MAX17000AETG+C00 [MAXIM]

Power Supply Support Circuit, Adjustable, 2 Channel, BICMOS, TQFN-24;
MAX17000AETG+C00
型号: MAX17000AETG+C00
厂家: MAXIM INTEGRATED PRODUCTS    MAXIM INTEGRATED PRODUCTS
描述:

Power Supply Support Circuit, Adjustable, 2 Channel, BICMOS, TQFN-24

信息通信管理
文件: 总32页 (文件大小:750K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
General Description  
Features  
o SMPS Regulator (VDDQ)  
The MAX17000A pulse-width modulation (PWM) con-  
troller provides a complete power solution for notebook  
DDR, DDR2, and DDR3 memory. It comprises a step-  
down controller, a source-sink LDO regulator, and a ref-  
erence buffer to generate the required VDDQ, VTT, and  
VTTR rails.  
Quick-PWM with 100ns Load-Step Response  
Output Voltages—Preset 1.8V, 1.5V, or  
Adjustable 1.0V to 2.5V  
1% V  
Accuracy Over Line and Load  
OUT  
26V Maximum Input Voltage Rating  
Accurate Valley Current-Limit Protection  
200kHz to 600kHz Switching Frequency  
The VDDQ rail is supplied by a step-down converter  
using Maxim’s proprietary Quick-PWM™ controller. The  
high-efficiency, constant-on-time PWM controller han-  
dles wide input/output voltage ratios (low duty-cycle  
applications) with ease and provides 100ns response  
to load transients while maintaining a relatively constant  
switching frequency. The Quick-PWM architecture cir-  
cumvents the poor load-transient timing problems of  
fixed-frequency current-mode PWMs while also avoid-  
ing the problems caused by widely varying switching  
frequencies in conventional constant-on-time and con-  
stant-off-time PWM schemes. The controller senses the  
current to achieve an accurate valley current-limit pro-  
tection. It is also built in with overvoltage, undervoltage,  
and thermal protections. The MAX17000A can be set to  
run in three different modes: power-efficient SKIP  
mode, low-noise forced-PWM mode, and standby  
mode to support memory in notebook computer stand-  
by operation. The switching frequency is programma-  
ble from 200kHz to 600kHz to allow small components  
and high efficiency. The VDDQ output voltage can be  
set to a preset 1.8V or 1.5V, or be adjusted from 1.0V to  
2.5V by an external resistor-divider. This output has 1%  
accuracy over line-and-load operating range.  
o Source/Sink Linear Regulator (VTT)  
±2A Peak Source/Sink  
Low-Output Capacitance Requirement  
Output Voltages-Preset VDDQ/2 or REFIN  
Adjustable from 0.5V to 1.5V  
o Soft-Start/Soft-Shutdown  
o SMPS Power-Good Window Comparator  
o VTT Power-Good Window Comparator  
o Selectable Overvoltage Protection  
o Undervoltage/Thermal Protections  
o ±±mA Reference ꢀuffer (VTTR)  
Ordering Information  
PART  
TEMP RANGE  
PIN-PACKAGE  
MAX17000AETG+  
-40°C to +85°C  
24 Thin QFN-EP*  
+Denotes a lead(Pb)-free/RoHS-compliant package.  
*EP = Exposed pad.  
Pin Configuration  
The MAX17000A includes a 2A source-sink LDO reg-  
ulator for the memory termination VTT rail. This VTT reg-  
ulator has a 5mV deadband that either sources or  
sinks, ideal for the fast-changing load burst present in  
memory termination applications. This feature also  
reduces output capacitance requirements.  
TOP VIEW  
18  
17  
16  
15  
14  
13  
12  
11  
10  
9
V
19  
CSL  
FB  
DD  
The VTTR reference buffer sources and sinks 3mA,  
providing the reference voltage needed by the memory  
controller and devices on the memory bus.  
PGND1 20  
AGND 21  
SKIP 22  
REFIN  
MAX17000A  
The MAX17000A is available in a 24-pin, 4mm x 4mm,  
thin QFN package.  
VTTI  
V
8
VTT  
23  
24  
CC  
*EP  
5
Applications  
7
PGND2  
SHDN  
Notebook Computers  
1
2
3
4
6
DDR, DDR2, and DDR3 Memory Supplies  
SSTL Memory Supplies  
THIN QFN  
4mm x 4mm  
*EXPOSED PAD  
Quick-PWM is a trademark of Maxim Integrated Products, Inc.  
For pricing, delivery, and ordering information, please contact Maxim Direct  
at 1-888-629-4642, or visit Maxim’s website at www.maximintegrated.com.  
19-4307; Rev 3; 4/13  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
AꢀSOLUTE MAXIMUM RATINGS  
TON to PGND1.......................................................-0.3V to +28V  
VTTI to PGND2 .........................................................-0.3V to +6V  
VTT to PGND2 ............................................-0.3V to (V + 0.3V)  
V
V
to PGND1..........................................................-0.3V to +6V  
DD  
CC  
TTI  
to V ............................................................-0.3V to +0.3V  
VTTS to AGND............................................-0.3V to (V  
+ 0.3V)  
+ 0.3V)  
DD  
CC  
OVP to AGND...........................................................-0.3V to +6V  
SHDN, STDBY, SKIP to AGND.................................-0.3V to +6V  
REFIN, FB, PGOOD1,  
VTTR to AGND ..........................................-0.3V to (V  
CSL  
PGND1, PGND2 to AGND.....................................-0.3V to +0.3V  
Continuous Power Dissipation (T = +70°C)  
A
PGOOD2 to AGND ................................-0.3V to (V  
CSH, CSL to AGND....................................-0.3V to (V  
DL to PGND1..............................................-0.3V to (V  
BST to PGND1...........................................................-1V to +34V  
BST to LX..................................................................-0.3V to +6V  
+ 0.3V)  
+ 0.3V)  
+ 0.3V)  
24-Pin, 4mm x 4mm Thin QFN  
CC  
CC  
DD  
(derated 27.8mW/°C above +70°C)..........................2222mW  
Operating Temperature Range ...........................-40°C to +85°C  
Junction Temperature......................................................+150°C  
Storage Temperature Range.............................-65°C to +150°C  
Lead Temperature (soldering, 10s) .................................+300°C  
Soldering Temperature (reflow) .......................................+260°C  
DH to LX....................................................-0.3V to (V  
+ 0.3V)  
BST  
BST to V .............................................................-0.3V to +28V  
DD  
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional  
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to  
absolute maximum rating conditions for extended periods may affect device reliability.  
ELECTRICAL CHARACTERISTICS  
(V = 12V, V  
= V  
= V  
= V  
= 5V, V  
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.  
CSL A  
IN  
CC  
DD  
SHDN  
REFIN  
Typical values are at T = +25°C.) (Note 1)  
A
PARAMETER  
SYMBOL  
CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
PWM CONTROLLER  
V
3
26  
5.5  
IN  
Input Voltage Range  
V
V
V
, V  
CC DD  
4.5  
FB = AGND  
FB = V  
1.485  
1.782  
0.99  
1
1.500  
1.800  
1.000  
1.515  
1.818  
1.01  
2.7  
V
= 4.5V to 26V,  
IN  
Output-Voltage Accuracy  
V
CSL  
CC  
SKIP = V  
CC  
FB = Adj  
Output-Voltage Range  
Load Regulation Error  
Line Regulation Error  
Soft-Start Ramp Time  
Soft-Stop Ramp Time  
Soft-Stop Threshold  
V
CSL  
V
V
CSH  
- V  
CSL  
= 0 to 18mV, SKIP = V  
CC  
0.1  
0.25  
1.4  
2.8  
25  
%
V
DD  
= 4.5V to 5.5V, V = 4.5V to 26V  
%
IN  
t
Rising edge of SHDN  
Falling edge of SHDN  
2.1  
ms  
ms  
mV  
SSTART  
t
SSTOP  
R
= 96.75k(600kHz),  
TON  
-15  
-10  
-15  
+15  
+10  
+15  
167ns nominal  
V
V
= 12V,  
= 1.2V  
R
TON  
= 200k(300kHz),  
IN  
On-Time Accuracy (Note 2)  
t
%
ON  
333ns nominal  
CSL  
R
TON  
= 303.25kꢀ  
(200kHz), 500ns nominal  
2
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
ELECTRICAL CHARACTERISTICS (continued)  
(V = 12V, V  
IN  
= V  
= V  
= V  
= 5V, V  
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.  
CSL A  
CC  
DD  
SHDN  
REFIN  
Typical values are at T = +25°C.) (Note 1)  
A
PARAMETER  
Minimum Off-Time  
SYMBOL  
CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
t
(Note 2)  
FB forced above 1.0V, STDBY = AGND or  
= +25°C  
250  
350  
ns  
OFF(MIN)  
Quiescent Supply Current (V  
)
I
0.01  
2
1.00  
4
μA  
mA  
μA  
μA  
μA  
DD  
DD  
CC  
V
T
A
CC,  
FB forced above 1.0V (PWM, VTT, and  
VTTR blocks); STDBY = V  
CC  
Quiescent Supply Current (V  
Shutdown Supply Current  
)
CC  
I
FB forced above 1.0V (PWM and VTTR  
blocks); STDBY = AGND  
900  
0.01  
0.01  
1500  
5
I
I
SHDN = AGND, T = +25°C  
A
CC + DD  
(V + V  
)
CC  
DD  
SHDN = AGND, V = 26V, V = 0 or 5V,  
IN  
DD  
TON Shutdown Current  
I
1.00  
TON  
T
A
= +25°C  
LINEAR REGULATOR (VTT)  
VTTI Input Voltage Range  
VTTI Supply Current  
V
1.0  
2.8  
50  
V
TTI  
I
VTTI = 2.8V, REFIN = 1.4V, no load  
SHDN = AGND, T = +25°C  
10  
μA  
μA  
nA  
V
VTTI  
VTTI Shutdown Current  
REFIN Input Bias Current  
REFIN Range  
10  
A
VTTI = 2.8V, REFIN = 1.4V, T = +25°C  
A
-50  
0.5  
+50  
1.5  
V
REFIN  
V
0.3  
-
CC  
REFIN Disable Threshold  
V
High-side on-resistance  
0.12  
0.18  
0.25  
0.36  
+5  
(source, I  
= 0.1A)  
VTT Internal MOSFET  
VTT  
Low-side on-resistance (sink, I  
= 0.1A)  
VTT  
V
= 1V,  
= +50μA  
REFIN  
-5  
-5  
(V  
(V  
- 5mV) or  
/2 - 5mV) to  
REFIN  
I
VTT  
VTT Output-Accuracy  
Source Load  
mV  
mV  
CSL  
V
= 0.5V to 1.5V,  
= 1V,  
REFIN  
VTTS, VTT = VTTS  
-5  
I
= +300mA  
VTT  
V
REFIN  
+5  
17  
(V  
(V  
+ 5mV) or  
/2 + 5mV) to  
REFIN  
I
= -50μA  
VTT  
VTT Output-Accuracy  
Sink Load  
CSL  
V
= 0.5V to 1.5V,  
= -300mA  
REFIN  
VTTS, VTT = VTTS  
+5  
I
VTT  
VTT Load Regulation  
VTT Line Regulation  
-50μA to -1A I  
+50μA to +1A  
13  
1
mV/A  
mV  
VTT  
1.0V V 2.8V, I  
= 100mA  
TTI  
VTT  
Source  
Sink  
2
4
VTT Current Limit  
A
-4  
-2  
VTT Current-Limit Soft-Start Time  
VTT Discharge MOSFET  
VTTS Input Current  
With respect to internal VTT_EN signal  
OVP = V  
160  
16  
μs  
CC  
T
A
= +25°C  
0.1  
1.0  
μA  
Maxim Integrated  
3
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
ELECTRICAL CHARACTERISTICS (continued)  
(V = 12V, V  
IN  
= V  
= V  
= V  
= 5V, V  
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.  
CSL A  
CC  
DD  
SHDN  
REFIN  
Typical values are at T = +25°C.) (Note 1)  
A
PARAMETER  
SYMBOL  
CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
REFERENCE BUFFER (VTTR)  
I
I
I
I
=
=
=
=
1mA  
3mA  
1mA  
3mA  
-10  
-20  
-10  
-20  
+10  
+20  
+10  
+20  
VTT  
VTT  
VTT  
VTT  
VTTR Output Accuracy (Adj)  
VTTR Output Accuracy (Preset)  
REFIN to VTTR  
mV  
mA  
V
CSL  
/2 to VTTR  
VTTR Maximum  
Recommended Current  
Source/sink  
5
FAULT DETECTION (SMPS)  
SMPS OVP and PGOOD1  
Upper Trip Threshold  
12  
15  
10  
18  
%
SMPS OVP and PGOOD1  
Upper Trip Threshold  
Fault-Propagation Delay  
t
FB forced 25mV above trip threshold  
Measured at FB, hysteresis = 25mV  
μs  
OVP  
SMPS Output Undervoltage  
Fault-Propagation Delay  
t
200  
-15  
10  
μs  
%
UVP  
SMPS PGOOD1 Lower Trip  
Threshold  
-12  
-18  
PGOOD1 Lower Trip Threshold  
Propagation Delay  
FB forced 50mV below PGOOD1 trip  
threshold  
t
I
μs  
V
PGOOD1  
PGOOD1  
PGOOD1 Output Low Voltage  
I
= 3mA  
0.4  
1
SINK  
FB = 1V (PGOOD1 high impedance),  
PGOOD1 forced to 5V, T = +25°C  
A
PGOOD1 Leakage Current  
μA  
Rising edge, PWM disabled below this level;  
hysteresis = 200mV  
TON POR Threshold  
V
3.0  
V
POR(IN)  
PGOOD2  
PGOOD2  
FAULT DETECTION (VTT)  
PGOOD2 Upper Trip Threshold  
PGOOD2 Lower Trip Threshold  
Hysteresis = 25mV  
Hysteresis = 25mV  
8
10  
13  
-8  
%
%
-13  
-10  
VTTS forced 50mV beyond PGOOD2  
trip threshold  
PGOOD2 Propagation Delay  
t
I
10  
5
μs  
VTTS forced 50mV beyond PGOOD2  
trip threshold  
PGOOD2 Fault Latch Delay  
PGOOD2 Output Low Voltage  
PGOOD2 Leakage Current  
ms  
V
I
= 3mA  
0.4  
1
SINK  
VTTS = V  
(PGOOD2 high impedance),  
REFIN  
μA  
PGOOD2 forced to 5V, T = +25°C  
A
FAULT DETECTION  
Thermal-Shutdown Threshold  
T
Hysteresis = 15°C  
160  
4.1  
16  
°C  
V
SHDN  
V
CC  
Undervoltage Lockout  
Rising edge, IC disabled below this level  
hysteresis = 200mV  
V
3.8  
4.4  
UVLO(VCC)  
Threshold  
CSL Discharge MOSFET  
OVP = V  
CC  
4
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
ELECTRICAL CHARACTERISTICS (continued)  
(V = 12V, V  
IN  
= V  
= V  
= V  
= 5V, V  
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.  
CSL A  
CC  
DD  
SHDN  
REFIN  
Typical values are at T = +25°C.) (Note 1)  
A
PARAMETER  
CURRENT LIMIT  
SYMBOL  
CONDITIONS  
MIN  
TYP  
MAX  
UNITS  
Valley Current-Limit Threshold  
V
V
V
- V  
- V  
17  
20  
25  
mV  
mV  
LIMIT  
CSH  
CSL  
Current-Limit Threshold  
(Negative)  
V
, SKIP = V  
-23  
NEG  
CSH  
CSL  
CC  
Current-Limit Threshold  
(Zero Crossing)  
V
V
- V  
LX  
1
mV  
ZX  
PGND1  
SMPS GATE DRIVERS  
DH Gate-Driver On-Resistance  
R
BST - LX forced to 5V  
DL high  
1.5  
1.5  
0.6  
5.0  
5.0  
3.0  
DH  
DL Gate-Driver On-Resistance  
R
DL  
DL low  
DH Gate-Driver Source/  
Sink Current  
I
DH forced to 2.5V, BST - LX forced to 5V  
1
A
A
DH  
I
I
DL forced to 2.5V  
DL forced to 2.5V  
1
3
DL Gate-Driver Source/  
Sink Current  
DL(SRC)  
DL(SNK)  
DL rising, T = +25°C  
10  
15  
25  
35  
A
Dead Time  
t
ns  
DEAD  
DL falling, T = +25°C  
A
Internal BST Switch  
On-Resistance  
I
= 10mA,  
BST  
R
4.5  
BST  
V
DD  
= 5V internal design target  
V
= V = 26V, SHDN = AGND,  
= +25°C  
BST  
LX  
LX, BST Leakage Current  
INPUTS AND OUTPUTS  
Logic-Input Threshold  
0.001  
20  
μA  
T
A
SHDN, STDBY, SKIP, OVP, rising edge  
hysteresis = 300mV/600mV (min/max)  
1.30  
1.65  
55  
2.00  
+1  
V
SHDN, STDBY, SKIP = 0 or V  
,
CC  
Logic-Input Current  
-1  
-1  
μA  
T
A
= +25°C  
Input Leakage Current  
Input Bias Current  
CSH = 0 or V , T = +25°C  
+1  
μA  
μA  
CC  
A
CSL = 0 or V  
100  
CC  
Maxim Integrated  
5
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
ELECTRICAL CHARACTERISTICS  
(V = 12V, V = V = V  
= V  
= 5V, V  
= 1.8V, STDBY = SKIP = AGND, T = -40°C to +85°C, unless otherwise noted.)  
CSL A  
IN  
CC  
DD  
SHDN  
REFIN  
(Note 1)  
PARAMETER  
SYMBOL  
CONDITIONS  
MIN  
MAX  
UNITS  
PWM CONTROLLER  
V
3
26  
IN  
Input Voltage Range  
V
V
V
, V  
CC DD  
4.5  
5.5  
FB = AGND  
FB = V  
1.485  
1.782  
0.990  
1.520  
1.820  
1.020  
V
= 4.5V to 26V,  
IN  
Output-Voltage Accuracy  
V
CSL  
CC  
SKIP = V  
CC  
FB = Adj  
= 96.75kꢀ  
R
TON  
(600kHz), 167ns  
nominal  
-15  
-10  
-15  
+15  
+10  
+15  
R
TON  
= 200kꢀ  
V
V
= 12V,  
IN  
On-Time Accuracy (Note 2)  
t
%
(300kHz), 333ns  
nominal  
ON  
= 1.2V  
CSL  
R
TON  
= 303.25kꢀ  
(200kHz), 500ns  
nominal  
Minimum Off-Time  
t
(Note 2)  
FB forced above 1.0V (PWM, VTT, and  
VTTR blocks); STDBY = V  
350  
4
ns  
OFF(MIN)  
mA  
CC  
Quiescent Supply Current (V  
)
CC  
I
CC  
FB forced above 1.0V (PWM and VTTR  
blocks); STDBY = AGND  
1500  
μA  
LINEAR REGULATOR (VTT)  
VTTI Input Voltage Range  
VTTI Supply Current  
V
1.0  
0.5  
2.8  
50  
V
μA  
V
VTTI  
I
VTTI = 2.8V, REFIN = 1.4V, no load  
VTTI  
REFIN Range  
V
1.5  
REFIN  
V
0.3  
-
CC  
REFIN Disable Threshold  
V
High-side on-resistance (source, I  
= 0.1A)  
0.25  
0.36  
17  
VTT  
VTT Internal MOSFET  
VTT Load Regulation  
Low-side on-resistance (sink, I  
= 0.1A)  
VTT  
-50μA to -1A I  
+50μA to +1A  
mV/A  
VTT  
6
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
ELECTRICAL CHARACTERISTICS (continued)  
(V = 12V, V = V = V  
= V  
= 5V, V  
= 1.8V, STDBY = SKIP = AGND, T = -40°C to +85°C, unless otherwise noted.)  
CSL A  
IN  
CC  
DD  
SHDN  
REFIN  
(Note 1)  
PARAMETER  
SYMBOL  
CONDITIONS  
MIN  
MAX  
UNITS  
REFERENCE BUFFER (VTTR)  
I
I
I
I
=
=
=
=
1mA  
3mA  
1mA  
3mA  
-10  
-20  
-10  
-20  
+10  
+20  
+10  
+20  
VTT  
VTT  
VTT  
VTT  
VTTR Output Accuracy (Adj)  
REFIN to VTTR  
mV  
mV  
VTTR Output Accuracy (Preset)  
V
CSL  
/2 to VTTR  
FAULT DETECTION (SMPS)  
PGOOD1 Output Low Voltage  
FAULT DETECTION (VTT)  
PGOOD2 Output Low Voltage  
FAULT DETECTION  
I
I
= 3mA  
= 3mA  
0.4  
0.4  
V
V
SINK  
SINK  
V
Undervoltage-Lockout  
Rising edge, IC disabled below this level;  
hysteresis = 200mV  
CC  
V
4.0  
15  
4.4  
25  
V
UVLO(VCC)  
Threshold  
CURRENT LIMIT  
Valley Current-Limit Threshold  
SMPS GATE DRIVERS  
DH Gate-Driver On-Resistance  
V
LIMIT  
V
CSH  
- V  
CSL  
mV  
R
DH  
BST - LX forced to 5V  
DL high  
5
5
3
DL Gate-Driver On-Resistance  
R
DL  
DL low  
DL rising  
10  
15  
Dead Time  
t
ns  
DEAD  
DL falling  
INPUTS AND OUTPUTS  
Logic-Input Threshold  
SHDN, STDBY, SKIP OVP, rising edge  
hysteresis = 300mV/600mV (min/max)  
1.3  
2
V
Note 1: Limits are 100% production tested at T = +25°C. Maximum and minimum limits over temperature are guaranteed by design  
A
and characterization.  
Note 2: On-time and off-time specifications are measured from 50% point at the DH pin with LX = GND, V  
= 5V, and a 250pF  
BST  
capacitor connected from DH to LX. Actual in-circuit times might differ due to MOSFET switching speeds.  
Maxim Integrated  
7
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Typical Operating Characteristics  
(MAX17000A Circuit of Figure 1, V = 12V, V  
IN  
= V  
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)  
DD  
CC  
A
SMPS 1.5V EFFICIENCY  
vs. LOAD CURRENT  
SMPS 1.5V EFFICIENCY  
vs. LOAD CURRENT  
SMPS 1.5V EFFICIENCY  
vs. LOAD CURRENT  
100  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
SKIP MODE  
STDBY = LOW  
SKIP MODE  
STDBY = LOW  
SKIP MODE  
STDBY = LOW  
90  
80  
70  
SKIP MODE  
SKIP MODE  
STDBY = HIGH  
60  
50  
40  
30  
20  
10  
STDBY = HIGH  
PWM MODE  
PWM MODE  
STDBY = HIGH OR LOW  
STDBY = HIGH OR LOW  
SKIP MODE  
STDBY = HIGH  
PWM MODE  
STDBY = HIGH OR LOW  
V
IN  
= 7V  
V
IN  
= 12V  
V = 20V  
IN  
0.01  
0.1  
1
10  
0.01  
0.1  
1
10  
0.01  
0.1  
1
10  
LOAD CURRENT (A)  
LOAD CURRENT (A)  
LOAD CURRENT (A)  
SMPS 1.5V OUTPUT VOLTAGE  
vs. LOAD CURRENT  
SMPS SWITCHING FREQUENCY  
vs. LOAD CURRENT  
SMPS VALLEY-CURRENT LIMIT  
vs. INPUT VOLTAGE  
1.51  
1.50  
1.49  
350  
300  
250  
10.50  
10.25  
10.00  
PWM MODE  
R
= 2mΩ  
SENSE  
SKIP MODE  
PWM MODE  
200  
150  
100  
50  
SKIP MODE  
9.75  
9.50  
V
V
= 12V  
IN  
= 1.5V  
V
IN  
= 12V  
OUT  
0
0.001  
0.01  
0.1  
1
10  
0
2
4
6
8
10  
4
8
12  
16  
20  
24  
28  
LOAD CURRENT (A)  
LOAD CURRENT (A)  
INPUT VOLTAGE (V)  
NO-LOAD SUPPLY CURRENT  
vs. INPUT VOLTAGE  
PRESET 1.5V OUTPUT  
VOLTAGE DISTRIBUTION  
100  
10  
50  
SAMPLE SIZE = 150  
T
A
T
A
= +85°C  
NO LOAD  
= +25°C  
PWM MODE, I + I  
CC DD  
40  
30  
20  
10  
PWM MODE, I  
IN  
STDBY = HIGH, SKIP MODE, I + I  
CC DD  
1
0.1  
STDBY = LOW, SKIP MODE, I + I  
CC DD  
SKIP MODE, I  
IN  
0.01  
0
4
8
12  
16  
20  
24  
28  
1.490  
1.495  
1.500  
1.505  
1.510  
INPUT VOLTAGE (V)  
OUTPUT VOLTAGE (V)  
8
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Typical Operating Characteristics (continued)  
(MAX17000A Circuit of Figure 1, V = 12V, V  
IN  
= V  
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)  
DD  
CC  
A
STARTUP WAVEFORM  
SHUTDOWN WAVEFORM  
STANDBY TRANSITION WAVEFORM  
(HEAVY LOAD)  
(DISCHARGE MODE ENABLED)  
MAX17000A toc11  
MAX17000A toc09  
MAX17000A toc10  
I
= 50mA  
VTT  
STDBY  
DL  
SHDN  
VDDQ  
VDDQ  
VTT  
VDDQ  
VTTR  
TON  
DL  
VTT  
PGOOD2  
PGOOD1  
VTT  
VTTR  
PGOOD1  
LX  
SHDN  
I
LX  
I
LX  
I
LX  
DL  
100μs/div  
200μs/div  
PGOOD1: 2V/div  
400μs/div  
STDBY: 5V/div  
VDDQ: 1V/div  
VTT: 1V/div  
TON: 1V/div  
DL: 5V/div  
LX: 10V/div  
SHDN: 5V/div  
R
= 0.25Ω  
DL: 5V/div  
PGOOD2: 5V/div  
PGOOD1: 5V/div  
SHDN: 10V/div  
LOAD  
VDDQ: 500mV/div  
VTT: 500mV/div  
VTTR: 500mV/div  
I
: 5A/div  
SKIP = GND  
VDDQ: 2V/div  
VTT: 1V/div  
VTTR: 1V/div  
LX  
DL: 5V/div  
I
: 2A/div  
I
LX  
: 2A/div  
LX  
SMPS LOAD-TRANSIENT RESPONSE  
SMPS LOAD-TRANSIENT RESPONSE  
STANDBY TRANSITION WAVEFORM  
(PWM MODE)  
(SKIP MODE)  
MAX17000A toc12  
MAX17000A toc13  
MAX17000A toc14  
STDBY  
VDDQ  
VDDQ  
LX  
VDDQ  
LX  
VTT  
TON  
DL  
LX  
I
I
LOAD  
LOAD  
I
LX  
I
LX  
I
LX  
10μs/div  
20μs/div  
20μs/div  
STDBY: 5V/div  
VDDQ: 1V/div  
VTT: 1V/div  
DL: 5V/div  
LX: 10V/div  
VDDQ: 50mV/div  
LX: 10V/div  
I
I
: 5A/div  
: 5A/div  
VDDQ: 50mV/div  
LX: 10V/div  
I : 5A/div  
LOAD  
LOAD  
LX  
I
LX  
: 5A/div  
I : 2A/div  
LX  
TON: 1V/div  
Maxim Integrated  
9
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Typical Operating Characteristics (continued)  
(MAX17000A Circuit of Figure 1, V = 12V, V  
IN  
= V  
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)  
DD  
CC A  
VTT VOLTAGE  
vs. SOURCE/SINK LOAD CURRENT  
VTT OFFSET VOLTAGE DISTRIBUTION  
AT 300mA LOAD  
OUTPUT OVERLOAD WAVEFORM  
MAX17000A toc15  
0.79  
50  
SAMPLE SIZE = 150  
T
A
T
A
= +85°C  
= +25°C  
DL  
0.78  
0.77  
0.76  
0.75  
40  
30  
20  
10  
VDDQ  
VTT  
VTTR  
PGOOD2  
PGOOD1  
0.74  
0.73  
0.72  
I
LX  
V
= 1.5V  
TTI  
0
400μs/div  
-2.0 -1.5 -1.0 -0.5  
0
0.5 1.0 1.5 2.0  
-15.0  
-12.5  
-10.0  
-7.5  
-5.0  
DL: 5V/div  
PGOOD2: 2V/div  
PGOOD1: 2V/div  
LOAD CURRENT (A)  
OFFSET VOLTAGE (mV)  
VDDQ: 1V/div  
VTT: 1V/div  
VTTR: 1V/div  
I
LX  
: 10A/div  
VTT OVERLOAD FAULT WAVEFORMS  
VTT SOURCE CURRENT LIMIT  
VTT SINK CURRENT LIMIT  
(5ms TIMER)  
MAX17000A toc20  
50  
50  
SAMPLE SIZE = 150  
T
A
T
A
= +85°C  
= +25°C  
SAMPLE SIZE = 150  
T
A
T
A
= +85°C  
DL  
= +25°C  
40  
30  
20  
10  
40  
30  
20  
10  
I
LX  
VDDQ  
VTT  
VTTR  
PGOOD1  
PGOOD2  
0
0
2.0  
2.5  
3.0  
3.5  
4.0  
-4.0  
-3.5  
-3.0  
-2.5  
-2.0  
1ms/div  
DL: 5V/div  
: 2A/div  
VDDQ: 2V/div  
VTT: 1V/div  
VTTR: 1V/div  
PGOOD1: 2V/div  
PGOOD2: 2V/div  
CURRENT LIMIT (A)  
CURRENT LIMIT (A)  
I
LX  
10  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Typical Operating Characteristics (continued)  
(MAX17000A Circuit of Figure 1, V = 12V, V  
= V  
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)  
IN  
DD  
CC  
A
VTT LOAD-TRANSIENT RESPONSE (SOURCE)  
BETWEEN 10mA AND 1.5A  
VTT LOAD-TRANSIENT RESPONSE  
I
(SINK)  
VTT  
MAX17000A toc21  
MAX17000A toc22  
I
VTT  
I
VTT  
VTT_ac  
VTT_ac  
VDDQ = 1.5V  
VDDQ = 1.5V  
20μs/div  
20μs/div  
I
: 1A/div  
I
: 1A/div  
VTT  
VTT  
VTT: 20mV/div  
VTT: 20mV/div  
VTT LOAD-TRANSIENT RESPONSE  
(SOURCE-SINK)  
VTTR OUTPUT VOLTAGE  
vs. LOAD CURRENT  
MAX17000A toc23  
0.79  
0.78  
0.77  
0.76  
I
VTT  
0.75  
0.74  
0.73  
VTT_ac  
0.72  
0.71  
0.70  
VDDQ = 1.5V  
20μs/div  
-6  
-4  
-2  
0
2
4
6
I
: 1A/div  
VTT  
LOAD CURRENT (mA)  
VTT: 50mV/div  
Maxim Integrated  
11  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Pin Description  
PIN  
NAME  
FUNCTION  
OVP Mode Control. This input selectively enables/disables the SMPS OV protection feature and  
output discharge mode. When enabled, the SMPS OV protection feature is enabled. Connect OVP to  
the following voltage levels for the desired function:  
1
OVP  
High (> 2.4V) = Enable SMPS OV protection, and SMPS and VTT discharge FETs.  
Low (GND) = Disable SMPS OV protection, and SMPS and VTT discharge FETs.  
Open-Drain Power-Good Output. PGOOD1 is low when the SMPS output voltage is more than 15%  
(typ) beyond the normal regulation point, in standby, in shutdown, and during soft-start.  
After the soft-start circuit has terminated, PGOOD1 becomes high impedance if the SMPS output is  
in regulation.  
2
3
PGOOD1  
PGOOD2  
Open-Drain Power-Good Output. PGOOD2 is low when the VTT output voltage is more than 10% (typ)  
beyond the normal regulation point, in standby, in shutdown, and during soft-start.  
After the SMPS soft-start circuit has terminated, PGOOD2 becomes high impedance if the VTT output  
is in regulation.  
Standby Control Input. When SHDN is high and STDBY is low, the MAX17000A turns off the VTT output  
(high-Z). When STDBY is high, normal SMPS operation resumes and the VTT output is enabled.  
4
5
STDBY  
Sense Pin for Termination Supply Output. Normally connected to the VTT pin to allow accurate  
VTTS  
regulation to V  
/2 or the REFIN voltage.  
CSL  
Termination Reference Buffer Output. VTTR tracks V  
/2 when REFIN is connected to V . VTTR  
CC  
CSL  
6
VTTR  
tracks V  
when a voltage between 0.5V to 1.5V is set at REFIN. Decouple VTTR to AGND with a  
REFIN  
0.33μF ceramic capacitor.  
7
8
PGND2  
VTT  
Power Ground for VTT. Connect PGND2 externally to the underside of the exposed pad.  
Termination Power-Supply Output. Connect VTT to VTTS to regulate the VTT voltage to the VTTS  
regulation setting.  
Termination Power-Supply Input. VTTI is the input power supply to the VTT linear regulator. Normally  
connected to the output of the SMPS regulator for DDR applications.  
9
VTTI  
External Reference Input. REFIN sets the feedback regulation voltage (VTTR = VTTS = V  
MAX17000A.  
) of the  
REFIN  
10  
REFIN  
Connect REFIN to V to use the internal V  
/2 divider.  
CC  
CSL  
Connect a 0.5V to 1.5V voltage input to set the adjustable output for VTT, VTTS, and VTTR.  
Feedback Input for SMPS Output. Connect to V for a fixed +1.8V output or to AGND for a fixed  
CC  
+1.5V output. For an adjustable output (1.0V to 2.7V), connect FB to a resistive divider from the  
output voltage. FB regulates to +1.0V.  
11  
12  
13  
FB  
Negative Input of the PWM Output Current-Sense and Supply Input for VTTR. Connect CSL to the  
negative side of the output current-sensing resistor or the filtering capacitor if the DC resistance of  
the output inductor is utilized for current sensing.  
CSL  
CSH  
CSL is also the path for the internal 16discharge MOSFET when V UVLO occurs with OVP enabled.  
CC  
Positive Input of the PWM Output Current Sense. Connect CSH to the positive side of the output  
current-sensing resistor or the filtering capacitor if the DC resistance of the output inductor is  
utilized for current sensing.  
12  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Pin Description (continued)  
PIN  
NAME  
FUNCTION  
Switching Frequency Setting Input. An external resistor between the input power source and this  
pin sets the switching frequency per phase according to the following equation:  
T
= C  
TON  
x (R  
+ 6.5k)  
SW  
TON  
TON  
14  
TON  
where C  
= 16.26pF.  
TON is high impedance in shutdown.  
15  
16  
DH  
LX  
High-Side Gate-Driver Output. Swings from LX to BST. DH is low when in shutdown or UVLO.  
Inductor Connection. Connect LX to the switched side of the inductor as shown in Figure 1.  
Boost Flying Capacitor Connection. Connect to an external 0.1μF, 6V capacitor as shown in Figure  
1. The MAX17000A contains an internal boost switch.  
17  
18  
BST  
DL  
Synchronous-Rectifier Gate-Driver Output. DL swings from V  
to PGND1.  
DD  
Supply Voltage Input for the DL Gate Driver and 3.3V Reference/Analog Supply. Connect to the  
system supply voltage (+4.5V to +5.5V). Bypass V to power ground with a 1μF or greater  
DD  
19  
V
DD  
ceramic capacitor.  
20  
21  
PGND1  
AGND  
Power Ground. Ground connection for the low-side MOSFET gate driver.  
Analog Ground. Connect backside exposed pad to AGND.  
Pulse-Skipping Control Input. This input determines the mode of operation under normal steady-  
state conditions and dynamic output-voltage transitions:  
High (> 2.4V) = Forced-PWM operation  
22  
23  
SKIP  
Low (AGND) = Pulse-skipping mode  
Controller Supply Voltage. Connect to a 4.5V to 5.5V source. Bypass V to AGND with a 1μF or  
CC  
greater ceramic capacitor.  
V
CC  
Shutdown Control Input. Connect to V for normal operation. When SHDN is pulled low, the  
CC  
MAX17000A slowly ramps down the output voltage to ground. When the internal target voltage  
reaches 25mV, the controller forces DL low, and enters the low current (1μA) shutdown state.  
When discharge mode is enabled by OVP (OVP = high), the CSL and VTT internal 16discharge  
MOSFETs are enabled in shutdown. When discharge mode is disabled by OVP (OVP = low), LX,  
VTT, and VTTR are high impedance in shutdown.  
24  
SHDN  
A rising edge on SHDN clears the fault OV protection latch.  
Exposed Pad. Connect backside exposed pad to AGND.  
EP  
Maxim Integrated  
13  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
DDR2, or DDR3 in a notebook computer. See Table 1 for  
component selections. Table 2 lists the component man-  
ufacturers. Table 3 is the operating mode truth table.  
Standard Application Circuits  
The MAX17000A standard application circuit (Figure 1)  
generates the VDDQ, VTT, and VTTR rails for DDR,  
Table 1. Component Selection for Standard Applications  
V
= 1.5V TO 1.8V AT 10A  
V
= 1.5V TO 1.8V AT 6A  
OUT  
OUT  
COMPONENT  
V
= 7V TO 20V (±00kHz)  
V
= 7V TO 16V (500kHz)  
IN  
IN  
(2x) 10μF, 25V  
Taiyo Yuden TMK432BJ106KM  
10μF, 25V  
Taiyo Yuden TMK432BJ106KM  
Input Capacitor  
(2x) 330μF, 2.5V ,12mΩ (C2 case)  
SANYO 2R5TPE330MCC2  
(2x) 220μF, 2.5V, 21mΩ (B2 case)  
SANYO 2R5TPE220MLB  
Output Capacitor  
Inductor  
1.4μH, 12A, 3.4mΩ (typ)  
Sumida CDEP105(L)NP-1R4  
1.4μH, 12A, 3.4mΩ (typ)  
Sumida CDEP105(L)NP-1R4  
2mΩ, 0.5W (2010)  
Vishay WSL20102L000FEA  
3mΩ, 0.5W (2010)  
Vishay WSL20103L000FEA  
Current-Sensing Resistor  
30V, 20A n-channel MOSFET (high side)  
Fairchild FDMS8690;  
30V, 40A n-channel MOSFET (low side)  
Fairchild FDMS8660S  
30V 20A n-channel MOSFET (high side)  
Fairchild FDMS8690;  
30V 40A n-channel MOSFET (low side)  
Fairchild FDMS8660S  
MOSFETs  
Table 2. Component Suppliers  
SUPPLIER  
PHONE  
WEꢀSITE  
INDUCTORS  
Dale (Vishay)  
402-563-6866 (USA)  
510-324-4110 (USA)  
www.vishay,com  
NEC/TOKIN America, Inc.  
www.nec-tokinamerica.com  
Panasonic Corp.  
Sumida Corp.  
65-231-3226 (Singapore), 408-749-9714 (USA)  
408-982-9660 (USA)  
www.panasonic.com  
www.sumida.com  
www.tokoam.com  
TOKO America, Inc.  
CAPACITORS  
858-675-8013 (USA)  
AVX Corp.  
843-448-9411 (USA)  
www.avxcorp.com  
KEMET Corp.  
408-986-0424 (USA)  
www.kemet.com  
Panasonic Corp.  
SANYO Electric Co., Ltd.  
Taiyo Yuden  
65-231-3226 (Singapore), 408-749-9714 (USA)  
81-72-870-6310 (Japan), 619-661-6835 (USA)  
03-3667-3408 (Japan), 408-573-4150 (USA)  
847-803-6100 (USA), 81-3-5201-7241 (Japan)  
www.panasonic.com  
www.sanyodevice.com  
www.t-yuden.com  
TDK Corp.  
www.component.tdk.com  
SENSING RESISTORS  
Vishay  
402-563-6866 (USA)  
800-341-0392 (USA)  
www.vishay,com  
MOSFET  
Fairchild Semiconductor  
DIODES  
www.fairchildsemi.com  
Central Semiconductor Corp.  
Nihon Inter Electronics Corp.  
631-435-1110  
www.centralsemi.com  
www.niec.co.jp  
81-3-3343-84-3411 (Japan)  
14  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Table ±. Operating Mode Truth Table  
SHDN STDBY SKIP  
OPERATION  
SMPS output ramps up in skip mode with a 1.4ms (typ) ramp time. PGOOD1 is held low until the  
SMPS output is in regulation.  
1
2
L H L H  
X
X
VTT and VTTR ramp up to the final voltage based on V  
VTT is in regulation.  
/2 or V  
. PGOOD2 is held low until  
REFIN  
CSL  
SMPS output ramps up in skip mode with a 1.4ms ramp time. PGOOD1 is held low until the SMPS  
output is in regulation.  
VTT remains off throughout since STDBY is low. PGOOD2 stays low throughout.  
L H  
L
VTTR ramps up to the final voltage based on V  
/2 or V  
.
REFIN  
CSL  
Standby mode is exited and the full current capability of the MAX17000A is available.  
VTT ramps up after the internal SMPS block is ready. VTT ramps to the final voltage based on  
3
4
5
6
7
H
H
H
H
H
L H  
X
H
L
V
CSL  
/2 or V  
.
REFIN  
PGOOD2 goes high when VTT is in regulation.  
SMPS is in forced-PWM mode.  
VTT and VTTR are enabled.  
PGOOD1 is high when the SMPS output is in regulation.  
PGOOD2 is high when VTT is in regulation.  
H
H
L
SMPS is in skip mode.  
VTT and VTTR are enabled.  
PGOOD1 is high when the SMPS output is in regulation.  
PGOOD2 is high when VTT is in regulation.  
SMPS is in forced-PWM mode.  
VTT is off and is in high impedance.  
PGOOD2 is forced low.  
H
L
VTTR is active and regulates to V  
/2 or V  
.
CSL  
REFIN  
SMPS is in skip mode.  
VTT is off and is high impedance.  
PGOOD2 is forced low.  
L
VTTR is active and regulates to V  
/2 or V  
.
CSL  
REFIN  
Skip mode is exited as the MAX17000A ramps the output down to zero.  
VTTR tracks V /2 or V during shutdown. After the SMPS output reaches 25mV, DL goes low.  
8
9
H L  
H L  
L
H
L
X
X
X
CSL  
REFIN  
Skip mode is exited as the MAX17000A ramps the output down to zero.  
VTTR tracks V /2 or V during shutdown. After the SMPS output reaches 25mV, DL goes  
CSL  
REFIN  
low. VTT is not enabled throughout soft-shutdown.  
DL low. Internal16discharge MOSFETs on CSL and VTT enabled if OVP is high, but disabled if  
OVP is low.  
10  
X
Maxim Integrated  
15  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
R
V
C
IN  
R
=
R
DCR  
CS  
R
TON  
7V TO 20V  
R
+ R  
C
14  
EQ  
1
TON  
OVP  
+5V  
17  
15  
L1 ( 1 1 )  
+
R
=
x
DCR  
BST  
DH  
R3  
100kΩ  
R2  
100kΩ  
C
IN  
C
EQ  
R
R
EQ  
C
N
H
2
3
C
PGOOD1  
PGOOD2  
BST  
VDDQ  
+1.8V OR 1.5V  
0.1μF  
L1  
16  
LX  
R
R
EQ  
C
18  
20  
N
L
19  
C
OUT  
DL  
D1  
+5V  
V
DD  
C
VDD  
PGND1  
1μF  
PGND  
R1  
10Ω  
13  
12  
C
EQ  
CSH  
CSL  
23  
21  
V
5V V  
CC  
CC  
C
VCC  
1μF  
MAX17000A  
R
FBA  
FBB  
FB OPTIONS:  
AGND  
11  
1. CONNECT FB TO 5V FOR FIXED +1.8V.  
2. CONNECT FB TO GND FOR FIXED +1.5V.  
3. USE FB RESISTOR-DIVIDER FOR ADJUSTABLE  
OUTPUT VOLTAGES.  
FB  
AGND  
R
4
24  
22  
SLP_S3#  
ON/OFF  
STDBY  
SHDN  
SKIP  
9
7
VTTI  
+1V TO + 2.5V  
C
VTTI  
VTT  
PGND2  
C
10  
V
CC  
REFIN  
8
5
6
VTT  
VTTS  
VTTR  
VTT = VDDQ/2  
VTTR = VDDQ/2  
C
VTTR  
0.33μF  
EP  
Figure 1. MAX17000A Standard Application Circuit  
The MAX17000A includes a 2A source-sink LDO reg-  
ulator for the memory termination rail. The source-sink  
regulator features a dead band that either sources or  
sinks, ideal for the fast-changing short-period loads  
presenting in memory termination applications. This  
feature also reduces the VTT output capacitance  
requirement down to 1μF, though load-transient  
response can still require higher capacitance values  
between 10μF and 20μF.  
Detailed Description  
The MAX17000A complete DDR solution comprises a  
step-down controller, a source-sink LDO regulator, and a  
reference buffer. Maxim’s proprietary Quick-PWM pulse-  
width modulator in the MAX17000A is specifically  
designed for handling fast load steps while maintaining a  
relatively constant operating frequency and inductor  
operating point over a wide range of input voltages. The  
Quick-PWM architecture circumvents the poor load-tran-  
sient timing problems of fixed-frequency current-mode  
PWMs, while also avoiding the problems caused by  
widely varying switching frequencies in conventional con-  
stant-on-time and constant-off-time PWM schemes.  
Figure 1 is the MAX17000A standard application circuit  
and Figure 2 is the MAX17000A functional diagram.  
The reference buffer sources and sinks 3mA, generating  
a reference rail for use in the memory controller and  
memory devices.  
16  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
TON  
ON-TIME  
t
OFF(MIN)  
COMPUTE  
CSL  
Q
TRIG  
BST  
ONE-SHOT  
TON  
TRIG  
ONE-SHOT  
Q
DH  
LX  
S
R
Q
ERROR  
AMP  
V
DD  
DL  
S
R
Q
PGND1  
SKIP  
1.2V  
SMPS FAULT  
DETECTION  
SMPS  
FAULT  
OVF  
ZERO CROSSING  
INT_FB  
1mV  
SMPS  
FAULT  
LATCH  
OVP  
CSL  
CSH  
VALLEY CURRENT LIMIT  
VTT  
FAULT  
20mV  
UVF  
0.7V  
10ms  
TIMER  
SMPS RUN  
EA  
SHDN  
RUN  
SOFT-START/  
SOFT-STOP  
1V REF  
FB  
DECODE  
INT_FB  
FB  
POWER-GOOD1  
PGOOD1  
V
CC  
OVF  
1.15V  
VTTR WINDOW  
COMPARATOR  
VTTR  
INT_REF  
VTT FAULT  
MAX17000A  
AGND  
POWER-GOOD2  
PGOOD2  
VTT WINDOW  
COMPARATOR  
VTTS  
VTTI  
1.4ms  
VTTI  
VTT  
VTT POS  
CURRENT LIMIT  
V
V
DD  
5ms  
TIMER  
VTT  
FAULT  
VTT SS  
CURRENT LIMIT  
SMPS  
FAULT  
VTT  
5mV  
5mV  
VTT_EN  
VTT  
VTT NEG  
CURRENT LIMIT  
STDBY  
REFIN  
DD  
PGND2  
V
- 0.3V  
DD  
PGND2  
VTTR  
VTT_EN  
PGND2  
CSL  
R
CSL  
VTT  
CSL  
V
CC  
R
16Ω  
UVLO  
16Ω  
RUN  
OVP  
PGND2  
PGND1  
Figure 2. MAX17000A Functional Diagram  
Maxim Integrated  
17  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
+5V Bias Supply (V , V  
)
DD  
CC  
C
× (R  
+ 6.5kΩ)× (V  
+ 0.075V)  
TON  
TON  
CSL  
The MAX17000A requires an external 5V bias supply in  
addition to the battery. Typically, this 5V bias supply is  
the notebook’s 95% efficient 5V system supply.  
Keeping the bias supply external to the IC improves  
efficiency and eliminates the cost associated with the  
5V linear regulator that would otherwise be needed to  
supply the PWM circuit and gate drivers. If stand-alone  
capability is needed, the 5V supply can be generated  
with an external linear regulator such as the MAX1615.  
t
=
ON  
V
IN  
1
f
=
SW  
C
× (R  
+ 6.5kΩ)  
TON  
TON  
where C  
= 16.26pF, and 0.075V is an approxima-  
TON  
tion to accommodate for the expected drop across the  
low-side MOSFET switch. This algorithm results in a  
nearly constant switching frequency despite the lack of  
a fixed-frequency clock generator.  
The 5V bias supply powers both the PWM controller  
and internal gate-drive power, so the maximum current  
drawn is:  
For loads above the critical conduction point, where the  
dead-time effect is no longer a factor, the actual switch-  
ing frequency is:  
I
= I + f  
Q
= 2mA to 20mA (typ)  
BIAS  
Q
SW G(MOSFETs)  
where I is the current for the PWM control circuit, f  
Q
SW  
is the switching frequency, and Q  
total gate-charge specification limits at V  
internal MOSFETs.  
is the  
G(MOSFETs)  
V
+ V  
DIS  
OUT  
f
=
= 5V for the  
SW  
GS  
t
× (V V  
+ V  
)
ON  
IN  
CHG  
DIS  
Free-Running Constant-On-Time PWM  
Controller with Input Feed-Forward  
where V  
is the sum of the parasitic voltage drops in  
DIS  
the inductor discharge path, including synchronous  
rectifier, inductor, and PCB resistances; V is the  
The Quick-PWM control architecture is a pseudo-fixed-  
frequency, constant on-time, current-mode regulator  
with voltage feed-forward. This architecture utilizes the  
output filter capacitor’s ESR to act as a current-sense  
resistor, so the output ripple voltage can provide the  
PWM ramp signal. In addition to the general Quick-  
PWM, the MAX17000A also senses the inductor current  
through DCR method or with a sensing resistor.  
Therefore, it is less dependent on the output capacitor  
ESR for stability. The control algorithm is simple: the  
high-side switch on-time is determined solely by a one-  
shot whose pulse width is inversely proportional to input  
voltage and directly proportional to output voltage.  
Another one-shot sets a minimum off-time (250ns typ).  
The on-time one-shot is triggered if the error compara-  
tor is low, the low-side switch current is below the valley  
current-limit threshold, and the minimum off-time one-  
shot has timed out.  
CHG  
sum of the parasitic voltage drops in the charging path,  
including the high-side switch, inductor, and PCB resis-  
tances; and t  
MAX17000A.  
is the on-time calculated by the  
ON  
Automatic Pulse-Skipping Mode  
(SKIP = AGND)  
In skip mode (SKIP = AGND), an inherent automatic  
switchover to PFM takes place at light loads. This  
switchover is affected by a comparator that truncates  
the low-side switch on-time at the inductor current’s  
zero crossing.  
DC output-accuracy specifications refer to the thresh-  
old of the error comparator. When the inductor is in  
continuous conduction, the MAX17000A regulates the  
valley of the output ripple, so the actual DC output volt-  
age is higher than the trip level by 50% of the output  
ripple voltage. In discontinuous conduction (SKIP =  
On-Time One-Shot  
The heart of the PWM core is the one-shot that sets the  
high-side switch on-time. This fast, low-jitter, adjustable  
one-shot includes circuitry that varies the on-time in  
response to battery and output voltages. The high-side  
switch on-time is inversely proportional to the battery  
AGND and I  
< I  
), the output voltage has  
LOAD(SKIP)  
OUT  
a DC regulation level higher than the error-comparator  
threshold by approximately 1.5% due to slope compen-  
sation. However, the internal integrator corrects for  
most of it, resulting in very little load regulation.  
The MAX17000A always uses skip mode during start-  
up, regardless of the SKIP and STDBY setting. The  
SKIP and STDBY controls take effect after soft-start is  
done. See Figure 3.  
voltage as measured by the V input, and proportional  
IN  
to the output voltage.  
An external resistor between the input power source  
and TON pin sets the switching frequency per phase  
according to the following equation:  
18  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
reverses at light loads while DH maintains a duty factor  
of V /V . The benefit of forced-PWM mode is to keep  
OUT IN  
a fairly constant switching frequency. However, forced-  
PWM operation comes at a cost: the no-load 5V bias  
current remains between 2mA to 20mA, depending on  
the switching frequency.  
ΔI  
Δt  
V
- V  
IN OUT  
=
L
STDBY = AGND overrides the SKIP pin setting, forcing  
the MAX17000A into standby.  
I
PEAK  
The MAX17000A switches to forced-PWM mode during  
shutdown, regardless of the state of SKIP and STDBY  
levels.  
I
= I  
/2  
LOAD PEAK  
Standby Mode (STDBY)  
It should be noted that standby mode in the  
MAX17000A corresponds to computer system standby  
operation, and is not referring to the MAX17000A shut-  
down status.  
0
ON-TIME  
TIME  
Figure 3. Pulse-Skipping/Discontinuous Crossover Point  
When standby mode is enabled (STDBY = AGND),  
VTT is disabled (high impedance) but VTTR remains  
active.  
Forced-PWM Mode (SKIP = V  
)
CC  
The low-noise forced-PWM mode (SKIP = V ) disables  
CC  
When standby mode is disabled (STDBY = V ), the  
CC  
the zero-crossing comparator, which controls the low-  
side switch on-time. This forces the low-side gate-drive  
waveform to constantly be the complement of the high-  
side gate-drive waveform, so the inductor current  
VTT block is enabled and the VTT output capacitor is  
charged. The VTT soft-start current limit increases lin-  
early from zero to its maximum current limit in 160μs  
(typ), keeping the input VTTI inrush low. See Figure 4.  
STDBY  
SMPS OUTPUT  
VTTR OUTPUT  
VTT HIGH-IMPEDANCE  
VTT OUTPUT  
VTT CURRENT LIMIT  
160μs  
PGOOD1  
PGOOD2  
STANDBY TIMING  
Figure 4. MAX17000A Standby Mode Timing  
Maxim Integrated  
19  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
PGOOD2 is the open-drain output for a window com-  
Valley Current-Limit Protection  
The MAX17000A uses the same valley current-limit pro-  
tection employed on all Maxim Quick-PWM controllers. If  
the current exceeds the valley current-limit threshold,  
the PWM controller is not allowed to initiate a new cycle.  
The actual peak current is greater than the valley cur-  
rent-limit threshold by an amount equal to the inductor  
ripple current. Therefore, the exact current-limit charac-  
teristic and maximum load capability are a function of  
the inductor value and battery voltage. When combined  
with the undervoltage-protection circuit, this current-limit  
method is effective in almost every circumstance.  
parator that continuously monitors the VTT output.  
PGOOD2 is actively held low in standby, shutdown,  
and during soft-start. PGOOD2 becomes high imped-  
ance as long as the VTT output voltage is within 10%  
of the regulation voltage. When the VTT output exceeds  
the 10% threshold, the MAX17000A pulls PGOOD2  
low. If PGOOD2 remains low for 5ms (typ), the  
MAX17000A latches off with the soft-shutdown  
sequence.  
For logic-level output voltages, connect an external 100kΩ  
pullup resistor from PGOOD1 and PGOOD2 to V  
.
DD  
In forced-PWM mode, the MAX17000A also implements  
a negative current limit to prevent excessive reverse  
POR, UVLO  
rises above  
Power-on reset (POR) occurs when V  
CC  
inductor currents when V  
is sinking current. The  
OUT  
approximately 2V, resetting the fault latch and soft-start  
circuit and preparing the controller for power-up. When  
OVP protection is enabled, a rising edge on POR turns  
on the 16Ω discharge MOSFET on CSL and VTT. When  
OVP is disabled, the internal 16Ω discharge MOSFETs  
on CSL and VTT also remain off.  
negative current-limit threshold is set to approximately  
115% of the positive current limit. See Figure 5.  
I
I
PEAK  
LOAD  
V
undervoltage lockout (UVLO) circuitry inhibits  
CC  
switching until V  
reaches 4.1V (typ). When V  
rises  
CC  
CC  
above 4.1V, the controller activates the PWM controller  
and initializes soft-start. When V drops below the  
CC  
UVLO threshold (falling edge), the controller stops, DL  
is pulled low, and the internal 16Ω discharge  
MOSFETs on the CSL and VTT outputs are enabled, if  
OVP is enabled.  
I
LIMIT  
LIR  
2
I
= I  
1-  
( )  
LIM(VAL) LOAD(MAX)  
Soft-Start and Soft-Shutdown  
Soft-start and soft-shutdown for the MAX17000A PWM  
block is voltage based. Soft-start begins when SHDN is  
driven high. During soft-start, the PWM output is  
ramped up from 0V to the final set voltage in 1.4ms.  
This reduces inrush current and provides a predictable  
ramp-up time for power sequencing. The MAX17000A  
always uses skip mode during startup, regardless of  
the SKIP and STDBY setting. The SKIP and STDBY con-  
trols take effect after soft-start is done.  
0
TIME  
Figure 5. Valley Current-Limit Threshold Point  
Power-Good Outputs  
(PGOOD1 and PGOOD2)  
The MAX17000A features two power-good outputs.  
PGOOD1 is the open-drain output for a window com-  
parator that continuously monitors the SMPS output.  
PGOOD1 is actively held low in shutdown and during  
soft-start and soft-shutdown. After the soft-start termi-  
nates, PGOOD1 becomes high impedance as long as  
the SMPS output voltage is between 115% (typ) and  
85% (typ) of the regulation voltage. When the SMPS  
output voltage exceeds the 115%/85% regulation win-  
dow, the MAX17000A pulls PGOOD1 low. Any fault  
condition on the SMPS output forces PGOOD1 and  
PGOOD2 low and latches off until the fault latch is  
The MAX17000A VTT LDO regulator uses a current-limit-  
ed soft-start function. When the VTT block is enabled, the  
internal source and sink current limits are linearly  
increased from zero to the full-scale limit in 160μs. Full-  
scale current limit is available when the VTT output is in  
regulation, or after 160μs, whichever is earlier. The VTTR  
reference buffer does not have any soft-start control.  
cleared by toggling SHDN or cycling V  
power below  
CC  
1V. Detection of an OVP event immediately pulls  
PGOOD1 low, regardless of the OVP state (OVP  
enabled or disabled).  
20  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
SHDN  
STDBY  
INT_REF  
REFOK  
SMPS_RUNOK  
1.4ms  
2.8ms  
25mV  
SMPS OUTPUT  
VTT OUTPUT  
VTTR OUTPUT  
VTT CURRENT LIMIT  
160μs  
PGOOD1  
PGOOD2  
SKIP  
FPWM  
DL  
VTT 16Ω FET  
CSL 16Ω FET  
Figure 6. MAX17000A Startup/Shutdown Timing with OVP Enabled  
When OVP is enabled (OVP = V ), the internal 16Ω  
Soft-shutdown begins after SHDN goes low, an output  
undervoltage fault occurs, or a thermal fault occurs. A  
fault on the SMPS (UV fault for more than 200μs (typ)),  
or fault on the VTT output that persists for more than  
5ms (typ), triggers shutdown of the whole IC. During  
soft-shutdown, the output is ramped down to 0V in  
2.8ms, reducing negative inductor currents that can  
cause negative voltages on the output. At the end of  
soft-shutdown, DL is driven low.  
CC  
discharging MOSFETs on CSL and VTT are enabled  
until startup is triggered again by a rising edge of  
SHDN. When OVP is disabled (OVP = AGND), the CSL  
and VTT internal 16Ω discharging MOSFETs are not  
enabled in shutdown.  
Output Fault Protection  
The MAX17000A provides overvoltage/undervoltage  
fault protections for the PWM output. Drive OVP to  
enable and disable fault protection as shown in Table 4.  
Maxim Integrated  
21  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Table 4. Fault Protection and Shutdown Setting Truth Table  
OVP  
MODE  
REACTION/DRIVER STATE  
DL immediately pulled low.  
VTTR tracks the SMPS output during soft-shutdown. CSL and VTT  
COMMENT  
Outputs high-  
impedance in  
shutdown.  
Shutdown  
(SHDN = low) are high impedance at the end of soft-shutdown (16discharge  
MOSFETs disabled).  
DL immediately pulled low.  
VTTR tracks the SMPS output during soft-shutdown. CSL and VTT  
are high impedance at the end of soft-shutdown (16discharge  
SMPS latched fault  
condition.  
SMPS UVP  
MOSFETs disabled).  
OVP Disabled  
Discharge Disabled  
(OVP = Low)  
SMPS OVP  
(disabled)  
Controller remains active (normal operation).  
Note: An OVP detection still pulls PGOOD1 low.  
Only PGOOD1 pulled  
low; fault not latched.  
PGOOD2 immediately pulled low.  
Soft-shutdown initiated if fault persists for more than 5ms (typ). DH  
VTT > +110% not used in soft-shutdown. DL low after soft-shutdown completed.  
VTTR tracks the SMPS output soft-shutdown.  
VTT latched fault  
condition if fault  
persists for more  
than 5ms (typ).  
VTT < -90% or  
DL and DH immediately pulled low.  
V
UVLO  
PGOOD1 and PGOOD2 immediately forced low. VTT and VTTR  
blocks immediately disabled (high impedance, no 16discharge  
on outputs).  
CC  
falling edge  
Soft-shutdown initiated.  
16discharge  
DL high after soft-shutdown completed.  
(SHDN = low) VTTR tracks the SMPS output during soft-shutdown. Internal 16ꢀ  
MOSFETs on CSL  
and VTT enabled in  
Shutdown  
discharge MOSFETs on CSL and VTT enabled after soft-shutdown. shutdown.  
Soft-shutdown initiated. DH not used in soft-shutdown. DL low  
after soft-shutdown completed.  
VTTR tracks the SMPS output during soft-shutdown. Internal 16ꢀ  
discharge MOSFETs on CSL and VTT enabled after soft-shutdown.  
SMPS latched fault  
condition.  
SMPS UVP  
OVP Enabled  
Discharge Enabled  
(OVP = High)  
DL immediately latched high, DH forced low.  
PGOOD1 and PGOOD2 immediately forced low.  
VTT and VTTR blocks immediately shut down. Internal 16ꢀ  
discharge MOSFETs on CSL and VTT enabled.  
SMPS OVP  
(enabled)  
SMPS latched fault  
condition.  
PGOOD2 immediately pulled low.  
VTT latched fault  
condition if fault  
persists for more  
than 5ms (typ).  
Soft-shutdown initiated if fault persists for more than 5ms (typ). DH  
not used in soft-shutdown. DL low after soft-shutdown completed.  
VTTR tracks the SMPS output during soft-shutdown. Internal 16ꢀ  
discharge MOSFETs on CSL and VTT enabled after soft-shutdown.  
VTT < 90% or  
VTT > 110%  
DL and DH immediately pulled low.  
PGOOD1 and PGOOD2 immediately forced low.  
VTT and VTTR blocks immediately disabled.  
Internal 16discharge MOSFETs on CSL and VTT enabled  
immediately.  
OVP Enabled  
Discharge Enabled  
(OVP = High)  
V
UVLO  
CC  
falling edge  
22  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Table 4. Fault Protection and Shutdown Setting Truth Table (continued)  
OVP  
MODE  
REACTION/DRIVER STATE  
COMMENT  
DL and DH immediately pulled low.  
PGOOD1 and PGOOD2 immediately forced low.  
VTT and VTTR blocks immediately disabled (high impedance, no  
16discharge on outputs).  
Thermal fault  
Active-fault condition.  
Activate INT_REF once V rises above UVLO, and SHDN = high.  
Once REFOK is valid (high), initiate the soft-start sequence.  
DL remains low until switching/soft-start begins.  
CC  
General Shutdown  
and Fault  
Conditions  
V
UVLO  
CC  
rising edge  
V
POR  
CC  
DL forced low.  
rising edge  
V
CC  
POR  
DL = Don’t care. V less than 2VT is not sufficient to turn on the  
CC  
falling edge MOSFETs.  
SMPS Overvoltage Protection (OVP)  
completed, the MAX17000A forces DL and DH low, and  
If the output voltage of the SMPS rises 115% above its  
nominal regulation voltage while OVP is enabled (OVP =  
enables the internal 16Ω discharge MOSFETs on CSL  
and VTT. Cycle V  
below 1V or toggle SHDN to clear  
CC  
V
CC  
), the controller sets its overvoltage fault latch, pulls  
the undervoltage fault latch and restart the controller.  
PGOOD1 and PGOOD2 low, and forces DL high. The  
VTT and VTTR block shut down immediately, and the  
internal 16Ω discharge MOSFETs on CSL and VTT are  
turned on. If the condition that caused the overvoltage  
persists (such as a shorted high-side MOSFET), the bat-  
Thermal-Fault Protection  
The MAX17000A features a thermal-fault protection cir-  
cuit. When the junction temperature rises above  
+160°C, a thermal sensor activates the fault latch, pulls  
PGOOD1 and PGOOD2 low, and shuts down using the  
tery fuse blows. Cycle V  
below 1V or toggle SHDN to  
CC  
shutdown sequence. Toggle SHDN or cycle V  
power  
CC  
clear the overvoltage fault latch and restart the controller.  
below V  
POR to reactivate the controller after the  
CC  
OVP is disabled when OVP is connected to AGND  
(Table 4). PGOOD1 upper threshold remains active at  
115% of nominal regulation voltage even when OVP is  
disabled and the 16Ω discharge MOSFETs on CSL  
and VTT are not enabled in shutdown.  
junction temperature cools by 15°C.  
Design Procedure  
Firmly establish the input voltage range and maximum  
load current before choosing a switching frequency and  
inductor operating point (ripple-current ratio). The pri-  
mary design trade-off lies in choosing a good switching  
frequency and inductor operating point, and the follow-  
ing four factors dictate the rest of the design:  
SMPS Undervoltage Protection (UVP)  
If the output voltage of the SMPS falls below 85% of its  
regulation voltage for more than 200μs (typ), the controller  
sets its undervoltage fault latch, pulls PGOOD1 and  
PGOOD2 low, and begins soft-shutdown pulsing DL. DH  
remains off during the soft-shutdown sequence initiated  
by an undervoltage fault. After soft-shutdown has com-  
pleted, the MAX17000A forces DL and DH low, and  
enables the internal 16Ω discharge MOSFETs on CSL  
Input Voltage Range: The maximum value  
(V ) must accommodate the worst-case input  
IN(MAX)  
supply voltage allowed by the notebook’s AC  
adapter voltage. The minimum value (V  
)
IN(MIN)  
must account for the lowest input voltage after  
drops due to connectors, fuses, and battery selec-  
tor switches. If there is a choice at all, lower input  
voltages result in better efficiency.  
and VTT. Cycle V  
below 1V or toggle SHDN to clear  
CC  
the undervoltage fault latch and restart the controller.  
VTT Overvoltage and Undervoltage Protection  
If the output voltage of the VTT regulator exceeds  
10% of its regulation voltage for more than 5ms (typ),  
the controller sets its fault latch, pulls PGOOD1 and  
PGOOD2 low, and begins soft-shutdown pulsing DL.  
DH remains off during the soft-shutdown sequence initi-  
ated by an undervoltage fault. After soft-shutdown has  
Maximum Load Current: There are two values to  
consider. The peak load current (I  
) deter-  
LOAD(MAX)  
mines the instantaneous component stresses and  
filtering requirements, and thus drives output  
capacitor selection, inductor saturation rating, and  
the design of the current-limit circuit. The continu-  
ous load current (I  
) determines the thermal  
LOAD  
Maxim Integrated  
23  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
stresses and thus drives the selection of input  
capacitors, MOSFETs, and other critical heat-con-  
tributing components. Most notebook loads gener-  
iron is inexpensive and can work well at 200kHz. The  
core must be large enough not to saturate at the peak  
inductor current (I  
):  
PEAK  
ally exhibit I  
= I  
x 80%.  
LOAD  
LOAD(MAX)  
LIR  
2
I
= I  
× 1+  
LOAD(MAX)  
PEAK  
Switching Frequency: This choice determines the  
basic trade-off between size and efficiency. The  
optimal frequency is largely a function of maximum  
input voltage, due to MOSFET switching losses that  
Setting the Valley Current Limit  
The minimum current-limit threshold must be high  
enough to support the maximum load current when the  
current limit is at the minimum tolerance value. The val-  
are proportional to frequency and V 2. The opti-  
IN  
mum frequency is also a moving target, due to  
rapid improvements in MOSFET technology that are  
making higher frequencies more practical.  
ley of the inductor current occurs at I  
half the ripple current; therefore:  
minus  
LOAD(MAX)  
Inductor Operating Point: This choice provides  
trade-offs between size vs. efficiency and transient  
response vs. output noise. Low inductor values pro-  
vide better transient response and smaller physical  
size, but also result in lower efficiency and higher  
output noise due to increased ripple current. The  
minimum practical inductor value is one that causes  
the circuit to operate at the edge of critical conduc-  
tion (where the inductor current just touches zero  
with every cycle at maximum load). Inductor values  
lower than this grant no further size-reduction bene-  
fit. The optimum operating point is usually found  
between 20% and 50% ripple current.  
LIR  
2
I
> I  
× 1-  
LIMIT(LOW) LOAD(MAX)  
where I  
equals the minimum current-limit  
threshold voltage divided by the output sense element  
(inductor DCR or sense resistor).  
LIMIT(LOW)  
The valley current limit is fixed at 17mV (min) across the  
CSH to CSL differential input.  
Special attention must be made to the tolerance and  
thermal variation of the on-resistance in the case of DCR  
sensing. Use the worst-case maximum value for R  
from the inductor data sheet, and add some margin for  
the rise in R with temperature. A good general rule  
is to allow 0.5% additional resistance for each degree  
Celsius of temperature rise, which must be included in  
the design margin unless the design includes an NTC  
thermistor in the DCR network to thermally compensate  
the current-limit threshold.  
DCR  
Inductor Selection  
DCR  
The switching frequency and operating point (% ripple  
current or LIR) determine the inductor value as follows:  
V
- V  
V
OUT  
IN  
OUT  
L =  
×
f
×I  
× LIR  
V
SW LOAD(MAX)  
IN  
The current-sense method (Figure 7) and magnitude  
determine the achievable current-limit accuracy and  
power loss. The sense resistor can be determined by:  
Find a low-loss inductor having the lowest possible DC  
resistance that fits in the allotted dimensions. Ferrite  
cores are often the best choice, although powdered  
R
= V  
/I  
SENSE  
LIMIT LIMIT  
INPUT (V )  
IN  
C
N
H
IN  
SENSE RESISTOR  
DH  
LX  
R
L
ESL  
SENSE  
L
L
ESL  
C
R
=
EQ EQ  
R
SENSE  
C
OUT  
C
DL  
EQ  
MAX17000A  
R
D
EQ  
L
N
L
PGND1  
CSH  
CSL  
A) OUTPUT SERIES RESISTOR SENSING  
Figure 7a. Current-Sense Configurations (Sheet 1 of 2)  
24  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
INPUT (V )  
IN  
C
IN  
N
H
INDUCTOR  
DH  
LX  
R
L
DCR  
R2  
R1 + R2  
R
=
R
DCR  
CS  
C
OUT  
R
R
2
1
MAX17000A  
DL  
D
L
N
L
L
1
1
R2  
+
R
=
DCR  
[R1 ]  
C
EQ  
PGND1  
C
EQ  
CSH  
CSL  
FOR THERMAL COMPENSATION:  
R2 SHOULD CONSIST OF AN NTC RESISTOR IN  
SERIES WITH A STANDARD THIN-FILM RESISTOR.  
B) LOSSLESS INDUCTOR SENSING  
Figure 7b. Current-Sense Configurations (Sheet 2 of 2)  
For the best current-sense accuracy and overcurrent  
protection, use a 1% tolerance current-sense resistor  
between the inductor and output as shown in Figure 7a.  
This configuration constantly monitors the inductor cur-  
rent, allowing accurate current-limit protection.  
However, the parasitic inductance of the current-sense  
resistor can cause current-limit inaccuracies, especially  
when using low-value inductors and current-sense  
MOSFET Gate Drivers (DH, DL)  
The DH and DL drivers are optimized for driving moder-  
ate-sized high-side, and larger low-side power MOSFETs.  
This is consistent with the low duty factor seen in note-  
book applications, where a large V - V  
differential  
IN  
OUT  
exists. The high-side gate driver (DH) sources and sinks  
1.2A, and the low-side gate driver (DL) sources 1.0A and  
sinks 2.4A. This ensures robust gate drive for high-cur-  
rent applications. The DH floating high-side MOSFET dri-  
ver is powered by an internal boost switch charge pump  
at BST, while the DL synchronous-rectifier driver is pow-  
resistors. This parasitic inductance (L  
) can be can-  
ESL  
celled by adding an RC circuit across the sense resis-  
tor with an equivalent time constant:  
ered directly by the 5V bias supply (V ).  
DD  
L
ESL  
C
× R  
=
PWM Output Capacitor Selection  
EQ  
EQ  
R
SENSE  
The output filter capacitor must have low enough effec-  
tive series resistance (ESR) to meet output ripple and  
load-transient requirements, yet have high enough ESR  
to satisfy stability requirements.  
Alternatively, low-cost applications that do not require  
highly accurate current-limit protection could reduce  
the overall power dissipation by connecting a series RC  
circuit across the inductor (Figure 7b) with an equiva-  
lent time constant:  
In core and chipset converters and other applications  
where the output is subject to large-load transients, the  
output capacitor’s size typically depends on how much  
ESR is needed to prevent the output from dipping too  
low under a load transient. Ignoring the sag due to finite  
capacitance:  
R2  
R1+ R2  
R
=
× R  
DCR  
CS  
and:  
V
STEP  
LOAD(MAX)  
R
(
+ R  
)
ESR  
PCB  
ΔI  
L
1
1
R
=
×
+
DCR  
C
R1 R2  
In low-power applications, the output capacitor’s size  
often depends on how much ESR is needed to maintain  
an acceptable level of output ripple voltage. The output  
ripple voltage of a step-down controller equals the total  
inductor ripple current multiplied by the output capaci-  
tor’s ESR.  
EQ  
where R  
and R  
is the required current-sense resistance,  
is the inductor’s series DC resistance. Use  
CS  
DCR  
the worst-case inductance and R  
by the inductor manufacturer, adding some margin for  
the inductance drop over temperature and load.  
values provided  
DCR  
Maxim Integrated  
25  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
The maximum ESR to meet ripple requirements is:  
ceramic output capacitors can be compensated using  
either a DC-compensation or AC-compensation  
method. The DC-coupling requires fewer external com-  
pensation capacitors, but this also creates an output  
load line that depends on the inductor’s DCR (parasitic  
resistance). Alternatively, the current-sense information  
can be AC-coupled, allowing stability to be dependent  
only on the inductance value and compensation com-  
ponents and eliminating the DC load line.  
V
× f  
× L  
× V  
IN SW  
R
× V  
RIPPLE  
ESR  
V
- V  
)
(
IN  
OUT  
OUT  
where f  
is the switching frequency.  
SW  
With most chemistries (polymer, tantalum, aluminum,  
electrolytic), the actual capacitance value required  
relates to the physical size needed to achieve low ESR  
and the chemistry limits of the selected capacitor tech-  
nology. Ceramic capacitors provide low ESR, but the  
capacitance and voltage rating (after derating) are  
When only using ceramic output capacitors, output  
overshoot (V  
) typically determines the minimum  
SOAR  
output capacitance requirement. Their relatively low  
capacitance value can allow significant output over-  
shoot when stepping from full-load to no-load condi-  
tions, unless a small inductor value and high switching  
frequency are used to minimize the energy transferred  
from inductor to capacitor during load-step recovery.  
determined by the capacity needed to prevent V  
SAG  
and V  
from causing problems during load tran-  
SOAR  
sients. Generally, once enough capacitance is added  
to meet the overshoot requirement, undershoot at the  
rising load edge is no longer a problem. Thus, the out-  
put capacitor selection requires carefully balancing  
capacitor chemistry limitations (capacitance vs. ESR  
vs. voltage rating) and cost.  
Unstable operation manifests itself in two related, but  
distinctly different ways: double pulsing and feedback  
loop instability. Double pulsing occurs due to noise on  
the output or because the ESR is so low that there is not  
enough voltage ramp in the output voltage signal. This  
“fools” the error comparator into triggering a new cycle  
immediately after the minimum off-time period has  
expired. Double pulsing is more annoying than harmful,  
resulting in nothing worse than increased output ripple.  
However, it can indicate the possible presence of loop  
instability due to insufficient ESR. Loop instability can  
result in oscillations at the output after line or load  
steps. Such perturbations are usually damped, but can  
cause the output voltage to rise above or fall below the  
tolerance limits.  
PWM Output Capacitor  
Stability Considerations  
For Quick-PWM controllers, stability is determined by the  
in-phase feedback ripple relative to the switching frequen-  
cy, which is typically dominated by the output ESR. The  
boundary of instability is given by the following equation:  
f
1
SW  
π
2π × R  
× C  
EFF OUT  
R
= R  
+ A × R  
EFF  
ESR CS SENSE  
where C  
is the total output capacitance, R  
is the  
OUT  
ESR  
The easiest method for checking stability is to apply a  
very fast zero-to-max load transient and carefully  
observe the output voltage ripple envelope for over-  
shoot and ringing. It can help to simultaneously monitor  
the inductor current with an AC current probe. Do not  
allow more than one cycle of ringing after the initial  
step-response undervoltage/overshoot.  
total equivalent series resistance of the output capaci-  
tors, R  
is the effective current-sense resistance  
SENSE  
(see Figure 7), and A is the current-sense gain of 2.  
CS  
For a standard 300kHz application, the effective zero  
frequency must be well below 95kHz, preferably below  
50kHz. With these frequency requirements, standard  
tantalum and polymer capacitors already commonly  
used have typical ESR zero frequencies below 50kHz,  
allowing the stability requirements to be achieved with-  
out any additional current-sense compensation. In the  
standard application circuit (Figure 1), the ESR needed  
Input Capacitor Selection  
The input capacitor must meet the ripple current  
requirement (I  
RMS  
lowing equation:  
) imposed by the switching currents.  
RMS  
The I  
requirements can be determined by the fol-  
to support a 15mV  
ripple is 15mV/(10A x 0.3) =  
P-P  
5mΩ. Two 330μF, 9mΩ polymer capacitors in parallel  
provide 4.5mΩ (max) ESR and 1/(2π x 330μF x 9mΩ) =  
53kHz ESR zero frequency.  
I
LOAD  
I
=
V
× V V  
(
)
RMS  
OUT  
IN  
OUT  
V
IN  
Ceramic capacitors have a high-ESR zero frequency,  
but applications with sufficient current-sense compen-  
sation can still take advantage of the small size, low  
ESR, and high reliability of the ceramic chemistry. By  
the inductor current DCR sensing, applications with  
The worst-case RMS current requirement occurs when  
operating with V = 2V  
IN  
. At this point, the above  
OUT  
equation simplifies to:  
I
= 0.5 x I  
LOAD  
RMS  
26  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
For most applications, nontantalum chemistries (ceramic,  
can be. Again, the optimum occurs when the switching  
losses equal the conduction (R ) losses. High-  
side switching losses do not usually become an issue  
until the input is greater than approximately 15V.  
aluminum, or OS-CON) are preferred due to their resis-  
tance to inrush surge currents typical of systems with a  
mechanical switch or connector in series with the input.  
If the Quick-PWM controller is operated as the second  
stage of a two-stage power-conversion system, tanta-  
lum input capacitors are acceptable. In either configu-  
ration, choose an input capacitor that exhibits less than  
+10°C temperature rise at the RMS input current for  
optimal circuit longevity.  
DS(ON)  
Calculating the power dissipation in high-side MOSFET  
(N ) due to switching losses is difficult since it must  
H
allow for difficult quantifying factors that influence the  
turn-on and turn-off times. These factors include the  
internal gate resistance, gate charge, threshold voltage,  
source inductance, and PCB layout characteristics. The  
following switching-loss calculation provides only a very  
rough estimate and is no substitute for breadboard  
evaluation, preferably including verification using a  
MOSFET Selection  
Most of the following MOSFET guidelines focus on the  
challenge of obtaining high load-current capability  
when using high-voltage (> 20V) AC adapters. Low-  
current applications usually require less attention.  
thermocouple mounted on N :  
H
Q
G(SW)  
PD (NH Switching) = V  
×I  
× f  
IN(MAX) LOAD SW  
The high-side MOSFET (N ) must be able to dissipate  
H
the resistive losses plus the switching losses at both  
I
GATE  
2
C
× V × f  
V
and V  
. Calculate both these sums.  
should be roughly equal to  
OSS  
IN  
SW  
IN(MIN)  
Ideally, the losses at V  
IN(MAX)  
+
2
IN(MIN)  
losses at V  
losses at V  
at V  
R
es at V  
, with lower losses in between. If the  
IN(MAX)  
IN(MIN)  
where C  
G(SW)  
is the N MOSFET’s output capacitance,  
H
OSS  
are significantly higher than the losses  
Q
is the charge needed to turn on the N MOSFET,  
H
, consider increasing the size of N (reducing  
IN(MAX)  
H
and I  
is the peak gate-drive source/sink current  
GATE  
(2.2A typ).  
but with higher C  
). Conversely, if the loss-  
GATE  
DS(ON)  
are significantly higher than the losses at  
IN(MAX)  
Switching losses in the high-side MOSFET can become  
an insidious heat problem when maximum AC adapter  
V
, consider reducing the size of N (increasing  
IN(MIN)  
R
H
to lower C  
). If V does not vary over a  
GATE IN  
DS(ON)  
voltages are applied, due to the squared term in the  
wide range, the minimum power dissipation occurs  
where the resistive losses equal the switching losses.  
2
C x V  
x f  
switching-loss equation. If the high-side  
SW  
IN  
MOSFET chosen for adequate R  
voltages becomes extraordinarily hot when biased from  
IN(MAX)  
lower parasitic capacitance.  
at low battery  
DS(ON)  
Choose a low-side MOSFET that has the lowest possi-  
ble on-resistance (R ), comes in a moderate-sized  
DS(ON)  
V
, consider choosing another MOSFET with  
package (i.e., one or two 8-pin SOs, DPAK, or D2PAK),  
and is reasonably priced. Make sure that the DL gate  
driver can supply sufficient current to support the gate  
charge and the current injected into the parasitic gate-  
to-drain capacitor caused by the high-side MOSFET  
turning on; otherwise, cross-conduction problems can  
occur (see the MOSFET Gate Drivers (DH, DL) section).  
For the low-side MOSFET (N ), the worst-case power  
L
dissipation always occurs at maximum input voltage:  
V
2
OUT  
PD (NL Resistive) =1−  
⎥ × I  
× R  
DS(ON)  
(
)
LOAD  
V
IN(MAX)  
MOSFET Power Dissipation  
Worst-case conduction losses occur at the duty factor  
The worst case for MOSFET power dissipation occurs  
under heavy overloads that are greater than  
LOAD(MAX)  
the current limit and cause the fault latch to trip. To pro-  
tect against this possibility, the circuit can be “over  
designed” to tolerate:  
extremes. For the high-side MOSFET (N ), the worst-  
H
case power dissipation due to resistance occurs at the  
minimum input voltage:  
I
, but are not quite high enough to exceed  
V
2
OUT  
PD (NH Resistive) =  
× I  
(
× R  
DS(ON)  
)
LOAD  
V
IN  
ΔI  
INDUCTOR  
I
= I  
+
LOAD VALLEY(MAX)  
2
Generally, a small high-side MOSFET is desired to  
reduce switching losses at high input voltages.  
required to stay within package  
power dissipation often limits how small the MOSFET  
I
× LIR  
LOAD(MAX)  
2
= I +  
VALLEY(MAX)  
However, the R  
DS(ON)  
Maxim Integrated  
27  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
where I  
is the maximum valley current  
VTTI Input Capacitor  
Stability Considerations  
VALLEY(MAX)  
allowed by the current-limit circuit, including threshold  
tolerance and on-resistance variation. The MOSFETs  
must have a good size heatsink to handle the overload  
power dissipation.  
The value of the VTTI bypass capacitor is chosen to  
limit the amount of ripple/noise at VTTI, and the amount  
of voltage dip during a load transient. Typically, VTTI is  
connected to the output of the buck regulator, which  
already has a large bulk capacitor. Nevertheless, a  
ceramic capacitor of equivalent value to the VTT output  
capacitor must be used and must be added and  
placed as close as possible to the VTTI pin. This value  
must be increased with larger load current, or if the  
trace from the VTTI pin to the power source is long and  
has significant impedance.  
Choose a Schottky diode (DL) with a forward voltage  
low enough to prevent the low-side MOSFET body  
diode from turning on during the dead time. Select a  
diode that can handle the load current during the dead  
times. This diode is optional and can be removed if effi-  
ciency is not critical.  
Setting the PWM Output Voltage  
Preset Output Voltages  
The MAX17000A’s Dual Mode™ operation allows the  
selection of common voltages without requiring external  
components. Connect FB to AGND for a fixed 1.5V out-  
Setting VTT Output Voltage  
The VTT output stage is powered from the VTTI input.  
The output voltage is set by the REFIN input. REFIN sets  
the feedback regulation voltage (VTTR = VTTS =  
put, to V  
for a fixed 1.8V output, or connect FB  
CC  
V
) of the MAX17000A. Connect a 0.1V to 2.0V volt-  
REFIN  
directly to OUT for a fixed 1.0V output.  
age input to set the adjustable output for VTT, VTTS, and  
VTTR. If REFIN is tied to V , the internal CSL/2 divider  
CC  
Adjustable Output Voltage  
is used to set VTT voltage; hence, VTT tracks the V  
CSL  
The output voltage can be adjusted from 1.0V to 2.7V  
using a resistive voltage-divider (Figure 8). The  
MAX17000A regulates FB to a fixed reference voltage  
(1.0V). The adjusted output voltage is:  
voltage and is set to V  
/2. This feature makes the  
CSL  
MAX17000A ideal for memory applications in which the  
termination supply must track the supply voltage.  
VTT Output Capacitor Selection  
A minimum value of 9μF is needed to stabilize a 300mA  
VTT output. This value of capacitance limits the regula-  
tor’s unity-gain bandwidth frequency to approximately  
1.2MHz (typ) to allow adequate phase margin for stabil-  
ity. To keep the capacitor acting as a capacitor within  
the regulator’s bandwidth, it is important that ceramic  
capacitors with low ESR and ESL be used.  
R
FBA  
V
= V × 1+  
OUT  
FB  
R
FBB  
where V is 1.0V.  
FB  
L1  
V
OUT  
LX  
DL  
N
L
C
OUT  
D1  
PGND1  
CSH  
CSL  
MAX17000A  
R
R
FBA  
FB  
FBB  
Figure 8. Setting V  
OUT  
with a Resistive Voltage-Divider  
Dual Mode is a trademark of Maxim Integrated Products, Inc.  
28  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Since the gain bandwidth is also determined by the  
PD(Total) = 2W  
transconductance of the output FETs, which increases  
with load current, the output capacitor might need to be  
greater than 20μF if the load current exceeds 1.5A, but  
can be smaller than 20μF if the maximum load current  
is less than 1.5A. As a guideline, choose the minimum  
capacitance and maximum ESR for the output capaci-  
tor using the following:  
The 2W total power dissipation is within the 24-pin  
TQFN multilayer board power dissipation specification  
of 2.22W. The typical application does not source or  
sink continuous high currents. VTT current is typically  
100mA to 200mA in the steady state. VTTR is down in  
the microamp range, though the Intel specification  
requires 3mA for DDR1 and 1mA for DDR2. True worst-  
case power dissipation occurs on an output short-circuit  
condition with worst-case current limit. The MAX17000A  
does not employ any foldback current limiting, and  
relies on the internal thermal shutdown for protection.  
Both the VTT and VTTR output stages are powered from  
the same VTTI input. Their output voltages are refer-  
enced to the same REFIN input. The value of the VTTI  
bypass capacitor is chosen to limit the amount of rip-  
ple/noise at VTTI, or the amount of voltage dip during a  
load transient. Typically, VTTI is connected to the output  
of the buck regulator, which already has a large bulk  
capacitor.  
I
LOAD  
C
= 20μF ×  
OUT _MIN  
1.5A  
C
needs to be increased by a factor of 2 for  
OUT_MIN  
low-dropout operation:  
1.5A  
R
= 5mΩ ×  
ESR_MAX  
I
LOAD  
R
value is measured at the unity-gain-band-  
ESR_MAX  
width frequency given by approximately:  
I
36  
LOAD  
f
=
×
GBW  
C
1.5A  
OUT  
Boost Capacitors  
) must be selected large  
The boost capacitors (C  
BST  
Once these conditions for stability are met, additional  
capacitors, including those of electrolytic and tantalum  
types, can be connected in parallel to the ceramic  
capacitor (if desired) to further suppress noise or volt-  
age ripple at the output.  
enough to handle the gate-charging requirements of  
the high-side MOSFETs. Typically, 0.1μF ceramic  
capacitors work well for low-power applications driving  
medium-sized MOSFETs. However, high-current appli-  
cations driving large, high-side MOSFETs require boost  
capacitors larger than 0.1μF. For these applications,  
select the boost capacitors to avoid discharging the  
capacitor more than 200mV while charging the high-  
side MOSFETs’ gates:  
VTTR Output Capacitor Selection  
The VTTR buffer is a scaled-down version of the VTT  
regulator, with much smaller output transconductance.  
Its compensation capacitor can, therefore, be smaller  
and its ESR larger than what is required for its larger  
counterpart. For typical applications requiring load cur-  
rent up to 4mA, a ceramic capacitor with a minimum  
Q
GATE  
C
=
BST  
200mV  
value of 0.33μF is recommended (R  
Connect this capacitor between VTTR and the analog  
ground plane.  
< 0.3Ω).  
ESR  
where Q  
is the total gate charge specified in the  
GATE  
high-side MOSFET’s data sheet. For example, assume  
the FDS6612A n-channel MOSFET is used on the high  
side. According to the manufacturer’s data sheet, a sin-  
gle FDS6612A has a maximum gate charge of 13nC  
Power Dissipation  
Power loss in the MAX17000A is the sum of the losses  
of the PWM block, the VTT LDO block, and the VTTR  
reference buffer:  
(V  
= 5V). Using the above equation, the required  
boost capacitance would be:  
GS  
PD(PWM) = I  
× 5V = 40mA × 5V = 0.2W  
BIAS  
13nC  
200mV  
C
=
= 0.065μF  
BST  
PD(VTT) = 2A × 0.9V = 1.8W  
Selecting the closest standard value, this example  
requires a 0.1μF ceramic capacitor.  
PD(VTTR) = 3mA × 0.9V = 2.7mW  
Maxim Integrated  
29  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Layout Procedure  
1) Place the power components first, with ground ter-  
minals adjacent (low-side MOSFET source, C  
Applications Information  
PCB Layout Guidelines  
Careful PCB layout is critical to achieve low switching  
losses and clean, stable operation. The switching  
power stage requires particular attention. If possible,  
mount all the power components on the topside of the  
board, with their ground terminals flush against one  
another. Follow these guidelines for good PCB layout:  
,
IN  
C
, and anode of the low-side Schottky). If possi-  
OUT  
ble, make all these connections on the top layer  
with wide, copper-filled areas.  
2) Mount the controller IC adjacent to the low-side  
MOSFET, preferably on the backside opposite the  
MOSFETs to keep LX, GND, DH, and the DL gate-  
drive lines short and wide. The DL and DH gate  
traces must be short and wide (50 mils to 100 mils  
wide if the MOSFET is 1in from the controller IC) to  
keep the driver impedance low and for proper  
adaptive dead-time sensing.  
Keep the high-current paths short, especially at the  
ground terminals. This practice is essential for sta-  
ble, jitter-free operation.  
Keep the power traces and load connections short.  
This practice is essential for high efficiency. Using  
thick copper PCBs (2oz vs. 1oz) can enhance full-  
load efficiency by 1% or more. Correctly routing  
PCB traces is a difficult task that must be  
approached in terms of fractions of centimeters,  
where a single milliohm of excess trace resistance  
causes a measurable efficiency penalty.  
3) Group the gate-drive components (BST diode and  
capacitor, V  
bypass capacitor) together near the  
DD  
controller IC.  
4) Make the DC-DC controller ground connections as  
shown in Figures 1 and 9. This diagram can be  
viewed as having two separate ground planes:  
power ground, where all the high-power compo-  
nents go; and an analog ground plane for sensitive  
analog components. The analog ground plane and  
power ground plane must meet only at a single  
point directly at the IC.  
Minimize current-sensing errors by connecting CSH  
and CSL directly across the current-sense resistor  
(R  
).  
SENSE  
When trade-offs in trace lengths must be made, it is  
preferable to allow the inductor-charging path to be  
made longer than the discharge path. For example,  
it is better to allow some extra distance between the  
input capacitors and the high-side MOSFET than to  
allow distance between the inductor and the low-  
side MOSFET or between the inductor and the out-  
put filter capacitor.  
5) Connect the output power planes directly to the out-  
put filter capacitor positive and negative terminals  
with multiple vias. Place the entire DC-to-DC con-  
verter circuit as close as is practical to the load.  
Table 5 lists the design differences between the  
MAX17000 and MAX17000A.  
Route high-speed switching nodes (BST, LX, DH,  
and DL) away from sensitive analog areas (REFIN,  
FB, CSH, and CSL).  
Table 5. MAX17000 vs. MAX17000A Design Differences  
MAX17000  
MAX17000A  
STDBY = Low turns off VTT and overrides the SKIP setting, forcing STDBY = Low only turns off VTT rail, and does not affect SMPS  
the SMPS to enter a low-quiescent current ultra-skip mode. operation.  
30  
Maxim Integrated  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
KELVIN SENSE VIAS  
UNDER THE INDUCTOR  
(SEE EVALUATION KIT)  
POWER STAGE LAYOUT (TOP SIDE OF PCB)  
OUTPUT  
INDUCTOR  
L1  
CSL  
CSH  
R
R2  
R1  
NTC  
POWER  
GROUND  
C
EQ  
KELVIN-SENSE VIAS TO  
INDUCTOR PAD  
INPUT  
SMPS  
INDUCTOR DCR SENSING  
CONNECT AGND AND PGND1 TO  
THE CONTROLLER AT THE  
EXPOSED PAD  
CONNECT THE  
EXPOSED PAD TO  
ANALOG GROUND  
V
BYPASS  
DD  
CAPACITOR  
VTTI BYPASS  
CAPACITOR  
VIA TO POWER GROUND  
V
CC  
BYPASS  
CAPACITOR  
VTT BYPASS  
CAPACITOR  
X-RAY VIEW.  
IC MOUNTED  
ON BOTTOM  
SIDE OF PCB.  
IC LAYOUT  
Figure 9. PCB Layout Example  
Package Information  
Chip Information  
For the latest package outline information and land patterns (foot-  
prints), go to www.maximintegrated.com/packages. Note that a  
“+”, “#”, or “-” in the package code indicates RoHS status only.  
Package drawings may show a different suffix character, but the  
drawing pertains to the package regardless of RoHS status.  
TRANSISTOR COUNT: 7856  
PROCESS: BiCMOS  
PACKAGE  
TYPE  
PACKAGE  
CODE  
OUTLINE  
NO.  
LAND  
PATTERN NO.  
24 TQFN  
T2444-4  
21-01±9  
90-0022  
Maxim Integrated  
31  
MAX17000A  
Complete DDR2 and DDR3 Memory  
Power-Management Solution  
Revision History  
REVISION  
NUMBER  
REVISION  
DATE  
PAGES  
CHANGED  
DESCRIPTION  
0
1
2
3
10/08  
12/08  
11/10  
4/13  
Initial release  
5, 11, 12, 13, 17, 23,  
Modified STDBY pin function  
Changed R  
equation  
29  
2
ESR_MAX  
Updated Absolute Maximum Ratings  
Maxim Integrated cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim Integrated product. No circuit patent  
licenses are implied. Maxim Integrated reserves the right to change the circuitry and specifications without notice at any time. The parametric values (min and  
max limits) shown in the Electrical Characteristics table are guaranteed. Other parametric values quoted in this data sheet are provided for guidance.  
32 ________________________________Maxim Integrated 160 Rio Robles, San Jose, CA 95134 USA 1-408-601-1000  
© 2013 Maxim Integrated Products, Inc.  
Maxim Integrated and the Maxim Integrated logo are trademarks of Maxim Integrated Products, Inc.  

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