If the buffer is disabled, an external
reference may drive this pin in the range of 1.25V to 5V.
+
–
AIN1 ,AIN1 (Pins14,13):AnalogDifferentialInputPins.
+
–
Full-scale range (AIN1 – AIN1 ) is ±REFOUT1 voltage.
These pins can be driven from V to GND.
DD
V
(Pins 15, 21, 44, 52): Power Supply. Bypass V to
DD
DD
GND with a 10µF ceramic capacitor and a 0.1µF ceramic
capacitorclosetothepart. TheV pinsshouldbeshorted
together and driven from the same supply.
DD
Exposed Pad (Pin 53): Ground. Solder this pad to ground.
232512f
11
For more information www.linear.com/LTC2325-12
LTC2325-12
pin FuncTions
CMOS DATA OUTPUT OPTION (CMOS/LVDS = LOW)
LVDS DATA OUTPUT OPTION (CMOS/LVDS = HIGH OR
FLOAT)
SDO1 (Pin 27): CMOS Serial Data Output for ADC Channel
1. The conversion result is shifted MSB first on each fall-
ing edge of SCK in SDR mode and each SCK edge in DDR
mode. 16 SCK edges are required for 13-bit conversion
data to be read from SDO1 in SDR mode, 8 SCK edges
in DDR mode.
+
–
SDOA , SDOA (Pins 27, 28): LVDS Serial Data Output
for ADC Channel 1. The conversion result is shifted CH1
MSB first on each falling edge of SCK in SDR mode and
each SCK edge in DDR mode. 16 SCK edges are required
for 13-bit conversion data to be read from SDOA in SDR
mode, 8 SCK edges in DDR mode. Terminate with a 100Ω
resistor at the receiver (FPGA).
SDO2 (Pin 29): CMOS Serial Data Output for ADC Channel
2. The conversion result is shifted MSB first on each fall-
ing edge of SCK in SDR mode and each SCK edge in DDR
mode. 16 SCK edges are required for 13-bit conversion
data to be read from SDO2 in SDR mode, 8 SCK edges
in DDR mode.
+
–
SDOB , SDOB (Pins 29, 30): LVDS Serial Data Output
for ADC Channel 2. The conversion result is shifted CH2
MSB first on each falling edge of SCK in SDR mode and
each SCK edge in DDR mode. 16 SCK edges are required
for 13-bit conversion data to be read from SDOB in SDR
mode, 8 SCK edges in DDR mode. Terminate with a 100Ω
resistor at the receiver (FPGA).
SDO3 (Pin 35): CMOS Serial Data Output for ADC Channel
3. The conversion result is shifted MSB first on each fall-
ing edge of SCK in SDR mode and each SCK edge in DDR
mode. 16 SCK edges are required for 13-bit conversion
data to be read from SDO3 in SDR mode, 8 SCK edges
in DDR mode.
+
–
CLKOUT ,CLKOUT (Pins33,34):SerialDataClockOutput.
CLKOUT provides a skew-matched clock to latch the SDO
outputatthereceiver.ThesepinsechotheinputatSCKwith
a small delay. These pins must be differentially terminated
by an external 100Ω resistor at the receiver (FPGA).
SDO4 (Pin 39): CMOS Serial Data Output for ADC Channel
4. The conversion result is shifted MSB first on each fall-
ing edge of SCK in SDR mode and each SCK edge in DDR
mode. 16 SCK edges are required for 13-bit conversion
data to be read from SDO4 in SDR mode, 8 SCK edges
in DDR mode.
+
–
SDOC , SDOC (Pins 35, 36): LVDS Serial Data Output
for ADC channel 3. The conversion result is shifted CH3
MSB first on each falling edge of SCK in SDR mode and
each SCK edge in DDR mode. 16 SCK edges are required
for 13-bit conversion data to be read from SDOA in SDR
mode, 8 SCK edges in DDR mode. Terminate with a 100Ω
resistor at the receiver (FPGA).
CLKOUT (Pin 33): Serial Data Clock Output. CLKOUT
provides a skew-matched clock to latch the SDO output
at the receiver (FPGA). The logic level is determined by
+
–
OV . This pin echoes the input at SCK with a small delay.
SDOD , SDOD (Pins 39, 40): LVDS Serial Data Output
for ADC Channel 4. The conversion result is shifted CH4
MSB first on each falling edge of SCK in SDR mode and
each SCK edge in DDR mode. 16 SCK edges are required
for 13-bit conversion data to be read from SDOA in SDR
mode, 8 SCK edges in DDR mode. Terminate with a 100Ω
resistor at the receiver (FPGA).
DD
CLKOUTEN (Pin 34): CLKOUT can be disabled by tying
Pin 34 to OV for a small power savings. If CLKOUT is
DD
used, ground this pin.
SCK (Pin 41): Serial Data Clock Input. The falling edge
of this clock shifts the conversion result MSB first onto
the SDO pins in SDR mode (DDR = LOW). In DDR mode
(SDR/DDR = HIGH) each edge of this clock shifts the
conversion result MSB first onto the SDO pins. The logic
+
–
SCK , SCK (Pins 41, 42): Serial Data Clock Input. The
falling edge of this clock shifts the conversion result MSB
first onto the SDO pins in SDR mode (SDR/DDR = LOW).
In DDR mode (SDR/DDR = HIGH) each edge of this clock
shifts the conversion result MSB first onto the SDO pins.
Thesepinsmustbedifferentiallyterminatedbyanexternal
level is determined by OV .
DD
DNC (Pins 28, 30, 36, 40, 42): In CMOS mode, do not
connect this pin.
100Ω resistor at the receiver (ADC).
232512f
12
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LTC2325-12
FuncTional block DiagraM
CMOS IO Mode
V
GND
DD
24
CNV
(15, 21, 44, 52)
(3, 7, 12, 18, 26, 32, 38, 46, 49, 53)
A
+
–
SDO1
DNC
IN1
+
–
27
28
14
13
12-BIT+SIGN
SAR ADC
CMOS
I/O
S/H
A
IN1
REFOUT1
×1
REF
22
A
A
+
–
IN2
SDO2
DNC
+
–
11
10
29
30
12-BIT+SIGN
SAR ADC
CMOS
I/O
S/H
IN2
REFOUT2
×1
REF
9
CLKOUT
SCK
41
42
33
34
CMOS
RECEIVERS
OUTPUT
CLOCK DRIVER
CLKOUTEN
DNC
SDR/DDR
23
A
A
+
–
IN3
SDO3
DNC
+
5
4
35
36
12-BIT+SIGN
SAR ADC
CMOS
I/O
S/H
–
IN3
REFOUT3
×1
REF
6
A
A
+
–
IN4
SDO4
DNC
+
2
1
39
40
12-BIT+SIGN
SAR ADC
CMOS
I/O
S/H
–
IN4
REFOUT4
×1
REF
45
250μA
OV (31, 37)
DD
REF
×1.7
×3.4
8
1.2V INT REF
REFBUFEN
43
25
CMOS/LVDS
232512 BDa
232512f
13
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LTC2325-12
FuncTional block DiagraM
LVDS IO Mode
V
GND
DD
24
CNV
(15, 21, 44, 52)
(3, 7, 12, 18, 26, 32, 38, 46, 49, 53)
+
–
A
+
–
SDOA
SDOA
IN1
+
–
27
28
14
13
LVDS
I/O
12-BIT+SIGN
SAR ADC
S/H
A
IN1
REFOUT1
×1
REF
22
+
A
A
+
–
SDOB
IN2
+
–
11
10
29
30
LVDS
I/O
12-BIT+SIGN
SAR ADC
–
S/H
SDOB
IN2
REFOUT2
×1
REF
9
+
+
–
CLKOUT
SCK
SCK
41
42
33
34
LVDS
RECEIVERS
OUTPUT
CLOCK DRIVER
–
CLKOUT
SDR/DDR
23
+
A
+
SDOC
IN3
+
5
4
35
36
LVDS
I/O
12-BIT+SIGN
SAR ADC
–
S/H
–
A
–
SDOC
IN3
REFOUT3
×1
REF
6
+
A
A
+
–
SDOD
IN4
+
2
1
39
40
LVDS
I/O
12-BIT+SIGN
SAR ADC
–
S/H
–
SDOD
IN4
REFOUT4
×1
REF
45
250μA
OV (31, 37)
DD
REF
×1.7
×3.4
8
1.2V INT REF
REFBUFEN
43
25
CMOS/LVDS
232512 BDb
232512f
14
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LTC2325-12
TiMing DiagraM
SDR Mode, CMOS
SAMPLE N
SAMPLE N+1
CNV
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16
SCK
Hi-Z
Hi-Z
CLKOUT
Hi-Z
Hi-Z
SDO1
D12
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[12:0] CORRESPOND TO PREVIOUS CONVERSION OF CH1
Hi-Z
Hi-Z
SDO4
D12
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[12:0] CORRESPOND TO PREVIOUS CONVERSION OF CH4
ACQUIRE
CONVERSION AND READOUT
232512 TD01
DDR Mode, CMOS
SAMPLE N
SAMPLE N+1
CNV
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16
SCK
Hi-Z
Hi-Z
CLKOUT
Hi-Z
Hi-Z
SDO1
D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[12:0] CORRESPOND TO PREVIOUS CONVERSION OF CH1
Hi-Z
Hi-Z
SDO4
D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[12:0] CORRESPOND TO PREVIOUS CONVERSION OF CH4
232512 TD02
ACQUIRE
CONVERSION AND READOUT
232512f
15
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LTC2325-12
TiMing DiagraM
SDR Mode, LVDS
SAMPLE N
SAMPLE N+1
CNV
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16
SCK
CLKOUT
SDOA
D12
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[15:0] CORRESPOND TO PREVIOUS CONVERSION OF CH1
SDOD
D12
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[15:0] CORRESPOND TO PREVIOUS CONVERSION OF CH4
ACQUIRE
CONVERSION AND READOUT
232512 TD03
DDR Mode, LVDS
SAMPLE N
SAMPLE N+1
CNV
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16
SCK
CLKOUT
SDOA
D12
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[15:0] CORRESPOND TO PREVIOUS CONVERSION OF CH1
SDOD
D12
D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
0
0
0
SERIAL DATA BITS D[15:0] CORRESPOND TO PREVIOUS CONVERSION OF CH4
232512 TD04
ACQUIRE
CONVERSION AND READOUT
232512f
16
For more information www.linear.com/LTC2325-12
LTC2325-12
applicaTions inForMaTion
OVERVIEW
TRANSFER FUNCTION
The LTC2325-12 is a low noise, high speed 12-bit succes-
sive approximation register (SAR) ADC with differential
inputs and a wide input common mode range. Operating
from a single 3.3V or 5V supply, the LTC2325-12 has a
The LTC2325-12 digitizes the full-scale voltage of 2 •
13
REFOUT1,2,3,4 into 2 levels, resulting in an LSꢀ size of
1mVwithREF=4.±96V.Theidealtransferfunctionisshown
in Figure 2. The output data is in 2’s complement format.
When driven by fully differential inputs, the transfer func-
4V or 8V differential input range, making it ideal for
P-P
P-P
13
applications which require a wide dynamic range. The
LTC2325-12 achieves ±±.5LSꢀ INL typical, no missing
codes at 12 bits and 77dꢀ SNR.
tion spans 2 codes. When driven by pseudo-differential
12
inputs, the transfer function spans 2 codes.
TheLTC2325-12hasanonboardreferencebufferandlow
drift(2±ppm/°Cmax)4.±96Vtemperature-compensated
reference. The LTC2325-12 also has a high speed SPI-
compatible serial interface that supports CMOS or LVDS.
The fast 5Msps per channel throughput with one-cycle
latency makes the LTC2325-12 ideally suited for a wide
variety of high speed applications. The LTC2325-12 dis-
sipates only 45mW per channel. Nap and sleep modes
are also provided to reduce the power consumption
of the LTC2325-12 during inactive periods for further
power savings.
0 1111 1111 1111
0 1111 1111 1110
0 0000 0000 0001
0 0000 0000 0000
1 1111 1111 1111
1LSB = 2 • REFOUT1,2
1 0000 0000 0001
8192
1 0000 0000 0000
–REFOUT
–1LSB 0 1LSB
REFOUT
–1LSB
INPUT VOLTAGE (V)
232512 F02
Figure 2. LTC2325-12 Transfer Function
CONVERTER OPERATION
The LTC2325-12 operates in two phases. During the ac-
quisition phase, the sample capacitor is connected to the
V
DD
C
IN
R
15Ω
ON
10pF
analog input pins A and A to sample the differential
+
–
IN
IN
A
A
+
IN
analoginputvoltage,asshowninFigure3.Afallingedgeon
the CNV pin initiates a conversion. During the conversion
phase,the13-bitCDACissequencedthroughasuccessive
approximationalgorithmeffectivelycomparingthesampled
input with binary-weighted fractions of the reference volt-
BIAS
VOLTAGE
V
DD
C
IN
R
15Ω
ON
10pF
232512 F03
age (e.g., V /2, V
REFOUT
/4 … V
REFOUT
/32768) using
REFOUT
–
IN
adifferentialcomparator. Attheendofconversion, aCDAC
output approximates the sampled analog input. The ADC
control logic then prepares the 13-bit digital output code
for serial transfer.
Figure 3. The Equivalent Circuit for the Differential
Analog Input of the LTC2325-12
Table 1. Code Ranges for the Analog Input Operational Modes
+
–
MODE
SPAN (V – V
)
IN
MIN CODE
MAX CODE
IN
Fully Differential
–REFOUT to +REFOUT
–REFOUT/2 to +REFOUT/2
± to REFOUT
1 ±±±± ±±±± ±±±±
1 1±±± ±±±± ±±±±
± ±±±± ±±±± ±±±±
± 1111 1111 1111
± ±111 1111 1111
± 1111 1111 1111
Pseudo-Differential ꢀipolar
Pseudo-Differential Unipolar
232512f
17
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LTC2325-12
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Analog Input
is connected to the input. Any unwanted signal that is
common to both inputs will be reduced by the common
mode rejection of the ADC sampler. The inputs of the
ADC core draw a small current spike while charging the
The differential inputs of the LTC2325-12 provide great
flexibility to convert a wide variety of analog signals with
no configuration required. The LTC2325-12 digitizes the
C capacitors during acquisition.
IN
difference voltage between the A and A pins while
+
–
IN
IN
supporting a wide common mode input range. The analog
Single-Ended Signals
input signals can have an arbitrary relationship to each
Single-ended signals can be directly digitized by the
LTC2325-12. These signals should be sensed pseudo-
differentially for improved common mode rejection. ꢀy
connecting the reference signal (e.g., ground sense) of
other, provided that they remain between V and GND.
DD
The LTC2325-12 can also digitize more limited classes of
analog input signals such as pseudo-differential unipolar/
bipolarandfullydifferentialwithnoconfigurationrequired.
the main analog signal to the other A pin, any noise or
IN
The analog inputs of the LTC2325-12 can be modeled
by the equivalent circuit shown in Figure 3. The back-
to-back diodes at the inputs form clamps that provide
disturbance common to the two signals will be rejected
by the high CMRR of the ADC. The LTC2325-12 flexibility
handles both pseudo-differential unipolar and bipolar
signals,withnoconfigurationrequired.Thewidecommon
mode input range relaxes the accuracy requirements of
anysignalconditioningcircuitspriortotheanaloginputs.
ESD protection. In the acquisition phase, 1±pF (C )
IN
from the sampling capacitor in series with approximately
15Ω(R )fromtheon-resistanceofthesamplingswitch
ON
V
REF
V
REF
LT1819
LTC2325-12
25Ω
25Ω
+
–
0V
0V
A
+
REFOUT1
REF
IN1
10µF
1µF
V
REF
220pF
10k
V
/2
REF
+
–
V
/2
REF
TO CONTROL
LOGIC
(FPGA, CPLD,
DSP, ETC.)
–
A
SDO1
CLKOUT
SCK
IN1
10k
1µF
ONLY CHANNEL 1 SHOWN FOR CLARITY
232512 F04
Figure 4. Pseudo-Differential Bipolar Application Circuit
ADC CODE
(2’s COMPLEMENT)
4095
2047
A
IN
(A + – A –)
IN IN
–V
–V /2
REF
0
V
REF
/2
V
REF
REF
DOTTED REGIONS AVAILABLE
–2048
–4096
232512 F05
Figure 5. Pseudo-Differential Bipolar Transfer Function
232512f
18
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LTC2325-12
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Pseudo-Differential Bipolar Input Range
Pseudo-Differential Unipolar Input Range
The pseudo-differential bipolar configuration represents
driving one of the analog inputs at a fixed voltage, typically
The pseudo-differential unipolar configuration represents
driving one of the analog inputs at ground and applying a
V
/2, and applying a signal to the other A pin. In this
signal to the other A pin. In this case, the analog input
REF
IN
IN
case the analog input swings symmetrically around the
fixedinputyieldingbipolartwo’scomplementoutputcodes
with an ADC span of half of full-scale. This configuration
is illustrated in Figure 4, and the corresponding transfer
function in Figure 5. The fixed analog input pin need not
be set at V /2, but at some point within the V rails
swings between ground and V yielding unipolar two’s
REF
complement output codes with an ADC span of half of
full-scale. This configuration is illustrated in Figure 6, and
thecorrespondingtransferfunctioninFigure7.Iftheinput
signal (A – A ) swings negative, valid codes will be
+
–
IN
IN
generated by the ADC and must be clamped by the user,
if necessary.
REF
DD
allowingthealternateinputtoswingsymmetricallyaround
thisvoltage.Iftheinputsignal(A –A )swingsbeyond
+
–
IN
IN
±REFOUT1,2,3,4/2, valid codes will be generated by the
ADC and must be clamped by the user, if necessary.
V
REF
LT1818
LTC2325-12
V
REF
25Ω
25Ω
+
–
0V
A
A
+
REFOUT1
IN1
0V
10µF
1µF
REF
220pF
TO CONTROL
LOGIC
(FPGA, CPLD,
DSP, ETC.)
–
SDO1
CLKOUT
SCK
IN1
232512 F06
Figure 6. Pseudo-Differential Unipolar Application Circuit
ADC CODE
(2’s COMPLEMENT)
4095
2047
A
IN
(A + – A –)
IN IN
–V
–V /2
REF
0
V
REF
/2
V
REF
REF
DOTTED REGIONS AVAILABLE
–2048
–4096
232512 F07
Figure 7. Pseudo-Differential Unipolar Transfer Function
232512f
19
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LTC2325-12
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Single-Ended-to-Differential Conversion
signal can span the maximum full-scale of the ADC, up to
±REFOUT1,2,3,4. The common mode input voltage can
Whilesingle-endedsignalscanbedirectlydigitizedaspre-
viously discussed, single-ended to differential conversion
circuits may also be used when higher dynamic range is
desired. ꢀy producing a differential signal at the inputs of
the LTC2325-12, the signal swing presented to the ADC is
maximized, thus increasing the achievable SNR.
The LT®1819 high speed dual operational amplifier is
recommendedforperformingsingle-ended-to-differential
conversions, as shown in Figure 8. In this case, the first
amplifier is configured as a unity-gain buffer and the
single-ended input signal directly drives the high imped-
ance input of this amplifier.
span the entire supply range up to V , limited by the
DD
input signal swing. The fully-differential configuration is
illustrated in Figure 1±, with the corresponding transfer
function illustrated in Figure 11.
INPUT DRIVE CIRCUITS
A low impedance source can directly drive the high im-
pedance inputs of the LTC2325-12 without gain error. A
high impedance source should be buffered to minimize
settling time during acquisition and to optimize the dis-
tortion performance of the ADC. Minimizing settling time
is important even for DC inputs, because the ADC inputs
draw a current spike when during acquisition.
Fully-Differential Inputs
For best performance, a buffer amplifier should be used to
drive the analog inputs of the LTC2325-12. The amplifier
provides low output impedance to minimize gain error
and allows for fast settling of the analog signal during
the acquisition phase. It also provides isolation between
the signal source and the ADC inputs, which draw a small
current spike during acquisition.
To achieve the best distortion performance of the
LTC2325-12, we recommend driving a fully-differential
signal through LT1819 amplifiers configured as two
unity-gain buffers, as shown in Figure 9. This circuit
achieves the full data sheet THD specification of –88dꢀ at
input frequencies up to 5±±kHz. A fully-differential input
V
V
REF
REF
0V
LT1819
LT1819
V
V
REF
REF
+
–
+
–
0V
0V
0V
V
REF
0V
V
V
REF
REF
V
REF
/2
+
–
+
–
200Ω
0V
0V
200Ω
232512 F09
232512 F08
Figure 8. Single-Ended to Differential Driver
Figure 9. LT1819 Buffering a Fully-Differential Signal Source
232512f
20
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LTC2325-12
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Input Filtering
the input bandwidth to the ADC core to 11±MHz. A buffer
amplifier with a low noise density must be selected to
minimize the degradation of the SNR over this bandwidth.
The noise and distortion of the buffer amplifier and signal
sourcemustbeconsideredsincetheyaddtotheADCnoise
and distortion. Noisy input signals should be filtered prior
to the buffer amplifier input with a low bandwidth filter
to minimize noise. The simple 1-pole RC lowpass filter
shown in Figure 12 is sufficient for many applications.
Highqualitycapacitorsandresistorsshouldbeusedinthe
RCfilterssincethesecomponentscanadddistortion.NPO
and silver mica type dielectric capacitors have excellent
linearity. Carbon surface mount resistors can generate
distortion from self heating and from damage that may
occurduringsoldering.Metalfilmsurfacemountresistors
are much less susceptible to both problems.
The sampling switch on-resistance (R ) and the sample
ON
capacitor (C ) form a second lowpass filter that limits
IN
V
V
REF
REF
0V
LT1819
LTC2325-12
25Ω
25Ω
+
–
0V
A
+
REFOUT1
REF
IN1
10µF
1µF
220pF
V
V
REF
0V
REF
+
–
0V
TO CONTROL
LOGIC
(FPGA, CPLD,
DSP, ETC.)
–
A
SDO1
CLKOUT
SCK
IN1
ONLY CHANNEL 1 SHOWN FOR CLARITY
232512 F10
Figure 10. Fully-Differential Application Circuit
ADC CODE
(2’s COMPLEMENT)
4095
2047
A
IN
(A + – A –)
INn
INn
–V
–V /2
REF
0
V
REF
/2
V
REF
REF
–2048
–4096
232512 F11
Figure 11. Fully-Differential Transfer Function
232512f
21
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LTC2325-12
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ADC REFERENCE
the four internal reference buffers with a current limited
output (25±μA) so it may be easily overdriven with an
external reference in the range of 1.25V to 5V. ꢀypass
REF to GND with a 1μF (X5R, ±8±5 size) ceramic capacitor
to compensate the reference buffer and minimize noise.
The 1μF capacitor should be as close as possible to the
LTC2325-12 package to minimize wiring inductance. The
voltage on the REF pin must be externally buffered if used
for external circuitry.
Internal Reference
The LTC2325-12 has an on-chip, low noise, low
drift (2±ppm/°C max), temperature compensated band-
gap reference. It is internally buffered and is available
at REF (Pin 8). The reference buffer gains the internal
reference voltage to 4.±96V for supply voltages V = 5V
DD
and to 2.±48V for V = 3.3V. The REF pin also drives
DD
SINGLE-ENDED
INPUT SIGNAL
50Ω
+
IN
LTC2325
–
IN
3.3nF
SINGLE-ENDED
TO DIFFERENTIAL
232512 F12
DRIVER
BW = 1MHz
Figure 12. Input Signal Chain
Table 2. Reference Configurations and Ranges
REFOUT1,2,3,4
PIN
DIFFERENTIAL
INPUT RANGE
REFERENCE CONFIGURATION
V
REFBUFEN
5V
REF PIN
4.±96V
DD
Internal Reference with Internal ꢀuffers
5V
3.3V
5V
4.±96V
±4.±96V
3.3V
5V
2.±48V
2.±48V
±2.±48V
Common External Reference with Internal ꢀuffer (REF Pin
Externally Overdriven)
1.25V to 5V
1.25V to 5V
4.±96V
1.25V to 3.3V
1.25V to 3.3V
1.25V to 5V
1.25V to 3.3V
±1.25V to ±5V
±1.25V to ±3.3V
±1.25V to ±5V
±1.25V to ±3.3V
3.3V
5V
3.3V
±V
External Reference with REF ꢀuffers Disabled
3.3V
±V
2.±48V
232512f
22
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LTC2325-12
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External Reference
recommendedwhenoverdrivingREFOUT. TheLTC6655-5
offers the same small size, accuracy, drift and extended
temperature range as the LTC6655-4.±96. ꢀy using a 5V
reference, a higher SNR can be achieved. We recommend
bypassing the LTC6655-5 with a 1±μF ceramic capacitor
(X5R, ±8±5 size) close to each of the REFOUT1,2,3,4
pins. If the REF pin voltage is used as a REFOUT refer-
ence when REFꢀUFEN is connected to GND, it should be
buffered externally.
The internal REFOUT1,2,3,4 buffers can also be over-
driven from 1.25V to 5V with an external reference at
REFOUT1,2,3,4 as shown in Figure 13 (c). To do so,
REFꢀUFEN must be grounded to disable the REF buffers.
A 55k internal resistance loads the REFOUT1,2,3,4 pins
when the REF buffers are disabled. To maximize the input
signal swing and corresponding SNR, the LTC6655-5 is
V
3.3V TO 5V
DD
V
+5V
DD
5V TO
13.2V
REFBUFEN
REF
REFBUFEN
REF
LTC6655-4.096
V
V
IN
OUT_F
V
OUT_S
1µF
LTC2325-12
SHDN
LTC2325-12
10µF
10µF
0.1µF
REFOUT1
REFOUT2
REFOUT3
REFOUT4
REFOUT1
REFOUT2
REFOUT3
REFOUT4
10µF
10µF
10µF
10µF
10µF
10µF
10µF
GND
GND
232512 F13a
232512 F13b
(13a) LTC2325-12 Internal Reference Circuit
(13b) LTC2325-12 with a Shared External Reference Circuit
V
+5V
DD
REFBUFEN
REF
1µF
5V TO 13.2V
5V TO 13.2V
5V TO 13.2V
5V TO 13.2V
LTC6655-4.096
V
V
IN
OUT_F
V
OUT_S
REFOUT1
SHDN
10µF
10µF
10µF
10µF
0.1µF
0.1µF
0.1µF
0.1µF
LTC2325-12
LTC6655-2.048
V
V
REFOUT2
REFOUT3
IN
OUT_F
V
OUT_S
SHDN
LTC6655-2.5
V
V
IN
OUT_F
SHDN
V
OUT_S
LTC6655-3
V
V
IN
OUT_F
V
OUT_S
REFOUT4
SHDN
GND
232512 F13c
(13c) LTC2325-12 with Different External Reference Voltages
Figure 13. Reference Connections
232512f
23
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LTC2325-12
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Internal Reference Buffer Transient Response
The REFOUT1,2,3,4 pins of the LTC2325-12 draw charge
DYNAMIC PERFORMANCE
Fast Fourier transform (FFT) techniques are used to test
the ADC’s frequency response, distortion and noise at the
rated throughput. ꢀy applying a low distortion sine wave
and analyzing the digital output using an FFT algorithm,
the ADC’s spectral content can be examined for frequen-
cies outside the fundamental. The LTC2325-12 provides
guaranteed tested limits for both AC distortion and noise
measurements.
(Q
) from the external bypass capacitors during
CONV
each conversion cycle. If the internal reference buffer is
overdriven, the external reference must provide all of this
charge with a DC current equivalent to I = Q
/t
.
REF
CONV CYC
Thus, the DC current draw of I
depends
REFOUT1,2,3,4
on the sampling rate and output code. In applications
where a burst of samples is taken after idling for long
periods, as shown in Figure 14 , I
quickly goes
REFꢀUF
Signal-to-Noise and Distortion Ratio (SINAD)
from approximately ~75µA to a maximum of 5±±µA for
REFOUT = 5V at 5Msps. This step in DC current draw
triggers a transient response in the external reference that
must be considered since any deviation in the voltage at
REFOUT will affect the accuracy of the output code. Due
to the one-cycle conversion latency, the first conversion
result at the beginning of a burst sampling period will
be invalid. If an external reference is used to overdrive
REFOUT1,2,3,4, the fast settling LTC6655 reference is
recommended.
The signal-to-noise and distortion ratio (SINAD) is the
ratiobetweentheRMSamplitudeofthefundamentalinput
frequency and the RMS amplitude of all other frequency
components at the A/D output. The output is bandlimited
tofrequenciesfromaboveDCandbelowhalfthesampling
frequency. Figure16showsthattheLTC2325-12achieves
a typical SINAD of 76dꢀ at a 5MHz sampling rate with a
2.2MHz input.
Signal-to-Noise Ratio (SNR)
The signal-to-noise ratio (SNR) is the ratio between the
RMS amplitude of the fundamental input frequency and
the RMS amplitude of all other frequency components
except the first five harmonics and DC. Figure 16 shows
that the LTC2325-12 achieves a typical SNR of 77dꢀ at a
5MHz sampling rate with a 2.2MHz input.
CNV
IDLE
PERIOD
232512 F14
Figure 14. CNV Waveform Showing Burst Sampling
0
16384
SNR = 77.1dB
THD = –87.2dB
–20
SINAD = 76.2dB
SFDR = 90.3dB
12288
–40
8192
–60
–80
4.096V RANGE
4096
–100
–120
–140
0
+
IN = 5MHz SQUARE WAVE
–
IN = 0V
–4096
0
0.5
1
1.5
2
2.5
–20 –10
0
10 20 30 40 50 60 70 80 90
FREQUENCY (MHz)
SETTLING TIME (ns)
232512 F16
232512 F15
Figure 15. Transient Response of the LTC2325-12
Figure 16. 32k Point FFT of the LTC2325-12
232512f
24
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LTC2325-12
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Total Harmonic Distortion (THD)
allows the LTC2325-12 to communicate with any digital
logic operating between 1.8V and 2.5V. When using LVDS
Totalharmonicdistortion(THD)istheratiooftheRMSsum
ofallharmonicsoftheinputsignaltothefundamentalitself.
The out-of-band harmonics alias into the frequency band
I/O, the OV supply must be set to 2.5V.
DD
Power Supply Sequencing
between DC and half the sampling frequency (f
THD is expressed as:
/2).
SMPL
The LTC2325-12 does not have any specific power supply
sequencing requirements. Care should be taken to adhere
to the maximum voltage relationships described in the
Absolute Maximum Ratings section. The LTC2325-12
has a power-on-reset (POR) circuit that will reset the
LTC2325-12 at initial power-up or whenever the power
supply voltage drops below 2V. Once the supply voltage
re-enters the nominal supply voltage range, the POR will
reinitialize the ADC. No conversions should be initiated
until 1±ms after a POR event to ensure the reinitialization
period has ended. Any conversions initiated before this
time will produce invalid results.
V22 +V32 +V42 +…+VN2
THD=2±log
V1
where V1 is the RMS amplitude of the fundamental
frequency and V2 through V are the amplitudes of the
N
second through Nth harmonics.
POWER CONSIDERATIONS
The LTC2325-12 requires two power supplies: the 3.3V
to 5V power supply (V ), and the digital input/output
DD
interface power supply (OV ). The flexible OV supply
DD
DD
40
35
30
25
20
15
V
DD
= 5V
V
= 3.3V
DD
0
1
2
3
4
5
SAMPLE FREQUENCY (Msps)
232516 F17
Figure 17. Power Supply Current of the LTC2325-12 Versus Sampling Rate
232512f
25
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TIMING AND CONTROL
capture the SDO output eases timing requirements at the
receiver. For low throughput speed applications, CLKOUT
CNV Timing
can be disabled by tying Pin 34 to OV .
DD
The LTC2325-12 sampling and conversion is controlled
by CNV. A rising edge on CNV will start sampling and the
fallingedgestartstheconversionandreadoutprocess.The
conversion process is timed by the SCK input clock. For
optimum performance, CNV should be driven by a clean
low jitter signal. The Typical Application at the back of the
data sheet illustrates a recommended implementation to
reduce the relatively large jitter from an FPGA CNV pulse
source. Note the low jitter input clock times the falling
edge of the CNV signal. The rising edge jitter of CNV is
much less critical to performance. The typical pulse width
of the CNV signal is 3±ns with < 1.5ns rise and fall times
at a 5Msps conversion rate.
Nap/Sleep Modes
Nap mode is a method to save power without sacrificing
power-updelaysforsubsequentconversions. Sleepmode
has substantial power savings, but a power-up delay is
incurred to allow the reference and power systems to
become valid. To enter nap mode on the LTC2325-12,
the SCK signal must be held high or low and a series of
two CNV pulses must be applied. This is the case for both
CMOS and LVDS modes. The second rising edge of CNV
initiates the nap state. The nap state will persist until either
asinglerisingedgeofSCKisapplied,orfurtherCNVpulses
are applied. The SCK rising edge will put the LTC2325-12
back into the operational (full-power) state. When in nap
mode, two additional pulses will put the LTC2325-12 in
sleep mode. When configured for CMOS I/O operation, a
single rising edge of SCK can return the LTC2325-12 into
operational mode. A 1±ms delay is necessary after exiting
sleep mode to allow the reference buffer to recharge the
external filter capacitor. In LVDS mode, exit sleep mode
by supplying a fifth CNV pulse. The fifth pulse will return
the LTC2325-12 to operational mode, and further SCK
pulses will keep the part from re-entering nap and sleep
modes. The fifth SCK pulse also works in CMOS mode
as a method to exit sleep. In the absence of SCK pulses,
repetitive CNV pulses will cycle the LTC2325-12 between
operational, nap and sleep modes indefinitely.
SCK Serial Data Clock Input
In SDR mode (SDR/DDR Pin 23 = GND), the falling edge
of this clock shifts the conversion result MSꢀ first onto
the SDO pins. A 1±±MHz external clock must be applied
at the SCK pin to achieve 5Msps throughput using all four
SDO outputs. In DDR mode (SDR/DDR Pin 23 = OV ),
DD
each input edge of SCK shifts the conversion result MSꢀ
first onto the SDO pins. A 5±MHz external clock must be
applied at the SCK pin to achieve 5Msps throughput using
all five SDO1 through SDO4 outputs.
CLKOUT Serial Data Clock Output
The CLKOUT output provides a skew-matched clock to
latch the SDO output at the receiver. The timing skew
of the CLKOUT and SDO outputs are matched. For high
throughput applications, using CLKOUT instead of SCK to
RefertothetimingdiagramsinFigure18,Figure19,Figure2±
and Figure 21 for more detailed timing information about
sleep and nap modes.
CNV
1
2
NAP MODE
FULL POWER MODE
SCK
HOLD STATIC HIGH OR LOW
Z
WAKE ON 1ST SCK EDGE
SDO1 – 4
Z
232512 F18
Figure 18. CMOS and LVDS Mode NAP and WAKE Using SCK
232512f
26
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LTC2325-12
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REFOUT
RECOVERY
REFOUT1 – 4
4.096V
4.096V
t
WAKE
CNV
1
2
3
4
NAP MODE
SLEEP MODE
FULL POWER MODE
SCK
HOLD STATIC HIGH OR LOW
WAKE ON 1ST SCK EDGE
SDO1 – 4
Z
Z
Z
Z
232512 F19
Figure 19. CMOS Mode SLEEP and WAKE Using SCK
REFOUT
RECOVERY
REFOUT1 – 4
4.096V
4.096V
t
WAKE
WAKE ON 5TH
CNV EDGE
CNV
1
2
3
4
5
NAP MODE
SLEEP MODE
FULL POWER MODE
SCK
HOLD STATIC HIGH OR LOW
SDO1 – 4
Z
Z
Z
Z
Z
232512 F20
Figure 20. LVDS and CMOS Mode SLEEP and WAKE Using CNV
SDR MODE TIMING
DDR MODE TIMING
t
t
CYC
CYC
t
t
t
READOUT
CNVH
CONV
t
t
t
CNVH
CONV
READOUT
t
DSCKCNVH
t
DSCKCNVH
CNV
CNV
t
t
SCKH
t
SCK
SCKH
t
SCK
SCK
SCK
1
2
3
14
15
16
1
2
3
14
15
16
t
SCKL
t
SCKL
CLKOUT
CLKOUT
1
2
3
14
15
16
1
2
3
14
15
16
t
DSCKCLKOUT
t
DSCKCLKOUT
t
t
t
t
DCNVSDOV
DCNVSDOZ
DCNVSDOZ
t
t
HSDO
HSDO
DCNVSDOV
HI-Z
HI-Z
HI-Z
HI-Z
SDO
D12
D11
D10
X
X
X
D12
SDO
D12
D11
D10
X
X
X
D12
232512 F21
Figure 21. LTC2325-12 Timing Diagram
232512f
27
For more information www.linear.com/LTC2325-12
LTC2325-12
applicaTions inForMaTion
DIGITAL INTERFACE
SDR/DDR Modes
The LTC2325-12 features a serial digital interface that
The LTC2325-12 has an SDR (single data rate) and DDR
(double data rate) mode for reading conversion data from
theSDOpins. Inbothmodes, CLKOUTisadelayedversion
of SCK. In SDR mode, each negative edge of SCK shifts
the conversion data out the SDO pins. In DDR mode,
each edge of the SCK input shifts the conversion data
out. In DDR mode, the required SCK frequency is half of
what is required in SDR mode. Tie SDR/DDR to ground
to configure for SDR mode and to OVDD for DDR mode.
The CLKOUT signal is a delayed version of the SCK input
and is phase aligned with the SDO data. In SDR mode, the
SDO transitions on the falling edge of CLKOUT as illus-
trated in Figure 21. We recommend using the rising edge
of CLKOUT to latch the SDO data into the FPGA register
in SDR mode. In DDR mode, the SDO transitions on each
input edge of SCK. We recommend using the CLKOUT ris-
ing and falling edges to latch the SDO data into the FPGA
registers in DDR mode. Since the CLKOUT and SDO data
are phase aligned, we recommend digitally delaying the
SDO data in the FPGA to provide adequate setup and hold
timing margins in DDR mode.
is simple and straightforward to use. The flexible OV
DD
supply allows the LTC2325-12 to communicate with any
digital logic operating between 1.8V and 2.5V. In addi-
tion to a standard CMOS SPI interface, the LTC2325-12
provides an optional LVDS SPI interface to support low
noise digital design. The CMOS /LVDS pin is used to select
the digital interface mode. The SCK input clock shifts the
conversion result MSB first on the SDO pins. CLKOUT
provides a skew-matched clock to latch the SDO output
at the receiver. The timing skew of the CLKOUT and SDO
outputs are matched. For high throughput applications,
using CLKOUT instead of SCK to capture the SDO output
eases timing requirements at the receiver. In CMOS mode,
use the SDO1 – SDO4, and CLKOUT pins as outputs. Use
+
the SCK pin as an input. In LVDS mode, use the SDOA /
–
+
–
+
–
SDOA through SDOD /SDOD and CLKOUT /CLKOUT
pins as differential outputs. Each LVDS lane yields one
channel worth of data: SDOA yields CH1 data, SDOB
yields CH2 data, SDOC yields CH3 data and SDOD yields
CH4 data. These pins must be differentially terminated
by an external 100Ω resistor at the receiver (FPGA).
+
–
The SCK /SCK pins are differential inputs and must be
terminated differentially by an external 100Ω resistor at
the receiver(ADC).
BOARD LAYOUT
To obtain the best performance from the LTC2325-12,
a printed circuit board is recommended. Layout for the
printed circuit board (PCB) should ensure the digital and
analog signal lines are separated as much as possible.
In particular, care should be taken not to run any digital
clocks or signals adjacent to analog signals or underneath
the ADC.
2.5V
LTC2325-12
FPGA OR DSP
OV
DD
+
–
+
–
SCK
SCK
100Ω
100Ω
+
–
+
–
SDOD
SDOD
+
–
+
–
Supply bypass capacitors should be placed as close as
possible to the supply pins. Low impedance common re-
turns for these bypass capacitors are essential to the low
noise operation of the ADC. A single solid ground plane
is recommended for this purpose. When possible, screen
the analog input traces using ground.
SDOC
SDOC
100Ω
100Ω
100Ω
100Ω
2.5V
CMOS/LVDS
+
–
+
–
CLKOUT
CLKOUT
+
–
+
–
SDOB
SDOB
+
–
+
–
SDOA
SDOA
Recommended Layout
RETIMING
FLIP-FLOP
For a detailed look at the reference design for this con-
verter, including schematics and PCB layout, please refer
to DC2395A, the evaluation kit for the LTC2325-12.
CNV
232512 F22
Figure 22. LTC2325-12 Using the LVDS Interface
232512f
28
For more information www.linear.com/LTC2325-12
LTC2325-12
package DescripTion
Please refer to http://www.linear.com/product/LTC2325-12#packaging for the most recent package drawings.
UKG Package
52-Lead Plastic QFN (7mm × 8mm)
(Reference LTC DWG # 05-08-1729 Rev Ø)
7.50 ±0.05
6.10 ±0.05
5.50 REF
(2 SIDES)
0.70 ±0.05
6.45 ±0.05
6.50 REF
(2 SIDES)
7.10 ±0.05 8.50 ±0.05
5.41 ±0.05
PACKAGE OUTLINE
0.25 ±0.05
0.50 BSC
RECOMMENDED SOLDER PAD PITCH AND DIMENSIONS
APPLY SOLDER MASK TO AREAS THAT ARE NOT SOLDERED
5.50 REF
(2 SIDES)
0.75 ±0.05
7.00 ±0.10
(2 SIDES)
R = 0.115
TYP
0.00 – 0.05
51
52
0.40 ±0.10
PIN 1 TOP MARK
(SEE NOTE 6)
1
2
PIN 1 NOTCH
R = 0.30 TYP OR
0.35 × 45°C
CHAMFER
6.45 ±0.10
8.00 ±0.10
(2 SIDES)
6.50 REF
(2 SIDES)
5.41 ±0.10
(UKG52) QFN REV
Ø 0306
R = 0.10
TYP
0.25 ±0.05
0.50 BSC
TOP VIEW
SIDE VIEW
0.200 REF
0.00 – 0.05
BOTTOM VIEW—EXPOSED PAD
0.75 ±0.05
NOTE:
4. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE
1. DRAWING IS NOT A JEDEC PACKAGE OUTLINE
2. DRAWING NOT TO SCALE
MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.20mm ON ANY SIDE, IF PRESENT
5. EXPOSED PAD SHALL BE SOLDER PLATED
3. ALL DIMENSIONS ARE IN MILLIMETERS
6. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION ON THE TOP AND BOTTOM OF PACKAGE
232512f
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-
29
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.
LTC2325-12
Typical applicaTion
Low Jitter Clock Timing with RF Sine Generator Using Clock Squaring/Level-Shifting Circuit and Retiming Flip-Flop
V
CC
NC7SVUO4P5X
0.1µF
1k
MASTER_CLOCK
V
CC
50Ω
1k
D
PRE
NC7SV74K8X
CONV
Q
CONTROL
LOGIC
(FPGA, CPLD,
DSP, ETC.)
CLR
CONV ENABLE
CNV
LTC2325-12
SCK
10Ω
10Ω
CLKOUT
GND
GND
CMOS/LVDS
SDR/DDR
SDO1 – 4
232512 TA02
NC7SVU04P5X (× 5)
relaTeD parTs
PART NUMBER
DESCRIPTION
COMMENTS
ADCs
LTC2311-16/LTC2311-14/ 16-/14-/12-Bit, 5Msps Simultaneous Sampling ADC 3.3V Supply, 1-Channel 40mW, 20ppm/°C Internal Reference, Flexible
LTC2311-12
Inputs, 16-Lead MSOP Package
LTC2323-16/LTC2323-14/ 16-14-/12-Bit Dual Simultaneous Sampling ADC
LTC2323-12
3V/5V Supply, 40mW/Ch, 20ppm/°C Max Internal Reference, Flexible
Inputs, 4mm × 5mm QFN-28 Package
LTC2321-16/LTC2321-14/ 16-/14-/12-Bit, Dual 2Msps, Simultaneous
3.3V/5V Supply, 33mW/Ch, 20ppm°C Max Internal Reference,
Flexible Inputs, 4mm × 5mm QFN-28 Package
LTC2321-12
Sampling ADCs
LTC2320-16/LTC2320-14/ 16-/14-12-Bit Octal, 1.5Msps/Ch Simultaneous
LTC2320-12 Sampling ADC
3.3V/5V Supply, 20mW/Ch, 20ppm/°C Internal Reference,
Flexible Inputs, 7mm × 8mm QFN-52 Package
LTC2324-16/LTC2324-14/ 16-/14-12-Bit Quad, 2Msps/Ch Simultaneous
3.3V/5V Supply, 40mW/Ch, 20ppm/°C Internal Reference,
Flexible Inputs, 7mm × 8mm QFN-52 Package
LTC2324-12
Sampling ADC
DACs
LTC2632
Dual 12-/10-/8-Bit, SPI V
Reference
DACs with Internal
DACs with External
2.7V to 5.5V Supply Range, 10ppm/°C Reference, External REF Mode,
Rail-to-Rail Output, 8-Pin ThinSOT™ Package
OUT
LTC2602/LTC2612/
LTC2622
Dual 16-/14-/12-Bit SPI V
Reference
300μA per DAC, 2.5V to 5.5V Supply Range, Rail-to-Rail Output, 8-Lead
MSOP Package
OUT
References
LTC6655
Precision Low Drift, Low Noise Buffered Reference 5V/4.096V/3.3V/3V/2.5V/2.048V/1.25V, 2ppm/°C, 0.25ppm
Peak-to-Peak Noise, MSOP-8 Package
LTC6652
Precision Low Drift, Low Noise Buffered Reference 5V/4.096V/3.3V/3V/2.5V/2.048V/1.25V, 5ppm/°C, 2.1ppm
Peak-to-Peak Noise, MSOP-8 Package
Amplifiers
LT1818/LT1819
400MHz, 2500V/µs, 9mA Single/Dual Operational
Amplifiers
–85dBc Distortion at 5MHz, 6nV/√Hz Input Noise Voltage, 9mA Supply
Current, Unity-Gain Stable
LT1806
LT6200
325MHz, Single, Rail-to-Rail Input and Output, Low –80dBc Distortion at 5MHz, 3.5nV/√Hz Input Noise Voltage,
Distortion, Low Noise Precision Op Amps 9mA Supply Current, Unity-Gain Stable
165MHz, Rail-to-Rail Input and Output, 0.95nV/√Hz Low Noise, Low Distortion, Unity-Gain Stable
Low Noise, Op Amp Family
232512f
LT 0417 • PRINTED IN USA
www.linear.com/LTC2325-12
30
LINEAR TECHNOLOGY CORPORATION 2017
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