RH1016 [Linear]

UltraFast? Precision 10ns Comparator; 超快?精度10ns的比较器
RH1016
型号: RH1016
厂家: Linear    Linear
描述:

UltraFast? Precision 10ns Comparator
超快?精度10ns的比较器

比较器
文件: 总2页 (文件大小:140K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DICE/DWF SPECIFICATION  
RH1016  
UltraFast™ Precision  
10ns Comparator  
1
1
8
7
PAD FUNCTION  
DIE CROSS REFERENCE  
1
1. V+  
LTC Finished  
Part Number  
Order  
Part Number  
1
2. +IN  
2
3
4
3. –IN  
RH1016M  
RH1016M  
RH1016 DICE  
RH1016 DWF*  
4. V–  
5. LATCH ENABLE  
6. GND  
6
*DWF = DICE in wafer form.  
7. Q OUT  
8. Q OUT  
L, LT, LTC and LTM are registered trademarks of Linear Technology Corporation.  
UltraFast is a trademark of Linear Technology Corporation.  
All other trademarks are the property of their respective owners.  
5
56mils × 58mils  
Backside Connection is V–  
DICE ELECTRICAL TEST LIMITS  
TA = 25°C. V+ = 5V, V= –5V, VOUT(Q) = 1.4V, VLATCH = 0V, unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN  
MAX  
±±  
1
UNITS  
mV  
V
Input Offset Voltage  
Input Offset Current  
Input Bias Current  
Input Voltage Range  
R ≤ 100Ω (Note 1)  
S
OS  
I
I
(Note 1)  
(Note 2)  
μA  
OS  
10  
μA  
B
(Note ±)  
Single 5V Supply (Note ±)  
–±.75  
1.25  
±.5  
±.5  
V
V
CMRR  
PSRR  
Common Mode Rejection  
Supply Voltage Rejection  
–±.75V ≤ V ≤ ±.5V  
80  
dB  
CM  
+
Positive Supply 4.6V ≤ V ≤5.4V  
Negative Supply –7V ≤ V ≤ –2V  
60  
80  
dB  
dB  
A
Small-Signal Voltage Gain  
Output High Voltage  
1V ≤ V  
≤ 2V  
1400  
V/V  
V
OUT  
+
V
OH  
V ≥ 4.6V, I  
= 1mA  
2.80  
2.60  
V
V
OUT  
I
= 10mA  
OUT  
V
Output Low Voltage  
I
= 4mA  
0.5  
±5  
5
V
mA  
mA  
V
OL  
SINK  
+
I
I
Positive Supply Current  
Negative Supply Current  
Latch Pin High Input Voltage  
Latch Pin Low Input Voltage  
Latch Pin Current  
V
V
2.0  
IH  
IL  
0.8  
V
I
IL  
V
= 0V  
LATCH  
500  
μA  
Note 1: Input offset voltage is defined as the average of the two voltages  
measured by forcing first one output, then the other to 1.4V. Input offset  
current is defined in the same way.  
Note 3: Input voltage range is guaranteed in part by CMRR testing and  
in part by design and characterization. See the LT1016 data sheet for  
discussion of input voltage range for supplies other than ±5V or 5V.  
Note 2: Input bias current (I ) is defined as the average of the two input  
B
currents.  
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.  
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-  
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.  
1
DICE/DWF SPECIFICATION  
RH1016  
Rad Hard die require special handling as compared to standard IC chips.  
wand can be made by pushing a small diameter Teflon tubing onto the tip  
of a steel-tipped wand. The inside diameter of the Teflon tip should match  
the die size for efficient pickup. The tip of the Teflon should be cut square  
and flat to ensure good vacuum to die surface. Ensure the Teflon tip  
remains clean from debris by inspecting under stereoscope.  
Rad Hard die are susceptible to surface damage because there is no silicon  
nitride passivation as on standard die. Silicon nitride protects the die  
surface from scratches by its hard and dense properties. The passivation  
on Rad Hard die is silicon dioxide that is much “softer” than silicon nitride.  
During die attach, care must be exercised to ensure no tweezers touch the  
top of the die.  
LTC recommends that die handling be performed with extreme care so  
as to protect the die surface from scratches. If the need arises to move  
the die around from the chip tray, use a Teflon-tipped vacuum wand. This  
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus  
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information  
on dice performance and lot qualifications via lot sampling test procedures.  
Dice data sheet subject to change. Please consult factory for current revision in production.  
I.D.No. 66-1±-1016  
LT 1008 • PRINTED IN USA  
LinearTechnology Corporation  
1630 McCarthy Blvd., Milpitas, CA 95035-7417  
2
© LINEAR TECHNOLOGY CORPORATION 2008  
(408) 432-1900 FAX: (408) 434-0507 www.linear.com  

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