LTC2418 [Linear]
2-Channel Differential Input 24-Bit No Latency DS ADC; 双通道差分输入24位无延迟DS ADC型号: | LTC2418 |
厂家: | Linear |
描述: | 2-Channel Differential Input 24-Bit No Latency DS ADC |
文件: | 总36页 (文件大小:409K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
LTC2412
2-Channel Differential Input
24-Bit No Latency ∆Σ ADC
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DESCRIPTIO
FEATURES
TheLTC®2412isa2-channeldifferentialinputmicropower
24-bit No Latency ∆ΣTM analog-to-digital converter with
anintegratedoscillator.Itprovides2ppmINLand0.16ppm
RMS noise over the entire supply range. The two differen-
tial channels are converted alternately with channel ID
included in the conversion results. It uses delta-sigma
technology and provides single conversion settling of the
digital filter. Through a single pin, the LTC2412 can be
configured for better than 110dB input differential mode
rejection at 50Hz or 60Hz ±2%, or it can be driven by an
external oscillator for a user defined rejection frequency.
The internal oscillator requires no external frequency
setting components.
■
2-Channel Differential Input with Automatic
Channel Selection (Ping-Pong)
■
Low Supply Current: 200µA, 4µA in Autosleep
■
Differential Input and Differential Reference with
GND to VCC Common Mode Range
2ppm INL, No Missing Codes
■
■
2.5ppm Full-Scale Error and 0.1ppm Offset
■
0.16ppm Noise, 22.5 Effective Number of Bits
■
No Latency: Digital Filter Settles in a Single Cycle and
Each Channel Conversion is Accurate
■
Internal Oscillator—No External Components
Required
■
110dB Min, 50Hz or 60Hz Notch Filter
■
Narrow SSOP-16 Package
The converter accepts any external differential reference
voltage from 0.1V to VCC for flexible ratiometric and
remote sensing measurement configurations. The full-
■
Single Supply 2.7V to 5.5V Operation
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APPLICATIO S
scale differential input range is from –0.5VREF to 0.5VREF
.
The reference common mode voltage, VREFCM, and the
input common mode voltage, VINCM, may be indepen-
dently set anywhere within the GND to VCC. The DC
common mode input rejection is better than 140dB.
■
Direct Sensor Digitizer
■
Weight Scales
■
Direct Temperature Measurement
Gas Analyzers
Strain-Gage Transducers
Instrumentation
Data Acquisition
Industrial Process Control
6-Digit DVMs
■
■
The LTC2412 communicates through a flexible 3-wire
digital interface which is compatible with SPI and
MICROWIRETM protocols.
, LTC and LT are registered trademarks of Linear Technology Corporation.
No Latency ∆Σ is a trademark of Linear Technology Corporation.
MICROWIRE is a trademark of National Semiconductor Corporation.
■
■
■
■
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TYPICAL APPLICATIO
Total Unadjusted Error vs Input
1.5
2.7V TO 5.5V
V
CC
1µF
1.0
= INTERNAL OSC/50Hz REJECTION
1
2
4
14
= EXTERNAL CLOCK SOURCE
= INTERNAL OSC/60Hz REJECTION
V
F
O
CC
+
+
0.5
0
REF
CH0
LTC2412
5
3
13
12
11
–
T
T
= 90°C
= 25°C
CH0
SCK
SDO
CS
A
A
V
= 5V
CC
–0.5
–1.0
–1.5
+
THERMOCOUPLE
REF = 5V
3-WIRE
SPI INTERFACE
–
–
REF
REF = GND
T
= –45°C
A
6
7
V
V
= 5V
INCM
= GND
+
REF
CH1
CH1
= 2.5V
–
F
O
8, 9, 10, 15, 16
–2.5 –2 –1.5 –1 –0.5
V
0
0.5
1
1.5
2
2.5
GND
2412 TA01
(V)
2412 TA02
IN
2412f
1
LTC2412
W W
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ABSOLUTE AXI U RATI GS
PACKAGE/ORDER I FOR ATIO
(Notes 1, 2)
TOP VIEW
ORDER PART NUMBER
Supply Voltage (VCC) to GND.......................–0.3V to 7V
Analog Input Voltage
to GND.................................... –0.3V to (VCC + 0.3V)
Reference Input Voltage
to GND.................................... –0.3V to (VCC + 0.3V)
Digital Input Voltage to GND........ –0.3V to (VCC + 0.3V)
Digital Output Voltage to GND ..... –0.3V to (VCC + 0.3V)
Operating Temperature Range
LTC2412C ............................................... 0°C to 70°C
LTC2412I............................................ –40°C to 85°C
Storage Temperature Range ................. –65°C to 150°C
Lead Temperature (Soldering, 10 sec).................. 300°C
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
GND
GND
V
CC
+
LTC2412CGN
LTC2412IGN
REF
REF
CH0
CH0
CH1
CH1
–
+
–
+
–
F
O
SCK
SDO
CS
GN PART MARKING
GND
GND
GND
2412
2412I
GN PACKAGE
16-LEAD PLASTIC SSOP
TJMAX = 125°C, θJA = 110°C/W
Consult LTC Marketing for parts specified with wider operating temperature ranges.
ELECTRICAL CHARACTERISTICS
The ● denotes specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Notes 3, 4)
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
Resolution (No Missing Codes)
Integral Nonlinearity
0.1V ≤ V ≤ V , –0.5 • V ≤ V ≤ 0.5 • V , (Note 5)
●
●
●
24
Bits
REF
CC
REF
IN
–
REF
+
5V ≤ V ≤ 5.5V, REF = 2.5V, REF = GND, V
= 1.25V, (Note 6)
= 2.5V, (Note 6)
1
2
5
ppm of V
ppm of V
ppm of V
CC
INCM
REF
REF
REF
+
–
5V ≤ V ≤ 5.5V, REF = 5V, REF = GND, V
14
CC
INCM
+
–
REF = 2.5V, REF = GND, V
= 1.25V, (Note 6)
INCM
+
–
Offset Error
2.5V ≤ REF ≤ V , REF = GND,
0.5
2.5
µV
CC
+
–
GND ≤ IN = IN ≤ V , (Note 14)
CC
+
–
Offset Error Drift
2.5V ≤ REF ≤ V , REF = GND,
10
nV/°C
ppm of V
CC
+
–
GND ≤ IN = IN ≤ V
CC
+
–
Positive Full-Scale Error
Positive Full-Scale Error Drift
Negative Full-Scale Error
Negative Full-Scale Error Drift
Total Unadjusted Error
2.5V ≤ REF ≤ V , REF = GND,
●
●
2.5
12
12
CC
REF
+
+
–
+
IN = 0.75REF , IN = 0.25 • REF
+
–
2.5V ≤ REF ≤ V , REF = GND,
0.03
2.5
ppm of V /°C
REF
CC
+
+
–
+
IN = 0.75REF , IN = 0.25 • REF
+
–
2.5V ≤ REF ≤ V , REF = GND,
ppm of V
REF
CC
+
+
–
+
+
IN = 0.25 • REF , IN = 0.75 • REF
+
–
2.5V ≤ REF ≤ V , REF = GND,
0.03
ppm of V /°C
REF
CC
+
+
–
IN = 0.25 • REF , IN = 0.75 • REF
+
–
5V ≤ V ≤ 5.5V, REF = 2.5V, REF = GND, V
5V ≤ V ≤ 5.5V, REF = 5V, REF = GND, V
REF = 2.5V, REF = GND, V
= 1.25V
= 2.5V
3
3
4
ppm of V
ppm of V
ppm of V
CC
INCM
REF
REF
REF
+
–
CC
INCM
+
–
= 1.25V, (Note 6)
INCM
+
–
Output Noise
5V ≤ V ≤ 5.5V, REF = 5V, REF = GND,
0.8
µV
RMS
CC
–
+
GND ≤ IN = IN ≤ V , (Note 13)
CC
2412f
2
LTC2412
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CO VERTER CHARACTERISTICS
The ● denotes specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Notes 3, 4)
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
+
–
Input Common Mode Rejection DC 2.5V ≤ REF ≤ V , REF = GND,
●
●
●
●
●
●
130
140
dB
CC
–
+
GND ≤ IN = IN ≤ V (Note 5)
CC
+
–
Input Common Mode Rejection
60Hz ±2%
2.5V ≤ REF ≤ V , REF = GND,
140
140
110
110
130
dB
dB
dB
dB
dB
CC
–
+
GND ≤ IN = IN ≤ V , (Notes 5, 7)
CC
+
–
Input Common Mode Rejection
50Hz ±2%
2.5V ≤ REF ≤ V , REF = GND,
CC
–
+
GND ≤ IN = IN ≤ V , (Notes 5, 8)
CC
Input Normal Mode Rejection
60Hz ±2%
(Notes 5, 7)
140
140
140
Input Normal Mode Rejection
(Note 5, 8)
50Hz ±2%
+
–
Reference Common Mode
Rejection DC
2.5V ≤ REF ≤ V , GND ≤ REF ≤ 2.5V,
CC
–
+
V
= 2.5V, IN = IN = GND (Note 5)
REF
+
–
–
+
Power Supply Rejection, DC
REF = 2.5V, REF = GND, IN = IN = GND
120
120
120
dB
dB
dB
+
–
–
+
Power Supply Rejection, 60Hz ±2% REF = 2.5V, REF = GND, IN = IN = GND, (Note 7)
+
–
–
+
Power Supply Rejection, 50Hz ±2% REF = 2.5V, REF = GND, IN = IN = GND, (Note 8)
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A ALOG I PUT A D REFERE CE The ● denotes specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 3)
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
+
+
IN
Absolute/Common Mode IN Voltage
●
●
●
GND – 0.3
GND – 0.3
V
V
+ 0.3
V
V
V
CC
CC
–
–
IN
Absolute/Common Mode IN Voltage
+ 0.3
/2
V
Input Differential Voltage Range
–V /2
REF
V
IN
REF
+
–
(IN – IN )
+
–
+
REF
REF
Absolute/Common Mode REF Voltage
●
●
●
0.1
GND
0.1
V
V
V
V
CC
–
Absolute/Common Mode REF Voltage
V
– 0.1
CC
V
Reference Differential Voltage Range
V
REF
CC
+
–
(REF – REF )
+
+
C (IN )
IN Sampling Capacitance
18
18
18
18
1
pF
pF
pF
pF
nA
nA
nA
nA
S
–
–
C (IN )
IN Sampling Capacitance
S
+
+
C (REF )
REF Sampling Capacitance
S
–
–
C (REF )
REF Sampling Capacitance
S
+
+
+
I
I
I
I
(IN )
IN DC Leakage Current
CS = V = 5.5V, IN = GND
●
●
●
●
–10
–10
–10
–10
10
DC_LEAK
DC_LEAK
DC_LEAK
DC_LEAK
CC
–
–
–
(IN )
IN DC Leakage Current
CS = V = 5.5V, IN = 5.5V
1
10
10
10
CC
+
+
+
(REF )
REF DC Leakage Current
CS = V = 5.5V, REF = 5.5V
1
CC
–
–
–
(REF )
REF DC Leakage Current
CS = V = 5.5V, REF = GND
1
CC
2412f
3
LTC2412
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DIGITAL I PUTS A D DIGITAL OUTPUTS
The ● denotes specifications which apply over the full
operating temperature range, otherwise specifications are at TA = 25°C. (Note 3)
SYMBOL
PARAMETER
CONDITIONS
2.7V ≤ V ≤ 5.5V
MIN
TYP
MAX
UNITS
V
IH
V
IL
V
IH
V
IL
High Level Input Voltage
●
●
●
●
●
●
2.5
2.0
V
V
CC
CS, F
2.7V ≤ V ≤ 3.3V
O
CC
Low Level Input Voltage
CS, F
4.5V ≤ V ≤ 5.5V
0.8
0.6
V
V
CC
2.7V ≤ V ≤ 5.5V
O
CC
High Level Input Voltage
SCK
2.7V ≤ V ≤ 5.5V (Note 9)
2.5
2.0
V
V
CC
2.7V ≤ V ≤ 3.3V (Note 9)
CC
Low Level Input Voltage
SCK
4.5V ≤ V ≤ 5.5V (Note 9)
0.8
0.6
V
V
CC
2.7V ≤ V ≤ 5.5V (Note 9)
CC
I
I
Digital Input Current
0V ≤ V ≤ V
CC
–10
–10
10
µA
µA
pF
pF
V
IN
IN
CS, F
O
Digital Input Current
SCK
0V ≤ V ≤ V (Note 9)
10
IN
IN
CC
C
C
V
V
V
V
Digital Input Capacitance
10
10
IN
CS, F
O
Digital Input Capacitance
SCK
(Note 9)
IN
High Level Output Voltage
SDO
I = –800µA
O
●
●
●
●
●
V
V
– 0.5
OH
OL
OH
OL
CC
CC
Low Level Output Voltage
SDO
I = 1.6mA
O
0.4
V
High Level Output Voltage
SCK
I = –800µA (Note 10)
O
– 0.5
V
Low Level Output Voltage
SCK
I = 1.6mA (Note 10)
O
0.4
10
V
I
Hi-Z Output Leakage
SDO
–10
µA
OZ
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POWER REQUIRE E TS
The ● denotes specifications which apply over the full operating temperature range,
otherwise specifications are at TA = 25°C. (Note 3)
SYMBOL
PARAMETER
Supply Voltage
Supply Current
CONDITIONS
MIN
TYP
MAX
UNITS
V
CC
●
2.7
5.5
V
I
CC
Conversion Mode
Sleep Mode
Sleep Mode
CS = 0V
●
●
200
4
2
300
13
µA
µA
µA
CS = V (Note 12)
CC
CS = V , 2.7V ≤ V ≤ 3.3V
CC
CC
(Note 12)
2412f
4
LTC2412
W U
TI I G CHARACTERISTICS
The ● denotes specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. (Note 3)
SYMBOL
PARAMETER
CONDITIONS
MIN
2.56
0.25
0.25
TYP
MAX
2000
390
UNITS
kHz
µs
f
t
t
t
External Oscillator Frequency Range
External Oscillator High Period
External Oscillator Low Period
Conversion Time
●
●
●
EOSC
HEO
390
µs
LEO
F = 0V
●
●
●
130.86
157.03
133.53
160.23
EOSC
136.20
163.44
(in kHz)
ms
ms
ms
CONV
O
F = V
O
CC
External Oscillator (Note 11)
20510/f
f
Internal SCK Frequency
Internal Oscillator (Note 10)
External Oscillator (Notes 10, 11)
19.2
kHz
kHz
ISCK
f
/8
EOSC
D
Internal SCK Duty Cycle
(Note 10)
(Note 9)
(Note 9)
(Note 9)
●
●
●
●
45
55
%
kHz
ns
ISCK
f
t
t
t
External SCK Frequency Range
External SCK Low Period
2000
ESCK
250
250
1.64
LESCK
External SCK High Period
ns
HESCK
DOUT_ISCK
Internal SCK 32-Bit Data Output Time
Internal Oscillator (Notes 10, 12)
External Oscillator (Notes 10, 11)
●
●
1.67
1.70
ms
ms
256/f
(in kHz)
EOSC
t
t
External SCK 32-Bit Data Output Time
CS ↓ to SDO Low Z
CS ↑ to SDO High Z
CS ↓ to SCK ↓
(Note 9)
●
●
●
●
●
●
●
●
●
32/f
(in kHz)
ms
ns
ns
ns
ns
ns
ns
ns
ns
DOUT_ESCK
1
ESCK
0
0
200
200
200
t2
t3
t4
(Note 10)
(Note 9)
0
CS ↓ to SCK ↑
50
t
t
SCK ↓ to SDO Valid
SDO Hold After SCK ↓
SCK Set-Up Before CS ↓
SCK Hold After CS ↓
220
50
KQMAX
KQMIN
(Note 5)
15
50
t
t
5
6
Note 1: Absolute Maximum Ratings are those values beyond which the
life of the device may be impaired.
Note 8: FO = VCC (internal oscillator) or fEOSC = 128000Hz ±2%
(external oscillator).
Note 2: All voltage values are with respect to GND.
Note 9: The converter is in external SCK mode of operation such that
the SCK pin is used as digital input. The frequency of the clock signal
driving SCK during the data output is fESCK and is expressed in kHz.
Note 10: The converter is in internal SCK mode of operation such that
the SCK pin is used as digital output. In this mode of operation the
SCK pin has a total equivalent load capacitance CLOAD = 20pF.
Note 3: VCC = 2.7V to 5.5V unless otherwise specified.
V
REF = REF+ – REF–, VREFCM = (REF+ + REF–)/2; VIN = IN+ – IN–,
VINCM = (IN+ + IN–)/2, IN+ and IN– are defined as the selected positive
(CH0+ or CH1+) and negative (CH0– or CH1–) input respectively.
Note 4: FO pin tied to GND or to VCC or to external conversion clock
source with fEOSC = 153600Hz unless otherwise specified.
Note 5: Guaranteed by design, not subject to test.
Note 11: The external oscillator is connected to the FO pin. The external
oscillator frequency, fEOSC, is expressed in kHz.
Note 12: The converter uses the internal oscillator.
Note 6: Integral nonlinearity is defined as the deviation of a code from
a straight line passing through the actual endpoints of the transfer
curve. The deviation is measured from the center of the quantization
band.
FO = 0V or FO = VCC
.
Note 13: The output noise includes the contribution of the internal
calibration operations.
Note 7: FO = 0V (internal oscillator) or fEOSC = 153600Hz ±2%
Note 14: Guaranteed by design and test correlation.
(external oscillator).
2412f
5
LTC2412
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TYPICAL PERFOR A CE CHARACTERISTICS
Total Unadjusted Error vs
Temperature (VCC = 5V,
Total Unadjusted Error vs
Temperature (VCC = 5V,
VREF = 2.5V)
Total Unadjusted Error vs
Temperature (VCC = 2.7V,
VREF = 2.5V)
V
REF = 5V)
1.5
1.0
1.5
1.0
10
8
V
= 5V
CC
+
REF = 2.5V
–
REF = GND
6
V
V
= 2.5V
INCM
= GND
REF
= 1.25V
4
T
= 90°C
A
0.5
0.5
F
O
2
T = 25°C
A
T
T
T
= 90°C
= 25°C
= –45°C
0
0
A
A
A
0
T
T
= 90°C
= 25°C
–2
A
–0.5
–1.0
–1.5
–0.5
–1.0
–1.5
–4
A
–6
T
= –45°C
O
A
V
V
= 2.5V
REF
T
= –45°C
A
= 1.25V
–0.5
INCM
–8
F
= GND
F
O
= GND
–10
–2.5 –2 –1.5 –1 –0.5
V
0
0.5
1
1.5
2
2.5
–1
–0.5
0
0.5
1
–1
0
0.5
1
(V)
V
(V)
V
(V)
IN
IN
IN
2412 G01
2412 G02
2412 G03
Integral Nonlinearity vs
Temperature (VCC = 5V,
VREF = 2.5V)
Integral Nonlinearity vs
Temperature (VCC = 5V,
VREF = 5V)
Integral Nonlinearity vs
Temperature (VCC = 2.7V,
VREF = 2.5V)
1.5
1.0
1.5
1.0
10
8
V
= 5V
V
= 2.7V
V
V
= 2.5V
REF
INCM
F = GND
O
CC
CC
+
REF = 2.5V
= 1.25V
–
REF = GND
6
T
= –45°C
T = 25°C
A
A
T
= 25°C
A
4
0.5
0.5
T
= 90°C
2
A
0
0
0
T
A
= 90°C
–2
–4
–6
–8
–10
V
= 5V
CC
T
= 90°C
= 25°C
A
A
+
–0.5
–1.0
–1.5
–0.5
–1.0
–1.5
REF = 2.5V
–
T
T
REF = GND
V
V
= 2.5V
INCM
= GND
REF
= –45°C
A
= 1.25V
F
O
–2.5 –2 –1.5 –1 –0.5
V
0
0.5
1
1.5
2
2.5
–1
–0.5
0
0.5
1
–1
–0.5
0
0.5
1
(V)
V
(V)
V
(V)
IN
IN
IN
2412 G04
2412 G05
2412 G06
Noise Histogram (Output Rate =
7.5Hz, VCC = 5V, VREF = 5V)
Noise Histogram (Output Rate =
22.5Hz, VCC = 5V, VREF = 5V)
Noise Histogram (Output Rate =
52.5Hz, VCC = 5V, VREF = 5V)
12
10
8
12
10
8
12
10
8
10,000 CONSECUTIVE
READINGS
GAUSSIAN
10,000 CONSECUTIVE
READINGS
GAUSSIAN
10,000 CONSECUTIVE
READINGS
GAUSSIAN
DISTRIBUTION
m = 0.105ppm
σ = 0.153ppm
DISTRIBUTION
m = 0.067ppm
σ = 0.151ppm
DISTRIBUTION
m = 8.285ppm
σ = 0.311ppm
V
V
V
= 5V
V
V
V
= 5V
V
V
V
= 5V
CC
REF
IN
CC
REF
IN
CC
REF
= 5V
= 5V
= 5V
= 0V
= 0V
= 0V
IN
+
+
+
–
REF = 5V
REF = 5V
REF = 5V
–
–
REF = GND
REF = GND
REF = GND
+
–
+
–
+
–
IN = 2.5V
IN = 2.5V
IN = 2.5V
6
6
6
IN = 2.5V
IN = 2.5V
IN = 2.5V
F
= GND
= 25°C
F
= 460800Hz
= 25°C
F = 1075200Hz
O
O
O
T
T
T = 25°C
A
A
A
4
4
4
2
2
2
0
0
0
–0.8 –0.6 –0.4 –0.2
0
0.2 0.4 0.6 0.8
–0.8 –0.6 –0.4 –0.2
0
0.2 0.4 0.6 0.8
–9.8 –9.4 –9 –8.6 –8.2 –7.8 –7.4 –7 –6.6
OUTPUT CODE (ppm OF V
)
OUTPUT CODE (ppm OF V
)
OUTPUT CODE (ppm OF V
)
REF
REF
REF
2412 G07
2412 G08
2412 G09
2412f
6
LTC2412
U W
TYPICAL PERFOR A CE CHARACTERISTICS
Noise Histogram (Output Rate =
7.5Hz, VCC = 5V, VREF = 2.5V)
Noise Histogram (Output Rate =
22.5Hz, VCC = 5V, VREF = 2.5V)
Noise Histogram (Output Rate =
52.5Hz, VCC = 5V, VREF = 2.5V)
12
10
8
12
10
8
12
10
8
10,000 CONSECUTIVE
READINGS
GAUSSIAN
10,000 CONSECUTIVE
READINGS
GAUSSIAN
10,000 CONSECUTIVE
READINGS
GAUSSIAN
DISTRIBUTION
m = 0.033ppm
σ = 0.293ppm
DISTRIBUTION
m = 0.014ppm
σ = 0.292ppm
DISTRIBUTION
m = 3.852ppm
σ = 0.326ppm
V
V
V
= 5V
V
V
V
= 5V
V
V
V
= 5V
CC
REF
IN
CC
REF
IN
CC
REF
= 2.5V
= 2.5V
= 2.5V
= 0V
= 0V
= 0V
IN
+
+
+
–
REF = 2.5V
REF = 2.5V
REF = 2.5V
–
–
REF = GND
REF = GND
REF = GND
+
–
+
–
+
–
IN = 1.25V
IN = 1.25V
IN = 1.25V
6
6
6
IN = 1.25V
IN = 1.25V
IN = 1.25V
F
= GND
= 25°C
F
= 460800Hz
= 25°C
F = 1075200Hz
O
O
O
T
T
T = 25°C
A
A
A
4
4
4
2
2
2
0
0
0
–1.6
–0.8
0
0.8
1.6
–1.6 –1.2 –0.8 –0.4
0
0.4 0.8 1.2 1.6
–5.5 –5.1 –4.7 –4.3 –3.9 –3.5 –3.1 –2.7 –2.3
OUTPUT CODE (ppm OF V
)
OUTPUT CODE (ppm OF V
)
OUTPUT CODE (ppm OF V
)
REF
REF
REF
2412 G10
2410 G11
2412 G12
Noise Histogram (Output Rate =
22.5Hz, VCC = 2.7V, VREF = 2.5V)
Noise Histogram (Output Rate =
7.5Hz, VCC = 2.7V, VREF = 2.5V)
Noise Histogram (Output Rate =
52.5Hz, VCC = 2.7V, VREF = 2.5V)
12
10
8
12
10
8
10
9
8
7
6
5
4
3
2
1
0
10,000 CONSECUTIVE
READINGS
GAUSSIAN
10,000 CONSECUTIVE
READINGS
GAUSSIAN
10,000 CONSECUTIVE
READINGS
GAUSSIAN
DISTRIBUTION
m = 0.079ppm
σ = 0.298ppm
DISTRIBUTION
m = 0.177ppm
σ = 0.297ppm
DISTRIBUTION
m = 3.714ppm
σ = 1.295ppm
V
V
V
= 2.7V
V
V
V
= 2.7V
V
V
V
= 2.7V
CC
REF
IN
CC
REF
IN
CC
REF
= 2.5V
= 2.5V
= 2.5V
= 0V
= 0V
= 0V
IN
+
+
+
–
REF = 2.5V
REF = 2.5V
REF = 2.5V
–
–
REF = GND
REF = GND
REF = GND
+
–
+
–
+
–
IN = 1.25V
IN = 1.25V
IN = 1.25V
6
6
IN = 1.25V
IN = 1.25V
IN = 1.25V
F
= GND
= 25°C
F
= 460800Hz
= 25°C
F = 1075200Hz
O
A
O
A
O
T
T
T = 25°C
A
4
4
2
2
0
0
–1.6 –1.2 –0.8 –0.4
0
0.4 0.8 1.2 1.6
–1.6 –1.2 –0.8 –0.4
0
0.4 0.8 1.2 1.6
–10 –8.5 –7 –5.5 –4 –2.5 –1 0.5
OUTPUT CODE (ppm OF V
2
OUTPUT CODE (ppm OF V
)
OUTPUT CODE (ppm OF V
)
)
REF
REF
REF
2412 G13
2412 G14
2412 G15
Long-Term Noise Histogram
(Time = 60 Hrs, VCC = 5V,
VREF = 5V)
Consecutive ADC Readings
vs Time
RMS Noise
vs Input Differential Voltage
12
10
8
1.0
0.8
0.5
0.4
0.3
0.2
0.1
0
V
V
= 5V
= 5V
GAUSSIAN DISTRIBUTION
m = 0.101837ppm
CC
REF
REF = 5V
+
σ = 0.154515ppm
–
0.6
REF = GND
V
= 2.5V
= GND
= 25°C
INCM
0.4
ADC CONSECUTIVE
READINGS
F
O
0.2
T
A
V
V
V
= 5V
= 5V
CC
REF
IN
6
0
= 0V
+
–0.2
–0.4
–0.6
–0.8
–1.0
REF = 5V
–
4
REF = GND
+
–
IN = 2.5V
+
–
V
V
V
= 5V
T = 25°C
A
IN = 2.5V
CC
IN = 2.5V
+
= 5V REF = 5V IN = 2.5V
2
REF
F
= GND
= 25°C
–
O
A
= 0V REF = GND
IN
T
F
= GND
O
0
–0.8 –0.6 –0.4 –0.2
0
0.2 0.4 0.6 0.8
0
5
10 15 20 25 30 35 40 45 50 55 60
TIME (HOURS)
–2.5 –2 –1.5 –1 –0.5
0
0.5
1
1.5
2
2.5
OUTPUT CODE (ppm OF V
)
INPUT DIFFERENTIAL VOLTAGE (V)
REF
2412 G16
2412 G17
2412 G18
2412f
7
LTC2412
U W
TYPICAL PERFOR A CE CHARACTERISTICS
RMS Noise vs VINCM
RMS Noise vs Temperature (TA)
RMS Noise vs VCC
850
825
800
775
750
725
700
675
650
850
825
800
775
750
725
700
675
650
850
825
800
775
750
725
700
675
650
+
–
REF = 2.5V
REF = GND
V
= 2.5V
REF
+
IN = GND
–
IN = GND
F
= GND
O
A
T
= 25°C
V
= 5V
CC
+
REF = 5V
–
V
= 5V
REF = GND
CC
+
REF = 5V
V
= 5V
REF
–
+
–
REF = GND
IN = V
INCM
INCM
+
–
IN = 2.5V
IN = V
IN = 2.5V
V
F
A
= 0V
IN
O
V
F
= 0V
= GND
= GND
IN
O
T
= 25°C
–0.5 0 0.5
1
1.5
2
2.5
3
(V)
3.5
4
4.5
5
5.5
–50
–25
0
25
50
75
100
2.7 3.1 3.5 3.9 4.3 4.7 5.1 5.5
(V)
V
INCM
TEMPERATURE (°C)
V
CC
2412 G19
2412 G20
2412 G21
Offset Error vs VINCM
RMS Noise vs VREF
Offset Error vs Temperature (TA)
850
825
800
775
750
725
700
675
650
0.3
0.2
0.3
0.2
V
= 5V
CC
–
REF = GND
+
–
IN = GND
IN = GND
F
= GND
= 25°C
O
A
0.1
0.1
T
V
= 5V
CC
+
0
0
REF = 5V
–
V
= 5V
CC
REF = GND
+
REF = 5V
V
= 5V
REF
–0.1
–0.2
–0.3
–0.1
–0.2
–0.3
–
+
–
REF = GND
IN = V
INCM
INCM
+
–
IN = 2.5V
IN = V
V
IN = 2.5V
= 0V
IN
V
O
= 0V
= GND
IN
F
= GND
O
A
F
T
= 25°C
0
0.5
1
1.5
2
V
2.5
(V)
3
3.5
4
4.5
5
–0.5 0 0.5
1
1.5
2
2.5
3
(V)
3.5
4
4.5
5
5.5
–50
–25
0
25
50
75
100
V
INCM
TEMPERATURE (°C)
REF
2412 G22
2412 G23
2412 G24
+Full-Scale Error
vs Temperature (TA)
Offset Error vs VCC
Offset Error vs VREF
0.3
0.2
0.3
0.2
3
2
1
0.1
0.1
0
0
0
+
–
REF = 2.5V
V
= 5V
V
= 5V
CC
REF = GND
CC
–0.1
–0.2
–0.3
–0.1
–0.2
–0.3
–1
–2
–3
–
+
REF = GND
REF = 5V
V
= 2.5V
REF
+
–
–
+
IN = GND
IN = GND
REF = GND
IN = GND
+
–
–
IN = 2.5V
IN = GND
F
= GND
= 25°C
IN = GND
F
= GND
O
A
O
A
T
F = GND
T
= 25°C
O
2.7 3.1 3.5 3.9 4.3 4.7 5.1 5.5
(V)
0
0.5
1
1.5
2
V
2.5
(V)
3
3.5
4
4.5
5
–45 –30 –15
0
15 30 45 60 75 90
V
CC
TEMPERATURE (°C)
REF
2412 G25
2412 G26
2412 G27
2412f
8
LTC2412
U W
TYPICAL PERFOR A CE CHARACTERISTICS
–Full-Scale Error
vs Temperature (TA)
+Full-Scale Error vs VCC
+Full-Scale Error vs VREF
3
2
3
2
3
2
V
= 5V
CC
+
REF = 5V
–
REF = GND
+
–
IN = GND
IN = 2.5V
1
1
1
F
= GND
O
0
0
0
+
–
REF = 2.5V
V
= 5V
CC
+
REF = GND
REF = V
REF
–1
–2
–3
–1
–2
–3
–1
–2
–3
–
V
= 2.5V
REF = GND
REF
+
+
–
+
IN = 1.25V
IN = 0.5 • REF
–
IN = GND
IN = GND
F
= GND
F
= GND
= 25°C
O
A
O
A
T
= 25°C
T
2.7 3.1 3.5 3.9 4.3 4.7 5.1 5.5
(V)
0
0.5
1
1.5
2
V
2.5
(V)
3
3.5
4
4.5
5
–45 –30 –15
0
15 30 45 60 75 90
V
TEMPERATURE (°C)
CC
REF
2412 G28
2412 G29
2412 G30
–Full-Scale Error vs VCC
PSRR vs Frequency at VCC
–Full-Scale Error vs VREF
3
2
3
2
0
+
–
REF = 2.5V
V
= 5V
V
= 4.1V ± 1.4V
DC
CC
CC
+
+
REF = GND
REF = V
REF = 2.5V
REF
–
–20
–
V
= 2.5V
REF = GND
REF = GND
IN = GND
REF
+
+
–
+
–
IN = GND
IN = GND
–
+
IN = 1.25V
IN = 0.5 • REF
–40 IN = GND
1
1
F
= GND
= 25°C
F
= GND
= 25°C
F
= GND
= 25°C
O
A
O
A
O
A
T
T
T
–60
–80
0
0
–1
–2
–3
–1
–2
–3
–100
–120
–140
2.7 3.1 3.5 3.9 4.3 4.7 5.1 5.5
(V)
0
0.5
1
1.5
2
V
2.5
(V)
3
3.5
4
4.5
5
0.01
0.1
1
10
100
V
FREQUENCY AT V (Hz)
CC
REF
CC
2412 G31
2412 G32
2412 G33
PSRR vs Frequency at VCC
PSRR vs Frequency at VCC
PSRR vs Frequency at VCC
0
0
–20
–40
0
V
= 4.1V ±1.4V
V
= 4.1V
DC
CC
DC
CC
+
+
REF = 2.5V
REF = 2.5V
–20
–40
–20
–40
–
–
REF = GND
REF = GND
+
–
+
–
IN = GND
IN = GND
IN = GND
IN = GND
F
= GND
= 25°C
F
= GND
= 25°C
O
A
O
A
T
T
–60
–60
–80
–60
–80
–80
–100
–120
–140
–100
–120
–140
–100
–120
–140
150 180 240
210
15300
15350
15450
0
30 60 90
15250
15400
10k
FREQUENCY AT V (Hz)
1M
120
1
10
100
1k
100k
FREQUENCY AT V (Hz)
FREQUENCY AT V (Hz)
CC
CC
CC
2412 G35
2412 G36
2412 G34
2412f
9
LTC2412
U W
TYPICAL PERFOR A CE CHARACTERISTICS
Conversion Current
vs Temperature
Conversion Current
vs Output Data Rate
Sleep Mode Current
vs Temperature
1000
900
800
700
600
500
400
300
200
100
6
5
240
230
220
210
200
190
180
170
160
F
= GND
V
= V
CC
O
REF
+
CS = V
IN = GND
CC
V
= 5.5V
CC
–
SCK = NC
SDO = NC
IN = GND
SCK = NC
SDO = NC
CS = GND
V
= 5.5V
= 5V
CC
V
= 5V
CC
V
= 5V
CC
4
F
= GND
F
= EXT OSC
= 25°C
O
O
A
CS = GND
SCK = NC
SDO = NC
T
3
2
V
CC
V
= 3V
CC
V
= 3V
CC
V
= 3V
V
CC
= 2.7V
CC
1
0
V
CC
= 2.7V
15 30
0
10 20 30 40 50
OUTPUT DATA RATE (READINGS/SEC)
100
–45 –30 –15
0
15 30 45 60 75 90
TEMPERATURE (°C)
–45 –30 –15
0
45 60 75 90
60 70 80 90
TEMPERATURE (°C)
2412 G37
2412 G38
2412 G39
U
U
U
PI FU CTIO S
VCC (Pin 1): Positive Supply Voltage. Bypass to GND with
a 10µF tantalum capacitor in parallel with 0.1µF ceramic
capacitor as close to the part as possible.
REF+ (Pin 2), REF– (Pin 3): Differential Reference Input.
ThevoltageonthesepinscanhaveanyvaluebetweenGND
and VCC as long as the reference positive input, REF+, is
maintained more positive than the reference negative
input, REF –, by at least 0.1V.
CH0+ (Pin 4): Positive Input for Differential Channel 0.
CH0– (Pin 5): Negative Input for Differential Channel 0.
CH1+ (Pin 6): Positive Input for Differential Channel 1.
CH1– (Pin 7): Negative Input for Differential Channel 1.
The voltage on these four analog inputs (Pins 4 to 7) can
have any value between GND and VCC. Within these limits
the converter bipolar input range (VIN = IN+ – IN–) extends
from–0.5•(VREF)to0.5•(VREF). Outsidethisinputrange
the converter produces unique overrange and underrange
output codes.
CS (Pin 11): Active LOW Digital Input. A LOW on this pin
enables the SDO digital output and wakes up the ADC.
Following each conversion the ADC automatically enters
the Sleep mode and remains in this low power state as
long as CS is HIGH. A LOW-to-HIGH transition on CS
during the Data Output transfer aborts the data transfer
and starts a new conversion.
SDO (Pin 12): Three-State Digital Output. During the Data
Output period, this pin is used as serial data output. When
the chip select CS is HIGH (CS = VCC) the SDO pin is in a
high impedance state. During the Conversion and Sleep
periods, this pin is used as the conversion status output.
TheconversionstatuscanbeobservedbypullingCSLOW.
SCK (Pin 13): Bidirectional Digital Clock Pin. In Internal
Serial Clock Operation mode, SCK is used as digital output
for the internal serial interface clock during the Data
Output period. In External Serial Clock Operation mode,
SCK is used as digital input for the external serial interface
clock during the Data Output period. A weak internal pull-
up is automatically activated in Internal Serial Clock Op-
eration mode. The Serial Clock Operation mode is deter-
mined by the logic level applied to the SCK pin at power up
or during the most recent falling edge of CS.
GND (Pins 8, 9, 10, 15, 16): Ground. Multiple ground pins
internally connected for optimum ground current flow and
VCC decoupling. Connect each one of these pins to a ground
planethroughalowimpedanceconnection.Allfivepinsmust
be connected to ground for proper operation.
2412f
10
LTC2412
U
U
U
PI FU CTIO S
FO (Pin 14): Frequency Control Pin. Digital input that
controls the ADC’s notch frequencies and conversion
time. When the FO pin is connected to VCC (FO = VCC), the
converter uses its internal oscillator and the digital filter
first null is located at 50Hz. When the FO pin is connected
to GND (FO = OV), the converter uses its internal oscillator
and the digital filter first null is located at 60Hz. When FO
isdrivenbyanexternalclocksignalwithafrequencyfEOSC
,
the converter uses this signal as its system clock and the
digital filter first null is located at a frequency fEOSC/2560.
U
U
W
FU CTIO AL BLOCK DIAGRA
INTERNAL
OSCILLATOR
V
CC
GND
F
O
AUTOCALIBRATION
AND CONTROL
(INT/EXT)
+
CH0
+
–
IN
IN
–
SCK
SDO
CS
CH0
DIFFERENTIAL
3RD ORDER
SERIAL
INTERFACE
MUX
∆Σ MODULATOR
+
CH1
–
+
–
CH1
DECIMATING FIR
CH0/CH1
PING-PONG
+
REF
2412 FD
–
REF
Figure 1. Functional Block Diagram
TEST CIRCUITS
V
CC
1.69k
SDO
SDO
C
= 20pF
1.69k
C
= 20pF
LOAD
LOAD
Hi-Z TO V
Hi-Z TO V
OL
OL
OH
OH
V
V
TO V
V
OL
V
OH
TO V
OH
OL
TO Hi-Z
2412 TA04
TO Hi-Z
2412 TA03
2412f
11
LTC2412
U
W
U U
APPLICATIO S I FOR ATIO
CONVERTER OPERATION
after the first rising edge of SCK, the device begins
outputting the conversion result. Taking CS high at this
point will terminate the data output state and start a new
conversion. There is no latency in the conversion result.
The data output corresponds to the conversion just per-
formed. This result is shifted out on the serial data out pin
(SDO) under the control of the serial clock (SCK). Data is
updated on the falling edge of SCK allowing the user to
reliably latch data on the rising edge of SCK (see Figure 3).
The data output state is concluded once 32 bits are read
out of the ADC or when CS is brought HIGH. The device
automatically initiates a new conversion and the cycle
repeats.
Converter Operation Cycle
The LTC2412 is a low power, ∆Σ ADC with automatic
alternate channel selection between the two differential
channels and an easy-to-use 3-wire serial interface (see
Figure 1). Channel 0 is selected automatically at power up
and the two channels are selected alternately afterwards
(ping-pong). Its operation is made up of three states. The
converter operating cycle begins with the conversion,
followed by the low power sleep state and ends with the
data output (see Figure 2). The 3-wire interface consists
of serial data output (SDO), serial clock (SCK) and chip
select (CS).
Through timing control of the CS and SCK pins, the
LTC2412 offers several flexible modes of operation
(internal or external SCK and free-running conversion
modes). These various modes do not require program-
ming configuration registers; moreover, they do not dis-
turbthecyclicoperationdescribedabove. Thesemodesof
operation are described in detail in the Serial Interface
Timing Modes section.
Initially, the LTC2412 performs a conversion. Once the
conversion is complete, the device enters the sleep state.
The part remains in the sleep state as long as CS is HIGH.
Whileinthissleepstate,powerconsumptionisreducedby
nearly two orders of magnitude. The conversion result is
heldindefinitelyinastaticshiftregisterwhiletheconverter
is in the sleep state.
Once CS is pulled LOW, the device exits the low power
modeandentersthedataoutputstate. IfCSispulledHIGH
beforethefirstrisingedgeofSCK,thedevicereturnstothe
low power sleep mode and the conversion result is still
held in the internal static shift register. If CS remains LOW
Conversion Clock
A major advantage the delta-sigma converter offers over
conventional type converters is an on-chip digital filter
(commonly implemented as a Sinc or Comb filter). For
high resolution, low frequency applications, this filter is
typically designed to reject line frequencies of 50Hz or
60Hz plus their harmonics. The filter rejection perfor-
mance is directly related to the accuracy of the converter
system clock. The LTC2412 incorporates a highly accu-
rate on-chip oscillator. This eliminates the need for exter-
nal frequency setting components such as crystals or
oscillators.Clockedbytheon-chiposcillator,theLTC2412
achieves a minimum of 110dB rejection at the line fre-
quency (50Hz or 60Hz ±2%).
POWER UP
+
+
–
–
IN = CH0 , IN = CH0
CONVERT
SLEEP
FALSE
CS = LOW
AND
SCK
Ease of Use
The LTC2412 data output has no latency, filter settling
delay or redundant data associated with the conversion
cycle.Thereisaone-to-onecorrespondencebetweenthe
conversion and the output data. Therefore, multiplexing
multiple analog voltages is easy.
TRUE
DATA OUTPUT
SWITCH CHANNEL
2412 F02
Figure 2. LTC2412 State Transition Diagram
2412f
12
LTC2412
U
W
U U
APPLICATIO S I FOR ATIO
The LTC2412 performs offset and full-scale calibrations
every conversion cycle. This calibration is transparent to
the user and has no effect on the cyclic operation de-
scribed above. The advantage of continuous calibration is
extreme stability of offset and full-scale readings with re-
specttotime,supplyvoltagechangeandtemperaturedrift.
Input Voltage Range
The analog input is truly differential with an absolute/
common mode range for the CH0+/CH0– or CH1+/CH1–
input pins extending from GND – 0.3V to VCC + 0.3V.
Outside these limits, the ESD protection devices begin to
turn on and the errors due to input leakage current
increase rapidly. Within these limits, the LTC2412 con-
verts the bipolar differential input signal, VIN = IN+ – IN–,
Power-Up Sequence
The LTC2412 automatically enters an internal reset state
when the power supply voltage VCC drops below approxi-
mately 2V. This feature guarantees the integrity of the
conversion result and of the serial interface mode selec-
tion. (See the 2-wire I/O sections in the Serial Interface
Timing Modes section.)
from –FS = –0.5 • VREF to +FS = 0.5 • VREF where VREF
=
REF+ – REF–, with the selected channel referred as IN+ and
IN–. Outside this range, the converter indicates the
overrange or the underrange condition using distinct
output codes.
Input signals applied to the analog input pins may extend
by 300mV below ground and above VCC. In order to limit
any fault current, resistors of up to 5k may be added in
series with the pins without affecting the performance of
the device. In the physical layout, it is important to main-
tain the parasitic capacitance of the connection between
these series resistors and the corresponding pins as low
as possible; therefore, the resistors should be located as
close as practical to the pins. The effect of the series
resistance on the converter accuracy can be evaluated
from the curves presented in the Input Current/Reference
Current sections. In addition, series resistors will intro-
duceatemperaturedependentoffseterrorduetotheinput
leakage current. A 1nA input leakage current will develop
a 1ppm offset error on a 5k resistor if VREF = 5V. This error
has a very strong temperature dependency.
When the VCC voltage rises above this critical threshold,
the converter creates an internal power-on-reset (POR)
signalwithatypicaldurationof1ms.ThePORsignalclears
all internal registers and selects channel 0. Following the
POR signal, the LTC2412 starts a normal conversion cycle
and follows the succession of states described above. The
firstconversionresultfollowingPORisaccuratewithinthe
specifications of the device if the power supply voltage is
restored within the operating range (2.7V to 5.5V) before
the end of the POR time interval.
Reference Voltage Range
This converter accepts a truly differential external refer-
ence voltage. The absolute/common mode voltage speci-
ficationfortheREF+ andREF– pinscoverstheentirerange
from GND to VCC. For correct converter operation, the
REF+ pin must always be more positive than the REF– pin.
Output Data Format
The LTC2412 serial output data stream is 32 bits long. The
first 3 bits represent status information indicating the
conversion state, selected channel and sign. The next 24
bits are the conversion result, MSB first. The remaining 5
bits are sub LSBs beyond the 24-bit level that may be
included in averaging or discarded without loss of resolu-
tion. The third and fourth bit together are also used to
indicate an underrange condition (the differential input
voltage is below –FS) or an overrange condition (the
differential input voltage is above +FS).
The LTC2412 can accept a differential reference voltage
from 0.1V to VCC. The converter output noise is deter-
mined by the thermal noise of the front-end circuits, and
as such, its value in nanovolts is nearly constant with
reference voltage. A decrease in reference voltage will not
significantly improve the converter’s effective resolution.
On the other hand, a reduced reference voltage will im-
prove the converter’s overall INL performance. A reduced
reference voltage will also improve the converter perfor-
mance when operated with an external conversion clock
(external FO signal) at substantially higher output data
rates (see the Output Data Rate section).
2412f
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Bit 31 (first output bit) is the end of conversion (EOC)
indicator. This bit is available at the SDO pin during the
conversion and sleep states whenever the CS pin is LOW.
This bit is HIGH during the conversion and goes LOW
when the conversion is complete.
Bits 4-0 are sub LSBs below the 24-bit level. Bits 4-0 may
be included in averaging or discarded without loss of
resolution.
DataisshiftedoutoftheSDOpinundercontroloftheserial
clock (SCK), see Figure 3. Whenever CS is HIGH, SDO
remains high impedance and any externally generated
SCK clock pulses are ignored by the internal data out shift
register.
Bit30(secondoutputbit)istheselectedchannelindicator.
The bit is LOW for channel 0 and HIGH for channel 1
selected.
Bit 29 (third output bit) is the conversion result sign indi-
cator (SIG). If VIN is >0, this bit is HIGH. If VIN is <0, this
bit is LOW.
In order to shift the conversion result out of the device, CS
mustfirstbedrivenLOW. EOCisseenattheSDOpinofthe
deviceonceCSispulledLOW.EOCchangesrealtimefrom
HIGH to LOW at the completion of a conversion. This
signal may be used as an interrupt for an external micro-
controller. Bit 31 (EOC) can be captured on the first rising
edge of SCK. Bit 30 is shifted out of the device on the first
falling edge of SCK. The final data bit (Bit 0) is shifted out
on the falling edge of the 31st SCK and may be latched on
the rising edge of the 32nd SCK pulse. On the falling edge
of the 32nd SCK pulse, SDO goes HIGH indicating the
initiation of a new conversion cycle. This bit serves as EOC
(Bit 31) for the next conversion cycle. Table 2 summarizes
the output data format.
Bit 28 (fourth output bit) is the most significant bit (MSB)
of the result. This bit in conjunction with Bit 29 also
provides the underrange or overrange indication. If both
Bit 29 and Bit 28 are HIGH, the differential input voltage is
above +FS. If both Bit 29 and Bit 28 are LOW, the
differential input voltage is below –FS.
The function of these bits is summarized in Table 1.
Table 1. LTC2412 Status Bits
Bit 31 Bit 30 Bit 29 Bit 28
Input Range
EOC CH0/CH1 SIG
MSB
V
≥ 0.5 • V
0
0
0
0
0 or 1
0 or 1
0 or 1
0 or 1
1
1
0
0
1
0
1
0
IN
REF
As long as the voltage on the analog input pins is main-
tainedwithinthe–0.3Vto(VCC +0.3V)absolutemaximum
operating range, a conversion result is generated for any
differential input voltage VIN from –FS = –0.5 • VREF to
+FS=0.5•VREF.Fordifferentialinputvoltagesgreaterthan
+FS, the conversion result is clamped to the value corre-
sponding to the +FS + 1LSB. For differential input voltages
below –FS, the conversion result is clamped to the value
corresponding to –FS – 1LSB.
0V ≤ V < 0.5 • V
IN
REF
–0.5 • V ≤ V < 0V
REF
IN
V
< –0.5 • V
IN
REF
Bits 28-5 are the 24-bit conversion result MSB first.
Bit 5 is the least significant bit (LSB).
CS
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 5
BIT 0
SDO
SCK
LSB
24
CH0/CH1
Hi-Z
1
2
3
4
5
26
27
32
SLEEP
DATA OUTPUT
CONVERSION
2412 F03
Figure 3. Output Data Timing
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Table 2. LTC2412 Output Data Format
Differential Input Voltage
Bit 31
EOC
Bit 30
CH0/CH1
Bit 29
SIG
Bit 28
MSB
Bit 27
Bit 26
Bit 25
…
Bit 0
V
*
IN
V * ≥ 0.5 • V **
0
0
0
0
0
0
0
0
0
0/1
0/1
0/1
0/1
0/1
0/1
0/1
0/1
0/1
0/1
1
1
1
1
1
0
0
0
0
0
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
…
…
…
…
…
…
…
…
…
…
0
1
0
1
0
1
0
1
0
1
IN
REF
0.5 • V ** – 1LSB
REF
0.25 • V **
REF
0.25 • V ** – 1LSB
REF
0
–1LSB
–0.25 • V **
REF
–0.25 • V ** – 1LSB
REF
–0.5 • V **
REF
V * < –0.5 • V **
0
IN
REF
+
–
*The differential input voltage V = IN – IN .
IN
+
–
**The differential reference voltage V = REF – REF .
REF
normal mode rejection in a frequency range fEOSC/2560
±4% and its harmonics. The normal mode rejection as a
function of the input frequency deviation from fEOSC/2560
is shown in Figure 4.
Frequency Rejection Selection (FO)
TheLTC2412internaloscillatorprovidesbetterthan110dB
normal mode rejection at the line frequency and all its
harmonics for 50Hz ±2% or 60Hz ±2%. For 60Hz rejec-
tion, FO should be connected to GND while for 50Hz
rejection the FO pin should be connected to VCC.
WheneveranexternalclockisnotpresentattheFO pin, the
converterautomaticallyactivatesitsinternaloscillatorand
enters the Internal Conversion Clock mode. The LTC2412
operation will not be disturbed if the change of conversion
clock source occurs during the sleep state or during the
data output state while the converter uses an external
serial clock. If the change occurs during the conversion
state, the result of the conversion in progress may be
The selection of 50Hz or 60Hz rejection can also be made
by driving FO to an appropriate logic level. A selection
change during the sleep or data output states will not
disturb the converter operation. If the selection is made
during the conversion state, the result of the conversion in
progress may be outside specifications but the following
conversions will not be affected.
–80
–85
When a fundamental rejection frequency different from
50Hz or 60Hz is required or when the converter must be
synchronized with an outside source, the LTC2412 can
operate with an external conversion clock. The converter
automatically detects the presence of an external clock
signal at the FO pin and turns off the internal oscillator. The
frequency fEOSC of the external signal must be at least
2560Hz (1Hz notch frequency) to be detected. The exter-
nal clock signal duty cycle is not significant as long as the
minimum and maximum specifications for the high and
low periods tHEO and tLEO are observed.
–90
–95
–100
–105
–110
–115
–120
–125
–130
–135
–140
–12
–8
–4
0
4
8
12
DIFFERENTIAL INPUT SIGNAL FREQUENCY
DEVIATION FROM NOTCH FREQUENCY f
/2560(%)
2412 F04
EOSC
While operating with an external conversion clock of a
frequency fEOSC, the LTC2412 provides better than 110dB
Figure 4. LTC2412 Normal Mode Rejection When
Using an External Oscillator of Frequency fEOSC
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outside specifications but the following conversions will
notbeaffected.Ifthechangeoccursduringthedataoutput
state and the converter is in the Internal SCK mode, the
serial clock duty cycle may be affected but the serial data
stream will remain valid.
detected at the CS pin. If SCK is HIGH or floating at power-
up or during this transition, the converter enters the inter-
nal SCK mode. If SCK is LOW at power-up or during this
transition, the converter enters the external SCK mode.
Serial Data Output (SDO)
Table 3 summarizes the duration of each state and the
achievable output data rate as a function of FO.
The serial data output pin, SDO (Pin 12), provides the
result of the last conversion as a serial bit stream (MSB
first) during the data output state. In addition, the SDO pin
is used as an end of conversion indicator during the
conversion and sleep states.
SERIAL INTERFACE PINS
The LTC2412 transmits the conversion results and re-
ceives the start of conversion command through a syn-
chronous 3-wire interface. During the conversion and
sleep states, this interface can be used to assess the
converter status and during the data output state it is used
to read the conversion result.
When CS (Pin 11) is HIGH, the SDO driver is switched to
a high impedance state. This allows sharing the serial
interface with other devices. If CS is LOW during the
convert or sleep state, SDO will output EOC. If CS is LOW
duringtheconversionphase, theEOCbitappearsHIGHon
the SDO pin. Once the conversion is complete, EOC goes
LOW.
Serial Clock Input/Output (SCK)
The serial clock signal present on SCK (Pin 13) is used to
synchronizethedatatransfer.Eachbitofdataisshiftedout
the SDO pin on the falling edge of the serial clock.
Chip Select Input (CS)
The active LOW chip select, CS (Pin 11), is used to test the
conversionstatusandtoenablethedataoutputtransferas
described in the previous sections.
In the Internal SCK mode of operation, the SCK pin is an
output and the LTC2412 creates its own serial clock by
dividing the internal conversion clock by 8. In the External
SCK mode of operation, the SCK pin is used as input. The
internalorexternalSCKmodeisselectedonpower-upand
then reselected every time a HIGH-to-LOW transition is
In addition, the CS signal can be used to trigger a new
conversion cycle before the entire serial data transfer has
been completed. The LTC2412 will abort any serial data
transfer in progress and start a new conversion cycle
Table 3. LTC2412 State Duration
State
Operating Mode
Duration
CONVERT
Internal Oscillator
F = LOW
(60Hz Rejection)
133ms, Output Data Rate ≤ 7.5 Readings/s
O
F = HIGH
O
160ms, Output Data Rate ≤ 6.2 Readings/s
(50Hz Rejection)
External Oscillator
F = External Oscillator
20510/f
s, Output Data Rate ≤ f
/20510 Readings/s
EOSC
O
EOSC
with Frequency f
kHz
EOSC
(f
EOSC
/2560 Rejection)
SLEEP
As Long As CS = HIGH
DATA OUTPUT
Internal Serial Clock
External Serial Clock with
F = LOW/HIGH
(Internal Oscillator)
As Long As CS = LOW But Not Longer Than 1.67ms
(32 SCK cycles)
O
F = External Oscillator with
As Long As CS = LOW But Not Longer Than 256/f
ms
EOSC
O
Frequency f
kHz
(32 SCK cycles)
EOSC
As Long As CS = LOW But Not Longer Than 32/f ms
SCK
Frequency f
kHz
(32 SCK cycles)
SCK
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anytime a LOW-to-HIGH transition is detected at the CS
pin after the converter has entered the data output state
(i.e., after the first rising edge of SCK occurs with
CS = LOW).
following sections describe each of these serial interface
timing modes in detail. In all these cases, the converter
can use the internal oscillator (FO = LOW or FO = HIGH) or
an external oscillator connected to the FO pin. Refer to
Table 4 for a summary.
Finally, CS can be used to control the free-running modes
of operation, see Serial Interface Timing Modes section.
Grounding CS will force the ADC to continuously convert
at the maximum output rate selected by FO.
External Serial Clock, Single Cycle Operation
(SPI/MICROWIRE Compatible)
This timing mode uses an external serial clock to shift out
the conversion result and a CS signal to monitor and
control the state of the conversion cycle, see Figure 5.
SERIAL INTERFACE TIMING MODES
The LTC2412’s 3-wire interface is SPI and MICROWIRE
compatible. This interface offers several flexible modes of
operation. These include internal/external serial clock,
2-or3-wireI/O,singlecycleconversionandautostart.The
The serial clock mode is selected on the falling edge of CS.
Toselecttheexternalserialclockmode,theserialclockpin
(SCK) must be LOW during each CS falling edge.
Table 4. LTC2412 Interface Timing Modes
SCK
Conversion
Cycle
Control
Data
Output
Control
Connection
and
Waveforms
Configuration
Source
External
External
Internal
Internal
External SCK, Single Cycle Conversion
External SCK, 2-Wire I/O
CS and SCK
SCK
CS and SCK
SCK
Figures 5, 6
Figure 7
Internal SCK, Single Cycle Conversion
Internal SCK, 2-Wire I/O, Continuous Conversion
CS ↓
CS ↓
Figures 8, 9
Figure 10
Continuous
Internal
2.7V TO 5.5V
V
CC
1µF
= 50Hz REJECTION
1
14
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
V
F
O
CC
LTC2412
2
3
4
5
6
7
+
–
+
REFERENCE
VOLTAGE
REF
13
12
11
0.1V TO V
REF
SCK
SDO
CS
CC
3-WIRE
CH0
CH0
CH1
CH1
SPI INTERFACE
–
+
–
ANALOG INPUT RANGE
–0.5V TO 0.5V
REF REF
8, 9, 10, 15, 16
GND
CS
TEST EOC
TEST EOC
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 26
BIT 5
LSB
BIT 0
SDO
CH0/CH1
SUB LSB
Hi-Z
Hi-Z
Hi-Z
SCK
(EXTERNAL)
CONVERSION
DATA OUTPUT
CONVERSION
SLEEP
SLEEP
2412 F05
TEST EOC
(OPTIONAL)
Figure 5. External Serial Clock, Single Cycle Operation
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As described above, CS may be pulled LOW at any time in
order to monitor the conversion status.
The serial data output pin (SDO) is Hi-Z as long as CS is
HIGH. At any time during the conversion cycle, CS may be
pulled LOW in order to monitor the state of the converter.
While CS is pulled LOW, EOC is output to the SDO pin.
EOC = 1 while a conversion is in progress and EOC = 0 if
the device is in the sleep state. With CS high, the device
automatically enters the low power sleep state once the
conversion is complete.
Typically, CS remains LOW during the data output state.
However, the data output state may be aborted by pulling
CS HIGH anytime between the first rising edge and the
32nd falling edge of SCK, see Figure 6. On the rising edge
of CS, the device aborts the data output state and imme-
diately initiates a new conversion. This is useful for sys-
tems not requiring all 32 bits of output data, aborting an
invalid conversion cycle or synchronizing the start of a
conversion.
When the device is in the sleep state (EOC = 0), its
conversion result is held in an internal static shift regis-
ter. Data is shifted out the SDO pin on each falling edge of
SCK. This enables external circuitry to latch the output on
the rising edge of SCK. EOC can be latched on the first
rising edge of SCK and the last bit of the conversion result
can be latched on the 32nd rising edge of SCK. On the
32nd falling edge of SCK, the device begins a new conver-
sion. SDO goes HIGH (EOC = 1) indicating a conversion is
in progress.
External Serial Clock, 2-Wire I/O
This timing mode utilizes a 2-wire serial I/O interface. The
conversion result is shifted out of the device by an exter-
nally generated serial clock (SCK) signal, see Figure 7. CS
may be permanently tied to ground, simplifying the user
interface or isolation barrier.
At the conclusion of the data cycle, CS may remain LOW
and EOC monitored as an end-of-conversion interrupt.
Alternatively, CS may be driven HIGH setting SDO to Hi-Z.
The external serial clock mode is selected at the end of the
power-on reset (POR) cycle. The POR cycle is concluded
2.7V TO 5.5V
V
CC
1µF
= 50Hz REJECTION
1
14
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
V
F
O
CC
LTC2412
2
3
4
5
6
7
+
–
+
REFERENCE
VOLTAGE
REF
13
12
11
0.1V TO V
REF
SCK
SDO
CS
CC
3-WIRE
CH0
CH0
CH1
CH1
SPI INTERFACE
–
+
–
ANALOG INPUT RANGE
–0.5V
TO 0.5V
REF
REF
8, 9, 10, 15, 16
GND
CS
TEST EOC
TEST EOC
BIT 0
EOC
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 9
BIT 8
SDO
CH0/CH1
Hi-Z
Hi-Z
Hi-Z
Hi-Z
SCK
(EXTERNAL)
SLEEP
DATA OUTPUT
CONVERSION
CONVERSION
SLEEP
TEST EOC (OPTIONAL)
SLEEP
2412 F06
DATA
OUTPUT
Figure 6. External Serial Clock, Reduced Data Output Length
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2.7V TO 5.5V
V
CC
1µF
= 50Hz REJECTION
1
14
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
V
F
O
CC
LTC2412
+
–
+
2
REFERENCE
REF
VOLTAGE
3
13
12
11
0.1V TO V
REF
SCK
SDO
CS
CC
2-WIRE
INTERFACE
4
5
6
7
CH0
CH0
CH1
CH1
–
+
–
ANALOG INPUT RANGE
–0.5V TO 0.5V
REF REF
8, 9, 10, 15, 16
GND
CS
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 26
BIT 5
LSB
BIT 0
SDO
CH0/CH1
24
SCK
(EXTERNAL)
CONVERSION
DATA OUTPUT
CONVERSION
2412 F07
Figure 7. External Serial Clock, CS = 0 Operation (2-Wire)
HIGH prior to the falling edge of CS. The device will not
enter the internal serial clock mode if SCK is driven LOW
on the falling edge of CS. An internal weak pull-up resistor
is active on the SCK pin during the falling edge of CS;
therefore, the internal serial clock timing mode is auto-
matically selected if SCK is not externally driven.
typically 1ms after VCC exceeds 2V. The level applied to
SCK at this time determines if SCK is internal or external.
SCK must be driven LOW prior to the end of POR in order
to enter the external serial clock timing mode.
Since CS is tied LOW, the end-of-conversion (EOC) can be
continuously monitored at the SDO pin during the convert
and sleep states. EOC may be used as an interrupt to an
external controller indicating the conversion result is
ready. EOC = 1 while the conversion is in progress and
EOC = 0 once the conversion ends. On the falling edge of
EOC, the conversion result is loaded into an internal static
shift register. Data is shifted out the SDO pin on each
falling edge of SCK enabling external circuitry to latch data
on the rising edge of SCK. EOC can be latched on the first
rising edge of SCK. On the 32nd falling edge of SCK, SDO
goes HIGH (EOC = 1) indicating a new conversion has
begun.
The serial data output pin (SDO) is Hi-Z as long as CS is
HIGH. At any time during the conversion cycle, CS may be
pulled LOW in order to monitor the state of the converter.
Once CS is pulled LOW, SCK goes LOW and EOC is output
to the SDO pin. EOC = 1 while a conversion is in progress
and EOC = 0 if the device is in the sleep state.
WhentestingEOC,iftheconversioniscomplete(EOC=0),
the device will exit the sleep state during the EOC test. In
order to allow the device to return to the low power sleep
state, CS must be pulled HIGH before the first rising edge
of SCK. In the internal SCK timing mode, SCK goes HIGH
and the device begins outputting data at time tEOCtest after
the falling edge of CS (if EOC = 0) or tEOCtest after EOC goes
LOW (if CS is LOW during the falling edge of EOC). The
value of tEOCtest is 23µs if the device is using its internal
oscillator (F0 = logic LOW or HIGH). If FO is driven by an
external oscillator of frequency fEOSC, then tEOCtest is
Internal Serial Clock, Single Cycle Operation
This timing mode uses an internal serial clock to shift out
the conversion result and a CS signal to monitor and
control the state of the conversion cycle, see Figure 8.
In order to select the internal serial clock timing mode, the
serial clock pin (SCK) must be floating (Hi-Z) or pulled
3.6/fEOSC. If CS is pulled HIGH before time tEOCtest, the
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V
2.7V TO 5.5V
CC
V
CC
1µF
= 50Hz REJECTION
1
14
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
V
F
O
CC
LTC2412
+
–
+
10k
2
REFERENCE
REF
VOLTAGE
3
13
12
11
0.1V TO V
REF
SCK
SDO
CS
CC
4
5
6
7
3-WIRE
SPI INTERFACE
CH0
CH0
CH1
CH1
–
+
–
ANALOG INPUT RANGE
–0.5V
TO 0.5V
REF
REF
8, 9, 10, 15, 16
GND
<t
EOCtest
CS
TEST EOC
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 26
BIT 5
LSB
BIT 0
SDO
CH0/CH1
24
Hi-Z
Hi-Z
Hi-Z
Hi-Z
SCK
(INTERNAL)
CONVERSION
DATA OUTPUT
CONVERSION
2412 F08
SLEEP
SLEEP
TEST EOC
(OPTIONAL)
Figure 8. Internal Serial Clock, Single Cycle Operation
device returns to the sleep state and the conversion result
is held in the internal static shift register.
HIGH state. This will cause the device to exit the internal
serial clock mode on the next falling edge of CS. This can
be avoided by adding an external 10k pull-up resistor to
theSCKpinorbyneverpullingCSHIGHwhenSCKisLOW.
If CS remains LOW longer than tEOCtest, the first rising
edge of SCK will occur and the conversion result is serially
shiftedoutoftheSDOpin.Thedataoutputcycleconcludes
after the 32nd rising edge. Data is shifted out the SDO pin
oneachfallingedgeofSCK. Theinternallygeneratedserial
clock is output to the SCK pin. This signal may be used to
shift the conversion result into external circuitry. EOC can
be latched on the first rising edge of SCK and the last bit
of the conversion result on the 32nd rising edge of SCK.
Afterthe32ndrisingedge, SDOgoesHIGH(EOC=1), SCK
stays HIGH and a new conversion starts.
Whenever SCK is LOW, the LTC2412’s internal pull-up at
pin SCK is disabled. Normally, SCK is not externally driven
if the device is in the internal SCK timing mode. However,
certainapplicationsmayrequireanexternaldriveronSCK.
If this driver goes Hi-Z after outputting a LOW signal, the
LTC2412’s internal pull-up remains disabled. Hence, SCK
remains LOW. On the next falling edge of CS, the device is
switched to the external SCK timing mode. By adding an
external 10k pull-up resistor to SCK, this pin goes HIGH
once the external driver goes Hi-Z. On the next CS falling
edge, the device will remain in the internal SCK timing
mode.
Typically, CS remains LOW during the data output state.
However, the data output state may be aborted by pulling
CS HIGH anytime between the first and 32nd rising edge
of SCK, see Figure 9. On the rising edge of CS, the device
aborts the data output state and immediately initiates a
new conversion. This is useful for systems not requiring
all 32 bits of output data, aborting an invalid conversion
cycle, or synchronizing the start of a conversion. If CS is
pulled HIGH while the converter is driving SCK LOW, the
internal pull-up is not available to restore SCK to a logic
A similar situation may occur during the sleep state when
CS is pulsed HIGH-LOW-HIGH in order to test the
conversion status. If the device is in the sleep state (EOC
=0),SCKwillgoLOW.OnceCSgoesHIGH(withinthetime
period defined above as tEOCtest), the internal pull-up is
activated. For a heavy capacitive load on the SCK pin, the
2412f
20
LTC2412
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APPLICATIO S I FOR ATIO
2.7V TO 5.5V
V
CC
V
CC
1µF
= 50Hz REJECTION
1
14
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
V
F
O
CC
LTC2412
+
–
+
10k
2
REFERENCE
REF
VOLTAGE
3
13
12
11
0.1V TO V
REF
SCK
SDO
CS
CC
4
5
6
7
3-WIRE
SPI INTERFACE
CH0
CH0
CH1
CH1
–
+
–
ANALOG INPUT RANGE
–0.5V TO 0.5V
REF
REF
8, 9, 10, 15, 16
GND
>t
<t
EOCtest
EOCtest
CS
TEST EOC
TEST EOC
BIT 0
EOC
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 26
BIT 8
SDO
CH0/CH1
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
SCK
(INTERNAL)
SLEEP
CONVERSION
DATA OUTPUT
CONVERSION
SLEEP
SLEEP
2412 F09
DATA
OUTPUT
TEST EOC
(OPTIONAL)
Figure 9. Internal Serial Clock, Reduced Data Output Length
internal pull-up may not be adequate to return SCK to a
HIGH level before CS goes low again. This is not a concern
under normal conditions where CS remains LOW after
detecting EOC = 0. This situation is easily overcome by
adding an external 10k pull-up resistor to the SCK pin.
if SCK is not externally driven LOW (if SCK is loaded such
that the internal pull-up cannot pull the pin HIGH, the
external SCK mode will be selected).
During the conversion, the SCK and the serial data output
pin (SDO) are HIGH (EOC = 1). Once the conversion is
complete, SCK and SDO go LOW (EOC = 0) indicating the
conversion has finished and the device has entered the
data output state. The data output cycle begins on the
first rising edge of SCK and ends after the 32nd rising
edge. Data is shifted out the SDO pin on each falling edge
of SCK. The internally generated serial clock is output
to the SCK pin. This signal may be used to shift the
conversion result into external circuitry. EOC can be
latched on the first rising edge of SCK and the last bit of
the conversion result can be latched on the 32nd rising
edge of SCK. After the 32nd rising edge, SDO goes HIGH
(EOC=1)indicatinganewconversionisinprogress.SCK
remains HIGH during the conversion.
Internal Serial Clock, 2-Wire I/O,
Continuous Conversion
This timing mode uses a 2-wire, all output (SCK and SDO)
interface. The conversion result is shifted out of the device
by an internally generated serial clock (SCK) signal, see
Figure 10. CS may be permanently tied to ground, simpli-
fying the user interface or isolation barrier.
The internal serial clock mode is selected at the end of the
power-on reset (POR) cycle. The POR cycle is concluded
approximately1msafterVCC exceeds2V. Aninternalweak
pull-up is active during the POR cycle; therefore, the
internal serial clock timing mode is automatically selected
2412f
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LTC2412
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2.7V TO 5.5V
V
CC
1µF
= 50Hz REJECTION
1
14
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
V
F
O
CC
LTC2412
2
3
4
5
6
7
+
–
+
REFERENCE
VOLTAGE
REF
13
12
11
0.1V TO V
REF
SCK
SDO
CS
CC
2-WIRE
INTERFACE
CH0
CH0
CH1
CH1
–
+
–
ANALOG INPUT RANGE
–0.5V TO 0.5V
REF
REF
8, 9, 10, 15, 16
GND
CS
BIT 31
EOC
BIT 30
BIT 29
SIG
BIT 28
MSB
BIT 27
BIT 26
BIT 5
LSB
BIT 0
SDO
CH0/CH1
24
SCK
(INTERNAL)
CONVERSION
DATA OUTPUT
CONVERSION
2412 F10
Figure 10. Internal Serial Clock, Continuous Operation
PRESERVING THE CONVERTER ACCURACY
inExternalSCKmodeofoperation)iswithinthisrange,the
LTC2412 power supply current may increase even if the
signal in question is at a valid logic level. For micropower
operation, it is recommended to drive all digital input
signals to full CMOS levels [VIL < 0.4V and VOH
(VCC – 0.4V)].
The LTC2412 is designed to reduce as much as possible
the conversion result sensitivity to device decoupling,
PCB layout, antialiasing circuits, line frequency perturba-
tions and so on. Nevertheless, in order to preserve the
extreme accuracy capability of this part, some simple
precautions are desirable.
>
During the conversion period, the undershoot and/or
overshootofafastdigitalsignalconnectedtotheLTC2412
pins may severely disturb the analog to digital conversion
process.Undershootandovershootcanoccurbecauseof
the impedance mismatch at the converter pin when the
transition time of an external control signal is less than
twice the propagation delay from the driver to LTC2412.
Forreference,onaregularFR-4board,signalpropagation
velocity is approximately 183ps/inch for internal traces
and 170ps/inch for surface traces. Thus, a driver gener-
ating a control signal with a minimum transition time of
1ns must be connected to the converter pin through a
trace shorter than 2.5 inches. This problem becomes
particularly difficult when shared control lines are used
and multiple reflections may occur. The solution is to
carefully terminate all transmission lines close to their
characteristic impedance.
Digital Signal Levels
The LTC2412’s digital interface is easy to use. Its digital
inputs(FO,CSandSCKinExternalSCKmodeofoperation)
accept standard TTL/CMOS logic levels and the internal
hysteresis receivers can tolerate edge rates as slow as
100µs.However,someconsiderationsarerequiredtotake
advantage of the exceptional accuracy and low supply
current of this converter.
The digital output signals (SDO and SCK in Internal SCK
mode of operation) are less of a concern because they are
not generally active during the conversion state.
While a digital input signal is in the range 0.5V to
(VCC – 0.5V), the CMOS input receiver draws additional
current from the power supply. It should be noted that,
when any one of the digital input signals (FO, CS and SCK
2412f
22
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Parallel termination near the LTC2412 pin will eliminate
thisproblembutwillincreasethedriverpowerdissipation.
A series resistor between 27Ω and 56Ω placed near the
driver or near the LTC2412 pin will also eliminate this
problem without additional power dissipation. The actual
resistor value depends upon the trace impedance and
connection topology.
Such perturbations may occur due to asymmetric capaci-
tivecouplingbetweentheFO signaltraceandtheconverter
input and/or reference connection traces. An immediate
solution is to maintain maximum possible separation
between the FO signal trace and the input/reference sig-
nals. When the FO signal is parallel terminated near the
converter, substantial AC current is flowing in the loop
formedbytheFO connectiontrace, theterminationandthe
ground return path. Thus, perturbation signals may be
inductively coupled into the converter input and/or refer-
ence. In this situation, the user must reduce to a minimum
the loop area for the FO signal as well as the loop area for
the differential input and reference connections.
An alternate solution is to reduce the edge rate of the
control signals. It should be noted that using very slow
edges will increase the converter power supply current
during the transition time. The multiple ground pins used
in this package configuration, as well as the differential
input and reference architecture, reduce substantially the
converter’s sensitivity to ground currents.
Driving the Input and Reference
Particular attention must be given to the connection of the
FO signal when the LTC2412 is used with an external
conversion clock. This clock is active during the conver-
sion time and the normal mode rejection provided by the
internal digital filter is not very high at this frequency. A
normal mode signal of this frequency at the converter
reference terminals may result into DC gain and INL
errors. A normal mode signal of this frequency at the
converterinputterminalsmayresultintoaDCoffseterror.
The input and reference pins of the LTC2412 converter are
directly connected to a network of sampling capacitors.
Depending upon the relation between the differential input
voltage and the differential reference voltage, these ca-
pacitorsareswitchingbetweenthesefourpinstransfering
small amounts of charge in the process. A simplified
equivalent circuit is shown in Figure 11, where IN+ and IN–
refertotheselecteddifferentialchannelandtheunselected
channel is omitted for simplicity.
V
CC
I
+
+
REF
R
(TYP)
V
IN + VINCM − VREFCM
SW
I IN+
=
=
I
I
LEAK
LEAK
(
)
)
20k
AVG
AVG
0.5• REQ
−VIN + VINCM − VREFCM
0.5• REQ
V
REF
I IN−
(
V2
V
CC
1.5• VREF − VINCM + VREFCM
IN
I REF+
=
−
I
+
IN
(
)
AVG
R
(TYP)
20k
0.5• REQ
V
REF • REQ
SW
I
I
LEAK
LEAK
V2
−1.5• VREF − VINCM + VREFCM
0.5• REQ
IN
IN
I REF−
=
+
V
+
(
)
AVG
C
VREF • REQ
EQ
18pF
where:
(TYP)
V
VREF = REF+ −REF−
CC
I
–
–
IN
IN
R
R
(TYP)
REF+ + REF−
SW
I
I
LEAK
LEAK
VREFCM
=
20k
2
V
V
IN = IN+ −IN−
IN+ − IN−
V
CC
V
INCM
=
I
–
–
2
REF
(TYP)
20k
SW
I
I
LEAK
LEAK
REQ = 3.61MΩ INTERNAL OSCILLATOR 60Hz Notch F = LOW
(
(
)
)
O
2412 F11
V
REQ = 4.32MΩ INTERNAL OSCILLATOR 50Hz Notch F = HIGH
REF
O
REQ = 0.555• 1012 / fEOSC EXTERNAL OSCILLATOR
(
)
SWITCHING FREQUENCY
f
f
= 76800Hz INTERNAL OSCILLATOR (F = LOW OR HIGH)
SW
SW
O
= 0.5 • f
EXTERNAL OSCILLATOR
EOSC
Figure 11. LTC2412 Equivalent Analog Input Circuit
2412f
23
LTC2412
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R
R
SOURCE
SOURCE
For a simple approximation, the source impedance RS
driving an analog input pin (IN+, IN–, REF+ or REF–) can be
considered to form, together with RSW and CEQ (see
Figure 11), a first order passive network with a time
constant τ = (RS + RSW) • CEQ. The converter is able to
sample the input signal with better than 1ppm accuracy if
the sampling period is at least 14 times greater than the
input circuit time constant τ. The sampling process on the
four input analog pins is quasi-independent so each time
constant should be considered by itself and, under worst-
case circumstances, the errors may add.
+
IN
C
C
PAR
V
V
+ 0.5V
– 0.5V
C
C
INCM
INCM
IN
IN
IN
IN
20pF
LTC2412
–
IN
2412 F12
PAR
20pF
Figure 12. An RC Network at IN+ and IN–
50
Whenusingtheinternaloscillator(FO =LOWorHIGH), the
LTC2412’sfront-endswitched-capacitornetworkisclocked
at 76800Hz corresponding to a 13µs sampling period.
Thus, for settling errors of less than 1ppm, the driving
sourceimpedanceshouldbechosensuchthatτ ≤13µs/14
= 920ns. When an external oscillator of frequency fEOSC is
used, the sampling period is 2/fEOSC and, for a settling
C
= 0.01µF
IN
C
= 0.001µF
IN
C
40
30
20
10
0
= 100pF
IN
C
= 0pF
IN
V
= 5V
CC
+
–
REF = 5V
REF = GND
+
–
IN = 5V
error of less than 1ppm, τ ≤ 0.14/fEOSC
.
IN = 2.5V
F
T
= GND
O
A
= 25°C
Input Current
1
10
100
1k
10k
100k
R
(Ω)
SOURCE
If complete settling occurs on the input, conversion re-
sults will be unaffected by the dynamic input current. An
incomplete settling of the input signal sampling process
may result in gain and offset errors, but it will not degrade
theINLperformanceoftheconverter. Figure11showsthe
mathematical expressions for the average bias currents
flowing through the IN+ and IN– pins as a result of the
sampling charge transfers when integrated over a sub-
stantial time period (longer than 64 internal clock cycles).
2412 F13
Figure 13. +FS Error vs RSOURCE at IN+ or IN– (Small CIN)
0
V
= 5V
CC
+
REF = 5V
–
REF = GND
–10
–20
–30
–40
–50
+
–
IN = GND
IN = 2.5V
F
= GND
= 25°C
O
A
T
The effect of this input dynamic current can be analyzed
using the test circuit of Figure 12. The CPAR capacitor
includes the LTC2412 pin capacitance (5pF typical) plus
thecapacitanceofthetestfixtureusedtoobtaintheresults
shown in Figures 13 and 14. A careful implementation can
bring the total input capacitance (CIN + CPAR) closer to 5pF
thus achieving better performance than the one predicted
by Figures 13 and 14. For simplicity, two distinct situa-
tions can be considered.
C
= 0.01µF
IN
C
= 0.001µF
IN
C
= 100pF
IN
C
= 0pF
IN
1
10
100
R
1k
(Ω)
10k
100k
SOURCE
2412 F14
Figure 14. –FS Error vs RSOURCE at IN+ or IN– (Small CIN)
for CIN will deteriorate the converter offset and gain
performancewithoutsignificantbenefitsofsignalfiltering
and the user is advised to avoid them. Nevertheless, when
For relatively small values of input capacitance (CIN
<
0.01µF), the voltage on the sampling capacitor settles
almost completely and relatively large values for the
source impedance result in only small errors. Such values
small values of CIN are unavoidably present as parasitics
2412f
24
LTC2412
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300
240
180
120
60
of input multiplexers, wires, connectors or sensors, the
LTC2412 can maintain its exceptional accuracy while
operatingwithrelativelargevaluesofsourceresistanceas
shown in Figures 13 and 14. These measured results may
be slightly different from the first order approximation
suggested earlier because they include the effect of the
actual second order input network together with the non-
linearsettlingprocessoftheinputamplifiers.ForsmallCIN
values, the settling on IN+ and IN– occurs almost indepen-
dently and there is little benefit in trying to match the
source impedance for the two pins.
V
= 5V
CC
+
C
= 1µF, 10µF
REF = 5V
IN
–
REF = GND
+
–
IN = 3.75V
IN = 1.25V
F
= GND
= 25°C
O
A
T
C
IN
= 0.1µF
C
IN
= 0.01µF
0
0
100 200 300 400 500 600 700 800 9001000
(Ω)
R
SOURCE
2412 F15
Larger values of input capacitors (CIN > 0.01µF) may be
required in certain configurations for antialiasing or gen-
eral input signal filtering. Such capacitors will average the
input sampling charge and the external source resistance
will see a quasi constant input differential impedance.
When FO = LOW (internal oscillator and 60Hz notch), the
typical differential input resistance is 1.8MΩ which will
generate a gain error of approximately 0.28ppm at full-
scale for each ohm of source resistance driving IN+ or IN.
When FO = HIGH (internal oscillator and 50Hz notch), the
typical differential input resistance is 2.16MΩ which will
generate a gain error of approximately 0.23ppm at full-
scale for each ohm of source resistance driving IN+ or IN.
When FO is driven by an external oscillator with a fre-
quency fEOSC (external conversion clock operation), the
typical differential input resistance is 0.28 • 1012/fEOSCΩ
and each ohm of source resistance driving IN+ or IN– will
resultin1.78•10–6 •fEOSCppmgainerroratfull-scale.The
effect of the source resistance on the two input pins is
additivewithrespecttothisgainerror. Thetypical+FSand
–FS errors as a function of the sum of the source resis-
tanceseenbyIN+ andIN– forlargevaluesofCIN areshown
in Figures 15 and 16.
Figure 15. +FS Error vs RSOURCE at IN+ or IN– (Large CIN)
0
C
= 0.01µF
= 0.1µF
IN
–60
–120
–180
–240
–300
C
IN
V
= 5V
CC
+
REF = 5V
–
REF = GND
+
–
IN = 1.25V
IN = 3.75V
F
= GND
= 25°C
C
= 1µF, 10µF
O
A
IN
T
0
100 200 300 400 500 600 700 800 9001000
(Ω)
R
SOURCE
2412 F16
Figure 16. –FS Error vs RSOURCE at IN+ or IN– (Large CIN)
values, itisadvisabletocarefullymatchthesourceimped-
ance seen by the IN+ and IN– pins. When FO = LOW
(internal oscillator and 60Hz notch), every 1Ω mismatch
in source impedance transforms a full-scale common
mode input signal into a differential mode input signal of
0.28ppm. When FO = HIGH (internal oscillator and 50Hz
notch), every 1Ω mismatch in source impedance trans-
forms a full-scale common mode input signal into a differ-
ential mode input signal of 0.23ppm. When FO is driven by
an external oscillator with a frequency fEOSC, every 1Ω
mismatch in source impedance transforms a full-scale
common mode input signal into a differential mode input
signal of 1.78 • 10–6 • fEOSCppm. Figure 17 shows the
In addition to this gain error, an offset error term may also
appear. The offset error is proportional with the mismatch
between the source impedance driving the two input pins
IN+ and IN– and with the difference between the input and
reference common mode voltages. While the input drive
circuitnonzerosourceimpedancecombinedwiththecon-
verter average input current will not degrade the INL
performance,indirectdistortionmayresultfromthemodu-
lation of the offset error by the common mode component
of the input signal. Thus, when using large CIN capacitor
typical offset error due to input common mode voltage for
2412f
25
LTC2412
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120
inasmalloffsetshift. A100Ωsourceresistancewillcreate
a 0.1µV typical and 1µV maximum offset voltage.
V
= 5V
CC
+
100
80
REF = 5V
A
–
REF = GND
+
–
IN = IN = V
INCM
60
B
Reference Current
40
C
D
E
F
20
In a similar fashion, the LTC2412 samples the differential
reference pins REF+ and REF– transfering small amount of
charge to and from the external driving circuits thus
producing a dynamic reference current. This current does
not change the converter offset, but it may degrade the
gainandINLperformance.Theeffectofthiscurrentcanbe
analyzed in the same two distinct situations.
0
–20
–40
–60
–80
–100
–120
F
= GND
O
A
G
T
= 25°C
SOURCEIN
= 10µF
R
C
– = 500Ω
IN
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
V
(V)
INCM
A: ∆R = +400Ω
E: ∆R = –100Ω
IN
IN
Forrelativelysmallvaluesoftheexternalreferencecapaci-
tors(CREF <0.01µF),thevoltageonthesamplingcapacitor
settles almost completely and relatively large values for
the source impedance result in only small errors. Such
values for CREF will deteriorate the converter offset and
gainperformancewithoutsignificantbenefitsofreference
filtering and the user is advised to avoid them.
B: ∆R = +200Ω
F: ∆R = –200Ω
IN
IN
C: ∆R = +100Ω
G: ∆R = –400Ω
IN
IN
D: ∆R = 0Ω
2412 F17
IN
Figure 17. Offset Error vs Common Mode Voltage
(VINCM = IN+ = IN–) and Input Source Resistance
Imbalance (∆RIN = RSOURCEIN+ – RSOURCEIN–) for
Large CIN Values (CIN ≥ 1µF)
various values of source resistance imbalance between
the IN+ and IN– pins when large CIN values are used.
Larger values of reference capacitors (CREF > 0.01µF) may
be required as reference filters in certain configurations.
Suchcapacitorswillaveragethereferencesamplingcharge
and the external source resistance will see a quasi con-
stant reference differential impedance. When FO = LOW
(internaloscillatorand60Hznotch), thetypicaldifferential
reference resistance is 1.3MΩ which will generate a gain
error of approximately 0.38ppm at full-scale for each ohm
of source resistance driving REF+ or REF–. When FO =
HIGH (internal oscillator and 50Hz notch), the typical
differential reference resistance is 1.56MΩ which will
generate a gain error of approximately 0.32ppm at full-
scale for each ohm of source resistance driving REF+ or
REF–. When FO is driven by an external oscillator with a
frequencyfEOSC (externalconversionclockoperation),the
typical differential reference resistance is 0.20 • 1012/
If possible, it is desirable to operate with the input signal
common mode voltage very close to the reference signal
common mode voltage as is the case in the ratiometric
measurement of a symmetric bridge. This configuration
eliminates the offset error caused by mismatched source
impedances.
Themagnitudeofthedynamicinputcurrentdependsupon
thesizeoftheverystableinternalsamplingcapacitorsand
upon the accuracy of the converter sampling clock. The
accuracy of the internal clock over the entire temperature
and power supply range is typical better than 0.5%. Such
a specification can also be easily achieved by an external
clock. When relatively stable resistors (50ppm/°C) are
used for the external source impedance seen by IN+ and
IN–, the expected drift of the dynamic current, offset and
gain errors will be insignificant (about 1% of their respec-
tive values over the entire temperature and voltage range).
Even for the most stringent applications, a one-time
calibration operation may be sufficient.
f
EOSCΩ and each ohm of source resistance drving REF+ or
REF– will result in 2.47 • 10–6 • fEOSCppm gain error at full-
scale. The effect of the source resistance on the two
reference pins is additive with respect to this gain error.
The typical +FS and –FS errors for various combinations
of source resistance seen by the REF+ and REF– pins and
external capacitance CREF connected to these pins are
shown in Figures 18, 19, 20 and 21.
In addition to the input sampling charge, the input ESD
protection diodes have a temperature dependent leakage
current. This current, nominally 1nA (±10nA max), results
2412f
26
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0
50
40
30
20
10
0
V
= 5V
CC
C
= 0.01µF
REF
+
REF = 5V
–
C
= 0.001µF
REF
REF = GND
–10
–20
–30
–40
–50
+
–
IN = 5V
C
= 100pF
REF
IN = 2.5V
C
= 0pF
F
= GND
= 25°C
REF
O
A
T
V
= 5V
CC
+
–
REF = 5V
C
= 0.01µF
REF
REF = GND
+
–
C
= 0.001µF
REF
IN = GND
IN = 2.5V
C
= 100pF
REF
C
F
= GND
O
= 0pF
T
= 25°C
A
REF
1
10
100
R
1k
10k
100k
1
10
100
R
1k
(Ω)
10k
100k
(Ω)
SOURCE
SOURCE
2412 F18
2412 F19
Figure 18. +FS Error vs RSOURCE at REF+ or REF– (Small CIN)
Figure 19. –FS Error vs RSOURCE at REF+ or REF– (Small CIN)
0
450
V
= 5V
CC
C
= 0.01µF
REF
+
C
= 1µF, 10µF
REF = 5V
REF
–
REF = GND
–90
–180
–270
–360
–450
360
270
180
90
+
–
IN = 1.25V
IN = 3.75V
F
= GND
= 25°C
O
A
T
C
= 0.1µF
REF
C
REF
= 0.1µF
V
= 5V
CC
+
REF = 5V
–
REF = GND
+
–
C
= 0.01µF
IN = 3.75V
REF
IN = 1.25V
C
= 1µF, 10µF
REF
F
= GND
= 25°C
O
A
T
0
0
100 200 300 400 500 600 700 800 9001000
(Ω)
0
100 200 300 400 500 600 700 800 9001000
(Ω)
R
R
SOURCE
SOURCE
2412 F20
2412 F21
Figure 20. +FS Error vs RSOURCE at REF+ and REF– (Large CREF
)
Figure 21. –FS Error vs RSOURCE at REF+ and REF– (Large CREF
)
tworeferencepinsisadditivewithrespecttothisINLerror.
In general, matching of source impedance for the REF+
and REF– pins does not help the gain or the INL error. The
user is thus advised to minimize the combined source
impedance driving the REF+ and REF– pins rather than to
try to match it.
In addition to this gain error, the converter INL perfor-
mance is degraded by the reference source impedance.
WhenFO =LOW(internaloscillatorand60Hznotch),every
100ΩofsourceresistancedrivingREF+ orREF– translates
into about 1.34ppm additional INL error. When FO = HIGH
(internaloscillatorand50Hznotch), every100Ωofsource
resistance driving REF+ or REF– translates into about
1.1ppm additional INL error. When FO is driven by an
external oscillator with a frequency fEOSC, every 100Ω of
source resistance driving REF+ or REF– translates into
about 8.73 • 10–6 • fEOSCppm additional INL error.
Figure 22 shows the typical INL error due to the source
resistance driving the REF+ or REF– pins when large CREF
values are used. The effect of the source resistance on the
The magnitude of the dynamic reference current depends
upon the size of the very stable internal sampling capaci-
tors and upon the accuracy of the converter sampling
clock. The accuracy of the internal clock over the entire
temperature and power supply range is typical better than
0.5%. Such a specification can also be easily achieved by
an external clock. When relatively stable resistors
2412f
27
LTC2412
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APPLICATIO S I FOR ATIO
15
There is no significant difference in the LTC2412 perfor-
mance between these two operation modes.
R
= 1000Ω
12
9
SOURCE
R
= 500Ω
SOURCE
An increase in fEOSC over the nominal 153600Hz will
translate into a proportional increase in the maximum
output data rate. This substantial advantage is neverthe-
less accompanied by three potential effects, which must
be carefully considered.
6
3
0
–3
–6
–9
–12
–15
R
= 100Ω
SOURCE
First, a change in fEOSC will result in a proportional change
in the internal notch position and in a reduction of the
converter differential mode rejection at the power line
frequency. In many applications, the subsequent perfor-
mance degradation can be substantially reduced by rely-
ing upon the LTC2412’s exceptional common mode
rejection and by carefully eliminating common mode to
differential mode conversion sources in the input circuit.
The user should avoid single-ended input filters and
should maintain a very high degree of matching and
symmetry in the circuits driving the IN+ and IN– pins.
–0.5–0.4–0.3–0.2–0.1
0
/V
0.1 0.2 0.3 0.4 0.5
V
INDIF REFDIF
V
= 5V
F = GND
O
CC
REF+ = 5V
C
= 10µF
REF
REF– = GND
T = 25°C
A
+
–
V
= 0.5 • (IN + IN ) = 2.5V
2412 F22
INCM
Figure 22. INL vs Differential Input Voltage (VIN = IN+ – IN–)
and Reference Source Resistance (RSOURCE at REF+ and REF–
for Large CREF Values (CREF ≥ 1µF)
(50ppm/°C) are used for the external source impedance
seen by REF+ and REF–, the expected drift of the dynamic
current gain error will be insignificant (about 1% of its
valueovertheentiretemperatureandvoltagerange). Even
for the most stringent applications a one-time calibration
operation may be sufficient.
Second, the increase in clock frequency will increase
proportionally the amount of sampling charge transferred
through the input and the reference pins. If large external
input and/or reference capacitors (CIN, CREF) are used, the
previous section provides formulae for evaluating the
effect of the source resistance upon the converter perfor-
mance for any value of fEOSC. If small external input and/
or reference capacitors (CIN, CREF) are used, the effect of
the external source resistance upon the LTC2412 typical
performance can be inferred from Figures 13, 14, 18 and
Inadditiontothereferencesamplingcharge,thereference
pinsESDprotectiondiodeshaveatemperaturedependent
leakage current. This leakage current, nominally 1nA
(±10nA max), results in a small gain error. A 100Ω source
resistance will create a 0.05µV typical and 0.5µV maxi-
mum full-scale error.
19 in which the horizontal axis is scaled by 153600/fEOSC
.
Third, an increase in the frequency of the external oscilla-
torabove460800Hz(amorethan3×increaseintheoutput
data rate) will start to decrease the effectiveness of the
internal autocalibration circuits. This will result in a pro-
gressive degradation in the converter accuracy and linear-
ity. Typical measured performance curves for output data
rates up to 100 readings per second are shown in Fig-
ures 23, 24, 25, 26, 27, 28, 29 and 30. In order to obtain
the highest possible level of accuracy from this converter
at output data rates above 20 readings per second, the
userisadvisedtomaximizethepowersupplyvoltageused
and to limit the maximum ambient operating temperature.
In certain circumstances, a reduction of the differential
Output Data Rate
When using its internal oscillator, the LTC2412 can pro-
duceupto7.5readingspersecondwithanotchfrequency
of 60Hz (FO = LOW) and 6.25 readings per second with a
notch frequency of 50Hz (FO = HIGH). The actual output
data rate will depend upon the length of the sleep and data
output phases which are controlled by the user and which
can be made insignificantly short. When operated with an
external conversion clock (FO connected to an external
oscillator), the LTC2412 output data rate can be increased
asdesired. Thedurationoftheconversionphaseis20510/
fEOSC. If fEOSC = 153600Hz, the converter behaves as if the
internal oscillator is used and the notch is set at 60Hz.
reference voltage may be beneficial.
2412f
28
LTC2412
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APPLICATIO S I FOR ATIO
7000
6000
5000
4000
3000
2000
1000
0
500
V
= 5V
CC
V
= 5V
CC
+
+
REF = 5V
450
400
350
300
250
200
150
100
50
REF = 5V
–
–
REF = GND
REF = GND
+
–
IN = 3.75V
V
V
= 2.5V
INCM
IN = 1.25V
= 0V
IN
F
= EXTERNAL OSCILLATOR
O
F
= EXTERNAL OSCILLATOR
O
T
= 85°C
A
T
= 85°C
A
T
= 25°C
A
T
A
= 25°C
0
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
2412 F24
2412 F23
Figure 23. Offset Error vs Output Data Rate and Temperature
Figure 24. +FS Error vs Output Data Rate and Temperature
0
24
23
22
–1000
T
= 85°C
T
= 25°C
A
A
21
20
19
18
17
16
15
14
13
12
–2000
–3000
–4000
–5000
–6000
–7000
T
= 25°C
A
T
= 85°C
A
V
= 5V
CC
+
REF = 5V
V
= 5V
CC
–
+
REF = GND
REF = 5V
–
V
V
F
= 2.5V
REF = GND
INCM
+
–
= 0V
IN = 1.25V
IN
= EXTERNAL OSCILLATOR
IN = 3.75V
O
RESOLUTION = LOG (V /NOISE )
RMS
F
= EXTERNAL OSCILLATOR
2
REF
O
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
2412 F25
2412 F26
Figure 25. –FS Error vs Output Data Rate and Temperature
Figure 26. Resolution (NoiseRMS ≤ 1LSB)
vs Output Data Rate and Temperature
22
250
RESOLUTION = LOG (V /INL
)
V
= 5V
CC
2
REF
MAX
+
225
200
175
150
125
100
75
REF = GND
20
18
16
14
12
10
8
V
V
F
= 2.5V
INCM
IN
= 0V
= EXTERNAL OSCILLATOR
= 25°C
O
T
T
= 85°C
T
= 25°C
A
A
A
V
= 5V
CC
V
= 5V
REF
+
REF = 5V
–
V
= 2.5V
REF = GND
REF
50
V
= 2.5V
INCM
–2.5V < V < 2.5V
IN
25
F
O
= EXTERNAL OSCILLATOR
0
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
2412 F27
2412 F28
Figure 28. Offset Error vs Output
Data Rate and Reference Voltage
Figure 27. Resolution (INLMAX ≤ 1LSB)
vs Output Data Rate and Temperature
2412f
29
LTC2412
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APPLICATIO S I FOR ATIO
24
Input Bandwidth
23
V
= 5V
REF
The combined effect of the internal Sinc4 digital filter and
of the analog and digital autocalibration circuits deter-
mines the LTC2412 input bandwidth. When the internal
oscillator is used with the notch set at 60Hz (FO = LOW),
the 3dB input bandwidth is 3.63Hz. When the internal
oscillator is used with the notch set at 50Hz (FO = HIGH),
the 3dB input bandwidth is 3.02Hz. If an external conver-
sionclockgeneratoroffrequencyfEOSC isconnectedtothe
22
21
20
19
18
17
16
15
14
13
12
V
= 2.5V
REF
V
= 5V
CC
–
REF = GND
V
V
F
= 2.5V
INCM
= 0V
IN
= EXTERNAL OSCILLATOR
O
T
= 25°C
A
RESOLUTION = LOG (V /NOISE )
RMS
2
REF
FO pin, the 3dB input bandwidth is 0.236 • 10–6 • fEOSC
.
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
Due to the complex filtering and calibration algorithms
utilized,theconverterinputbandwidthisnotmodeledvery
accurately by a first order filter with the pole located at the
3dB frequency. When the internal oscillator is used, the
shape of the LTC2412 input bandwidth is shown in Fig-
ure 31 for FO = LOW and FO = HIGH. When an external
oscillator of frequency fEOSC is used, the shape of the
LTC2412 input bandwidth can be derived from Figure 31,
FO = LOW curve in which the horizontal axis is scaled by
fEOSC/153600.
2412 F29
Figure 29. Resolution (NoiseRMS ≤ 1LSB)
vs Output Data Rate and Reference Voltage
22
RESOLUTION =
LOG (V /INL )
2
REF
MAX
20
18
16
14
12
10
8
V
= 2.5V
V
= 5V
REF
REF
T
= 25°C
= 5V
A
CC
The conversion noise (800nVRMS typical for VREF = 5V)
can be modeled by a white noise source connected to a
noise free converter. The noise spectral density is
62.75nV/√Hz for an infinite bandwidth source and
86.1nV/√Hz for a single 0.5MHz pole source. From these
numbers, it is clear that particular attention must be given
to the design of external amplification circuits. Such
circuits face the simultaneous requirements of very low
bandwidth (just a few Hz) in order to reduce the output
referred noise and relatively high bandwidth (at least
500kHz) necessary to drive the input switched-capacitor
network. A possible solution is a high gain, low bandwidth
amplifier stage followed by a high bandwidth unity-gain
buffer.
V
–
REF = GND
= 0.5 • REF
+
V
INCM
–0.5V • V
< V < 0.5 • V
REF
IN REF
F
O
= EXTERNAL OSCILLATOR
0
10 20 30 40 50 60 70 80 90 100
OUTPUT DATA RATE (READINGS/SEC)
2412 F30
Figure 30. Resolution (INLMAX ≤ 1LSB)
vs Output Data Rate and Reference Voltage
0.0
–0.5
–1.0
–1.5
F
= HIGH
F = LOW
O
O
–2.0
–2.5
–3.0
–3.5
–4.0
–4.5
–5.0
–5.5
–6.0
When external amplifiers are driving the LTC2412, the
ADCinputreferredsystemnoisecalculationcanbesimpli-
fied by Figure 32. The noise of an amplifier driving the
LTC2412 input pin can be modeled as a band limited white
noise source. Its bandwidth can be approximated by the
bandwidth of a single pole lowpass filter with a corner
frequency fi. The amplifier noise spectral density is ni.
From Figure 32, using fi as the x-axis selector, we can find
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
DIFFERENTIAL INPUT SIGNAL FREQUENCY (Hz)
2412 F31
Figure 31. Input Signal Bandwidth
Using the Internal Oscillator
on the y-axis the noise equivalent bandwidth freqi of the
2412f
30
LTC2412
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100
10
1
input driving amplifier. This bandwidth includes the band
limitingeffectsoftheADCinternalcalibrationandfiltering.
The noise of the driving amplifier referred to the converter
input and including all these effects can be calculated as
N = ni • √freqi. The total system noise (referred to the
LTC2412 input) can now be obtained by summing as
squarerootofsumofsquaresthethreeADCinputreferred
noise sources: the LTC2412 internal noise (800nV), the
noise of the IN+ driving amplifier and the noise of the IN–
driving amplifier.
F
F
= LOW
= HIGH
O
O
0.1
0.1
1
10 100 1k 10k 100k 1M
If the FO pin is driven by an external oscillator of frequency
fEOSC, Figure32canstillbeusedfornoisecalculationifthe
x-axis is scaled by fEOSC/153600. For large values of the
ratio fEOSC/153600, the Figure 32 plot accuracy begins to
decrease, but in the same time the LTC2412 noise floor
rises and the noise contribution of the driving amplifiers
lose significance.
INPUT NOISE SOURCE SINGLE POLE
EQUIVALENT BANDWIDTH (Hz)
2412 F32
Figure 32. Input Referred Noise Equivalent Bandwidth
of an Input Connected White Noise Source
0
F
= HIGH
O
–10
–20
–30
–40
Normal Mode Rejection and Antialiasing
–50
–60
One of the advantages delta-sigma ADCs offer over con-
ventional ADCs is on-chip digital filtering. Combined with
a large oversampling ratio, the LTC2412 significantly
simplifies antialiasing filter requirements.
–70
–80
–90
–100
–110
–120
TheSinc4 digitalfilterprovidesgreaterthan120dBnormal
mode rejection at all frequencies except DC and integer
multiples of the modulator sampling frequency (fS). The
LTC2412’s autocalibration circuits further simplify the
antialiasing requirements by additional normal mode sig-
nal filtering both in the analog and digital domain. Inde-
pendent of the operating mode, fS = 256 • fN = 2048 •
fOUTMAX where fN in the notch frequency and fOUTMAX is
the maximum output data rate. In the internal oscillator
mode with a 50Hz notch setting, fS = 12800Hz and with a
60Hz notch setting fS = 15360Hz. In the external oscillator
mode, fS = fEOSC/10.
0
f
2f 3f 4f 5f 6f 7f 8f 9f 10f 11f 12f
S S S S S S S S S S S S
DIFFERENTIAL INPUT SIGNAL FREQUENCY (Hz)
2412 F33
Figure 33. Input Normal Mode Rejection,
Internal Oscillator and 50Hz Notch
0
F
F
= LOW OR
O
O
–10
–20
= EXTERNAL
OSCILLATOR,
f
= 10 • f
EOSC
S
–30
–40
–50
–60
–70
–80
The combined normal mode rejection performance is
shown in Figure 33 for the internal oscillator with 50Hz
notch setting (FO = HIGH) and in Figure 34 for the internal
oscillator with 60Hz notch setting (FO = LOW) and for the
external oscillator mode. The regions of low rejection
occurring at integer multiples of fS have a very narrow
bandwidth.Magnifieddetailsofthenormalmoderejection
curves are shown in Figure 35 (rejection near DC) and
–90
–100
–110
–120
0
f
2f 3f 4f 5f 6f 7f 8f 9f 10f
S S S S S S S S S S
DIFFERENTIAL INPUT SIGNAL FREQUENCY (Hz)
2412 F34
Figure 34. Input Normal Mode Rejection, Internal
Oscillator and 60Hz Notch or External Oscillator
2412f
31
LTC2412
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APPLICATIO S I FOR ATIO
Figure 36 (rejection at fS = 256fN) where fN represents the
notch frequency. These curves have been derived for the
external oscillator mode but they can be used in all
operating modes by appropriately selecting the fN value.
As a result of these remarkable normal mode specifica-
tions, minimal (if any) antialias filtering is required in front
of the LTC2412. If passive RC components are placed in
front of the LTC2412, the input dynamic current should be
considered (see Input Current section). In cases where
large effective RC time constants are used, an external
buffer amplifier may be required to minimize the effects of
dynamic input current.
The user can expect to achieve in practice this level of
performance using the internal oscillator as it is demon-
strated by Figures 37 and 38. Typical measured values of
the normal mode rejection of the LTC2412 operating with
an internal oscillator and a 60Hz notch setting are shown
in Figure 37 superimposed over the theoretical calculated
curve. Similarly, typical measured values of the normal
mode rejection of the LTC2412 operating with an internal
oscillator and a 50Hz notch setting are shown in Figure 38
superimposed over the theoretical calculated curve.
Traditional high order delta-sigma modulators, while pro-
viding very good linearity and resolution, suffer from po-
tential instabilities at large input signal levels. The
proprietary architecture used for the LTC2412 third order
modulator resolves this problem and guarantees a pre-
dictablestablebehavioratinputsignallevelsofupto150%
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
–120
250f 252f 254f 256f 258f 260f 262f
N
0
f
2f
N
3f
4f
N
5f
6f
7f
8f
N
N
N
N
N
N
N
N
N
N
N
N
INPUT SIGNAL FREQUENCY (Hz)
INPUT SIGNAL FREQUENCY (Hz)
2412 F36
2412 F35
Figure 35. Input Normal Mode Rejection
Figure 36. Input Normal Mode Rejection
0
–20
D
5V
5V
–40
–60
–80
–100
–120
0
15 30 45 60 75 90 105 120 135 150 165 180 195 210 225 240
INPUT FREQUENCY (Hz)
2412 F37
Figure 37. Input Normal Mode Rejection vs Input Frequency
with Input Perturbation of 100% Full Scale (60Hz Notch)
2412f
32
LTC2412
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of full scale. In many industrial applications, it is not un-
commontohavetomeasuremicrovoltlevelsignalssuper-
imposed over volt level perturbations and LTC2412 is
eminently suited for such tasks. When the perturbation is
differential,thespecificationofinterestisthenormalmode
rejection for large input signal levels. With a reference
voltage VREF = 5V, the LTC2412 has a full-scale differen-
tialinputrangeof5Vpeak-to-peak.Figures39and40show
measurementresultsfortheLTC2412normalmoderejec-
tion ratio with a 7.5V peak-to-peak (150% of full scale)
input signal superimposed over the more traditional nor-
mal mode rejection ratio results obtained with a 5V peak-
to-peak (full scale) input signal. In Figure 39, the LTC2412
uses the internal oscillator with the notch set at 60Hz (FO
= LOW) and in Figure 40 it uses the internal oscillator with
thenotchsetat50Hz(FO=HIGH).ItisclearthattheLTC2412
rejectionperformanceismaintainedwithnocompromises
in this extreme situation. When operating with large input
signal levels, the user must observe that such signals do
not violate the device absolute maximum ratings.
Measuring Barometric Pressure and Temperature
with a Single Sensor
Figure 41 shows the LTC2412 measuring both tempera-
ture and pressure from an Intersema model MS5401-BM
absolute pressure sensor. The bridge has a nominal
impedanceof3.4k, atemperaturecoefficientofresistance
of 2900ppm/°C and a temperature coefficient of span of
–1900ppm/°C. R1 provides first order temperature com-
pensationoftheoutputspanbycausingthebridgevoltage
to increase by 1900ppm/°C, offsetting the –1900ppm/°C
TC of span. R1 should have a much smaller TC than that
of the bridge resistance; 50ppm/°C or less is satisfactory.
In addition to compensating the bridge output span, this
circuitalsoprovidesaconvenientwaytomeasureambient
temperature. Channel 1 of the LTC2412 measures the
bridge excitation voltage, which has a slope of approxi-
mately 3.2mV/°C. Channel 0 measures the bridge output,
which has a slope of 50mV/bar. The temperature reading
can also be used for second order compensation of the
pressure reading.
0
–20
D
5V
5V
–40
–60
–80
–100
–120
0
12.5 25 37.5 50 62.5 75 87.5 100 112.5 125 137.5 150 162.5 175 187.5 200
INPUT FREQUENCY (Hz)
2412 F38
Figure 38. Input Normal Mode Rejection vs Input Frequency with Input Perturbation of 100% Full Scale (50Hz Notch)
2412f
33
LTC2412
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0
V
V
= 5V
= 7.5V
V
= 5V
IN(P-P)
CC
+
REF = 5V
REF = GND
IN(P-P)
–
–20
(150% OF FULL SCALE)
V
INCM
= 2.5V
F
T
= GND
= 25°C
O
–40
A
–60
–80
–100
–120
0
15 30 45 60 75 90 105 120 135 150 165 180 195 210 225 240
INPUT FREQUENCY (Hz)
2412 F39
Figure 39. Measured Input Normal Mode Rejection vs Input Frequency with Input Perturbation of 150% Full Scale (60Hz Notch)
0
V
= 5V
V
= 5V
IN(P-P)
CC
–20
–40
–60
–80
–100
–120
0
12.5 25 37.5 50 62.5 75 87.5 100 112.5 125 137.5 150 162.5 175 187.5 200
INPUT FREQUENCY (Hz)
2412 F40
Figure 40. Measured Input Normal Mode Rejection vs Input Frequency with Input Perturbation of 150% Full Scale (50Hz Notch)
2412f
34
LTC2412
U
PACKAGE DESCRIPTIO
GN Package
16-Lead Plastic SSOP (Narrow .150 Inch)
(Reference LTC DWG # 05-08-1641)
.189 – .196*
(4.801 – 4.978)
.045 ±.005
.009
(0.229)
REF
16 15 14 13 12 11 10 9
.254 MIN
.150 – .165
.229 – .244
.150 – .157**
(5.817 – 6.198)
(3.810 – 3.988)
.0165 ±.0015
.0250 TYP
RECOMMENDED SOLDER PAD LAYOUT
1
2
3
4
5
6
7
8
.015 ± .004
(0.38 ± 0.10)
× 45°
.053 – .068
(1.351 – 1.727)
.004 – .0098
(0.102 – 0.249)
.007 – .0098
(0.178 – 0.249)
0° – 8° TYP
.016 – .050
(0.406 – 1.270)
.0250
(0.635)
BSC
.008 – .012
(0.203 – 0.305)
NOTE:
1. CONTROLLING DIMENSION: INCHES
INCHES
2. DIMENSIONS ARE IN
(MILLIMETERS)
GN16 (SSOP) 0502
3. DRAWING NOT TO SCALE
*DIMENSION DOES NOT INCLUDE MOLD FLASH. MOLD FLASH
SHALL NOT EXCEED 0.006" (0.152mm) PER SIDE
**DIMENSION DOES NOT INCLUDE INTERLEAD FLASH. INTERLEAD
FLASH SHALL NOT EXCEED 0.010" (0.254mm) PER SIDE
2412f
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tationthattheinterconnectionofitscircuitsasdescribedhereinwillnotinfringeonexistingpatentrights.
35
LTC2412
U
TYPICAL APPLICATIO
5V
1
2
4.7µF
0.1µF
14
V
R1
F
O
CC
6.8k
+
50ppm/°C
REF
FO SELECTED
LTC2412
3
FOR 60Hz
4
5
6
7
3
REJECTION
+
–
+
CH0
CH0
CH1
13
4
1
SCK
SDO
CS
12
11
INTERSEMA
MSS401-BM
1 BAR FS
2
CH1¯
–
REF
8,9,10,15,16
GND
2412 TA05
Figure 41. Measure Barometric Pressure and Temperature with a Single Sensor
RELATED PARTS
PART NUMBER
DESCRIPTION
COMMENTS
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Precise Charge, Balanced Switching, Low Power
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Dual Precision Instrumentation Switched Capacitor
Building Block
LTC1050
Precision Chopper Stabilized Op Amp
Precision Bandgap Reference, 5V
No External Components 5µV Offset, 1.6µV Noise
P-P
LT1236A-5
LT1461
0.05% Max, 5ppm/°C Drift
Micropower Precision LDO Reference
24-Bit, No Latency ∆Σ ADC in SO-8
High Accuracy 0.04% Max, 3ppm/°C Max Drift
LTC2400
0.3ppm Noise, 4ppm INL, 10ppm Total Unadjusted Error, 200µA
0.6ppm Noise, 4ppm INL, 10ppm Total Unadjusted Error, 200µA
0.3ppm Noise, 4ppm INL, 10ppm Total Unadjusted Error, 200µA
0.16ppm Noise, 2ppm INL, 3ppm Total Unadjusted Error, 200µA
LTC2401/LTC2402
LTC2404/LTC2408
LTC2410
1-/2-Channel, 24-Bit, No Latency ∆Σ ADC in MSOP
4-/8-Channel, 24-Bit, No Latency ∆Σ ADC
24-Bit, Fully Differential, No Latency ∆Σ ADC
24-Bit, No Latency ∆Σ ADC in MSOP
24-Bit, Simultaneous 50Hz/60Hz Rejection ∆Σ ADC
24-Bit, No Latency ∆Σ ADC
LTC2411
1.45µV
Noise, 2ppm INL
RMS
LTC2411-1
LTC2413
0.3ppm Noise, 2ppm INL, Pin Compatible with LTC2411
Simultaneous 50Hz/60Hz Rejection, 800nV Noise
RMS
LTC2414/LTC2418
LTC2415
8-/16-Channel, 24-Bit No Latency ∆Σ ADC
24-Bit, No Latency ∆Σ ADC with 15Hz Output Rate
20-Bit, No Latency ∆Σ ADC in SO-8
0.2ppm Noise, 2ppm INL, 3ppm Total Unadjusted Error, 200µA
Pin Compatible with the LTC2410
LTC2420
1.2ppm Noise, 8ppm INL, Pin Compatible with LTC2400
1.2ppm Noise, 8ppm INL, Pin Compatible with LTC2404/LTC2408
4kHz Output Rate, 200nV Noise, 24.6 ENOBs
LTC2424/LTC2428
LTC2440
4-/8-Channel, 20-Bit, No Latency ∆Σ ADCs
High Speed, Low Noise 24-Bit ADC
2412f
LT/TP 1202 2K • PRINTED IN USA
36 LinearTechnology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
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(408) 432-1900 FAX: (408) 434-0507 www.linear.com
LINEAR TECHNOLOGY CORPORATION 2002
相关型号:
LTC2418CGN#TR
LTC2418 - 8-/16-Channel 24-Bit No Latency Delta Sigma ADCs; Package: SSOP; Pins: 28; Temperature Range: 0°C to 70°C
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LTC2420CS8#PBF
LTC2420 - 20-Bit µPower No Latency Delta-Sigma ADC in SO-8; Package: SO; Pins: 8; Temperature Range: 0°C to 70°C
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LTC2420CS8#TRPBF
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