RH1083MMK [Linear]

IC VREG ADJUSTABLE POSITIVE LDO REGULATOR, 2 V DROPOUT, MBFM2, METAL CAN, TO-3, 2 PIN, Adjustable Positive Single Output LDO Regulator;
RH1083MMK
型号: RH1083MMK
厂家: Linear    Linear
描述:

IC VREG ADJUSTABLE POSITIVE LDO REGULATOR, 2 V DROPOUT, MBFM2, METAL CAN, TO-3, 2 PIN, Adjustable Positive Single Output LDO Regulator

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DICE/DWF SPECIFICATION  
RH1083CK  
7.5A Low Dropout  
Positive Adjustable Regulator  
PAD FUNCTION  
DIE CROSS REFERENCE  
1. ADJUST  
2. VOUT  
3. VIN  
3
LTC Finished  
Order DICE CANDIDATE  
Part Number Below  
Part Number  
2
2
2
2
RH1083CK  
RH1083CK  
RH1083CK DICE  
RH1083CK DWF*  
3
3
Please refer to LTC standard product data sheet for  
other applicable product information.  
*DWF = DICE in wafer form.  
3
2
1
160mils × 121mils  
Backside metal: Alloyed gold layer  
Backside potential: substrate to Pad 2  
, LT, LTC and LTM are registered trademarks of Linear Technology Corporation.  
All other trademarks are the property of their respective owners.  
DICE/DWF ELECTRICAL TEST LIMITS  
PARAMETER  
CONDITIONS  
NOTES  
MIN  
MAX  
1.262  
1.270  
UNITS  
Reference Voltage  
I
= 10mA, (V – V ) = 3V  
1.238  
1.225  
V
V
OUT  
IN  
OUT  
10mA ≤ I  
≤ 50mA  
OUT  
OUT  
IN  
1.5V ≤ (V – V ) ≤ 25V  
Line Regulation  
Load Regulation  
I
= 10mA, 1.5V ≤ (V – V ) ≤ 15V  
1, 2  
1, 2  
3
0.2  
0.5  
%
%
OUT  
IN  
OUT  
15V ≤ (V – V ) ≤ 30V  
IN  
OUT  
(V – V ) = 3V  
10mA ≤ I  
0.35  
%
IN  
OUT  
OUT  
≤ 50mA  
Dropout Voltage  
1.5  
V
A
ΔV = 1%, I  
= 50mA  
REF  
OUT  
Current Limit  
(V – V ) = 5V  
8
IN  
OUT  
Minimum Load Current  
ADJUST Pin Current  
ADJUST Pin Current Change  
(V – V ) = 25V  
10  
120  
5
mA  
μA  
μA  
IN  
OUT  
T = 25°C  
J
10mA ≤ I  
≤ 50mA  
OUT  
OUT  
IN  
1.5V ≤ (V – V ) ≤ 25V  
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.  
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-  
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.  
1
DICE/DWF SPECIFICATION  
RH1083CK  
DICE/DWF ELECTRICAL TEST LIMITS  
Note 1: See the LT®1083 data sheet thermal regulation specifications for  
changes in output voltage due to heating effects. Line and load regulation  
are measured at a constant junction temperature by low duty cycle pulse  
testing.  
Note 3: Dropout voltage is tested at 50mA but guaranteed over the full  
output current range of the device. Test points and limits are shown on the  
Dropout Voltage curve in the LT1083 data sheet.  
Note 2: Power dissipation is determined by the input/output differential  
voltage and the output current.  
Rad Hard die require special handling as compared to standard IC chips.  
Rad Hard die are susceptible to surface damage because there is no silicon nitride passivation as on standard die. Silicon nitride protects the die surface  
from scratches by its hard and dense properties. The passivation on Rad Hard die is silicon dioxide that is much “softer” than silicon nitride.  
LTC recommends that die handling be performed with extreme care so as to protect the die surface from scratches. If the need arises to move the  
die around from the chip tray, use a Teflon-tipped vacuum wand. This wand can be made by pushing a small diameter Teflon tubing onto the tip of a  
steel-tipped wand. The inside diameter of the Teflon tip should match the die size for efficient pickup. The tip of the Teflon should be cut square and  
flat to ensure good vacuum to die surface. Ensure the Teflon tip remains clean from debris by inspecting under stereoscope.  
During die attach, care must be exercised to ensure no tweezers touch the top of the die.  
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus  
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information  
on dice performance and lot qualifications via lot sampling test procedures.  
Dice data sheet subject to change. Please consult factory for current revision in production.  
I.D.No. 66-13-1083ck  
LT 0208 • PRINTED IN USA  
LinearTechnology Corporation  
1630 McCarthy Blvd., Milpitas, CA 95035-7417  
2
© LINEAR TECHNOLOGY CORPORATION 2008  
(408) 432-1900 FAX: (408) 434-0507 www.linear.com  

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