MAX17000AETG+C00 [MAXIM]
Power Supply Support Circuit, Adjustable, 2 Channel, BICMOS, TQFN-24;型号: | MAX17000AETG+C00 |
厂家: | MAXIM INTEGRATED PRODUCTS |
描述: | Power Supply Support Circuit, Adjustable, 2 Channel, BICMOS, TQFN-24 信息通信管理 |
文件: | 总32页 (文件大小:750K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
General Description
Features
o SMPS Regulator (VDDQ)
The MAX17000A pulse-width modulation (PWM) con-
troller provides a complete power solution for notebook
DDR, DDR2, and DDR3 memory. It comprises a step-
down controller, a source-sink LDO regulator, and a ref-
erence buffer to generate the required VDDQ, VTT, and
VTTR rails.
Quick-PWM with 100ns Load-Step Response
Output Voltages—Preset 1.8V, 1.5V, or
Adjustable 1.0V to 2.5V
1% V
Accuracy Over Line and Load
OUT
26V Maximum Input Voltage Rating
Accurate Valley Current-Limit Protection
200kHz to 600kHz Switching Frequency
The VDDQ rail is supplied by a step-down converter
using Maxim’s proprietary Quick-PWM™ controller. The
high-efficiency, constant-on-time PWM controller han-
dles wide input/output voltage ratios (low duty-cycle
applications) with ease and provides 100ns response
to load transients while maintaining a relatively constant
switching frequency. The Quick-PWM architecture cir-
cumvents the poor load-transient timing problems of
fixed-frequency current-mode PWMs while also avoid-
ing the problems caused by widely varying switching
frequencies in conventional constant-on-time and con-
stant-off-time PWM schemes. The controller senses the
current to achieve an accurate valley current-limit pro-
tection. It is also built in with overvoltage, undervoltage,
and thermal protections. The MAX17000A can be set to
run in three different modes: power-efficient SKIP
mode, low-noise forced-PWM mode, and standby
mode to support memory in notebook computer stand-
by operation. The switching frequency is programma-
ble from 200kHz to 600kHz to allow small components
and high efficiency. The VDDQ output voltage can be
set to a preset 1.8V or 1.5V, or be adjusted from 1.0V to
2.5V by an external resistor-divider. This output has 1%
accuracy over line-and-load operating range.
o Source/Sink Linear Regulator (VTT)
±2A Peak Source/Sink
Low-Output Capacitance Requirement
Output Voltages-Preset VDDQ/2 or REFIN
Adjustable from 0.5V to 1.5V
o Soft-Start/Soft-Shutdown
o SMPS Power-Good Window Comparator
o VTT Power-Good Window Comparator
o Selectable Overvoltage Protection
o Undervoltage/Thermal Protections
o ±±mA Reference ꢀuffer (VTTR)
Ordering Information
PART
TEMP RANGE
PIN-PACKAGE
MAX17000AETG+
-40°C to +85°C
24 Thin QFN-EP*
+Denotes a lead(Pb)-free/RoHS-compliant package.
*EP = Exposed pad.
Pin Configuration
The MAX17000A includes a 2A source-sink LDO reg-
ulator for the memory termination VTT rail. This VTT reg-
ulator has a 5mV deadband that either sources or
sinks, ideal for the fast-changing load burst present in
memory termination applications. This feature also
reduces output capacitance requirements.
TOP VIEW
18
17
16
15
14
13
12
11
10
9
V
19
CSL
FB
DD
The VTTR reference buffer sources and sinks 3mA,
providing the reference voltage needed by the memory
controller and devices on the memory bus.
PGND1 20
AGND 21
SKIP 22
REFIN
MAX17000A
The MAX17000A is available in a 24-pin, 4mm x 4mm,
thin QFN package.
VTTI
V
8
VTT
23
24
CC
*EP
5
Applications
7
PGND2
SHDN
Notebook Computers
1
2
3
4
6
DDR, DDR2, and DDR3 Memory Supplies
SSTL Memory Supplies
THIN QFN
4mm x 4mm
*EXPOSED PAD
Quick-PWM is a trademark of Maxim Integrated Products, Inc.
For pricing, delivery, and ordering information, please contact Maxim Direct
at 1-888-629-4642, or visit Maxim’s website at www.maximintegrated.com.
19-4307; Rev 3; 4/13
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
AꢀSOLUTE MAXIMUM RATINGS
TON to PGND1.......................................................-0.3V to +28V
VTTI to PGND2 .........................................................-0.3V to +6V
VTT to PGND2 ............................................-0.3V to (V + 0.3V)
V
V
to PGND1..........................................................-0.3V to +6V
DD
CC
TTI
to V ............................................................-0.3V to +0.3V
VTTS to AGND............................................-0.3V to (V
+ 0.3V)
+ 0.3V)
DD
CC
OVP to AGND...........................................................-0.3V to +6V
SHDN, STDBY, SKIP to AGND.................................-0.3V to +6V
REFIN, FB, PGOOD1,
VTTR to AGND ..........................................-0.3V to (V
CSL
PGND1, PGND2 to AGND.....................................-0.3V to +0.3V
Continuous Power Dissipation (T = +70°C)
A
PGOOD2 to AGND ................................-0.3V to (V
CSH, CSL to AGND....................................-0.3V to (V
DL to PGND1..............................................-0.3V to (V
BST to PGND1...........................................................-1V to +34V
BST to LX..................................................................-0.3V to +6V
+ 0.3V)
+ 0.3V)
+ 0.3V)
24-Pin, 4mm x 4mm Thin QFN
CC
CC
DD
(derated 27.8mW/°C above +70°C)..........................2222mW
Operating Temperature Range ...........................-40°C to +85°C
Junction Temperature......................................................+150°C
Storage Temperature Range.............................-65°C to +150°C
Lead Temperature (soldering, 10s) .................................+300°C
Soldering Temperature (reflow) .......................................+260°C
DH to LX....................................................-0.3V to (V
+ 0.3V)
BST
BST to V .............................................................-0.3V to +28V
DD
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(V = 12V, V
= V
= V
= V
= 5V, V
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.
CSL A
IN
CC
DD
SHDN
REFIN
Typical values are at T = +25°C.) (Note 1)
A
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
PWM CONTROLLER
V
3
26
5.5
IN
Input Voltage Range
V
V
V
, V
CC DD
4.5
FB = AGND
FB = V
1.485
1.782
0.99
1
1.500
1.800
1.000
1.515
1.818
1.01
2.7
V
= 4.5V to 26V,
IN
Output-Voltage Accuracy
V
CSL
CC
SKIP = V
CC
FB = Adj
Output-Voltage Range
Load Regulation Error
Line Regulation Error
Soft-Start Ramp Time
Soft-Stop Ramp Time
Soft-Stop Threshold
V
CSL
V
V
CSH
- V
CSL
= 0 to 18mV, SKIP = V
CC
0.1
0.25
1.4
2.8
25
%
V
DD
= 4.5V to 5.5V, V = 4.5V to 26V
%
IN
t
Rising edge of SHDN
Falling edge of SHDN
2.1
ms
ms
mV
SSTART
t
SSTOP
R
= 96.75kꢀ (600kHz),
TON
-15
-10
-15
+15
+10
+15
167ns nominal
V
V
= 12V,
= 1.2V
R
TON
= 200kꢀ (300kHz),
IN
On-Time Accuracy (Note 2)
t
%
ON
333ns nominal
CSL
R
TON
= 303.25kꢀ
(200kHz), 500ns nominal
2
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
ELECTRICAL CHARACTERISTICS (continued)
(V = 12V, V
IN
= V
= V
= V
= 5V, V
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.
CSL A
CC
DD
SHDN
REFIN
Typical values are at T = +25°C.) (Note 1)
A
PARAMETER
Minimum Off-Time
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
t
(Note 2)
FB forced above 1.0V, STDBY = AGND or
= +25°C
250
350
ns
OFF(MIN)
Quiescent Supply Current (V
)
I
0.01
2
1.00
4
μA
mA
μA
μA
μA
DD
DD
CC
V
T
A
CC,
FB forced above 1.0V (PWM, VTT, and
VTTR blocks); STDBY = V
CC
Quiescent Supply Current (V
Shutdown Supply Current
)
CC
I
FB forced above 1.0V (PWM and VTTR
blocks); STDBY = AGND
900
0.01
0.01
1500
5
I
I
SHDN = AGND, T = +25°C
A
CC + DD
(V + V
)
CC
DD
SHDN = AGND, V = 26V, V = 0 or 5V,
IN
DD
TON Shutdown Current
I
1.00
TON
T
A
= +25°C
LINEAR REGULATOR (VTT)
VTTI Input Voltage Range
VTTI Supply Current
V
1.0
2.8
50
V
TTI
I
VTTI = 2.8V, REFIN = 1.4V, no load
SHDN = AGND, T = +25°C
10
μA
μA
nA
V
VTTI
VTTI Shutdown Current
REFIN Input Bias Current
REFIN Range
10
A
VTTI = 2.8V, REFIN = 1.4V, T = +25°C
A
-50
0.5
+50
1.5
V
REFIN
V
0.3
-
CC
REFIN Disable Threshold
V
High-side on-resistance
0.12
0.18
0.25
0.36
+5
(source, I
= 0.1A)
VTT Internal MOSFET
ꢀ
VTT
Low-side on-resistance (sink, I
= 0.1A)
VTT
V
= 1V,
= +50μA
REFIN
-5
-5
(V
(V
- 5mV) or
/2 - 5mV) to
REFIN
I
VTT
VTT Output-Accuracy
Source Load
mV
mV
CSL
V
= 0.5V to 1.5V,
= 1V,
REFIN
VTTS, VTT = VTTS
-5
I
= +300mA
VTT
V
REFIN
+5
17
(V
(V
+ 5mV) or
/2 + 5mV) to
REFIN
I
= -50μA
VTT
VTT Output-Accuracy
Sink Load
CSL
V
= 0.5V to 1.5V,
= -300mA
REFIN
VTTS, VTT = VTTS
+5
I
VTT
VTT Load Regulation
VTT Line Regulation
-50μA to -1A ꢀ I
ꢀ +50μA to +1A
13
1
mV/A
mV
VTT
1.0V ꢀ V ꢀ 2.8V, I
= 100mA
TTI
VTT
Source
Sink
2
4
VTT Current Limit
A
-4
-2
VTT Current-Limit Soft-Start Time
VTT Discharge MOSFET
VTTS Input Current
With respect to internal VTT_EN signal
OVP = V
160
16
μs
ꢀ
CC
T
A
= +25°C
0.1
1.0
μA
Maxim Integrated
3
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
ELECTRICAL CHARACTERISTICS (continued)
(V = 12V, V
IN
= V
= V
= V
= 5V, V
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.
CSL A
CC
DD
SHDN
REFIN
Typical values are at T = +25°C.) (Note 1)
A
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
REFERENCE BUFFER (VTTR)
I
I
I
I
=
=
=
=
1mA
3mA
1mA
3mA
-10
-20
-10
-20
+10
+20
+10
+20
VTT
VTT
VTT
VTT
VTTR Output Accuracy (Adj)
VTTR Output Accuracy (Preset)
REFIN to VTTR
mV
mA
V
CSL
/2 to VTTR
VTTR Maximum
Recommended Current
Source/sink
5
FAULT DETECTION (SMPS)
SMPS OVP and PGOOD1
Upper Trip Threshold
12
15
10
18
%
SMPS OVP and PGOOD1
Upper Trip Threshold
Fault-Propagation Delay
t
FB forced 25mV above trip threshold
Measured at FB, hysteresis = 25mV
μs
OVP
SMPS Output Undervoltage
Fault-Propagation Delay
t
200
-15
10
μs
%
UVP
SMPS PGOOD1 Lower Trip
Threshold
-12
-18
PGOOD1 Lower Trip Threshold
Propagation Delay
FB forced 50mV below PGOOD1 trip
threshold
t
I
μs
V
PGOOD1
PGOOD1
PGOOD1 Output Low Voltage
I
= 3mA
0.4
1
SINK
FB = 1V (PGOOD1 high impedance),
PGOOD1 forced to 5V, T = +25°C
A
PGOOD1 Leakage Current
μA
Rising edge, PWM disabled below this level;
hysteresis = 200mV
TON POR Threshold
V
3.0
V
POR(IN)
PGOOD2
PGOOD2
FAULT DETECTION (VTT)
PGOOD2 Upper Trip Threshold
PGOOD2 Lower Trip Threshold
Hysteresis = 25mV
Hysteresis = 25mV
8
10
13
-8
%
%
-13
-10
VTTS forced 50mV beyond PGOOD2
trip threshold
PGOOD2 Propagation Delay
t
I
10
5
μs
VTTS forced 50mV beyond PGOOD2
trip threshold
PGOOD2 Fault Latch Delay
PGOOD2 Output Low Voltage
PGOOD2 Leakage Current
ms
V
I
= 3mA
0.4
1
SINK
VTTS = V
(PGOOD2 high impedance),
REFIN
μA
PGOOD2 forced to 5V, T = +25°C
A
FAULT DETECTION
Thermal-Shutdown Threshold
T
Hysteresis = 15°C
160
4.1
16
°C
V
SHDN
V
CC
Undervoltage Lockout
Rising edge, IC disabled below this level
hysteresis = 200mV
V
3.8
4.4
UVLO(VCC)
Threshold
CSL Discharge MOSFET
OVP = V
ꢀ
CC
4
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
ELECTRICAL CHARACTERISTICS (continued)
(V = 12V, V
IN
= V
= V
= V
= 5V, V
= 1.8V, STDBY = SKIP = AGND, T = 0°C to +85°C, unless otherwise noted.
CSL A
CC
DD
SHDN
REFIN
Typical values are at T = +25°C.) (Note 1)
A
PARAMETER
CURRENT LIMIT
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
Valley Current-Limit Threshold
V
V
V
- V
- V
17
20
25
mV
mV
LIMIT
CSH
CSL
Current-Limit Threshold
(Negative)
V
, SKIP = V
-23
NEG
CSH
CSL
CC
Current-Limit Threshold
(Zero Crossing)
V
V
- V
LX
1
mV
ZX
PGND1
SMPS GATE DRIVERS
DH Gate-Driver On-Resistance
R
BST - LX forced to 5V
DL high
1.5
1.5
0.6
5.0
5.0
3.0
ꢀ
ꢀ
DH
DL Gate-Driver On-Resistance
R
DL
DL low
DH Gate-Driver Source/
Sink Current
I
DH forced to 2.5V, BST - LX forced to 5V
1
A
A
DH
I
I
DL forced to 2.5V
DL forced to 2.5V
1
3
DL Gate-Driver Source/
Sink Current
DL(SRC)
DL(SNK)
DL rising, T = +25°C
10
15
25
35
A
Dead Time
t
ns
ꢀ
DEAD
DL falling, T = +25°C
A
Internal BST Switch
On-Resistance
I
= 10mA,
BST
R
4.5
BST
V
DD
= 5V internal design target
V
= V = 26V, SHDN = AGND,
= +25°C
BST
LX
LX, BST Leakage Current
INPUTS AND OUTPUTS
Logic-Input Threshold
0.001
20
μA
T
A
SHDN, STDBY, SKIP, OVP, rising edge
hysteresis = 300mV/600mV (min/max)
1.30
1.65
55
2.00
+1
V
SHDN, STDBY, SKIP = 0 or V
,
CC
Logic-Input Current
-1
-1
μA
T
A
= +25°C
Input Leakage Current
Input Bias Current
CSH = 0 or V , T = +25°C
+1
μA
μA
CC
A
CSL = 0 or V
100
CC
Maxim Integrated
5
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
ELECTRICAL CHARACTERISTICS
(V = 12V, V = V = V
= V
= 5V, V
= 1.8V, STDBY = SKIP = AGND, T = -40°C to +85°C, unless otherwise noted.)
CSL A
IN
CC
DD
SHDN
REFIN
(Note 1)
PARAMETER
SYMBOL
CONDITIONS
MIN
MAX
UNITS
PWM CONTROLLER
V
3
26
IN
Input Voltage Range
V
V
V
, V
CC DD
4.5
5.5
FB = AGND
FB = V
1.485
1.782
0.990
1.520
1.820
1.020
V
= 4.5V to 26V,
IN
Output-Voltage Accuracy
V
CSL
CC
SKIP = V
CC
FB = Adj
= 96.75kꢀ
R
TON
(600kHz), 167ns
nominal
-15
-10
-15
+15
+10
+15
R
TON
= 200kꢀ
V
V
= 12V,
IN
On-Time Accuracy (Note 2)
t
%
(300kHz), 333ns
nominal
ON
= 1.2V
CSL
R
TON
= 303.25kꢀ
(200kHz), 500ns
nominal
Minimum Off-Time
t
(Note 2)
FB forced above 1.0V (PWM, VTT, and
VTTR blocks); STDBY = V
350
4
ns
OFF(MIN)
mA
CC
Quiescent Supply Current (V
)
CC
I
CC
FB forced above 1.0V (PWM and VTTR
blocks); STDBY = AGND
1500
μA
LINEAR REGULATOR (VTT)
VTTI Input Voltage Range
VTTI Supply Current
V
1.0
0.5
2.8
50
V
μA
V
VTTI
I
VTTI = 2.8V, REFIN = 1.4V, no load
VTTI
REFIN Range
V
1.5
REFIN
V
0.3
-
CC
REFIN Disable Threshold
V
High-side on-resistance (source, I
= 0.1A)
0.25
0.36
17
VTT
VTT Internal MOSFET
VTT Load Regulation
ꢀ
Low-side on-resistance (sink, I
= 0.1A)
VTT
-50μA to -1A ꢀ I
ꢀ +50μA to +1A
mV/A
VTT
6
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
ELECTRICAL CHARACTERISTICS (continued)
(V = 12V, V = V = V
= V
= 5V, V
= 1.8V, STDBY = SKIP = AGND, T = -40°C to +85°C, unless otherwise noted.)
CSL A
IN
CC
DD
SHDN
REFIN
(Note 1)
PARAMETER
SYMBOL
CONDITIONS
MIN
MAX
UNITS
REFERENCE BUFFER (VTTR)
I
I
I
I
=
=
=
=
1mA
3mA
1mA
3mA
-10
-20
-10
-20
+10
+20
+10
+20
VTT
VTT
VTT
VTT
VTTR Output Accuracy (Adj)
REFIN to VTTR
mV
mV
VTTR Output Accuracy (Preset)
V
CSL
/2 to VTTR
FAULT DETECTION (SMPS)
PGOOD1 Output Low Voltage
FAULT DETECTION (VTT)
PGOOD2 Output Low Voltage
FAULT DETECTION
I
I
= 3mA
= 3mA
0.4
0.4
V
V
SINK
SINK
V
Undervoltage-Lockout
Rising edge, IC disabled below this level;
hysteresis = 200mV
CC
V
4.0
15
4.4
25
V
UVLO(VCC)
Threshold
CURRENT LIMIT
Valley Current-Limit Threshold
SMPS GATE DRIVERS
DH Gate-Driver On-Resistance
V
LIMIT
V
CSH
- V
CSL
mV
R
DH
BST - LX forced to 5V
DL high
5
5
3
ꢀ
ꢀ
DL Gate-Driver On-Resistance
R
DL
DL low
DL rising
10
15
Dead Time
t
ns
DEAD
DL falling
INPUTS AND OUTPUTS
Logic-Input Threshold
SHDN, STDBY, SKIP OVP, rising edge
hysteresis = 300mV/600mV (min/max)
1.3
2
V
Note 1: Limits are 100% production tested at T = +25°C. Maximum and minimum limits over temperature are guaranteed by design
A
and characterization.
Note 2: On-time and off-time specifications are measured from 50% point at the DH pin with LX = GND, V
= 5V, and a 250pF
BST
capacitor connected from DH to LX. Actual in-circuit times might differ due to MOSFET switching speeds.
Maxim Integrated
7
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Typical Operating Characteristics
(MAX17000A Circuit of Figure 1, V = 12V, V
IN
= V
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)
DD
CC
A
SMPS 1.5V EFFICIENCY
vs. LOAD CURRENT
SMPS 1.5V EFFICIENCY
vs. LOAD CURRENT
SMPS 1.5V EFFICIENCY
vs. LOAD CURRENT
100
100
90
80
70
60
50
40
30
20
10
100
90
80
70
60
50
40
30
20
10
SKIP MODE
STDBY = LOW
SKIP MODE
STDBY = LOW
SKIP MODE
STDBY = LOW
90
80
70
SKIP MODE
SKIP MODE
STDBY = HIGH
60
50
40
30
20
10
STDBY = HIGH
PWM MODE
PWM MODE
STDBY = HIGH OR LOW
STDBY = HIGH OR LOW
SKIP MODE
STDBY = HIGH
PWM MODE
STDBY = HIGH OR LOW
V
IN
= 7V
V
IN
= 12V
V = 20V
IN
0.01
0.1
1
10
0.01
0.1
1
10
0.01
0.1
1
10
LOAD CURRENT (A)
LOAD CURRENT (A)
LOAD CURRENT (A)
SMPS 1.5V OUTPUT VOLTAGE
vs. LOAD CURRENT
SMPS SWITCHING FREQUENCY
vs. LOAD CURRENT
SMPS VALLEY-CURRENT LIMIT
vs. INPUT VOLTAGE
1.51
1.50
1.49
350
300
250
10.50
10.25
10.00
PWM MODE
R
= 2mΩ
SENSE
SKIP MODE
PWM MODE
200
150
100
50
SKIP MODE
9.75
9.50
V
V
= 12V
IN
= 1.5V
V
IN
= 12V
OUT
0
0.001
0.01
0.1
1
10
0
2
4
6
8
10
4
8
12
16
20
24
28
LOAD CURRENT (A)
LOAD CURRENT (A)
INPUT VOLTAGE (V)
NO-LOAD SUPPLY CURRENT
vs. INPUT VOLTAGE
PRESET 1.5V OUTPUT
VOLTAGE DISTRIBUTION
100
10
50
SAMPLE SIZE = 150
T
A
T
A
= +85°C
NO LOAD
= +25°C
PWM MODE, I + I
CC DD
40
30
20
10
PWM MODE, I
IN
STDBY = HIGH, SKIP MODE, I + I
CC DD
1
0.1
STDBY = LOW, SKIP MODE, I + I
CC DD
SKIP MODE, I
IN
0.01
0
4
8
12
16
20
24
28
1.490
1.495
1.500
1.505
1.510
INPUT VOLTAGE (V)
OUTPUT VOLTAGE (V)
8
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Typical Operating Characteristics (continued)
(MAX17000A Circuit of Figure 1, V = 12V, V
IN
= V
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)
DD
CC
A
STARTUP WAVEFORM
SHUTDOWN WAVEFORM
STANDBY TRANSITION WAVEFORM
(HEAVY LOAD)
(DISCHARGE MODE ENABLED)
MAX17000A toc11
MAX17000A toc09
MAX17000A toc10
I
= 50mA
VTT
STDBY
DL
SHDN
VDDQ
VDDQ
VTT
VDDQ
VTTR
TON
DL
VTT
PGOOD2
PGOOD1
VTT
VTTR
PGOOD1
LX
SHDN
I
LX
I
LX
I
LX
DL
100μs/div
200μs/div
PGOOD1: 2V/div
400μs/div
STDBY: 5V/div
VDDQ: 1V/div
VTT: 1V/div
TON: 1V/div
DL: 5V/div
LX: 10V/div
SHDN: 5V/div
R
= 0.25Ω
DL: 5V/div
PGOOD2: 5V/div
PGOOD1: 5V/div
SHDN: 10V/div
LOAD
VDDQ: 500mV/div
VTT: 500mV/div
VTTR: 500mV/div
I
: 5A/div
SKIP = GND
VDDQ: 2V/div
VTT: 1V/div
VTTR: 1V/div
LX
DL: 5V/div
I
: 2A/div
I
LX
: 2A/div
LX
SMPS LOAD-TRANSIENT RESPONSE
SMPS LOAD-TRANSIENT RESPONSE
STANDBY TRANSITION WAVEFORM
(PWM MODE)
(SKIP MODE)
MAX17000A toc12
MAX17000A toc13
MAX17000A toc14
STDBY
VDDQ
VDDQ
LX
VDDQ
LX
VTT
TON
DL
LX
I
I
LOAD
LOAD
I
LX
I
LX
I
LX
10μs/div
20μs/div
20μs/div
STDBY: 5V/div
VDDQ: 1V/div
VTT: 1V/div
DL: 5V/div
LX: 10V/div
VDDQ: 50mV/div
LX: 10V/div
I
I
: 5A/div
: 5A/div
VDDQ: 50mV/div
LX: 10V/div
I : 5A/div
LOAD
LOAD
LX
I
LX
: 5A/div
I : 2A/div
LX
TON: 1V/div
Maxim Integrated
9
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Typical Operating Characteristics (continued)
(MAX17000A Circuit of Figure 1, V = 12V, V
IN
= V
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)
DD
CC A
VTT VOLTAGE
vs. SOURCE/SINK LOAD CURRENT
VTT OFFSET VOLTAGE DISTRIBUTION
AT 300mA LOAD
OUTPUT OVERLOAD WAVEFORM
MAX17000A toc15
0.79
50
SAMPLE SIZE = 150
T
A
T
A
= +85°C
= +25°C
DL
0.78
0.77
0.76
0.75
40
30
20
10
VDDQ
VTT
VTTR
PGOOD2
PGOOD1
0.74
0.73
0.72
I
LX
V
= 1.5V
TTI
0
400μs/div
-2.0 -1.5 -1.0 -0.5
0
0.5 1.0 1.5 2.0
-15.0
-12.5
-10.0
-7.5
-5.0
DL: 5V/div
PGOOD2: 2V/div
PGOOD1: 2V/div
LOAD CURRENT (A)
OFFSET VOLTAGE (mV)
VDDQ: 1V/div
VTT: 1V/div
VTTR: 1V/div
I
LX
: 10A/div
VTT OVERLOAD FAULT WAVEFORMS
VTT SOURCE CURRENT LIMIT
VTT SINK CURRENT LIMIT
(5ms TIMER)
MAX17000A toc20
50
50
SAMPLE SIZE = 150
T
A
T
A
= +85°C
= +25°C
SAMPLE SIZE = 150
T
A
T
A
= +85°C
DL
= +25°C
40
30
20
10
40
30
20
10
I
LX
VDDQ
VTT
VTTR
PGOOD1
PGOOD2
0
0
2.0
2.5
3.0
3.5
4.0
-4.0
-3.5
-3.0
-2.5
-2.0
1ms/div
DL: 5V/div
: 2A/div
VDDQ: 2V/div
VTT: 1V/div
VTTR: 1V/div
PGOOD1: 2V/div
PGOOD2: 2V/div
CURRENT LIMIT (A)
CURRENT LIMIT (A)
I
LX
10
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Typical Operating Characteristics (continued)
(MAX17000A Circuit of Figure 1, V = 12V, V
= V
= 5V, SKIP = GND, T = +25°C, unless otherwise noted.)
IN
DD
CC
A
VTT LOAD-TRANSIENT RESPONSE (SOURCE)
BETWEEN 10mA AND 1.5A
VTT LOAD-TRANSIENT RESPONSE
I
(SINK)
VTT
MAX17000A toc21
MAX17000A toc22
I
VTT
I
VTT
VTT_ac
VTT_ac
VDDQ = 1.5V
VDDQ = 1.5V
20μs/div
20μs/div
I
: 1A/div
I
: 1A/div
VTT
VTT
VTT: 20mV/div
VTT: 20mV/div
VTT LOAD-TRANSIENT RESPONSE
(SOURCE-SINK)
VTTR OUTPUT VOLTAGE
vs. LOAD CURRENT
MAX17000A toc23
0.79
0.78
0.77
0.76
I
VTT
0.75
0.74
0.73
VTT_ac
0.72
0.71
0.70
VDDQ = 1.5V
20μs/div
-6
-4
-2
0
2
4
6
I
: 1A/div
VTT
LOAD CURRENT (mA)
VTT: 50mV/div
Maxim Integrated
11
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Pin Description
PIN
NAME
FUNCTION
OVP Mode Control. This input selectively enables/disables the SMPS OV protection feature and
output discharge mode. When enabled, the SMPS OV protection feature is enabled. Connect OVP to
the following voltage levels for the desired function:
1
OVP
High (> 2.4V) = Enable SMPS OV protection, and SMPS and VTT discharge FETs.
Low (GND) = Disable SMPS OV protection, and SMPS and VTT discharge FETs.
Open-Drain Power-Good Output. PGOOD1 is low when the SMPS output voltage is more than 15%
(typ) beyond the normal regulation point, in standby, in shutdown, and during soft-start.
After the soft-start circuit has terminated, PGOOD1 becomes high impedance if the SMPS output is
in regulation.
2
3
PGOOD1
PGOOD2
Open-Drain Power-Good Output. PGOOD2 is low when the VTT output voltage is more than 10% (typ)
beyond the normal regulation point, in standby, in shutdown, and during soft-start.
After the SMPS soft-start circuit has terminated, PGOOD2 becomes high impedance if the VTT output
is in regulation.
Standby Control Input. When SHDN is high and STDBY is low, the MAX17000A turns off the VTT output
(high-Z). When STDBY is high, normal SMPS operation resumes and the VTT output is enabled.
4
5
STDBY
Sense Pin for Termination Supply Output. Normally connected to the VTT pin to allow accurate
VTTS
regulation to V
/2 or the REFIN voltage.
CSL
Termination Reference Buffer Output. VTTR tracks V
/2 when REFIN is connected to V . VTTR
CC
CSL
6
VTTR
tracks V
when a voltage between 0.5V to 1.5V is set at REFIN. Decouple VTTR to AGND with a
REFIN
0.33μF ceramic capacitor.
7
8
PGND2
VTT
Power Ground for VTT. Connect PGND2 externally to the underside of the exposed pad.
Termination Power-Supply Output. Connect VTT to VTTS to regulate the VTT voltage to the VTTS
regulation setting.
Termination Power-Supply Input. VTTI is the input power supply to the VTT linear regulator. Normally
connected to the output of the SMPS regulator for DDR applications.
9
VTTI
External Reference Input. REFIN sets the feedback regulation voltage (VTTR = VTTS = V
MAX17000A.
) of the
REFIN
10
REFIN
Connect REFIN to V to use the internal V
/2 divider.
CC
CSL
Connect a 0.5V to 1.5V voltage input to set the adjustable output for VTT, VTTS, and VTTR.
Feedback Input for SMPS Output. Connect to V for a fixed +1.8V output or to AGND for a fixed
CC
+1.5V output. For an adjustable output (1.0V to 2.7V), connect FB to a resistive divider from the
output voltage. FB regulates to +1.0V.
11
12
13
FB
Negative Input of the PWM Output Current-Sense and Supply Input for VTTR. Connect CSL to the
negative side of the output current-sensing resistor or the filtering capacitor if the DC resistance of
the output inductor is utilized for current sensing.
CSL
CSH
CSL is also the path for the internal 16ꢀ discharge MOSFET when V UVLO occurs with OVP enabled.
CC
Positive Input of the PWM Output Current Sense. Connect CSH to the positive side of the output
current-sensing resistor or the filtering capacitor if the DC resistance of the output inductor is
utilized for current sensing.
12
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Pin Description (continued)
PIN
NAME
FUNCTION
Switching Frequency Setting Input. An external resistor between the input power source and this
pin sets the switching frequency per phase according to the following equation:
T
= C
TON
x (R
+ 6.5kꢀ)
SW
TON
TON
14
TON
where C
= 16.26pF.
TON is high impedance in shutdown.
15
16
DH
LX
High-Side Gate-Driver Output. Swings from LX to BST. DH is low when in shutdown or UVLO.
Inductor Connection. Connect LX to the switched side of the inductor as shown in Figure 1.
Boost Flying Capacitor Connection. Connect to an external 0.1μF, 6V capacitor as shown in Figure
1. The MAX17000A contains an internal boost switch.
17
18
BST
DL
Synchronous-Rectifier Gate-Driver Output. DL swings from V
to PGND1.
DD
Supply Voltage Input for the DL Gate Driver and 3.3V Reference/Analog Supply. Connect to the
system supply voltage (+4.5V to +5.5V). Bypass V to power ground with a 1μF or greater
DD
19
V
DD
ceramic capacitor.
20
21
PGND1
AGND
Power Ground. Ground connection for the low-side MOSFET gate driver.
Analog Ground. Connect backside exposed pad to AGND.
Pulse-Skipping Control Input. This input determines the mode of operation under normal steady-
state conditions and dynamic output-voltage transitions:
High (> 2.4V) = Forced-PWM operation
22
23
SKIP
Low (AGND) = Pulse-skipping mode
Controller Supply Voltage. Connect to a 4.5V to 5.5V source. Bypass V to AGND with a 1μF or
CC
greater ceramic capacitor.
V
CC
Shutdown Control Input. Connect to V for normal operation. When SHDN is pulled low, the
CC
MAX17000A slowly ramps down the output voltage to ground. When the internal target voltage
reaches 25mV, the controller forces DL low, and enters the low current (1μA) shutdown state.
When discharge mode is enabled by OVP (OVP = high), the CSL and VTT internal 16ꢀ discharge
MOSFETs are enabled in shutdown. When discharge mode is disabled by OVP (OVP = low), LX,
VTT, and VTTR are high impedance in shutdown.
24
—
SHDN
A rising edge on SHDN clears the fault OV protection latch.
Exposed Pad. Connect backside exposed pad to AGND.
EP
Maxim Integrated
13
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
DDR2, or DDR3 in a notebook computer. See Table 1 for
component selections. Table 2 lists the component man-
ufacturers. Table 3 is the operating mode truth table.
Standard Application Circuits
The MAX17000A standard application circuit (Figure 1)
generates the VDDQ, VTT, and VTTR rails for DDR,
Table 1. Component Selection for Standard Applications
V
= 1.5V TO 1.8V AT 10A
V
= 1.5V TO 1.8V AT 6A
OUT
OUT
COMPONENT
V
= 7V TO 20V (±00kHz)
V
= 7V TO 16V (500kHz)
IN
IN
(2x) 10μF, 25V
Taiyo Yuden TMK432BJ106KM
10μF, 25V
Taiyo Yuden TMK432BJ106KM
Input Capacitor
(2x) 330μF, 2.5V ,12mΩ (C2 case)
SANYO 2R5TPE330MCC2
(2x) 220μF, 2.5V, 21mΩ (B2 case)
SANYO 2R5TPE220MLB
Output Capacitor
Inductor
1.4μH, 12A, 3.4mΩ (typ)
Sumida CDEP105(L)NP-1R4
1.4μH, 12A, 3.4mΩ (typ)
Sumida CDEP105(L)NP-1R4
2mΩ, 0.5W (2010)
Vishay WSL20102L000FEA
3mΩ, 0.5W (2010)
Vishay WSL20103L000FEA
Current-Sensing Resistor
30V, 20A n-channel MOSFET (high side)
Fairchild FDMS8690;
30V, 40A n-channel MOSFET (low side)
Fairchild FDMS8660S
30V 20A n-channel MOSFET (high side)
Fairchild FDMS8690;
30V 40A n-channel MOSFET (low side)
Fairchild FDMS8660S
MOSFETs
Table 2. Component Suppliers
SUPPLIER
PHONE
WEꢀSITE
INDUCTORS
Dale (Vishay)
402-563-6866 (USA)
510-324-4110 (USA)
www.vishay,com
NEC/TOKIN America, Inc.
www.nec-tokinamerica.com
Panasonic Corp.
Sumida Corp.
65-231-3226 (Singapore), 408-749-9714 (USA)
408-982-9660 (USA)
www.panasonic.com
www.sumida.com
www.tokoam.com
TOKO America, Inc.
CAPACITORS
858-675-8013 (USA)
AVX Corp.
843-448-9411 (USA)
www.avxcorp.com
KEMET Corp.
408-986-0424 (USA)
www.kemet.com
Panasonic Corp.
SANYO Electric Co., Ltd.
Taiyo Yuden
65-231-3226 (Singapore), 408-749-9714 (USA)
81-72-870-6310 (Japan), 619-661-6835 (USA)
03-3667-3408 (Japan), 408-573-4150 (USA)
847-803-6100 (USA), 81-3-5201-7241 (Japan)
www.panasonic.com
www.sanyodevice.com
www.t-yuden.com
TDK Corp.
www.component.tdk.com
SENSING RESISTORS
Vishay
402-563-6866 (USA)
800-341-0392 (USA)
www.vishay,com
MOSFET
Fairchild Semiconductor
DIODES
www.fairchildsemi.com
Central Semiconductor Corp.
Nihon Inter Electronics Corp.
631-435-1110
www.centralsemi.com
www.niec.co.jp
81-3-3343-84-3411 (Japan)
14
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Table ±. Operating Mode Truth Table
SHDN STDBY SKIP
OPERATION
SMPS output ramps up in skip mode with a 1.4ms (typ) ramp time. PGOOD1 is held low until the
SMPS output is in regulation.
1
2
L ꢁ H L ꢁ H
X
X
VTT and VTTR ramp up to the final voltage based on V
VTT is in regulation.
/2 or V
. PGOOD2 is held low until
REFIN
CSL
SMPS output ramps up in skip mode with a 1.4ms ramp time. PGOOD1 is held low until the SMPS
output is in regulation.
VTT remains off throughout since STDBY is low. PGOOD2 stays low throughout.
L ꢁ H
L
VTTR ramps up to the final voltage based on V
/2 or V
.
REFIN
CSL
Standby mode is exited and the full current capability of the MAX17000A is available.
VTT ramps up after the internal SMPS block is ready. VTT ramps to the final voltage based on
3
4
5
6
7
H
H
H
H
H
L ꢁ H
X
H
L
V
CSL
/2 or V
.
REFIN
PGOOD2 goes high when VTT is in regulation.
SMPS is in forced-PWM mode.
VTT and VTTR are enabled.
PGOOD1 is high when the SMPS output is in regulation.
PGOOD2 is high when VTT is in regulation.
H
H
L
SMPS is in skip mode.
VTT and VTTR are enabled.
PGOOD1 is high when the SMPS output is in regulation.
PGOOD2 is high when VTT is in regulation.
SMPS is in forced-PWM mode.
VTT is off and is in high impedance.
PGOOD2 is forced low.
H
L
VTTR is active and regulates to V
/2 or V
.
CSL
REFIN
SMPS is in skip mode.
VTT is off and is high impedance.
PGOOD2 is forced low.
L
VTTR is active and regulates to V
/2 or V
.
CSL
REFIN
Skip mode is exited as the MAX17000A ramps the output down to zero.
VTTR tracks V /2 or V during shutdown. After the SMPS output reaches 25mV, DL goes low.
8
9
H ꢁ L
H ꢁ L
L
H
L
X
X
X
CSL
REFIN
Skip mode is exited as the MAX17000A ramps the output down to zero.
VTTR tracks V /2 or V during shutdown. After the SMPS output reaches 25mV, DL goes
CSL
REFIN
low. VTT is not enabled throughout soft-shutdown.
DL low. Internal16ꢀ discharge MOSFETs on CSL and VTT enabled if OVP is high, but disabled if
OVP is low.
10
X
Maxim Integrated
15
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
R
V
C
IN
R
=
R
DCR
CS
R
TON
7V TO 20V
R
+ R
C
14
EQ
1
TON
OVP
+5V
17
15
L1 ( 1 1 )
+
R
=
x
DCR
BST
DH
R3
100kΩ
R2
100kΩ
C
IN
C
EQ
R
R
EQ
C
N
H
2
3
C
PGOOD1
PGOOD2
BST
VDDQ
+1.8V OR 1.5V
0.1μF
L1
16
LX
R
R
EQ
C
18
20
N
L
19
C
OUT
DL
D1
+5V
V
DD
C
VDD
PGND1
1μF
PGND
R1
10Ω
13
12
C
EQ
CSH
CSL
23
21
V
5V V
CC
CC
C
VCC
1μF
MAX17000A
R
FBA
FBB
FB OPTIONS:
AGND
11
1. CONNECT FB TO 5V FOR FIXED +1.8V.
2. CONNECT FB TO GND FOR FIXED +1.5V.
3. USE FB RESISTOR-DIVIDER FOR ADJUSTABLE
OUTPUT VOLTAGES.
FB
AGND
R
4
24
22
SLP_S3#
ON/OFF
STDBY
SHDN
SKIP
9
7
VTTI
+1V TO + 2.5V
C
VTTI
VTT
PGND2
C
10
V
CC
REFIN
8
5
6
VTT
VTTS
VTTR
VTT = VDDQ/2
VTTR = VDDQ/2
C
VTTR
0.33μF
EP
Figure 1. MAX17000A Standard Application Circuit
The MAX17000A includes a 2A source-sink LDO reg-
ulator for the memory termination rail. The source-sink
regulator features a dead band that either sources or
sinks, ideal for the fast-changing short-period loads
presenting in memory termination applications. This
feature also reduces the VTT output capacitance
requirement down to 1μF, though load-transient
response can still require higher capacitance values
between 10μF and 20μF.
Detailed Description
The MAX17000A complete DDR solution comprises a
step-down controller, a source-sink LDO regulator, and a
reference buffer. Maxim’s proprietary Quick-PWM pulse-
width modulator in the MAX17000A is specifically
designed for handling fast load steps while maintaining a
relatively constant operating frequency and inductor
operating point over a wide range of input voltages. The
Quick-PWM architecture circumvents the poor load-tran-
sient timing problems of fixed-frequency current-mode
PWMs, while also avoiding the problems caused by
widely varying switching frequencies in conventional con-
stant-on-time and constant-off-time PWM schemes.
Figure 1 is the MAX17000A standard application circuit
and Figure 2 is the MAX17000A functional diagram.
The reference buffer sources and sinks 3mA, generating
a reference rail for use in the memory controller and
memory devices.
16
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
TON
ON-TIME
t
OFF(MIN)
COMPUTE
CSL
Q
TRIG
BST
ONE-SHOT
TON
TRIG
ONE-SHOT
Q
DH
LX
S
R
Q
ERROR
AMP
V
DD
DL
S
R
Q
PGND1
SKIP
1.2V
SMPS FAULT
DETECTION
SMPS
FAULT
OVF
ZERO CROSSING
INT_FB
1mV
SMPS
FAULT
LATCH
OVP
CSL
CSH
VALLEY CURRENT LIMIT
VTT
FAULT
20mV
UVF
0.7V
10ms
TIMER
SMPS RUN
EA
SHDN
RUN
SOFT-START/
SOFT-STOP
1V REF
FB
DECODE
INT_FB
FB
POWER-GOOD1
PGOOD1
V
CC
OVF
1.15V
VTTR WINDOW
COMPARATOR
VTTR
INT_REF
VTT FAULT
MAX17000A
AGND
POWER-GOOD2
PGOOD2
VTT WINDOW
COMPARATOR
VTTS
VTTI
1.4ms
VTTI
VTT
VTT POS
CURRENT LIMIT
V
V
DD
5ms
TIMER
VTT
FAULT
VTT SS
CURRENT LIMIT
SMPS
FAULT
VTT
5mV
5mV
VTT_EN
VTT
VTT NEG
CURRENT LIMIT
STDBY
REFIN
DD
PGND2
V
- 0.3V
DD
PGND2
VTTR
VTT_EN
PGND2
CSL
R
CSL
VTT
CSL
V
CC
R
16Ω
UVLO
16Ω
RUN
OVP
PGND2
PGND1
Figure 2. MAX17000A Functional Diagram
Maxim Integrated
17
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
+5V Bias Supply (V , V
)
DD
CC
C
× (R
+ 6.5kΩ)× (V
+ 0.075V)
TON
TON
CSL
The MAX17000A requires an external 5V bias supply in
addition to the battery. Typically, this 5V bias supply is
the notebook’s 95% efficient 5V system supply.
Keeping the bias supply external to the IC improves
efficiency and eliminates the cost associated with the
5V linear regulator that would otherwise be needed to
supply the PWM circuit and gate drivers. If stand-alone
capability is needed, the 5V supply can be generated
with an external linear regulator such as the MAX1615.
t
=
ON
V
IN
1
f
=
SW
C
× (R
+ 6.5kΩ)
TON
TON
where C
= 16.26pF, and 0.075V is an approxima-
TON
tion to accommodate for the expected drop across the
low-side MOSFET switch. This algorithm results in a
nearly constant switching frequency despite the lack of
a fixed-frequency clock generator.
The 5V bias supply powers both the PWM controller
and internal gate-drive power, so the maximum current
drawn is:
For loads above the critical conduction point, where the
dead-time effect is no longer a factor, the actual switch-
ing frequency is:
I
= I + f
Q
= 2mA to 20mA (typ)
BIAS
Q
SW G(MOSFETs)
where I is the current for the PWM control circuit, f
Q
SW
is the switching frequency, and Q
total gate-charge specification limits at V
internal MOSFETs.
is the
G(MOSFETs)
V
+ V
DIS
OUT
f
=
= 5V for the
SW
GS
t
× (V − V
+ V
)
ON
IN
CHG
DIS
Free-Running Constant-On-Time PWM
Controller with Input Feed-Forward
where V
is the sum of the parasitic voltage drops in
DIS
the inductor discharge path, including synchronous
rectifier, inductor, and PCB resistances; V is the
The Quick-PWM control architecture is a pseudo-fixed-
frequency, constant on-time, current-mode regulator
with voltage feed-forward. This architecture utilizes the
output filter capacitor’s ESR to act as a current-sense
resistor, so the output ripple voltage can provide the
PWM ramp signal. In addition to the general Quick-
PWM, the MAX17000A also senses the inductor current
through DCR method or with a sensing resistor.
Therefore, it is less dependent on the output capacitor
ESR for stability. The control algorithm is simple: the
high-side switch on-time is determined solely by a one-
shot whose pulse width is inversely proportional to input
voltage and directly proportional to output voltage.
Another one-shot sets a minimum off-time (250ns typ).
The on-time one-shot is triggered if the error compara-
tor is low, the low-side switch current is below the valley
current-limit threshold, and the minimum off-time one-
shot has timed out.
CHG
sum of the parasitic voltage drops in the charging path,
including the high-side switch, inductor, and PCB resis-
tances; and t
MAX17000A.
is the on-time calculated by the
ON
Automatic Pulse-Skipping Mode
(SKIP = AGND)
In skip mode (SKIP = AGND), an inherent automatic
switchover to PFM takes place at light loads. This
switchover is affected by a comparator that truncates
the low-side switch on-time at the inductor current’s
zero crossing.
DC output-accuracy specifications refer to the thresh-
old of the error comparator. When the inductor is in
continuous conduction, the MAX17000A regulates the
valley of the output ripple, so the actual DC output volt-
age is higher than the trip level by 50% of the output
ripple voltage. In discontinuous conduction (SKIP =
On-Time One-Shot
The heart of the PWM core is the one-shot that sets the
high-side switch on-time. This fast, low-jitter, adjustable
one-shot includes circuitry that varies the on-time in
response to battery and output voltages. The high-side
switch on-time is inversely proportional to the battery
AGND and I
< I
), the output voltage has
LOAD(SKIP)
OUT
a DC regulation level higher than the error-comparator
threshold by approximately 1.5% due to slope compen-
sation. However, the internal integrator corrects for
most of it, resulting in very little load regulation.
The MAX17000A always uses skip mode during start-
up, regardless of the SKIP and STDBY setting. The
SKIP and STDBY controls take effect after soft-start is
done. See Figure 3.
voltage as measured by the V input, and proportional
IN
to the output voltage.
An external resistor between the input power source
and TON pin sets the switching frequency per phase
according to the following equation:
18
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
reverses at light loads while DH maintains a duty factor
of V /V . The benefit of forced-PWM mode is to keep
OUT IN
a fairly constant switching frequency. However, forced-
PWM operation comes at a cost: the no-load 5V bias
current remains between 2mA to 20mA, depending on
the switching frequency.
ΔI
Δt
V
- V
IN OUT
=
L
STDBY = AGND overrides the SKIP pin setting, forcing
the MAX17000A into standby.
I
PEAK
The MAX17000A switches to forced-PWM mode during
shutdown, regardless of the state of SKIP and STDBY
levels.
I
= I
/2
LOAD PEAK
Standby Mode (STDBY)
It should be noted that standby mode in the
MAX17000A corresponds to computer system standby
operation, and is not referring to the MAX17000A shut-
down status.
0
ON-TIME
TIME
Figure 3. Pulse-Skipping/Discontinuous Crossover Point
When standby mode is enabled (STDBY = AGND),
VTT is disabled (high impedance) but VTTR remains
active.
Forced-PWM Mode (SKIP = V
)
CC
The low-noise forced-PWM mode (SKIP = V ) disables
CC
When standby mode is disabled (STDBY = V ), the
CC
the zero-crossing comparator, which controls the low-
side switch on-time. This forces the low-side gate-drive
waveform to constantly be the complement of the high-
side gate-drive waveform, so the inductor current
VTT block is enabled and the VTT output capacitor is
charged. The VTT soft-start current limit increases lin-
early from zero to its maximum current limit in 160μs
(typ), keeping the input VTTI inrush low. See Figure 4.
STDBY
SMPS OUTPUT
VTTR OUTPUT
VTT HIGH-IMPEDANCE
VTT OUTPUT
VTT CURRENT LIMIT
160μs
PGOOD1
PGOOD2
STANDBY TIMING
Figure 4. MAX17000A Standby Mode Timing
Maxim Integrated
19
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
PGOOD2 is the open-drain output for a window com-
Valley Current-Limit Protection
The MAX17000A uses the same valley current-limit pro-
tection employed on all Maxim Quick-PWM controllers. If
the current exceeds the valley current-limit threshold,
the PWM controller is not allowed to initiate a new cycle.
The actual peak current is greater than the valley cur-
rent-limit threshold by an amount equal to the inductor
ripple current. Therefore, the exact current-limit charac-
teristic and maximum load capability are a function of
the inductor value and battery voltage. When combined
with the undervoltage-protection circuit, this current-limit
method is effective in almost every circumstance.
parator that continuously monitors the VTT output.
PGOOD2 is actively held low in standby, shutdown,
and during soft-start. PGOOD2 becomes high imped-
ance as long as the VTT output voltage is within 10%
of the regulation voltage. When the VTT output exceeds
the 10% threshold, the MAX17000A pulls PGOOD2
low. If PGOOD2 remains low for 5ms (typ), the
MAX17000A latches off with the soft-shutdown
sequence.
For logic-level output voltages, connect an external 100kΩ
pullup resistor from PGOOD1 and PGOOD2 to V
.
DD
In forced-PWM mode, the MAX17000A also implements
a negative current limit to prevent excessive reverse
POR, UVLO
rises above
Power-on reset (POR) occurs when V
CC
inductor currents when V
is sinking current. The
OUT
approximately 2V, resetting the fault latch and soft-start
circuit and preparing the controller for power-up. When
OVP protection is enabled, a rising edge on POR turns
on the 16Ω discharge MOSFET on CSL and VTT. When
OVP is disabled, the internal 16Ω discharge MOSFETs
on CSL and VTT also remain off.
negative current-limit threshold is set to approximately
115% of the positive current limit. See Figure 5.
I
I
PEAK
LOAD
V
undervoltage lockout (UVLO) circuitry inhibits
CC
switching until V
reaches 4.1V (typ). When V
rises
CC
CC
above 4.1V, the controller activates the PWM controller
and initializes soft-start. When V drops below the
CC
UVLO threshold (falling edge), the controller stops, DL
is pulled low, and the internal 16Ω discharge
MOSFETs on the CSL and VTT outputs are enabled, if
OVP is enabled.
I
LIMIT
LIR
2
I
= I
1-
( )
LIM(VAL) LOAD(MAX)
Soft-Start and Soft-Shutdown
Soft-start and soft-shutdown for the MAX17000A PWM
block is voltage based. Soft-start begins when SHDN is
driven high. During soft-start, the PWM output is
ramped up from 0V to the final set voltage in 1.4ms.
This reduces inrush current and provides a predictable
ramp-up time for power sequencing. The MAX17000A
always uses skip mode during startup, regardless of
the SKIP and STDBY setting. The SKIP and STDBY con-
trols take effect after soft-start is done.
0
TIME
Figure 5. Valley Current-Limit Threshold Point
Power-Good Outputs
(PGOOD1 and PGOOD2)
The MAX17000A features two power-good outputs.
PGOOD1 is the open-drain output for a window com-
parator that continuously monitors the SMPS output.
PGOOD1 is actively held low in shutdown and during
soft-start and soft-shutdown. After the soft-start termi-
nates, PGOOD1 becomes high impedance as long as
the SMPS output voltage is between 115% (typ) and
85% (typ) of the regulation voltage. When the SMPS
output voltage exceeds the 115%/85% regulation win-
dow, the MAX17000A pulls PGOOD1 low. Any fault
condition on the SMPS output forces PGOOD1 and
PGOOD2 low and latches off until the fault latch is
The MAX17000A VTT LDO regulator uses a current-limit-
ed soft-start function. When the VTT block is enabled, the
internal source and sink current limits are linearly
increased from zero to the full-scale limit in 160μs. Full-
scale current limit is available when the VTT output is in
regulation, or after 160μs, whichever is earlier. The VTTR
reference buffer does not have any soft-start control.
cleared by toggling SHDN or cycling V
power below
CC
1V. Detection of an OVP event immediately pulls
PGOOD1 low, regardless of the OVP state (OVP
enabled or disabled).
20
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
SHDN
STDBY
INT_REF
REFOK
SMPS_RUNOK
1.4ms
2.8ms
25mV
SMPS OUTPUT
VTT OUTPUT
VTTR OUTPUT
VTT CURRENT LIMIT
160μs
PGOOD1
PGOOD2
SKIP
FPWM
DL
VTT 16Ω FET
CSL 16Ω FET
Figure 6. MAX17000A Startup/Shutdown Timing with OVP Enabled
When OVP is enabled (OVP = V ), the internal 16Ω
Soft-shutdown begins after SHDN goes low, an output
undervoltage fault occurs, or a thermal fault occurs. A
fault on the SMPS (UV fault for more than 200μs (typ)),
or fault on the VTT output that persists for more than
5ms (typ), triggers shutdown of the whole IC. During
soft-shutdown, the output is ramped down to 0V in
2.8ms, reducing negative inductor currents that can
cause negative voltages on the output. At the end of
soft-shutdown, DL is driven low.
CC
discharging MOSFETs on CSL and VTT are enabled
until startup is triggered again by a rising edge of
SHDN. When OVP is disabled (OVP = AGND), the CSL
and VTT internal 16Ω discharging MOSFETs are not
enabled in shutdown.
Output Fault Protection
The MAX17000A provides overvoltage/undervoltage
fault protections for the PWM output. Drive OVP to
enable and disable fault protection as shown in Table 4.
Maxim Integrated
21
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Table 4. Fault Protection and Shutdown Setting Truth Table
OVP
MODE
REACTION/DRIVER STATE
DL immediately pulled low.
VTTR tracks the SMPS output during soft-shutdown. CSL and VTT
COMMENT
Outputs high-
impedance in
shutdown.
Shutdown
(SHDN = low) are high impedance at the end of soft-shutdown (16ꢀ discharge
MOSFETs disabled).
DL immediately pulled low.
VTTR tracks the SMPS output during soft-shutdown. CSL and VTT
are high impedance at the end of soft-shutdown (16ꢀ discharge
SMPS latched fault
condition.
SMPS UVP
MOSFETs disabled).
OVP Disabled
Discharge Disabled
(OVP = Low)
SMPS OVP
(disabled)
Controller remains active (normal operation).
Note: An OVP detection still pulls PGOOD1 low.
Only PGOOD1 pulled
low; fault not latched.
PGOOD2 immediately pulled low.
Soft-shutdown initiated if fault persists for more than 5ms (typ). DH
VTT > +110% not used in soft-shutdown. DL low after soft-shutdown completed.
VTTR tracks the SMPS output soft-shutdown.
VTT latched fault
condition if fault
persists for more
than 5ms (typ).
VTT < -90% or
DL and DH immediately pulled low.
V
UVLO
PGOOD1 and PGOOD2 immediately forced low. VTT and VTTR
blocks immediately disabled (high impedance, no 16ꢀ discharge
on outputs).
CC
—
falling edge
Soft-shutdown initiated.
16ꢀ discharge
DL high after soft-shutdown completed.
(SHDN = low) VTTR tracks the SMPS output during soft-shutdown. Internal 16ꢀ
MOSFETs on CSL
and VTT enabled in
Shutdown
discharge MOSFETs on CSL and VTT enabled after soft-shutdown. shutdown.
Soft-shutdown initiated. DH not used in soft-shutdown. DL low
after soft-shutdown completed.
VTTR tracks the SMPS output during soft-shutdown. Internal 16ꢀ
discharge MOSFETs on CSL and VTT enabled after soft-shutdown.
SMPS latched fault
condition.
SMPS UVP
OVP Enabled
Discharge Enabled
(OVP = High)
DL immediately latched high, DH forced low.
PGOOD1 and PGOOD2 immediately forced low.
VTT and VTTR blocks immediately shut down. Internal 16ꢀ
discharge MOSFETs on CSL and VTT enabled.
SMPS OVP
(enabled)
SMPS latched fault
condition.
PGOOD2 immediately pulled low.
VTT latched fault
condition if fault
persists for more
than 5ms (typ).
Soft-shutdown initiated if fault persists for more than 5ms (typ). DH
not used in soft-shutdown. DL low after soft-shutdown completed.
VTTR tracks the SMPS output during soft-shutdown. Internal 16ꢀ
discharge MOSFETs on CSL and VTT enabled after soft-shutdown.
VTT < 90% or
VTT > 110%
DL and DH immediately pulled low.
PGOOD1 and PGOOD2 immediately forced low.
VTT and VTTR blocks immediately disabled.
Internal 16ꢀ discharge MOSFETs on CSL and VTT enabled
immediately.
OVP Enabled
Discharge Enabled
(OVP = High)
V
UVLO
CC
—
falling edge
22
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Table 4. Fault Protection and Shutdown Setting Truth Table (continued)
OVP
MODE
REACTION/DRIVER STATE
COMMENT
DL and DH immediately pulled low.
PGOOD1 and PGOOD2 immediately forced low.
VTT and VTTR blocks immediately disabled (high impedance, no
16ꢀ discharge on outputs).
Thermal fault
Active-fault condition.
Activate INT_REF once V rises above UVLO, and SHDN = high.
Once REFOK is valid (high), initiate the soft-start sequence.
DL remains low until switching/soft-start begins.
CC
General Shutdown
and Fault
Conditions
V
UVLO
CC
—
rising edge
V
POR
CC
DL forced low.
—
—
rising edge
V
CC
POR
DL = Don’t care. V less than 2VT is not sufficient to turn on the
CC
falling edge MOSFETs.
SMPS Overvoltage Protection (OVP)
completed, the MAX17000A forces DL and DH low, and
If the output voltage of the SMPS rises 115% above its
nominal regulation voltage while OVP is enabled (OVP =
enables the internal 16Ω discharge MOSFETs on CSL
and VTT. Cycle V
below 1V or toggle SHDN to clear
CC
V
CC
), the controller sets its overvoltage fault latch, pulls
the undervoltage fault latch and restart the controller.
PGOOD1 and PGOOD2 low, and forces DL high. The
VTT and VTTR block shut down immediately, and the
internal 16Ω discharge MOSFETs on CSL and VTT are
turned on. If the condition that caused the overvoltage
persists (such as a shorted high-side MOSFET), the bat-
Thermal-Fault Protection
The MAX17000A features a thermal-fault protection cir-
cuit. When the junction temperature rises above
+160°C, a thermal sensor activates the fault latch, pulls
PGOOD1 and PGOOD2 low, and shuts down using the
tery fuse blows. Cycle V
below 1V or toggle SHDN to
CC
shutdown sequence. Toggle SHDN or cycle V
power
CC
clear the overvoltage fault latch and restart the controller.
below V
POR to reactivate the controller after the
CC
OVP is disabled when OVP is connected to AGND
(Table 4). PGOOD1 upper threshold remains active at
115% of nominal regulation voltage even when OVP is
disabled and the 16Ω discharge MOSFETs on CSL
and VTT are not enabled in shutdown.
junction temperature cools by 15°C.
Design Procedure
Firmly establish the input voltage range and maximum
load current before choosing a switching frequency and
inductor operating point (ripple-current ratio). The pri-
mary design trade-off lies in choosing a good switching
frequency and inductor operating point, and the follow-
ing four factors dictate the rest of the design:
SMPS Undervoltage Protection (UVP)
If the output voltage of the SMPS falls below 85% of its
regulation voltage for more than 200μs (typ), the controller
sets its undervoltage fault latch, pulls PGOOD1 and
PGOOD2 low, and begins soft-shutdown pulsing DL. DH
remains off during the soft-shutdown sequence initiated
by an undervoltage fault. After soft-shutdown has com-
pleted, the MAX17000A forces DL and DH low, and
enables the internal 16Ω discharge MOSFETs on CSL
•
Input Voltage Range: The maximum value
(V ) must accommodate the worst-case input
IN(MAX)
supply voltage allowed by the notebook’s AC
adapter voltage. The minimum value (V
)
IN(MIN)
must account for the lowest input voltage after
drops due to connectors, fuses, and battery selec-
tor switches. If there is a choice at all, lower input
voltages result in better efficiency.
and VTT. Cycle V
below 1V or toggle SHDN to clear
CC
the undervoltage fault latch and restart the controller.
VTT Overvoltage and Undervoltage Protection
If the output voltage of the VTT regulator exceeds
10% of its regulation voltage for more than 5ms (typ),
the controller sets its fault latch, pulls PGOOD1 and
PGOOD2 low, and begins soft-shutdown pulsing DL.
DH remains off during the soft-shutdown sequence initi-
ated by an undervoltage fault. After soft-shutdown has
•
Maximum Load Current: There are two values to
consider. The peak load current (I
) deter-
LOAD(MAX)
mines the instantaneous component stresses and
filtering requirements, and thus drives output
capacitor selection, inductor saturation rating, and
the design of the current-limit circuit. The continu-
ous load current (I
) determines the thermal
LOAD
Maxim Integrated
23
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
stresses and thus drives the selection of input
capacitors, MOSFETs, and other critical heat-con-
tributing components. Most notebook loads gener-
iron is inexpensive and can work well at 200kHz. The
core must be large enough not to saturate at the peak
inductor current (I
):
PEAK
ally exhibit I
= I
x 80%.
LOAD
LOAD(MAX)
LIR
2
⎛
⎝
⎞
I
= I
× 1+
⎜
LOAD(MAX)
⎟
⎠
PEAK
•
•
Switching Frequency: This choice determines the
basic trade-off between size and efficiency. The
optimal frequency is largely a function of maximum
input voltage, due to MOSFET switching losses that
Setting the Valley Current Limit
The minimum current-limit threshold must be high
enough to support the maximum load current when the
current limit is at the minimum tolerance value. The val-
are proportional to frequency and V 2. The opti-
IN
mum frequency is also a moving target, due to
rapid improvements in MOSFET technology that are
making higher frequencies more practical.
ley of the inductor current occurs at I
half the ripple current; therefore:
minus
LOAD(MAX)
Inductor Operating Point: This choice provides
trade-offs between size vs. efficiency and transient
response vs. output noise. Low inductor values pro-
vide better transient response and smaller physical
size, but also result in lower efficiency and higher
output noise due to increased ripple current. The
minimum practical inductor value is one that causes
the circuit to operate at the edge of critical conduc-
tion (where the inductor current just touches zero
with every cycle at maximum load). Inductor values
lower than this grant no further size-reduction bene-
fit. The optimum operating point is usually found
between 20% and 50% ripple current.
LIR
2
⎛
⎝
⎞
I
> I
× 1-
⎜
⎟
⎠
LIMIT(LOW) LOAD(MAX)
where I
equals the minimum current-limit
threshold voltage divided by the output sense element
(inductor DCR or sense resistor).
LIMIT(LOW)
The valley current limit is fixed at 17mV (min) across the
CSH to CSL differential input.
Special attention must be made to the tolerance and
thermal variation of the on-resistance in the case of DCR
sensing. Use the worst-case maximum value for R
from the inductor data sheet, and add some margin for
the rise in R with temperature. A good general rule
is to allow 0.5% additional resistance for each degree
Celsius of temperature rise, which must be included in
the design margin unless the design includes an NTC
thermistor in the DCR network to thermally compensate
the current-limit threshold.
DCR
Inductor Selection
DCR
The switching frequency and operating point (% ripple
current or LIR) determine the inductor value as follows:
⎛
⎞
⎛
⎝
⎞
⎠
V
- V
V
OUT
IN
OUT
L =
×
⎜
⎟
⎜
⎟
f
×I
× LIR
V
⎝
⎠
SW LOAD(MAX)
IN
The current-sense method (Figure 7) and magnitude
determine the achievable current-limit accuracy and
power loss. The sense resistor can be determined by:
Find a low-loss inductor having the lowest possible DC
resistance that fits in the allotted dimensions. Ferrite
cores are often the best choice, although powdered
R
= V
/I
SENSE
LIMIT LIMIT
INPUT (V )
IN
C
N
H
IN
SENSE RESISTOR
DH
LX
R
L
ESL
SENSE
L
L
ESL
C
R
=
EQ EQ
R
SENSE
C
OUT
C
DL
EQ
MAX17000A
R
D
EQ
L
N
L
PGND1
CSH
CSL
A) OUTPUT SERIES RESISTOR SENSING
Figure 7a. Current-Sense Configurations (Sheet 1 of 2)
24
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
INPUT (V )
IN
C
IN
N
H
INDUCTOR
DH
LX
R
L
DCR
R2
R1 + R2
R
=
R
DCR
CS
C
OUT
R
R
2
1
MAX17000A
DL
D
L
N
L
L
1
1
R2
+
R
=
DCR
[R1 ]
C
EQ
PGND1
C
EQ
CSH
CSL
FOR THERMAL COMPENSATION:
R2 SHOULD CONSIST OF AN NTC RESISTOR IN
SERIES WITH A STANDARD THIN-FILM RESISTOR.
B) LOSSLESS INDUCTOR SENSING
Figure 7b. Current-Sense Configurations (Sheet 2 of 2)
For the best current-sense accuracy and overcurrent
protection, use a 1% tolerance current-sense resistor
between the inductor and output as shown in Figure 7a.
This configuration constantly monitors the inductor cur-
rent, allowing accurate current-limit protection.
However, the parasitic inductance of the current-sense
resistor can cause current-limit inaccuracies, especially
when using low-value inductors and current-sense
MOSFET Gate Drivers (DH, DL)
The DH and DL drivers are optimized for driving moder-
ate-sized high-side, and larger low-side power MOSFETs.
This is consistent with the low duty factor seen in note-
book applications, where a large V - V
differential
IN
OUT
exists. The high-side gate driver (DH) sources and sinks
1.2A, and the low-side gate driver (DL) sources 1.0A and
sinks 2.4A. This ensures robust gate drive for high-cur-
rent applications. The DH floating high-side MOSFET dri-
ver is powered by an internal boost switch charge pump
at BST, while the DL synchronous-rectifier driver is pow-
resistors. This parasitic inductance (L
) can be can-
ESL
celled by adding an RC circuit across the sense resis-
tor with an equivalent time constant:
ered directly by the 5V bias supply (V ).
DD
L
ESL
C
× R
=
PWM Output Capacitor Selection
EQ
EQ
R
SENSE
The output filter capacitor must have low enough effec-
tive series resistance (ESR) to meet output ripple and
load-transient requirements, yet have high enough ESR
to satisfy stability requirements.
Alternatively, low-cost applications that do not require
highly accurate current-limit protection could reduce
the overall power dissipation by connecting a series RC
circuit across the inductor (Figure 7b) with an equiva-
lent time constant:
In core and chipset converters and other applications
where the output is subject to large-load transients, the
output capacitor’s size typically depends on how much
ESR is needed to prevent the output from dipping too
low under a load transient. Ignoring the sag due to finite
capacitance:
R2
R1+ R2
R
=
× R
DCR
CS
and:
V
STEP
LOAD(MAX)
R
(
+ R
≤
)
ESR
PCB
ΔI
L
1
1
⎡
⎤
R
=
×
+
DCR
⎢
⎣
⎥
⎦
C
R1 R2
In low-power applications, the output capacitor’s size
often depends on how much ESR is needed to maintain
an acceptable level of output ripple voltage. The output
ripple voltage of a step-down controller equals the total
inductor ripple current multiplied by the output capaci-
tor’s ESR.
EQ
where R
and R
is the required current-sense resistance,
is the inductor’s series DC resistance. Use
CS
DCR
the worst-case inductance and R
by the inductor manufacturer, adding some margin for
the inductance drop over temperature and load.
values provided
DCR
Maxim Integrated
25
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
The maximum ESR to meet ripple requirements is:
ceramic output capacitors can be compensated using
either a DC-compensation or AC-compensation
method. The DC-coupling requires fewer external com-
pensation capacitors, but this also creates an output
load line that depends on the inductor’s DCR (parasitic
resistance). Alternatively, the current-sense information
can be AC-coupled, allowing stability to be dependent
only on the inductance value and compensation com-
ponents and eliminating the DC load line.
⎡
⎢
⎤
⎥
V
× f
× L
× V
IN SW
R
≤
× V
RIPPLE
ESR
V
- V
⎢
⎣
⎥
⎦
IN
OUT
OUT
where f
is the switching frequency.
SW
With most chemistries (polymer, tantalum, aluminum,
electrolytic), the actual capacitance value required
relates to the physical size needed to achieve low ESR
and the chemistry limits of the selected capacitor tech-
nology. Ceramic capacitors provide low ESR, but the
capacitance and voltage rating (after derating) are
When only using ceramic output capacitors, output
overshoot (V
) typically determines the minimum
SOAR
output capacitance requirement. Their relatively low
capacitance value can allow significant output over-
shoot when stepping from full-load to no-load condi-
tions, unless a small inductor value and high switching
frequency are used to minimize the energy transferred
from inductor to capacitor during load-step recovery.
determined by the capacity needed to prevent V
SAG
and V
from causing problems during load tran-
SOAR
sients. Generally, once enough capacitance is added
to meet the overshoot requirement, undershoot at the
rising load edge is no longer a problem. Thus, the out-
put capacitor selection requires carefully balancing
capacitor chemistry limitations (capacitance vs. ESR
vs. voltage rating) and cost.
Unstable operation manifests itself in two related, but
distinctly different ways: double pulsing and feedback
loop instability. Double pulsing occurs due to noise on
the output or because the ESR is so low that there is not
enough voltage ramp in the output voltage signal. This
“fools” the error comparator into triggering a new cycle
immediately after the minimum off-time period has
expired. Double pulsing is more annoying than harmful,
resulting in nothing worse than increased output ripple.
However, it can indicate the possible presence of loop
instability due to insufficient ESR. Loop instability can
result in oscillations at the output after line or load
steps. Such perturbations are usually damped, but can
cause the output voltage to rise above or fall below the
tolerance limits.
PWM Output Capacitor
Stability Considerations
For Quick-PWM controllers, stability is determined by the
in-phase feedback ripple relative to the switching frequen-
cy, which is typically dominated by the output ESR. The
boundary of instability is given by the following equation:
f
1
SW
π
≥
2π × R
× C
EFF OUT
R
= R
+ A × R
EFF
ESR CS SENSE
where C
is the total output capacitance, R
is the
OUT
ESR
The easiest method for checking stability is to apply a
very fast zero-to-max load transient and carefully
observe the output voltage ripple envelope for over-
shoot and ringing. It can help to simultaneously monitor
the inductor current with an AC current probe. Do not
allow more than one cycle of ringing after the initial
step-response undervoltage/overshoot.
total equivalent series resistance of the output capaci-
tors, R
is the effective current-sense resistance
SENSE
(see Figure 7), and A is the current-sense gain of 2.
CS
For a standard 300kHz application, the effective zero
frequency must be well below 95kHz, preferably below
50kHz. With these frequency requirements, standard
tantalum and polymer capacitors already commonly
used have typical ESR zero frequencies below 50kHz,
allowing the stability requirements to be achieved with-
out any additional current-sense compensation. In the
standard application circuit (Figure 1), the ESR needed
Input Capacitor Selection
The input capacitor must meet the ripple current
requirement (I
RMS
lowing equation:
) imposed by the switching currents.
RMS
The I
requirements can be determined by the fol-
to support a 15mV
ripple is 15mV/(10A x 0.3) =
P-P
5mΩ. Two 330μF, 9mΩ polymer capacitors in parallel
provide 4.5mΩ (max) ESR and 1/(2π x 330μF x 9mΩ) =
53kHz ESR zero frequency.
⎛
⎝
⎞
⎠
I
LOAD
I
=
V
× V − V
(
)
RMS
OUT
IN
OUT
⎜
⎟
V
IN
Ceramic capacitors have a high-ESR zero frequency,
but applications with sufficient current-sense compen-
sation can still take advantage of the small size, low
ESR, and high reliability of the ceramic chemistry. By
the inductor current DCR sensing, applications with
The worst-case RMS current requirement occurs when
operating with V = 2V
IN
. At this point, the above
OUT
equation simplifies to:
I
= 0.5 x I
LOAD
RMS
26
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
For most applications, nontantalum chemistries (ceramic,
can be. Again, the optimum occurs when the switching
losses equal the conduction (R ) losses. High-
side switching losses do not usually become an issue
until the input is greater than approximately 15V.
aluminum, or OS-CON) are preferred due to their resis-
tance to inrush surge currents typical of systems with a
mechanical switch or connector in series with the input.
If the Quick-PWM controller is operated as the second
stage of a two-stage power-conversion system, tanta-
lum input capacitors are acceptable. In either configu-
ration, choose an input capacitor that exhibits less than
+10°C temperature rise at the RMS input current for
optimal circuit longevity.
DS(ON)
Calculating the power dissipation in high-side MOSFET
(N ) due to switching losses is difficult since it must
H
allow for difficult quantifying factors that influence the
turn-on and turn-off times. These factors include the
internal gate resistance, gate charge, threshold voltage,
source inductance, and PCB layout characteristics. The
following switching-loss calculation provides only a very
rough estimate and is no substitute for breadboard
evaluation, preferably including verification using a
MOSFET Selection
Most of the following MOSFET guidelines focus on the
challenge of obtaining high load-current capability
when using high-voltage (> 20V) AC adapters. Low-
current applications usually require less attention.
thermocouple mounted on N :
H
Q
⎛
⎞
G(SW)
PD (NH Switching) = V
×I
× f
IN(MAX) LOAD SW
⎜
⎟
The high-side MOSFET (N ) must be able to dissipate
H
the resistive losses plus the switching losses at both
I
⎝
⎠
GATE
2
C
× V × f
V
and V
. Calculate both these sums.
should be roughly equal to
OSS
IN
SW
IN(MIN)
Ideally, the losses at V
IN(MAX)
+
2
IN(MIN)
losses at V
losses at V
at V
R
es at V
, with lower losses in between. If the
IN(MAX)
IN(MIN)
where C
G(SW)
is the N MOSFET’s output capacitance,
H
OSS
are significantly higher than the losses
Q
is the charge needed to turn on the N MOSFET,
H
, consider increasing the size of N (reducing
IN(MAX)
H
and I
is the peak gate-drive source/sink current
GATE
(2.2A typ).
but with higher C
). Conversely, if the loss-
GATE
DS(ON)
are significantly higher than the losses at
IN(MAX)
Switching losses in the high-side MOSFET can become
an insidious heat problem when maximum AC adapter
V
, consider reducing the size of N (increasing
IN(MIN)
R
H
to lower C
). If V does not vary over a
GATE IN
DS(ON)
voltages are applied, due to the squared term in the
wide range, the minimum power dissipation occurs
where the resistive losses equal the switching losses.
2
C x V
x f
switching-loss equation. If the high-side
SW
IN
MOSFET chosen for adequate R
voltages becomes extraordinarily hot when biased from
IN(MAX)
lower parasitic capacitance.
at low battery
DS(ON)
Choose a low-side MOSFET that has the lowest possi-
ble on-resistance (R ), comes in a moderate-sized
DS(ON)
V
, consider choosing another MOSFET with
package (i.e., one or two 8-pin SOs, DPAK, or D2PAK),
and is reasonably priced. Make sure that the DL gate
driver can supply sufficient current to support the gate
charge and the current injected into the parasitic gate-
to-drain capacitor caused by the high-side MOSFET
turning on; otherwise, cross-conduction problems can
occur (see the MOSFET Gate Drivers (DH, DL) section).
For the low-side MOSFET (N ), the worst-case power
L
dissipation always occurs at maximum input voltage:
⎡
⎤
⎛
⎞
V
2
OUT
PD (NL Resistive) =⎢1−
⎥ × I
× R
DS(ON)
(
)
⎜
⎟
LOAD
V
⎢
⎣
⎥
⎝
⎠
IN(MAX)
⎦
MOSFET Power Dissipation
Worst-case conduction losses occur at the duty factor
The worst case for MOSFET power dissipation occurs
under heavy overloads that are greater than
LOAD(MAX)
the current limit and cause the fault latch to trip. To pro-
tect against this possibility, the circuit can be “over
designed” to tolerate:
extremes. For the high-side MOSFET (N ), the worst-
H
case power dissipation due to resistance occurs at the
minimum input voltage:
I
, but are not quite high enough to exceed
⎛
⎝
⎞
⎠
V
2
OUT
PD (NH Resistive) =
× I
(
× R
DS(ON)
)
LOAD
⎜
⎟
V
IN
ΔI
⎛
⎝
⎞
INDUCTOR
I
= I
+
LOAD ⎜ VALLEY(MAX)
⎟
⎠
2
Generally, a small high-side MOSFET is desired to
reduce switching losses at high input voltages.
required to stay within package
power dissipation often limits how small the MOSFET
I
× LIR
⎛
⎞
LOAD(MAX)
2
= I +
VALLEY(MAX)
However, the R
⎜
⎟
DS(ON)
⎝
⎠
Maxim Integrated
27
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
where I
is the maximum valley current
VTTI Input Capacitor
Stability Considerations
VALLEY(MAX)
allowed by the current-limit circuit, including threshold
tolerance and on-resistance variation. The MOSFETs
must have a good size heatsink to handle the overload
power dissipation.
The value of the VTTI bypass capacitor is chosen to
limit the amount of ripple/noise at VTTI, and the amount
of voltage dip during a load transient. Typically, VTTI is
connected to the output of the buck regulator, which
already has a large bulk capacitor. Nevertheless, a
ceramic capacitor of equivalent value to the VTT output
capacitor must be used and must be added and
placed as close as possible to the VTTI pin. This value
must be increased with larger load current, or if the
trace from the VTTI pin to the power source is long and
has significant impedance.
Choose a Schottky diode (DL) with a forward voltage
low enough to prevent the low-side MOSFET body
diode from turning on during the dead time. Select a
diode that can handle the load current during the dead
times. This diode is optional and can be removed if effi-
ciency is not critical.
Setting the PWM Output Voltage
Preset Output Voltages
The MAX17000A’s Dual Mode™ operation allows the
selection of common voltages without requiring external
components. Connect FB to AGND for a fixed 1.5V out-
Setting VTT Output Voltage
The VTT output stage is powered from the VTTI input.
The output voltage is set by the REFIN input. REFIN sets
the feedback regulation voltage (VTTR = VTTS =
put, to V
for a fixed 1.8V output, or connect FB
CC
V
) of the MAX17000A. Connect a 0.1V to 2.0V volt-
REFIN
directly to OUT for a fixed 1.0V output.
age input to set the adjustable output for VTT, VTTS, and
VTTR. If REFIN is tied to V , the internal CSL/2 divider
CC
Adjustable Output Voltage
is used to set VTT voltage; hence, VTT tracks the V
CSL
The output voltage can be adjusted from 1.0V to 2.7V
using a resistive voltage-divider (Figure 8). The
MAX17000A regulates FB to a fixed reference voltage
(1.0V). The adjusted output voltage is:
voltage and is set to V
/2. This feature makes the
CSL
MAX17000A ideal for memory applications in which the
termination supply must track the supply voltage.
VTT Output Capacitor Selection
A minimum value of 9μF is needed to stabilize a 300mA
VTT output. This value of capacitance limits the regula-
tor’s unity-gain bandwidth frequency to approximately
1.2MHz (typ) to allow adequate phase margin for stabil-
ity. To keep the capacitor acting as a capacitor within
the regulator’s bandwidth, it is important that ceramic
capacitors with low ESR and ESL be used.
⎛
⎝
⎞
⎠
R
FBA
V
= V × 1+
OUT
FB
⎜
⎟
R
FBB
where V is 1.0V.
FB
L1
V
OUT
LX
DL
N
L
C
OUT
D1
PGND1
CSH
CSL
MAX17000A
R
R
FBA
FB
FBB
Figure 8. Setting V
OUT
with a Resistive Voltage-Divider
Dual Mode is a trademark of Maxim Integrated Products, Inc.
28
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Since the gain bandwidth is also determined by the
PD(Total) = 2W
transconductance of the output FETs, which increases
with load current, the output capacitor might need to be
greater than 20μF if the load current exceeds 1.5A, but
can be smaller than 20μF if the maximum load current
is less than 1.5A. As a guideline, choose the minimum
capacitance and maximum ESR for the output capaci-
tor using the following:
The 2W total power dissipation is within the 24-pin
TQFN multilayer board power dissipation specification
of 2.22W. The typical application does not source or
sink continuous high currents. VTT current is typically
100mA to 200mA in the steady state. VTTR is down in
the microamp range, though the Intel specification
requires 3mA for DDR1 and 1mA for DDR2. True worst-
case power dissipation occurs on an output short-circuit
condition with worst-case current limit. The MAX17000A
does not employ any foldback current limiting, and
relies on the internal thermal shutdown for protection.
Both the VTT and VTTR output stages are powered from
the same VTTI input. Their output voltages are refer-
enced to the same REFIN input. The value of the VTTI
bypass capacitor is chosen to limit the amount of rip-
ple/noise at VTTI, or the amount of voltage dip during a
load transient. Typically, VTTI is connected to the output
of the buck regulator, which already has a large bulk
capacitor.
I
LOAD
C
= 20μF ×
OUT _MIN
1.5A
C
needs to be increased by a factor of 2 for
OUT_MIN
low-dropout operation:
1.5A
R
= 5mΩ ×
ESR_MAX
I
LOAD
R
value is measured at the unity-gain-band-
ESR_MAX
width frequency given by approximately:
I
36
LOAD
f
=
×
GBW
C
1.5A
OUT
Boost Capacitors
) must be selected large
The boost capacitors (C
BST
Once these conditions for stability are met, additional
capacitors, including those of electrolytic and tantalum
types, can be connected in parallel to the ceramic
capacitor (if desired) to further suppress noise or volt-
age ripple at the output.
enough to handle the gate-charging requirements of
the high-side MOSFETs. Typically, 0.1μF ceramic
capacitors work well for low-power applications driving
medium-sized MOSFETs. However, high-current appli-
cations driving large, high-side MOSFETs require boost
capacitors larger than 0.1μF. For these applications,
select the boost capacitors to avoid discharging the
capacitor more than 200mV while charging the high-
side MOSFETs’ gates:
VTTR Output Capacitor Selection
The VTTR buffer is a scaled-down version of the VTT
regulator, with much smaller output transconductance.
Its compensation capacitor can, therefore, be smaller
and its ESR larger than what is required for its larger
counterpart. For typical applications requiring load cur-
rent up to 4mA, a ceramic capacitor with a minimum
Q
GATE
C
=
BST
200mV
value of 0.33μF is recommended (R
Connect this capacitor between VTTR and the analog
ground plane.
< 0.3Ω).
ESR
where Q
is the total gate charge specified in the
GATE
high-side MOSFET’s data sheet. For example, assume
the FDS6612A n-channel MOSFET is used on the high
side. According to the manufacturer’s data sheet, a sin-
gle FDS6612A has a maximum gate charge of 13nC
Power Dissipation
Power loss in the MAX17000A is the sum of the losses
of the PWM block, the VTT LDO block, and the VTTR
reference buffer:
(V
= 5V). Using the above equation, the required
boost capacitance would be:
GS
PD(PWM) = I
× 5V = 40mA × 5V = 0.2W
BIAS
13nC
200mV
C
=
= 0.065μF
BST
PD(VTT) = 2A × 0.9V = 1.8W
Selecting the closest standard value, this example
requires a 0.1μF ceramic capacitor.
PD(VTTR) = 3mA × 0.9V = 2.7mW
Maxim Integrated
29
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Layout Procedure
1) Place the power components first, with ground ter-
minals adjacent (low-side MOSFET source, C
Applications Information
PCB Layout Guidelines
Careful PCB layout is critical to achieve low switching
losses and clean, stable operation. The switching
power stage requires particular attention. If possible,
mount all the power components on the topside of the
board, with their ground terminals flush against one
another. Follow these guidelines for good PCB layout:
,
IN
C
, and anode of the low-side Schottky). If possi-
OUT
ble, make all these connections on the top layer
with wide, copper-filled areas.
2) Mount the controller IC adjacent to the low-side
MOSFET, preferably on the backside opposite the
MOSFETs to keep LX, GND, DH, and the DL gate-
drive lines short and wide. The DL and DH gate
traces must be short and wide (50 mils to 100 mils
wide if the MOSFET is 1in from the controller IC) to
keep the driver impedance low and for proper
adaptive dead-time sensing.
•
Keep the high-current paths short, especially at the
ground terminals. This practice is essential for sta-
ble, jitter-free operation.
•
Keep the power traces and load connections short.
This practice is essential for high efficiency. Using
thick copper PCBs (2oz vs. 1oz) can enhance full-
load efficiency by 1% or more. Correctly routing
PCB traces is a difficult task that must be
approached in terms of fractions of centimeters,
where a single milliohm of excess trace resistance
causes a measurable efficiency penalty.
3) Group the gate-drive components (BST diode and
capacitor, V
bypass capacitor) together near the
DD
controller IC.
4) Make the DC-DC controller ground connections as
shown in Figures 1 and 9. This diagram can be
viewed as having two separate ground planes:
power ground, where all the high-power compo-
nents go; and an analog ground plane for sensitive
analog components. The analog ground plane and
power ground plane must meet only at a single
point directly at the IC.
•
•
Minimize current-sensing errors by connecting CSH
and CSL directly across the current-sense resistor
(R
).
SENSE
When trade-offs in trace lengths must be made, it is
preferable to allow the inductor-charging path to be
made longer than the discharge path. For example,
it is better to allow some extra distance between the
input capacitors and the high-side MOSFET than to
allow distance between the inductor and the low-
side MOSFET or between the inductor and the out-
put filter capacitor.
5) Connect the output power planes directly to the out-
put filter capacitor positive and negative terminals
with multiple vias. Place the entire DC-to-DC con-
verter circuit as close as is practical to the load.
Table 5 lists the design differences between the
MAX17000 and MAX17000A.
•
Route high-speed switching nodes (BST, LX, DH,
and DL) away from sensitive analog areas (REFIN,
FB, CSH, and CSL).
Table 5. MAX17000 vs. MAX17000A Design Differences
MAX17000
MAX17000A
STDBY = Low turns off VTT and overrides the SKIP setting, forcing STDBY = Low only turns off VTT rail, and does not affect SMPS
the SMPS to enter a low-quiescent current ultra-skip mode. operation.
30
Maxim Integrated
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
KELVIN SENSE VIAS
UNDER THE INDUCTOR
(SEE EVALUATION KIT)
POWER STAGE LAYOUT (TOP SIDE OF PCB)
OUTPUT
INDUCTOR
L1
CSL
CSH
R
R2
R1
NTC
POWER
GROUND
C
EQ
KELVIN-SENSE VIAS TO
INDUCTOR PAD
INPUT
SMPS
INDUCTOR DCR SENSING
CONNECT AGND AND PGND1 TO
THE CONTROLLER AT THE
EXPOSED PAD
CONNECT THE
EXPOSED PAD TO
ANALOG GROUND
V
BYPASS
DD
CAPACITOR
VTTI BYPASS
CAPACITOR
VIA TO POWER GROUND
V
CC
BYPASS
CAPACITOR
VTT BYPASS
CAPACITOR
X-RAY VIEW.
IC MOUNTED
ON BOTTOM
SIDE OF PCB.
IC LAYOUT
Figure 9. PCB Layout Example
Package Information
Chip Information
For the latest package outline information and land patterns (foot-
prints), go to www.maximintegrated.com/packages. Note that a
“+”, “#”, or “-” in the package code indicates RoHS status only.
Package drawings may show a different suffix character, but the
drawing pertains to the package regardless of RoHS status.
TRANSISTOR COUNT: 7856
PROCESS: BiCMOS
PACKAGE
TYPE
PACKAGE
CODE
OUTLINE
NO.
LAND
PATTERN NO.
24 TQFN
T2444-4
21-01±9
90-0022
Maxim Integrated
31
MAX17000A
Complete DDR2 and DDR3 Memory
Power-Management Solution
Revision History
REVISION
NUMBER
REVISION
DATE
PAGES
CHANGED
DESCRIPTION
0
1
2
3
10/08
12/08
11/10
4/13
Initial release
—
5, 11, 12, 13, 17, 23,
Modified STDBY pin function
Changed R
equation
29
2
ESR_MAX
Updated Absolute Maximum Ratings
Maxim Integrated cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim Integrated product. No circuit patent
licenses are implied. Maxim Integrated reserves the right to change the circuitry and specifications without notice at any time. The parametric values (min and
max limits) shown in the Electrical Characteristics table are guaranteed. Other parametric values quoted in this data sheet are provided for guidance.
32 ________________________________Maxim Integrated 160 Rio Robles, San Jose, CA 95134 USA 1-408-601-1000
© 2013 Maxim Integrated Products, Inc.
Maxim Integrated and the Maxim Integrated logo are trademarks of Maxim Integrated Products, Inc.
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